CN110045224A - A kind of Kelvin connects the test circuit and test method of circuit - Google Patents
A kind of Kelvin connects the test circuit and test method of circuit Download PDFInfo
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- CN110045224A CN110045224A CN201910385889.2A CN201910385889A CN110045224A CN 110045224 A CN110045224 A CN 110045224A CN 201910385889 A CN201910385889 A CN 201910385889A CN 110045224 A CN110045224 A CN 110045224A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2621—Circuits therefor for testing field effect transistors, i.e. FET's
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/67—Testing the correctness of wire connections in electric apparatus or circuits
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
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- Y02E10/50—Photovoltaic [PV] energy
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The present invention provides the test circuit and test method of a kind of Kelvin's connection circuit, and test circuit includes: the road N leg of circuit, and the value of N is corresponding with measured device port number；Every road leg of circuit is made of two-way sub-circuit, and the connecting pin of the two-way sub-circuit is connect with the same port of measured device respectively, and the other end is open end；The open end of the two-way sub-circuit respectively corresponds the driving end and sensing end that circuit is connected for Kelvin；Equivalent resistance on the two-way sub-circuit is respectively to drive end equivalent resistance, sensing end equivalent resistance；The road N leg of circuit corresponds to the road N Kelvin and connects circuit；At least an electric current constant-current source, voltmeter, the electric current constant-current source, voltmeter are connected to the different open ends at least twice, obtain voltage value at least twice, to detect the connectivity with measured device, and/or calculate the equivalent resistance.Under the premise of test equipment only uses necessary test lead and connect with measured device, above-mentioned detection is realized.
Description
Technical field
The present invention relates to circuit testing technology field, especially a kind of Kelvin connects test circuit and the test side of circuit
Method.
Background technique
Being tested using Kelvin's connection in semiconductor test field is highly important test method, it avoids drive
The pressure drop that streaming current generates on conducting wire keeps measurement and driving voltage relatively accurate on measured device.
Whether correct, high quality can have an impact test Kelvin's connection, especially to high-power discrete semiconductor
The test of device.Since the voltage and current test condition of high-power discrete semiconductor devices is relatively high, if Kelvin connects
Connect it is incorrect will lead to output voltage electric current it is incorrect in addition damage measured device；If Kelvin's quality of connection is low, such as line
Upper dead resistance, test fixture contact resistance are excessive etc., and above-mentioned resistance also will affect output voltage under the conditions of high-current test
The correctness of electric current is very damage test fixture.
The prior art is to Kelvin's connecting detection method of high-power discrete semiconductor devices as shown in Figure 1, with tested
Device is for diode, resistance Ra_sence indicates that the port A_Sence is output to the lead resistance of measured device anode in figure
With the summation of fixture contact resistance, resistance Ra_Force indicates that the port A_Force is output to the lead resistance of measured device anode
With the summation of fixture contact resistance.Other resistance marked in figure are similarly.To test anode two-port (A_Force, A_Sence)
Kelvin connection for (test of cathode C_Sence, C_Force are similarly), current test method be using test circuit
(board) internal small current constant-current source Is, to constant current between the port A_Force and the port A_Sence, voltmeter measures A_
Voltage Vm between Sence line and A_Sence line obtains the resistance summation Ra_sence+Ra_Force of two-port, and can
Whether the detection port A_Force connect with the port A_Sence.
As shown in Fig. 2, by taking measured device is mos pipe as an example (three terminal devices such as other field-effect tube, triode are similarly),
Rd_sence indicates that the port D_Sence is output to the lead resistance of measured device drain terminal and the summation of fixture contact resistance, Rd_
Force indicates that the port D_Force is output to the lead resistance of measured device drain terminal and the summation of fixture contact resistance.It is marked in figure
Other resistance similarly.For Kelvin to test drain terminal connects (grid end, source test are similarly), current test method is
Using the internal small current constant-current source Is of test circuit (board), to constant current between the port D_Force and the port D_Sence, electricity
The voltage Vm between the table measurement port D_Force and the port D_Sence is pressed, resistance summation Rd_sence+Rd_ on line is obtained
Force, and be able to detect the port D_Force and whether connect with the port D_Sence.
The method deficiency of above-mentioned detection Kelvin connection is: only using necessary test lead in test circuit and is tested
Under the premise of device connects, it is only capable of the detection port A_Force and the port A_Sence (or the port D_Force and the port D_Sence)
Whether connect, whether is connect with measured device after connection can not be detected.Furthermore only it is capable of measuring resistance Ra_sence+Ra_Force
It needs to carry in the resistance value of (or resistance Rd_sence+Rd_Force), the actually port A_Force (or the port D_Force) big
Electric current, it is sensitive to resistance on the port A_Force (or the port D_Force) and contact resistance.And the above method is unable to independent measurement
Resistance Ra_Force (or Rd_sence) on the port A_Force (or the port D_Force).
Summary of the invention
The main purpose of the present invention is to provide test circuits and test method that a kind of Kelvin connects circuit, are testing
Equipment only uses under the premise of necessary test lead connect with measured device, realizes for the sensing end of Kelvin's circuit and drive
Whether it is connect with measured device after the connection of moved end, and individually obtains the equivalent resistance on driving end.
It is described based on Kelvin connect circuit test circuit include:
The value of the road N leg of circuit, N is corresponding with measured device port number；
Every road leg of circuit is made of two-way sub-circuit, and the connecting pin of the two-way sub-circuit is same with measured device respectively
Port connection, the other end is open end；The open end of the two-way sub-circuit respectively corresponds the driving that circuit is connected for Kelvin
End and sensing end；Equivalent resistance on the two-way sub-circuit is respectively to drive end equivalent resistance, sensing end equivalent resistance；
The road N leg of circuit corresponds to the road N Kelvin and connects circuit；
At least an electric current constant-current source, a voltmeter,
So that the electric current constant-current source, voltmeter is connected to the different open ends at least twice, obtains electric at least twice
Pressure value to detect the connectivity with measured device, and/or calculates the equivalent resistance.
