CN110460828B - Micro-electro-mechanical scanning mirror projection system and method - Google Patents
Micro-electro-mechanical scanning mirror projection system and method Download PDFInfo
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- CN110460828B CN110460828B CN201910780842.6A CN201910780842A CN110460828B CN 110460828 B CN110460828 B CN 110460828B CN 201910780842 A CN201910780842 A CN 201910780842A CN 110460828 B CN110460828 B CN 110460828B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N9/00—Details of colour television systems
- H04N9/12—Picture reproducers
- H04N9/31—Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM]
- H04N9/3129—Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM] scanning a light beam on the display screen
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N9/00—Details of colour television systems
- H04N9/12—Picture reproducers
- H04N9/31—Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM]
- H04N9/3138—Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM] using arrays of modulated light sources
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N9/00—Details of colour television systems
- H04N9/12—Picture reproducers
- H04N9/31—Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM]
- H04N9/3141—Constructional details thereof
Abstract
The invention discloses a micro-electro-mechanical scanning mirror projection system and a method, belonging to the field of imaging, wherein the system comprises a circuit module, a light source module, a scanning mirror and a processing module, wherein the scanning mirror carries out angle deflection under the action of a scanning driving signal, and an included angle alpha is formed between a normal line of the scanning mirror when the scanning mirror is static and a fast axis scanning direction of a raster scanning mode; then the calculation unit calculates according to the included angle alpha, the distance d from the scanning mirror to the projection picture, the preset pixel interval L and the preset scanning mirror deflection angle theta (t) to obtain a light source modulation signal; the invention can modulate the lighting time of each pixel point according to the included angle alpha and the distance from the scanning mirror to the projection picture, so that the pixel point distance of the final projection picture reaches a preset value, the condition of uneven pixel point distance is improved, and the imaging quality of the projection picture is ensured.
Description
Technical Field
The present invention relates to the field of micro-electromechanical imaging, and more particularly to a micro-electromechanical scanning mirror projection system and method.
Background
Miniature portable projection devices, such as projection cell phones, projection watches, etc., have been desirable imaging products. At present, the mems imaging system is becoming one of the technologies most likely to realize the miniature portable projection device due to its smaller size and better imaging effect.
When a micro-electromechanical scanning mirror imaging system is required to obliquely project a picture, such as a projection keyboard, the situation of uneven pixel point spacing is easy to occur in the current micro-electromechanical scanning mirror driving mode and the light source modulation mode of the micro-electromechanical scanning mirror imaging system, and the final imaging quality of the projected picture is affected.
Fig. 1 is a schematic view of a scene in which the mems imaging system projects a horizontal forward projection image, wherein a normal f of the mems scanning mirror 142 when it is at rest is perpendicular to the projection image 150. Since the lighting time of each pixel point of the projection picture modulated by the current micro-electromechanical scanning mirror imaging system is a fixed value, the horizontal pixel pitch of the projection picture 150, as shown in the square area in the figure, depends on the horizontal deflection angle of the micro-electromechanical scanning mirror. The horizontal deflection angle of the mems scanning mirror depends on the horizontal scanning driving signal of the mems scanning mirror, and the horizontal scanning driving signal is generally a sine wave signal (or a triangular wave signal, which is only illustrated as the sine wave signal, as shown in fig. 3), and the horizontal pixel pitches shown are substantially equal, and the picture pixels are uniform.
Fig. 2 is a schematic view of a scene of a horizontal oblique projection image of the mems scanning mirror imaging system, wherein a normal f of the mems scanning mirror 142 when it is still forms an angle α with a horizontal direction of the projection image 150, where α is greater than 0 ° and less than 90 °, and the horizontal direction of the projection image 150 is also a fast axis scanning direction of a raster scanning manner of the mems scanning mirror. Due to the inclination of the angle, the distance from the light beam reflected by the micro electro mechanical scanning mirror 142 to the pixel point 1 in the image is shorter than the distance to the pixel point n, and therefore, when the micro electro mechanical scanning mirror is obliquely projected, the pixel distance from the pixel point 1 to the pixel point n in the projection image is gradually increased. The pixel spacing is not uniform, which affects the imaging quality of the final projected image 150.
Disclosure of Invention
1. Technical problem to be solved by the invention
The invention aims to overcome the defects in the prior art and provides a micro-electromechanical scanning mirror projection system and a micro-electromechanical scanning mirror projection method, wherein the lighting time of each pixel point can be adaptively modulated according to the inclined angle of the scanning mirror, the vertical distance from the scanning mirror to a projection picture and the like, so that the pixel pitch of the final projection picture reaches a preset value, the condition of non-uniform pixel pitch is improved, and the imaging quality of the final projection picture is improved.
