CN110323198A - Contactless upper lower chip packaging structure and its packaging method - Google Patents
Contactless upper lower chip packaging structure and its packaging method Download PDFInfo
- Publication number
- CN110323198A CN110323198A CN201910679831.9A CN201910679831A CN110323198A CN 110323198 A CN110323198 A CN 110323198A CN 201910679831 A CN201910679831 A CN 201910679831A CN 110323198 A CN110323198 A CN 110323198A
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- Prior art keywords
- pin
- chip
- subframe
- opening
- contactless
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- 238000004806 packaging method and process Methods 0.000 title claims abstract description 27
- 238000000034 method Methods 0.000 title claims abstract description 14
- 238000009413 insulation Methods 0.000 claims abstract description 8
- 238000000465 moulding Methods 0.000 claims description 12
- 238000004080 punching Methods 0.000 claims description 11
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 9
- 229910052802 copper Inorganic materials 0.000 claims description 9
- 239000010949 copper Substances 0.000 claims description 9
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 8
- 239000000463 material Substances 0.000 claims description 6
- 238000005520 cutting process Methods 0.000 claims description 5
- 229920003023 plastic Polymers 0.000 claims description 5
- 239000004033 plastic Substances 0.000 claims description 5
- 238000005452 bending Methods 0.000 claims description 3
- 238000005476 soldering Methods 0.000 claims description 3
- 239000012790 adhesive layer Substances 0.000 claims description 2
- 238000005538 encapsulation Methods 0.000 abstract description 4
- 230000002093 peripheral effect Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000001816 cooling Methods 0.000 description 2
- 239000006185 dispersion Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 238000012536 packaging technology Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/367—Cooling facilitated by shape of device
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49541—Geometry of the lead-frame
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49541—Geometry of the lead-frame
- H01L23/49548—Cross section geometry
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49541—Geometry of the lead-frame
- H01L23/49548—Cross section geometry
- H01L23/49551—Cross section geometry characterised by bent parts
- H01L23/49555—Cross section geometry characterised by bent parts the bent parts being the outer leads
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49575—Assemblies of semiconductor devices on lead frames
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- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/18—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different subgroups of the same main group of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N
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- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/50—Multistep manufacturing processes of assemblies consisting of devices, each device being of a type provided for in group H01L27/00 or H01L29/00
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16245—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32135—Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/32145—Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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- H—ELECTRICITY
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73253—Bump and layer connectors
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Abstract
The present invention discloses the contactless upper lower chip packaging structure of one kind and its packaging method, it include: lead frame, first chip, second chip and plastic-sealed body, the lead frame includes the first subframe and the second subframe, first subframe and the opposite side of the second subframe are equipped with the first pin, second pin and third pin, and the second pin is located at the lower section of the first pin, the lower surface of first chip is electrically connected with the first pin on the first subframe and the second subframe, the lower surface of second chip is respectively fixedly connected with by insulation glue-line with the second pin on the first subframe and the second subframe, upper surface is electrically connected by bonding wire and the third pin on the first subframe and the second subframe, the plastic-sealed body encapsulates first chip, second chip, first pin, second pin With third pin.The present invention makes small chip be embedded in the bottom of large chip, improves the utilization rate in lead frame structure space, reduces encapsulation volume, improves radiating efficiency.
Description
Technical field
The present invention relates to microelectronic packaging technology fields, and in particular to a kind of contactless upper lower chip packaging structure and its
Packaging method.
Background technique
Chip package is a kind of technology for being packaged the plastics of integrated circuit insulation or ceramic material, does not pacify only up to
It puts, fix, sealing, protecting the effect of chip and increased thermal conductivity energy, but also being to link up the chip interior world and external circuit
Bridge.As intellectual product and wearable device Xiang Geng little, thinner and lighter direction develop, the manufacturing process of chip is not yet
It is disconnected to develop from micron to nanoscale, but the process of chip manufacturing develop more down it is more difficult.
As shown in Figure of description 1, the existing main mode of multi-chip package, which is that large chip 20 is folded, is loaded in lead frame 10
Upper surface, small chip 30 is folded to be loaded in 20 upper surface of large chip, and distance is very between the small chip 30 of such structure and large chip 20
Closely, 20 lower surface of large chip to the lower surface of plastic-sealed body 40 distance and small chip 30 to plastic-sealed body 40 upper surface away from
It is larger from, the heat dissipation between chip is not utilized, and 40 thickness of plastic-sealed body is big after plastic packaging molding, and product overall volume is larger.
