CN117075003A - Four-terminal test line contact detection method and system - Google Patents
Four-terminal test line contact detection method and system Download PDFInfo
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- CN117075003A CN117075003A CN202311352066.2A CN202311352066A CN117075003A CN 117075003 A CN117075003 A CN 117075003A CN 202311352066 A CN202311352066 A CN 202311352066A CN 117075003 A CN117075003 A CN 117075003A
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- 238000012360 testing method Methods 0.000 title claims abstract description 69
- 238000001514 detection method Methods 0.000 title claims abstract description 35
- 238000012545 processing Methods 0.000 claims abstract description 57
- 238000005070 sampling Methods 0.000 claims description 40
- 230000003321 amplification Effects 0.000 claims description 31
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 31
- 238000000034 method Methods 0.000 abstract description 3
- 238000007689 inspection Methods 0.000 abstract description 2
- 239000003990 capacitor Substances 0.000 description 52
- 238000010586 diagram Methods 0.000 description 4
- 230000000737 periodic effect Effects 0.000 description 4
- 125000004122 cyclic group Chemical group 0.000 description 3
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 2
- 235000008429 bread Nutrition 0.000 description 2
- 230000009977 dual effect Effects 0.000 description 2
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- 229910052744 lithium Inorganic materials 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
- G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances
Abstract
The invention belongs to the technical field of circuit detection, and discloses a four-terminal test line contact detection method and a system, wherein the method comprises the following steps: respectively carrying out voltage acquisition on an anode connecting contact and a cathode connecting contact between the four-terminal testing device and an object to be tested to obtain an anode contact voltage signal and a cathode contact voltage signal; performing signal processing on the positive contact voltage signal and the negative contact voltage signal to obtain corresponding level signals; judging whether the contact is in poor contact or not according to the value corresponding to the level signal; wherein the positive connection contact includes a drive+ contact and a sense+ contact, and the negative connection contact includes a DRIVE-contact and a SENSE-contact. The invention can accurately distinguish the contact condition of the two groups of test lines, judge the specific poor contact line, reduce the line inspection time due to the contact problem and improve the test efficiency.
Description
Technical Field
The invention relates to the technical field of circuit detection, in particular to a four-terminal test line contact detection method and system.
Background
In the alternating current impedance test of the lithium battery, the accuracy requirement on the tester is high because the alternating current internal resistance of the lithium battery is smaller and is usually m omega level. To improve the accuracy of ac impedance testing, most tester products use kelvin four terminal test clips. The four terminals of the four-terminal test clamp are respectively a current output drive+, DRIVE-and a voltage sampling sense+, SENSE-and are used in actual application and normal test. The test clamp is combined with an internal circuit to effectively eliminate the influence of contact resistance and thermoelectric voltage between the test wire and the object to be tested on the test result.
However, in practical applications, the phenomenon that one or more of the four terminals are in poor contact with the object to be tested, so that the test result is wrong often occurs. In order to determine whether it is an analyte problem or a contact problem, the test instrument must have a test line contact detection function. The existing method is that signals collected by sense+ and SENSE-terminals are sent to a comparator, then the result of the comparator is sent to a single chip microcomputer, when external contact is bad, the amplitude of the signals collected by the two terminals is changed, so that the output result of the comparator is changed, when the single chip microcomputer detects the change of the level of the output end of the comparator, the contact is judged to be bad, but the method is an integral detection during detection, and can not distinguish which group of test lines are bad, so that once the problem occurs during field use, the detection is very complicated.
Disclosure of Invention
The embodiment of the invention provides a four-terminal test line contact detection method and a system, which are used for solving the problem that a specific line with poor contact in the four-terminal test cannot be accurately judged in the prior art.
The following presents a simplified summary in order to provide a basic understanding of some aspects of the disclosed embodiments. This summary is not an extensive overview and is intended to neither identify key/critical elements nor delineate the scope of such embodiments. Its sole purpose is to present some concepts in a simplified form as a prelude to the more detailed description that is presented later.
According to a first aspect of an embodiment of the present invention, a four-terminal test line contact detection method is provided.
In one embodiment, the four-terminal test line contact detection method includes:
respectively carrying out voltage acquisition on an anode connecting contact and a cathode connecting contact between the four-terminal testing device and an object to be tested to obtain an anode contact voltage signal and a cathode contact voltage signal;
performing signal processing on the positive contact voltage signal and the negative contact voltage signal to obtain corresponding level signals; judging whether the contact is in poor contact or not according to the value corresponding to the level signal;
Wherein the positive connection contact includes a drive+ contact and a sense+ contact, and the negative connection contact includes a DRIVE-contact and a SENSE-contact.
In one embodiment, voltage acquisition is performed on a positive connection contact between the four-terminal test device and the object to be tested, and obtaining a positive contact voltage signal includes: respectively carrying out voltage acquisition on the DRIVE+ contact and the SENSE+ contact to obtain two paths of voltage acquisition signals; and carrying out differential amplification processing on the two paths of voltage acquisition signals to obtain a positive contact voltage signal.