2. Technical scheme
In order to achieve the purpose, the technical scheme provided by the invention is as follows:
the invention relates to a micro-electromechanical scanning mirror imaging system, which comprises:
a circuit module including a light source modulation circuit configured to output a light source modulation signal and a scan driving circuit; the scan driving circuit is configured to output a scan driving signal;
the light source module is configured to output a light beam corresponding to each pixel point n of the picture to be projected according to the light source modulation signal;
a scanning mirror configured to perform two-dimensional angular deflection in a raster scanning manner according to a scanning driving signal and reflect the light beam output by the light source module; the normal line of the scanning mirror when the scanning mirror is static and the fast axis scanning direction of the raster scanning mode form an included angle alpha, wherein alpha is more than 0 degree and less than 90 degrees;
a processing module, including a calculating unit, where the light source modulation signal includes a lighting time Δ t of each pixel n, and the calculating unit is configured to calculate the lighting time Δ t of each pixel n according to the following formula:
L＝|d*tan[90°-α+θH(t+Δt)]-d*tan[90°-α+θH(t)]|，
wherein L is the pixel pitch of the projection picture, d is the vertical distance from the scanning mirror to the projection picture, t is the time, thetaH(t) is the horizontal deflection angle, θ, produced by the scan mirror at time tH(t) ≠ β/2, where (- β/2, + β/2) is the range of horizontal deflection angles of the scan mirror.
As a further improvement of the invention, the scanning driving signals comprise a horizontal driving signal and a vertical driving signal, wherein the horizontal driving signal drives the scanning mirror to generate a horizontal deflection angle thetaH(t); the vertical driving signal drives the scanning mirror to generate a vertical deflection angle thetaV(t)。
As a further improvement of the present invention, when the normal line of the scanning mirror when the scanning mirror is stationary forms an angle α with the fast axis scanning direction of the raster scanning mode, the calculating unit is configured to calculate the lighting time Δ t of each pixel point n according to the following formula:
when theta isHWhen t is ± β/2, Δ t is X, where X is a predetermined constant.
As a further improvement of the invention, the horizontal driving signal is a sine wave signal, and the scanning mirror is driven to generate a horizontal deflection angle thetaH(t)。
As a further development of the invention, the processing module further comprises a memory unit which is configured to store the horizontal deflection angle θ of the scanning mirrorH(t) and the horizontal deflection angle range of the scan mirror is (-beta/2, + beta/2).
As a further improvement of the present invention, the processing module further includes a parameter obtaining unit, and the parameter obtaining unit is configured to obtain a pixel pitch L of the projection picture, a vertical distance d from the scanning mirror to the projection picture, and the included angle α.
The invention relates to a micro-electromechanical scanning mirror imaging method of a micro-electromechanical scanning mirror imaging system, which comprises the following steps:
the method comprises the following steps: firstly, a scanning mirror carries out two-dimensional angular deflection in a raster scanning mode under the action of a scanning driving signal, and the deflection angle is theta (t), wherein the normal line of the scanning mirror when the scanning mirror is static and the fast axis scanning direction of the raster scanning mode form an included angle alpha, and alpha is more than 0 degree and less than 90 degrees;
step two: then, the calculating unit is configured to calculate the lighting time Δ t of each pixel point n according to the following formula, that is, calculate the light source modulation signal:
L＝|d*tan[90°-α+θH(t+Δt)]-d*tan[90°-α+θH(t)]|，
wherein L is the pixel pitch of the projection picture, d is the vertical distance from the scanning mirror to the projection picture, t is the time, thetaH(t) is the horizontal deflection angle, θ, produced by the scan mirror at time tH(t) ≠ β/2, where (- β/2, + β/2) is the range of horizontal deflection angles of the scan mirror;
step three: and then, projecting light beams corresponding to each pixel point n of the image to be projected, which are output according to the light source modulation signal, onto the scanning mirror, and reflecting the light beams out by the scanning mirror to form a projection image, thereby completing the uniformity adjustment of the pixel point spacing of the projection image.
3. Advantageous effects
Compared with the prior art, the technical scheme provided by the invention has the following remarkable effects:
the micro-electro-mechanical scanning mirror imaging system provided by the invention can adaptively modulate the light emitting duration of each pixel point according to the scene parameters of the inclined projection picture of the micro-electro-mechanical scanning mirror imaging system, such as the inclined included angle of the scanning mirror, the vertical distance from the scanning mirror to the projection picture and the like, so that the pixel interval of the final projection picture reaches a preset value, the condition of uneven pixel interval is improved, and the imaging quality of the final projection picture is improved.
