CN110376499B - System and method for measuring three-terminal current waveform and annealing effect of triode and method for measuring neutron fluence - Google Patents

System and method for measuring three-terminal current waveform and annealing effect of triode and method for measuring neutron fluence Download PDF

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CN110376499B
CN110376499B CN201910640619.1A CN201910640619A CN110376499B CN 110376499 B CN110376499 B CN 110376499B CN 201910640619 A CN201910640619 A CN 201910640619A CN 110376499 B CN110376499 B CN 110376499B
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triode
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CN110376499A (en
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白小燕
刘岩
陈伟
齐超
金晓明
王桂珍
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Northwest Institute of Nuclear Technology
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Abstract

The invention provides a system and a method for measuring the waveform and the annealing effect of three-terminal current of a triode and a neutron fluence measuring method in order to accurately measure the three-terminal current of the triode, the annealing effect and the neutron fluence under pulsed neutron irradiation. The invention measures the response of the current at three ends of the triode to be measured to the pulse neutron under the condition of fixing the emitter current of the triode to be measured, and the offset of the triode is not influenced by the photocurrent during irradiation, thereby realizing the accurate measurement of the annealing effect of the triode under the irradiation of the pulse neutron and the neutron fluence in an unknown irradiation field.

Description

System and method for measuring three-terminal current waveform and annealing effect of triode and method for measuring neutron fluence
Technical Field
The invention relates to a triode annealing effect measuring system under the condition of pulse neutron radiation, in particular to a triode three-terminal current waveform and annealing effect measuring system and method and a neutron fluence measuring method under the condition of fixed emitter current.
Background
Under pulsed neutron irradiation, a large number of displacement loss defects (clusters) are generated in the semiconductor: vacancy and interstitial atom pairs. The initially formed simple defects (clusters) can be recombined with various particles such as self, impurity atoms, doping atoms and the like to form complex defects (clusters), the defect evolution process has an important basic position in the research of the neutron radiation effect of a semiconductor, and the measurement of the annealing effect of a triode under the irradiation condition of pulsed neutrons is an excellent means for experimentally researching the defect evolution.
Under steady-state neutron irradiation, the amplification factor of the triode under the fixed collector current is usually measured by adopting a voltage scanning or current scanning method, so that the measurement of the annealing effect of the triode is realized, and the measurement principle is shown in fig. 1. In the scanning method, the input voltage or current in one scanning period is changed, so the current at three ends of the triode is also changed, and the irradiation of pulse neutrons can also cause the change of the current at three ends of the triode, so under the irradiation condition of the pulse neutrons, if the scanning method is adopted, the change of the current caused by the irradiation is difficult to judge unless the time length of one scanning period is far less than the width of the pulse neutrons. However, if the scan time is too short, the triode will not respond. Therefore, the scanning method is not suitable for measuring the three-terminal current of the triode under the pulse neutron environment, and therefore a new measuring system needs to be established for accurately measuring the three-terminal current and/or the annealing effect of the triode under the pulse neutron irradiation.
In addition, measurement of the neutron fluence of an unknown irradiation field can be realized by accurately measuring the three-terminal current of the triode under the irradiation of the pulse neutrons.
Disclosure of Invention
The invention solves the problem that the current at three ends of the triode is accurately measured under the irradiation of pulse neutrons, thereby providing a system and a method for measuring the waveform of the current at three ends of the triode.
The invention solves the problem that the annealing effect of the triode is accurately measured under the irradiation of the pulsed neutrons, thereby providing a measuring system and a measuring method of the annealing effect of the triode.
The invention solves the third problem of accurately measuring the neutron fluence in the radiation environment, thereby providing a neutron fluence measuring method.
The technical solution of the invention is as follows:
a measuring system for the three-terminal current waveform of a triode is used for measuring the three-terminal current waveform of the triode under the condition of pulse neutron radiation; it is characterized in that: the device comprises a computer, a triode current measuring circuit and a trigger circuit;
the triode current measuring circuit comprises a data acquisition card, a low-voltage power supply, a test board and an irradiation board; the low-voltage power supply is used for providing bias voltage for the triode to BE tested and ensuring positive bias of BE junction and reverse bias of BC junction of the triode to BE tested;
the triggering circuit comprises a neutron detector and a high-voltage power supply; the neutron detector is used for monitoring pulse neutron time waveform and providing a trigger signal for the triode current measuring circuit; the high-voltage power supply is used for providing bias voltage for the neutron detector;
the irradiation board and the neutron detector are arranged in the irradiation room, and the data acquisition card, the low-voltage power supply, the test board and the high-voltage power supply are arranged in the test room; the test board is connected with the irradiation board, and the high-voltage power supply is connected with the neutron detector through transmission lines;
the computer is connected with the data acquisition card and is used for controlling the data acquisition card, realizing parameter configuration, current measurement and data storage of the data acquisition card and generating current waveforms of three ends of the triode according to data acquired by the data acquisition card;
the irradiation plate is used for placing the triode to be tested;
the test board is provided with the triode current measuring circuit for measuring the current of the three ends of the triode to be measured, and the triode current measuring circuit must meet the following conditions: 1) ensuring that the triode to be tested works in an amplification state before and after irradiation; 2) ensuring the current of the emitting electrode of the triode to be tested to be fixed; 3) the BC junction of the triode to BE tested is ensured to BE always in a reverse bias state and the BE junction is always in a forward bias state during pulse irradiation.
Furthermore, the trigger circuit also comprises an oscilloscope arranged in the test room, and the oscilloscope is connected with the neutron detector and the data acquisition card through transmission lines respectively; the computer is also used for realizing parameter configuration of the oscilloscope.
Further, the neutron detector is a diamond neutron detector or an inorganic scintillator detector.
