CN110379759B - 吸附装置、转移系统及转移方法 - Google Patents

吸附装置、转移系统及转移方法 Download PDF

Info

Publication number
CN110379759B
CN110379759B CN201910604688.7A CN201910604688A CN110379759B CN 110379759 B CN110379759 B CN 110379759B CN 201910604688 A CN201910604688 A CN 201910604688A CN 110379759 B CN110379759 B CN 110379759B
Authority
CN
China
Prior art keywords
substrate
adsorption device
magnetic film
magnetic
target
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201910604688.7A
Other languages
English (en)
Other versions
CN110379759A (zh
Inventor
陈柏良
林永富
田仲広久
岛田康宪
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Century Technology Shenzhen Corp Ltd
Original Assignee
Century Technology Shenzhen Corp Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Century Technology Shenzhen Corp Ltd filed Critical Century Technology Shenzhen Corp Ltd
Priority to CN201910604688.7A priority Critical patent/CN110379759B/zh
Priority to TW108124580A priority patent/TWI736932B/zh
Priority to US16/547,857 priority patent/US11521878B2/en
Publication of CN110379759A publication Critical patent/CN110379759A/zh
Application granted granted Critical
Publication of CN110379759B publication Critical patent/CN110379759B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/673Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
    • H01L21/67333Trays for chips
    • H01L21/67336Trays for chips characterized by a material, a roughness, a coating or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65GTRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G47/00Article or material-handling devices associated with conveyors; Methods employing such devices
    • B65G47/74Feeding, transfer, or discharging devices of particular kinds or types
    • B65G47/90Devices for picking-up and depositing articles or materials
    • B65G47/92Devices for picking-up and depositing articles or materials incorporating electrostatic or magnetic grippers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67709Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations using magnetic elements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67721Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrates to be conveyed not being semiconductor wafers or large planar substrates, e.g. chips, lead frames
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/93Batch processes
    • H01L24/95Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/04Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/075Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00
    • H01L25/0753Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00 the devices being arranged next to each other
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67144Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68368Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used in a transfer process involving at least two transfer steps, i.e. including an intermediate handle substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/75Apparatus for connecting with bump connectors or layer connectors
    • H01L2224/757Means for aligning
    • H01L2224/75733Magnetic holding means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/838Bonding techniques
    • H01L2224/8385Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
    • H01L2224/83851Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester being an anisotropic conductive adhesive
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/93Batch processes
    • H01L2224/95Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
    • H01L2224/9512Aligning the plurality of semiconductor or solid-state bodies
    • H01L2224/95143Passive alignment, i.e. self alignment, e.g. using surface energy, chemical reactions, thermal equilibrium
    • H01L2224/95144Magnetic alignment, i.e. using permanent magnetic parts in the semiconductor or solid-state body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2933/00Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
    • H01L2933/0008Processes
    • H01L2933/0033Processes relating to semiconductor body packages
    • H01L2933/0066Processes relating to semiconductor body packages relating to arrangements for conducting electric current to or from the semiconductor body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005Processes
    • H01L33/0095Post-treatment of devices, e.g. annealing, recrystallisation or short-circuit elimination
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/62Arrangements for conducting electric current to or from the semiconductor body, e.g. lead-frames, wire-bonds or solder balls

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Mechanical Engineering (AREA)
  • Led Device Packages (AREA)
  • Electroluminescent Light Sources (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

本发明提供一种吸附装置,包括:基板,所述基板具有磁性,可产生磁场;以及磁性膜,所述磁性膜设置于所述基板的一表面上并部分覆盖所述基板的所述表面,所述磁性膜产生与所述基板产生的磁场的方向相反的磁场,使得所述表面被所述磁性膜覆盖的位置不表现磁性。本发明提供的吸附装置,可实现仅在吸附装置特定位置产生磁力。本发明还提供一种转移系统及一种转移方法。