Wherein, measured device is diode, and described to be connected to electric current constant-current source, voltmeter at least twice different described
Open end includes:
One, electric current constant-current source, voltmeter are connected to the leg of circuit two-way sub-circuit connecting with diode anode, cathode
Open end between；
Two, voltmeter be connected to the leg of circuit two-way sub-circuit being connect with diode anode, cathode open end it
Between and the corresponding sensing end of leg of circuit two-way sub-circuit between；It is corresponding that electric current constant-current source is connected to leg of circuit two-way sub-circuit
Driving end between.
Wherein, measured device is three end field-effect tube, described that electric current constant-current source, voltmeter is made to be connected to difference at least twice
The open end include:
One, electric current constant-current source, voltmeter are connected to the circuit connecting with three end FET drains, grid, source electrode
Between the open end of arm two-way sub-circuit；
Two, voltmeter is connected to opening for the leg of circuit two-way sub-circuit connecting with three end FET drains, source electrode
It puts between end, and between sensing end corresponding with the two-way leg of circuit that three end FET drains, source electrode connect；Electric current constant current
Source is connected between driving end corresponding with the two-way leg of circuit of three end FET drains, source electrode connection；
Be connected to corresponding with the two-way leg of circuit that three end FET drains connect sensing end and with three end field-effect tube grid
The corresponding driving end of two-way leg of circuit of pole connection.
Wherein, measured device is triode, and described to be connected to electric current constant-current source, voltmeter at least twice different described
Open end includes:
One, electric current constant-current source, voltmeter are connected to the leg of circuit connecting with transistor collector, emitter, base stage
Two-way sub-circuit open end between；
Two, voltmeter is connected to the open end for the leg of circuit two-way sub-circuit connecting with transistor collector, base stage
Between, and between sensing end corresponding with the two-way leg of circuit that transistor collector, base stage connect；Electric current constant-current source is connected to
Between driving end corresponding with the two-way leg of circuit that transistor collector, base stage connect.
In addition, measured device is triode, described to be connected to electric current constant-current source, voltmeter at least twice different described
Open end further include:
Voltmeter be connected to the two-way sub-circuit for the leg of circuit being connect with transistor emitter, base stage open end it
Between, and between sensing end corresponding with the two-way leg of circuit that transistor emitter, base stage connect；Electric current constant-current source be connected to
Between the corresponding driving end of two-way leg of circuit that transistor emitter, base stage connect.
Measured device is triode, described that electric current constant-current source, voltmeter is made to be connected to the different openings at least twice
End includes:
One, electric current constant-current source, voltmeter are connected to the leg of circuit connecting with transistor collector, emitter, base stage
Two-way sub-circuit open end between；
Two, voltmeter is connected to the open end for the leg of circuit two-way sub-circuit connecting with transistor emitter, base stage
Between, and between sensing end corresponding with the two-way leg of circuit that transistor emitter, base stage connect；Electric current constant-current source is connected to
Between driving end corresponding with the two-way leg of circuit that transistor emitter, base stage connect.
Measured device is triode, described that electric current constant-current source, voltmeter is made to be connected to the different openings at least twice
End further include:
Voltmeter be connected to the two-way sub-circuit for the leg of circuit being connect with transistor collector, base stage open end it
Between, and between sensing end corresponding with the two-way leg of circuit that transistor collector, base stage connect；Electric current constant-current source be connected to
Between the corresponding driving end of two-way leg of circuit that transistor collector, base stage connect.
In addition, further including a switching circuit, it is connect respectively with the electric current constant-current source, voltmeter, for switching the electricity
Stream constant-current source, voltmeter connect at least twice.
A kind of test method based on above-mentioned test circuit provided herein, comprising steps of
The voltage value that voltmeter First Contact Connections to the open end are obtained is compared with preset first clamp voltage, base
Whether connected between the connecting pin that comparison result judges every road leg of circuit two-way sub-circuit respectively；
In conjunction with the electric current constant-current source of First Contact Connections to the open end, calculate separately on each road leg of circuit two-way sub-circuit
The sum of equivalent resistance；
Voltmeter is connected to the voltage value of the open end acquisition for the second time compared with preset second clamp voltage, base
Judge whether each road leg of circuit corresponds in comparison result to connect with the port of measured device；
It is connected to the open end for the second time in conjunction with electric current constant-current source, the driving end calculated separately on each road leg of circuit is equivalent
Resistance；
Calculate separately the sensing end equivalent resistance on each road leg of circuit.
Wherein, measured device is diode, comprising steps of
The voltage value that voltmeter First Contact Connections to the open end are obtained is compared with preset first clamp voltage, base
Whether connected between the connecting pin for the leg of circuit two-way sub-circuit that comparison result judgement and diode anode, cathode connect；
In conjunction with the electric current constant-current source of First Contact Connections to the open end, calculates separately and be connected to and diode anode, yin
The sum of equivalent resistance on the leg of circuit two-way sub-circuit of pole connection；
Voltmeter is connected to for the second time between the corresponding sensing end of each leg of circuit the voltage value that obtains with it is preset
Second clamp voltage compares, and judges whether each leg of circuit corresponds to based on comparative result and connect with the anode of diode, cathode；
It is connected to for the second time in conjunction with electric current constant-current source between the driving end of each leg of circuit, calculates separately each circuit
The driving end equivalent resistance of arm；
Calculate separately the sensing end equivalent resistance of each leg of circuit.
