CN110460828A - A kind of micro electromechanical scanning mirror projection system and method - Google Patents
A kind of micro electromechanical scanning mirror projection system and method Download PDFInfo
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- CN110460828A CN110460828A CN201910780842.6A CN201910780842A CN110460828A CN 110460828 A CN110460828 A CN 110460828A CN 201910780842 A CN201910780842 A CN 201910780842A CN 110460828 A CN110460828 A CN 110460828A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N9/00—Details of colour television systems
- H04N9/12—Picture reproducers
- H04N9/31—Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM]
- H04N9/3129—Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM] scanning a light beam on the display screen
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N9/00—Details of colour television systems
- H04N9/12—Picture reproducers
- H04N9/31—Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM]
- H04N9/3138—Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM] using arrays of modulated light sources
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N9/00—Details of colour television systems
- H04N9/12—Picture reproducers
- H04N9/31—Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM]
- H04N9/3141—Constructional details thereof
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- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Mechanical Optical Scanning Systems (AREA)
- Mechanical Light Control Or Optical Switches (AREA)
- Transforming Electric Information Into Light Information (AREA)
Abstract
The invention discloses a kind of micro electromechanical scanning mirror projection system and methods, belong to imaging field, system includes circuit module, light source module, scanning mirror and processing module, wherein, scanning mirror carries out angular deflection under scanning drive signal effect, and the fast axle scanning direction of normal and grating scanning mode when scanning mirror is static is at angle α；Then modulation of source signal is calculated according to α angle, the distance d of scanning mirror to projection image, presetted pixel spacing L and default scanning mirror deflection angle θ (t) in computing unit；Then the corresponding light beam of each pixel to projection image exported according to modulation of source signal is projected on scanning mirror, realize the even regulation of projection image pixel spacing, the present invention is according to the distance of angle α, scanning mirror to projected picture, each pixel can be modulated lights duration, so that final projection image pixel spacing reaches preset value, the non-uniform situation of pixel spacing is improved, ensure that the image quality of projection image.
Description
Technical field
The present invention relates to micro electronmechanical imaging fields, more specifically to a kind of micro electromechanical scanning mirror projection system and side
Method.
Background technique
Minitype portable projection device, such as projection mobile phone, projection wrist-watch, are always the imaging product that people are expected.
Micro electromechanical scanning mirror imaging system is at present with its lesser size and preferable imaging effect, be increasingly becoming most possibly realize it is micro-
One of the technology of type portable translucent equipment.
In a manner of the modulation of source of current micro electromechanical scanning mirror driving method and micro electromechanical scanning mirror imaging system, In
When micro electromechanical scanning mirror imaging system being needed to tilt projection image, such as projected keyboard etc., it is uneven to be easy to appear pixel spacing
Even situation influences the image quality of final projection image.
It is as shown in Figure 1 the schematic diagram of a scenario of the horizontal positive projection image of micro electromechanical scanning mirror imaging system, wherein micro electronmechanical
Normal f when scanning mirror 142 is static is vertical with projected picture 150.It is modulated by current micro electromechanical scanning mirror imaging system
A length of fixed value when lighting of each pixel of projected picture, therefore the horizontal pixel spacing of projected picture 150, such as side in figure
Shown in frame region, micro electromechanical scanning mirror X deflection angle is depended on.And micro electromechanical scanning mirror X deflection angle is depending on micro-
The horizontal scanning drive signal of electromechanical scanning mirror, horizontal scanning drive signal are generally sine wave signal (it could also be possible that three
Angle wave signal, here only illustrate sine wave signal the case where, as shown in Figure 3), the horizontal pixel spacing presented is basic
Equal, picture pixel is more uniform.
