CN110090956B - Multi-laser rapid splicing method for SLM (Selective laser melting) equipment - Google Patents
Multi-laser rapid splicing method for SLM (Selective laser melting) equipment Download PDFInfo
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Abstract
The application provides a multi-laser fast splicing method for SLM equipment, which specifically comprises the following steps: manufacturing a standard pattern according to the equipment splicing area and the precision requirement; scanning the standard pattern by using an SLM device and a double laser system; analyzing the scanned and formed real object pattern on site, and obtaining a geometric deviation value of a laser scanning coordinate system; inputting the deviation value into SLM equipment, and adjusting laser scanning coordinates; re-scanning the standard pattern again to determine that the double-laser adjustment is completed; and repeating double-laser adjustment, and realizing the quick splicing of a plurality of laser systems through the quick splicing of double lasers. According to the method and the device, the precise geometric deviation between the laser coordinate systems can be obtained on site, the image does not need to be sent back to the place where the professional equipment is located, and the multi-laser splicing can be completed on the equipment debugging site at high precision and quickly.
Description
Technical Field
The invention belongs to the technical field of additive manufacturing, and particularly relates to a multi-laser rapid splicing method for SLM (selective laser melting) equipment.
Background
In the face of increasing demands for SLM process processing efficiency, multi-laser SLM equipment and multi-laser high-precision splicing have become one of the key points in SLM equipment manufacturing. At present, two methods, namely field visual inspection debugging and image data analysis, are available for a multi-laser high-precision splicing method.
And the on-site visual inspection debugging is used for carrying out multi-laser splicing, a multi-laser system is used for scanning standard images, and the geometric deviation between different laser coordinate systems, including X-axis deviation, Y-axis deviation and XY plane internal rotation, is measured by visual inspection or tools on site. Because human eyes observe the difference and have errors with the measurement of the field tool, the splicing process needs to be repeated for many times, and the precision is not high.
The image data analysis method is to convert the standard image scanned by the multi-laser system into electronic data by using a special instrument, analyze the geometric deviation between different laser coordinate systems by using related software and draw a conclusion. And then inputting the obtained adjustment value into SLM equipment control software to complete the splicing of multiple lasers.
The defects of slow speed, poor precision and incapability of obtaining results on site exist in the SLM equipment multi-laser high-precision splicing in the prior art, and are as follows:
1. the speed is slow: performing field visual inspection debugging, and repeatedly measuring and splicing for multiple times; and image data analysis needs to send the image back to the place where the professional equipment is located, and the two methods cannot realize multi-laser splicing quickly.
2. The precision is poor: the field visual debugging is based on human eye observation or measurement of a field manual tool, and the precision cannot meet the standard of the SLM technology.
3. Results cannot be obtained on site: the image data analysis needs to send the standard pattern obtained on site to a special instrument for processing, and the equipment cannot be transported to the SLM equipment debugging site, so the image data analysis method cannot be completed on site.
Disclosure of Invention
In order to improve the multi-laser splicing method of the traditional SLM equipment, the multi-laser splicing can be rapidly completed at a high precision on the equipment debugging site by utilizing a specific standard image, and the multi-laser rapid splicing method of the SLM equipment is provided, and comprises the following steps:
firstly, manufacturing a standard pattern comprising at least three scales according to the size of a double-laser splicing area of equipment and the requirement of equipment processing precision;
secondly, converting the manufactured standard pattern into a file which can be processed by SLM equipment, respectively scanning by a first laser and a second laser in double-laser splicing, and scanning the standard pattern into a real pattern through splicing;
acquiring data on a scale according to the scanned and formed real object pattern, and calculating a geometric deviation value of a laser scanning coordinate system;
step four, the obtained X-axis direction deviation, Y-axis direction deviation and X-Y plane rotation value are used as deviation values for adjusting second laser of the SLM equipment, and are input into the SLM equipment to adjust scanning coordinates of the second laser;
step five, rescanning the standard pattern, wherein the 0 scale marks of the deviation edges of all the scales in the real pattern are aligned with the 0 scale marks in the standard edges of the scales, so that the scanning coordinate systems of two lasers in double-laser splicing are completely overlapped at the moment, the double-laser splicing is finished, if the reading is not zero, the steps three and four are repeated, the geometric deviation value of the laser scanning coordinate system is calculated again, and the geometric deviation value is led into SLM equipment to adjust the laser scanning coordinate system;
and step six, taking one laser scanning coordinate system in the double-laser splicing as a standard coordinate system, and repeatedly adopting the double-laser splicing steps to adjust other laser scanning coordinate systems relative to the laser scanning coordinate system, namely repeating the steps from the first step to the fifth step.