Wherein, measured device is three end field-effect tube, comprising steps of
The voltage value that voltmeter First Contact Connections to the open end are obtained is compared with preset first clamp voltage, base
In the connecting pin for the leg of circuit two-way sub-circuit that comparison result judges to connect with three end FET drains, grid, source electrode respectively
Between whether connect；
In conjunction with the electric current constant-current source of First Contact Connections to the open end, calculates separately to be connected to and be leaked with three end field-effect tube
The sum of the equivalent resistance on leg of circuit two-way sub-circuit that pole, grid, source electrode connect；
Be connected to corresponding with the two-way leg of circuit that three end FET drains connect sensing end and with three end field-effect tube grid
The corresponding driving end of two-way leg of circuit of pole connection；Voltmeter is connected to for the second time and three end FET drains, source electrode company
The voltage value obtained between the corresponding sensing end of the two-way leg of circuit connect is tied compared with preset second clamp voltage based on comparing
Fruit judges whether each road leg of circuit corresponds to and connect with the drain electrode of three end field-effect tube, grid, source electrode；
It is connected to for the second time in conjunction with electric current constant-current source corresponding with the two-way leg of circuit of three end FET drains, source electrode connection
Driving end between, calculate separately the driving end equivalent resistance for the two-way leg of circuit connecting with three end FET drains, source electrode；
Calculate separately the sensing end equivalent resistance for the two-way leg of circuit connecting with three end FET drains, source electrode.
Wherein, measured device is triode, comprising steps of
The voltage value that voltmeter First Contact Connections to the open end are obtained is compared with preset first clamp voltage, base
In the connecting pin for the leg of circuit two-way sub-circuit that comparison result judges to connect with transistor collector, emitter, base stage respectively it
Between whether connect；
In conjunction with electric current constant-current source First Contact Connections to the open end, calculates separately and be connected to and transistor collector, hair
The sum of the equivalent resistance on leg of circuit two-way sub-circuit that emitter-base bandgap grading, base stage connect；
Voltmeter is connected to for the second time with transistor collector, base stage connection the corresponding sensing end of two-way leg of circuit it
Between the voltage value that obtains compared with preset second clamp voltage, judgement connects with transistor collector, base stage based on comparative result
Whether the two-way leg of circuit connect corresponds to connect with transistor collector, base stage；
It is connected to drive corresponding with the two-way leg of circuit of transistor collector, base stage connection for the second time in conjunction with electric current constant-current source
Between moved end, the driving end equivalent resistance for the two-way leg of circuit connecting with transistor collector, base stage is calculated separately；
Calculate separately the sensing end equivalent resistance for the two-way leg of circuit connecting with transistor collector, base stage.
In addition, further comprising the steps of:
Voltmeter is connected to for the second time with transistor emitter, base stage connection the corresponding sensing end of two-way leg of circuit it
Between the voltage value that obtains compared with preset second clamp voltage, judgement connects with transistor emitter, base stage based on comparative result
Whether the two-way leg of circuit connect corresponds to connect with transistor emitter, base stage；
It is connected to drive corresponding with the two-way leg of circuit of transistor emitter, base stage connection for the second time in conjunction with electric current constant-current source
Between moved end, the driving end equivalent resistance for the two-way leg of circuit connecting with transistor emitter, base stage is calculated separately；
Calculate separately the sensing end equivalent resistance for the two-way leg of circuit connecting with transistor emitter, base stage.
Measured device is triode, comprising steps of
The voltage value that voltmeter First Contact Connections to the open end are obtained is compared with preset first clamp voltage, base
In the connecting pin for the leg of circuit two-way sub-circuit that comparison result judges to connect with transistor collector, emitter, base stage respectively it
Between whether connect；
In conjunction with electric current constant-current source First Contact Connections to the open end, calculates separately and be connected to and transistor collector, hair
The sum of the equivalent resistance on leg of circuit two-way sub-circuit that emitter-base bandgap grading, base stage connect；
Voltmeter is connected to for the second time with transistor emitter, base stage connection the corresponding sensing end of two-way leg of circuit it
Between the voltage value that obtains compared with preset second clamp voltage, judgement connects with transistor emitter, base stage based on comparative result
Whether the two-way leg of circuit connect corresponds to connect with transistor emitter, base stage；
It is connected to drive corresponding with the two-way leg of circuit of transistor emitter, base stage connection for the second time in conjunction with electric current constant-current source
Between moved end, the driving end equivalent resistance for the two-way leg of circuit connecting with transistor emitter, base stage is calculated separately；
Calculate separately the sensing end equivalent resistance for the two-way leg of circuit connecting with transistor emitter, base stage.
In addition, further comprising the steps of:
Voltmeter is connected to for the second time with transistor collector, base stage connection the corresponding sensing end of two-way leg of circuit it
Between the voltage value that obtains compared with preset second clamp voltage, judgement connects with transistor collector, base stage based on comparative result
Whether the two-way leg of circuit connect corresponds to connect with transistor collector, base stage；
It is connected to drive corresponding with the two-way leg of circuit of transistor collector, base stage connection for the second time in conjunction with electric current constant-current source
Between moved end, the driving end equivalent resistance for the two-way leg of circuit connecting with transistor collector, base stage is calculated separately；
Calculate separately the sensing end equivalent resistance for the two-way leg of circuit connecting with transistor collector, base stage.