It is illustrated in figure 2 the schematic diagram of a scenario of the horizontal tiltedly projection image of micro electromechanical scanning mirror imaging system, wherein micro electronmechanical
Normal f and 150 horizontal direction of projected picture when scanning mirror 142 is static is at angle α, wherein 0 ° of 90 ° of < α <, projected picture 150
Horizontal direction is also the fast axle scanning direction of the grating scanning mode of micro electromechanical scanning mirror.Due to the inclination of angle, cause micro-
The distance for light beam pixel 1 into figure that electromechanical scanning mirror 142 is reflected is more closer than the distance to pixel n, therefore tilts and throw
When penetrating, the pel spacing of pixel 1 to pixel n are become larger in projection image.Pixel spacing is uneven, influences finally to throw
Penetrate the image quality of picture 150.
Summary of the invention
1. technical problems to be solved by the inivention
It is an object of the invention to overcome deficiency in the prior art, a kind of micro electromechanical scanning mirror projection system and method are provided,
Wherein each picture can be modulated according to slanted angle, the vertical range of scanning mirror to projected picture etc. of scanning mirror with being adapted to
Vegetarian refreshments lights duration, so that the pel spacing of final projection image reaches preset value, it is uneven so as to improve pixel spacing
The case where, improve the image quality of final projection image.
2. technical solution
In order to achieve the above objectives, technical solution provided by the invention are as follows:
A kind of micro electromechanical scanning mirror imaging system of the invention, comprising:
Circuit module comprising modulation of source circuit and scan drive circuit, the modulation of source circuit are configured as output light
Source modulated signal；Shown scan drive circuit is configured as output scanning drive signal；
Light source module is configured as exporting the corresponding light beam of each pixel n to projection image according to modulation of source signal；
Scanning mirror is configured as carrying out two-dimensional angular deflection by grating scanning mode according to scanning drive signal, and reflects institute
State the light beam of light source module output；The fast axle scanning direction of normal and grating scanning mode when the scanning mirror is static is at angle
α, wherein 0 ° of 90 ° of < α <；
Processing module, the processing module include computing unit, and the computing unit is configured as according to the α angle, described
The deflection angle θ (t) of scanning mirror to the distance d of projection image, presetted pixel spacing L and preset scanning mirror is calculated
Modulation of source signal.
As further improvement of the present invention, the modulation of source signal includes that each pixel n lights duration Δ
t；The computing unit is configured as distance d, presetted pixel according to the α angle, the scanning mirror to the projection image
The deflection angle θ (t) of spacing L and the preset scanning mirror, each pixel is calculated lights duration Δ t.
As further improvement of the present invention, the scanning drive signal includes horizontal drive signals and perpendicular drive letter
Number, wherein the horizontal drive signals driving scanning mirror generates X deflection angle θH(t)；The vertical driving signal driving
Scanning mirror generates vertical deflection angle θV(t).
As further improvement of the present invention, the fast axle of normal and grating scanning mode when the scanning mirror is static
When scanning direction is at α angle, what the computing unit was configured as being calculated each pixel n according to the following formula lights duration Δ
T:
L=|d*tan[90°-α+θH(t+ Δ t)]-d*tan [90 ° of-α+θH(t)] |,
Wherein, L is the pel spacing of projected picture, and d is scanning mirror to the vertical range of projected picture, and t is moment, θHIt (t) is t
The X deflection angle that scanning mirror described in moment generates, θH(t) ≠ ± β/2, wherein (- β/2 ,+β/2) is the water of the scanning mirror
The range of flat deflection angle.
As further improvement of the present invention, the fast axle of normal and grating scanning mode when the scanning mirror is static
When scanning direction is at α angle, what the computing unit was configured as being calculated each pixel n according to the following formula lights duration Δ
T:
Work as θH(t)=± β/2 when, Δ t=X, wherein X is predetermined constant.
As further improvement of the present invention, the horizontal drive signals are sine wave signal, drive the scanning mirror
Generate X deflection angle θH(t).
As further improvement of the present invention, the processing module further includes storage unit, and the storage unit is matched
It is set to the X deflection angle of storage scanning mirrorAnd the X deflection angle range of the scanning mirror be (- β/2 ,+
β/2).
