CN110337056A - A kind of production method of high density directive property piezo-electric electro-acoustic transducer array - Google Patents

A kind of production method of high density directive property piezo-electric electro-acoustic transducer array Download PDF

Info

Publication number
CN110337056A
CN110337056A CN201910721646.1A CN201910721646A CN110337056A CN 110337056 A CN110337056 A CN 110337056A CN 201910721646 A CN201910721646 A CN 201910721646A CN 110337056 A CN110337056 A CN 110337056A
Authority
CN
China
Prior art keywords
film
directive property
high density
piezo
piezoelectric
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201910721646.1A
Other languages
Chinese (zh)
Other versions
CN110337056B (en
Inventor
王焕焕
徐金国
葛斌
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Changzhou Yuanjingmo Microelectronics Co ltd
Original Assignee
Changzhou Meta Crystal Electronic Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Changzhou Meta Crystal Electronic Technology Co Ltd filed Critical Changzhou Meta Crystal Electronic Technology Co Ltd
Priority to CN201910721646.1A priority Critical patent/CN110337056B/en
Publication of CN110337056A publication Critical patent/CN110337056A/en
Application granted granted Critical
Publication of CN110337056B publication Critical patent/CN110337056B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04RLOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
    • H04R31/00Apparatus or processes specially adapted for the manufacture of transducers or diaphragms therefor
    • H04R31/003Apparatus or processes specially adapted for the manufacture of transducers or diaphragms therefor for diaphragms or their outer suspension
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04RLOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
    • H04R2231/00Details of apparatus or processes specially adapted for the manufacture of transducers or diaphragms therefor covered by H04R31/00, not provided for in its subgroups
    • H04R2231/001Moulding aspects of diaphragm or surround

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Signal Processing (AREA)
  • Transducers For Ultrasonic Waves (AREA)

Abstract

The present invention relates to a kind of production method of high density directive property piezo-electric electro-acoustic transducer array, one of unit production methods are as follows: the upper surface of silicon wafer wafer is sequentially depositing lower electrode, lower layer's piezoelectricity, target, upper layer piezoelectricity, upper electrode film and forms the double-deck piezoelectric thin film layer structure;The double-deck piezoelectric thin film layer structure is subjected to longitudinal photoetching, the double-deck piezoelectric thin film layer structure is divided into the part of left, center, right three;Left half bilayer piezoelectric membrane photoetching is simultaneously etched to exposing lower electrode film;Right half bilayer piezoelectric membrane photoetching is simultaneously etched to the lower target film of exposing;The upper surface of three parts generated carries out deposited metal electrical connection film and graphically makes routing;The silicon wafer wafer of middle section is carried out front etch to discharge to form the chamber portion with inclination angle.This method relative to etch-back technique, the minimum spacing of unit two sides can contract it is smaller, so that the cell density of the micro- electroacoustic transducer of array is increased, to enhance the directive property of electroacoustic transducer.

Description

A kind of production method of high density directive property piezo-electric electro-acoustic transducer array
Technical field
The present invention relates to electroacoustic transducer fields, and in particular to a kind of high density directive property piezo-electric electro-acoustic transducer array Production method.
Background technique
As to music, film and the growth for participating in the audio frequencies demands such as phone, video conference is appreciated, electroacoustic equipment becomes It obtains and is increasingly positioned at entertainment orientation and commercialization.It is put outside traditional electroacoustic equipment, such as common speaker, mobile phone, all there is one Common ground: it directly transmits, i.e., is moved by directly excitation air molecule, to generate audible sound.But this is used in public places A little electroacoustic equipments can bring certain individual privacy and noise pollution problem.Even solving this with wired or wireless headset A little problems, however wear earphone and will cause the sense of discomfort and walking inconvenience of ear again.
Therefore, develop a kind of audio frequency directional electroacoustic transducer that can be realized voice directional spreading, to protection people's privacy With prevent noise pollution from having very great help.Compared with traditional electroacoustic equipment, audio frequency directional electroacoustic transducer is then using complete Different technologies generate audible sound indirectly in air.The technology emits modulated directional ultrasonic signal to air In, low frequency audible sound is generated by the reciprocation of air molecule and ultrasonic wave on ultrasound beamformer direction.Because producing The reciprocation of raw low frequency audible sound exists only in the ultrasonic beam of high directivity, that is, realizes determining to keep pouring in and broadcasting for audible sound.
Audio frequency directional type electroacoustic transducer may be mounted in mobile phone, and in driving, driver need not hold mobile phone Or wearing earphone can be conversed, and safe driving is conducive to;The use of audio, video program is listened to by mobile phone in public Person, it is not necessary to which good audiovisual experience can be possessed by wearing earphone, without interfering with other people.These use demands make audio frequency Orienting micro- electroacoustic transducer has boundless application prospect.Audio frequency directional electroacoustic transducer system is mainly by the micro- electroacoustic of ultrasound Energy converter, preamplifier and Digital Signal Processing (DSP) three parts composition.At the digital signal of audio frequency directional electroacoustic transducer Reason part is less big with the difference of common audio frequency directional electroacoustic transducer, and preamplifier also partially has benefited from current integrated circuit Development, do not distinguish too much.And the micro- electroacoustic transducer part of ultrasound is just entirely different, because electroacoustic transducer size is significantly Reduce and require considerable output acoustic pressure again, so needing by MEMS (micro-electromechanical System, abbreviation MEMS) technology prepares micro- electroacoustic transducer, this patent main purpose be proposed using MEMS technology it is a kind of high Density directive property piezo-electric electro-acoustic transducer array and preparation method thereof.
Summary of the invention
1. technical problem to be solved:
For the above technical issues, the present invention proposes a kind of production of high density directive property piezo-electric electro-acoustic transducer array Method, the piezo-electric electro-acoustic transducer produced can be improved the output acoustic pressure of electroacoustic transducer and reduce the ruler of electroacoustic transducer It is very little.
2. technical solution:
A kind of production method of high density directive property piezo-electric electro-acoustic transducer array: the high density directive property piezoelectric electro electroacoustic The array that transducer array is made of multiple high density directive property piezo-electric electro-acoustic transducer units, the high density directive property piezoelectricity Electroacoustic transducer unit production method the following steps are included:
Step 1: silicon wafer wafer is chosen;
Step 2: it is thin that lower electrode film, lower layer's piezoelectric membrane, target are sequentially depositing in the upper surface of silicon wafer wafer Film, upper layer piezoelectric membrane, upper electrode film totally 5 layer film form the double-deck piezoelectric thin film layer structure;
Step 3: the double-deck piezoelectric thin film layer structure generated in step 2 is subjected to photoetching and is etched;It specially will be double-deck The longitudinal direction photoetching of piezoelectric thin film layer structure is simultaneously etched to silicon wafer wafer upper surface;The double-deck piezoelectric thin film layer structure that step 2 is generated It is divided into the part of left, center, right three, i.e. left half bilayer piezoelectric membrane, middle section bilayer piezoelectric membrane and right half bilayer pressure Conductive film;Silicon wafer wafer is refused photoetching and is etched in step 3;
Step 4: the photoetching of horizontal direction is carried out to left half bilayer piezoelectric membrane and is etched to exposing lower electrode film; The photoetching of horizontal direction is carried out to right half bilayer piezoelectric membrane and is etched to the lower target film of exposing;
Step 5: the upper surface of generate in step 4 three parts is subjected to deposited metal and is electrically connected film, and figure Change production routing PAD;
Step 6: the silicon wafer wafer of the bottom of middle section bilayer piezoelectric membrane is subjected to front etch release, forms band There is the chamber portion at inclination angle.
Further, the size of the silicon wafer wafer is 4 cun or 6 cun or 8 cun or 12 cun;The wafer is common Silicon wafer or soi wafer.
Further, the lower electrode film, target film, upper electrode film material be have Ohmic contact simultaneously Conductive metal, metal oxide or non-metal conductor.
Further, the lower electrode film, target film, upper electrode film material be metal platinum, gold, aluminium.
Further, the material of upper layer piezoelectric membrane and lower layer's piezoelectric membrane is the material for having piezoelectric effect.
Further, the material of upper layer piezoelectric membrane and lower layer's piezoelectric membrane is lead zirconate titanate or oxidized aluminum nitride zinc or three Lead zirconate titanate, the quartz of member system or binary system doping.
3. the utility model has the advantages that
(1) electroacoustic transducer of the invention is only with ordinary silicon chip, using double-deck piezoelectric membrane elastomer each other, while again It can be used as the double-deck sensitive layer to use.Cavity, relative to etch-back technique, unit two sides are formed by front release tech Minimum spacing can contract smaller, so that the cell density of the micro- electroacoustic transducer of array is increased, to enhance electroacoustic transduction The directive property of device.
(2) the double-deck piezoelectric membrane that electroacoustic transducer of the invention uses can enhance the sensitivity of micro- electroacoustic transducer.
(3) electroacoustic transducer of the invention and can using ordinary silicon chip as substrate, save the manufacturing cost of chip.
Detailed description of the invention
Fig. 1 is traditional MEMS piezoelectric micromotor electroacoustic transducer structure schematic diagram;
Fig. 2 is a kind of front view of a unit in high density directive property piezo-electric electro-acoustic transducer array;
Fig. 3 is a kind of production flow diagram of one unit of high density directive property piezo-electric electro-acoustic transducer array.
Specific embodiment
The present invention is specifically described with reference to the accompanying drawing.
For the audio frequency range that human ear can be heard in 20Hz to 20kHz, acoustic pressure range is minimum in 20uPa to 100kPa The 20uPa of acoustic pressure limitation at 1 khz.For device design requirement, sound pressure level will reach under 1kHz frequency and 1m distance 40dB.Such as the MEMS piezoelectric micromotor electroacoustic transducer for possessing 255 units for one, it would be desirable to calculate list first Sound pressure level to be achieved needed for a unit to obtain needing acoustic pressure to be achieved, then extrapolates amplitude required for unit.
According to psychologic acoustics, if minimum intermodulation distortion is in 20kHz, it is necessary to sampling rate to 40kHz.For not in unison Sound pressure level under voice frequency has,
SPLf=20000=SPLf=1000+20lg (half sample rate of f/f=1000)
For the MEMS piezoelectric micromotor electroacoustic transducer of 255 units, have
SPL255=SPLf=20000=40dB+20lg (20000/10000)=66Db
The SPL of multiple units can be expressed as,
SPLn=20lg (Pn/P0)
Wherein, P is the acoustic pressure generated, and P0 is minimum acoustic pressure 20uPa.Therefore, the MEMS piezoelectric micromotor electroacoustic of individual unit changes Can device need the sound pressure level to be achieved to be,
SPL1=SPL255-20lg255=17.87dB
Therefore, the acoustic pressure P1 generated required for single MEMS piezoelectric micromotor electroacoustic transducer is,
P1=P010SPL1/20=156.5uPa
MEMS piezoelectric micromotor electroacoustic transducer is in such a way that piezoelectric cantilever driving center board generates acoustic pressure, the sound of generation Pressure is related with the factors such as Piezoelectric Driving cantilever beam amplitude, platen area and frequency, has
2 π ρ S ε f2/r of P=√
Wherein, ρ is atmospheric density, and S is energy converter platen area, needs to be arranged to the circle that radius is 150um according to device Shape, ε are cantilever beam amplitudes, and r is the distance of intended recipient sound.Consider to generate required for single MEMS piezoelectric micromotor electroacoustic transducer Acoustic pressure, then can extrapolate Piezoelectric Driving cantilever beam amplitude, have
ε=Pr/ (2 π ρ S of √)=2.5um
Therefore, for one possesses the MEMS piezoelectric micromotor electroacoustic transducer of 255 units under 1kHz frequency and 1m distance Sound pressure level will reach 40dB, determining that energy converter sounding circle plate radius under conditions of 150um, needs Piezoelectric Driving cantilever Beam amplitude reaches 2.5um.More beam micro-structures are designed by the piezoelectric coefficient d 31 of the condition combination piezoelectric material, so that it may be met The demand of device.
Such as the structure chart that attached drawing 1 is traditional MEMS piezoelectric micromotor electroacoustic transducer, which uses soi wafer substrate A1 is formed as piezoelectric elasticity layer, simple single layer piezoelectric membrane structure as sensitive layer and etch-back technique release cavity Film makes sensor vibrate and work under electric drive.In Fig. 1, A1 is the bottom silicon layer and top silicon layer of soi wafer, and A2 is SOI silicon The BOX layer of piece, A3 are upper/lower electrode layer, and A4 is metal Pad layers, and A5 is PZT piezoelectric material.Its working principle is that: total Processing is on insulator on silicon substrate (Silicon on Insulator, SOI), by have middle layer (i.e. bonding coat, Adhensive layer) joining technique be combined together PZT (be also possible to AlN either ZnO) with SOI substrate.SOI Refer to and re-forms one layer of monocrystalline silicon thin film or monocrystalline silicon thin film in an insulating substrate by an insulating layer (usually SiO2) From the silicon substrate of support separate this spline structure material, this material structure can realize manufacture device thin-film material completely with The isolation of substrate material has ghost effect is small, speed is fast, low in energy consumption and integrated level is high etc. compared to common silicon substrate SOI substrate Plurality of advantages.After PZT layers of upper/lower electrode adds voltage, according to inverse piezoelectric effect, PZT can be laterally (to d31 transverse-vibration For dynamic model formula) generate strain, occur it is certain elongate or shorten, since PZT is by being engaged with it thicker silicon bullet together Property layer and boundary constraint, make PZT drive silicon elastic layer bend together, thus make film generate extensional vibration, in air In medium, this extensional vibration will generate (super) sound wave.
By in Fig. 1 it can be found that traditional MEMS piezoelectric micromotor electroacoustic transducer structure backside cavity be inverted trapezoidal, formed electroacoustic When transducer array, the spacing of two units can be influenced by back cavity structure and inevitably be increased, so that directive property is poor.This Outside, the sensitivity of single layer piezoelectric film is relatively low, also relatively high using the cost of soi wafer.
As shown in Fig. 3, a kind of production method of high density directive property piezo-electric electro-acoustic transducer array, the high density refer to The array that tropism piezo-electric electro-acoustic transducer array is made of multiple high density directive property piezo-electric electro-acoustic transducer units;It is described highly dense Spend directive property piezo-electric electro-acoustic transducer unit production method the following steps are included:
Step 1: silicon wafer wafer 1 is chosen;
Step 2: it is thin that lower electrode film 2, lower layer's piezoelectric membrane 3, target are sequentially depositing in the upper surface of silicon wafer wafer Film 4, upper layer piezoelectric membrane 5, upper electrode film 6 totally 5 layer film form the double-deck piezoelectric thin film layer structure;
Step 3: the double-deck piezoelectric thin film layer structure generated in step 2 is subjected to photoetching and is etched;It specially will be double-deck The longitudinal direction photoetching of piezoelectric thin film layer structure is simultaneously etched to silicon wafer wafer upper surface;The double-deck piezoelectric thin film layer structure that step 2 is generated It is divided into the part of left, center, right three, i.e. left half bilayer piezoelectric membrane, middle section bilayer piezoelectric membrane and right half bilayer pressure Conductive film;Silicon wafer wafer 1 is refused photoetching and is etched in step 3;
Step 4: left half bilayer piezoelectric membrane is carried out the photoetching of horizontal direction and is etched to expose lower electrode film 2; The photoetching of horizontal direction is carried out to right half bilayer piezoelectric membrane and is etched to the lower target film 4 of exposing;
Step 5: the upper surface of generate in step 4 three parts is subjected to deposited metal and is electrically connected film, and figure Change production routing PAD7;
Step 6: the silicon wafer wafer of the bottom of middle section bilayer piezoelectric membrane is subjected to front etch release, forms band There is the chamber portion at inclination angle.
Further, the size of the silicon wafer wafer is 4 cun or 6 cun or 8 cun or 12 cun;The wafer is common Silicon wafer or soi wafer.
Further, the lower electrode film 2, target film 4, upper electrode film 6 material be to have ohm and connect Touching and conductive metal, metal oxide or non-metal conductor.
Further, the lower electrode film, target film, upper electrode film material be metal platinum, gold, aluminium.
Further, the material of lower layer's piezoelectric membrane is the material for having piezoelectric effect.
Further, the material of lower layer's piezoelectric membrane is lead zirconate titanate or oxidized aluminum nitride zinc or ternary system or binary It is lead zirconate titanate, the quartz of doping.
It is as shown in Fig. 2 the structure of a unit of the electroacoustic transducer processed using method provided by the invention Figure.Wherein 1 is silicon wafer wafer;2 be lower electrode film;3 be lower layer's piezoelectric membrane;4 be target film;5 be upper layer piezoelectricity Film;6 be upper electrode film;7 be upper electrode film.After the upper/lower electrode to PZT layers applies alternating voltage, according to inverse piezoelectricity Effect, PZT can be adjusted and be handed in the strain of transverse direction (d31 lateral vibration mode) and longitudinal (d33 longitudinal vibration mode) generation period The frequency of time variant voltage can make the PZT layers of vibration generated by a relatively large margin closer to the intrinsic frequency of PZT, and then in air (super) sound wave is generated in medium.
Although the present invention has been described by way of example and in terms of the preferred embodiments, they be not it is for the purpose of limiting the invention, it is any ripe This those skilled in the art is practised, without departing from the spirit and scope of the invention, can make various changes or retouch from working as, therefore guarantor of the invention Shield range should be subject to what claims hereof protection scope was defined.

Claims (6)

1. a kind of production method of high density directive property piezo-electric electro-acoustic transducer array, the high density directive property piezoelectric electroacoustic transducer The array that energy device array is made of multiple high density directive property piezo-electric electro-acoustic transducer units;It is characterized by: the high density Directive property piezo-electric electro-acoustic transducer unit production method specifically includes the following steps:
Step 1: silicon wafer wafer is chosen;
Step 2: the upper surface of silicon wafer wafer be sequentially depositing lower electrode film, lower layer's piezoelectric membrane, target film, on It is laminated conductive film, upper electrode film totally 5 layer film, forms the double-deck piezoelectric thin film layer structure;
Step 3: the double-deck piezoelectric thin film layer structure generated in step 2 is subjected to photoetching and is etched;Specially by the double-deck piezoelectricity The photoetching of film layer structure longitudinal direction is simultaneously etched to silicon wafer wafer upper surface;The double-deck piezoelectric thin film layer structure that step 2 generates is divided into The part of left, center, right three, i.e. left half bilayer piezoelectric membrane, middle section bilayer piezoelectric membrane and right half bilayer piezoelectricity are thin Film;Silicon wafer wafer is refused photoetching and is etched in step 3;
Step 4: the photoetching of horizontal direction is carried out to left half bilayer piezoelectric membrane and is etched to exposing lower electrode film;To the right side Partial double piezoelectric membrane carries out the photoetching of horizontal direction and is etched to the lower target film of exposing;
Step 5: the upper surface of generate in step 4 three parts is subjected to deposited metal and is electrically connected film, and is graphically made Make routing PAD;
Step 6: carrying out front etch release for the silicon wafer wafer of the bottom of middle section bilayer piezoelectric membrane, is formed to have and be inclined The chamber portion at angle.
2. a kind of production method of high density directive property piezo-electric electro-acoustic transducer array according to claim 1, feature Be: the size of the silicon wafer wafer is 4 cun or 6 cun or 8 cun or 12 cun;The wafer is ordinary silicon chip or SOI Silicon wafer.
3. a kind of production method of high density directive property piezo-electric electro-acoustic transducer array according to claim 1, feature Be: the lower electrode film, target film, upper electrode film material be have Ohmic contact and conductive gold Category, metal oxide or non-metal conductor.
4. a kind of production method of high density directive property piezo-electric electro-acoustic transducer array according to claim 1, feature Be: the lower electrode film, target film, upper electrode film material be metal platinum, gold, aluminium.
5. a kind of production method of high density directive property piezo-electric electro-acoustic transducer array according to claim 1, feature Be: the material of upper layer piezoelectric membrane and lower layer's piezoelectric membrane is the material for having piezoelectric effect.
6. a kind of production method of high density directive property piezo-electric electro-acoustic transducer array according to claim 1, feature Be: the material of upper layer piezoelectric membrane and lower layer's piezoelectric membrane is lead zirconate titanate or oxidized aluminum nitride zinc or ternary system or binary system Lead zirconate titanate, the quartz of doping.
CN201910721646.1A 2019-08-06 2019-08-06 Manufacturing method of high-density directional piezoelectric electroacoustic transducer array Active CN110337056B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910721646.1A CN110337056B (en) 2019-08-06 2019-08-06 Manufacturing method of high-density directional piezoelectric electroacoustic transducer array

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910721646.1A CN110337056B (en) 2019-08-06 2019-08-06 Manufacturing method of high-density directional piezoelectric electroacoustic transducer array

Publications (2)

Publication Number Publication Date
CN110337056A true CN110337056A (en) 2019-10-15
CN110337056B CN110337056B (en) 2021-01-26

Family

ID=68148760

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910721646.1A Active CN110337056B (en) 2019-08-06 2019-08-06 Manufacturing method of high-density directional piezoelectric electroacoustic transducer array

Country Status (1)

Country Link
CN (1) CN110337056B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111816755A (en) * 2020-06-18 2020-10-23 中北大学 AlN-based piezoelectric MEMS hydrophone and preparation method thereof
US20210377670A1 (en) * 2020-05-29 2021-12-02 Qualcomm Incorporated Audio speaker and proximity sensor with piezoelectric polymer technology

Citations (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1394103A (en) * 2001-06-26 2003-01-29 株式会社村田制作所 Piezoelectric electroacoustic transducer and mfg. method thereof
CN1517296A (en) * 2002-09-26 2004-08-04 ���ǵ�����ʽ���� Flexible micro-electromechanical system changer and its manufacturing method and radio loud-speaker
CN1731595A (en) * 2005-08-31 2006-02-08 清华大学 Micro-ultrasonic device making technics facing facing orientation and distance-measuring application
US20110006382A1 (en) * 2009-07-07 2011-01-13 Rohm Co., Ltd. MEMS sensor, silicon microphone, and pressure sensor
CN102143422A (en) * 2010-01-29 2011-08-03 柳杨 Circular membrane piezoelectric ultrasonic transducer
CN103946996A (en) * 2011-09-20 2014-07-23 新宁研究院 Ultrasound transducer and method for making the same
CN103985814A (en) * 2014-05-13 2014-08-13 上海集成电路研发中心有限公司 Double-layer piezoelectric film cantilever beam sensor structure and manufacturing method thereof
WO2015005193A1 (en) * 2013-07-12 2015-01-15 富士フイルム株式会社 Substrate for diaphragm-type resonant mems devices, diaphragm-type resonant mems device and method for manufacturing same
CN104718768A (en) * 2012-10-15 2015-06-17 Nec卡西欧移动通信株式会社 Electroacoustic transducer, manufacturing method thereof, and electronic device utilizing same
JP2016030305A (en) * 2014-07-28 2016-03-07 セイコーエプソン株式会社 Electronic device and manufacturing method
CN105428519A (en) * 2015-12-17 2016-03-23 上海集成电路研发中心有限公司 Multilayer piezoelectric thin film cantilever beam sensor and preparation method therefor
CN106060756A (en) * 2016-08-22 2016-10-26 明光市龙腾科技工贸有限公司 Method for manufacturing multilayer piezoelectric loudspeaker vibrator
US20170171680A1 (en) * 2015-12-15 2017-06-15 Kabushiki Kaisha Audio-Technica Narrow directional microphone
CN107920313A (en) * 2016-08-27 2018-04-17 深圳市诺维创科技有限公司 A kind of miniature piezoelectric ultrasonic transducer and preparation method thereof
CN108462935A (en) * 2018-04-28 2018-08-28 广州凯立达电子有限公司 Double-deck piezoelectric ceramic electro-acoustic element and preparation method thereof
US20190082268A1 (en) * 2017-09-13 2019-03-14 Hyundai Motor Company Micro phone and method for manufacturing the same
CN109926298A (en) * 2017-12-18 2019-06-25 深圳先进技术研究院 One mode converts ultrasonic transducer and its manufacturing method
CN110040681A (en) * 2019-03-05 2019-07-23 常州元晶电子科技有限公司 A kind of production method of the high consistency MEMS PZT (piezoelectric transducer) of low cost

Patent Citations (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1394103A (en) * 2001-06-26 2003-01-29 株式会社村田制作所 Piezoelectric electroacoustic transducer and mfg. method thereof
CN1517296A (en) * 2002-09-26 2004-08-04 ���ǵ�����ʽ���� Flexible micro-electromechanical system changer and its manufacturing method and radio loud-speaker
CN1731595A (en) * 2005-08-31 2006-02-08 清华大学 Micro-ultrasonic device making technics facing facing orientation and distance-measuring application
US20110006382A1 (en) * 2009-07-07 2011-01-13 Rohm Co., Ltd. MEMS sensor, silicon microphone, and pressure sensor
CN102143422A (en) * 2010-01-29 2011-08-03 柳杨 Circular membrane piezoelectric ultrasonic transducer
CN103946996A (en) * 2011-09-20 2014-07-23 新宁研究院 Ultrasound transducer and method for making the same
CN104718768A (en) * 2012-10-15 2015-06-17 Nec卡西欧移动通信株式会社 Electroacoustic transducer, manufacturing method thereof, and electronic device utilizing same
WO2015005193A1 (en) * 2013-07-12 2015-01-15 富士フイルム株式会社 Substrate for diaphragm-type resonant mems devices, diaphragm-type resonant mems device and method for manufacturing same
CN103985814A (en) * 2014-05-13 2014-08-13 上海集成电路研发中心有限公司 Double-layer piezoelectric film cantilever beam sensor structure and manufacturing method thereof
JP2016030305A (en) * 2014-07-28 2016-03-07 セイコーエプソン株式会社 Electronic device and manufacturing method
US20170171680A1 (en) * 2015-12-15 2017-06-15 Kabushiki Kaisha Audio-Technica Narrow directional microphone
CN105428519A (en) * 2015-12-17 2016-03-23 上海集成电路研发中心有限公司 Multilayer piezoelectric thin film cantilever beam sensor and preparation method therefor
CN106060756A (en) * 2016-08-22 2016-10-26 明光市龙腾科技工贸有限公司 Method for manufacturing multilayer piezoelectric loudspeaker vibrator
CN107920313A (en) * 2016-08-27 2018-04-17 深圳市诺维创科技有限公司 A kind of miniature piezoelectric ultrasonic transducer and preparation method thereof
US20190082268A1 (en) * 2017-09-13 2019-03-14 Hyundai Motor Company Micro phone and method for manufacturing the same
CN109926298A (en) * 2017-12-18 2019-06-25 深圳先进技术研究院 One mode converts ultrasonic transducer and its manufacturing method
CN108462935A (en) * 2018-04-28 2018-08-28 广州凯立达电子有限公司 Double-deck piezoelectric ceramic electro-acoustic element and preparation method thereof
CN110040681A (en) * 2019-03-05 2019-07-23 常州元晶电子科技有限公司 A kind of production method of the high consistency MEMS PZT (piezoelectric transducer) of low cost