Description

吸附装置、转移系统及转移方法
技术领域
本发明涉及显示面板制作领域,尤其涉及一种吸附装置、应用该吸附装置的转移系统及应用该吸附装置的转移方法。
背景技术
在LED显示装置尤其是Micro-LED显示面板的制造过程中,需要将大量的LED移转到具有电路的基板上进行安装固定。一种已知的移转方法是采用静电吸附的方式,即通过静电将待移转的LED吸附到一移转机构上,移转机构将LED传送到基板的上方之后,移除静电,使LED脱离吸附而落到基板上。然而,所述静电吸附的方式存在可能基板上的电路板被静电击伤的风险。
发明内容
本发明一方面提供一种吸附装置,包括:
基板,所述基板具有磁性,可产生磁场;以及
磁性膜,所述磁性膜设置于所述基板的一表面上并部分覆盖所述基板的所述表面,所述磁性膜产生与所述基板产生的磁场的方向相反的磁场,使得所述表面被所述磁性膜覆盖的位置不表现磁性。
本发明另一方面提供一种转移系统,包括:
吸附装置,所述吸附装置为如上述的吸附装置,所述吸附装置用于吸附发光二极管;
目标基板,所述目标基板上设置有多个异方性导电胶,每一个异方性导电胶用于固定连接一个发光二极。
本发明另一方面提供一种转移方法,所述转移方法包括:
提供上述的吸附装置,通过所述吸附装置吸附多个发光二极管;
提供一目标基板,所述目标基板上设置有多个异方性导电胶,移动所述吸附装置或移动所述目标基板,以使所述多个发光二极管与目标基板上的异方性导电胶一一对应接触;
对所述异方性导电胶进行热固化或紫外固化,使所述多个发光二极管脱离所述吸附装置转移至目标基板上。
本实施例提供的吸附装置,包括具有磁性的基板及形成于基板的表面上的磁性膜,磁性膜产生与所述基板产生的磁场的方向相反的磁场。由于磁性膜部分覆盖基板的表面,则基板的表面被磁性膜覆盖的位置的磁性被磁性膜产生的磁性抵消,不体现磁性。而仅基板的表面未被磁性膜覆盖的位置体现磁性,用于吸附目标物体。上述吸附装置,实现了仅在基板的特定位置(未被磁性膜覆盖的位置)而非整块基板产生磁性。
附图说明
图1为本发明实施例提供的吸附装置的立体结构示意图。
图2为图1中吸附装置沿Ⅱ-Ⅱ线的剖面结构示意图。
图3为本发明实施例提供的转移系统的结构示意图。
图4为图3中目标基板的平面结构示意图。
图5为本发明实施例提供的转移方法的流程示意图。
图6为图3中转移系统在一工作状态下的结构示意图。
图7为图3中转移系统在另一工作状态下的结构示意图。
主要元件符号说明
Figure BDA0002120312540000021
Figure BDA0002120312540000031
如下具体实施方式将结合上述附图进一步说明本发明。
具体实施方式
请参阅图1,本实施例提供的吸附装置10,用于通过磁力吸附目标物体(图未示),且本实施例中,吸附装置10尤其适用于吸附尺寸微小的目标物体(微米级)。
请继续参阅图1,吸附装置10包括基板11及设置于基板11的表面111上的磁性膜12,其中,基板11的表面111用于吸附目标物体。
本实施例中,基板11为具有磁性的材料构成,例如铁磁体、亚铁磁体等,基板11具有两个磁极:磁极N和磁极S,并产生磁场。例如,基板11靠近磁性膜12的一侧为其磁极S,基板11远离磁性膜12的一侧为其磁极N。于一变更实施例中,基板11本身不为具备磁性的材料构成,而通过为其施加电流使其产生磁场(电生磁原理)。本发明不对基板11产生磁场的方式作限定。
请参阅图2,磁性膜12设置于基板11的表面111上,并部分覆盖基板11的表面111。磁性膜12包括逆磁性物质121,由于基板11产生磁场,根据逆磁性物质121的特性,逆磁性物质121受到磁场作用而被磁化,形成磁极S和磁极N。具体的,逆磁性物质121靠近基板11的一侧形成磁极S、逆磁性物质121远离基板11的一侧形成磁极S。也即,逆磁性物质121被基板11产生的磁场磁化后,逆磁性物质121上靠近基板11的一侧与基板11上靠近磁性膜12的一侧具有相同磁性的磁极,而逆磁性物质121上远离基板11的一侧与基板11上远离磁性膜12的一侧具有相同磁性的磁极,则逆磁性物质121产生与基板11产生的磁场的方向相反的磁场。磁性膜12包含逆磁性物质121,逆磁性物质121在受到基板11的磁场作用时产生与基板11产生的磁场的方向相反的磁场,则相当于磁性膜12整体产生与基板11产生的磁场的方向相反的磁场。
应当理解,图2中所示基板11与磁性膜12的磁极分布方式并不对本发明造成限制,在本发明的一变更实施例中,基板11与磁性膜12的磁极分布方式可不同,满足“磁性膜12上靠近基板11的一侧与基板11上靠近磁性膜12的一侧具有相同磁性的磁极,而磁性膜12上远离基板11的一侧与基板11上远离磁性膜12的一侧具有相同磁性的磁极”即可。
请继续参阅图2,本实施例中,上述逆磁性物质121为逆磁性磁石121,磁性膜12包括树脂122及混合于树脂122中的多颗逆磁性磁石121。每一逆磁性磁石121被基板11磁化并产生与基板11的磁场的方向相反的磁场。
请同时参阅图1和图2,本实施例中,磁性膜12上形成有多个通孔123,基板11的表面111相对各个通孔123裸露。如上所述,磁性膜12产生与基板11的磁场的方向相反的磁场,因此,在基板11的表面111被磁性膜12覆盖的部分,基板11与磁性膜12产生的磁性相互抵消,不表现出磁性,而仅在基板11的表面111未被磁性膜12覆盖的部分(相对各个通孔123裸露的位置)体现磁性,此部分的磁性为基板11产生的磁性。需要注意的是,若要实现基板11的表面111被磁性膜12覆盖的部分的磁性刚好被磁性膜12产生的磁性抵消,则需要经过有限次的试验,根据基板11产生的磁场力大小以及逆磁性磁石121被磁化后差生的磁性大小,控制磁性膜12中的逆磁性磁石121的尺寸、数量。
本实施例中,多个通孔123呈阵列式排布,应当理解,于本发明一变更实施例中,多个通孔123采取其他的排布方式,例如排列为一整行/列。各个通孔123的内径大小由吸附装置10要吸附的目标物体的尺寸决定,具体的,基板11的表面111对应每一通孔123的位置用于吸附一目标物体,则各个通孔123的内径应大于吸附装置10要吸附的目标物体的尺寸。
进一步的,本实施例中,吸附装置10的形成方式为:在基板11上形成完全覆盖表面111的一整层磁性膜12,并对磁性膜12进行蚀刻(例如激光蚀刻)形成多个通孔123。
本实施例提供的吸附装置10,包括具有磁性的基板11及形成于基板11的表面111上的磁性膜12,磁性膜12产生与所述基板11产生的磁场的方向相反的磁场。由于磁性膜12部分覆盖基板11的表面111,则基板11的表面111被磁性膜12覆盖的位置的磁性被磁性膜12产生的磁性抵消,不体现磁性。而仅基板11的表面111未被磁性膜12覆盖的位置体现磁性,用于吸附目标物体。上述吸附装置10,实现了仅在基板11的特定位置(各个通孔对应位置)而非整块基板11产生磁性;且磁性膜12上形成有多个通孔123,基板11的表面111上对应每一通孔123的位置皆吸附一目标物体,则吸附装置10可实现单次吸附多个目标物体。
请参阅图3,本实施例还提供一种转移系统20,转移系统20包括吸附装置10及目标基板21。本实施例中,转移系统20用于完成显示面板制作过程中发光二极管22(也即上述的目标物体)的单次巨量转移(一次吸附多颗发光二极管22)。
本实施例中,吸附装置10如上述,此处不再赘述。请同时参阅图3和图4,目标基板21为显示面板的有源基板(或阵列基板),其上定义有多个像素区域211。转移系统20工作过程中,多个像素区域211对应基板11的表面111上未被磁性膜12覆盖的部分(对应通孔123的位置)。也即,基板11的表面111上未被磁性膜12覆盖的部分吸附发光二极管22至目标基板21上的对个像素区域211。本实施例中,多个像素区域211呈阵列式排布,多个通孔123也呈阵列式排布,多个像素区域211与多个通孔123一一对应。且目标基板21上设置有多个异方性导电胶212,每一像素区域211中设置有一异方性导电胶212,因此多个异方性导电胶212也呈阵列式排布。本实施例中,发光二极管22为如迷你发光二极管(mini Light EmitDiode,mini LED)或微型发光二极管(Micro Light Emit Diode,Micro LED)等。
请参阅图5,本实施例还提供一种转移方法,应用于上述的转移系统20中,转移方法包括:
步骤S1,提供上述的吸附装置,通过所述吸附装置吸附多个发光二极管;
步骤S2,提供一目标基板,所述目标基板上设置有多个异方性导电胶,移动所述吸附装置或移动所述目标基板,以使所述多个发光二极管与目标基板上的异方性导电胶一一对应接触;
步骤S3,对所述异方性导电胶进行热固化或紫外固化,使所述多个发光二极管脱离所述吸附装置转移至目标基板上。
请一并参阅图3及图5,步骤S1中,将基板11设置有磁性膜12的表面111正对发光二极管22,发光二极管22由具有磁性的材料制成或其包含磁性粒子,使得发光二极管22具有与各个基板11表面111相对各个通孔123裸露的位置相反的磁性,则发光二极管22受到指向吸附装置10方向的磁力,被基板11吸附住。基板11上有多个通孔123,基板11的表面111对应每一通孔123的位置吸附一颗发光二极管22,则吸附装置10单次可吸附多个发光二极管22,在显示面板制程中,吸附装置10单次可吸附的发光二极管22数量可达到上万颗。
请一并参阅图5及图6,步骤S2中,通过移动吸附装置10至目标基板21或移动目标基板21至吸附装置10,使得吸附装置10所吸附的各个发光二极管22与目标基板21上的异方性导电胶212一一对应接触。
请一并参阅图5及图7,步骤S3中,再对异方性导电胶212进行热固化或UV固化,使得各个发光二极管22一一对应被粘附于异方性导电胶212上。发光二极管22与异方性导电胶212之间的粘附力大于吸附装置10对发光二极管22的吸附力,移动吸附装置10,发光二极管22即可从吸附装置10脱离,而被固定于目标基板21。
如上述的过程,即可实现单次吸附多个发光二极管22并将其转移至目标基板21,尤其是在发光二极管22(mini LED:次毫米级发光二极管,尺寸约为100μm~200μm以上;Micro LED:尺寸为100μm以下)的尺寸较小的情况下,上述的转移系统20有利于提高显示面板的制作效率。
本技术领域的普通技术人员应当认识到,以上的实施方式仅是用来说明本发明,而并非用作为对本发明的限定,只要在本发明的实质精神范围之内,对以上实施例所作的适当改变和变化都落在本发明要求保护的范围之内。

Claims (8)

1.一种吸附装置,其特征在于,包括:
基板,所述基板具有磁性,可产生磁场;以及
磁性膜,所述磁性膜设置于所述基板的一表面上并部分覆盖所述基板的所述表面,所述磁性膜包括树脂及混合于所述树脂中的多颗逆磁性磁石,所述树脂粘附于所述基板的所述表面,所述多颗逆磁性磁石被基板磁化产生与基板的磁场方向相反的磁场,使得所述表面被所述磁性膜覆盖的位置不表现磁性。
2.如权利要求1所述的吸附装置,其特征在于,所述磁性膜上形成有间隔设置的多个通孔以使所述基板的所述表面相对露出,所述表面相对各个所述通孔露出的位置具有磁性以吸附目标物体。
3.如权利要求2所述的吸附装置,其特征在于,所述目标物体为发光二极管。
4.如权利要求1所述的吸附装置,其特征在于,所述基板为具有磁性的材料构成或所述基板通电流以产生磁性。
5.一种转移系统,其特征在于,包括:
吸附装置,所述吸附装置为如权利要求1~4任一项所述的吸附装置,所述吸附装置用于吸附发光二极管;
目标基板,所述目标基板上设置有多个异方性导电胶,每一个异方性导电胶用于固定连接一个发光二极管。
6.如权利要求5所述的转移系统,其特征在于,所述目标基板为显示面板的有源基板,所述目标基板定义有多个像素区域,各个所述像素区域的位置与所述基板的所述表面上未被所述磁性膜覆盖的位置对应。
7.如权利要求6所述的转移系统,其特征在于:
所述吸附装置为如权利要求2或3所述的吸附装置,所述多个像素区域与所述多个通孔一一对应。
8.一种转移方法,其特征在于,所述转移方法包括:
提供权利要求1~4任一项所述的吸附装置,通过所述吸附装置吸附多个发光二极管;
提供一目标基板,所述目标基板上设置有多个异方性导电胶,移动所述吸附装置或移动所述目标基板,以使所述多个发光二极管与目标基板上的异方性导电胶一一对应接触;
对所述异方性导电胶进行热固化或紫外固化,使所述多个发光二极管脱离所述吸附装置转移至目标基板上。
CN201910604688.7A 2019-07-05 2019-07-05 吸附装置、转移系统及转移方法 Active CN110379759B (zh)