As further improvement of the present invention, the processing module further includes parameter acquiring unit, and the parameter obtains
Unit is configured as obtaining the vertical range d of the pel spacing L of projected picture, the scanning mirror to projected picture, the angle
α。
A kind of micro electromechanical scanning mirror imaging method of the invention comprising:
Step 1: scanning mirror carries out two-dimensional angular deflection by grating scanning mode under the action of scanning drive signal first,
And deflection angle is θ (t), wherein the fast axle scanning direction of normal and grating scanning mode when the scanning mirror is static is at folder
Angle α, 0 ° of 90 ° of < α <；
Step 2: and then computing unit is according to α angle, the distance d of scanning mirror to projection image, presetted pixel spacing L and pre-
If the deflection angle θ (t) of scanning mirror modulation of source signal is calculated；
Step 3: then the corresponding light beam of each pixel n to projection image exported according to modulation of source signal is projected
Onto scanning mirror, then above-mentioned light beam is reflected away by scanning mirror and forms projection image, thus between completion projection image pixel
Away from uniformity adjust.
3. beneficial effect
Using technical solution provided by the invention, compared with prior art, there is following remarkable result:
Micro electromechanical scanning mirror imaging system provided by the present invention can tilt projection picture according to micro electromechanical scanning mirror imaging system
The scenario parameters in face, for example, the vertical range etc. of the slanted angle of scanning mirror, scanning mirror to projection image, adaptively modulation is every
Going out for a pixel is long when light, so that the pel spacing of final projection image reaches preset value, so as to improve between above-mentioned pixel
Away from non-uniform situation, the image quality of final projection image is improved.
Detailed description of the invention
Fig. 1 is the schematic diagram of a scenario of the horizontal positive projection image of micro electromechanical scanning mirror imaging system；
Fig. 2 is the schematic diagram of a scenario of the horizontal tiltedly projection image of micro electromechanical scanning mirror imaging system；
Fig. 3 is the horizontal scanning drive signal of micro electromechanical scanning mirror and the waveform diagram of vertical scanning driving signal；
Fig. 4 is a kind of schematic diagram of micro electromechanical scanning mirror imaging system provided by the invention；
Fig. 5 is a kind of schematic diagram of a scenario of the horizontal tiltedly projection image of micro electromechanical scanning mirror imaging system provided by the invention.
Label declaration in schematic diagram:
110, processing module；111, computing unit；112, storage unit；113, parameter acquiring unit；
120, circuit module；121, modulation of source circuit；122, scan drive circuit；
130, light source module；
141, micro-electromechanical device；142, scanning mirror；
150, projected picture.
Specific embodiment
To further appreciate that the contents of the present invention, the present invention is described in detail with reference to the accompanying drawings and examples.
Embodiment 1
As shown in figure 4, present embodiments providing a kind of micro electromechanical scanning mirror imaging system, which includes light source module 130, sweeps
Retouch mirror 142, circuit module 120 and processing module 110, in which: circuit module 120, including modulation of source circuit 121 and scanning
Driving circuit 122, the modulation of source circuit 121 are configured as output light source modulated signal, which is configured
To export scanning drive signal.
Modulation of source signal includes two aspects, wherein being on the one hand on the other hand to be to the modulation of pixel n color gray scale
The modulation of duration is lighted to pixel n, specifically the present embodiment is the modulation that duration is lighted to pixel n.As shown in figure 3, sweeping
Retouching driving signal includes horizontal scanning drive signal and vertical scanning driving signal.Wherein, horizontal scanning drive signal is generally
Sinusoidal signal, period T, in general scanning mode use interlacing scan, and therefore, modulation of source signal is only in horizontal sweep
Pixel n is lighted in the preceding half period of driving signal.Vertical scanning driving signal is generally sawtooth signal, is divided into the display phase
Between and flyback during, modulation of source signal does not light pixel n during flyback.