Furthermore, the triode current measuring circuit comprises a shunt diode D1, a constant current diode D2 and a sampling resistor RB、REAnd RCAnd a voltage dividing resistor Rs；
Figure GDA0002924527420000031
Sampling resistor RBOne end of the sampling resistor R is connected with the base electrode of the triode to be testedBThe other end of the resistor is grounded, and a sampling resistor RCOne end of the sampling resistor R is connected with the collector of the triode to be testedCAt the other end VCC(ii) a Sampling resistor REOne end of the sampling resistor is connected with an emitting electrode of the triode to be tested and the sampling resistor REThe other end of the constant current diode D2 is connected with one end of the constant current diode D2, and the other end of the constant current diode D8932 is connected with VEESaid V isCCAnd VEESupplied by said low voltage source, VCCAnd VEEThe size of the positive bias voltage enables a BE junction of the triode to BE tested to BE positively biased and a BC junction of the triode to BE negatively biased;
one end of the shunt diode D1 is connected with the base electrode of the triode to be tested and the sampling resistor RBAnd the other end of the shunt diode D1 passes through the voltage-dividing resistor RsIs connected with VSSSaid V isSSSupplied by said low voltage source, VSSEnsuring positive bias of BE junction and reverse bias of BC junction of the triode to BE tested during pulse irradiation;
sampling resistor RBVoltage V acrossRB1、VRB2Sampling resistor REVoltage V acrossRE1、VRE2Sampling resistor RCVoltage V acrossRC1、VRC2Two ends R of the divider resistorsVoltage V ofRS1、VRS2And the signals are respectively sent to four analog input channels of the data acquisition card.
Further, a sampling resistor RB、RE、RCAnd a voltage dividing resistor RsVoltage at either end not exceeding 10V, RB、RE、RCAnd RsThe voltage difference between the two ends is less than or equal to 10V.
Further, the voltage VSSCannot be higher than VCC-(Iγ+IC)Rc-IγRs-VD2Cannot be lower than VEE-IERE-IγRs-VD2+VD1Wherein: i isγRepresenting the magnitude of the photocurrent, V, during irradiationD2Representing the voltage difference, V, across the constant current diode D2D1Representative shunting diodeVoltage difference across tube D1, ICRepresenting the collector current of a triode, IERepresenting the emitter current of the transistor.
Further, in the measurement process, the data acquisition card is in a single-trigger state, and the analog input channel is set as differential input.
The invention also provides a measuring method of the three-terminal current waveform of the triode, which is used for realizing the measurement of the three-terminal current waveform of the triode under the condition of pulse neutron radiation; it is characterized by comprising the following steps:
1) building a current measuring circuit:
the emitting end of the triode to be tested is connected with a sampling resistor R in seriesEAnd a constant current diode D2, and the other end D2 of the constant current diode is connected with VEE(ii) a A sampling resistor R is connected in series with the base of the triode to be testedBAnd sampling the resistance RBThe other end of the first and second electrodes is grounded; at the base electrode and the sampling resistor R of the triode to be testedBOne end of a shunt diode D1 is connected between the two ends, and the other end of the shunt diode D1 passes through a voltage dividing resistor RsIs connected with VSS(ii) a A sampling resistor R is connected in series with the collector of the triode to be testedCSampling resistor RCAt the other end VCC；
Figure GDA0002924527420000041
VCCAnd VEEThe BE junction and the BC junction of the triode to BE tested are positively biased and reversely biased; voltage VSSThe reverse bias of a BC junction and the positive bias of a BE junction of the triode during the irradiation period are ensured;
2) placing the triode to be tested on the irradiation plate in the irradiation room, and placing the other devices on the test plate outside the irradiation room; the irradiation plate is connected with the test plate through a transmission line; the neutron detector is placed in the irradiation room, the high-voltage power supply and the oscilloscope are placed in the test room, and the input and the output of the neutron detector are respectively connected with the high-voltage power supply and the acquisition channel of the oscilloscope through transmission lines; the trigger output end of the oscilloscope is connected with the input trigger end of the data acquisition card;
3) measuring sampling resistance R by using data acquisition card before irradiationBVoltage difference V between both endsRBSampling resistor REVoltage difference V between both endsREAnd a sampling resistor RCVoltage difference V between both endsRCAnd storing;
4) turning on a high-voltage power supply to supply power to the neutron detector, enabling the oscilloscope to be in a single self-triggering preparation state, enabling the data acquisition card to be in a single triggering preparation state, and waiting for arrival of pulse neutrons;
5) after the data acquisition card is successfully triggered, the sampling resistor R is acquired and storedBVoltage difference V between both endsRBAnd a sampling resistor REVoltage difference V between both endsRESampling resistor RCVoltage difference V between both endsRCA voltage dividing resistor RsVoltage difference V between both endsRSThese four voltage waveforms;
6) calculating the current values of the base electrode, the emitting electrode and the collector of the triode to be tested at each sampling moment under the condition of pulse neutron radiation according to the voltage sampling value obtained in the step 5), thereby obtaining the current waveforms of the base electrode, the emitting electrode and the collector of the triode to be tested. Can be based on a voltage dividing resistor RsVoltage difference V between both endsRSEstimating the magnitude of the photocurrent as VSSA selected reference.
Further, in step 1): voltage VSSNot less than VEE-IERE-IγRs-VD2+VD1And is not higher than VCC-(Iγ+IC)Rc-IγRs-VD2(ii) a Wherein: i isγRepresenting the magnitude of the photocurrent, V, during irradiationD2Representing the voltage difference, V, across the constant current diode D2D1Representing the voltage difference across the shunt diode D1, ICRepresenting the collector current of a triode, IERepresenting the emitter current of the transistor. I isγEstimating according to neutron fluence and empirical value of gamma before irradiation, and dividing resistance R after irradiationsVoltage difference V between two endsRSIs estimated by methods known in the art.
The invention also provides a triode annealing effect measuring system which is used for measuring the triode annealing effect under the condition of pulse neutron radiation; it is characterized in that: the device comprises a computer, a triode current measuring circuit and a trigger circuit;
the triode current measuring circuit comprises a data acquisition card, a low-voltage power supply, a test board and an irradiation board; the low-voltage power supply is used for providing bias voltage for the triode to BE tested and ensuring positive bias of BE junction and reverse bias of BC junction of the triode to BE tested;
the triggering circuit comprises a neutron detector and a high-voltage power supply; the neutron detector is used for monitoring pulse neutron time waveform and providing a trigger signal for the triode current measuring circuit; the high-voltage power supply is used for providing bias voltage for the neutron detector;
the irradiation board and the neutron detector are arranged in the irradiation room, and the data acquisition card, the low-voltage power supply, the test board and the high-voltage power supply are arranged in the test room; the test board is connected with the irradiation board, and the high-voltage power supply is connected with the neutron detector through transmission lines;
the computer is connected with the data acquisition card and is used for controlling the data acquisition card, realizing parameter configuration, current measurement and data storage of the data acquisition card and acquiring an annealing effect curve of the triode according to data acquired by the data acquisition card;
the irradiation plate is used for placing the triode to be tested;
the test board is provided with the triode current measuring circuit for measuring the current of the three ends of the triode to be measured, and the triode current measuring circuit must meet the following conditions: 1) ensuring that the triode to be tested works in an amplification state before and after irradiation; 2) ensuring the current of the emitting electrode of the triode to be tested to be fixed; 3) the BC junction of the triode to BE tested is always in a reverse bias state and the BE junction is always in a forward bias state during pulse irradiation.