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20210377670A1 (en) * 2020-05-29 2021-12-02 Qualcomm Incorporated Audio speaker and proximity sensor with piezoelectric polymer technology
CN111816755A (en) * 2020-06-18 2020-10-23 中北大学 AlN-based piezoelectric MEMS hydrophone and preparation method thereof

Also Published As

Publication number Publication date
CN110337056B (en) 2021-01-26

Similar Documents

Publication Publication Date Title
CN111001553B (en) Tunable ultrasonic sensor array
CN107532938B (en) Ultrasonic microphone and ultrasonic acoustic radio apparatus
US8116508B2 (en) Dual-mode loudspeaker
KR101520070B1 (en) Piezoelectric microspeaker and its fabrication method
KR101598927B1 (en) Piezoelectric Speaker
US20100256498A1 (en) Ultrasonic imaging device
CN111050256A (en) Miniaturized high-sensitivity piezoelectric microphone
JP2009260723A (en) Transducer
US8858447B2 (en) Ultrasonic transducer and method of manufacturing the same
CN102111702A (en) Piezoelectric flat panel loudspeaker with distributed ceramic wafers
WO2021000070A1 (en) Mems microphone
CN112543408B (en) Closed diaphragm piezoelectric MEMS loudspeaker and preparation method thereof
CN101478709A (en) Ultrasonic sensor and loudspeaker
CN110337056A (en) A kind of production method of high density directive property piezo-electric electro-acoustic transducer array
CN115914959A (en) Acoustic piezoelectric thin film device structure
CN209748809U (en) audio device and electronic equipment
CN111054615B (en) MEMS piezoelectric ultrasonic transducer with horn structure
WO2022141827A1 (en) Bone conduction sound transmission device
US20130257551A1 (en) Oscillator device and electronic instrument
US8121317B2 (en) Piezoelectric microphone
CN104796831B (en) A kind of Electret Condencer Microphone and its manufacturing method
WO2005053357A1 (en) Piezoelectric microspeaker with corrugated diaphragm
CN101867860B (en) Condenser microphone having split electrodes
CN105338458A (en) Mems microphone
WO2012132261A1 (en) Oscillator and electronic device

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
CB03 Change of inventor or designer information

Inventor after: Wang Huanhuan

Inventor after: Ge Bin

Inventor before: Wang Huanhuan

Inventor before: Xu Jinguo

Inventor before: Ge Bin

CB03 Change of inventor or designer information
GR01 Patent grant
GR01 Patent grant
CP03 Change of name, title or address

Address after: 213000 No. 17, beitanghe East Road, Tianning District, Changzhou City, Jiangsu Province

Patentee after: Changzhou Yuanjingmo Microelectronics Co.,Ltd.

Country or region after: China

Address before: 213000 No. 11 Qingyang North Road, Tianning District, Changzhou City, Jiangsu Province

Patentee before: CHANGZHOU YUANJING ELECTRONIC TECHNOLOGY CO.,LTD.

Country or region before: China

CP03 Change of name, title or address