CN110221131B - Terahertz compact field test system based on electric scanning antenna - Google Patents
Terahertz compact field test system based on electric scanning antenna Download PDFInfo
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- CN110221131B CN110221131B CN201910596911.8A CN201910596911A CN110221131B CN 110221131 B CN110221131 B CN 110221131B CN 201910596911 A CN201910596911 A CN 201910596911A CN 110221131 B CN110221131 B CN 110221131B
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- 238000012360 testing method Methods 0.000 title claims abstract description 26
- 239000011358 absorbing material Substances 0.000 claims description 3
- 238000006243 chemical reaction Methods 0.000 claims description 3
- 238000000034 method Methods 0.000 description 11
- 238000005259 measurement Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 5
- 238000003754 machining Methods 0.000 description 4
- 238000001228 spectrum Methods 0.000 description 3
- 238000004891 communication Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of antennas
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/02—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
- G01S7/40—Means for monitoring or calibrating
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- Radar, Positioning & Navigation (AREA)
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- Variable-Direction Aerials And Aerial Arrays (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The invention discloses a terahertz compact field test system based on an electric scanning antenna, which comprises the following components: the device comprises a darkroom, a target to be tested, a fixing device, a vector network analyzer, a terahertz vector network expansion module, a computer, an electric scanning antenna and a feed module, wherein the electric scanning antenna and the feed module are both positioned in the darkroom, and the electric scanning antenna is in control connection with the terahertz vector network expansion module through the feed module. By the mode, the radar reflection section of the target to be tested or the far-field pattern data of the antenna to be tested can be obtained through the small-sized, quick and convenient terahertz compact field, and the brand-new active electric scanning antenna is adopted to replace the original emitting surface or holographic grating, so that the system cost is reduced, the use space is reduced, and meanwhile, the capability of quickly testing the small-sized compact field is provided.
Description
Technical Field
The invention belongs to the fields of industrial detection, scientific experiments, test metering and the like, and particularly relates to a terahertz compact field test system based on an electric scanning antenna.
Background
Radio technical equipment such as communication, radar, navigation, remote sensing, broadcasting, television and the like transmits information through radio waves, and radiation and reception of the radio waves are required. In radio technology equipment, the means for radiating and receiving electromagnetic waves is called an antenna. The antenna is an essential important component in a radio information propagation system, and core parameters such as a directional diagram of a microwave-terahertz antenna can be tested by using a vector network analyzer and a vector network expansion module, so that main performance parameter indexes of the antenna are obtained.
The method for acquiring the antenna parameter index mainly comprises a far field method, a near field method and a compact field method. Far field methods are costly, often require testing at tens of kilometers of distance, and near field methods require near field data to be converted into far field data with certain errors.
The compact range measurement system is an antenna measurement system, and can provide a quasi-plane wave test area with excellent performance in a short distance. In the past, a precise reflecting surface or a holographic grating is adopted to convert spherical waves generated by a feed source into plane waves in a short distance, so that the far-field test requirement is met. The compact range measurement system simulates a far-field plane wave electromagnetic environment in a small microwave darkroom, and performs multiple measurements and researches such as antenna pattern measurement, gain comparison, radar cross section measurement, imaging and the like by using conventional far-field test equipment and methods.
Conventional compact range measurement systems commonly employ reflective surfaces or holographic gratings to transform spherical waves into plane waves in close range, and the compact range measurement systems face many challenges as the operating frequency increases:
in terahertz frequency band compact range system, the machining precision of the reflecting surface is required to be higher (precision is less than 5 um), the reflecting surface is required to be large enough to ensure sufficient dead zone area, the traditional machining mode cannot meet the machining requirement of the reflecting surface with high precision and large size, and the machining cost is also higher.
The traditional compact range system has the advantages of complex design, large occupied area, time and labor waste for installing and debugging the reflecting surface and high overall use cost.
The traditional compact range system adopts a mechanical turntable steering function to realize multi-angle scanning of a target, and the traditional mechanical turntable is limited by the characteristics of mechanical and physical movement, and has low speed and large volume. Multiple application scenes in 5G/6G communication cannot be simulated, and a fast and convenient compact range test function cannot be provided.
Disclosure of Invention
The technical problem to be solved by the invention is how to provide a terahertz compact field test system capable of obtaining radar reflection cross section of a target to be tested or far field pattern data of an antenna to be tested.
In order to solve the technical problems, the invention adopts the following technical scheme: provided is a terahertz compact field test system based on an electric scanning antenna, comprising: the system comprises a darkroom, a target to be detected, a fixing device, a vector network analyzer, a terahertz vector network expansion module and a computer. The darkroom is a terahertz darkroom and is provided with an inner space, the object to be detected and the fixing device are both positioned in the darkroom, and the object to be detected is positioned above the top plane of the fixing device.
The computers are electrically connected, and the computers are sequentially connected with the vector network analyzer and the terahertz vector network expansion module.
The terahertz compact field testing system based on the electric scanning antenna further comprises the electric scanning antenna and a feed module, wherein the electric scanning antenna and the feed module are both positioned in a darkroom, and the electric scanning antenna is in control connection with the terahertz vector network expansion module through the feed module.
The vector network analyzer sends out millimeter wave signals, and then amplifies and multiplies the millimeter wave signals to a terahertz frequency band through a terahertz vector network expansion module to obtain terahertz signals, and the terahertz signals are converted into free space plane waves after passing through an electric scanning antenna; the free space plane wave irradiates the target to be measured, the free space plane wave is reflected by the target to be measured and returns to the electric scanning antenna in the original path, the electric scanning antenna receives the free space plane wave and returns to the electric scanning antenna, the electric scanning antenna returns to the electric scanning antenna, the electric current signal is converted into a millimeter wave signal through the terahertz vector network expansion module in a down-conversion mode, the millimeter wave signal returns to the vector network analyzer, and the vector network analyzer calculates parameters and stores the parameters in the computer.
Optionally, the electric scanning antenna is an active electric scanning antenna. The active electric scanning antenna is set as a phased array antenna or a metamaterial electric scanning antenna.
Optionally, the phased array antenna includes a plurality of antenna elements, and the antenna elements are arranged to form an antenna array plane.
Optionally, the antenna element includes a radio frequency signal module, a phase shifter and an amplifier, and the radio frequency signal module, the phase shifter and the amplifier are connected in sequence in a controlled manner.
Optionally, the metamaterial electric scanning antenna comprises a plurality of metamaterial units, and the metamaterial units form a metamaterial scanning array.
Optionally, each metamaterial unit comprises a varactor or a MEMS switch.
Alternatively, the vector network analyzer is replaced by a signal source and a spectrum analyzer.
Optionally, a wave absorbing material with a corresponding working frequency band is arranged in the terahertz darkroom.
The beneficial effects of the invention are as follows: a miniaturized, fast, convenient and low-cost terahertz compact field can obtain radar reflection section of a target to be tested or far-field pattern data of an antenna to be tested, and a brand new active electric scanning antenna is adopted to replace an original emitting surface or holographic grating, so that system cost is reduced, use space is reduced, and meanwhile, the capability of rapidly testing the miniaturized compact field is provided.
Drawings
For a clearer description of the technical solutions of the embodiments of the present invention, the drawings that are needed in the description of the embodiments will be briefly introduced below, it being obvious that the drawings in the description below are only some embodiments of the present invention, and that other drawings can be obtained according to these drawings without inventive effort for a person skilled in the art, wherein:
FIG. 1 is a schematic diagram of one embodiment of a conventional reflector compact testing system of the prior art;
FIG. 2 is a schematic diagram of one embodiment of a terahertz compact field testing system based on an electric scanning antenna in accordance with the present invention;
FIG. 3 is a schematic diagram of a phased array electric scan antenna of an embodiment of a terahertz compact field test system based on an electric scan antenna of the present invention;
FIG. 4 is a schematic diagram of a metamaterial electric scanning antenna in accordance with one embodiment of the terahertz compact field testing system based on an electric scanning antenna of the present invention;
Wherein, the correspondence between the reference numerals and the component names in the figures is as follows: 1. a darkroom; 2. a target to be measured; 3. an electric scanning antenna; 31. an antenna element; 311. a radio frequency signal module; 312. a phase shifter; 313. an amplifier; 32. a metamaterial unit; 4. a feed module; 5. terahertz vector network expansion module; 6. a vector network analyzer; 7. A computer; 8. a fixing device.
Detailed Description
The following description of the technical solutions in the embodiments of the present invention will be clear and complete, and it is obvious that the described embodiments are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Referring to the drawings, in one embodiment of the present invention, there is provided a terahertz compact field testing system based on an electric scanning antenna, including: the system comprises a darkroom 1, a target to be measured 2, a fixing device 8, a vector network analyzer 6, a terahertz vector network expansion module 5 and a computer 8. The darkroom 1 is a terahertz darkroom and is provided with an inner space, the object 2 to be measured and the fixing device 8 are both positioned in the darkroom 1, the object 2 to be measured is positioned above the top plane of the fixing device 8, and the fixing device 8 is used for supporting and fixing the object 2 to be measured. In the implementation process, the terahertz darkroom is provided with wave absorbing materials with corresponding working frequency bands. The object 2 to be measured may also specifically need to be equipped with a turntable or a mechanical arm to achieve 1,2, 3-dimensional steering.
In the implementation process, the vector network analyzer 6 can send millimeter wave signals, and the computer 7, the vector network analyzer 6 and the terahertz vector network expansion module 5 are all located outside the darkroom 1. The computers 7 are electrically connected. The computer 7 is also sequentially connected with the vector network analyzer 6 and the terahertz vector network expansion module 5 in sequence.
In the invention, the terahertz compact field testing system based on the electric scanning antenna further comprises the electric scanning antenna 3 and the feed module 4, wherein the electric scanning antenna 3 and the feed module 4 are both positioned in the darkroom 1, and the electric scanning antenna 3 is in control connection with the terahertz vector network expansion module 5 through the feed module 4.
In a specific implementation process, after the vector network analyzer 6 sends out millimeter wave signals, the millimeter wave signals are amplified and multiplied to a terahertz frequency band through the terahertz vector network expansion module 5 to obtain terahertz signals, and the terahertz signals are converted into free space plane waves after passing through the electric scanning antenna 3; the free space plane wave irradiates the target 2 to be measured, the free space plane wave is reflected by the target 2 to be measured and returns to the electric scanning antenna 3 in the original path, the electric scanning antenna 3 receives the free space plane wave and returns to the electric scanning antenna, the electric scanning antenna 3 converts the free space plane wave into a current signal, the current signal is subjected to down-conversion into a millimeter wave signal through the terahertz vector network expansion module 5, the millimeter wave signal returns to the vector network analyzer 6, and the vector network analyzer 6 calculates parameters and stores the parameters in the computer 7. After that, the computer 7 controls the beam of the electric scanning antenna to turn to the next position, and repeats the above actions, so that the radar reflection section of the target to be measured or the far-field pattern data of the antenna to be measured can be obtained.
In a specific embodiment, the electric sweep antenna 3 is an active electric sweep antenna; the active electric scanning antenna is set as a phased array antenna or a metamaterial electric scanning antenna.
Further, the phased array antenna includes a plurality of antenna elements 31, and the antenna elements 31 are arranged to form an antenna array plane.
In a specific implementation, the antenna element 31 includes a radio frequency signal module 311, a phase shifter 312, and an amplifier 313, where the radio frequency signal module 311, the phase shifter 312, and the amplifier 313 are sequentially connected in a controlled manner.
The phased array electric scanning antenna mainly utilizes a large number of small antenna elements to be arranged into an antenna array surface, each antenna element is controlled by an independent switch, and main beams with different directions can be synthesized by controlling the phase difference emitted by each antenna element based on the Huygens principle. The technology is mature and is divided into a passive phased array and an active phased array according to different structures.
In another implementation, the metamaterial electric scanning antenna includes a plurality of metamaterial units 32, and the metamaterial units 32 form a metamaterial scanning array. Wherein each metamaterial unit 32 comprises a varactor or a MEMS switch.
The metamaterial electric scanning antenna mainly comprises a novel antenna named as a leaky-wave antenna which can be formed by utilizing a metamaterial. When an electromagnetic wave propagates along the traveling wave structure, the electromagnetic wave continuously radiates a leaky wave along the traveling wave structure, and the leaky wave generating structure is a leaky wave antenna. Leaky-wave antennas manufactured by using metamaterials have a back-end-fire frequency scanning characteristic, and the scanning angle of the antenna can be widened to-90 degrees to +90 degrees. Scanning in the 180 range can be achieved if varactors are incorporated into the metamaterial cell structure.
In a preferred embodiment, the terahertz standard antenna and the antenna to be tested can also be millimeter wave antennas, the vector network analyzer can work independently or work together with a vector network expansion module according to the working frequency requirement, in a preferred embodiment, the vector network analyzer 6 is replaced by a signal source and a spectrum analyzer, and the vector network analyzer 6 is replaced by the spectrum analyzer and the signal source to be matched.
Therefore, the invention has the following advantages: a miniaturized, fast, convenient and low-cost terahertz compact field can obtain radar reflection section of a target to be tested or far-field pattern data of an antenna to be tested, and a brand new active electric scanning antenna is adopted to replace an original emitting surface or holographic grating, so that system cost is reduced, use space is reduced, and meanwhile, the capability of rapidly testing the miniaturized compact field is provided.
The foregoing description is only illustrative of the present invention and is not intended to limit the scope of the invention, and all equivalent structures or equivalent processes or direct or indirect application in other related arts are included in the scope of the present invention.
Claims (4)
1. A terahertz compact field test system based on an electric scan antenna, comprising: the camera comprises a camera body (1), a target (2) to be detected, a fixing device (8), a vector network analyzer (6), a terahertz vector network expansion module (5) and a computer (7), wherein the camera body (1) is a terahertz camera body and is provided with an inner space, the target (2) to be detected and the fixing device (8) are both positioned in the camera body (1), the target (2) to be detected is positioned above the top plane of the fixing device (8), the vector network analyzer (6) sends millimeter wave signals, the computer (7), the vector network analyzer (6) and the terahertz vector network expansion module (5) are all positioned outside the camera body (1), the computer (7) is electrically connected with the vector network analyzer (6) and the terahertz vector network expansion module (5) in sequence; the terahertz compact field testing system based on the electric scanning antenna is characterized by further comprising the electric scanning antenna (3) and a feed module (4), wherein the electric scanning antenna (3) and the feed module (4) are both positioned in a darkroom (1), the electric scanning antenna (3) and the terahertz vector network expansion module (5) are in control connection through the feed module (4), and after millimeter wave signals are sent out by the vector network analyzer (6), the terahertz vector network expansion module (5) amplifies and multiplies the millimeter wave signals to a terahertz frequency band to obtain terahertz signals, and the terahertz signals are converted into free space plane waves after passing through the electric scanning antenna (3); the free space plane wave irradiates the target (2) to be detected, the free space plane wave returns to the electric scanning antenna (3) in the original path after being reflected by the target (2) to be detected, the electric scanning antenna (3) receives the free space plane wave and then restores the free space plane wave to be a current signal, the current signal is subjected to down-conversion to be a millimeter wave signal through the terahertz vector network expansion module (5), the millimeter wave signal returns to the vector network analyzer (6), and the vector network analyzer (6) calculates parameters and stores the parameters in the computer (7);
The electric scanning antenna (3) is an active electric scanning antenna; the active electric scanning antenna is set to be a phased array antenna or a metamaterial electric scanning antenna; the phased array antenna comprises a plurality of antenna elements (31), wherein the antenna elements (31) are arranged into an antenna array surface; the terahertz darkroom is provided with a wave absorbing material.
2. The terahertz compact field testing system based on the electric scanning antenna according to claim 1, wherein the antenna element (31) comprises a radio frequency signal module (311), a phase shifter (312) and an amplifier (313), and the radio frequency signal module (311), the phase shifter (312) and the amplifier (313) are sequentially connected in a controlled manner.
3. The system of claim 1, wherein the metamaterial antenna comprises a plurality of metamaterial units (32), and the metamaterial units (32) form a metamaterial scanning array.
4. A terahertz compact field testing system based on an electric scanning antenna according to claim 3, characterized in that each metamaterial unit (32) comprises a varactor diode or a MEMS switch.
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| CN201910596911.8A CN110221131B (en) | 2019-07-04 | 2019-07-04 | Terahertz compact field test system based on electric scanning antenna |
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| CN114216853B (en) * | 2021-12-13 | 2023-12-29 | 清华大学 | Real-time detection system and method based on terahertz leaky-wave antenna |
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