Furthermore, the trigger circuit also comprises an oscilloscope arranged in the test room, and the oscilloscope is connected with the neutron detector and the data acquisition card through transmission lines respectively; the computer is also used for realizing parameter configuration of the oscilloscope.
Further, the neutron detector is a diamond neutron detector or an inorganic scintillator detector.
Further, the triode current measuring circuit comprises a shunt diode D1,Constant current diode D2 and sampling resistor RB、REAnd RCAnd a voltage dividing resistor Rs；
Figure GDA0002924527420000061
Sampling resistor RBOne end of the sampling resistor R is connected with the base electrode of the triode to be testedBThe other end of the resistor is grounded, and a sampling resistor RCOne end of the sampling resistor R is connected with the collector of the triode to be testedCAt the other end VCC(ii) a Sampling resistor REOne end of the sampling resistor is connected with an emitting electrode of the triode to be tested and the sampling resistor REThe other end of the constant current diode D2 is connected with one end of the constant current diode D2, and the other end of the constant current diode D8932 is connected with VEESaid V isCCAnd VEESupplied by said low voltage source, VCCAnd VEEThe size of the positive bias voltage enables a BE junction of the triode to BE tested to BE positively biased and a BC junction of the triode to BE negatively biased;
one end of the shunt diode D1 is connected with the base electrode of the triode to be tested and the sampling resistor RBAnd the other end of the shunt diode D1 passes through the voltage-dividing resistor RsIs connected with VSS；
Sampling resistor RBVoltage V acrossRB1、VRB2Sampling resistor REVoltage V acrossRE1、VRE2Sampling resistor RCVoltage V acrossRC1、VRC2Two ends R of the divider resistorsVoltage V ofRS1、VRS2And the signals are respectively sent to four analog input channels of the data acquisition card.
The invention also provides a measuring method of the triode annealing effect, which is used for measuring the triode annealing effect under the condition of pulse neutron radiation; it is characterized by comprising the following steps:
1) building a current test circuit:
the emitting end of the triode to be tested is connected with a sampling resistor R in seriesEAnd a constant current diode D2, and the other end D2 of the constant current diode is connected with VEE(ii) a A sampling resistor R is connected in series with the base of the triode to be testedBAnd sampling the resistance RBIn addition toOne end is grounded; at the base electrode and the sampling resistor R of the triode to be testedBOne end of a shunt diode D1 is connected between the two ends, and the other end of the shunt diode D1 passes through a voltage dividing resistor RsIs connected with VSS(ii) a A sampling resistor R is connected in series with the collector of the triode to be testedCSampling resistor RCAt the other end VCC；
Figure GDA0002924527420000071
VCCAnd VEEThe BE junction and the BC junction of the triode to BE tested are positively biased and reversely biased; voltage VSSThe reverse bias of a BC junction and the positive bias of a BE junction of the triode during the irradiation period are ensured;
2) placing the triode to be tested on the irradiation plate in the irradiation room, and placing the other devices on the test plate outside the irradiation room; the irradiation plate is connected with the test plate through a transmission line; the neutron detector is placed in the irradiation room, the high-voltage power supply and the oscilloscope are placed in the test room, and the input and the output of the neutron detector are respectively connected with the high-voltage power supply and the acquisition channel of the oscilloscope through transmission lines; the trigger output end of the oscilloscope is connected with the input trigger end of the data acquisition card;
3) measuring sampling resistance R by using data acquisition card before irradiationBVoltage difference V between both endsRBSampling resistor REVoltage difference V between both endsREAnd a sampling resistor RCVoltage difference V between both endsRCAnd storing;
4) turning on a high-voltage power supply to supply power to the neutron detector, enabling the oscilloscope to be in a single self-triggering preparation state, enabling the data acquisition card to be in a single triggering preparation state, and waiting for arrival of pulse neutrons;
5) after the data acquisition card is successfully triggered, the sampling resistor R is acquired and storedBVoltage difference V between both endsRBSampling resistor REVoltage difference V between both endsRESampling resistor RCVoltage difference V between both endsRCA voltage dividing resistor RsVoltage difference V between both endsRSThese four voltage waveforms;
6) calculating the base electrode, the emitting electrode and the sum of the triode to be tested at each sampling moment under the condition of pulse neutron radiation according to the voltage sampling value obtained in the step 5)The current value of the collector electrode is obtained, so that the current waveforms of the base electrode, the emitter electrode and the collector electrode of the triode to be tested are obtained; according to the voltage-dividing resistance RsVoltage difference V between both endsRSEstimating the magnitude of the photocurrent as VSSA selected reference;
7) under the condition that the emitter current of the triode is fixed and unchanged, calculating the annealing factor AF of the triode:
Figure GDA0002924527420000072
in the above formula:
AF is an annealing factor; i isB(0) A triode base current at an initial time; i isB(t) triode base current at time t, IB(∞) represents the triode base current for an infinitely long time.
Further, in step 1): voltage VSSNot less than VEE-IERE-IγRs-VD2+VD1And is not higher than VCC-(Iγ+IC)Rc-IγRs-VD2(ii) a Wherein: i isγRepresenting the magnitude of the photocurrent, V, during irradiationD2Representing the voltage difference, V, across the constant current diode D2D1Representing the voltage difference across the shunt diode D1, ICRepresenting the collector current of the transistor and IE the emitter current of the transistor. I isγEstimating according to neutron fluence and empirical value of gamma before irradiation, and dividing resistance R after irradiationsVoltage difference V between two endsRSIs estimated by methods known in the art.