Drawings
FIG. 1 is a schematic view of a scene of a horizontal orthographic projection image of a micro-electromechanical scanning mirror imaging system;
FIG. 2 is a schematic view of a scene of a horizontal oblique projection picture of a micro-electromechanical scanning mirror imaging system;
FIG. 3 is a waveform diagram of horizontal scan drive signals and vertical scan drive signals of a micro-electromechanical scan mirror;
FIG. 4 is a schematic diagram of a micro-electromechanical scanning mirror imaging system provided by the present invention;
FIG. 5 is a schematic view of a scene of a horizontal oblique projection image of a micro-electromechanical scanning mirror imaging system according to the present invention.
The reference numerals in the schematic drawings illustrate:
110. a processing module; 111. a calculation unit; 112. a storage unit; 113. a parameter acquisition unit;
120. a circuit module; 121. a light source modulation circuit; 122. a scan driving circuit;
130. a light source module;
141. a micro-electromechanical device; 142. a scanning mirror;
150. and projecting the picture.
Detailed Description
For a further understanding of the present invention, reference will now be made in detail to the following examples and accompanying drawings.
Example 1
As shown in fig. 4, the embodiment provides a micro-electromechanical scanning mirror imaging system, which includes a light source module 130, a scanning mirror 142, a circuit module 120, and a processing module 110, wherein: the circuit module 120 includes a light source modulation circuit 121 and a scan driving circuit 122, wherein the light source modulation circuit 121 is configured to output a light source modulation signal, and the scan driving circuit 122 is configured to output a scan driving signal.
The light source modulation signal includes two aspects, namely modulation of the n-color gray scale of the pixel point on the one hand, and modulation of the lighting time length of the pixel point n on the other hand, specifically, the embodiment is modulation of the lighting time length of the pixel point n on the other hand. As shown in fig. 3, the scan driving signals include horizontal scan driving signals and vertical scan driving signals. The horizontal scanning driving signal is generally a sinusoidal signal with a period T, and the scanning method generally employs interlaced scanning, so that the light source modulation signal lights the pixel point n only in the first half period of the horizontal scanning driving signal. The vertical scanning driving signal is generally a sawtooth wave signal and is divided into a display period and a retrace period, and the light source modulation signal does not light the pixel point n in the retrace period.
And the light source module 130 is configured to output a light beam corresponding to each pixel point n of the to-be-projected picture 150 according to the light source modulation signal. The light source module 130 in fig. 4 includes three color lasers of red, R, green, G, and blue, B, and three dichroic plates P1, P2, and P3 corresponding to the three color lasers, and combines the modulated R, G, B light beams by wavelength selectivity of the dichroic plates P1, P2, and P3.
Included in fig. 4 is a micro-electromechanical device 141 having a scan mirror 142. Wherein the scanning mirror 142 is configured to perform two-dimensional angular deflection in a raster scanning manner (as shown by a scanning track of the projection screen 150 in fig. 4) according to the scanning driving signal, and to reflect the light beam output by the light source module 130; the normal of the scanning mirror 142 when stationary forms an angle alpha with the fast axis scanning direction of the raster scanning mode, where alpha is greater than 0 degrees and less than 90 degrees. Fig. 2 shows a case where the normal line of the scanning mirror 142 at rest forms an angle α with the horizontal direction of the projection screen 150.
The processing module 110, the processing module 110 includes a calculating unit 111, and the calculating unit 111 is configured to calculate a light source modulation signal according to the above-mentioned α included angle, the vertical distance d from the scanning mirror 142 to the projection picture 150, the preset pixel pitch L, and the preset deflection angle θ (t) of the scanning mirror 142, where the light source modulation signal of this embodiment specifically includes the lighting time Δ t of each pixel; the calculating unit 111 is configured to calculate the lighting time Δ t of each pixel according to the α included angle, the distance d from the scanning mirror 142 to the projection screen 150, the preset pixel pitch L, and the preset deflection angle θ (t) of the scanning mirror 142.
It can be understood that the micro-electromechanical scanning mirror imaging system provided in this embodiment can adaptively modulate the lighting time of each pixel point n according to the scene parameters of the inclined projected picture of the micro-electromechanical scanning mirror imaging system, such as the included angle α, the vertical distance d from the scanning mirror 142 to the projected picture 150, and the like, so that the pixel pitch of the final projected picture 150 reaches the preset value L, thereby improving the condition that the pixel pitch is not uniform, and improving the imaging quality of the final projected picture 150. As shown in fig. 5, a scene schematic diagram of a horizontal oblique projection image of a mems scanning mirror imaging system provided in this embodiment is shown, and compared with the situation in fig. 2, by adopting the scheme of this embodiment, the uniformity of the pixel pitch of the oblique projection image is significantly improved.