Light source module 130 is configured as exporting n pairs of each pixel to projection image 150 according to modulation of source signal
The light beam answered.Tri-color laser and corresponding three dichroic of the light source module 130 including the green G indigo plant B of red R in Fig. 4
R, G, B light beam modulated is carried out conjunction beam by the wavelength selectivity of dichroic piece P1, P2, P3 by piece P1, P2, P3.
It include the micro-electromechanical device 141 with scanning mirror 142 in Fig. 4.Wherein, scanning mirror 142 is configured as according to scanning
Driving signal carries out two-dimensional angular deflection by grating scanning mode (as shown in the scanning track of projected picture 150 in Fig. 4), and
The light beam that reflection source module 130 exports；The fast axle scanning direction of normal and grating scanning mode when scanning mirror 142 is static at
Angle α, 0 ° of 90 ° of < α <.Be illustrated in figure 2 scanning mirror 142 it is static when normal and projection image 150 horizontal direction at folder
The case where angle α.
Processing module 110, processing module 110 include computing unit 111, which is configured as according to above-mentioned α
Angle, scanning mirror 142 arrive the deflection of the vertical range d, presetted pixel spacing L and preset scanning mirror 142 of projected picture 150
Angle, θ (t), so that modulation of source signal be calculated, specifically the modulation of source signal of the present embodiment includes each pixel
Light duration Δ t；The computing unit 111 be configured as according to α angle, scanning mirror 142 to projection image 150 distance d,
The deflection angle θ (t) of presetted pixel spacing L and the preset scanning mirror 142, are calculated when lighting of each pixel
Long Δ t.
It is appreciated that the present embodiment provided by micro electromechanical scanning mirror imaging system, can according to micro electromechanical scanning mirror at
As the scenario parameters of system tilt projection image, for example, above-mentioned angle α, scanning mirror 142 arrive the vertical range d of projected picture 150
Deng, the duration of lighting of each pixel n is adaptively modulated, so that the pel spacing of final projection image 150 reaches preset value L,
So as to improve the above-mentioned non-uniform situation of pixel spacing, the image quality of final projection image 150 is improved.As shown in figure 5,
For a kind of schematic diagram of a scenario of the horizontal tiltedly projection image of micro electromechanical scanning mirror imaging system provided in this embodiment, compared to Fig. 2
The case where, using the scheme of the present embodiment, the pel spacing uniformity for tilting projection image, which has, to be clearly better.
The horizontal drive signals of scanning mirror 142 drive the scanning mirror 142 to generate X deflection angle θH(t), water here
Flat deflection angle θH(t) normal in 142 rotation process of scanning mirror and level formed by its normal when static be can be understood as
Angular separation, that is, the normal and horizontal direction angle formed by its normal when static for being expressed as t moment scanning mirror 142；Scanning
The vertical driving signal of mirror 142 drives the scanning mirror 142 to generate vertical deflection angle θV(t)；The horizontal deflection angle of scanning mirror 142
Spending range is [- β/2 ,+β/2], therefore, θH(t) ≠ ± β/2 are the process of the non-endpoint of horizontal sweep；θH(t)=± β/2 are
The angle of endpoint, the above parameter level deflection angle θ are just arrived in horizontal sweepH(t), X deflection angle range be [- β/2 ,+
β/2], it is above-mentioned micro electromechanical scanning mirror imaging system default setting, is pre-stored in the storage unit 112 of processing module 110
In.
As shown in Fig. 2, for the schematic diagram of a scenario of the horizontal tiltedly projection image of micro electromechanical scanning mirror imaging system.Therefore can by with
The concrete scene parameter that family will tiltedly be thrown, as normal and grating scanning mode when scanning mirror 142 is static fast axle scanning direction at
The pel spacing L(of angle α, the vertical range d of scanning mirror 142 to projected picture 150 and preset projected picture 150 is
Pel spacing L), it is input in the processing module 110, which may include parameter acquiring unit 113, the parameter
Acquiring unit 113 is configured as obtaining the pel spacing L for the projected picture 150 that user is inputted, scanning mirror 142 to projected picture
150 vertical range d and above-mentioned angle α.
InIn the case where, computing unit 111 is configured as that each pixel n is calculated according to the following formula
Light duration Δ t:
L=|d*tan[90°-α+θH(t+ Δ t)]-d*tan [90 ° of-α+θH(t)] |,
Wherein, t is moment, θH(t) X deflection angle generated for scanning mirror 142 described in t moment is all known in other parameters
In the case where, pixel n's corresponding to available each moment t lights duration Δ t.
Work as θH(t)=± β/2 when, each pixel n is calculated lights duration Δ t=X, wherein X is predetermined constant,
When i.e. 142 horizontal sweep of scanning mirror is to endpoint, the duration of lighting of corresponding pixel points n can be a fixed value, this is to projection
The uniformity of the pel spacing of picture 150 influences little.The occurrence of this X can be by those skilled in the art as the case may be
Appearance setting is carried out, which is not described herein again.
A kind of micro electromechanical scanning mirror imaging method of the present embodiment comprising:
Step 1: it is inclined to carry out two-dimensional angle by grating scanning mode under the action of scanning drive signal for scanning mirror 142 first
Turn, and deflection angle is θ (t), wherein the fast axle scanning side of normal and grating scanning mode when the scanning mirror 142 is static
To at angle α, 0 ° of 90 ° of < α <；
Step 2: and then computing unit 111 is according between α angle, the distance d of scanning mirror 142 to projection image 150, presetted pixel
Modulation of source signal is calculated in deflection angle θ (t) away from L and preset scanning mirror 142；
Step 3: then the corresponding light beam of each pixel n to projection image 150 exported according to modulation of source signal is thrown
It is mapped on scanning mirror 142, then above-mentioned light beam is reflected away by scanning mirror 142 and forms projection image 150, thus complete projection picture
The uniformity of 150 pixel spacing of face is adjusted.
Above description is only the preferred embodiment of the application and the explanation to institute's application technology principle.Those skilled in the art
Member is it should be appreciated that invention scope involved in the application, however it is not limited to technology made of the specific combination of above-mentioned technical characteristic
Scheme, while should also cover in the case where not departing from foregoing invention design, it is carried out by above-mentioned technical characteristic or its equivalent feature
Any combination and the other technical solutions formed.Such as features described above has similar function with (but being not limited to) disclosed herein
Can technical characteristic replaced mutually and the technical solution that is formed.
Schematically the present invention and embodiments thereof are described above, description is not limiting, institute in attached drawing
What is shown is also one of embodiments of the present invention, and actual structure is not limited to this.So if the common skill of this field
Art personnel are enlightened by it, without departing from the spirit of the invention, are not inventively designed and the technical solution
Similar frame mode and embodiment, are within the scope of protection of the invention.
Claims (9)
1. a kind of micro electromechanical scanning mirror imaging system characterized by comprising
Circuit module (120) comprising modulation of source circuit (121) and scan drive circuit (122), the modulation of source circuit
(121) it is configured as output light source modulated signal；Shown scan drive circuit (122) is configured as output scanning drive signal；
Light source module (130) is configured as exporting n pairs of each pixel to projection image (150) according to modulation of source signal
The light beam answered；
Scanning mirror (142) is configured as carrying out two-dimensional angular deflection by grating scanning mode according to scanning drive signal, and anti-
Penetrate the light beam of the light source module (130) output；The fast axle of normal and grating scanning mode when the scanning mirror (142) is static
Scanning direction is at angle α, wherein 0 ° of 90 ° of < α <；
Processing module (110), the processing module (110) include computing unit (111), and the computing unit (111) is configured
For according to the α angle, the scanning mirror (142) to distance d, the presetted pixel spacing L of projection image (150) and preset
The modulation of source signal that the deflection angle θ (t) of scanning mirror (142) is calculated.