The invention also provides a neutron fluence measuring method, which is used for realizing the measurement of the neutron fluence in the radiation environment; the method is characterized by comprising the following steps:
1) measuring the change of the current at three ends of the triode along with the neutron fluence in the radiation field with the known neutron fluence, and calculating the amplification factor of the triode under the condition of fixed emitter current according to the current
Figure GDA0002924527420000081
Obtaining a change curve of the reciprocal of the amplification factor of the triode along with the neutron fluence, and carrying out linear fitting on the change curve to obtain the slope of the change curve, wherein the slope is the neutron damage constant of the minority carrier of the triode;
2) after the triode is annealed at high temperature, the triode is placed in a radiation field with unknown neutron fluence to measure the current change of the three ends of the triode, and then the amplification factor of the triode under the condition of fixed emitter current is calculated according to the current
Figure GDA0002924527420000082
Thereby obtaining the reciprocal of the amplification factor of the triode; measuring the three-terminal current change is realized by adopting the method for measuring the three-terminal current waveform of the triode; i isCIs the collector current of the triode; i isBIs the base current of the triode;
3) calculating corresponding neutron fluence according to the reciprocal of the amplification factor of the triode obtained in the step 2) and the neutron damage constant of the minority carrier obtained in the step 1).
The invention has the beneficial effects that:
1) the invention measures the response of the current at three ends of the triode to be measured to the pulse neutrons under the condition of fixing the emitter current of the triode to be measured, and the offset of the triode is not influenced by the photocurrent during irradiation, thereby realizing the accurate measurement of the annealing effect of the triode under the irradiation of the pulse neutrons.
2) The online measurement in the radiation environment is necessarily long-line measurement, and the long-line measurement can increase noise signals, so that the voltage difference between two ends of the sampling resistor is obtained by differentially measuring the voltages at two ends of the sampling resistor through the data acquisition card, the common-mode signal can be reduced, the signal-to-noise ratio is improved, the voltage precision of the long-line measurement is improved, and the background voltage does not exceed 0.1mV under the condition of 30 meters long line.
3) The invention is also suitable for monitoring the neutron fluence in the radiation environment. The current measuring device has high current measuring precision, so the current measuring device can play a great role in the environment with low neutron fluence.
Drawings
Fig. 1 is a schematic diagram of triode amplification factor measurement under steady-state neutron irradiation.
Fig. 2 is a block diagram of the preferred embodiment of the system for measuring the annealing effect of the transistor according to the present invention (the block diagram of the system for measuring the three-terminal current of the transistor is the same as that of fig. 2, except for the software built in the computer).
Fig. 3 is a schematic diagram of the measurement of three-terminal current of an NPN type triode under the irradiation condition of pulse neutrons in the invention, wherein: vRBFor sampling the resistance RBVoltage difference across, VREFor sampling the resistance REVoltage difference across, VRCFor sampling the resistance RCThe voltage difference across the terminals.
Fig. 4 shows the corresponding result of transistor 3DG130D obtained on a sienna pulse reactor using the measurement system of the present invention, where: (a) the time waveform of the relative neutron fluence rate, (b) the time waveform of the emitter current, (c) the time waveform of the base current, and (d) the time waveform of the collector current.
Fig. 5 is an annealing curve of a triode obtained by the present invention.
Detailed Description
The invention is further described below with reference to the accompanying drawings:
FIG. 2 is a schematic block diagram of a preferred embodiment of the triode annealing effect measurement system of the present invention, wherein the whole triode annealing effect measurement system comprises a triode current measurement circuit and a trigger circuit, wherein the data acquisition card, the low voltage power supply, the test board and the irradiation board form the triode current measurement circuit; a diamond neutron detector (in other embodiments, an inorganic scintillator detector can also be adopted), a high-voltage power supply and an oscilloscope form a trigger circuit; the irradiation board and the diamond neutron detector are placed in the irradiation room, the data acquisition card, the low-voltage power supply, the test board, the high-voltage power supply and the oscilloscope are placed in the test room, and the test board is connected with the irradiation board, the oscilloscope is connected with the diamond neutron detector, and the high-voltage power supply is connected with the diamond neutron detector through transmission lines.
In the trigger circuit, the diamond neutron detector is selected, so that the response time is in ns magnitude, and the broadening of the pulse neutron time waveform is avoided. The high-voltage power supply provides bias voltage for the diamond neutron detector through the coaxial long transmission line, and the output signal of the diamond neutron detector is transmitted to the oscilloscope through the coaxial long transmission line. And in the measurement process, the oscilloscope is in a single self-triggering state, and the sampling and triggering setting is carried out on the oscilloscope according to the characteristics of the pulse neutrons. And connecting the TTL level triggered and output by the oscilloscope to the APFI0 end of the data acquisition card through the coaxial short transmission line to be used as a trigger signal of the data acquisition card. In other embodiments, an oscilloscope may not be provided, and at this time, the output voltage signal of the diamond neutron detector needs to be changed to the input voltage amplitude range required by the data acquisition card through amplitude change.
The invention requires that the data acquisition card should have: synchronous acquisition, differential input and the maximum sampling rate of a single channel meet the measurement requirement of the time waveform of the pulse neutron, and an analog trigger APFI port is provided. And no crosstalk between channels is ensured during synchronous acquisition.
The test board is provided with a triode current measuring circuit for measuring the current of the three ends of the triode to be tested, and the triode current measuring circuit must meet the following conditions: 1) ensuring that the triode to be tested works in an amplification state before and after irradiation; 2) fixing the current of the emitting electrode of the triode to be tested; 3) the CB junction of the triode to BE tested is always in reverse bias and the BE junction is always in forward bias during pulse irradiation.
Fig. 3 is a schematic diagram of a current measuring circuit for measuring three-terminal current of an NPN-type triode under pulse irradiation conditions, wherein during measurement, the triode to be measured is placed on an irradiation board, other devices except the triode to be measured are placed on a test board, and the irradiation board and the test board are connected by a transmission line (lemo) long line. And the emitting electrode of the triode on the test board is connected with a constant current diode D2 in series, so that the current of the emitting electrode is ensured to be fixed. VCCAnd VEEThe low-voltage power supply is used for providing bias voltage for the triode to BE tested, and the positive bias and the negative bias of the BC junction of the triode to BE tested are ensured. RB、REAnd RCFor sampling the resistance, VRB、VRCAnd VRERespectively connected to three analog input channels of data acquisition card via coaxial short transmission line, thereby measuring with the data acquisition cardRBVoltage difference V between both endsRB，REVoltage difference V between both endsRE，RCVoltage difference V between both endsRC. The anode of the shunt diode D1 is connected with the base electrode of the triode to be tested, and the cathode of the shunt diode D1 is connected with the divider resistor RsOne end of the voltage dividing resistor is connected with the other end of the voltage dividing resistor is connected with a bias voltage V provided by a direct current power supplySS，
Figure GDA0002924527420000111
D1、Rs、VSSTogether forming a shunt branch for the photocurrent. When no photocurrent or little photocurrent is present, the shunt diode D1 is in a non-conducting state and the base current flows entirely into RB(ii) a When the photocurrent increases to a level where it is at RBThe voltage drop (the conduction voltage of the diode is generally 0.7V) caused by the voltage drop makes the shunt diode D1 conduct
Figure GDA0002924527420000112
Most of the photocurrent flows away through the shunt diode D1, so that the reverse bias state of the CB junction of the triode to be tested is not changed. RsThe voltages at the two ends can also be accessed to an analog input channel of the data acquisition card through a coaxial short transmission line, so that the magnitude of photocurrent under the irradiation of pulse neutrons can be judged. For PNP type transistors, VCCAnd VEEThe polarity is changed, the connection direction of the positive electrode and the negative electrode of the constant current diode D2 and the shunt diode D1 is changed, and the other connection direction is unchanged.
In order to ensure reverse bias of the CB junction and positive bias of the BE junction of the triode during irradiation, the bias voltage V isSSShould not be less than VEE-IERE-IγRs-VD2+VD1And is not higher than VCC-(Iγ+IC)Rc-IγRs-VD2(ii) a Wherein: i isγRepresenting the magnitude of the photocurrent, V, during irradiationD2Representing the voltage difference, V, across the constant current diode D2D1Representing the voltage difference across the shunt diode D1, ICRepresenting the collector current of the transistor and IE the emitter current of the transistor. I isγAccording to neutron fluence and its attendant before irradiationEstimating the empirical value along with gamma, and estimating the empirical value according to the divider resistor R after irradiationsVoltage difference V between two endsRSThe measured value of (a) is estimated, and the estimation method is a method already disclosed in the field.
Differential measurement of sampling resistance R by data acquisition cardB、REAnd RCAnd the voltages at the two ends can obtain the current of the three ends of the triode to be tested according to the voltage value and the resistance value. In the measuring process, a data acquisition card is in a single-time triggering state, an analog input channel is set as differential input, the sampling rate and the sampling time are determined according to the time behavior of pulse neutrons, the sampling time is at least 10 times of the width of the pulse neutrons, the sampling rate is at least 5 times of the reciprocal of the length of the rising edge of the pulse neutrons, a triggering signal is APFI0, the triggering level is set to 1.5V, and the triggering edge is set to the falling edge. As the input voltage range of the analog input channel of most data acquisition cards with the difference function in the market at present is +/-10V, the sampling resistor R is used for providing the universality of the inventionB、RE、RCAnd a voltage dividing resistor RsVoltage at either end not exceeding 10V, RB、REAnd, RC、RsThe voltage difference between the two ends is less than or equal to 10V.
The computer controls the data acquisition card and the oscilloscope through test software to complete the functions of configuration, measurement, storage and the like; the test software comprises Labview Signal Express and Open Choice, wherein the Labview Signal Express is used for controlling the data acquisition card, and the Open Choice is used for controlling the oscilloscope.
The current value of the three ends of the triode at each moment is measured, so that the waveform of the current of the three ends of the triode changing along with the time can be drawn, and the annealing effect curve of the triode can be further calculated. Under the condition that the current of an emitting electrode of the triode is fixed, the calculation formula of the annealing factor of the triode is as follows:
Figure GDA0002924527420000121
in the above formula:
AF is an annealing factor; i isB(0) A triode base current at an initial time; i isBTripolar at time (t)Tube base current, IB(∞) represents the triode base current for an infinitely long time. In practice, the base current of the triode at the infinite time is measured, and the base current of the triode within 5 to 10 minutes after pulse neutron irradiation is generally taken.
And (3) verification of an annealing effect measurement experiment:
the measuring system of the invention is utilized to measure the annealing effect curve of the triode on the Siemens pulse reactor. The pulse neutrons on the Saian pulse reactor and the photocurrent generated in the triode along with gamma can be ignored, so that the divider resistor RsAnd the shunt diode D1 did not function in this experimental validation. The specific parameters of the measurement circuit used are as follows: vCC＝+10V，VEE＝-10V，VSS＝0V，RB＝10kΩ，RE＝RC＝RsThe emitter current of the transistor was fixed to 0.25mA at 200 Ω. The bias voltage of the diamond neutron detector is 200V, the model of the oscilloscope is DPO40104 produced by Take corporation, the sampling rate is set as 5M/s, the sampling time is set as 0.2s, and the trigger position is set as 10%. The model of the data acquisition card is USB6356 manufactured by NI corporation, the sampling rate is set as 1M/s, the sampling time is 0.2s, the differential input mode is adopted, the trigger signal is APFI0, the trigger level is set as 1.5V, the trigger edge is set as the falling edge, and the trigger position is set as 10%.
Under the non-irradiation condition of a laboratory, the error between the current value measured by the Agilent 34410A ammeter and the current value obtained by the measuring system is within 5 percent, which shows that the current measuring result of the measuring system is correct under the non-irradiation condition.
Fig. 4 shows the corresponding results of the transistor 3DG130D obtained by the measuring system of the present invention on a sienna pulse reactor, wherein (a) in fig. 4 is the time waveform of the relative neutron fluence rate, and (b), (c) and (d) in fig. 4 are the time waveforms of the emitter, base and collector currents, respectively. As can be seen from (b) in fig. 4, under the condition of pulse neutron irradiation, the emitter current of the triode is basically kept unchanged, which meets the preset condition of the circuit. As can be seen from (c) in fig. 4, the base current of the triode is also substantially unchanged under the non-irradiation condition, so that it can be judged that the change of the base current of the triode under the irradiation condition is caused by irradiation.
Measuring base current I of the triode again after irradiation is finished for 5 minutesB＝4.1μA。
Calculating the annealing factor according to the above formula, wherein IBThe (∞) base current of the triode measured 5 minutes after the irradiation was completed was substituted, and the resulting annealing curve is shown in FIG. 5.
The change of the amplification factor of the triode along with time can be calculated according to the current of the three ends, the change of the inverse of the amplification factor of the triode has a linear relation with the neutron fluence, and the linear coefficient is called as a neutron damage constant of a minority carrier, so that the neutron fluence can be obtained according to the relation. Therefore, the method is also suitable for measuring the neutron fluence in the radiation environment, and the specific method comprises the following steps:
1) measuring the change of the current at three ends of the triode along with the neutron fluence in the radiation field with the known neutron fluence, and calculating the amplification factor of the triode under the condition of fixed emitter current according to the current
Figure GDA0002924527420000131
Obtaining a change curve of the reciprocal of the amplification factor of the triode along with the neutron fluence, and carrying out linear fitting on the change curve to obtain the slope of the change curve, wherein the slope is the neutron damage constant of the minority carrier of the triode;
2) after the triode is annealed at high temperature, the triode is placed in a radiation field with unknown neutron fluence to measure the current change of the three ends of the triode, and then the amplification factor of the triode under the condition of fixed emitter current is calculated according to the current
Figure GDA0002924527420000132
Thereby obtaining the reciprocal of the amplification factor of the triode; measuring the current change of the three ends is realized by adopting the current measuring method;
3) calculating corresponding neutron fluence according to the reciprocal of the amplification factor of the triode obtained in the step 2) and the neutron damage constant of the minority carrier obtained in the step 1).
The calculation of the current to neutron fluence is carried out according to ASTM standard E1855-96.

Claims (16)

1. The triode three-terminal current waveform measuring system is used for measuring the triode three-terminal current waveform under the condition of pulse neutron irradiation; the method is characterized in that: the device comprises a computer, a triode current measuring circuit and a trigger circuit;
the triode current measuring circuit comprises a data acquisition card, a low-voltage power supply, a test board and an irradiation board; the low-voltage power supply is used for providing bias voltage for the triode to BE tested and ensuring positive bias of BE junction and reverse bias of BC junction of the triode to BE tested;
the triggering circuit comprises a neutron detector and a high-voltage power supply; the neutron detector is used for monitoring pulse neutron time waveform and providing a trigger signal for the triode current measuring circuit; the high-voltage power supply is used for providing bias voltage for the neutron detector;
the irradiation board and the neutron detector are arranged in the irradiation room, and the data acquisition card, the low-voltage power supply, the test board and the high-voltage power supply are arranged in the test room; the test board is connected with the irradiation board, and the high-voltage power supply is connected with the neutron detector through transmission lines;
the computer is connected with the data acquisition card and is used for controlling the data acquisition card, realizing parameter configuration, current measurement and data storage of the data acquisition card and generating current waveforms of three ends of the triode according to data acquired by the data acquisition card;
the irradiation plate is used for placing the triode to be tested;
the triode current measuring circuit for measuring the current of the three ends of the triode to be measured is placed on the test board, and the triode current measuring circuit must meet the conditions: 1) ensuring that the triode to be tested works in an amplification state before and after irradiation; 2) ensuring the current of the emitting electrode of the triode to be tested to be fixed; 3) and the BC junction of the triode to BE tested is ensured to BE in a reverse bias state and the BE junction is ensured to BE in a forward bias state during pulse irradiation.
2. The triode three-terminal current waveform measurement system of claim 1, wherein: the triggering loop also comprises an oscilloscope arranged in the test room, and the oscilloscope is connected with the neutron detector and the data acquisition card through transmission lines respectively; the computer is also used for realizing parameter configuration of the oscilloscope.
3. The triode three-terminal current waveform measurement system of claim 1, wherein: the neutron detector is a diamond detector or an inorganic scintillator detector.
4. The triode three-terminal current waveform measurement system of claim 1, 2 or 3, wherein: the triode current measuring circuit comprises a shunt diode D1, a constant current diode D2 and a sampling resistor RB、REAnd RCAnd a voltage dividing resistor Rs;
Figure FDA0002924527410000021
sampling resistor RBOne end of the sampling resistor R is connected with the base electrode of the triode to be testedBThe other end of the resistor is grounded, and a sampling resistor RCOne end of the sampling resistor R is connected with the collector of the triode to be testedCAt the other end VCC(ii) a Sampling resistor REOne end of the sampling resistor is connected with an emitting electrode of the triode to be tested and the sampling resistor REThe other end of the constant current diode D2 is connected with one end of the constant current diode D2, and the other end of the constant current diode D8932 is connected with VEESaid V isCCAnd VEESupplied by said low voltage source, VCCAnd VEEThe size of the positive bias voltage enables a BE junction of the triode to BE tested to BE positively biased and a BC junction of the triode to BE negatively biased;
one end of the shunt diode D1 is connected with the base electrode of the triode to be tested and the sampling resistor RBAnd the other end of the shunt diode D1 passes through the voltage-dividing resistor RsIs connected with VSSSaid V isSSSupplied by said low voltage source, VSSEnsuring positive bias of BE junction and reverse bias of BC junction of the triode to BE tested during pulse irradiation;
sampling resistor RBVoltage V acrossRB1、VRB2Sampling resistor REVoltage V acrossRE1、VRE2Sampling resistor RCVoltage V acrossRC1、VRC2Two ends R of the divider resistorsVoltage V ofRS1、VRS2And the signals are respectively sent to four analog input channels of the data acquisition card.
5. The triode three-terminal current waveform measurement system of claim 4, wherein: sampling resistor RB、RE、RCAnd a voltage dividing resistor RsVoltage at either end not exceeding 10V, RB、RE、RCAnd RsThe voltage difference between the two ends is less than or equal to 10V.
6. The triode three-terminal current waveform measurement system of claim 4, wherein: voltage VSSCannot be higher than VCC-(Iγ+IC)Rc-IγRs-VD2Cannot be lower than VEE-IERE-IγRs-VD2+VD1Wherein: i isγRepresenting the magnitude of the photocurrent, V, during irradiationD2Representing the voltage difference, V, across the constant current diode D2D1Representing the voltage difference across the shunt diode D1, ICRepresenting the collector current of a triode, IERepresenting the emitter current of the transistor.
7. The triode three-terminal current waveform measurement system of claim 1, 2 or 3, wherein: in the measuring process, the data acquisition card is in a single-trigger state, and the analog input channel is set as differential input.
8. The measuring method of the three-terminal current waveform of the triode is used for realizing the measurement of the three-terminal current waveform of the triode under the condition of pulse neutron radiation; the method is characterized by comprising the following steps:
1) building a current measuring circuit:
the emitting end of the triode to be tested is connected with a sampling resistor R in seriesEAnd a constant current diode D2, and the other end D2 of the constant current diode is connected with VEE(ii) a In the base of the triode to be testedPolar series sampling resistor RBAnd sampling the resistance RBThe other end of the first and second electrodes is grounded; at the base electrode and the sampling resistor R of the triode to be testedBOne end of a shunt diode D1 is connected between the two ends, and the other end of the shunt diode D1 passes through a voltage dividing resistor RsIs connected with VSS(ii) a A sampling resistor R is connected in series with the collector of the triode to be testedCSampling resistor RCAt the other end VCC；
Figure FDA0002924527410000031
VCCAnd VEEThe BE junction and the BC junction of the triode to BE tested are positively biased and reversely biased; voltage VSSThe BC junction of the triode is reversely biased and the BE junction is positively biased during irradiation;
2) placing the triode to be tested on an irradiation plate in an irradiation room, and placing the other devices on a test plate in the test room; the irradiation plate is connected with the test plate through a transmission line; the neutron detector is placed in the irradiation room, the high-voltage power supply and the oscilloscope are placed in the test room, and the input and the output of the neutron detector are respectively connected with the high-voltage power supply and the oscilloscope through transmission lines; the trigger output end of the oscilloscope is connected with the input trigger end of the data acquisition card;
3) measuring sampling resistance R by using data acquisition card before irradiationBVoltage difference V between both endsRBSampling resistor REVoltage difference V between both endsREAnd a sampling resistor RCVoltage difference V between both endsRCAnd storing;
4) turning on a high-voltage power supply to supply power to the neutron detector, enabling the oscilloscope to be in a single self-triggering preparation state, enabling the data acquisition card to be in a single triggering preparation state, and waiting for arrival of pulse neutrons;
5) after the data acquisition card is successfully triggered, the sampling resistor R is acquired and storedBVoltage difference V between both endsRBSampling resistor REVoltage difference V between both endsRESampling resistor RCVoltage difference V between both endsRCA voltage dividing resistor RsVoltage difference V between both endsRSFour voltage waveforms;
6) calculating the current values of the base electrode, the emitting electrode and the collector of the triode to be tested at each sampling moment under the condition of pulse neutron radiation according to the voltage sampling value obtained in the step 5), thereby obtaining the current waveforms of the base electrode, the emitting electrode and the collector of the triode to be tested.
9. The method of claim 8, wherein the method comprises the steps of:
in step 1): voltage VSSNot less than VEE-IERE-IγRs-VD2+VD1And is not higher than VCC-(Iγ+IC)Rc-IγRs-VD2(ii) a Wherein: i isγRepresenting the magnitude of the photocurrent, V, during irradiationD2Representing the voltage difference, V, across the constant current diode D2D1Representing the voltage difference across the shunt diode D1, ICRepresenting the collector current of a triode, IERepresenting the emitter current of the transistor.
10. The triode annealing effect measuring system is used for measuring the triode annealing effect under the condition of pulse neutron radiation; the method is characterized in that: the device comprises a computer, a triode current measuring circuit and a trigger circuit;
the triode current measuring circuit comprises a data acquisition card, a low-voltage power supply, a test board and an irradiation board; the low-voltage power supply is used for providing bias voltage for the triode to BE tested and ensuring positive bias of BE junction and reverse bias of BC junction of the triode to BE tested;
the triggering circuit comprises a neutron detector and a high-voltage power supply; the neutron detector is used for monitoring pulse neutron time waveform and providing a trigger signal for the triode current measuring circuit; the high-voltage power supply is used for providing bias voltage for the neutron detector;
the irradiation board and the neutron detector are arranged in the irradiation room, and the data acquisition card, the low-voltage power supply, the test board and the high-voltage power supply are arranged in the test room; the test board is connected with the irradiation board, and the high-voltage power supply is connected with the neutron detector through transmission lines;
the computer is connected with the data acquisition card and is used for controlling the data acquisition card, realizing parameter configuration, current measurement and data storage of the data acquisition card and acquiring an annealing effect curve of the triode according to data acquired by the data acquisition card;
the irradiation plate is used for placing the triode to be tested;
the triode current measuring circuit for measuring the current of the three ends of the triode to be measured is placed on the test board, and the triode current measuring circuit must meet the conditions: 1) ensuring that the triode to be tested works in an amplification state before and after irradiation; 2) ensuring the current of the emitting electrode of the triode to be tested to be fixed; 3) the BC junction of the triode to BE tested can BE ensured to BE in a reverse bias state and the BE junction is in a forward bias state during pulse irradiation;
the specific method for acquiring the annealing effect curve of the triode according to the data acquired by the data acquisition card comprises the following steps:
step 1, calculating current values of a base electrode, an emitting electrode and a collector of a triode to be tested at each sampling moment under the condition of pulse neutron radiation according to a voltage sampling value acquired by a data acquisition card, thereby obtaining the waveform of the current of the base electrode, the emitting electrode and the collector of the triode to be tested along with the change of time;
step 2, under the condition that the emitter current of the triode is fixed, calculating the annealing factor AF of the triode:
Figure FDA0002924527410000051
in the above formula:
AF is an annealing factor; i isB(0) A triode base current at an initial time; i isB(t) triode base current at time t, IB(∞) represents triode base current for infinite time;
and 3, drawing an annealing effect curve of the triode based on the calculated annealing factor AF.
11. The triode annealing effect measurement system of claim 10, wherein: the triggering loop also comprises an oscilloscope arranged in the test room, and the oscilloscope is connected with the neutron detector and the data acquisition card through transmission lines respectively; the computer is also used for realizing parameter configuration of the oscilloscope.
12. The triode annealing effect measurement system of claim 10, wherein: the neutron detector is a diamond neutron detector or an inorganic scintillator detector.
13. The triode annealing effect measurement system according to claim 10, 11 or 12, wherein:
the triode current measuring circuit comprises a shunt diode D1, a constant current diode D2 and a sampling resistor RB、REAnd RCAnd a voltage dividing resistor Rs；
Figure FDA0002924527410000052
Sampling resistor RBOne end of the sampling resistor R is connected with the base electrode of the triode to be testedBThe other end of the resistor is grounded, and a sampling resistor RCOne end of the sampling resistor R is connected with the collector of the triode to be testedCAt the other end VCC(ii) a Sampling resistor REOne end of the sampling resistor is connected with an emitting electrode of the triode to be tested and the sampling resistor REThe other end of the constant current diode D2 is connected with one end of the constant current diode D2, and the other end of the constant current diode D8932 is connected with VEESaid V isCCAnd VEESupplied by said low voltage source, VCCAnd VEEThe size of the positive bias voltage enables a BE junction of the triode to BE tested to BE positively biased and a BC junction of the triode to BE negatively biased;
one end of the shunt diode D1 is connected with the base electrode of the triode to be tested and the sampling resistor RBAnd the other end of the shunt diode D1 passes through the voltage-dividing resistor RsIs connected with VSS；
Sampling resistor RBVoltage V acrossRB1、VRB2Sampling resistor REVoltage V acrossRE1、VRE2Sampling resistor RCVoltage V acrossRC1、VRC2Two ends R of the divider resistorsVoltage V ofRS1、VRS2Are respectively sent into the data acquisitionFour analog input channels of the card.
14. The triode annealing effect measuring method is used for measuring the triode annealing effect under the condition of pulse neutron radiation; the method is characterized by comprising the following steps:
1) building a current test circuit:
the emitting end of the triode to be tested is connected with a sampling resistor R in seriesEAnd a constant current diode D2, and the other end D2 of the constant current diode is connected with VEE(ii) a A sampling resistor R is connected in series with the base of the triode to be testedBAnd sampling the resistance RBThe other end of the first and second electrodes is grounded; at the base electrode and the sampling resistor R of the triode to be testedBOne end of a shunt diode D1 is connected between the two ends, and the other end of the shunt diode D1 passes through a voltage dividing resistor RsIs connected with VSS(ii) a A sampling resistor R is connected in series with the collector of the triode to be testedCSampling resistor RCAt the other end VCC；
Figure FDA0002924527410000061
VCCAnd VEEThe BE junction and the BC junction of the triode to BE tested are positively biased and reversely biased; voltage VSSThe reverse bias of a BC junction and the positive bias of a BE junction of the triode during the irradiation period are ensured;
2) placing the triode to be tested on the irradiation plate in the irradiation room, and placing the other devices on the test plate outside the irradiation room; the irradiation plate is connected with the test plate through a transmission line; the neutron detector is placed in the irradiation room, the high-voltage power supply and the oscilloscope are placed in the test room, and the input and the output of the neutron detector are respectively connected with the high-voltage power supply and the acquisition channel of the oscilloscope through transmission lines; the trigger output end of the oscilloscope is connected with the input trigger end of the data acquisition card;
3) measuring sampling resistance R by using data acquisition card before irradiationBVoltage difference V between both endsRBSampling resistor REVoltage difference V between both endsREAnd a sampling resistor RCVoltage difference V between both endsRCAnd storing;
4) turning on a high-voltage power supply to supply power to the neutron detector, enabling the oscilloscope to be in a single self-triggering preparation state, enabling the data acquisition card to be in a single triggering preparation state, and waiting for arrival of pulse neutrons;
5) after the data acquisition card is successfully triggered, the sampling resistor R is acquired and storedBVoltage difference V between both endsRBSampling resistor REVoltage difference V between both endsRESampling resistor RCVoltage difference V between both endsRCA voltage dividing resistor RsVoltage difference V between both endsRSThese four voltage waveforms;
6) calculating current values of the base electrode, the emitting electrode and the collector of the triode to be tested at each sampling moment under the condition of pulse neutron radiation according to the voltage sampling value obtained in the step 5), thereby obtaining current waveforms of the base electrode, the emitting electrode and the collector of the triode to be tested;
7) under the condition that the emitter current of the triode is fixed and unchanged, calculating the annealing factor AF of the triode:
Figure FDA0002924527410000071
in the above formula:
AF is an annealing factor; i isB(0) A triode base current at an initial time; i isB(t) triode base current at time t, IB(∞) represents the triode base current for an infinitely long time.
15. The method of claim 14, wherein the step of measuring the annealing effect comprises:
in step 1): voltage VSSNot less than VEE-IERE-IγRs-VD2+VD1And is not higher than VCC-(Iγ+IC)Rc-IγRs-VD2(ii) a Wherein: i isγRepresenting the magnitude of the photocurrent, V, during irradiationD2Representing the voltage difference, V, across the constant current diode D2D1Representing the voltage difference across the shunt diode D1, ICRepresenting the collector current of a triode, IERepresenting emitter current of a triode。
16. The neutron fluence measuring method is used for measuring the neutron fluence in a radiation environment; the method is characterized by comprising the following steps:
1) measuring the change of the current at three ends of the triode along with the neutron fluence in the radiation field with the known neutron fluence, and calculating the amplification factor of the triode under the condition of fixed emitter current according to the current
Figure FDA0002924527410000072
Obtaining a change curve of the reciprocal of the amplification factor of the triode along with the neutron fluence, and carrying out linear fitting on the change curve to obtain the slope of the change curve, wherein the slope is the neutron damage constant of the minority carrier of the triode;
2) after the triode is annealed at high temperature, the triode is placed in a radiation field with unknown neutron fluence to measure the current change of the three ends of the triode, and then the amplification factor of the triode under the condition of fixed emitter current is calculated according to the current
Figure FDA0002924527410000081
Thereby obtaining the reciprocal of the amplification factor of the triode; measuring the three-terminal current change is realized by adopting the method for measuring the three-terminal current waveform of the triode of claim 8; i isCIs the collector current of the triode; i isBIs the base current of the triode;
3) calculating corresponding neutron fluence according to the reciprocal of the amplification factor of the triode obtained in the step 2) and the neutron damage constant of the minority carrier obtained in the step 1).
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