CN110132262B - High-flatness realization method of star sensor - Google Patents
High-flatness realization method of star sensor Download PDFInfo
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- CN110132262B CN110132262B CN201910291475.3A CN201910291475A CN110132262B CN 110132262 B CN110132262 B CN 110132262B CN 201910291475 A CN201910291475 A CN 201910291475A CN 110132262 B CN110132262 B CN 110132262B
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- star sensor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/30—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring roughness or irregularity of surfaces
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C21/00—Navigation; Navigational instruments not provided for in groups G01C1/00 - G01C19/00
- G01C21/02—Navigation; Navigational instruments not provided for in groups G01C1/00 - G01C19/00 by astronomical means
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C25/00—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M7/00—Vibration-testing of structures; Shock-testing of structures
- G01M7/08—Shock-testing
Abstract
The invention relates to a high-flatness realization method of a star sensor, belonging to the technical field of spacecraft part manufacturing. The high flatness realization method of the star sensor product provided by the invention realizes the flatness superior to 0.01mm and far higher than the flatness level of 0.1mm which is usually required by the existing star sensor product; the invention solves the problem of poor flatness of the whole star sensor product caused by complex assembly operation, severe mechanical test, space thermal environment test and other tests in the development process, realizes high flatness superior to 0.01mm, and has no potential performance hazard on the whole star sensor product.
Description
Technical Field
The invention relates to a high-flatness realization method of a star sensor, belonging to the technical field of spacecraft part manufacturing.
Background
The star sensor is an important attitude measurement component in a spacecraft control subsystem, and is generally assembled by various complex components such as an optical system, a circuit, a mechanical structure and the like. Since the star sensor is usually installed outside the spacecraft cabin, besides the heating of electronic components in the internal circuit, the star sensor can be influenced by the irradiation of external heat flows such as the sun, the earth, the moon and the like, and therefore, in order to ensure that the star sensor is within a normal working temperature range, a good heat dissipation channel is required. The star sensor is mainly directly mounted on the support through a mounting flange of the star sensor, and heat is dissipated through heat conduction.
Generally speaking, the higher the flatness index of the contact surface of the mounting flange and the bracket, the higher the contact heat transfer coefficient. If the flatness of the whole photoelectric product can be improved from 0.1mm to 0.02mm, and the flatness of the bracket can be improved from 0.1mm to 0.02mm, the contact heat transfer coefficient can be improved by 1 to 2 orders of magnitude relative to the contact heat transfer coefficient under the condition of 0.1mm flatness, and the contact heat transfer coefficient can be improved from 100W/m2·K～500W/m2K increased to 5000W/m2·K～50000W/m2K. The power consumption of a certain star sensor product is about 8W, the average power irradiated by external heat flows of the sun, the earth, the moon and the like is 12W, the temperature difference between the star sensor product and the support is within the range of 2-4 ℃ under the condition that the planeness of the contact surface is 0.1mm, and if the planeness of the contact surface is improved to 0.02mm, the temperature difference between the star sensor product and the support is reduced to be within 0.2 ℃, so that the star sensor product has the advantages of high power consumption, high accuracy and low costThe flatness of the whole star sensor product is improved, and the heat dissipation capability of the whole star sensor product can be greatly improved.
The star sensor product for the spacecraft, which is mainly applied at present, has the technical index requirements of miniaturization and light weight besides the function of realizing the established attitude measurement, and the star sensor product needs to pass the examination of a rigorous identification-level mechanical test and a space thermal environment test before the space flight application. In order to ensure that the star sensor product has relatively good strength and rigidity, the star sensor product is internally and widely designed by adopting an over-static and over-positioning structure, and has more components and parts which need to be assembled and more complex assembly process. The mounting flange of the star sensor product needs to mount various components, optical systems or circuits besides providing a mounting interface, so that the structure is usually complex, and the mounting surface is easily deformed due to deformation generated in the process of machining or part standing; in the process that the star sensor product is assembled into a whole machine by parts, because of the adoption of the hyperstatic and over-positioning structural design, residual stress is inevitably existed between the parts, and the deformation of the installation surface of the whole machine is easily caused; meanwhile, the whole star sensor product is also subjected to the influences of various environmental factors such as focusing, calibration, mechanical tests, space thermal environment tests, star observation and the like, and stress release is generated in the test process, so that the whole star sensor product, particularly a mounting flange contact plane, deforms.
The planeness of the whole installation flange of the star sensor product in the space mission is generally required to be 0.1mm, most star sensor products can meet the planeness index requirement of 0.1mm, but the planeness of some star sensor products is better than 0.1mm at the initial stage of product development, but after mechanical tests and space thermal environment tests, the planeness of the products reaches 0.12 mm-0.15 mm, the planeness of the star sensor products is an important index in the space product inspection, and the product can be rejected by users due to the out-of-tolerance of the index.
The measures for solving the problem of the out-of-tolerance of the flatness of the whole star sensor product are two types: one is that the body of the photoelectric product is knocked for many times by a rubber hammer, so that the flatness meets the requirement; the other is a complete machine grinding mode, so that the flatness meets the requirement.
The star sensor product is knocked by the rubber hammer to realize the following defects in high flatness of the star sensor product:
1. the high flatness implementation process cannot be quantified and the flatness level is not high. The principle of realizing high flatness by knocking the body of the star sensor product through the rubber hammer is that the star sensor product is placed on a marble platform with higher flatness, the rubber hammer knocks the body structure of the star sensor product to further generate acting force on a mounting flange of the star sensor product, and the marble platform has reacting force on the mounting flange so as to correct the flatness of the mounting flange of the star sensor product.
2. The star sensor product has the risk of being tested after being knocked by the rubber hammer for multiple times. The rubber hammer is used for knocking the star sensor product for multiple times, multiple impact excitations are actually applied to the star sensor product, although the magnitude of the impact excitations is small, the impact excitations also belong to the impact excitations outside the research and development task of the star sensor product, and the star sensor product, an internal optical system and electronic components of the star sensor product can be potentially damaged.
Based on the two defects, the planeness of the star sensor product is rarely corrected by using a rubber hammer knocking method in the actual operation process.
The high planeness of the star sensor product realized by the method of grinding the whole machine has the following defects:
1. the star sensor product may have a risk of electrostatic damage during the whole grinding process. In the whole machine grinding process of the star sensor product, static electricity can be generated on a mounting flange and a grinding table surface of the star sensor product, the star sensor product is a static electricity sensitive product, and the static electricity can easily damage electronic components in the star sensor product to cause the function failure of the star sensor product.
2. The star sensor product may be contaminated by the surplus material during the grinding process of the whole machine. In the whole machine grinding process of the star sensor product, grinding particles or grinding liquid are required to be added on a grinding table top, the tiny allowance removal of the bottom surface of the mounting flange is realized through the friction between the grinding particles or the grinding liquid and the mounting flange, the flatness of the mounting flange is realized through long-time grinding, and as the star sensor product has the characteristics of complex structure and poor sealing performance, the grinding particles or the grinding liquid can easily enter the star sensor product in the grinding process to generate surplus substances, so that the product is polluted.
3. The risk of poor flatness still exists before the star sensor product is assembled to a spacecraft after delivery to a user. The whole grinding of the star sensor product can improve the flatness of the whole grinding machine and generate stress action on the structure. After the star sensor product is delivered to a user, a long time of testing is usually needed, in the testing and standing processes, the flatness of the whole machine can be influenced by residual stress generated in the grinding process, and further the problem that the flatness of the whole machine reaches the standard and is out of tolerance before the star sensor product is assembled to a spacecraft when the star sensor product is delivered to the user occurs.
Based on the defects, the star sensor product has a greater risk of realizing high flatness of the whole star sensor product through whole grinding.
Disclosure of Invention
The technical problem solved by the invention is as follows: the method overcomes the defects of the prior art, provides the star sensor high-flatness realization method, solves the problem that the flatness of the photoelectric product is poor after the photoelectric product is assembled and undergoes severe mechanical test conditions and space thermal environment tests, and simultaneously avoids the risks of static loss, redundant pollution, over-test and the like which are possibly brought by the improvement of the flatness of the whole machine by adopting the prior art.
The technical solution of the invention is as follows:
a star sensor high flatness implementation method comprises the steps of assembling design of a star sensor and testing design of the star sensor; the star sensor structure mainly comprises a mounting flange, a top cover plate, four support columns and four side cover plates;
one ends of the four support columns are connected to the mounting flange through screws, and then the top cover plate is connected to the other ends of the four support columns through the four screws, namely the mounting flange is arranged at the bottom ends of the four support columns, and the top cover plate is arranged at the top ends of the four support columns;
the four side cover plates are also fixedly connected with the mounting flange and the top cover plate through screws, namely the mounting flange is arranged at the bottom end of each side cover plate, and the top cover plate is arranged at the top end of each side plate;
the star sensor assembly design is as follows: the height h of the four side cover plates is less than the distance L between the top cover plate and the mounting flange, and the L-h is 0.05-0.1 mm; l is the distance between the lower surface of the top cover plate and the upper surface of the mounting flange;
the test design of the star sensor is as follows: the mounting flange is fixedly connected to the high-flatness protection plate through the screws, the flatness of the high-flatness protection plate is better than 5 microns, the protection plate is a flat plate, namely the mounting flange is fixedly connected to the protection plate through the screws before the star sensor is tested, and then the star sensor is tested, wherein the testing comprises focusing testing, calibration testing, mechanical testing, thermal testing, star observation testing and the like.
The invention has the advantages over the prior art that:
(1) the high flatness realization method of the star sensor product provided by the invention realizes the flatness superior to 0.01mm and far higher than the flatness level of 0.1mm which is usually required by the existing star sensor product;
(2) the invention solves the problem of poor flatness of the whole star sensor product caused by complex assembly, severe mechanical test and thermal test in the development process, realizes high flatness superior to 0.01mm, and has no potential performance hazard on the whole star sensor product;
(3) the invention provides a method for realizing high flatness of a whole star sensor product, which is a control method integrating assembly design and test design, realizes whole-process monitoring and control of the flatness of the whole star sensor product, is a pre-process and in-process control method, is different from the conventional post-process control method for realizing high flatness of the whole star sensor product through grinding, and avoids risks such as electrostatic damage, pollution and the like in the grinding of the whole star sensor product;
(4) the method for realizing the complete high flatness of the star sensor product is practical and reliable, can be popularized to the development of all spacecraft parts with complex structures, and has good popularization and application prospects.
Drawings
FIG. 1 is a schematic view of a star sensor according to the present invention;
fig. 2 is a schematic view of the star sensor of the present invention mounted on a protective plate.
Detailed Description
The invention is described in further detail below with reference to the figures and specific embodiments.
The star sensor product is mainly structurally composed of a mounting flange 1, a top cover plate 2, support columns 3 (4 in total) and side cover plates 4 (4 in total) as shown in figure 1.
The assembly design method of the star sensor comprises the following steps:
a) the four support columns are connected to the mounting flange through screws, and the top cover plate is connected to the four support columns through the four screws;
b) the lower end of the side cover plate is connected to the mounting flange through a screw, and the upper end of the side cover plate is connected to the top cover plate;
c) the height h of the four side cover plates is less than the distance L between the top cover plate and the main body flange, and the L-h is 0.05-0.1 mm.
The test design method of the star sensor comprises the following steps:
as shown in fig. 2, the mounting flange 1 is fixedly connected to the high-flatness protection plate 5 through screws, the flatness of the high-flatness protection plate is better than 5 μm, the protection plate is a flat plate, namely the mounting flange is fixedly connected to the protection plate through screws before the star sensor is tested, and then the test is performed, wherein the test comprises a focusing test, a calibration test, a mechanical test, a thermal test, a star observation test and the like.
By the method, the flatness of the star sensor product is superior to 0.01 mm.
Those skilled in the art will appreciate that the details of the invention not described in detail in this specification are well within the skill of those in the art.
Claims (1)
1. A star sensor high flatness realization method is characterized in that: the method comprises the steps of assembling and designing the star sensor and testing and designing the star sensor;
the star sensor assembly design is as follows: the height of the side cover plate is smaller than the distance between the top cover plate and the mounting flange;
the difference between the height of the side cover plate and the distance between the top cover plate and the mounting flange is 0.05-0.1 mm;
the test design of the star sensor is as follows: before testing, fixedly connecting the mounting flange to the protection plate;
fixedly connecting the mounting flange to the protection plate by using a screw;
the flatness of the protective plate is better than 5 μm;
the protective plate is a flat plate;
the test comprises a focusing test;
the test also comprises a calibration test and a mechanical test;
the test also comprises a thermal test and a star observation test;
the star sensor comprises a mounting flange, a top cover plate, four support columns and four side cover plates;
one ends of the four support columns are connected to the mounting flange through screws, and the top cover plate is connected to the other ends of the four support columns through the four screws;
one ends of the four side cover plates are connected to the mounting flange through screws, and the top cover plate is connected to the other ends of the four side plates through the four screws.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201910291475.3A CN110132262B (en) | 2019-04-12 | 2019-04-12 | High-flatness realization method of star sensor |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201910291475.3A CN110132262B (en) | 2019-04-12 | 2019-04-12 | High-flatness realization method of star sensor |
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| CN110132262A CN110132262A (en) | 2019-08-16 |
| CN110132262B true CN110132262B (en) | 2021-03-26 |
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