2. a kind of micro electromechanical scanning mirror imaging system according to claim 1, which is characterized in that the modulation of source signal
Duration Δ t is lighted including each pixel n；The computing unit (111) is configured as according to the α angle, the scanning
Mirror (142) to the projection image (150) distance d, presetted pixel spacing L and the preset scanning mirror (142) it is inclined
Gyration θ (t), each pixel is calculated lights duration Δ t.
3. a kind of micro electromechanical scanning mirror imaging system according to claim 2, which is characterized in that the scanning drive signal
Including horizontal drive signals and vertical driving signal, wherein horizontal drive signals driving scanning mirror (142) generates horizontal inclined
Gyration θH(t)；Vertical driving signal driving scanning mirror (142) generates vertical deflection angle θV(t).
4. a kind of micro electromechanical scanning mirror imaging system according to claim 3, which is characterized in that when the scanning mirror
(142) when the fast axle scanning direction of normal and grating scanning mode when static is at α angle, the computing unit (111) is matched
Be set to be calculated each pixel n according to the following formula light duration Δ t:
L=|d*tan[90°-α+θH(t+ Δ t)]-d*tan [90 ° of-α+θH(t)] |,
Wherein, L is the pel spacing of projected picture (150), and d is the vertical range that scanning mirror (142) arrive projected picture, when t is
It carves, θH(t) X deflection angle generated for scanning mirror (142) described in t moment, θH(t) ≠ ± β/2, wherein (- β/2 ,+β/2)
For the range of the X deflection angle of the scanning mirror (142).
5. a kind of micro electromechanical scanning mirror imaging system according to claim 3, which is characterized in that when the scanning mirror
(142) when the fast axle scanning direction of normal and grating scanning mode when static is at α angle, the computing unit (111) is matched
Be set to be calculated each pixel n according to the following formula light duration Δ t:
Work as θH(t)=± β/2 when, Δ t=X, wherein X is predetermined constant.
6. a kind of micro electromechanical scanning mirror imaging system according to claim 4 or 5, which is characterized in that the horizontal drive
Signal is sine wave signal, and the scanning mirror (142) is driven to generate X deflection angle θH(t).
7. a kind of micro electromechanical scanning mirror imaging system according to claim 4, which is characterized in that the processing module
It (110) further include storage unit (112), the storage unit (112) is configured as the horizontal deflection angle of storage scanning mirror (142)
DegreeAnd the X deflection angle range of the scanning mirror (142) is (- β/2 ,+β/2).
8. a kind of micro electromechanical scanning mirror imaging system according to claim 4 or 5, which is characterized in that the processing module
It (110) further include parameter acquiring unit (113), the parameter acquiring unit (113) is configured as obtaining the pixel of projected picture
Spacing L, the scanning mirror (142) arrive the vertical range d of projected picture (150), the angle α.
9. a kind of micro electromechanical scanning mirror imaging method a kind of as described in claim any one of 1-8, characterized in that it comprises:
Step 1: scanning mirror (142) carries out two-dimensional angle by grating scanning mode under the action of scanning drive signal first
Deflection, and deflection angle is θ (t), wherein the fast axle of normal and grating scanning mode when the scanning mirror (142) is static is swept
Direction is retouched into angle α, 0 ° of 90 ° of < α <；
Step 2: and then computing unit (111) arrives the distance d of projection image (150) according to α angle, scanning mirror (142), presets
Modulation of source signal is calculated in the deflection angle θ (t) of pel spacing L and preset scanning mirror (142)；
Step 3: the corresponding light beam of each pixel n to projection image (150) that will then be exported according to modulation of source signal
It projects on scanning mirror (142), then above-mentioned light beam is reflected away by scanning mirror (142) and is formed projection image (150), it is thus complete
It is adjusted at the uniformity of projection image (150) pixel spacing.
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| CN111650744A (en) * | 2020-08-04 | 2020-09-11 | 成都极米科技股份有限公司 | Method, device and equipment for adjusting parameters of galvanometer and readable storage medium |
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