The horizontal driving signal of the scan mirror 142 drives the scan mirror 142 to generate a horizontal deflection angle thetaH(t), here the horizontal deflection angle θH(t) may be understood as the horizontal angle formed by the normal line of the scanning mirror 142 during the rotation process and the normal line of the scanning mirror 142 when the scanning mirror is stationary, that is, the horizontal angle formed by the normal line of the scanning mirror 142 and the normal line of the scanning mirror 142 when the scanning mirror is stationary at time t; the vertical driving signal of the scan mirror 142 drives the scan mirror 142 to generate a vertical deflection angle thetaV(t); the horizontal deflection angle range of the scanning mirror 142 is [ - β/2, + β/2 [ - β/2 ]]Thus, θH(t) ≠ beta/2, which is the horizontal scanning non-end point process; thetaH(t) ± β/2 is exactly the end point of the horizontal scanAngle, above parameter horizontal deflection angle thetaH(t) the horizontal deflection angle range is [ -beta/2, + beta/2]The imaging system is factory set and stored in the storage unit 112 of the processing module 110 in advance.
Fig. 2 is a schematic view of a scene of a horizontal oblique projection image of the mems scanning mirror imaging system. Therefore, specific scene parameters of oblique projection, such as an included angle α formed by a normal of the scanning mirror 142 when the scanning mirror 142 is stationary and a fast axis scanning direction of the raster scanning mode, a vertical distance d from the scanning mirror 142 to the projection screen 150, and a preset pixel pitch L (i.e. the pixel pitch L) of the projection screen 150, can be input into the processing module 110 by the user, and the processing module 110 can include a parameter obtaining unit 113, where the parameter obtaining unit 113 is configured to obtain the pixel pitch L of the projection screen 150, the vertical distance d from the scanning mirror 142 to the projection screen 150, and the included angle α input by the user.
At thetaHIn the case where (t) ≠ β/2, the calculating unit 111 is configured to calculate the lighting time Δ t of each pixel point n according to the following formula:
L＝|d*tan[90°-α+θH(t+Δt)]-d*tan[90°-α+θH(t)]|，
where t is time, θH(t) is the horizontal deflection angle generated by the scanning mirror 142 at the time t, and under the condition that other parameters are known, the lighting time Δ t of the pixel point n corresponding to each time t can be obtained.
When theta isHWhen the value of (t) ± β/2, the lighting time Δ t of each pixel n is calculated to be X, where X is a preset constant, that is, when the scanning mirror 142 horizontally scans to the end point, the lighting time of the corresponding pixel n may be a fixed value, which does not greatly affect the uniformity of the pixel pitch of the projection picture 150. The specific value of X can be set by those skilled in the art according to specific situations, and will not be described herein.
The imaging method of the micro-electromechanical scanning mirror imaging system of the embodiment comprises the following steps:
the method comprises the following steps: firstly, the scanning mirror 142 performs two-dimensional angular deflection in a raster scanning mode under the action of a scanning driving signal, and the deflection angle is theta (t), wherein an included angle alpha is formed between a normal line of the scanning mirror 142 when the scanning mirror is static and a fast axis scanning direction of the raster scanning mode, and alpha is more than 0 degree and less than 90 degrees;
step two: then, the calculating unit 111 calculates to obtain a light source modulation signal according to the α included angle, the distance d from the scanning mirror 142 to the projection picture 150, the preset pixel pitch L, and the preset deflection angle θ (t) of the scanning mirror 142;
step three: and then, the light beam corresponding to each pixel point n of the image 150 to be projected, which is output according to the light source modulation signal, is projected onto the scanning mirror 142, and the scanning mirror 142 reflects the light beam out to form the projection image 150, so that the uniformity adjustment of the pixel point spacing of the projection image 150 is completed.
The above description is only a preferred embodiment of the application and is illustrative of the principles of the technology employed. It will be appreciated by those skilled in the art that the scope of the invention herein disclosed is not limited to the particular combination of features described above, but also encompasses other arrangements formed by any combination of the above features or their equivalents without departing from the spirit of the invention. For example, the above features may be replaced with (but not limited to) features having similar functions disclosed in the present application.
The present invention and its embodiments have been described above schematically, without limitation, and what is shown in the drawings is only one of the embodiments of the present invention, and the actual structure is not limited thereto. Therefore, if the person skilled in the art receives the teaching, without departing from the spirit of the invention, the person skilled in the art shall not inventively design the similar structural modes and embodiments to the technical solution, but shall fall within the scope of the invention.
