CN110286253A - A kind of adaptive probe impedance matching process and device - Google Patents
A kind of adaptive probe impedance matching process and device Download PDFInfo
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- CN110286253A CN110286253A CN201910416677.6A CN201910416677A CN110286253A CN 110286253 A CN110286253 A CN 110286253A CN 201910416677 A CN201910416677 A CN 201910416677A CN 110286253 A CN110286253 A CN 110286253A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
- G01R21/133—Arrangements for measuring electric power or power factor by using digital technique
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H11/00—Networks using active elements
- H03H11/02—Multiple-port networks
- H03H11/28—Impedance matching networks
- H03H11/30—Automatic matching of source impedance to load impedance
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
A kind of adaptive probe impedance matching process and device, method include: S1, measure the output impedance of measurand, calculate measurand to the peak power output of probe according to measurement result；S2 measures measurand to the real output of probe, judges whether real output is equal to peak power output, if so, the fixed input impedance popped one's head at this time, if it is not, executing step S3；S3 calculates the adjustment direction of probe input impedance and is sized according to real output and peak power output, and according to adjustment direction and is sized the input impedance for adjusting and popping one's head in；S4 repeats step S2 and S3, until the real output of probe is equal to peak power output, the fixed input impedance popped one's head at this time.This method solve the measurement errors introduced due to measurand and test equipment due to impedance mismatch, can be directly applied for the probe of the test equipment of the impedances dependent form such as high-end oscillograph, frequency spectrograph.
Description
Technical field
The present invention relates to electronic measuring instrument field more particularly to a kind of adaptive probe impedance matching process and device.
Background technique
The electronic measuring instruments such as oscillograph, frequency spectrograph be unable to do without probe, and the quality of probe directly influences measurement result
Precision.Especially to high-precision test equipment, the performance of probe plays a key role measurement result.Determine probe performance
There are two factor is main: first is that the analog bandwidth of probe, which determine can determine from the frequency range of measurand pickoff signals
The signal distortion that measured signal is fed to before test equipment is determined；Second is that the input impedance of probe, which determine tested pair
Whether picture signals occur distorted signals during being sent into measuring instrument.Under normal conditions, the feature resistance of signal-transmitting cable
Resisting is 50 ohm, and in order to match with the characteristic impedance of signal-transmitting cable holding, the input impedance of test equipment is typically designed as
50 ohm or 1 megohm.Therefore, the input impedance of common probe is generally also configured as 50 ohm or 1 megohm.Low side oscillography
Device only has 1 megohm of input impedance, and the input impedance of middle-end oscillograph can switch between 50 ohm and 1 megohm, high-end
A kind of generally only 50 ohm of input impedances.In frequency applications, 50 ohm of instrument input impedance is mainly used for and signal electricity
Cable matching, prevents signal reflex；When low frequency applications, 1 megohm is mainly used for reducing influence of the input impedance to signal amplitude.
In actual measurement, it since the impedance of measurand can not just be exactly 50 ohm or 1 megohm, is answered in high frequency
In, there is signal reflex and generate measurement error and can hardly be avoided.
Summary of the invention
(1) technical problems to be solved
It is directed to above-mentioned technical problem, the present invention proposes a kind of adaptive probe impedance matching process and device, for solving
Certainly the impedance of measurand and the measuring instrument probe unmatched problem of input impedance improve to eliminate signal reflex and measure essence
The flexibility of degree and application.
(2) technical solution
One aspect of the present invention proposes a kind of adaptive probe impedance matching process, comprising: S1 measures the output of measurand
Impedance calculates measurand to the peak power output of probe according to measurement result；S2, reality of the measurement measurand to probe
Output power, judges whether real output is equal to peak power output, if so, the fixed input impedance popped one's head at this time, if
It is no, execute step S3；S3, according to real output and peak power output, calculate probe input impedance adjustment direction and
It is sized, and according to adjustment direction and is sized the adaptive input impedance for adjusting probe；It pops one's head in after S4, measuring process S3
Real output, repeat step S2 and S3, until the real output of probe is equal to peak power output, it is fixed at this time
The input impedance of probe.
Optionally, in step s 4, it repeats in step S3, real output includes that the reality of the probe currently measured is defeated
The real output of power and the preceding probe once measured out.
Optionally, after step s4 further include: the input impedance of probe fixed in step S4 is converted to 50 Europe by S5
The output impedance of nurse.
Optionally, in step sl, measure measurand output impedance include: by measurand be equivalent to voltage source with
The series connection of resistance measures the output impedance of measurand according to maximum power Transfer theorem.
Optionally, in step sl, it is as follows to the formula of the peak power output of probe to calculate measurand:
Wherein, PmaxFor peak power output, uOCFor the voltage swing of voltage source, R0For the output impedance of measurand.
Optionally, in step s 2, measurement measurand includes: that measurement measurand is defeated to the real output of probe
The voltage and current size of signal out calculates real output according to voltage and current size.
Optionally, before step S1 further include: S0 is hindered according to the initial input of the default probe of the type of measurand
It is anti-.
It optionally, in step s3, include: using power with the input impedance for being sized adjustment probe according to adjustment direction
Value resistor network is adjusted the input impedance of probe, wherein weight resistor network includes multiple weighted resistors, each weighted resistor
Resistance value with 2 integral multiple weight be incremented by.
Another aspect of the present invention provides a kind of adaptive probe impedance coalignment, comprising: impedance measurement module, for surveying
The output impedance for measuring measurand calculates measurand to the peak power output of probe according to measurement result；Impedance adjustment mould
Block is calculated and is visited according to real output and peak power output to the real output of probe for measuring measurand
It the adjustment direction of head input impedance and is sized, and according to adjustment direction and is sized the input of adaptive adjustment probe and hinders
Resist to required input impedance；Impedance transformation module, for the output impedance for being 50 ohm by required input impedance transformation.
Optionally, impedance adjustment module is according to the input impedance duplicate measurements measurand of the probe of adjustment to the reality of probe
Border output power, according to the real output of the probe of the secondary measurement, the preceding probe once measured real output and
Peak power output repeats the input impedance of adjustment probe to required input impedance.
(3) beneficial effect
The present invention proposes a kind of adaptive probe impedance matching process and device, has the beneficial effect that
Measurand is measured to the real output of probe, with measurand to the maximum work output of probe by dynamic
Rate compares, and dynamic adjusts the input impedance of probe to match the output impedance of measurand, solves due to measurand and surveys
The measurement error that examination equipment is introduced due to impedance mismatch can be directly applied for the impedances such as high-end oscillograph, frequency spectrograph dependence
The probe of the test equipment of type.
Detailed description of the invention
Fig. 1 diagrammatically illustrates the adaptive probe impedance matching process schematic illustration of the embodiment of the present invention.
Fig. 2 diagrammatically illustrates the flow chart of the adaptive probe impedance matching process of the embodiment of the present invention.
Fig. 3 diagrammatically illustrates measurand equivalent impedance schematic diagram of the embodiment of the present invention.
Fig. 4 diagrammatically illustrates the schematic diagram of the adaptive probe impedance coalignment of the embodiment of the present invention.
Fig. 5 diagrammatically illustrates impedance transformation module principle structural schematic diagram of the embodiment of the present invention.
Specific embodiment
To make the objectives, technical solutions, and advantages of the present invention clearer, below in conjunction with specific embodiment, and reference
Attached drawing, the present invention is described in more detail.
The present invention proposes a kind of adaptive probe impedance matching process, and the schematic diagram of measurement is as shown in Figure 1, mainly logical
The Current Voltage for crossing the output of measurement measurand calculates measurand to the real output of probe, with measurand pair
The peak power output of probe compares, and judges whether actual power reaches peak power output, so that dynamic self-adapting is visited
The input impedance of head is to match the output impedance of measurand.
Fig. 2 diagrammatically illustrates the flow chart of the adaptive probe impedance matching process of the embodiment of the present invention.As shown in Fig. 2,
The probe impedance matching process includes:
S0, according to the initial input impedance of the default probe of the type of measurand.
Preset initial input impedance may just with the impedance matching of measurand, it is also possible to mismatch, need to pass through
Subsequent step is judged and is adjusted.
S1 measures the output impedance of measurand, calculates measurand to the maximum work output of probe according to measurement result
Rate.
The output impedance of measurand be often it is unknown, need by measurement obtain.According to Thevenin's theorem, can incite somebody to action
Measurand is equivalent to a voltage source and connects with a resistance, as shown in Figure 3.The series resistance is the equivalent of measurand
Output impedance.According to maximum power Transfer theorem, as the Dai Weinan equivalent resistance R of measurand0With external load resistors RiIt is equal
When, the power that measurand passes to external load resistors is maximum, calculation formula are as follows:
Wherein, PmaxFor peak power output, uOCFor the voltage swing of equivalent voltage source, R0It is hindered for the output of measurand
It is anti-.
S2 measures measurand to the real output of probe, judges whether real output is equal to maximum output
Power, if so, the fixed input impedance popped one's head at this time, if it is not, executing step S3.
Similarly step S1, according to maximum power Transfer theorem, as the Dai Weinan equivalent resistance R of measurand0With probe
When input impedance is equal, the power that measurand passes to probe is maximum.It therefore, can be by judging that measurand passes to probe
Actual power size whether be measurand pass to probe peak power output mode, determine measurand and probe
Whether impedance matches.
Firstly, obtaining reality of the signal on probe by the current or voltage size of measurement measurand output signal
Power.Secondly, judge whether the actual power is peak power output, if so, the input impedance of preset probe and tested
The output impedance of object matches, at this point, by the input impedance of the fixed probe of the preset input impedance, if it is not, step S3 is executed,
Impedance is adjusted.In an embodiment of the present invention, measurand exports 12 ADC and realizes to signal waveform or amplitude
Sampling multiple repairing weld can be used and be averaged, therefore, ADC is adopted due to need to only measure the output power of measurand
The requirement of sample rate and sampling precision is not very high.
S3, according to real output and peak power output, adjustment direction and the adjustment for calculating probe input impedance are big
It is small, and according to adjustment direction and it is sized the adaptive input impedance for adjusting probe.
When the output impedance of preset input impedance and measurand mismatches, probe can adaptively adjustment input resistance
Anti-, this adaptively refers to that probe can be according to the difference of current input impedance and target input impedance (output impedance of measurand)
Value, the current input impedance of adjust automatically is to approach target input impedance.In actual operation, the direction of input impedance adjustment and tune
Whole size (impedance is tuned up or turned down, the value for tuning up or turning down is how many) is uncertain, can be according to the reality on probe at this time
Border power, the input impedance popped one's head at this time and maximal input etc. determine.Direction and adjustment further according to determining adjustment
Size adaptively adjusts the input impedance of probe.
The real output popped one's head in after S4, measuring process S3 repeats step S2 and S3, until the reality output function of probe
Rate is equal to peak power output, the fixed input impedance popped one's head at this time.
The real output for continuing measuring probe after above-mentioned steps S3, repeats step S2, judges measurand at this time
Output impedance and adjustment after the input impedance popped one's head in whether match, mismatch, repeat step S3, continue the input resistance to probe
It is anti-to be adjusted, at this point, not only needing basis to pop one's head at this time when calculating the adjustment direction of probe input impedance and being sized
On actual power, the input impedance popped one's head at this time and maximal input, it is also necessary in conjunction with the reality of the probe of preceding one-shot measurement
Border power, accurately to obtain the direction of the adjustment of probe impedance and be sized.Dynamic measurement is adjusted with adaptive in this way
Whole, until the real output of probe is equal to peak power output, fixed impedance adjusted at this time is the final defeated of probe
Enter impedance.
Wherein, during above-mentioned impedance adjustment, the adjustment for input impedance of popping one's head in is adjusted using weight resistor network,
The resistance value of each weighted resistor is incremented by with 2 integral multiple weight.Using different weighted resistors, probe is adjusted in a manner of Approach by inchmeal
Input impedance often measures a performance number, calculates the adjusted value of its input resistance of popping one's head in, and is adjusted and measures again, directly
To equal with the impedance of measurand.
The input impedance of probe fixed in step S4 is converted to 50 ohm of output impedance by S5.
In order to guarantee the connection of high-fidelity between probe and measuring device (such as oscillograph), the output impedance needs of probe are adopted
With 50 ohm, to meet the impedance matching with signal transmssion line and measuring device.Therefore the input for the probe for needing to have measured
The output impedance that impedance transformation is 50 ohm.
The present invention proposes a kind of adaptive probe impedance coalignment, as shown in figure 4, the adaptive probe impedance matching dress
Setting 400 includes:
Impedance measurement module 410 calculates measurand pair according to measurement result for measuring the output impedance of measurand
The peak power output of probe.
Specifically, measurand is equivalent to a voltage source and connects with a resistance by impedance measurement module 410, such as Fig. 3
It is shown.The series resistance is the equivalent output impedance of measurand.According to maximum power Transfer theorem, when the equivalent electricity of Dai Weinan
Hinder R0With external load resistors RiWhen equal, the power that measurand passes to external load resistors is maximum, calculation formula are as follows:
Wherein, PmaxFor peak power output, uOCFor the voltage swing of equivalent voltage source, R0It is hindered for the output of measurand
It is anti-.
Impedance adjustment module 420, for measuring measurand to the real output of probe, according to real output
And peak power output, it calculates the adjustment direction of probe input impedance and is sized, and according to adjustment direction and be sized
The input impedance of adaptive adjustment probe is to required input impedance.
Specifically, by measuring the current or voltage size of measurand output signal, reality of the signal on probe is obtained
Border power.Judge whether the actual power is peak power output, if so, the input impedance and measurand of preset probe
Output impedance matching, at this point, by the input impedance of the fixed probe of the preset input impedance, if it is not, according on probe at this time
Actual power, actual power, the input impedance popped one's head at this time and the maximal input of probe of preceding one-shot measurement etc. come it is true
It is fixed.The input impedance of probe is adjusted according to the direction of determining adjustment and being sized.So dynamic measurement and adjustment,
Until the real output of probe is equal to peak power output, fixed impedance adjusted at this time be pop one's head in finally enter resistance
It is anti-.Wherein, the adjustment of input impedance of popping one's head in is adjusted using weight resistor network, and the resistance value of each weighted resistor is with 2 integer
Times weight is incremented by.
Impedance transformation module 430, for the output impedance for being 50 ohm by required input impedance transformation.
Specifically, 430 theory structure schematic diagram of conversion module is as shown in figure 5, in order to guarantee that probe (such as shows with measuring device
Wave device) between high-fidelity connection, the output impedance of probe needs to be set with signal transmssion line and measurement to meet using 50 ohm
Standby impedance matching.Therefore need to be converted to the input impedance of the probe measured 50 ohm of output impedance.
In conclusion the embodiment of the present invention proposes the matching process and device of a kind of adaptive probe impedance, pass through dynamic
Measurand is measured to the real output of probe, compared with measurand is to the peak power output of probe, dynamic is adaptive
The input impedance of probe should be adjusted to match the output impedance of measurand, to obtain peak signal energy.
Particular embodiments described above has carried out further in detail the purpose of the present invention, technical scheme and beneficial effects
It describes in detail bright, it should be understood that the above is only a specific embodiment of the present invention, is not intended to restrict the invention, it is all
Within the spirit and principles in the present invention, any modification, equivalent substitution, improvement and etc. done should be included in guarantor of the invention
Within the scope of shield.
Claims (10)
1. a kind of adaptive probe impedance matching process characterized by comprising
S1 measures the output impedance of measurand, calculates the measurand to the maximum work output of probe according to measurement result
Rate；
S2 measures the measurand to the real output of the probe, judges whether the real output is equal to
The peak power output, if so, the input impedance of the fixed probe described at this time, if it is not, executing step S3；
S3 calculates the adjustment direction of the probe input impedance according to the real output and the peak power output
And it is sized, and the input impedance of the probe is adaptively adjusted according to the adjustment direction and being sized；
The real output of the probe after S4, measuring process S3 repeats step S2 and S3, until the reality of the probe is defeated
Power is equal to the peak power output, the input impedance of the fixed probe described at this time out.
2. adaptive probe impedance matching process according to claim 1, which is characterized in that in step s 4, repeat to walk
In rapid S3, the real output includes the real output of the probe currently measured and the reality of the preceding probe once measured
Border output power.
3. adaptive probe impedance matching process according to claim 1, which is characterized in that also wrap after step s4
It includes:
The input impedance of probe fixed in step S4 is converted to 50 ohm of output impedance by S5.
4. adaptive probe impedance matching process according to claim 1, which is characterized in that in step sl, measure quilt
Survey object output impedance include:
The measurand is equivalent to connecting for voltage source and resistance, described tested pair according to the measurement of maximum power Transfer theorem
The output impedance of elephant.
5. adaptive probe impedance matching process according to claim 4, which is characterized in that in step sl, calculate institute
It is as follows to the formula of the peak power output of the probe to state measurand:
Wherein, PmaxFor the peak power output, uOCFor the voltage swing of the voltage source, R0For the defeated of the measurand
Impedance out.
6. adaptive probe impedance matching process according to claim 1, which is characterized in that in step s 2, measure institute
State measurand includes: to the real output of the probe
The voltage or size of current for measuring the measurand output signal calculate the reality according to the voltage or size of current
Border output power.
7. adaptive probe impedance matching process according to claim 1, which is characterized in that also wrapped before step S1
It includes:
S0 presets the initial input impedance of the probe according to the type of the measurand.
8. adaptive probe impedance matching process according to claim 1, which is characterized in that in step s3, according to institute
Adjustment direction, which is stated, with the input impedance for adjusting the probe is sized includes:
The input impedance of the probe is adjusted using weight resistor network, wherein the weight resistor network includes more
The resistance value of a weighted resistor, each weighted resistor is incremented by with 2 integral multiple weight.
9. a kind of adaptive probe impedance coalignment characterized by comprising
Impedance measurement module calculates the measurand to institute according to measurement result for measuring the output impedance of measurand
State the peak power output of probe；
Impedance adjustment module, it is defeated according to the reality for measuring the measurand to the real output of the probe
Power and the peak power output out calculate the adjustment direction of the probe input impedance and are sized, and according to described
Adjustment direction and being sized adaptively adjusts the input impedance of the probe to required input impedance；
Impedance transformation module, for the output impedance for being 50 ohm by the required input impedance transformation.
10. adaptive probe impedance coalignment according to claim 9, which is characterized in that the impedance adjustment module
According to measurand described in the input impedance duplicate measurements of the probe of adjustment to the real output of the probe, according to
The real output and the maximum work output of the real output of the probe of the secondary measurement, the preceding probe once measured
Rate repeats to adjust the input impedance of the probe to required input impedance.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111289786A (en) * | 2020-05-13 | 2020-06-16 | 深圳市鼎阳科技股份有限公司 | Probe interface circuit and probe adapter circuit for probe of oscilloscope |
| CN112327030A (en) * | 2020-11-06 | 2021-02-05 | 苏州浪潮智能科技有限公司 | Link impedance matching debugging method and device |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002064386A (en) * | 2000-08-23 | 2002-02-28 | Sony Corp | Matching device |
| CN102347745A (en) * | 2010-08-04 | 2012-02-08 | 国基电子（上海）有限公司 | Adaptive impedance matching circuit |
| CN102931927A (en) * | 2012-10-09 | 2013-02-13 | 昆山美博通讯科技有限公司 | Impedance matching method for power amplification module |
| CN103026800A (en) * | 2010-07-30 | 2013-04-03 | 株式会社普来马特 | Rf power distribution device and rf power distribution method |
| CN103687267A (en) * | 2012-09-17 | 2014-03-26 | 北京北方微电子基地设备工艺研究中心有限责任公司 | Impedance matching device, impedance matching method and substrate processing equipment |
| CN103828247A (en) * | 2011-09-19 | 2014-05-28 | 高通股份有限公司 | Adaptive tuning of an impedance matching circuit in a wireless device |
| CN104682575A (en) * | 2015-03-01 | 2015-06-03 | 华南理工大学 | Resonance type wireless power transmission system with double-terminal impedance transformer networks |
| CN105092980A (en) * | 2015-07-17 | 2015-11-25 | 北京控制工程研究所 | Intelligent testing method of input and output impedances |
| CN105375651A (en) * | 2015-11-12 | 2016-03-02 | 中国人民解放军国防科学技术大学 | Long-service-life wireless electric energy transmission apparatus for rotary interfaces of movable parts |
| CN106899321A (en) * | 2017-01-04 | 2017-06-27 | 力同科技股份有限公司 | A kind of digital intercom terminal and its impedance matching methods |
-
2019
- 2019-05-17 CN CN201910416677.6A patent/CN110286253A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002064386A (en) * | 2000-08-23 | 2002-02-28 | Sony Corp | Matching device |
| CN103026800A (en) * | 2010-07-30 | 2013-04-03 | 株式会社普来马特 | Rf power distribution device and rf power distribution method |
| CN102347745A (en) * | 2010-08-04 | 2012-02-08 | 国基电子（上海）有限公司 | Adaptive impedance matching circuit |
| CN103828247A (en) * | 2011-09-19 | 2014-05-28 | 高通股份有限公司 | Adaptive tuning of an impedance matching circuit in a wireless device |
| CN103687267A (en) * | 2012-09-17 | 2014-03-26 | 北京北方微电子基地设备工艺研究中心有限责任公司 | Impedance matching device, impedance matching method and substrate processing equipment |
| CN102931927A (en) * | 2012-10-09 | 2013-02-13 | 昆山美博通讯科技有限公司 | Impedance matching method for power amplification module |
| CN104682575A (en) * | 2015-03-01 | 2015-06-03 | 华南理工大学 | Resonance type wireless power transmission system with double-terminal impedance transformer networks |
| CN105092980A (en) * | 2015-07-17 | 2015-11-25 | 北京控制工程研究所 | Intelligent testing method of input and output impedances |
| CN105375651A (en) * | 2015-11-12 | 2016-03-02 | 中国人民解放军国防科学技术大学 | Long-service-life wireless electric energy transmission apparatus for rotary interfaces of movable parts |
| CN106899321A (en) * | 2017-01-04 | 2017-06-27 | 力同科技股份有限公司 | A kind of digital intercom terminal and its impedance matching methods |
Non-Patent Citations (1)
| Title |
|---|
| 刘学观 等编著: "《微波技术与天线》", 31 August 2016, 西安：西安电子科技大学出版社 * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111289786A (en) * | 2020-05-13 | 2020-06-16 | 深圳市鼎阳科技股份有限公司 | Probe interface circuit and probe adapter circuit for probe of oscilloscope |
| CN112327030A (en) * | 2020-11-06 | 2021-02-05 | 苏州浪潮智能科技有限公司 | Link impedance matching debugging method and device |
| CN112327030B (en) * | 2020-11-06 | 2022-12-16 | 苏州浪潮智能科技有限公司 | Link impedance matching debugging method and device |
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