Detailed description of the invention
Fig. 1 is Kelvin's connecting test circuit diagram of prior art test diode；
Fig. 2 is Kelvin's connecting test circuit diagram that the prior art tests mos pipe；
Fig. 3 is second group of test circuit diagram of first embodiment test diode；
Fig. 4 is second group of test circuit diagram of the diode that first embodiment is tested inside three end field-effect tube；
Fig. 5 is second group of test circuit diagram that second embodiment tests three end field-effect tube；
Fig. 6 is first group of test circuit diagram that 3rd embodiment tests triode；
Fig. 7 is second group of test circuit diagram that 3rd embodiment tests triode；
Fig. 8 is another second group of test circuit diagram that 3rd embodiment tests triode.
Specific embodiment
The test circuit of circuit is connected to Kelvin of the present invention referring to FIG. 1 to FIG. 8 and test method carries out
It is described in detail.
By taking measured device is diode as an example, Kelvin's connecting test circuit includes first embodiment as shown in Figure 1,3
Two groups, first group of test circuit is identical as the prior art as shown in Figure 1, including is connected to Kelvin and connects circuit A_Force
Electric current constant-current source Is and voltmeter V between A_Sence, between C_Force and C_Sence.
It is connected in circuit in Kelvin, the port Force, which is otherwise known as, drives port, and Sence is otherwise known as sensing ports.For
Convenient for description, herein, Kelvin connects circuit and four road connecting lines of diode are properly termed as two-way leg of circuit, the first via
Two sub-circuits included by leg of circuit are respectively as follows: one end and connect with diode anode, and the other end is connected to the son electricity of A_Force
Road；And one end is connect with diode anode, the other end is connected to the sub-circuit of A_Sence.Included by second road leg of circuit
Two sub-circuits are respectively as follows: one end and connect with diode cathode, and the other end is connected to the sub-circuit of C_Force；And one end and two
The connection of pole pipe cathode, the other end are connected to the sub-circuit of C_Sence.The one end connecting with diode anode can be described as connecting pin,
Driving end with Kelvin and sensing one end that end is connect can be described as open end.In addition, the port of test equipment is output to tested device
The lead resistance of part and the summation of fixture contact resistance are known as equivalent resistance, the corresponding equivalent resistance for driving port, sensing ports
It is referred to as driving end equivalent resistance, sensing end equivalent resistance.
First group of test circuit detect respectively Kelvin connect between circuit A_Force and A_Sence, C_Force and C_
Connection between Sence.If the voltage measured=the first clamp voltage, it was demonstrated that between A_Force and A_Sence or
It is not connected between C_Force and C_Sence；If the voltage measured ≠ the first clamp voltage, then it represents that connection.It is fixed using ohm
Resistance value Ra_sence+Ra_Force and resistance value Rc_sence+Rc_Force can be calculated in rule.(first) the clamper electricity
Pressure refers to the pincers pressure function that constant-current circuit has, and the maximum voltage of constant-current source output does not exceed (first) clamp voltage, institute
It is preset for stating (first) clamp voltage.
Second group of test circuit as shown in Figure 3, including be connected between A_Force and A_Sence, C_Force
Voltmeter V between C_Sence, between A_Sence and C_Sence, and be connected between A_Force and C_Force
Electric current constant-current source Is.
Voltage Vm3 between A_Sence and C_Sence is measured, if the second clamp voltage of Vm3=, it was demonstrated that A_Force and A_
After Sence and C_Force is connect with C_Sence, some connecting pin is not connect with measured device.If Vm3 ≠ second is clamped
Position voltage indicates that A_Force with after A_Sence is connect and C_Force is connect with C_Sence, is connect with measured device.
The voltage Vm2 between voltage Vm1, C_Sence and C_Force between A_Force and A_Sence is measured respectively.
Based on voltage (Vm1, Vm2) and electric current (Is), resistance value Ra_Force, Rc_Force is calculated using Ohm's law.
Resistance value Ra_sence+Ra_Force and resistance value Ra_Force is it is known that resistance value Ra_ can be calculated to obtain as a result,
sence；Similarly, resistance value Rc_sence+Rc_Force and resistance value Rc_Force is it is known that resistance value Rc_ can be calculated to obtain
sence。
In the present embodiment, first, second group of test circuit, which connect circuit with Kelvin, can be integrated in same circuit test plate
On, the switching for connecting circuit with Kelvin by setting one switching circuit, two groups of test circuits of realization connects, to complete split
The test of Er Wen connection circuit.First, second group of test circuit can be two groups of circuits independent of each other；Or share phase
Same coupling part, only by difference part as the two groups of circuits that can be switched over.In subsequent embodiment, using identical switching
Principle realizes the switching of different test circuits.
It is illustrated in figure 4 on second group of test circuit base of first embodiment shown in Fig. 3 and is expanded, using identical original
Reason is tested with measured device for the diode inside three end field-effect tube.Situation shown in Fig. 4 is for two poles drawn a circle
The circuit diagram that pipe is tested.
If Fig. 2, second embodiment shown in fig. 5 are by taking measured device is three end field-effect tube as an example, such as MOS, IGBT etc..
Kelvin's connecting test circuit includes two groups, and first group of test circuit is identical as the prior art as shown in Figure 2, including is connected to
(drain electrode) between D_Force and D_Sence, (source electrode) between G_Force and G_Sence, (grid) S_Force and S_Sence
Between constant current constant-current source Is and voltmeter V.
First group of test circuit detect respectively Kelvin connect between circuit D_Force and D_Sence, G_Force and G_
Connection between Sence, between S_Force and S_Sence.If measuring any group in above-mentioned three groups of voltage=the first
Clamp voltage ', it was demonstrated that the line of the group is not connected；If measuring each group voltage ≠ first clamp voltage in above-mentioned three groups ',
Indicate connection.It calculates separately to obtain resistance value Rd_sence+Rd_Force, resistance value Rg_sence+Rg_Force, resistance value
Rs_sence+Rs_Force, Computing Principle are identical with the first embodiment, and are repeated no more.
Second group of test circuit as shown in figure 5, connection D_Sence and G_Force (or connect D_Sence and G_Sence,
The two is similarly).Constant current constant-current source Is is connected between D_Force and S_Force；Between D_Sence and D_Sence, S_
Voltmeter is all connected between Force and S_Sence, between D_Sence and S_Sence.In circuit, D_Sence and G_ is connected
Force (or connection D_Sence and G_Sence) is for the conducting of three end field-effect tube.
Detect between D_Force and D_Sence respectively, between G_Force and G_Sence, S_Force and S_Sence it
Between connect after, if connect with measured device.Voltage Vm3 between D_Sence and S_Sence is measured, if the voltage Vm3 measured
=the second clamp voltage ', indicate that D_Force connects respectively with D_Sence, G_Force and G_Sence, S_Force and S_Sence
After connecing, some connecting pin is not connect with measured device.If the clamp voltage of voltage Vm3 ≠ second measured ', indicate D_
Between Force and D_Sence, between G_Force and G_Sence, after being separately connected between S_Force and S_Sence, with quilt
Survey device connection.
The voltage Vm2 between voltage Vm1, S_Sence and S_Force between D_Force and D_Sence is measured respectively,
Resistance value Rd_Force and resistance value Rs_Force is calculated.In conjunction with known resistance value Rd_sence+Rd_Force, resistance
Resistance value Rd_Sence and resistance value Rs_sence can be calculated in value Rs_sence+Rs_Force.
3rd embodiment as shown in Figure 6 to 8 is by taking measured device is triode as an example.Kelvin's connecting test circuit packet
Two groups are included, first group of test circuit as shown in FIG. 6 is identical as the prior art as shown in Figure 1.Use the side of test diode
Method tests the pole BE and the pole BC of triode respectively, i.e. (collector) between C_Force and C_Sence, (base stage) B_ in detection Fig. 6
Between Force and B_Sence, the connection of (emitter) between E_Force and E_Sence.In addition, calculating to obtain resistance value
Rc_sence+Rc_Force, resistance value Rb_sence+Rb_Force, resistance value Re_sence+Re_Force, above-mentioned connection feelings
The detection of condition and the calculating of resistance value are identical as the principle of the first, second embodiment, and specific steps repeat no more.
Second group of test circuit is as shown in Figure 7, Figure 8, and Fig. 7 is identical as test philosophy as shown in Figure 3, test b C diode
When, voltage is all connected between C_Force and C_Sence, between B_Force and B_Sence, between C_Sence and B_Sence
Table, and electric current constant-current source Is is connected between C_Force and B_Force.
It is detected between C_Force and C_Sence, after being connected between B_Force and B_Sence respectively, if with tested device
Part connection, and calculate separately to obtain resistance value Rc_Force, resistance value Rb_Force and resistance value Rc_sence, resistance
Value Rb_sence.Specific test philosophy is identical as aforementioned first, second embodiment, repeats no more.
Be illustrated in figure 8 second group of test circuit circuit diagram of test b E diode, test philosophy still with survey shown in Fig. 7
It is identical to try principle.It should be noted that in test b E diode, it is no longer necessary to be connected to base stage B_Force and B_Sence it
Between voltmeter, this is because having calculated resistance value Rb_sence and resistance value Rb_ in test b C diode
Thus Force no longer needs the voltmeter between B_Force and B_Sence to remove test Rb_Force.It can be appreciated that if only surveying
When trying BE diode, then also voltmeter need to be connected between base stage B_Force and B_Sence.
It, can be by the second test of the BE diode of the test triode to triode, BC diode based on 3rd embodiment
Circuit integration is an integrated circuit, can also be split as two sets of test circuits.It can be appreciated that when splitting into two sets of circuits
When, Fig. 7, embodiment shown in Fig. 8 can be used, can also in Fig. 7 omit B_Force and B_Sence between voltmeter, and
Increase the voltmeter between B_Force and B_Sence in Fig. 8.Likewise, realizing the first, second test by a switching circuit
The switching of two sets of circuits in the switching of circuit and the second test circuit.
The foregoing is merely presently preferred embodiments of the present invention, is not intended to limit the invention, it is all in spirit of the invention and
Within principle, any modification, equivalent replacement, improvement and so on be should all be included in the protection scope of the present invention.
Claims (15)
1. a kind of test circuit for connecting circuit based on Kelvin characterized by comprising
The value of the road N leg of circuit, N is corresponding with measured device port number；
Every road leg of circuit is made of two-way sub-circuit, the connecting pin of the two-way sub-circuit respectively with the same port of measured device
Connection, the other end is open end；The open end of the two-way sub-circuit respectively correspond for Kelvin connect circuit driving end and
Sense end；Equivalent resistance on the two-way sub-circuit is respectively to drive end equivalent resistance, sensing end equivalent resistance；
The road N leg of circuit corresponds to the road N Kelvin and connects circuit；
At least an electric current constant-current source, a voltmeter,
So that the electric current constant-current source, voltmeter is connected to the different open ends at least twice, obtain voltage value at least twice,
To detect the connectivity with measured device, and/or calculate the equivalent resistance.
2. test circuit according to claim 1, which is characterized in that measured device is diode, described to make electric current constant current
Source, voltmeter are connected to the different open ends at least twice
One, electric current constant-current source, voltmeter are connected to opening for the leg of circuit two-way sub-circuit connecting with diode anode, cathode
It puts between end；
Two, voltmeter is connected between the open end for the leg of circuit two-way sub-circuit connecting with diode anode, cathode, with
And between the corresponding sensing end of leg of circuit two-way sub-circuit；Electric current constant-current source is connected to the corresponding driving of leg of circuit two-way sub-circuit
Between end.
3. test circuit according to claim 1, which is characterized in that measured device is three end field-effect tube, described to make electricity
Stream constant-current source, voltmeter are connected to the different open ends at least twice and include:
One, electric current constant-current source, voltmeter are connected to the leg of circuit two connecting with three end FET drains, grid, source electrode
Between the open end of way circuit；
Two, voltmeter is connected to the open end for the leg of circuit two-way sub-circuit connecting with three end FET drains, source electrode
Between, and between sensing end corresponding with the two-way leg of circuit that three end FET drains, source electrode connect；Electric current constant-current source connects
Connect three end FET drains, source electrode connection the corresponding driving end of two-way leg of circuit between；
It is connected to sensing end corresponding with the two-way leg of circuit that three end FET drains connect and connects with three end fet gates
The corresponding driving end of the two-way leg of circuit connect.
4. test circuit according to claim 1, which is characterized in that measured device is triode, described to make electric current constant current
Source, voltmeter are connected to the different open ends at least twice
One, electric current constant-current source, voltmeter are connected to the two of the leg of circuit connecting with transistor collector, emitter, base stage
Between the open end of way circuit；
Two, voltmeter is connected between the open end for the leg of circuit two-way sub-circuit connecting with transistor collector, base stage,
And between sensing end corresponding with the two-way leg of circuit that transistor collector, base stage connect；Electric current constant-current source is connected to and three
Between the corresponding driving end of two-way leg of circuit that pole pipe collector, base stage connect.
5. test circuit according to claim 4, which is characterized in that measured device is triode, described to make electric current constant current
Source, voltmeter are connected to the different open ends at least twice further include:
Voltmeter is connected between the open end of two-way sub-circuit for the leg of circuit connecting with transistor emitter, base stage,
And between sensing end corresponding with the two-way leg of circuit that transistor emitter, base stage connect；Electric current constant-current source is connected to and three
Between the corresponding driving end of two-way leg of circuit that pole pipe emitter, base stage connect.
6. test circuit according to claim 1, which is characterized in that measured device is triode, described to make electric current constant current
Source, voltmeter are connected to the different open ends at least twice
One, electric current constant-current source, voltmeter are connected to the two of the leg of circuit connecting with transistor collector, emitter, base stage
Between the open end of way circuit；
Two, voltmeter is connected between the open end for the leg of circuit two-way sub-circuit connecting with transistor emitter, base stage,
And between sensing end corresponding with the two-way leg of circuit that transistor emitter, base stage connect；Electric current constant-current source is connected to and three
Between the corresponding driving end of two-way leg of circuit that pole pipe emitter, base stage connect.
7. test circuit according to claim 6, which is characterized in that measured device is triode, described to make electric current constant current
Source, voltmeter are connected to the different open ends at least twice further include:
Voltmeter is connected between the open end of two-way sub-circuit for the leg of circuit connecting with transistor collector, base stage,
And between sensing end corresponding with the two-way leg of circuit that transistor collector, base stage connect；Electric current constant-current source is connected to and three
Between the corresponding driving end of two-way leg of circuit that pole pipe collector, base stage connect.
8. according to claim 1, any circuit in 2,3,4 or 6, which is characterized in that further include a switching circuit, respectively with
The electric current constant-current source, voltmeter connection, for switching the electric current constant-current source, voltmeter connects at least twice.
9. a kind of test method based on any test circuit of claim 1~8, which is characterized in that comprising steps of
The voltage value that voltmeter First Contact Connections to the open end are obtained compared with preset first clamp voltage, based on than
Relatively result judges whether connect between the connecting pin of every road leg of circuit two-way sub-circuit respectively；
In conjunction with the electric current constant-current source of First Contact Connections to the open end, calculate separately on each road leg of circuit two-way sub-circuit etc.
Imitate the sum of resistance；
Voltmeter is connected to voltage value that the open end obtains for the second time with preset second clamp voltage compared with, be based on than
Relatively result judges whether each road leg of circuit corresponds to and connect with the port of measured device；
It is connected to the open end for the second time in conjunction with electric current constant-current source, calculates separately the equivalent electricity in driving end on each road leg of circuit
Resistance；
Calculate separately the sensing end equivalent resistance on each road leg of circuit.
10. test method according to claim 9, which is characterized in that measured device is diode, comprising steps of
The voltage value that voltmeter First Contact Connections to the open end are obtained compared with preset first clamp voltage, based on than
Whether connected between the connecting pin for the leg of circuit two-way sub-circuit that the judgement of relatively result and diode anode, cathode connect；
In conjunction with the electric current constant-current source of First Contact Connections to the open end, calculates separately and be connected to and diode anode, cathode company
The sum of the equivalent resistance on leg of circuit two-way sub-circuit connect；
Voltmeter is connected to the voltage value and preset second obtained between the corresponding sensing end of each leg of circuit for the second time
Clamp voltage compares, and judges whether each leg of circuit corresponds to based on comparative result and connect with the anode of diode, cathode；
It is connected to for the second time in conjunction with electric current constant-current source between the driving end of each leg of circuit, calculates separately each leg of circuit
Drive end equivalent resistance；
Calculate separately the sensing end equivalent resistance of each leg of circuit.
11. test method according to claim 9, which is characterized in that measured device is three end field-effect tube, including step
It is rapid:
The voltage value that voltmeter First Contact Connections to the open end are obtained compared with preset first clamp voltage, based on than
Relatively result is judged respectively between the connecting pin of the leg of circuit two-way sub-circuit of three end FET drains, grid, source electrode connection
Whether connect；
In conjunction with the electric current constant-current source of First Contact Connections to the open end, calculate separately be connected to three end FET drains,
The sum of the equivalent resistance on leg of circuit two-way sub-circuit that grid, source electrode connect；
It is connected to sensing end corresponding with the two-way leg of circuit that three end FET drains connect and connects with three end fet gates
The corresponding driving end of the two-way leg of circuit connect；Voltmeter is connected to for the second time and is connect with three end FET drains, source electrode
The voltage value obtained between the corresponding sensing end of two-way leg of circuit is sentenced based on comparative result compared with preset second clamp voltage
Whether the road Duan Ge leg of circuit corresponds to connect with the drain electrode of three end field-effect tube, grid, source electrode；
It is connected to drive corresponding with the two-way leg of circuit of three end FET drains, source electrode connection for the second time in conjunction with electric current constant-current source
Between moved end, the driving end equivalent resistance for the two-way leg of circuit connecting with three end FET drains, source electrode is calculated separately；
Calculate separately the sensing end equivalent resistance for the two-way leg of circuit connecting with three end FET drains, source electrode.
12. test method according to claim 9, which is characterized in that measured device is triode, comprising steps of
The voltage value that voltmeter First Contact Connections to the open end are obtained compared with preset first clamp voltage, based on than
Relatively result judges respectively
No connection；
In conjunction with electric current constant-current source First Contact Connections to the open end, calculate separately be connected to transistor collector, emitter,
The sum of equivalent resistance on the leg of circuit two-way sub-circuit of base stage connection；
Voltmeter is connected between sensing end corresponding with the two-way leg of circuit of transistor collector, base stage connection for the second time and is obtained
The voltage value obtained is compared with preset second clamp voltage, and judgement is connect with transistor collector, base stage based on comparative result
Whether two-way leg of circuit corresponds to connect with transistor collector, base stage；
It is connected to driving end corresponding with the two-way leg of circuit of transistor collector, base stage connection for the second time in conjunction with electric current constant-current source
Between, calculate separately the driving end equivalent resistance for the two-way leg of circuit connecting with transistor collector, base stage；
Calculate separately the sensing end equivalent resistance for the two-way leg of circuit connecting with transistor collector, base stage.
13. test method according to claim 12, which is characterized in that further comprise the steps of:
Voltmeter is connected between sensing end corresponding with the two-way leg of circuit of transistor emitter, base stage connection for the second time and is obtained
The voltage value obtained is compared with preset second clamp voltage, and judgement is connect with transistor emitter, base stage based on comparative result
Whether two-way leg of circuit corresponds to connect with transistor emitter, base stage；
It is connected to driving end corresponding with the two-way leg of circuit of transistor emitter, base stage connection for the second time in conjunction with electric current constant-current source
Between, calculate separately the driving end equivalent resistance for the two-way leg of circuit connecting with transistor emitter, base stage；
Calculate separately the sensing end equivalent resistance for the two-way leg of circuit connecting with transistor emitter, base stage.
14. test method according to claim 9, which is characterized in that measured device is triode, comprising steps of
The voltage value that voltmeter First Contact Connections to the open end are obtained compared with preset first clamp voltage, based on than
Relatively result judges respectively
No connection；
In conjunction with electric current constant-current source First Contact Connections to the open end, calculate separately be connected to transistor collector, emitter,
The sum of equivalent resistance on the leg of circuit two-way sub-circuit of base stage connection；
Voltmeter is connected between sensing end corresponding with the two-way leg of circuit of transistor emitter, base stage connection for the second time and is obtained
The voltage value obtained is compared with preset second clamp voltage, and judgement is connect with transistor emitter, base stage based on comparative result
Whether two-way leg of circuit corresponds to connect with transistor emitter, base stage；
It is connected to driving end corresponding with the two-way leg of circuit of transistor emitter, base stage connection for the second time in conjunction with electric current constant-current source
Between, calculate separately the driving end equivalent resistance for the two-way leg of circuit connecting with transistor emitter, base stage；
Calculate separately the sensing end equivalent resistance for the two-way leg of circuit connecting with transistor emitter, base stage.
15. test method according to claim 14, which is characterized in that further comprise the steps of:
Voltmeter is connected between sensing end corresponding with the two-way leg of circuit of transistor collector, base stage connection for the second time and is obtained
The voltage value obtained is compared with preset second clamp voltage, and judgement is connect with transistor collector, base stage based on comparative result
Whether two-way leg of circuit corresponds to connect with transistor collector, base stage；
It is connected to driving end corresponding with the two-way leg of circuit of transistor collector, base stage connection for the second time in conjunction with electric current constant-current source
Between, calculate separately the driving end equivalent resistance for the two-way leg of circuit connecting with transistor collector, base stage；
Calculate separately the sensing end equivalent resistance for the two-way leg of circuit connecting with transistor collector, base stage.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113064041A (en) * | 2019-12-31 | 2021-07-02 | 圣邦微电子（北京）股份有限公司 | Method and device for measuring on-resistance of field effect transistor |
| CN113359008A (en) * | 2021-06-01 | 2021-09-07 | 长鑫存储技术有限公司 | Test protection circuit and control method thereof, test circuit and chip test circuit |
| CN117075003A (en) * | 2023-10-19 | 2023-11-17 | 青岛锐捷智能仪器有限公司 | Four-terminal test line contact detection method and system |
| CN117214649A (en) * | 2023-11-07 | 2023-12-12 | 珠海格力电子元器件有限公司 | Power device testing device and method |
Citations (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006133166A (en) * | 2004-11-09 | 2006-05-25 | Sony Corp | Electronic circuit device, and its measuring device and method |
| JP2008281408A (en) * | 2007-05-10 | 2008-11-20 | Hioki Ee Corp | Device for inspecting circuit board |
| US20080290882A1 (en) * | 2006-05-23 | 2008-11-27 | Integrated Technology Corporation | Probe needle protection method for high current probe testing of power devices |
| CN101713794A (en) * | 2009-10-23 | 2010-05-26 | 广州蓝奇电子实业有限公司 | Method for detecting poor contact of battery voltage testing terminals |
| JP2011085462A (en) * | 2009-10-15 | 2011-04-28 | Hioki Ee Corp | Four-terminal resistance measuring device |
| CN103675459A (en) * | 2013-11-29 | 2014-03-26 | 上海华力微电子有限公司 | Method for measuring conductor resistance in integrated circuit |
| CN104198876A (en) * | 2014-09-17 | 2014-12-10 | 河北工业大学 | Neutral-line disconnection detecting and positioning device and method for low-voltage system |
| CN105445635A (en) * | 2014-07-29 | 2016-03-30 | 华润赛美科微电子(深圳)有限公司 | Metal oxide semiconductor field effect transistor on-resistance measuring method |
| CN106067612A (en) * | 2016-04-21 | 2016-11-02 | 中国北方车辆研究所 | High direct voltage electric connector and connection reliability checking method thereof |
| CN106597247A (en) * | 2016-12-29 | 2017-04-26 | 西北核技术研究所 | Measuring system for volt-ampere characteristic curve of radiation effect semiconductor device based on four-probe method |
| CN107064719A (en) * | 2017-06-02 | 2017-08-18 | 北京华峰测控技术有限公司 | A kind of Kelvin's connecting fault detection circuit and method |
| CN107345996A (en) * | 2017-07-11 | 2017-11-14 | 北京华峰测控技术有限公司 | FET test circuit and method of testing |
| CN206756972U (en) * | 2017-06-02 | 2017-12-15 | 北京华峰测控技术有限公司 | A kind of Kelvin's connecting fault detects circuit |
| CN210038116U (en) * | 2019-05-09 | 2020-02-07 | 华峰测控技术(天津)有限责任公司 | Kelvin connection circuit's test circuit |
-
2019
- 2019-05-09 CN CN201910385889.2A patent/CN110045224B/en active Active
Patent Citations (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006133166A (en) * | 2004-11-09 | 2006-05-25 | Sony Corp | Electronic circuit device, and its measuring device and method |
| US20080290882A1 (en) * | 2006-05-23 | 2008-11-27 | Integrated Technology Corporation | Probe needle protection method for high current probe testing of power devices |
| JP2008281408A (en) * | 2007-05-10 | 2008-11-20 | Hioki Ee Corp | Device for inspecting circuit board |
| JP2011085462A (en) * | 2009-10-15 | 2011-04-28 | Hioki Ee Corp | Four-terminal resistance measuring device |
| CN101713794A (en) * | 2009-10-23 | 2010-05-26 | 广州蓝奇电子实业有限公司 | Method for detecting poor contact of battery voltage testing terminals |
| CN103675459A (en) * | 2013-11-29 | 2014-03-26 | 上海华力微电子有限公司 | Method for measuring conductor resistance in integrated circuit |
| CN105445635A (en) * | 2014-07-29 | 2016-03-30 | 华润赛美科微电子(深圳)有限公司 | Metal oxide semiconductor field effect transistor on-resistance measuring method |
| CN104198876A (en) * | 2014-09-17 | 2014-12-10 | 河北工业大学 | Neutral-line disconnection detecting and positioning device and method for low-voltage system |
| CN106067612A (en) * | 2016-04-21 | 2016-11-02 | 中国北方车辆研究所 | High direct voltage electric connector and connection reliability checking method thereof |
| CN106597247A (en) * | 2016-12-29 | 2017-04-26 | 西北核技术研究所 | Measuring system for volt-ampere characteristic curve of radiation effect semiconductor device based on four-probe method |
| CN107064719A (en) * | 2017-06-02 | 2017-08-18 | 北京华峰测控技术有限公司 | A kind of Kelvin's connecting fault detection circuit and method |
| CN206756972U (en) * | 2017-06-02 | 2017-12-15 | 北京华峰测控技术有限公司 | A kind of Kelvin's connecting fault detects circuit |
| CN107345996A (en) * | 2017-07-11 | 2017-11-14 | 北京华峰测控技术有限公司 | FET test circuit and method of testing |
| CN210038116U (en) * | 2019-05-09 | 2020-02-07 | 华峰测控技术(天津)有限责任公司 | Kelvin connection circuit's test circuit |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113064041A (en) * | 2019-12-31 | 2021-07-02 | 圣邦微电子（北京）股份有限公司 | Method and device for measuring on-resistance of field effect transistor |
| CN113064041B (en) * | 2019-12-31 | 2023-12-15 | 圣邦微电子（北京）股份有限公司 | Method and device for measuring on-resistance of field effect transistor |
| CN113359008A (en) * | 2021-06-01 | 2021-09-07 | 长鑫存储技术有限公司 | Test protection circuit and control method thereof, test circuit and chip test circuit |
| CN117075003A (en) * | 2023-10-19 | 2023-11-17 | 青岛锐捷智能仪器有限公司 | Four-terminal test line contact detection method and system |
| CN117214649A (en) * | 2023-11-07 | 2023-12-12 | 珠海格力电子元器件有限公司 | Power device testing device and method |
| CN117214649B (en) * | 2023-11-07 | 2024-07-02 | 珠海格力电子元器件有限公司 | Power device testing device and method |
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