Preferably, according to the size of the double-laser splicing area of the equipment and the requirement of the processing precision of the equipment, a standard pattern containing at least three scales is manufactured in the first step, and the specific steps are as follows:
(1-1) the scale is composed of a scale shaft and line segments on both sides of the scale shaft, the side composed of standard line segments is called standard side of the scale, the side composed of deviation line segments is called deviation side of the scale, the minimum distance between the standard line segments is standard value A, the splicing precision is B, and then the line segment number N of the standard side and the deviation side is at least
The standard side of the scale takes the 0 scale mark as the center, and every interval A is a scale mark towards two sides, the scale value of each scale mark is the number of standard line segments from the 0 scale mark, one side of the two sides of the 0 scale mark is a positive value, and the other side of the two sides of the 0 scale mark is a negative value; the deviation edge of the scale takes the 0 scale mark as the center, and every interval A-B is a scale mark towards two sides, the scale value of the deviation edge scale mark corresponding to the positive value of the standard edge is the number of the deviation line segments from the 0 scale mark, the scale value of the deviation edge scale mark corresponding to the negative value of the standard edge is N minus 1, and then the number of the deviation line segments from the 0 scale mark is subtracted;
(1-2) the standard pattern includes at least three scales, wherein two scales are the same direction scales;
(1-3) the distance L between the homodromous scales is known, and the distance L is the distance between the scale shafts of the two homodromous scales.
Preferably, the standard patterns in step (1-2) are, from top to bottom, a first scale for measuring X-axis deviation, a second scale for measuring Y-axis deviation and a third scale for measuring X-axis deviation.
Preferably, in the third step, data on the scale is acquired according to the scanned and formed real object pattern, and a geometric deviation value of the laser scanning coordinate system is calculated, which specifically comprises the following steps:
(3-1) acquiring the scale mark value in the standard edge of the scale corresponding to the scale mark 0 in the deviation edge of the scale, marking as C1, and if the scale mark 0 in the deviation edge is between the two scale marks in the standard edge, selecting the value with the smaller value in the two scale marks in the standard edge as C1;
(3-2) finding the scale mark, which is exactly aligned with the scale mark in the standard edge of the scale, in the deviation edge of the scale, obtaining the numerical value of the scale mark in the deviation edge of the scale, and marking the numerical value as C2, if a plurality of scale marks in the deviation edge of the scale are aligned with the scale mark in the standard edge of the scale, selecting the scale mark in the deviation edge with the minimum numerical value as C2; tools such as a magnifying glass and the like are required to assist in observation when necessary;
(3-3) calculating readings of the three scales respectively by using a formula A C1+ B C2 according to the values of C1 and C2 acquired by each scale, wherein the readings of the three scales are respectively marked as D1, D2 and D3;
(3-4) calculating a geometric deviation value of the second laser scanning coordinate system relative to the first laser scanning coordinate system according to the acquired scale reading:
deviation in the X-axis direction: δ x ═ (D1+ D3)/2;
deviation in the Y-axis direction: δ y — D2;
rotation in the X-Y plane: δ θ ═ arctan ((D1-D3)/L);
wherein δ X represents an X-axis direction deviation; δ y represents a deviation in the X-axis direction; δ θ represents the angular deviation between the two scanning coordinate systems.
Preferably, the value of the standard value a is required to be as follows: not more than X0Or Y0Product of the medium and small number and the required stitching precision B, where X0Rectangular length of splicing region for double laser, Y0The splicing area is the rectangular height of the double laser.
Preferably, the step (1-1) further comprises selecting different colors for the standard side and the deviation side scales of the ruler.
Compared with the prior art, the application has the advantages that:
1. according to the design of the standard image, an operator can accurately obtain the difference between the scanning coordinates of different lasers through human eyes or simple auxiliary tools. The precision of on-site multi-laser splicing is greatly improved.
2. According to the standard image data, the image does not need to be sent back to the place where the professional equipment is located, and the adjustment speed of the laser in the SLM equipment is increased.
3. The method can complete standard image data analysis on site, obtain the geometric deviation between different laser coordinate systems, and realize high-precision and rapid completion of multi-laser splicing on the equipment debugging site.
Drawings
FIG. 1 is a combination graph of a set of standard line segments and a set of deviation line segments;
FIG. 2 standard pattern for dual laser stitching;
FIG. 3 shows a standard pattern with a double laser splicing precision of 0.01 mm;
FIG. 4 is a schematic diagram of a scanning forming object pattern with a double laser splicing precision of 0.01 mm;
FIG. 5 is an enlarged view of the scale line 0 of the first scale;
FIG. 6 is an enlarged view of the first scale where the offset edge tick marks are aligned with the standard edge tick marks; and
fig. 7 a dual laser stitching step.
Detailed Description
According to the laser splicing method, the principle that the splicing generates displacement when geometric deviation exists in a plurality of laser coordinate systems is utilized, the standard image is set to be a specific scale, the geometric deviation value is obtained through the standard image displacement result to adjust the lasers, and the existing multi-laser high-precision splicing method is greatly simplified.
The invention provides a multi-laser rapid splicing method for SLM equipment, which can be carried out on an equipment debugging field and can finish multi-laser splicing with high precision and rapidly. The SLM equipment multi-laser fast splicing method comprises six steps: firstly, manufacturing a standard pattern according to equipment splicing area and precision requirements; scanning a standard pattern by using an SLM (selective laser melting) device and a double laser system; analyzing the standard pattern on site and obtaining a geometric deviation value of a laser scanning coordinate system; fourthly, inputting the deviation value into SLM equipment, and adjusting laser scanning coordinates; re-scanning the standard pattern again to determine that the double-laser adjustment is finished; and sixthly, repeating double-laser adjustment, and realizing the quick splicing of a plurality of laser systems through the double-laser quick splicing.
Step one, manufacturing a standard pattern according to the size of a double-laser splicing area of equipment and the requirement of equipment processing precision. The splicing area of the double lasers is rectangular, and the length of the rectangle is X0High is Y0Therefore, the standard pattern to be produced should not be larger than the double laser splicing area, so as to ensure that the pattern can be normally scanned and formed by the two lasers.
(1-1) As shown in FIG. 1, the scale is composed of a scale shaft and line segments on both sides of the scale shaft, the first side is composed of a standard line segment called standard side of the scale, and the second side is composed of a deviation line segment called deviation side of the scale. The length of each standard line segment is a standard value A, and the value of the standard value A is required to be not more than X0Or Y0The product of the small and medium number and the required splicing precision B, namely A is less than or equal to min (X)0，Y0) B, preferably to take as large a number as possible to facilitate calculation. And the length of each deviation line segment is the standard value A minus the required splicing precision B. The minimum number N of the line segments of the standard edge and the deviation edge is the quotient of dividing the standard value A by the splicing precision B, and then 1 is added after the quotient is rounded downwards, namely
The middle of the scale is set to be 0 scale mark, and the number of at least more than or equal to (N-1)/2 line segments is arranged on both sides of the 0 scale mark respectively, namely the 0 scale mark of the scale is positioned at the center of the scale. The standard side of the scale takes the 0 scale mark as the center, and every interval A from the 0 scale mark to the two sides is a scale mark, the scale value of each scale mark is the standard line value of the scale mark from the 0 scale mark, and one side of the two sides of the 0 scale mark of the standard side is a positive value and the other side of the two sides of the 0 scale mark of the standard side is a negative value. The deviation edge takes the 0 scale mark as the center, and every interval A-B from the 0 scale mark to the two sides is taken as a scale mark, the scale value of the deviation edge scale mark corresponding to the positive value of the standard edge is the number of the deviation line segments from the 0 scale mark, and the scale value of the deviation edge scale mark corresponding to the negative value of the standard edge is N minus 1 and then minus the number of the deviation line segments from the 0 scale mark. To make the scale contrast moreClearly, the standard side and the deviation side of the scale are selected to be different colors.
(1-2) the standard pattern includes at least three scales, two of which are homeotropic scales, and as shown in fig. 2, from top to bottom, a first scale for measuring X-axis deviation, a second scale for measuring Y-axis deviation, and a third scale for measuring X-axis deviation, respectively.
(1-3) the distance L between the homodromous scales is known, and the distance L is the distance between the scale shafts of the two homodromous scales.
And step two, converting the manufactured standard pattern into a file format which can be processed by the SLM equipment, respectively scanning by different laser systems, specifically, a standard edge of a first laser scanning scale and a deviation edge of a second laser scanning scale, and splicing and scanning the standard pattern into a real pattern.
And step three, sequentially acquiring data on the three scales according to the scanned and formed real object pattern.
(3-1) acquiring the scale mark value in the standard edge of the scale corresponding to the scale mark 0 in the deviation edge of the scale, marking as C1, and if the scale mark 0 in the deviation edge is between the two scale marks in the standard edge, selecting the value with the smaller value in the two scale marks in the standard edge as C1;
(3-2) finding the scale mark where the scale mark in the deviation edge of the scale is exactly aligned with the scale mark in the standard edge of the scale, obtaining the numerical value of the scale mark in the deviation edge of the scale, and marking the numerical value as C2, if a plurality of scale marks in the deviation edge of the scale are aligned with the scale mark in the standard edge of the scale, selecting the scale mark in the deviation edge with the minimum numerical value as C2; tools such as a magnifying glass and the like are required to assist in observation when necessary;
(3-3) based on the C1 and C2 values obtained from each scale, the readings of the three scales were calculated using the formula a × C1+ B × C2, and the readings of the three scales were recorded as D1, D2, and D3, respectively.
(3-4) calculating a geometric deviation of the second laser scanning coordinate system relative to the first laser scanning coordinate system based on the acquired scale readings:
deviation in the X-axis direction: δ x ═ (D1+ D3)/2;
deviation in the Y-axis direction: δ y — D2;
rotation in the X-Y plane: δ θ ═ arctan ((D1-D3)/L);
and step four, inputting the obtained X-axis direction deviation, Y-axis direction deviation and X-Y plane rotation value as deviation values for adjusting the second laser of the SLM equipment into the SLM equipment to adjust the scanning coordinates of the second laser.
And step five, rescanning the standard pattern, wherein the 0 scale marks on the deviation edges of all the scales in the pattern are aligned with the 0 scale marks in the standard edges of the scales, which shows that the first laser scanning coordinate system and the second laser scanning coordinate system are completely overlapped at the moment, and the laser splicing is finished. If the reading is not zero, repeating the third step and the fourth step, calculating the coordinate system deviation value again, and guiding the coordinate system deviation value into SLM equipment to adjust the second laser scanning coordinate system.
And step six, forming double-laser splicing by the first laser and other lasers respectively, taking the first laser scanning coordinate system as a standard coordinate system, and adjusting the other laser scanning coordinate systems relative to the first laser scanning coordinate system by adopting the double-laser splicing step, namely repeating the step one to the step five, and realizing the multi-laser splicing after all lasers in the SLM equipment are adjusted.
The technical scheme provided by the application is explained in detail by using specific steps of the operation of the SLM device multi-laser fast splicing method in actual production, so as to better embody the advantages of the application.
The SLM device includes a first laser, a second laser, a third laser, and a fourth laser. Taking the double laser splicing of the first laser and the second laser as an example: double laser splicing area X0*Y0The splicing precision is required to be 0.01mm from 100mm to 100 mm. Therefore, the value of a is less than 1mm, and in this embodiment, a is set to be 0.5 mm. And manufacturing a standard pattern according to the equivalent value of the size of the double-laser splicing area and the requirement of the machining precision of equipment. The method specifically comprises the following steps: as shown in fig. 3, the minimum distance a of the standard line segments is 0.5mm, the minimum distance a-B of the deviation line segments is 0.5mm-0.01mm is 0.49mm, and the number of line segments in each group is 0.5mm-0.01mm
0 graduation line positionIn the center of the scale, since (N-1)/2 is 25 (51-1)/2, the number of line segments on both sides of the 0 graduation mark is only equal to or greater than 25, and therefore, in this embodiment, the number of line segments on both sides of the 0 graduation mark is 25, specifically: the scale value of the standard side scale mark of the scale marks a scale value for every 5 line segments by taking 0 as the center, and the scale values are respectively +/-5, +/-10, … … and +/-25 from the 0 scale mark to the two sides; the scale value of the deviation edge scale mark of the scale takes 0 as the center, and each 5 line segments are marked with one scale value, and the scale value of the deviation edge scale mark corresponding to the positive value of the standard edge is 5, 10, … … and 25; the scale values of the scale lines on the sides of the deviation corresponding to the negative values of the standard sides are 45, 40, … … 25. The standard side scale of the scale is black, and the deviation side scale of the scale is red. The standard pattern includes three scales, two of which are homodromous scales, and a first scale for measuring the X-axis deviation, a second scale for measuring the Y-axis deviation, and a third scale for measuring the X-axis deviation, respectively, from top to bottom as shown in fig. 3. The distance L between the same-direction scales is 60mm, namely the distance between the scale shafts of the first scale and the third scale is 60 mm.
And converting the manufactured standard pattern into a file which can be processed by the SLM equipment, scanning the standard edge of the scale by the first laser and scanning the deviation edge of the scale by the second laser respectively, and splicing and scanning the standard pattern into a real pattern, as shown in FIG. 4.
And sequentially acquiring data on the three scales according to the scanned and formed real object pattern. Taking the first scale as an example, the data of the first scale are shown in fig. 5 and 6, respectively. The scale line 0 in the deviation edge is between the scale lines 0 and-1 in the standard edge, so that the value-1 with the smaller value in the two scale lines of the standard edge is selected and recorded as C1, namely C1 is recorded as-1; the scale mark 30 in the deviation edge of the scale is just aligned with the scale mark-20 in the standard edge of the scale, and the value 30 of the scale mark in the deviation edge of the scale is marked as C2, namely C2 is marked as 30; the scale then reads D1 ═ a × C1+ B × C2 ═ 0.5mm (-1) +0.01mm × 30 ═ 0.2 mm. Similarly, a second scale reading D2 ═ 0.3mm can be obtained; the third scale reads-0.2 mm-D3. The geometric deviation of the second laser coordinates from the first laser scanning coordinate system can thus be obtained as:
deviation in the X-axis direction: δ x ═ (D1+ D3)/2 ═ 0.2mm-0.2mm)/2 ═ 0.2 mm;
deviation in the Y-axis direction: δ y-D2-0.3 mm;
rotation in the X-Y plane: δ θ ═ arctan ((D1-D3)/L) ((-0.2mmm +0.2mm)/60mm) ═ 0 °;
according to the calculation result, the second laser scanning coordinate system is shifted rightwards by 0.2mm and upwards by 0.3mm relative to the first laser scanning coordinate system, and no angle deviation exists.
And inputting the obtained X-axis direction deviation, Y-axis direction deviation and X-Y plane rotation value as deviation values of second laser of the SLM equipment into the SLM equipment to adjust a second laser scanning coordinate system.
And rescanning the standard pattern, wherein the 0 scale marks on the deviation edges of all the scales in the pattern are aligned with the 0 scale marks in the standard edges of the scales, which shows that the first laser scanning coordinate system and the second laser scanning coordinate system are completely overlapped at the moment, and the double-laser splicing is finished.
And then the first laser and the third laser, and the first laser and the fourth laser respectively form double laser splicing, and a third laser scanning coordinate system and a fourth laser scanning coordinate system are respectively adjusted by adopting a double laser splicing step, so that the third laser scanning coordinate system and the fourth laser scanning coordinate system are both coincided with the first laser scanning coordinate system. At the moment, scanning coordinate systems of the first laser, the second laser, the third laser and the fourth laser are overlapped, and multi-laser fast splicing of the SLM equipment is achieved.
Finally, it should be noted that: the above-mentioned embodiments are only used for illustrating the technical solution of the present invention, and not for limiting the same; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention.
Claims (3)
1. A multi-laser fast splicing method for SLM equipment is characterized by comprising the following steps:
firstly, manufacturing a standard pattern comprising at least three scales according to the size of a double-laser splicing area of equipment and the requirement of equipment processing precision;
the method comprises the following specific steps:
(1-1) the scale is composed of a scale shaft and line segments on both sides of the scale shaft, the first side is composed of a standard line segment called standard side of the scale, the second side is composed of a deviation line segment called deviation side of the scale, the minimum distance of the standard line segment is a standard value A, the minimum distance of the deviation line segment is A-B, B is splicing precision, and the line segment number N of the standard side and the deviation side is at least
The standard side of the scale takes the 0 scale mark as the center, and every interval A is a scale mark towards two sides, the scale value of each scale mark is the number of standard line segments from the 0 scale mark, one side of the two sides of the 0 scale mark is a positive value, and the other side of the two sides of the 0 scale mark is a negative value; the deviation edge of the scale takes the 0 scale mark as the center, and every interval A-B is a scale mark towards two sides, the scale value of the deviation edge scale mark corresponding to the positive value of the standard edge is the number of the deviation line segments from the 0 scale mark, the scale value of the deviation edge scale mark corresponding to the negative value of the standard edge is N minus 1, and then the number of the deviation line segments from the 0 scale mark is subtracted;
(1-2) the standard pattern includes at least three scales, wherein two scales are the same direction scales;
the standard patterns are respectively a first scale for measuring X-axis deviation, a second scale for measuring Y-axis deviation and a third scale for measuring X-axis deviation from top to bottom;
(1-3) the distance L between the homodromous scales is known, wherein the distance L is the distance between the scale shafts of the two homodromous scales;
secondly, converting the manufactured standard pattern into a file which can be processed by SLM equipment, respectively scanning by a first laser and a second laser in double-laser splicing, and scanning the standard pattern into a real pattern through splicing;
acquiring data on a scale according to the scanned and formed real object pattern, and calculating a geometric deviation value of a laser scanning coordinate system;
the method comprises the following specific steps:
(3-1) acquiring the scale mark value in the standard edge of the scale corresponding to the scale mark 0 in the deviation edge of the scale, marking as C1, and if the scale mark 0 in the deviation edge is between the two scale marks in the standard edge, selecting the value with the smaller value in the two scale marks in the standard edge as C1;
(3-2) finding the scale mark, which is exactly aligned with the scale mark in the standard edge of the scale, in the deviation edge of the scale, obtaining the numerical value of the scale mark in the deviation edge of the scale, and marking the numerical value as C2, if a plurality of scale marks in the deviation edge of the scale are aligned with the scale mark in the standard edge of the scale, selecting the scale mark in the deviation edge with the minimum numerical value as C2;
(3-3) calculating readings of the three scales respectively by using a formula A C1+ B C2 according to the values of C1 and C2 acquired by each scale, wherein the readings of the three scales are respectively marked as D1, D2 and D3;
(3-4) calculating a geometric deviation value of the second laser scanning coordinate system relative to the first laser scanning coordinate system according to the acquired scale reading:
deviation in the X-axis direction: δ x ═ (D1+ D3)/2;
deviation in the Y-axis direction: δ y — D2;
rotation in the X-Y plane: δ θ ═ arctan ((D1-D3)/L);
wherein δ X represents an X-axis direction deviation; δ Y represents a Y-axis direction deviation; δ θ represents the angular deviation between the two scanning coordinate systems;
step four, the obtained X-axis direction deviation, Y-axis direction deviation and X-Y plane rotation value are used as deviation values for adjusting second laser of the SLM equipment, and are input into the SLM equipment to adjust scanning coordinates of the second laser;
step five, rescanning the standard pattern, wherein the 0 scale marks of the deviation edges of all the scales in the real pattern are aligned with the 0 scale marks in the standard edges of the scales, so that the scanning coordinate systems of two lasers in double-laser splicing are completely overlapped at the moment, the double-laser splicing is finished, if the reading is not zero, the steps three and four are repeated, the geometric deviation value of the laser scanning coordinate system is calculated again, and the geometric deviation value is led into SLM equipment to adjust the laser scanning coordinate system;
and step six, taking one laser scanning coordinate system in the double-laser splicing as a standard coordinate system, and repeatedly adopting the double-laser splicing steps to adjust other laser scanning coordinate systems relative to the laser scanning coordinate system, namely repeating the steps from the first step to the fifth step.
2. The SLM device multi-laser fast tiling method of claim 1, characterized in that:
the value of the standard value A is required to be as follows: not more than X0Or Y0Product of the medium and small number and the required stitching precision B, where X0Rectangular length of splicing region for double laser, Y0The splicing area is the rectangular height of the double laser.
3. The SLM device multi-laser fast tiling method of claim 1, characterized in that:
the step (1-1) further comprises selecting different colors for the standard side and the deviation side scales of the ruler.
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