Summary of the invention
The present invention in view of the existing deficiencies of the prior art, provides the contactless upper lower chip packaging structure of one kind and its encapsulation
Method can save the encapsulated space of chip, reduce the thickness of plastic-sealed body, improve chip cooling efficiency.
To achieve the above object, the present invention is using following technical solution:
A kind of contactless upper lower chip packaging structure, comprising:
Lead frame, the lead frame include the first subframe and the second subframe, first subframe and the second sub- frame
The opposite side of frame is equipped with the first pin, second pin and third pin, and first pin and second pin are staggered up and down
Setting, and the second pin is located at the lower section of the first pin, and first on first subframe and the second subframe draws
It is formed with the first opening between foot, is formed with second between the second pin on first subframe and the second subframe and opens
Mouthful, the width of first opening is greater than the width of the second opening;
First chip, the lower surface of first chip and the first pin on the first subframe and the second subframe are distinguished
It is electrically connected, and lower surface a part of first chip is exposed by the first opening;
The lower surface of second chip, second chip passes through on insulation glue-line and the first subframe and the second subframe
Second pin is respectively fixedly connected with, and lower surface a part of second chip is exposed by the second opening, second core
The upper surface of piece is electrically connected by bonding wire and the third pin on the first subframe and the second subframe, second core
Gap is maintained between the upper surface of piece and the lower surface of the first chip;
Plastic-sealed body, the plastic-sealed body are encapsulated first chip, the second chip, the first pin, second pin and third and are drawn
Foot.
As a preferred solution of the present invention, first pin is concordant with the upper surface of lead frame body straight
Pin, the second pin and third pin are from the downward dent dent pin in the upper surface of lead frame body, and institute
It is concordant with the upper surface of third pin to state second pin.
As a preferred solution of the present invention, the lower surface of first chip is equipped with the copper pillar bump protruded out downwards,
The end of the copper pillar bump is equipped with tin cap, and first chip passes through the on tin cap and the first subframe and the second subframe
Connection is respectively welded in one pin.
As a preferred solution of the present invention, the upper surface of second chip is equipped with several pads, and the pad is logical
It crosses bonding wire and is respectively welded with the third pin on the first subframe and the second subframe and is connect.
As a preferred solution of the present invention, the second pin stretches out in the lower section of the first opening.
A kind of contactless chip packaging method up and down, comprising the following steps:
1) it molded lead: using punching or cutting mode, is formed on the first subframe and the second subframe of lead frame
First pin, second pin and third pin out, and the extension elongation of the first pin is made to be less than second pin and third pin
Extension elongation;
2) the dent molding of second pin: punching press is carried out to second pin using mold, makes second pin with respect to the first pin
It bends downward, makes to form the first opening, the first subframe and the between the first pin on the first subframe and the second subframe
The second opening is formed between second pin on two subframes, the width of the first opening is greater than the width of the second opening;
3) the dent molding of third pin: punching press is carried out to third pin using mold, makes third pin with respect to the first pin
It bends downward;Wherein, the third pin includes the peripheral pins of three interior pins and four, when punching press, is first drawn in dent three
Foot dent four peripheral pins again.
4) the second chip assembles: firstly, the second chip is made to pass through the first opening, then, making the second core using insulation glue-line
Piece is respectively fixedly connected with the second pin on the first subframe and the second subframe, finally, making the second chip by bonding wire
Upper surface and third pin are electrically connected;
5) the first chip assembles: being made on lower surface and the first subframe and the second subframe of the first chip using Reflow Soldering
The first pin be electrically connected;
6) encapsulated moulding: by vacuum mold make encapsulating material encapsulate first chip, the second chip, the first pin,
Second pin and third pin are to form plastic-sealed body;
7) dowel on lead frame is cut off, forms the packaging body of multiple dispersions by Trim Molding.
As a preferred solution of the present invention, in step 3), the upper surface of third pin and the upper surface of second pin
Concordantly.
It as a preferred solution of the present invention, is 140 DEG C~160 DEG C in temperature when the second chip assembles in step 4)
When baking 2~3h make the curable adhesive layer that insulate, realize being fixedly connected for the second chip and second pin.
As a preferred solution of the present invention, the upper surface of first chip is at a distance from the upper surface of plastic-sealed body
90-110μm。
As a preferred solution of the present invention, in step 6), the encapsulating material selects good fluidity, partial size less than 50
μm plastic grain.
The present invention has obvious advantages and beneficial effects compared with the existing technology, specifically, by making second pin
Dent downwards with respect to the first pin with third pin, what the first chip was installed on the first subframe and the second subframe first draws
On foot, the second chip is installed in the second pin on the first subframe and the second subframe, and the second chip passes through bonding wire
It is electrically connected with third pin, so that small chip be made to be embedded in the bottom of large chip, and keeps spacing between small chip and large chip,
Compared with the utilization rate that the folded structure for being downloaded to large chip surface of small chip improves lead frame structure space, reduce the thickness of plastic-sealed body
Degree, reduces encapsulation volume, is conducive to product and develops towards smaller, thinner and lighter direction;Chip is above and below plastic-sealed body simultaneously
Both side surface is closer, is more advantageous to chip cooling, improves production quality, improves product service life;Second pin and
Three pins are to reduce the length of bonding wire, bank is more stable from the downward dent dent pin in the upper surface of lead frame body.
More clearly to illustrate structure feature of the invention, technological means and its specific purposes achieved and function, under
In conjunction with attached drawing and specific embodiment, invention is further described in detail in face:
Detailed description of the invention
Fig. 1 is chip-packaging structure schematic diagram in the prior art;
Fig. 2 is the overlooking structure diagram of embodiments of the present invention;
Fig. 3 is the side structure schematic view of embodiments of the present invention;
Fig. 4 is the structural schematic diagram after embodiments of the present invention rib cutting.
Description of drawing identification:
10, lead frame;11, the first subframe;12, the second subframe;
13, the first pin;14, second pin;15, third pin;
16, bonding wire;17, insulate glue-line;20, the first chip;
21, copper pillar bump;30, the second chip;31, pad;
40, plastic-sealed body.
Specific embodiment
In the description of the present invention, it should be noted that term " center ", "upper", "lower", "left", "right", "vertical",
The orientation or positional relationship of the instructions such as "horizontal", "inner", "outside" be based on the orientation or positional relationship shown in the drawings, merely to
Convenient for description invention and simplify description, rather than the position of indication or suggestion meaning or element must have a particular orientation, with
Specific orientation construction and operation, therefore be not considered as limiting the invention.
In the description of the present invention, it should be noted that unless otherwise clearly defined and limited, term " installation ", " phase
Even ", " connection " shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or be integrally connected;It can
To be mechanical connection, it is also possible to be electrically connected;It can be directly connected, can also can be indirectly connected through an intermediary
Connection inside two elements.For the ordinary skill in the art, concrete condition can be regarded and understand that above-mentioned term exists
Concrete meaning in the present invention.
As in Figure 2-4, a kind of contactless upper lower chip packaging structure, comprising: lead frame 10, the lead frame 10 wrap
Include the first subframe 11 and the second subframe 12, first subframe 11 and the opposite side of the second subframe 12 are equipped with
One pin 13, second pin 14 and third pin 15, first pin 13 and about 14 second pin are arranged in a staggered manner, and institute
State the lower section that second pin 14 is located at the first pin 13, the first pin 13 on first subframe 11 and the second subframe 12
Between be formed with the first opening, the second pin 14 stretches out in the lower section of the first opening, first subframe 11 and second
The second opening is formed between second pin 14 on subframe 12, the width of first opening is greater than the width of the second opening
Degree;The first pin on first chip 20, the lower surface of first chip 20 and the first subframe 11 and the second subframe 12
13 are electrically connected, and lower surface a part of first chip 20 is exposed by the first opening;Second chip 30, it is described
The lower surface of second chip 30 is divided by the glue-line 17 that insulate with the second pin 14 on the first subframe 11 and the second subframe 12
Be not fixedly connected, and lower surface a part of second chip 30 by second opening expose, second chip 30 it is upper
Surface is electrically connected by bonding wire 16 with the third pin 15 on the first subframe 11 and the second subframe 12, and described second
Gap is maintained between the upper surface of chip 30 and the lower surface of the first chip 20;Plastic-sealed body 40, the plastic-sealed body 40 encapsulate institute
State the first chip 20, the second chip 30, the first pin 13, second pin 14 and third pin 15, first chip 20 it is upper
Surface is 90-110 μm, specially 100 μm at a distance from the upper surface of plastic-sealed body 40.Specifically, the first sub- frame in the present invention
Frame 11 and the second subframe 12 pass through dowel integrally connected before cutting.
Specifically, first pin 13 is the straight pin concordant with the upper surface of lead frame body, described second draws
Foot 14 and third pin 15 are from the downward dent dent pin in the upper surface of lead frame body, and the second pin 14
It is concordant with the upper surface of third pin 15.The lower surface of first chip 20 is equipped with the copper pillar bump 21 protruded out downwards, described
The end of copper pillar bump 21 is equipped with tin cap, and first chip 20 passes through on tin cap and the first subframe 11 and the second subframe 12
The first pin 13 connection is respectively welded.The upper surface of second chip 30 is equipped with several pads 31, and the pad 31 passes through
Bonding wire 16 is respectively welded with the third pin 15 on the first subframe 11 and the second subframe 12 and connect.
A kind of contactless chip packaging method up and down, comprising the following steps:
1) molded lead: using punching or cutting mode, in the first subframe 11 and the second subframe 12 of lead frame 10
On mold the first pin 13, second pin 14 and third pin 15, and draw the extension elongation of the first pin 13 less than second
The extension elongation of foot 14 and third pin 15, the surface area of second pin 14 are greater than the surface of the first pin 13 and third pin 15
Product;
2) the dent molding of second pin 14: carrying out punching press to second pin 14 using mold, makes second pin 14 opposite the
One pin 13 is bent downward, and makes to form the first opening between the first pin 13 on the first subframe 11 and the second subframe 12,
The second opening is formed between second pin 14 on first subframe 11 and the second subframe 12, the width of the first opening is greater than the
The width of two openings;
3) the dent molding of third pin 15: carrying out punching press to third pin 15 using mold, makes third pin 15 opposite the
One pin 13 is bent downward;Wherein, the third pin 15 includes the peripheral pins of three interior pins and four, when punching press, is first beaten
Dent four peripheral pins, the upper surface of the upper surface and second pin 14 that finally make third pin 15 are flat again for recessed three interior pins
Together;
4) the second chip 30 assembles: firstly, the second chip 30 is made to pass through the first opening, then, being made using insulation glue-line 17
Second chip 30 is respectively fixedly connected with the second pin 14 on the first subframe 11 and the second subframe 12, finally, passing through weldering
Line 16 is electrically connected the pad 31 of 30 upper surface of the second chip and third pin 15;Wherein, insulation glue-line 17 is 140 in temperature
DEG C~160 DEG C when baking 2~3h after solidified, realize being fixedly connected for the second chip 30 and second pin 14;
5) the first chip 20 assembles: the lower surface of first chip 20 is equipped with several copper pillar bumps 21, copper pillar bump 21
End be equipped with tin cap, tin cap by Reflow Soldering make the first chip 20 lower surface and the first subframe 11 and the second subframe 12
On the first pin 13 be electrically connected;
6) encapsulated moulding: draw encapsulating material encapsulating first chip 20, the second chip 30, first by vacuum mold
Foot 13, second pin 14 and third pin 15 control upper surface and the plastic-sealed body of the first chip 20 to form plastic-sealed body 40
The distance of 40 upper surface is 90-110 μm, specially 100 μm;When encapsulation, the encapsulating material selects good fluidity, partial size small
In 50 μm of plastic grain.
7) dowel on lead frame 10 is cut off, forms the packaging body of multiple dispersions, while to lead frame by Trim Molding
10 outer pin carries out bending forming.
The above described is only a preferred embodiment of the present invention, be not intended to limit the invention, therefore it is all according to this hair
The practical any modification, equivalent substitution, improvement and etc. to the above embodiments of bright technology, still fall within technical solution of the present invention
In the range of.
Claims (10)
1. a kind of contactless upper lower chip packaging structure characterized by comprising
Lead frame, the lead frame include the first subframe and the second subframe, first subframe and the second subframe phase
Pair side be equipped with the first pin, second pin and third pin, first pin and second pin are arranged in a staggered manner up and down,
And the second pin is located at the lower section of the first pin, between the first pin on first subframe and the second subframe
It is formed with the first opening, the second opening is formed between the second pin on first subframe and the second subframe, it is described
The width of first opening is greater than the width of the second opening;
First chip, the lower surface of first chip and the first pin on the first subframe and the second subframe are electrical respectively
Connection, and lower surface a part of first chip is exposed by the first opening;
The lower surface of second chip, second chip passes through second on insulation glue-line and the first subframe and the second subframe
Pin is respectively fixedly connected with, and lower surface a part of second chip is exposed by the second opening, second chip
Upper surface is electrically connected by bonding wire and the third pin on the first subframe and the second subframe, second chip
Gap is maintained between upper surface and the lower surface of the first chip;
Plastic-sealed body, the plastic-sealed body encapsulate first chip, the second chip, the first pin, second pin and third pin.
2. contactless upper lower chip packaging structure according to claim 1, which is characterized in that first pin be with
The concordant straight pin in the upper surface of lead frame body, the second pin and third pin are the upper table from lead frame body
Dent dent pin downwards, and the second pin is concordant with the upper surface of third pin.
3. contactless upper lower chip packaging structure according to claim 1, which is characterized in that under first chip
Surface is equipped with the copper pillar bump that protrudes out downwards, and the end of the copper pillar bump is equipped with tin cap, first chip by tin cap with
Connection is respectively welded in the first pin on first subframe and the second subframe.
4. contactless upper lower chip packaging structure according to claim 1, which is characterized in that second chip it is upper
Surface is equipped with several pads, and the pad is respectively welded by bonding wire and the third pin on the first subframe and the second subframe
Connection.
5. contactless upper lower chip packaging structure according to claim 1, which is characterized in that the second pin is stretched out
In the lower section of the first opening.
6. a kind of contactless chip packaging method up and down, which comprises the following steps:
1) using punching or cutting mode, the molded lead: is molded on the first subframe and the second subframe of lead frame
One pin, second pin and third pin, and make the extension elongation of the first pin less than the stretching of second pin and third pin
Length;
2) the dent molding of second pin: punching press is carried out to second pin using mold, keeps second pin downward with respect to the first pin
Bending makes to form the first opening between the first pin on the first subframe and the second subframe, the first subframe and the second son
The second opening is formed between second pin on frame, the width of the first opening is greater than the width of the second opening;
3) the dent molding of third pin: punching press is carried out to third pin using mold, keeps third pin downward with respect to the first pin
Bending;
4) the second chip assemble: firstly, make the second chip pass through first opening, then, using insulation glue-line make the second chip with
Second pin on first subframe and the second subframe is respectively fixedly connected with, finally, making the upper table of the second chip by bonding wire
Face and third pin are electrically connected;
5) the first chip assembles: making the on the lower surface and the first subframe and the second subframe of the first chip using Reflow Soldering
One pin is electrically connected;
6) encapsulated moulding: encapsulating material is made to encapsulate first chip, the second chip, the first pin, second by vacuum mold
Pin and third pin are to form plastic-sealed body.
7. contactless chip packaging method up and down according to claim 6, which is characterized in that
In step 3), the upper surface of third pin and the upper surface of second pin are concordant.
8. contactless chip packaging method up and down according to claim 6, which is characterized in that in step 4), the second core
When piece assembles, when temperature is 140 DEG C~160 DEG C, 2~3h of baking makes the curable adhesive layer that insulate, and realizes the second chip and second pin
Be fixedly connected.
9. it is according to claim 6 it is contactless up and down chip packaging method, which is characterized in that first chip it is upper
Surface is 90-110 μm at a distance from the upper surface of plastic-sealed body.
10. contactless chip packaging method up and down according to claim 6, which is characterized in that in step 6), the envelope
Package material selects the plastic grain of good fluidity, partial size less than 50 μm.
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CN111725173A (en) * | 2020-06-05 | 2020-09-29 | 杰群电子科技(东莞)有限公司 | Stack packaging structure and manufacturing method thereof |
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