Claims (7)
1. A microelectromechanical scanning mirror imaging system, comprising:
a circuit module (120) comprising a light source modulation circuit (121) and a scan driving circuit (122), the light source modulation circuit (121) being configured to output a light source modulation signal; the scan driving circuit (122) is configured to output a scan driving signal;
the light source module (130) is configured to output a light beam corresponding to each pixel point n of the picture (150) to be projected according to the light source modulation signal;
a scanning mirror (142) configured to perform two-dimensional angular deflection in a raster scanning manner according to a scanning drive signal and reflect the light beam output by the light source module (130); the normal line of the scanning mirror (142) when in rest forms an included angle alpha with the fast axis scanning direction of the raster scanning mode, wherein the alpha is more than 0 degree and less than 90 degrees;
the processing module (110), the processing module (110) includes a calculating unit (111), wherein the light source modulation signal includes a lighting time Δ t of each pixel point n; the calculation unit (111) is configured to calculate the lighting time Δ t of each pixel point n according to the following formula:
L＝|d*tan[90°-α+θH(t+Δt)]-d*tan[90°-α+θH(t)]|，
wherein L is the pixel pitch of the projection picture (150), d is the vertical distance from the scanning mirror (142) to the projection picture, t is the time, thetaH(t) is the horizontal deflection angle, θ, produced by the scan mirror (142) at time tH(t) ≠ β/2, where (- β/2, + β/2) is the range of horizontal deflection angles of the scan mirror (142).
2. A microelectromechanical scanning mirror imaging system of claim 1, characterized in that the scanning drive signals comprise horizontal drive signals and vertical drive signals, wherein the horizontal drive signals drive the scanning mirror (142) to produce a horizontal deflection angle θH(t); the vertical driving signal drives the scanning mirror (142) to generate a vertical deflection angle thetaV(t)。
3. A mems mirror imaging system according to claim 2, wherein when the normal of the mirror (142) at rest makes an angle α with the fast axis scanning direction of the raster scanning mode, the computing unit (111) is configured to compute the on time Δ t of each pixel n according to the following equation:
when theta isHWhen t is ± β/2, Δ t is X, where X is a predetermined constant.
4. A micro-electromechanical scanning mirror imaging system according to claim 1 or 3, characterized in that said horizontal driving signal is a sine wave signal, driving said scanning mirror (142) to produce a horizontal deflection angle θH(t)。
5. A microelectromechanical scanning mirror imaging system of claim 1, characterized in that the processing module (110) further comprises a storage unit (112), the storage unit (112) being configured to store a horizontal deflection angle θ of the scanning mirror (142)H(t) and the horizontal deflection angle range of the scan mirror (142) is (-beta/2, + beta/2).
6. A mems mirror imaging system according to claim 1 or 3, wherein the processing module (110) further comprises a parameter obtaining unit (113), and the parameter obtaining unit (113) is configured to obtain the pixel pitch L of the projection image, the vertical distance d from the mirror (142) to the projection image (150), and the included angle α.
7. A microelectromechanical scanning mirror imaging method of a microelectromechanical scanning mirror imaging system as set forth in any of claims 1-6, comprising:
the method comprises the following steps: firstly, a scanning mirror (142) performs two-dimensional angular deflection in a raster scanning mode under the action of a scanning driving signal, and the deflection angle is theta (t), wherein an included angle alpha is formed between a normal line of the scanning mirror (142) when the scanning mirror is static and a fast axis scanning direction of the raster scanning mode, and alpha is more than 0 degree and less than 90 degrees;
step two: then, the calculating unit (111) is configured to calculate the lighting time Δ t of each pixel point n according to the following formula, that is, calculate a light source modulation signal:
L＝|d*tan[90°-α+θH(t+Δt)]-d*tan[90°-α+θH(t)]|，
wherein L is the pixel pitch of the projection picture (150), d is the vertical distance from the scanning mirror (142) to the projection picture, t is the time, thetaH(t) is the horizontal deflection angle, θ, produced by the scan mirror (142) at time tH(t) ≠ β/2, where (- β/2, + β/2) is the range of horizontal deflection angles of the scan mirror (142);
step three: and then, projecting light beams corresponding to each pixel point n of the image (150) to be projected, which is output according to the light source modulation signal, onto the scanning mirror (142), and reflecting the light beams out by the scanning mirror (142) to form the projection image (150), thereby completing the uniformity adjustment of the pixel point spacing of the projection image (150).
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