CN110146493A - 一种光路检测系统及带有该系统的光激化学发光检测仪 - Google Patents
一种光路检测系统及带有该系统的光激化学发光检测仪 Download PDFInfo
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- CN110146493A CN110146493A CN201810144665.8A CN201810144665A CN110146493A CN 110146493 A CN110146493 A CN 110146493A CN 201810144665 A CN201810144665 A CN 201810144665A CN 110146493 A CN110146493 A CN 110146493A
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- 238000001514 detection method Methods 0.000 title claims abstract description 99
- 230000005284 excitation Effects 0.000 claims abstract description 84
- 230000000903 blocking effect Effects 0.000 claims abstract description 6
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 40
- 230000003287 optical effect Effects 0.000 claims description 18
- 235000013399 edible fruits Nutrition 0.000 claims description 2
- 239000003153 chemical reaction reagent Substances 0.000 description 8
- 238000000034 method Methods 0.000 description 8
- 230000008569 process Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 238000012545 processing Methods 0.000 description 4
- 238000012546 transfer Methods 0.000 description 4
- 230000003321 amplification Effects 0.000 description 3
- 238000003018 immunoassay Methods 0.000 description 3
- 238000011534 incubation Methods 0.000 description 3
- 238000003199 nucleic acid amplification method Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 239000000427 antigen Substances 0.000 description 2
- 102000036639 antigens Human genes 0.000 description 2
- 108091007433 antigens Proteins 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 230000004913 activation Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000000571 coke Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000004313 glare Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000005622 photoelectricity Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
- G01N21/76—Chemiluminescence; Bioluminescence
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- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Plasma & Fusion (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
Description
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Priority Applications (1)
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CN201810144665.8A CN110146493A (zh) | 2018-02-11 | 2018-02-11 | 一种光路检测系统及带有该系统的光激化学发光检测仪 |
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CN201810144665.8A CN110146493A (zh) | 2018-02-11 | 2018-02-11 | 一种光路检测系统及带有该系统的光激化学发光检测仪 |
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CN110146493A true CN110146493A (zh) | 2019-08-20 |
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CN201810144665.8A Pending CN110146493A (zh) | 2018-02-11 | 2018-02-11 | 一种光路检测系统及带有该系统的光激化学发光检测仪 |
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Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0355738A2 (en) * | 1988-08-26 | 1990-02-28 | Hitachi, Ltd. | Fluorophotometer for use in automatic equipment of chemical analysis for measuring the intensity of fluorescence in the automatic equipment |
CN102830224A (zh) * | 2012-08-28 | 2012-12-19 | 天津市先石光学技术有限公司 | 用于均相发光免疫检测的光路切换机构 |
CN203949870U (zh) * | 2014-06-27 | 2014-11-19 | 南京信息工程大学 | 一种基于荧光分析的液体理化参数测量装置 |
CN205080051U (zh) * | 2015-10-07 | 2016-03-09 | 朱泽策 | 一种可应用于瞬态光谱仪和时间分辨成像装置的光斩波器 |
CN205120591U (zh) * | 2015-11-05 | 2016-03-30 | 鄢培杰 | 一种荧光共聚焦信号采集装置 |
CN106066317A (zh) * | 2016-06-12 | 2016-11-02 | 朱泽策 | 光斩波器在延迟发光测量系统中的使用方法 |
CN206019686U (zh) * | 2016-07-19 | 2017-03-15 | 深圳市有为环境科技有限公司 | 避光装置及采用该避光装置的检测设备 |
CN207850930U (zh) * | 2018-02-11 | 2018-09-11 | 博阳生物科技(上海)有限公司 | 一种光路检测系统及带有该系统的光激化学发光检测仪 |
-
2018
- 2018-02-11 CN CN201810144665.8A patent/CN110146493A/zh active Pending
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0355738A2 (en) * | 1988-08-26 | 1990-02-28 | Hitachi, Ltd. | Fluorophotometer for use in automatic equipment of chemical analysis for measuring the intensity of fluorescence in the automatic equipment |
CN102830224A (zh) * | 2012-08-28 | 2012-12-19 | 天津市先石光学技术有限公司 | 用于均相发光免疫检测的光路切换机构 |
CN203949870U (zh) * | 2014-06-27 | 2014-11-19 | 南京信息工程大学 | 一种基于荧光分析的液体理化参数测量装置 |
CN205080051U (zh) * | 2015-10-07 | 2016-03-09 | 朱泽策 | 一种可应用于瞬态光谱仪和时间分辨成像装置的光斩波器 |
CN205120591U (zh) * | 2015-11-05 | 2016-03-30 | 鄢培杰 | 一种荧光共聚焦信号采集装置 |
CN106066317A (zh) * | 2016-06-12 | 2016-11-02 | 朱泽策 | 光斩波器在延迟发光测量系统中的使用方法 |
CN206019686U (zh) * | 2016-07-19 | 2017-03-15 | 深圳市有为环境科技有限公司 | 避光装置及采用该避光装置的检测设备 |
CN207850930U (zh) * | 2018-02-11 | 2018-09-11 | 博阳生物科技(上海)有限公司 | 一种光路检测系统及带有该系统的光激化学发光检测仪 |
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PB01 | Publication | ||
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Address after: 201210 floor 3 and 5, building 1, No. 88, Cailun Road, free trade zone, Pudong New Area, Shanghai Applicant after: BEYOND DIAGNOSTICS (SHANGHAI) Co.,Ltd. Applicant after: Kemei Diagnostic Technology Co.,Ltd. Address before: 201210 Pudong New Area, Shanghai, Zhangjiang Cai Lun Road, building 2, 3 floor, east 2. Applicant before: BEYOND DIAGNOSTICS (SHANGHAI) Co.,Ltd. Applicant before: BEIJING CHEMCLIN BIOTECH Co.,Ltd. |
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CB02 | Change of applicant information | ||
CB02 | Change of applicant information |
Address after: 200131 3rd and 5th floors, building 1, No.88 Cailun Road, Pudong New Area pilot Free Trade Zone, Shanghai Applicant after: Kemei Boyang diagnostic technology (Shanghai) Co.,Ltd. Applicant after: Kemei Diagnostic Technology Co.,Ltd. Address before: 201210 the third and fifth floors of Building 1, No. 88, Cailun Road, Pudong New Area, Shanghai Applicant before: BEYOND DIAGNOSTICS (SHANGHAI) Co.,Ltd. Applicant before: Kemei Diagnostic Technology Co.,Ltd. |
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Effective date of registration: 20230905 Address after: Room 202, Building 2, No. 188 Fuchunjiang Road, Suzhou High tech Zone, Suzhou City, Jiangsu Province, 215004 Applicant after: Kemei Diagnostic Technology (Suzhou) Co.,Ltd. Address before: 200131 3rd and 5th floors, building 1, No.88 Cailun Road, Pudong New Area pilot Free Trade Zone, Shanghai Applicant before: Kemei Boyang diagnostic technology (Shanghai) Co.,Ltd. Applicant before: Kemei Diagnostic Technology Co.,Ltd. |