Priority Applications (3)

Application Number Priority Date Filing Date Title
CN201910604688.7A CN110379759B (zh) 2019-07-05 2019-07-05 吸附装置、转移系统及转移方法
TW108124580A TWI736932B (zh) 2019-07-05 2019-07-11 吸附裝置、轉移系統及轉移方法
US16/547,857 US11521878B2 (en) 2019-07-05 2019-08-22 Adsorption device, transferring system having same, and transferring method using same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910604688.7A CN110379759B (zh) 2019-07-05 2019-07-05 吸附装置、转移系统及转移方法

Publications (2)

Publication Number Publication Date
CN110379759A CN110379759A (zh) 2019-10-25
CN110379759B true CN110379759B (zh) 2021-02-02

Family

ID=68252183

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910604688.7A Active CN110379759B (zh) 2019-07-05 2019-07-05 吸附装置、转移系统及转移方法

Country Status (3)

Country Link
US (1) US11521878B2 (zh)
CN (1) CN110379759B (zh)
TW (1) TWI736932B (zh)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110379758B (zh) * 2019-07-05 2021-02-02 深超光电(深圳)有限公司 吸附装置、转移系统及转移方法
CN110518098B (zh) * 2019-09-26 2020-12-29 京东方科技集团股份有限公司 一种微型发光二极管芯片的巨量转移方法及系统
CN111863694B (zh) * 2020-07-17 2022-03-29 深圳市华星光电半导体显示技术有限公司 转移装置及转移方法
CN112435946A (zh) * 2020-11-16 2021-03-02 申广 Led芯片巨量转移方法、转移装置及显示屏制作方法
TWI811625B (zh) * 2021-01-29 2023-08-11 台灣愛司帝科技股份有限公司 晶片移轉方法、晶片移轉裝置以及影像顯示器
CN113053793B (zh) * 2021-03-19 2023-02-03 江西乾照光电有限公司 一种Micro LED阵列器件巨量转移装置及转移方法
CN114162602B (zh) * 2021-12-14 2023-12-19 广州得尔塔影像技术有限公司 装拆盖装置以及装拆盖设备

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002261058A (ja) * 2001-03-06 2002-09-13 Sumitomo Electric Ind Ltd 化合物半導体ウエハの製造方法
JP2006140398A (ja) * 2004-11-15 2006-06-01 Sony Corp 素子転写方法
US20060223225A1 (en) * 2005-03-29 2006-10-05 Symbol Technologies, Inc. Method, system, and apparatus for transfer of integrated circuit dies using an attractive force
JP5435299B2 (ja) * 2008-03-07 2014-03-05 日本電気株式会社 半導体装置
WO2014068690A1 (ja) * 2012-10-31 2014-05-08 中外炉工業株式会社 基板保持装置
WO2015013864A1 (zh) * 2013-07-29 2015-02-05 晶元光电股份有限公司 选择性转移半导体元件的方法
WO2016061452A1 (en) * 2014-10-16 2016-04-21 Rensselaer Polytechnic Institute Directed self-assembly of electronic components using diamagnetic levitation
US9698134B2 (en) * 2014-11-27 2017-07-04 Sct Technology, Ltd. Method for manufacturing a light emitted diode display
KR20170026957A (ko) * 2015-08-31 2017-03-09 삼성디스플레이 주식회사 표시 장치 및 상기 표시 장치의 제조 방법
CN107305915B (zh) * 2016-04-19 2019-04-05 财团法人工业技术研究院 电子-可编程磁性转移模块和电子元件的转移方法
US20180261570A1 (en) * 2017-03-13 2018-09-13 SelfArray, Inc. Methods and systems for parallel assembly, transfer, and bonding of ferromagnetic components
TWI605536B (zh) * 2017-04-12 2017-11-11 財團法人工業技術研究院 磁性轉移模組及轉移電子元件的方法
CN107425101B (zh) * 2017-07-11 2019-03-01 华灿光电(浙江)有限公司 一种微型发光二极管芯片巨量转移的方法
US20190015873A1 (en) * 2017-07-12 2019-01-17 SelfArray, Inc. Methods and systems for sorting a plurality of components for directed self-assembly
US20190019717A1 (en) * 2017-07-12 2019-01-17 SelfArray, Inc. Design for a tessellated magnetic stage for the parallel assembly of diamagnetic components
CN107680983B (zh) * 2017-10-30 2022-03-29 厦门乾照光电股份有限公司 Micro LED阵列器件、拾取装置及相关制作方法、转运方法
KR101949047B1 (ko) * 2017-12-06 2019-02-15 인하대학교 산학협력단 픽 앤 플레이스 장치
CN109273565B (zh) * 2018-10-15 2021-02-02 华映科技(集团)股份有限公司 一种微发光二极管芯片的转移方法
CN109378370B (zh) * 2018-12-05 2020-08-25 合肥京东方光电科技有限公司 微型led的转移设备、显示基板的制造系统及制造方法
CN109801868A (zh) * 2019-01-15 2019-05-24 严光能 芯片转移装置及其制作方法、led芯片转移方法
CN109782463B (zh) * 2019-03-28 2022-06-03 京东方科技集团股份有限公司 防吸附装置、防吸附方法和显示装置

Also Published As

Publication number Publication date
US11521878B2 (en) 2022-12-06
CN110379759A (zh) 2019-10-25
US20210005490A1 (en) 2021-01-07
TW202103245A (zh) 2021-01-16
TWI736932B (zh) 2021-08-21

Similar Documents

Publication Publication Date Title
CN110379759B (zh) 吸附装置、转移系统及转移方法
CN110379758B (zh) 吸附装置、转移系统及转移方法
CN109378370B (zh) 微型led的转移设备、显示基板的制造系统及制造方法
KR102572669B1 (ko) 전기 소자 이송 장치
CN107680983B (zh) Micro LED阵列器件、拾取装置及相关制作方法、转运方法
US20110151588A1 (en) Method and magnetic transfer stamp for transferring semiconductor dice using magnetic transfer printing techniques
US11676839B2 (en) Method for making adsorption device
US20100170086A1 (en) Device, unit, system and method for the magnetically-assisted assembling of chip-scale, and nano and micro-scale components onto a substrate
CN107783331B (zh) 器件转移装置及其转移器件的方法、器件转移板
JP6600060B2 (ja) マイクロコンポーネントデバイスの大量配列方法およびシステム
CN109003966A (zh) 显示面板及其制作方法
CN110418517A (zh) 显示面板的小型发光二极管表面粘着组装方法
US11498779B2 (en) Adsorption device, method for making same, and transferring system having same
US9502625B2 (en) Electrophotographic deposition of unpackaged semiconductor device
KR102538376B1 (ko) 마이크로 발광 다이오드 어레이 소자, 제작 방법 및 이송 방법
WO2020107874A1 (zh) 微发光二极管阵列器件、转移装置及转移方法
US10566507B2 (en) Apparatus for high speed printing of semiconductor devices
TWI829172B (zh) 巨量轉移系統及巨量轉移方法
WO2020252577A1 (en) High throughput microprinting process

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant