CN110307963A - The method for detecting any wavelength focal length of transmission type optical system - Google Patents

The method for detecting any wavelength focal length of transmission type optical system Download PDF

Info

Publication number
CN110307963A
CN110307963A CN201910728724.0A CN201910728724A CN110307963A CN 110307963 A CN110307963 A CN 110307963A CN 201910728724 A CN201910728724 A CN 201910728724A CN 110307963 A CN110307963 A CN 110307963A
Authority
CN
China
Prior art keywords
optical system
wavelength
focal length
distance
rear cut
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201910728724.0A
Other languages
Chinese (zh)
Other versions
CN110307963B (en
Inventor
韩森
张齐元
庄锦程
王全召
李雪园
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzhou Wiener Instrument Co Ltd
Original Assignee
Suzhou Wiener Instrument Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suzhou Wiener Instrument Co Ltd filed Critical Suzhou Wiener Instrument Co Ltd
Priority to CN201910728724.0A priority Critical patent/CN110307963B/en
Publication of CN110307963A publication Critical patent/CN110307963A/en
Application granted granted Critical
Publication of CN110307963B publication Critical patent/CN110307963B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0242Testing optical properties by measuring geometrical properties or aberrations
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0242Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0271Testing optical properties by measuring geometrical properties or aberrations by using interferometric methods

Landscapes

  • Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

The present invention provides a kind of methods for detecting any wavelength focal length of transmission type optical system, which comprises the following steps: step 1 measures the focal length of optical system, obtains optical system λ0Focal length f (λ0);Step 2 measures the rear cut-off distance of optical system, obtains optical system λ1mRear cut-off distance l (λ1)、l(λ2)……l(λm);Step 3, by l (λ1)、l(λ2)……l(λm) substitute into rear cut-off distance and wavelength equation, calculate Al、Bl、ClAnd DlValue;Step 4, the A that will be calculatedl、Bl、Cl、DlValue substitute into intercept and wavelength equation, calculatings wavelength is λ0And λnOptical system rear cut-off distance l (λ0) and l (λn);Step 5 passes through l (λ0) and l (λn) calculate rear cut-off distance intervalStep 6 passes through f (λ0) andCalculate focal length f (λn), optical system is Single wavelength system, achromatic system, any one in apochromatic system.

Description

The method for detecting any wavelength focal length of transmission type optical system
Technical field
The present invention relates to a kind of methods for detecting focal length, and in particular to a kind of any wavelength of detection transmission type optical system is burnt Away from method.
Background technique
Focal length is an important parameter of optical system, common focal-length measurement method have magnifying power method, precision angle method, Abbe focometer method etc..Optical system designs usually under some specific wavelength and in certain wavelength band, transmitted light system The focal length of system changes with the variation of wavelength, and needs accurately to know the focal length of system in many applications.
A certain wavelength or the very broadband focal length in narrowband are mainly measured in existing focal length measurement method.As commonly Using the narrow bandwidth LED light source centered on 550nm in focometer, the focal length when focal length of measurement is optical system 550nm, in addition As patent CN201410439298.6 " the focal length of lens measurement device and method based on fizeau interferometer " uses laser interferometer The focal length of lens is measured, the monochromatic focal length that can be transmitted with accurate detection.Therefore due to present measuring instrument and method limitation, Limited wavelength focal length can only be measured.
Summary of the invention
The present invention is to carry out to solve the above-mentioned problems, and it is an object of the present invention to provide a kind of any wavelength of detection optical system The method of focal length.
The present invention provides a kind of methods for detecting any wavelength focal length of transmission type optical system, have the feature that, The following steps are included: step 1, measures the focal length of optical system using the instrument of focal length measurement, obtains optical system λ0 Focal length f (λ0);Step 2 measures the rear cut-off distance of optical system using the device of measurement rear cut-off distance, obtains optical system Unite λ1mRear cut-off distance l (λ1)、l(λ2)……l(λm);Step 2 is obtained the rear cut-off distance l (λ of m kind wavelength by step 31)、l (λ2)……l(λm) substitute into rear cut-off distance and wavelength equation,
M=1,2,3,4, calculate Al、Bl、ClAnd DlValue;Step 4, the A that will be calculatedl、Bl、ClAnd DlValue substitute into In formula (1), calculating separately wavelength is λ0And λnOptical system rear cut-off distance l (λ0) and l (λn);Step 5, by what is be calculated l(λ0) and l (λn) substitute into formula (2),
Calculate λ0And λnOptical system rear cut-off distance intervalStep 6, the f (λ that measurement is obtained0) and meter It obtainsIt substitutes into formula (3),
Calculating wavelength is λnOptical system focal length f (λn), wherein optical system be Single wavelength system, achromatic system with And any one in apochromatic system.
In the method for the detection any wavelength focal length of transmission type optical system provided by the invention, can also have such Feature, wherein 400nm≤λ0≠λ1≠…≠λm≠λn≤ 1000nm or 400nm≤λ01≠…≠λmn≤ 1000nm, Or 400nm≤λ01n≠…≠λm≤ 1000nm, optical system are achromatic system or apochromatic system, work as optics When system is achromatic system, in step 3,1.1≤X1≤ 4.9,5≤X2≤ 6.2,1.8≤X3≤ 2.3, when optical system is When apochromatic system, in step 3,0.1≤X1≤ 3.1,3.9≤X2≤ 6.9,1.8≤X3≤ 2.4,6.5≤X1+X2≤7.2。
In the method for the detection any wavelength focal length of transmission type optical system provided by the invention, can also have such Feature, wherein 300nm≤λ0≠λ1≠…≠λm≠λn≤ 2500nm or 300nm≤λ01≠…≠λmn≤ 2500nm, Or 300nm≤λ01n≠…≠λm≤ 2500nm, when optical system is Single wavelength system, in step 3,1.8≤X1≤ 2,3.9≤X2≤ 6.8,2.2≤X3≤ 2.3, when optical system is achromatic system, in step 3,2.1≤X1≤ 4.5,5≤ X2≤ 6.2,2≤X3≤ 2.1, when optical system is apochromatic system, in step 3,0.1≤X1≤ 3.1,3.9≤X2≤ 6.7,1.9≤X3≤ 2.4,6.6≤X1+X2≤7.2。
The present invention provides a kind of methods for detecting any wavelength focal length of transmission type optical system, have the feature that, The following steps are included: step 1, measures the focal length of optical system using the instrument of focal length measurement, obtains optical system λ0 Focal length f (λ0);Step 2 measures the rear cut-off distance of optical system using the device of measurement rear cut-off distance, obtains optical system Unite λ1mRear cut-off distance l (λ1)、l(λ2)……l(λm);Step 2 is obtained the rear cut-off distance l (λ of m kind wavelength by step 31)、l (λ2)……l(λm) substitute into rear cut-off distance and wavelength equation,
M=1,2,3, calculate Al、BlAnd ClValue;Step 4, the A that will be calculatedl、Bl、ClValue substitute into formula (4) In, calculating separately wavelength is λ0And λnOptical system rear cut-off distance l (λ0) and l (λn);Step 5, the l (λ that will be calculated0) and l (λn) substitute into formula (5),
Calculate λ0And λnOptical system rear cut-off distance intervalStep 6, the f (λ that measurement is obtained0) and meter It obtainsIt substitutes into formula (6),
Calculating wavelength is λnOptical system focal length f (λn), wherein optical system is Single wavelength system.It is provided in the present invention Detection any wavelength focal length of transmission type optical system method in, can also have the feature that, wherein when 400nm≤ λ0≠λ1≠…≠λm≠λn≤ 1000nm or 400nm≤λ01≠…≠λmn≤ 1000nm or 400nm≤λ01= λn≠…≠λmWhen≤1000nm, in step 3,0.1≤X1≤ 1.8,2.3≤X2≤ 4.9,1.8≤X1-X2≤4.4。
The present invention provides a kind of methods for detecting any wavelength focal length of transmission type optical system, have the feature that, The following steps are included: step 1, measures the focal length of optical system using the instrument of focal length measurement, obtains optical system λ1mFocal length f (λ1)...f(λm);Step 2, the focal length f (λ for the optical system that step 1 is obtained1)...f(λm) substitute into public affairs Formula:
M=1,2,3,4, calculate Af、Bf、CfAnd DfValue;Step 3, the A that will be calculatedf、Bf、CfAnd DfValue substitute into In above-mentioned formula (7), calculating wavelength is λnOptical system focal length f (λn), wherein optical system is Single wavelength system, colour killing Any one in poor system and apochromatic system.Af=Al+ C, C are constant, Bf=Bl, Cf=Cl, Df=Dl
In the method for the detection any wavelength focal length of transmission type optical system provided by the invention, can also have such Feature, wherein 400nm≤λ0≠λ1≠…≠λm≠λn≤ 1000nm or 400nm≤λ01≠…≠λmn≤ 1000nm, Or 400nm≤λ01n≠…≠λm≤ 1000nm, optical system are achromatic system or apochromatic system, work as optics When system is achromatic system, in step 2,1.1≤X1≤ 4.9,5≤X2≤ 6.2,1.8≤X3≤ 2.3, when optical system is When apochromatic system, in step 2,0.1≤X1≤ 3.1,3.9≤X2≤ 6.9,1.8≤X3≤ 2.4,6.5≤X1+X2≤7.2。
In the method for the detection any wavelength focal length of transmission type optical system provided by the invention, can also have such Feature, wherein 300nm≤λ0≠λ1≠…≠λm≠λn≤ 2500nm or 300nm≤λ01≠…≠λmn≤ 2500nm, Or 300nm≤λ01n≠…≠λm≤ 2500nm, when optical system is Single wavelength system, in step 2,1.8≤X1≤ 2,3.9≤X2≤ 6.8,2.2≤X3≤ 2.3, when optical system is achromatic system, in step 2,2.1≤X1≤ 4.5,5≤ X2≤ 6.2,2≤X3≤ 2.1, when optical system is apochromatic system, in step 2,0.1≤X1≤ 3.1,3.9≤X2≤ 6.7,1.9≤X3≤ 2.4,6.6≤X1+X2≤7.2。
The present invention provides a kind of methods for detecting any wavelength focal length of transmission type optical system, have the feature that, The following steps are included: step 1, measures the focal length of optical system using the instrument of focal length measurement, obtains optical system λ1mFocal length f (λ1)...f(λm);Step 2, the focal length f (λ for the optical system that step 1 is obtained1)...f(λm) substitute into public affairs Formula:
M=1,2,3, calculate Af、Bf、CfValue;Step 3, the A that will be calculatedf、Bf、CfValue substitute into above-mentioned formula (8) in, calculating wavelength is λnOptical system focal length f (λn), wherein optical system is Single wavelength system.Af=Al+ C, C are Constant, Bf=Bl, Cf=Cl
In the method for the detection any wavelength focal length of transmission type optical system provided by the invention, can also have such Feature, wherein as 400nm≤λ0≠λ1≠…≠λm≠λn≤ 1000nm or 400nm≤λ01≠…≠λmn≤ 1000nm or 400nm≤λ01n≠…≠λmWhen≤1000nm, in step 3,0.1≤X1≤ 1.8,2.3≤X2≤ 4.9,1.8≤X1-X2≤4.4。
The action and effect of invention
The method of the detection any wavelength focal length of transmission type optical system involved according to the present invention, because using one kind The measurement of wavelength focometry instrument measures to obtain wavelength to be λ to optical system0System focal length, then using after m kind wavelength Intercept measuring device obtains λ to optical system measuring1mRear cut-off distance l (λ1)、l(λ2)……l(λm), use l (λ1)、l (λ2)……l(λm) the rear cut-off distance formula l (λ) of not homologous ray can be corresponded to;λ is calculated separately according to rear cut-off distance formula l (λ)0And λn Rear cut-off distance l (λ0)、l(λn);λ is calculated again0And λnOptical system rear cut-off distance intervalOptics System wavelength is λnOptical system focal length f (λn) basisIt is calculated.
In addition, the method for the detection any wavelength focal length of transmission type optical system involved according to the present invention, it can be with one The measurement of kind wavelength focometry instrument measures to obtain wavelength to be~λ to optical systemmFocal length f (λ1)...f(λm), it uses Focal length f (λ1)...f(λm) focal length formula f (λ) that not homologous ray can be corresponded to, it is λ that wavelength, which is calculated,nOptical system coke Away from f (λn)。
So the above method through the invention, can access the focal length of any wavelength of transmission type optical system, it is above-mentioned Limited wavelength focometry in original method is expanded to the measurement of any wavelength focal length in a wavelength range by method, so that light The available more accurate detection of system focal length is learned, there is broad applicability.
In addition, the rear cut-off distance in the former is that the position of the plane of reference is different from the difference of focal length in the above method, therefore it Be substantially with the functional relation of wavelength it is the same, be only to differ a constant constant term.That is, realizing light After any wavelength detecting of system needs several specific wavelength focal lengths or needs 1 specific wavelength focal length and several specific wavelengths Then intercept is calculated according to correlation formula.And the measurement of optical system rear cut-off distance is easier to realize than focometry.
Detailed description of the invention
Fig. 1 is the relation schematic diagram of optical system different wave length focal length and rear cut-off distance in the present invention;
Fig. 2 is the schematic diagram of the focal length in the present invention using focometer measurement optical system;
Fig. 3 is the schematic diagram of the detection device of the rear cut-off distance of detection optical system in the present invention;
Fig. 4 is that interferometer measurement optical system focal length schematic diagram is used in the present invention;
Fig. 5 is in the present invention using the schematic diagram of the rear cut-off distance of interferometer detection optical system;
Fig. 6 is to obtain the solution coke of Single wavelength system using the detection method in embodiment in the embodiment of the present invention one Comparison diagram away from-wavelength curve and theoretic acquisition data and curves;
Fig. 7 is to obtain the solution coke of Single wavelength system using the detection method in embodiment in the embodiment of the present invention two Comparison diagram away from-wavelength curve and theoretic acquisition data and curves;
Fig. 8 is to obtain the solution coke of achromatic system using the detection method in embodiment in the embodiment of the present invention three Comparison diagram away from-wavelength curve and theoretic acquisition data and curves;
Fig. 9 is to obtain asking for apochromatic system system using the detection method in embodiment in the embodiment of the present invention four Solve the comparison diagram of focal length-wavelength curve and theoretic acquisition data and curves;
Specific embodiment
In order to be easy to understand the technical means, the creative features, the aims and the efficiencies achieved by the present invention, tie below Embodiment is closed to be specifically addressed the method for any wavelength focal length of detection transmission type optical system of the invention.
<embodiment one>
Fig. 1 is the focal length of lens and rear cut-off distance schematic diagram, and focal length is only that the plane of reference is different from the difference of rear cut-off distance, therefore Focal length and rear cut-off distance are the same with the knots modification of wavelength.
The present embodiment is the focal length for detecting any wavelength in Single wavelength optical system.
Fig. 2 is the schematic diagram of the focal length in the present invention using focometer measurement optical system;Fig. 3 is detection light in the present invention The schematic diagram of the detection device of the rear cut-off distance of system.
As shown in Figure 2,3, detection optical system focal length device 100 includes focometer 10, Single wavelength optical system 11 to be measured. Detection optical system rear cut-off distance device 200 includes laser 20, negative lens 21, microcobjective 22, collimating mirror 23, shearing interferometer 24, Single wavelength optical system to be measured 25 (being same structure with Single wavelength optical system 11 to be measured) and light intensity detector 26.Detection Optical system rear cut-off distance device 200 can replace laser 20 to detect different wave length rear cut-off distance.
11 focal length of optical system (conventional detection means) is measured with focometer 10, reuses rear cut-off distance detection device 200 Measure 3 wavelength rear cut-off distances of optical system.Laser 20 issues light beam by negative lens 21, micro- object in rear cut-off distance detection device Mirror 22, then directional light is formed by adjusting collimation lens 23, the collimation of directional light, directional light are detected by shearing interferometer 24 Lens 25 (being same structure with Single wavelength optical system 11 to be measured) to be measured are incident on, focus is pooled, passes through light intensity detector The maximum position of light intensity of detection convergence luminous point determines the position of focus, and records the rear cut-off distance of optical system corresponding wavelength.
The method that the focal length of any wavelength in Single wavelength optical system is detected in the present embodiment, passes through the optical system measured The focal length of 3 wavelength rear cut-off distances and 1 wavelength calculates any wavelength focal length of optical system, comprising the following steps:
Step 1 is λ using optical source wavelength0Focometer Single wavelength (monochrome) system is detected to obtain optical system Focal length f (λ0)。
Step 2 is respectively λ using wavelength1、λ2、λ3Rear cut-off distance detection device monochromatic system is detected to obtain three A rear cut-off distance l (λ1)、l(λ2)、l(λ3);
Step 3, the monochromatic system that step 2 is obtained are λ in wavelength1、λ2And λ3Rear cut-off distance l (λ1)、l(λ2)、l (λ3) substitute into formula:
M=1 in formula, 2,3,
400nm≤λ0≠λ1≠λ2≠λ3≠λn≤ 1000nm, at this point, 0.1≤X1≤ 1.8,2.3≤X2≤ 4.9,1.8≤ X1-X2≤4.4.That is X1、X2Take any real number within the scope of this.In the present embodiment, X1=0.7, X2=3.
Calculate Al、BlAnd ClValue.
Step 4, the A that will be calculatedl、BlAnd ClValue substitute into formula (4) in, calculatings wavelength be λ0And λnMonochromatic light Rear cut-off distance l (the λ of system0) and l (λn)。
Step 5 is λ according to the wavelength that step 4 obtains0And λnOptical system rear cut-off distance l (λ0) and l (λn) calculate λ0With λnOptical system rear cut-off distance interval
Step 6 is λ according to the wavelength that step 1 obtains0The defocused intercept f (λ of optical system0) and step 5 obtain λ0With λnOptical system rear cut-off distance intervalCalculating wavelength is λnOptical system focal length f (λn),
Fig. 6 is to obtain the solution coke of Single wavelength system using the detection method in embodiment in the embodiment of the present invention one Comparison diagram away from-wavelength curve and theoretic acquisition data and curves.In figure, Simulation is acquisition data and curves, and F7 is bent Line is to use the curve of 500nm, 600nm and 700nm by equations using the monochromatic optical system of F7 material, can from Fig. 6 To find out, this two curves are essentially coincided.
<embodiment two>
The present embodiment is the focal length for detecting any wavelength in Single wavelength optical system.
Fig. 5 is in the present invention using the schematic diagram of the rear cut-off distance of interferometer detection optical system.
As shown in Fig. 2,5, detection optical system focal length device 100 includes focometer 10, Single wavelength optical system 11 to be measured. Detection optical system rear cut-off distance device 400 includes 4 wavelength laser interferometers 40, standard flat mirror 41, Single wavelength optics to be measured System 42 (being same structure with Single wavelength optical system 11 to be measured) and reflecting spherical mirror 43.The interference of detection optical system rear cut-off distance Instrument 400 replaces different laser interferometer detection different wave length rear cut-off distances.
11 focal length of optical system (conventional detection means) is measured with focometer 10, reuses 400 measurement of interferometer detection 4 wavelength rear cut-off distances of optical system.Interferometer 400 issues directional light, by Plane reference mirror 41 and tested Single wavelength optical system It is converged after system 42, mobile reflecting spherical mirror 43, until 43 centre of sphere of reflecting spherical mirror is overlapped with the focus of optical system 42, passes through survey Measure Zernike-Z3(Z3=0, defocusing amount zero), record the position of spherical reflector 43.Replace different wave length laser interferometer 40, the position of available different wave length reflecting mirror 43, the as rear cut-off distance of different wave length.
The method that the focal length of any wavelength in Single wavelength optical system is detected in the present embodiment, passes through the optical system measured The focal length of 4 wavelength rear cut-off distances and 1 wavelength calculates any wavelength focal length of optical system, comprising the following steps:
Step 1 is λ using optical source wavelength0Focometer Single wavelength (monochrome) system is detected to obtain optical system Focal length f (λ0)。
Step 2 is respectively λ using wavelength1、λ2、λ3、λ4Rear cut-off distance detection device monochromatic system is detected to obtain Three rear cut-off distance l (λ1)、l(λ2)、l(λ3)、l(λ4);
Step 3, the monochromatic system that step 2 is obtained are λ in wavelength1、λ2、λ3、λ4Rear cut-off distance l (λ1)、l(λ2)、l (λ3)、l(λ4) substitute into formula:
M=1 in formula, 2,3,4,
As 300nm≤λ0≠λ1≠…≠λm≠λn≤ 2500nm or 300nm≤λ01≠…≠λmn≤ 2500nm, Or 300nm≤λ01n≠…≠λmWhen≤2500nm, 1.8≤X1≤ 2,3.9≤X2≤ 6.8,2.2≤X3≤2.3.This reality It applies in example, X1=2, X2=6, X3=2.2.
Calculate Al、Bl、Cl、DlValue.
Step 4, the A that will be calculatedl、Bl、Cl、DlValue substitute into formula (1) in, calculatings wavelength be λ0And λnMonochrome Rear cut-off distance l (the λ of optical system0) and l (λn)。
Step 5 is λ according to the wavelength that step 4 obtains0And λnOptical system rear cut-off distance l (λ0) and l (λn) calculate λ0With λnOptical system rear cut-off distance interval
Step 6 is λ according to the wavelength that step 1 obtains0The defocused intercept f (λ of optical system0) and step 5 obtain λ0With λnOptical system rear cut-off distance intervalCalculating wavelength is λnOptical system focal length f (λn),
Fig. 7 is to obtain the solution coke of Single wavelength system using the detection method in embodiment in the embodiment of the present invention two Comparison diagram away from-wavelength curve and theoretic acquisition data and curves.In figure, Simulation is acquisition data and curves, and BK7 is bent Line is to use the curve of 500nm, 600nm, 700nm and 800nm by equations using the monochromatic optical system of BK7 material, From figure 7 it can be seen that this two curves essentially coincide.
<embodiment three>
The present embodiment is the focal length for detecting any wavelength in achromatic optical system.
Fig. 4 is that interferometer measurement optical system focal length schematic diagram is used in the present invention.
As shown in Figure 3,4, the transmission wavefront detection device 300 for detecting any wavelength optical system includes 1 laser interference Instrument 30, standard spherical mirror 31, achromatic optical system 32, plate glass 33 and plane of reflection mirror 24.Detection process is detailed in specially Sharp CN201410439298.6), obtain focal length of the achromatic optical system 32 under 1 wavelength.Reuse rear cut-off distance detection dress Set 200 measurement optical system, 4 wavelength rear cut-off distances.In rear cut-off distance detection device laser 20 issue light beam by negative lens 21, Microcobjective 22, then directional light is formed by adjusting collimation lens 23, the collimation of directional light is detected by shearing interferometer 24, Directional light is incident on lens 25 (being same structure with achromatic optical system 32 to be measured) to be measured, pools focus, passes through light intensity The maximum position of light intensity of the detection convergence luminous point of detector 26 determines the position of focus, and after recording optical system corresponding wavelength Intercept.
The method that the focal length of any wavelength in achromatic optical system is detected in the present embodiment, passes through the optical system measured The focal length of 4 wavelength rear cut-off distances and 1 wavelength calculates any wavelength focal length of optical system, comprising the following steps:
Step 1 is λ using optical source wavelength0Focometer detected to obtain optical system coke to achromatic optical system Away from f (λ0)。
Step 2 is respectively λ using wavelength1、λ2、λ3、λ4Rear cut-off distance detection device achromatic optical system is examined It measures to three rear cut-off distance l (λ1)、l(λ2)、l(λ3)、l(λ4);
Step 3, the achromatic optical system that step 2 is obtained are λ in wavelength1、λ2、λ3、λ4Rear cut-off distance l (λ1)、l (λ2)、l(λ3)、l(λ4) substitute into formula:
M=1 in formula, 2,3,4,
As 400nm≤λ0≠λ1≠…≠λm≠λn≤ 1000nm or 400nm≤λ01≠…≠λmn≤ 1000nm, Or 400nm≤λ01n≠…≠λmWhen≤1000nm, 1.1≤X1≤ 4.9,5≤X2≤ 6.2,1.8≤X3≤2.3。
As 300nm≤λ0≠λ1≠…≠λm≠λn≤ 2500nm or 300nm≤λ01≠…≠λmn≤ 2500nm, Or 300nm≤λ01n≠…≠λmWhen≤2500nm, 2.1≤X1≤ 4.5,5≤X2≤ 6.2,2≤X3≤2.1。
In the present embodiment, 400nm≤λ0≠λ1≠λ2≠λ3≠λn≤ 1000nm, at this point, 1.1≤X1≤ 4.9,5≤X2 ≤ 6.2,1.8≤X3≤2.3.That is X1、X2、X3Take any real number within the scope of this.In the present embodiment, X1=2, X2=6, X3 =2.
Calculate Al、Bl、Cl、DlValue.
Step 4, the A that will be calculatedl、Bl、Cl、DlValue substitute into formula (1) in, calculatings wavelength be λ0And λnMonochrome Rear cut-off distance l (the λ of optical system0) and l (λn)。
Step 5 is λ according to the wavelength that step 4 obtains0And λnOptical system rear cut-off distance l (λ0) and l (λn) calculate λ0With λnOptical system rear cut-off distance interval
Step 6 is λ according to the wavelength that step 1 obtains0The defocused intercept f (λ of optical system0) and step 5 obtain λ0With λnOptical system rear cut-off distance intervalCalculating wavelength is λnOptical system focal length f (λn),
Fig. 8 is to obtain the solution coke of achromatic system using the detection method in embodiment in the embodiment of the present invention three Comparison diagram away from-wavelength curve and theoretic acquisition data and curves.In figure, Simulation is acquisition data and curves, colour killing Poor curve is that double glued achromatic optical systems use the curve of 500nm, 600nm, 700nm and 800nm by equations, from Fig. 8 can be seen that this two curves and essentially coincide.
<example IV>
The present embodiment is the focal length for detecting any wavelength in complex achromatic optical system.
As shown in figure 4, the transmission wavefront detection device 300 for detecting any wavelength optical system includes 4 laser interferometer 30, standard spherical mirror 31, complex achromatic optical system 32, plate glass 33 and plane of reflection mirror 24.Use 4 different wave lengths Laser interferometer 30 is identical to the light path and method of apochromatism system 32, and detection process is detailed in patent CN201410439298.6), focal length of the complex achromatic optical system 32 under 4 wavelength is obtained.
The method that the focal length of any wavelength in complex achromatic optical system is detected in the present embodiment, passes through the optical system measured The focal length of 4 wavelength of uniting carrys out any wavelength focal length of calculating optical system, comprising the following steps:
Step 1 is respectively respectively λ using wavelength1、λ2、λ3、λ4Laser interferometer system is detected to obtain focal length f(λ1)、f(λ2)、f(λ3)、f(λ4)。
Step 2, the focal length f (λ for the optical system that step 1 is obtained1)、f(λ2)、f(λ3)、f(λ4) substitute into focal length public affairs Formula:
M=1,2,3,4,
As 400nm≤λ0≠λ1≠…≠λm≠λn≤ 1000nm or 400nm≤λ01≠…≠λmn≤ 1000nm, Or 400nm≤λ01n≠…≠λmWhen≤1000nm, 0.1≤X1≤ 3.1,3.9≤X2≤ 6.9,1.8≤X3≤ 2.4, 6.5≤X1+X2≤7.2。
As 300nm≤λ0≠λ1≠…≠λm≠λn≤ 2500nm or 300nm≤λ01≠…≠λmn≤ 2500nm, Or 300nm≤λ01n≠…≠λmWhen≤2500nm, 0.1≤X1≤ 3.1,3.9≤X2≤ 6.7,1.9≤X3≤ 2.4, 6.6≤X1+X2≤7.2。
In the present embodiment, 310nm≤λ0≠λ1≠λ2≠λ3≠λn≤ 2400nm, at this point, 0.1≤X1≤ 3.1,3.9≤ X2≤ 6.9,1.8≤X3≤ 2.4,6.5≤X1+X2≤7.2.That is X1、X2、X3Take any real number within the scope of this.This implementation In example, X1=1.1, X2=5.8, X3=2.2.
Calculate Af、Bf、CfAnd DfValue.Wherein, Af=Al+ C, C are constant, Bf=Bl, Cf=Cl, Df=Dl
Step 3, the A that will be calculatedf、Bf、CfAnd DfValue substitute into above-mentioned formula (7) in, calculatings wavelength be λnOptics Focal length f (the λ of systemn)。
Fig. 9 is to obtain the solution coke of apochromatic system using the detection method in embodiment in the embodiment of the present invention four Comparison diagram away from-wavelength curve and theoretic acquisition data and curves.In figure, Simulation is acquisition data and curves, is disappeared again Chromatic curve is to use the curve of 500nm, 600nm, 700nm and 800nm by equations using apochromatic system, from figure 9 as can be seen that this two curves essentially coincide.
The action and effect of embodiment
The method of the detection any wavelength focal length of transmission type optical system involved according to the present invention, because using one kind The measurement of wavelength focometry instrument measures to obtain wavelength to be λ to optical system0System focal length, then using after m kind wavelength Intercept measuring device obtains λ to optical system measuring1mRear cut-off distance l (λ1)、l(λ2)……l(λm), use l (λ1)、l (λ2)……l(λm) the rear cut-off distance formula l (λ) of not homologous ray can be corresponded to;λ is calculated separately according to rear cut-off distance formula l (λ)0And λn Rear cut-off distance l (λ0)、l(λn);λ is calculated again0And λnOptical system rear cut-off distance intervalOptics System wavelength is λnOptical system focal length f (λn) basisIt is calculated.
In addition, the method for the detection any wavelength focal length of transmission type optical system involved according to the present invention, it can be with one The measurement of kind wavelength focometry instrument measures to obtain wavelength to be~λ to optical systemmFocal length f (λ1)...f(λm), it uses Focal length f (λ1)...f(λm) focal length formula f (λ) that not homologous ray can be corresponded to, it is λ that wavelength, which is calculated,nOptical system coke Away from f (λn)。
So the above method through the invention, can access the focal length of any wavelength of transmission type optical system, it is above-mentioned Limited wavelength focometry in original method is expanded to the measurement of any wavelength focal length in a wavelength range by method, so that light The available more accurate detection of system focal length is learned, there is broad applicability.
In addition, the rear cut-off distance in the former is that the position of the plane of reference is different from the difference of focal length in the above method, therefore it Be substantially with the functional relation of wavelength it is the same, be only to differ a constant constant term.That is, realizing light After any wavelength detecting of system needs several specific wavelength focal lengths or needs 1 specific wavelength focal length and several specific wavelengths Then intercept is calculated according to correlation formula.And the measurement of optical system rear cut-off distance is easier to realize than focometry.
Above embodiment is preferred case of the invention, the protection scope being not intended to limit the invention.

Claims (10)

1. a kind of method for detecting any wavelength focal length of transmission type optical system, which comprises the following steps:
Step 1 measures the focal length of optical system using the instrument of focal length measurement, obtains optical system λ0Focal length f (λ0);
Step 2 measures the rear cut-off distance of optical system using the device of measurement rear cut-off distance, obtains optical system λ1m's Rear cut-off distance l (λ1)、l(λ2)……l(λm);
Step 2 is obtained the rear cut-off distance l (λ of m kind wavelength by step 31)、l(λ2)……l(λm) substitute into rear cut-off distance and wavelength side Journey,
M=1,2,3,4,
Calculate Al、Bl、ClAnd DlValue;
Step 4, the A that will be calculatedl、Bl、ClAnd DlValue substitute into formula (1) in, calculate separately wavelength be λ0And λnOptics System rear cut-off distance l (λ0) and l (λn);
Step 5, the l (λ that will be calculated0) and l (λn) substitute into formula (2),
Calculate λ0And λnOptical system rear cut-off distance interval
Step 6, the f (λ that measurement is obtained0) and be calculatedIt substitutes into formula (3),
Calculating wavelength is λnOptical system focal length f (λn),
Wherein, the optical system is any one in Single wavelength system, achromatic system and apochromatic system.
2. the method for the detection any wavelength focal length of transmission type optical system according to claim 1, it is characterised in that:
Wherein, 400nm≤λ0≠λ1≠…≠λm≠λn≤ 1000nm or 400nm≤λ01≠…≠λmn≤ 1000nm, Or 400nm≤λ01n≠…≠λm≤ 1000nm, the optical system be achromatic system or apochromatic system,
When the optical system is achromatic system, in step 3,1.1≤X1≤ 4.9,5≤X2≤ 6.2,1.8≤X3≤ 2.3
When the optical system is apochromatic system, in step 3,0.1≤X1≤ 3.1,3.9≤X2≤ 6.9,1.8≤X3 ≤ 2.4,6.5≤X1+X2≤7.2。
3. the method for the detection any wavelength focal length of transmission type optical system according to claim 1, it is characterised in that:
Wherein, 300nm≤λ0≠λ1≠…≠λm≠λn≤ 2500nm or 300nm≤λ01≠…≠λmn≤ 2500nm, Or 300nm≤λ01n≠…≠λm≤ 2500nm,
When the optical system is Single wavelength system, in step 3,1.8≤X1≤ 2,3.9≤X2≤ 6.8,2.2≤X3≤ 2.3
When the optical system is achromatic system, in step 3,2.1≤X1≤ 4.5,5≤X2≤ 6.2,2≤X3≤ 2.1,
When the optical system is apochromatic system, in step 3,0.1≤X1≤ 3.1,3.9≤X2≤ 6.7,1.9≤X3 ≤ 2.4,6.6≤X1+X2≤7.2。
4. a kind of method for detecting any wavelength focal length of transmission type optical system, which comprises the following steps:
Step 1 measures the focal length of optical system using the instrument of focal length measurement, obtains optical system λ0Focal length f (λ0);
Step 2 measures the rear cut-off distance of optical system using the device of measurement rear cut-off distance, obtains optical system λ1m's Rear cut-off distance l (λ1)、l(λ2)……l(λm);
Step 2 is obtained the rear cut-off distance l (λ of m kind wavelength by step 31)、l(λ2)……l(λm) substitute into rear cut-off distance and wavelength side Journey,
M=1,2,3,
Calculate Al、BlAnd ClValue;
Step 4, the A that will be calculatedl、Bl、ClValue substitute into formula (4) in, calculate separately wavelength be λ0And λnOptical system Rear cut-off distance l (λ0) and l (λn);
Step 5, the l (λ that will be calculated0) and l (λn) substitute into formula (5),
Calculate λ0And λnOptical system rear cut-off distance interval
Step 6, the f (λ that measurement is obtained0) and be calculatedIt substitutes into formula (6),
Calculating wavelength is λnOptical system focal length f (λn),
Wherein, the optical system is Single wavelength system.
5. the method for the detection any wavelength focal length of transmission type optical system according to claim 4, it is characterised in that:
Wherein, as 400nm≤λ0≠λ1≠…≠λm≠λn≤ 1000nm or 400nm≤λ01≠…≠λmn≤ 1000nm or 400nm≤λ01n≠…≠λmWhen≤1000nm, in step 3,0.1≤X1≤ 1.8,2.3≤X2≤ 4.9,1.8≤X1-X2≤4.4。
6. a kind of method for detecting any wavelength focal length of transmission type optical system, which comprises the following steps:
Step 1 measures the focal length of optical system using the instrument of focal length measurement, obtains optical system λ1mFocal length f(λ1)...f(λm);
Step 2, the focal length f (λ for the optical system that step 1 is obtained1)...f(λm) substitute into focal length formula:
M=1,2,3,4,
Calculate Af、Bf、CfAnd DfValue;
Step 3, the A that will be calculatedf、Bf、CfAnd DfValue substitute into above-mentioned formula (7) in, calculatings wavelength be λnOptical system Focal length f (λn),
Wherein, the optical system is any one in Single wavelength system, achromatic system and apochromatic system.
7. the method for the detection any wavelength focal length of transmission type optical system according to claim 6, it is characterised in that:
Wherein, 400nm≤λ0≠λ1≠…≠λm≠λn≤ 1000nm or 400nm≤λ01≠…≠λmn≤ 1000nm, Or 400nm≤λ01n≠…≠λm≤ 1000nm, the optical system be achromatic system or apochromatic system,
When the optical system is achromatic system, in step 2,1.1≤X1≤ 4.9,5≤X2≤ 6.2,1.8≤X3≤ 2.3
When the optical system is apochromatic system, in step 2,0.1≤X1≤ 3.1,3.9≤X2≤ 6.9,1.8≤X3 ≤ 2.4,6.5≤X1+X2≤7.2。
8. the method for the detection any wavelength focal length of transmission type optical system according to claim 6, it is characterised in that:
Wherein, 300nm≤λ0≠λ1≠…≠λm≠λn≤ 2500nm or 300nm≤λ01≠…≠λmn≤ 2500nm, Or 300nm≤λ01n≠…≠λm≤ 2500nm,
When the optical system is Single wavelength system, in step 2,1.8≤X1≤ 2,3.9≤X2≤ 6.8,2.2≤X3≤ 2.3
When the optical system is achromatic system, in step 2,2.1≤X1≤ 4.5,5≤X2≤ 6.2,2≤X3≤ 2.1,
When the optical system is apochromatic system, in step 2,0.1≤X1≤ 3.1,3.9≤X2≤ 6.7,1.9≤X3 ≤ 2.4,6.6≤X1+X2≤7.2。
9. a kind of method for detecting any wavelength focal length of transmission type optical system, which comprises the following steps:
Step 1 measures the focal length of optical system using the instrument of focal length measurement, obtains optical system λ1mFocal length f(λ1)...f(λm);
Step 2, the focal length f (λ for the optical system that step 1 is obtained1)...f(λm) substitute into focal length formula:
M=1,2,3,
Calculate Af、Bf、CfValue;
Step 3, the A that will be calculatedf、Bf、CfValue substitute into above-mentioned formula (8) in, calculatings wavelength be λnOptical system coke Away from f (λn),
Wherein, the optical system is Single wavelength system.
10. the method for the detection any wavelength focal length of transmission type optical system according to claim 9, it is characterised in that:
Wherein, as 400nm≤λ0≠λ1≠…≠λm≠λn≤ 1000nm or 400nm≤λ01≠…≠λmn≤ 1000nm or 400nm≤λ01n≠…≠λmWhen≤1000nm, in step 3,0.1≤X1≤ 1.8,2.3≤X2≤ 4.9,1.8≤X1-X2≤4.4。
CN201910728724.0A 2019-08-08 2019-08-08 Method for detecting any wavelength focal length of transmission type optical system Active CN110307963B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910728724.0A CN110307963B (en) 2019-08-08 2019-08-08 Method for detecting any wavelength focal length of transmission type optical system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910728724.0A CN110307963B (en) 2019-08-08 2019-08-08 Method for detecting any wavelength focal length of transmission type optical system

Publications (2)

Publication Number Publication Date
CN110307963A true CN110307963A (en) 2019-10-08
CN110307963B CN110307963B (en) 2020-11-03

Family

ID=68083169

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910728724.0A Active CN110307963B (en) 2019-08-08 2019-08-08 Method for detecting any wavelength focal length of transmission type optical system

Country Status (1)

Country Link
CN (1) CN110307963B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112985780A (en) * 2021-03-19 2021-06-18 苏州维纳仪器有限责任公司 Method for measuring magnification chromatic aberration of optical system

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006107985A2 (en) * 2005-04-05 2006-10-12 Qed Technologies International, Inc. Method for accurate high-resolution measurements of aspheric surfaces
CN101303269A (en) * 2007-05-09 2008-11-12 奥林巴斯株式会社 Optical system evaluation apparatus, optical system evaluation method and program thereof
CN102564736A (en) * 2011-09-15 2012-07-11 北京国科世纪激光技术有限公司 Device and method for measuring focal length of lens
CN104165758A (en) * 2014-08-29 2014-11-26 南京理工大学 Lens focal length measuring device and method based on Fizeau interferomenter
CN106959207A (en) * 2017-05-27 2017-07-18 崔京杰 GRIN Lens transmission wavefront measurement apparatus and method
CN107462401A (en) * 2017-07-26 2017-12-12 苏州维纳仪器有限责任公司 The method for detecting the transmission wavefront of any wavelength optical system
CN108195566A (en) * 2018-01-03 2018-06-22 苏州维纳仪器有限责任公司 The method for detecting arbitrary wavelength arbitrary shape bore optical system transmission wavefront
CN108225743A (en) * 2018-01-03 2018-06-29 苏州维纳仪器有限责任公司 The method for detecting arbitrary wavelength optical system defocus position transmission wavefront
CN109253867A (en) * 2018-09-27 2019-01-22 北京空间机电研究所 A kind of Focal Length of Optical system and method

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006107985A2 (en) * 2005-04-05 2006-10-12 Qed Technologies International, Inc. Method for accurate high-resolution measurements of aspheric surfaces
CN101303269A (en) * 2007-05-09 2008-11-12 奥林巴斯株式会社 Optical system evaluation apparatus, optical system evaluation method and program thereof
CN102564736A (en) * 2011-09-15 2012-07-11 北京国科世纪激光技术有限公司 Device and method for measuring focal length of lens
CN104165758A (en) * 2014-08-29 2014-11-26 南京理工大学 Lens focal length measuring device and method based on Fizeau interferomenter
CN106959207A (en) * 2017-05-27 2017-07-18 崔京杰 GRIN Lens transmission wavefront measurement apparatus and method
CN107462401A (en) * 2017-07-26 2017-12-12 苏州维纳仪器有限责任公司 The method for detecting the transmission wavefront of any wavelength optical system
CN108195566A (en) * 2018-01-03 2018-06-22 苏州维纳仪器有限责任公司 The method for detecting arbitrary wavelength arbitrary shape bore optical system transmission wavefront
CN108225743A (en) * 2018-01-03 2018-06-29 苏州维纳仪器有限责任公司 The method for detecting arbitrary wavelength optical system defocus position transmission wavefront
CN109253867A (en) * 2018-09-27 2019-01-22 北京空间机电研究所 A kind of Focal Length of Optical system and method

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
ZHAO W, LI, Z, QIU L, ET AL: "Large-aperture laser differential confocal ultra-long focal length measurement and its system", 《OPTICS EXPRESS》 *
张齐元,韩森 等: "离焦位置任意波长透射波前", 《光子学报》 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112985780A (en) * 2021-03-19 2021-06-18 苏州维纳仪器有限责任公司 Method for measuring magnification chromatic aberration of optical system

Also Published As

Publication number Publication date
CN110307963B (en) 2020-11-03

Similar Documents

Publication Publication Date Title
CN107462405B (en) Broadband differential confocal Infrared Lens element refractive index measurement method and device
US8520218B2 (en) Measuring method of refractive index and measuring apparatus of refractive index
CN103884491B (en) A kind of scanning camera pendulum mirror two dimension dynamic angular measures calibration steps and device
CN107144419B (en) A kind of optical system wavefront aberration measuring device and method based on Shack-Hartmann wavefront sensor
CN110146259A (en) A kind of reflective multi-light axis consistency quantitative test of large-caliber off-axis and calibrating installation
CN104111163A (en) Convex lens focal length measuring device and method
CN108007582B (en) Laser wavelength detection method and device based on Rayleigh Brillouin scattering
CN111999042B (en) Method for detecting any wavelength transmission wavefront of optical system
CN106679940A (en) High-precision laser divergence angle parameter calibration device
CN104165758B (en) Lens focal length measuring device and method based on Fizeau interferomenter
CN103471521B (en) The real-time detection method of optical aspherical surface fast and accurately
US10018836B2 (en) Geodetic instrument with diffractive optical elements
CN103471524B (en) Confocal paraboloids vertex curvature radius measuring method
CN110736721B (en) Glass plate refractive index uniformity detection device and detection method based on diffraction grating
CN107782697B (en) Method and device for measuring refractive index of broadband confocal infrared lens element
CN113465520A (en) System and method for realizing measurement of thickness and inclination angle of transparent material
CN102252828B (en) Method for monitoring real-time changes in reflectivity of highly reflective optical element under laser irradiation
CN108287058A (en) Correct superpower laser M2The device and method of measuring system thermal deformation
CN103471525B (en) Differential confocal parabola vertex curvature radius measurement method
CN113639661B (en) Morphology detection system and morphology detection method
CN110307963A (en) The method for detecting any wavelength focal length of transmission type optical system
CN108692819B (en) Wave-front detection system of wavelength tuning Hartmann sensor
CN111998782A (en) Optical measuring device and method
CN108195566B (en) The method for detecting any wavelength arbitrary shape bore optical system transmission wavefront
CN105806240A (en) Method capable of simultaneously measuring multiple absolute distances based on optical transfer functions

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant