CN110231090A - A kind of test method of thermal infrared spectrum instrument internal stray radiation - Google Patents
A kind of test method of thermal infrared spectrum instrument internal stray radiation Download PDFInfo
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- G—PHYSICS
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
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- G—PHYSICS
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
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Abstract
The invention discloses a kind of test methods of thermal infrared spectrum instrument internal stray radiation, radiation test is carried out under a time of integration to the spectrum channel of the total regression wave band of detector and thermal infrared spectrum instrument respectively using black matrix, detector and spectrometer are once tested respectively by this method, can internal stray radiological equivalent under measuring system current state sum of the grayscale values radiation flux, the sum of the grayscale values radiation flux of the internal stray radiation of thermal infrared spectrum instrument at a temperature of any time of integration and any ray machine can be obtained in ray machine temperature when binding test.Method of the present invention is simple, and can effectively solve the problem that the problem of radiation of thermal infrared spectrum instrument internal stray seriously affects system Electrodynamic radiation and systematic quantification, is suitable for practical engineering application.
Description
Technical field
The present invention relates to the quantification testing fields of remote sensing instrument, are related specifically to a kind of thermal infrared spectrum instrument stray radiation
Test method.
Background technique
Signal light is divided into dozens of to a wave bands up to a hundred, due to light during thermal infrared spectrum instrument progress spectrum
The internal stray radiation that machine itself radiation generates is stronger, and the intensity of signal is more traditional, and Image-forming instrument is fainter, and system is caused to believe
It makes an uproar the problems such as ratio, effective dynamic range are smaller, and the time for exposure is difficult to improve；And internal stray radiation increases with temperature and is increased
Greatly, system Electrodynamic radiation and systematic quantification are seriously affected.Therefore, the measurement and determine that the internal stray of thermal infrared spectrum instrument radiates
Mark is particularly important to the research of internal stray radiation.
Foreign countries have developed more more classical thermal infrared imaging spectral instruments, the thermal infrared imaging spectrometer of existing report
Such as AHI, LWHIS, QWSET, MAKO；And the country is limited by the reasons such as the detector for lacking superior performance, in thermal infrared spectrum
The design of instrument and the research of test aspect are relatively limited.Foreign countries report equipment spectrometer multipair greatly using profound hypothermia (15K~
100K) mode freezed has carried out effective inhibition to internal stray radiation, and the demand of calibration measurement is carried out to internal stray radiation
It is lower.However, in recent years, under the promotion of external commercial company, the development of thermal infrared spectrum instrument is freezed to non-profound hypothermia, is regarded greatly
Field, light-weighted direction are developed, and the raising of optical-mechanical system temperature and inner wall area and complexity increase, and radiate internal stray
Measurement and inhibition the problem of highlight again, need to establish internal stray radiation effective model and feasible analysis test side
Method.
Existing thermal infrared spectrum instrument internal stray Emanations Analysis test method is mainly simulation analysis method, and such methods utilize
Computer software to internal stray radiation carry out modeling analysis, common software have TracePro, Lighttools, ASAP,
FRED etc., software analysis method are based primarily upon Monte Carlo method, Ray-tracing Method, paraxial calculating method etc..The advantage of such methods
It is the advantages that easy to operate, at low cost, the period is short.However, the surface parameter for the parameter such as mechanical-optical setup that modeling uses, transmitting
Rate and the catadioptric parameter of optical mirror plane etc. are ideal value, and there are difference with the parameter value of real system, affect emulation knot
The precision of fruit, it is difficult to accurate reflection internal system stray radiation.Therefore, in practical engineering applications, need using experiment calibration
The method of measurement more accurately measures the stray radiation of thermal infrared spectrum instrument.
Summary of the invention
Present invention aims at the test methods for proposing a kind of thermal infrared spectrum instrument internal system stray radiation to solve
In practical engineering application, thermal infrared spectrum instrument internal stray radiation calibration seriously affects system Electrodynamic radiation and systematic quantification
Problem.
For this purpose, the following technical solutions are proposed by the present invention:
A kind of test method of thermal infrared spectrum instrument internal stray radiation, as shown in Figure 1, under certain time of integration respectively
The single spectrum channel of thermal infrared spectrum instrument and the total regression wave band of detector that detector is housed are tested, quantified
The output gray level value and radiation flux of thermal infrared spectrum instrument internal stray radiation, specifically comprise the following steps:
1) in certain time of integration t0Under, detector total regression wave band is individually tested using black matrix, obtains detection
Device output gray level value:
Wherein, B0For biasing unrelated with black signal in detector, G0It is t for the time of integration0When detector to incident spoke
The response of brightness,It is T for operating temperatureblackBlack matrix in detector service band λ1~λ2The radiation launched
Brightness, hdet1For the biasing related with the time of integration that detector generates, hdet2Indicate intrinsic unrelated with the time of integration of detector
Biasing；
2) above-mentioned detector is installed on thermal infrared spectrum instrument, recycles black matrix in identical time of integration t0Lower pair
The single spectrum channel of total system is tested, and total system output gray level value is obtained:
Wherein, Tsystem0For the thermal infrared spectrum instrument ray machine temperature surveyed at that time,It is for ray machine temperature
Tsystem0Thermal infrared spectrum instrument in detector service band λ1~λ2The radiance launched；For work temperature
Degree is TblackBlack signal through thermal infrared spectrum instrument light splitting after spectrum channel wave band λ3~λ4The radiance launched,
δopticalFor the efficiency of optical system, B1For biasing unrelated with black signal in the thermal infrared spectrum instrument equipped with detector,
GstrayIt is t for the time of integration0When the detector response of spoke brightness that thermal infrared spectrum instrument internal stray is radiated；
3) by that 1) and 2), can obtain in time of integration t0Under, the spoke that detector radiates thermal infrared spectrum instrument internal stray is bright
The response G of degreestrayAre as follows:
Therefore, any time of integration t and thermal infrared spectrum instrument ray machine temperature TsystemUnder, thermal infrared spectrum instrument internal stray
Radiation-induced output gray level value are as follows:
The radiation flux of thermal infrared spectrum instrument internal stray radiation are as follows:
Wherein,It is T for ray machine temperaturesystemThermal infrared spectrum instrument in detector service band λ1~λ2
The radiance launched；KstrayIndicate that radiance is converted into the geometrical factor of radiation flux, KblackIt is detector to black matrix
Spoke brightness is converted into the geometrical factor of radiation flux.
The invention adopts the above technical scheme, first respectively to the thermal infrared spectrum that detector is housed under certain time of integration
The single spectrum channel of instrument and the total regression wave band of detector carry out calibration test, quantify the thermal infrared of any time of integration
The output gray level value and radiation flux of spectrometer internal stray radiation.The present invention is using black matrix respectively to the total regression wave of detector
The spectrum channel of section and thermal infrared spectrum instrument carries out radiation calibration test under a time of integration, by this method to detector
Once calibrated respectively with spectrometer, can measuring system current state internal stray radiological equivalent sum of the grayscale values radiation
Flux, ray machine temperature when binding test can be realized at a temperature of any time of integration and any ray machine in thermal infrared spectrum instrument
The sum of the grayscale values radiation flux of portion's stray radiation.Method of the present invention is simple, and can effectively solve the problem that thermal infrared spectrum instrument
Internal stray radiation calibration seriously affects the problem of system Electrodynamic radiation and systematic quantification, is suitable for practical engineering application.
Detailed description of the invention
Fig. 1 is the test method flow diagram of thermal infrared spectrum instrument internal stray of the present invention radiation.
Fig. 2 is the optical texture schematic diagram for the thermal infrared spectrum instrument that specific embodiment uses.
Fig. 3 is the schematic diagram individually tested using black matrix detector in specific embodiment.
Fig. 4 is to be shown using black matrix what the thermal infrared spectrum instrument system equipped with detector was tested in specific embodiment
It is intended to.
Fig. 5 is the result gray value matched curve individually tested using black matrix detector in specific embodiment.
Fig. 6 is the knot tested using black matrix the thermal infrared spectrum instrument system equipped with detector in specific embodiment
Fruit gray value matched curve.
It is miscellaneous inside thermal infrared spectrum instrument at a temperature of different ray machines when Fig. 7 is that the time of integration is 0.3ms in specific embodiment
The gray value curve of scattered radiation.
Specific embodiment
In order to keep objects, features and advantages of the present invention more clear, with reference to the accompanying drawings and embodiments, to the present invention
A kind of specific embodiment make more detailed description, in the following description, elaborate many concrete details so as to
The present invention is understood in sufficient, but the present invention can be implemented with being much different from the other way of description, therefore, the present invention
It is not limited by the specific embodiment of following discloses.
We are by taking the thermal infrared spectrum instrument for measuring Offner structure as an example, the thermal infrared spectrum instrument optical texture such as Fig. 2
It is shown, specific embodiment is provided according to the test method that thermal infrared spectrum instrument internal stray of the present invention radiates.
As shown in figure 3, individually being calibrated using black matrix 1 detector 2, effective work of the detector 2 directly facing black matrix 1
It is measured as region, the detector is the long wave detector of MARS VLW series of Sofradir company, and parameter detector is shown in
Table 1:
1 parameter detector of table
Super large face source black matrix of the calibration blackbody using the ECN100N40 of HGH Infrared System company, face Source size
1000mm × 1000mm, nominal operating range are 10~100 DEG C, 0.01 DEG C of accuracy of temperature control.It will be set as the time of integration when measurement
0.3ms, since detector directly receives the energy of black matrix, when 35 DEG C of blackbody temperature, detector output gray level goes out for experiment discovery
The phenomenon that being now saturated, therefore blackbody temperature is respectively set to 20 DEG C, 25 DEG C, 30 DEG C, 35 DEG C, and acquire in different blackbody temperatures
The gray scale output response of lower detector.
Detector 2 is connect with thermal infrared spectrum instrument 3, so that 2 face of detector battle array is located at 3 focal plane of spectrometer by focusing
Afterwards, system is calibrated, as shown in figure 4, making 1 effective coverage of black matrix short distance, all standing slit visual field when calibration, use is defeated
Wavelength is 10.60 μm of monochromatic CO out2Gas laser accurately confirmed 10.48 μm~10.72 μm this light as light source
Compose the position in channel.The HFY300 type facet source black matrix of Shanghai Fu Yuan photoelectricity company, face Source size Ф 100mm, mark are used herein
Working range is referred to as 20~70 DEG C, 0.01 DEG C of accuracy of temperature control.Black matrix is closely placed in front of slit, temperature is respectively set to
30 DEG C, 40 DEG C, 50 DEG C, 60 DEG C, and acquire the gray scale output response of the detector under different blackbody temperatures.In addition, measuring reality
Ray machine temperature T when testingsystem=19.3 DEG C.
When data processing, to reduce influence of the detector heterogeneity to calibration, spectrum is taken to tie up the gray value of a column pixel
It is weighted and averaged to obtain output gray level of the average gray as single pixel.In addition, in order to guarantee detector calibration and light
It is logical to have taken 10.48 μm~10.72 μm this spectrum to the result of two groups of scaling experiments for the data consistency of spectrometer calibration
The pixel that the center one in road arranges is as data sample.The result individually calibrated detector is as shown in figure 5, abscissa being
The spoke brightness value of the corresponding different temperatures black matrix of 7.70 μm~11.70 mu m wavebands, ordinate are detector output gray level value, for
The calibration equation of linear region is fitted are as follows:
gdetector=74.02 × L+1113.5 (6)
With calibration equation formula
It is corresponding, if time of integration t0Unit be ms, obtain response rate G=246.73DNm2·sr·ms-1·W-1, partially
Set B0=1113.5DN.
The calibration results to the thermal infrared spectrum instrument for installing detector additional are as shown in fig. 6, abscissa is 10.48 μm~10.72
μm corresponding black matrix spoke brightness of spectral band, ordinate are detector output gray level value, are fitted calibration equation are as follows:
gsystem=64.77 × L+3175 (7)
With calibration equation formula
It is corresponding, if time of integration t0Unit be ms, response rate G=215.90DNm2·sr·ms-1·W-1, herein
Calculate the optical efficiency δ for installing the thermal infrared spectrum instrument system of detector additional in this spectrum channeloptical=87.50%, bias B1
=3175DN.
Therefore, according to
It can obtain in time of integration t0Under, the response for the spoke brightness that detector radiates thermal infrared spectrum instrument internal stray are as follows:
Gstray=209.85DNm2·sr·ms-1·W-1 (8)
According to
Known to T at a temperature of any time of integration t and ray machinesystemUnder, detector list caused by the internal system stray radiation
The output gray level of pixel can be expressed as
When the time of integration is 0.3ms, thermal infrared spectrum instrument internal stray at a temperature of different ray machines can be measured by formula (9)
The gray value of radiation, as shown in Figure 7.It does not need to repeat to calibrate when in use, it is only necessary to the temperature of measure spectrum instrument ray machine
Determine the gray value of spectrometer internal stray radiation contributions.
When black matrix is 30 DEG C, the total output gray level value of thermal infrared spectrum system detector is 3327.76DN, is passed through formula (9)
Know that internal stray radiant output gray value is 2474.46DN.It is obtained by formula (7), 10.48 μm~10.72 μm spectral bands of signal
Output gray level value be 154.22DN, by formula (6) it is found that the fixed bias of detector and circuit be 699.08DN, it can be seen that
At a temperature of the ray machine of this experiment, the large percentage that thermal infrared internal stray radiation Zhan is always exported, is 74.36%.
Joint type (4), (9) and the K for substituting into known parameters thermal infrared systemblack=0.4833 × 10-10m2Sr can be obtained,
The received internal stray radiation flux of detector list pixel at a temperature of ray machine is
The calibration results (9) (10) formula reflects the output gray level value and product of the internal stray radiation of thermal infrared spectrum instrument respectively
Between timesharing and the quantitative relationship of the quantitative relationship of ray machine temperature and radiation flux and ray machine temperature.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in essence of the invention
Made any modifications, equivalent replacements, and improvements etc., should all be included in the protection scope of the present invention within mind and principle.
Claims (1)
1. a kind of test method of thermal infrared spectrum instrument internal stray radiation, it is characterised in that: under certain time of integration respectively
The single spectrum channel of thermal infrared spectrum instrument and the total regression wave band of detector that detector is housed are tested, quantified
The output gray level value and radiation flux of thermal infrared spectrum instrument internal stray radiation, specifically comprise the following steps:
1) in certain time of integration t0Under, detector total regression wave band is individually tested using black matrix, obtains detector output
Gray value:
Wherein, B0For biasing unrelated with black signal in detector, G0It is t for the time of integration0When detector to incident spoke brightness
Response,It is T for operating temperatureblackBlack matrix in detector service band λ1~λ2The radiance launched,
hdet1For the biasing related with the time of integration that detector generates, hdet2Indicate the detector intrinsic biasing unrelated with the time of integration；
2) above-mentioned detector is installed on thermal infrared spectrum instrument, recycles black matrix in identical time of integration t0Under to entirety
The single spectrum channel of system is tested, and total system output gray level value is obtained:
Wherein, Tsystem0For the thermal infrared spectrum instrument ray machine temperature surveyed at that time,It is T for ray machine temperaturesystem0's
Thermal infrared spectrum instrument is in detector service band λ1~λ2The radiance launched；It is T for operating temperatureblack
Black signal through thermal infrared spectrum instrument light splitting after spectrum channel wave band λ3~λ4The radiance launched, δopticalFor optics
The efficiency of system, B1For biasing unrelated with black signal in the thermal infrared spectrum instrument equipped with detector, GstrayFor the time of integration
For t0When the detector response of spoke brightness that thermal infrared spectrum instrument internal stray is radiated；
3) it by step 1) and 2), can obtain in time of integration t0Under, spoke brightness that detector radiates thermal infrared spectrum instrument internal stray
Response GstrayAre as follows:
Therefore, any time of integration t and thermal infrared spectrum instrument ray machine temperature TsystemUnder, the radiation of thermal infrared spectrum instrument internal stray
Caused output gray level value are as follows:
The radiation flux of thermal infrared spectrum instrument internal stray radiation are as follows:
Wherein,It is T for ray machine temperaturesystemThermal infrared spectrum instrument in detector service band λ1~λ2Launch
Radiance；KstrayIndicate that radiance is converted into the geometrical factor of radiation flux, KblackIt is detector to black matrix spoke brightness
It is converted into the geometrical factor of radiation flux.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111609937A (en) * | 2020-06-08 | 2020-09-01 | 北京环境特性研究所 | Thermal infrared imager external field calibration method and device |
| CN113008377A (en) * | 2021-02-22 | 2021-06-22 | 中国电子科技集团公司第十一研究所 | Analysis method and suppression method for stray radiation of infrared optical system |
| CN113092069A (en) * | 2019-12-23 | 2021-07-09 | 中国科学院长春光学精密机械与物理研究所 | Method and device for measuring stray radiation in large-diameter infrared photoelectric system |
| CN113945278A (en) * | 2021-09-14 | 2022-01-18 | 中国科学院上海技术物理研究所 | Space optical remote sensing instrument reflection wave band on-orbit full dynamic range radiometric calibration method |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107677375A (en) * | 2017-09-21 | 2018-02-09 | 中国科学院长春光学精密机械与物理研究所 | A kind of infrared radiation measurement system robot scaling equipment and calibrating method |
| CN107957297A (en) * | 2017-11-23 | 2018-04-24 | 北京环境特性研究所 | A kind of thermal imaging system radiation calibration precision analytical method |
-
2019
- 2019-03-11 CN CN201910178546.9A patent/CN110231090A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107677375A (en) * | 2017-09-21 | 2018-02-09 | 中国科学院长春光学精密机械与物理研究所 | A kind of infrared radiation measurement system robot scaling equipment and calibrating method |
| CN107957297A (en) * | 2017-11-23 | 2018-04-24 | 北京环境特性研究所 | A kind of thermal imaging system radiation calibration precision analytical method |
Non-Patent Citations (1)
| Title |
|---|
| 田棋杰 等: "根据环境温度测量制冷型红外成像系统内部杂散辐射", 《光学学报》 * |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113092069A (en) * | 2019-12-23 | 2021-07-09 | 中国科学院长春光学精密机械与物理研究所 | Method and device for measuring stray radiation in large-diameter infrared photoelectric system |
| CN111609937A (en) * | 2020-06-08 | 2020-09-01 | 北京环境特性研究所 | Thermal infrared imager external field calibration method and device |
| CN111609937B (en) * | 2020-06-08 | 2021-07-20 | 北京环境特性研究所 | Thermal infrared imager external field calibration method and device |
| CN113008377A (en) * | 2021-02-22 | 2021-06-22 | 中国电子科技集团公司第十一研究所 | Analysis method and suppression method for stray radiation of infrared optical system |
| CN113945278A (en) * | 2021-09-14 | 2022-01-18 | 中国科学院上海技术物理研究所 | Space optical remote sensing instrument reflection wave band on-orbit full dynamic range radiometric calibration method |
| CN113945278B (en) * | 2021-09-14 | 2023-09-12 | 中国科学院上海技术物理研究所 | Method for calibrating radiation of reflection band on-orbit full dynamic range of space optical remote sensing instrument |
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