In one embodiment, voltage acquisition is performed on a negative electrode connection contact between a four-terminal test device and an object to be tested, and obtaining a negative electrode contact voltage signal includes: respectively carrying out voltage acquisition on the DRIVE-contact and the SENSE-contact to obtain two paths of voltage acquisition signals; and carrying out differential amplification processing on the two paths of voltage acquisition signals to obtain a negative electrode contact voltage signal.
In one embodiment, the four-terminal test line contact detection method further includes: performing signal inversion processing on the positive contact voltage signal and the negative contact voltage signal to obtain corresponding inversion voltage signals; and periodically sampling based on the positive contact voltage signal and the corresponding reverse phase voltage signal, the negative contact voltage signal and the corresponding reverse phase voltage signal to obtain a final positive contact voltage output signal and a final negative contact voltage output signal.
In one embodiment, performing signal processing on the positive contact voltage signal and the negative contact voltage signal to obtain corresponding level signals includes: and respectively carrying out signal amplification processing on the positive contact voltage output signal and the negative contact voltage output signal to obtain corresponding amplified signals, and carrying out comparator processing on the obtained amplified signals to obtain corresponding level signals.
According to a second aspect of embodiments of the present invention, a four-terminal test line contact detection system is provided.
In one embodiment, the four-terminal test line contact detection system comprises:
the signal acquisition module is used for respectively carrying out voltage acquisition on an anode connection contact and a cathode connection contact between the four-terminal testing device and an object to be tested to obtain an anode contact voltage signal and a cathode contact voltage signal, wherein the anode connection contact comprises a drive+ contact and a sense+ contact, and the cathode connection contact comprises a DRIVE-contact and a SENSE-contact;
the signal processing module is used for performing signal processing on the positive contact voltage signal and the negative contact voltage signal to obtain corresponding level signals;
and the signal judging module is used for judging whether the contact is in poor contact or not according to the value corresponding to the level signal.
In one embodiment, the signal acquisition module comprises a first sampling module, wherein the first sampling module is used for acquiring voltage of an anode connecting contact between the four-terminal testing device and an object to be tested to obtain an anode contact voltage signal;
when the first sampling module acquires voltage of a positive electrode connecting contact between the four-terminal testing device and an object to be tested to obtain a positive electrode contact voltage signal, the first sampling module acquires voltage of the drive+ contact and the sense+ contact respectively to obtain two paths of voltage acquisition signals; and differential amplification processing is carried out on the two paths of voltage acquisition signals to obtain a positive contact voltage signal.
In one embodiment, the signal acquisition module comprises a second sampling module, and the second sampling module is used for carrying out voltage acquisition on a negative electrode connection contact between the four-terminal testing device and the object to be tested to obtain a negative electrode contact voltage signal;
when the second sampling module acquires voltage of a negative electrode connecting contact between the four-terminal testing device and an object to be tested to obtain a negative electrode contact voltage signal, the second sampling module acquires voltage of the DRIVE-contact and the SENSE-contact respectively to obtain two paths of voltage acquisition signals; and differential amplification processing is carried out on the two paths of voltage acquisition signals to obtain a negative electrode contact voltage signal.
In one embodiment, the four-terminal test line contact detection system further comprises:
the signal inversion processing module is used for performing signal inversion processing on the positive contact voltage signal and the negative contact voltage signal to obtain corresponding inversion voltage signals;
the signal period acquisition module is used for periodically sampling based on the positive contact voltage signal and the corresponding reverse phase voltage signal, the negative contact voltage signal and the corresponding reverse phase voltage signal to obtain a final positive contact voltage output signal and a final negative contact voltage output signal.
In one embodiment, the signal processing module comprises a signal amplification module and a signal comparison module, wherein,
the signal amplifying module is used for respectively amplifying the positive contact voltage output signal and the negative contact voltage output signal to obtain corresponding amplified signals;
and the signal comparison module is used for carrying out comparator processing on the obtained amplified signal to obtain a corresponding level signal.
The technical scheme provided by the embodiment of the invention can have the following beneficial effects:
the invention can detect the DRIVE+, SENSE+ and the DRIVE-, SENSE simultaneously, accurately distinguish the respective contact condition of the two groups of test lines, judge the line with poor contact, reduce the line inspection time due to the contact problem and improve the test efficiency.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the invention as claimed.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and together with the description, serve to explain the principles of the invention.
FIG. 1 is a flow chart of a four terminal test line contact detection method according to an exemplary embodiment;
FIG. 2 is a block diagram of a four terminal test line contact detection system, according to an exemplary embodiment;
FIG. 3 is a circuit diagram of a first sampling module and a corresponding signal inversion processing module, shown according to an example embodiment;
FIG. 4 is a circuit diagram of a second sampling module and corresponding signal inversion processing module, shown according to an example embodiment;
fig. 5 is a circuit diagram illustrating a signal period acquisition module with a signal amplification module and a signal comparison module according to an example embodiment.
Detailed Description
The following description and the drawings sufficiently illustrate specific embodiments herein to enable those skilled in the art to practice them. Portions and features of some embodiments may be included in, or substituted for, those of others. The scope of the embodiments herein includes the full scope of the claims, as well as all available equivalents of the claims. The terms "first," "second," and the like herein are used merely to distinguish one element from another element and do not require or imply any actual relationship or order between the elements. Indeed the first element could also be termed a second element and vice versa. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a structure, apparatus, or device that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such structure, apparatus, or device. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a structure, apparatus or device comprising the element. Various embodiments are described herein in a progressive manner, each embodiment focusing on differences from other embodiments, and identical and similar parts between the various embodiments are sufficient to be seen with each other.
The terms "longitudinal," "transverse," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like herein refer to an orientation or positional relationship based on that shown in the drawings, merely for ease of description herein and to simplify the description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operate in a particular orientation, and thus are not to be construed as limiting the invention. In the description herein, unless otherwise specified and limited, the terms "mounted," "connected," and "coupled" are to be construed broadly, and may be, for example, mechanically or electrically coupled, may be in communication with each other within two elements, may be directly coupled, or may be indirectly coupled through an intermediary, as would be apparent to one of ordinary skill in the art.
Herein, unless otherwise indicated, the term "plurality" means two or more.
Herein, the character "/" indicates that the front and rear objects are an or relationship. For example, A/B represents: a or B.
Herein, the term "and/or" is an association relation describing an object, meaning that three relations may exist. For example, a and/or B, represent: a or B, or, A and B.
It should be understood that, although the steps in the flowchart are shown in sequence as indicated by the arrows, the steps are not necessarily performed in sequence as indicated by the arrows. The steps are not strictly limited to the order of execution unless explicitly recited herein, and the steps may be executed in other orders. Moreover, at least some of the steps in the figures may include multiple sub-steps or stages that are not necessarily performed at the same time, but may be performed at different times, nor does the order in which the sub-steps or stages are performed necessarily performed in sequence, but may be performed alternately or alternately with at least a portion of other steps or other steps.
The various modules in the apparatus or system of the present application may be implemented in whole or in part in software, hardware, and combinations thereof. The above modules may be embedded in hardware or may be independent of a processor in the computer device, or may be stored in software in a memory in the computer device, so that the processor may call and execute operations corresponding to the above modules.
Embodiments of the invention and features of the embodiments may be combined with each other without conflict.
Fig. 1 shows an embodiment of a four terminal test line contact detection method of the present invention.
In this alternative embodiment, the four-terminal test line contact detection method includes:
step S101, respectively carrying out voltage acquisition on an anode connecting contact and a cathode connecting contact between a four-terminal testing device and an object to be tested to obtain an anode contact voltage signal and a cathode contact voltage signal, wherein the anode connecting contact comprises a DRIVE+ contact and a SENSE+ contact, and the cathode connecting contact comprises a DRIVE-contact and a SENSE-contact;
step S103, performing signal processing on the positive contact voltage signal and the negative contact voltage signal to obtain corresponding level signals;
step S105, judging whether the contact is in poor contact or not according to the value corresponding to the level signal.
In the alternative embodiment, when the voltage acquisition is performed on the positive electrode connection contact between the four-terminal testing device and the object to be tested to obtain a positive electrode contact voltage signal, the voltage acquisition can be performed on the drive+ contact and the sense+ contact respectively to obtain two paths of voltage acquisition signals; and performing differential amplification processing on the two paths of voltage acquisition signals to obtain a positive contact voltage signal. In addition, signal inversion processing can be performed on the positive contact voltage signal to obtain a corresponding inversion voltage signal; after the phase inversion, the two paths of signals can be sampled periodically and alternately, and a steamed bread wave similar to the full wave rectification effect can be obtained so as to carry out signal processing subsequently.
In the alternative embodiment, when the voltage acquisition is performed on the negative electrode connection contact between the four-terminal testing device and the object to be tested to obtain a negative electrode contact voltage signal, the voltage acquisition can be performed on the DRIVE-contact and the SENSE-contact respectively to obtain two paths of voltage acquisition signals; and performing differential amplification processing on the two paths of voltage acquisition signals to obtain a negative contact voltage signal. Similarly, the negative contact voltage signal can be subjected to signal inversion processing to obtain a corresponding inversion voltage signal; after the phase inversion, the two paths of signals can be sampled periodically and alternately, and a steamed bread wave similar to the full wave rectification effect can be obtained so as to carry out signal processing subsequently.
In this alternative embodiment, the periodic alternating sampling is based on the positive contact voltage signal and the corresponding reverse voltage signal, and the negative contact voltage signal and the corresponding reverse voltage signal, so as to obtain a final positive contact voltage output signal and a final negative contact voltage output signal. After periodic alternating sampling, the positive contact voltage output signal and the negative contact voltage output signal are respectively subjected to signal amplification processing to obtain corresponding amplified signals, and the obtained amplified signals are subjected to comparator processing to obtain corresponding level signals.
Fig. 2 illustrates one embodiment of a four terminal test line contact detection system of the present invention.
In this alternative embodiment, the four-terminal test line contact detection system includes:
the signal acquisition module 201 is configured to acquire voltages of an anode connection contact and a cathode connection contact between the four-terminal test device and an object to be tested, so as to obtain an anode contact voltage signal and a cathode contact voltage signal, where the anode connection contact includes a drive+ contact and a sense+ contact, and the cathode connection contact includes a DRIVE-contact and a SENSE-contact;
the signal processing module 203 is configured to perform signal processing on the positive contact voltage signal and the negative contact voltage signal to obtain corresponding level signals;
and the signal judging module 205 is configured to judge whether the contact is in poor contact according to a value corresponding to the level signal.
In this alternative embodiment, the signal acquisition module 201 includes a first sampling module, where the first sampling module is configured to perform voltage acquisition on an anode connection contact between the four-terminal testing device and the object to be tested, so as to obtain an anode contact voltage signal; when the first sampling module acquires voltage of a positive electrode connecting contact between the four-terminal testing device and an object to be tested to obtain a positive electrode contact voltage signal, the first sampling module acquires voltage of the drive+ contact and the sense+ contact respectively to obtain two paths of voltage acquisition signals; differential amplification processing is carried out on the two paths of voltage acquisition signals to obtain a positive contact voltage signal; and the corresponding signal inversion processing module is used for performing signal inversion processing on the positive contact voltage signal to obtain a corresponding inversion voltage signal.
In this alternative embodiment, the signal acquisition module 201 includes a second sampling module, where the second sampling module is configured to perform voltage acquisition on a negative electrode connection contact between the four-terminal testing device and the object to be tested, so as to obtain a negative electrode contact voltage signal; when the second sampling module acquires voltage of a negative electrode connecting contact between the four-terminal testing device and an object to be tested to obtain a negative electrode contact voltage signal, the second sampling module acquires voltage of the DRIVE-contact and the SENSE-contact respectively to obtain two paths of voltage acquisition signals; and differential amplification processing is carried out on the two paths of voltage acquisition signals to obtain a negative electrode contact voltage signal. And the corresponding signal inversion processing module is used for performing signal inversion processing on the negative contact voltage signal to obtain a corresponding inversion voltage signal.
In this alternative embodiment, the periodic sampling includes a signal period collecting module, where the signal period collecting module is configured to periodically sample based on the positive contact voltage signal and the corresponding reverse voltage signal, and the negative contact voltage signal and the corresponding reverse voltage signal, to obtain a final positive contact voltage output signal and a final negative contact voltage output signal.
In this optional embodiment, the signal processing module includes a signal amplifying module and a signal comparing module, where the signal amplifying module is configured to amplify the positive contact voltage output signal and the negative contact voltage output signal respectively to obtain corresponding amplified signals; and the signal comparison module is used for carrying out comparator processing on the obtained amplified signal to obtain a corresponding level signal.
In order to facilitate understanding of the above technical solutions of the present invention, the following further describes the above technical solutions of the present invention based on specific circuits of the first sampling module, the second sampling module, the signal inversion processing module, the signal period acquisition module, the signal amplification module, and the signal comparison module.
As shown in fig. 3, in practical application, the first sampling module and the corresponding signal inversion processing module may actually be formed by a first differential amplifying circuit and a first inverting circuit, where the first differential amplifying circuit includes a first differential circuit, a second differential circuit and a first amplifying circuit.
The first differential circuit comprises a first operational amplifier IC1A, wherein the non-inverting input end of the first operational amplifier IC1A is connected with a first resistor R1, the other end of the first resistor R1 is connected with a sense+ contact, a first capacitor C1 and a second capacitor C2 are connected in parallel between the first resistor R1 and the sense+ contact, a second resistor R2 is connected between the first resistor R1 and the first capacitor C1 and the second capacitor C2 which are connected in parallel, in addition, a first diode group D1 is connected between the first resistor R1 and the non-inverting input end of the first operational amplifier IC1A, the first diode group D1 is formed by two diodes which are connected in parallel, and the other end of the first diode group D1 is grounded; the inverting input of the first operational amplifier IC1A is connected with the output end of the first operational amplifier IC1A, and a third resistor R3 and a third capacitor C3 are connected in parallel between the inverting input end of the first operational amplifier IC1A and the output end of the first operational amplifier IC 1A; the output end of the first operational amplifier IC1A is also connected with a fourth resistor R4, and the other end of the fourth resistor R4 is connected with the first amplifying circuit.
The second differential circuit comprises a second operational amplifier IC1B, wherein the non-inverting input end of the second operational amplifier IC1B is connected with a fifth resistor R5, the other end of the fifth resistor R5 is connected with a DRIVE+ contact, a fourth capacitor C4 and a fifth capacitor C5 are connected in parallel between the fifth resistor R5 and the DRIVE+ contact, and a sixth resistor R6 is also connected between the fifth resistor R5 and the fourth capacitor C4 and the fifth capacitor C5 which are connected in parallel; in addition, a second diode group D2 is connected between the fifth resistor R5 and the non-inverting input terminal of the second operational amplifier IC1B, the second diode group D2 is composed of two diodes connected in parallel, and the other end of the second diode group D2 is grounded; the inverting input of the second operational amplifier IC1B is connected with the output end of the second operational amplifier IC1B, and a seventh resistor R7 and a sixth capacitor C6 are connected in parallel between the inverting input end of the second operational amplifier IC1B and the output end of the second operational amplifier IC 1B; the output end of the second operational amplifier IC1B is also connected with an eighth resistor R8, and the other end of the eighth resistor R8 is connected with the first amplifying circuit; in addition, the inverting input of the second operational amplifier IC1B is further connected to a ninth resistor R9, the other end of the eighth resistor R8 is connected to a tenth resistor R10, the other end of the tenth resistor R10 is connected in parallel to a seventh capacitor C7 and an eighth capacitor C8, and the other ends of the seventh capacitor C7 and the eighth capacitor C8 which are connected in parallel are connected to the inverting input of the first operational amplifier IC 1A.
The first amplifying circuit comprises a third operational amplifier IC2A, wherein the non-inverting input end of the third operational amplifier IC2A is connected with the eighth resistor R8, and an eleventh resistor R11, a ninth capacitor C9 and a tenth capacitor C10 which are connected in parallel are connected between the non-inverting input end of the third operational amplifier IC2A and the eighth resistor R8; the inverting input end of the third operational amplifier IC2A is connected with the fourth resistor R4, the inverting input end of the third operational amplifier IC2A is connected with the output end of the third operational amplifier IC2A, and the output end of the third operational amplifier IC2A outputs the positive contact voltage signal V3; in addition, a twelfth resistor R12, an eleventh capacitor C11, and a twelfth capacitor C12 connected in parallel are further connected between the output terminal of the third operational amplifier IC2A and the inverting input terminal of the third operational amplifier IC 2A.
The first inverting circuit includes a fourth operational amplifier IC2B, the non-inverting input terminal of the fourth operational amplifier IC2B is grounded, the inverting input terminal of the fourth operational amplifier IC2B is connected with a thirteenth resistor R13, the other end of the thirteenth resistor R13 is connected with the output terminal of the third operational amplifier IC2A, the inverting input terminal of the fourth operational amplifier IC2B is connected with the output terminal of the fourth operational amplifier IC2B, the output terminal of the fourth operational amplifier IC2B outputs a positive contact voltage output signal V4, and a fourteenth resistor R14 is connected between the inverting input terminal of the fourth operational amplifier IC2B and the output terminal of the fourth operational amplifier IC 2B.
When the voltage detection device is used, the drive+ is an excitation line for outputting current to an object to be detected, the sense+ is a voltage detection positive end of the object to be detected, and the two normal states are approximate short-circuit states. The two signals are sampled and subjected to differential amplification to obtain an output signal V3, and the output signal V3 is inverted to obtain a signal V4 with the same amplitude and opposite phase. Thus V3 and V4 are integer multiples of the difference between DRIVE+ and SENSE+.
In fig. 3, the first differential circuit and the second differential circuit are two single paths of dual operational amplifier chips, the input voltage of the second operational amplifier IC1B is X, the output voltage is U1, the input voltage of the first operational amplifier IC1A is Y, the output voltage is U2, and when the seventh resistor R7 is equal to the third resistor R3, the differential amplifying circuits are formed by combining the two single paths of operational amplifier circuits, and when the seventh resistor R7 is equal to the third resistor R3, the amplifying relationship is U1-u2= (X-Y) (r9+r10+2r7)/(r7r9+r7r10), and the appropriate amplification factor can be obtained by only adjusting the 7 th resistor R7, the 9 th resistor R9, and the tenth resistor R10.
The third operational amplifier IC2A is one of the two operational amplifiers IC2, the U1 and the U2 are differentially amplified by the third operational amplifier IC2A to obtain an output signal V3, meanwhile, V3 enters the fourth operational amplifier IC2B, the fourth operational amplifier IC2B is one of the two operational amplifier chips IC2, and is used as reverse amplification at the moment, the amplification coefficient is-R14/R13, and when the fourteenth resistor R14 is equal to the thirteenth resistor R13, a signal V4 with the same amplitude and opposite phase to the V3 can be obtained. Note that when the clip contacts well, U1-u2=0, because x=y at this time, results in v3=v4=0.
As shown in fig. 4, in practical application, the second sampling module and the corresponding signal inverting processing module may actually be formed by a second differential amplifying circuit and a second inverting circuit, where the second differential amplifying circuit includes a third differential circuit, a fourth differential circuit and a second amplifying circuit.
The third differential circuit comprises a fifth operational amplifier IC3A, wherein the non-inverting input end of the fifth operational amplifier IC3A is connected with a fifteenth resistor R15, the other end of the fifteenth resistor R15 is connected with a SENSE-contact, a thirteenth capacitor C13 is connected between the fifteenth resistor R15 and the SENSE-contact, a sixteenth resistor R16 is connected between the thirteenth capacitor C13 and the fifteenth resistor R15, and the other end of the sixteenth resistor R16 is grounded; a third diode group D3 connected between the fifteenth resistor R15 and the non-inverting input terminal of the fifth operational amplifier IC3A, the third diode group D3 being composed of two diodes connected in parallel, and the other end of the third diode group D3 being grounded; an inverting input of the fifth operational amplifier IC3A is connected with an output end of the fifth operational amplifier IC3A, and a seventeenth resistor R17 and a fourteenth capacitor C14 are connected in parallel between the inverting input end of the fifth operational amplifier IC3A and the output end of the fifth operational amplifier IC 3A; the output end of the fifth operational amplifier IC3A is also connected with an eighteenth resistor R18, and the other end of the eighteenth resistor R18 is connected with a second amplifying circuit.
The fourth differential circuit comprises a sixth operational amplifier IC3B, wherein the non-inverting input end of the sixth operational amplifier IC3B is connected with a nineteenth resistor R19, the other end of the nineteenth resistor R19 is connected with a fifteenth capacitor C15, the other end of the fifteenth capacitor C15 is connected with a DRIVE-contact, a twentieth resistor R20 is connected between the fifteenth capacitor C15 and the nineteenth resistor R19, and the other end of the twentieth resistor R20 is grounded; in addition, a fourth diode group D4 is connected between the nineteenth resistor R19 and the non-inverting input terminal of the sixth operational amplifier IC3B, the fourth diode group D4 is composed of two diodes connected in parallel, and the other end of the fourth diode group D4 is grounded; an inverting input end of the sixth operational amplifier IC3B is connected with an output end of the sixth operational amplifier IC3B, and a twenty-first resistor R21 and a sixteenth capacitor C16 which are connected in parallel are connected between the inverting input end of the sixth operational amplifier IC3B and the output end of the sixth operational amplifier IC 3B; the output end of the sixth operational amplifier IC3B is connected with a twenty-second resistor R22, and the other end of the twenty-second resistor R22 is connected with a second amplifying circuit; the inverting input terminal of the sixth operational amplifier IC3B is further connected with a twenty-third resistor R23, the other end of the twenty-third resistor R23 is connected with the inverting input terminal of the fifth operational amplifier IC3A, and a seventeenth capacitor C17 and an eighteenth capacitor C18 which are connected in parallel are connected between the twenty-third resistor R23 and the inverting input terminal of the fifth operational amplifier IC 3A.
The second amplifying circuit comprises a seventh operational amplifier IC4A, wherein the non-inverting input end of the seventh operational amplifier IC4A is connected with the twenty-second resistor R22, a twenty-fourth resistor R24 and a nineteenth capacitor C19 are also tapped between the seventh operational amplifier IC4A and the twenty-second resistor R22, and the twenty-fourth resistor R24 and the nineteenth capacitor C19 are both grounded; an inverting input terminal of the seventh operational amplifier IC4A is connected to the eighteenth resistor R18, and an inverting input terminal of the seventh operational amplifier IC4A is connected to an output terminal of the seventh operational amplifier IC4A, and an output terminal of the seventh operational amplifier IC4A outputs the negative contact voltage signal V1; a twentieth capacitor C20 and a twenty-fifth resistor R25 connected in parallel are connected between the inverting input terminal of the seventh operational amplifier IC4A and the output terminal of the seventh operational amplifier IC 4A.
The second inverting circuit includes an eighth operational amplifier IC4B, a non-inverting input terminal of the eighth operational amplifier IC4B is grounded, an inverting input terminal of the eighth operational amplifier IC4B is connected to a twenty-sixth resistor R26, the twenty-sixth resistor R26 is connected to an output terminal of the seventh operational amplifier IC4A, an inverting input terminal of the eighth operational amplifier IC4B is connected to an output terminal of the eighth operational amplifier IC4B, and a twenty-seventh resistor R27 is connected between the inverting input terminal of the eighth operational amplifier IC4B and the output terminal of the eighth operational amplifier IC4B, and an output terminal of the eighth operational amplifier IC4B outputs a negative contact voltage output signal V2.
When in use, the DRIVE-is a return line after current excitation passes through the object to be detected, and the SENSE-is a negative end of the voltage sampling of the object to be detected, and the DRIVE-and the SENSE-are in approximate short circuit state in normal contact.
In fig. 4, the fifth operational amplifier IC3A and the sixth operational amplifier IC3B are dual operational amplifier chips to obtain two single paths, and the fifth operational amplifier IC3A is provided with the input voltage X, the output voltage U1, and the input voltage Y of the sixth operational amplifier IC3B, and the output voltage U2, and the two single paths are combined into a differential amplifier circuit, when the twenty-first resistor R21 is equal to the seventeenth resistor R17, the amplification relationship is U1-u2= (X-Y) (2R 21-R23)/R23, and at this time, the amplification factor can be obtained by adjusting the twenty-first resistor R21 and the twenty-third resistor R23.
The seventh operational amplifier IC4A is one of the two operational amplifier ICs 4, and after differential amplification by the seventh operational amplifier IC4A, the U1 and U2 obtain an output signal V1, and at the same time, V1 enters the eighth operational amplifier IC4B, where the eighth operational amplifier IC4B is one of the two operational amplifier chips IC4, and at this time, as the reverse amplification, the amplification coefficient is-R26/R27, and when the twenty-seventh resistor R27 is equal to the twenty-sixth resistor R26, a signal V2 with the same amplitude and opposite phase to V1 can be obtained. Note that when the clip contacts well, U1-u2=0, because x=y at this time, results in v1=v2=0.
As shown in fig. 5, in practical application, the signal period acquisition module includes a signal period acquisition circuit, the signal amplification module includes a third amplification circuit and a fourth amplification circuit, and the signal comparison module includes a first signal comparison circuit and a second signal comparison circuit.
The signal period acquisition circuit comprises a control chip IC3, wherein the control chip IC3 is connected with a control signal input end ARM-control S2, a control signal input end ARM-control S3, a negative electrode contact voltage signal V1, a negative electrode contact voltage output signal V2, a positive electrode contact voltage signal V3 and a positive electrode contact voltage output signal V4; the VEE pin and the VCC pin of the control chip IC3 are respectively connected with a twenty-first capacitor C21 and a twenty-second capacitor C22, and the twenty-first capacitor C21 and the twenty-second capacitor C22 are grounded; a twenty-eighth resistor R28, a twenty-ninth resistor R29 and a thirty-eighth resistor R30 are sequentially connected to a 15 pin of the control chip IC 3; a twenty-third capacitor C23 is connected between the twenty-eighth resistor R28 and the twenty-ninth resistor R29, a twenty-fourth capacitor C24 is connected between the twenty-ninth resistor R29 and the thirty-fourth resistor R30, and a twenty-fifth capacitor C25 is connected between the thirty-third resistor R30 and the third amplifying circuit; the 4 th pin of the control chip IC3 is sequentially connected with a thirty-first resistor R31, a thirty-second resistor R32, and a thirty-third resistor R33, a twenty-sixth capacitor C26 is connected between the thirty-first resistor R31 and the thirty-second resistor R32, a twenty-seventh capacitor C27 is connected between the thirty-second resistor R32 and the thirty-third resistor R33, and a twenty-eighth capacitor C28 is connected between the thirty-third resistor R33 and the fourth amplifying circuit.
The signal period acquisition circuit further comprises a control signal input end ARM-11/PF1 and a control signal input end ARM-13/PF3, wherein the control signal input end ARM-11/PF1 is connected with a G end of a first triode Q1, an S end of the first triode Q1 is grounded, a D end of the first triode Q1 is connected with a thirty-fourth resistor R34 and a thirty-fifth resistor R35 which are connected in parallel, and the other ends of the thirty-fourth resistor R34 and the thirty-fifth resistor R35 which are connected in parallel are connected with the third amplifying circuit; the control signal input end ARM-11/PF1 is also connected with the G end of a second triode Q2, the S end of the second triode Q2 is grounded, and the D end of the second triode Q2 is connected with a thirty-sixth resistor R36 and a thirty-seventh resistor R37 which are connected in parallel; the other ends of the thirty-sixth resistor R36 and the thirty-seventh resistor R37 which are connected in parallel are connected with the fourth amplifying circuit; and a thirty-eighth resistor R38 is further connected between the control signal input end ARM-11/PF1 and the second triode Q2.
The control signal input end ARM-13/PF3 is connected with the G end of a third triode Q3, the S end of the third triode Q3 is grounded, the D end of the third triode Q3 is connected with a thirty-ninth resistor R39 and a fortieth resistor R40 which are connected in parallel, and the other ends of the thirty-ninth resistor R39 and the fortieth resistor R40 which are connected in parallel are connected with the third amplifying circuit; the control signal input end ARM-13/PF3 is also connected with the G end of a fourth triode Q4, the S end of the fourth triode Q4 is grounded, and the D end of the fourth triode Q4 is connected with a forty-first resistor R41 and a forty-second resistor R42 which are connected in parallel; the other ends of the forty-first resistor R41 and the forty-second resistor R42 which are connected in parallel are connected with the fourth amplifying circuit, and a forty-third resistor R43 is also connected between the control signal input end ARM-13/PF3 and the fourth triode Q4.
The third amplifying circuit comprises a ninth operational amplifier IC5A, wherein the non-inverting input end of the ninth operational amplifier IC5A is connected with a thirty-fourth resistor R30, and the inverting input end of the ninth operational amplifier IC5A is connected with one ends of a thirty-fourth resistor R34 and a thirty-fifth resistor R35 which are connected in parallel; a forty-fourth resistor R44 is further connected between the ninth operational amplifier IC5A and the thirty-fourth resistor R34 and the thirty-fifth resistor R35 which are connected in parallel, and the other end of the forty-fourth resistor R44 is grounded; an inverting input end of the ninth operational amplifier IC5A is connected with an output end of the ninth operational amplifier IC5A, and a forty-fifth resistor R45 and a twenty-ninth capacitor C29 which are connected in parallel are connected between the inverting input end of the ninth operational amplifier IC5A and the output end of the ninth operational amplifier IC 5A; and the output end of the ninth operational amplifier IC5A is connected with the first signal comparison circuit.
The fourth amplifying circuit comprises a tenth operational amplifier IC5B, wherein the non-inverting input end of the ninth operational amplifier IC5A is connected with a thirty-third resistor R33, and the inverting input end of the ninth operational amplifier IC5A is connected with one ends of a thirty-sixth resistor R36 and a thirty-seventh resistor R37 which are connected in parallel; a forty-sixth resistor R46 is further connected between the ninth operational amplifier IC5A and the thirty-sixth resistor R36 and the thirty-seventh resistor R37 which are connected in parallel, and the other end of the forty-sixth resistor R46 is grounded; an inverting input end of the tenth operational amplifier IC5B is connected with an output end of the tenth operational amplifier IC5B, and a forty-seventh resistor R47 and a thirty-seventh capacitor C30 which are connected in parallel are connected between the inverting input end of the tenth operational amplifier IC5B and the output end of the tenth operational amplifier IC 5B; and the output end of the tenth operational amplifier IC5B is connected with the second signal comparison circuit.
The first signal comparison circuit comprises an eleventh operational amplifier IC6A, wherein the non-inverting input end of the eleventh operational amplifier IC6A is connected with a forty-eighth resistor R48 and a forty-ninth resistor R49 which are connected in parallel and a fifty-first resistor R50 and a fifty-first resistor R51 which are connected in parallel, the other ends of the fifty-first resistor R50 and the fifty-first resistor R51 which are connected in parallel are also connected with a thirty-first capacitor C31, the other end of the thirty-first capacitor C31 is connected with a fifty-second resistor R52, and the other end of the fifty-second resistor R52 is connected with the output end of the eleventh operational amplifier IC 6A; the inverting input terminal of the eleventh operational amplifier IC6A is connected to the output terminal of the ninth operational amplifier IC5A, the output terminal of the eleventh operational amplifier IC6A is further connected to a fifty-third resistor R53, the other end of the fifty-third resistor R53 is connected to VCC, and the output terminal of the eleventh operational amplifier IC6A outputs the positive level signal V5.
The second signal comparison circuit comprises a twelfth operational amplifier IC6B, wherein the non-inverting input end of the twelfth operational amplifier IC6B is connected with a fifty-fourth resistor R54 and a fifty-fifth resistor R55 which are connected in parallel and a fifty-sixth resistor R56 and a fifty-seventh resistor R57 which are connected in parallel, the other ends of the fifty-sixth resistor R56 and the fifty-seventh resistor R57 which are connected in parallel are also connected with a thirty-second capacitor C32, the other end of the thirty-second capacitor C32 is connected with a fifty-eighth resistor R58, and the other end of the fifty-eighth resistor R58 is connected with the output end of the twelfth operational amplifier IC 6B; the inverting input terminal of the twelfth operational amplifier IC6B is connected to the output terminal of the tenth operational amplifier IC5B, the output terminal of the twelfth operational amplifier IC6B is further connected to a fifty-ninth resistor R59, the other end of the fifty-ninth resistor R59 is connected to VCC, and the output terminal of the twelfth operational amplifier IC6B outputs a negative level signal V6.
When the signal processing circuit is used, after the control chip IC3 (MC 74HC 4053) receives output signals V1, V2, V3 and V4, the output signals 15 foot 2Z corresponding to the V3 and V4 and the output signal 4 foot 3Z corresponding to the V1 and V2 are respectively input into two paths of signal processing circuits with the same structure through the switching of the control signals ARM-Contral S2 and ARM-Contral S3 and the periodic sampling of the V1, V2, V3 and V4. One path is amplified by the same phase of the ninth operational amplifier IC5A and then by the comparator of the eleventh operational amplifier IC6A, so that the corresponding level of different contact states can be obtained. The other way is the same.
In fig. 5, the input signals are signals V4, V3, V2, V5 corresponding to 1, 2, 3, 5, respectively, and the output signals are 15, 4. The two input signals of the 15-pin cyclic output V3 and V4 can be realized by respectively controlling the 9-pin S3 and the 10-pin S2 through the grounding of the S1 of the control chip IC3 and the control signals ARM-Contral S2 and ARM-Contral S3, and the cyclic output V1 and V2 of the 4-pin can be realized in the same way.
According to fig. 3 and 4, when the four-terminal clamp is not in good contact, V3, V4, V1 and V2 are signals with the same amplitude and opposite phases, so the 15-pin and 4-pin outputs are positive and negative symmetrical square waves. The twenty eighth resistor R28, the twenty third capacitor C23, the twenty ninth resistor R29, the twenty fourth capacitor C24, the thirty fifth resistor R30, the twenty fifth capacitor C25, the thirty first resistor R31, the twenty sixth capacitor C26, the thirty second resistor R32, the twenty seventh capacitor C27, the thirty third resistor R33 and the twenty eighth capacitor C28 are respectively passive low-pass filters, and when the 15-pin square wave and the 4-pin square wave pass through the low-pass filters, the high-frequency components are filtered to form sine waves. The ninth operational amplifier IC5A and the tenth operational amplifier IC5B are two branches of the two-way operational amplifier chip IC5, and are used as homodromous amplifiers, the amplified results enter the IC6 after the two-way sine waves after being filtered are amplified in phase, the IC6 is a two-way comparator, the eleventh operational amplifier IC6A and the twelfth operational amplifier IC6B are two branches of the comparator, and are designed as hysteresis comparators, and the two-way amplified sine waves are compared. And the sine wave must be amplified above the threshold of the hysteretic comparator at the peak resulting in a low output.
When the clip contacts well, since V1 and V2 are both low and V3 and V4 are both low, even if the control chip IC3 is in cyclic switching, both pins 15 and 4 of the control chip IC3 will output low, and after being amplified by the IC5, the low level is still low, which is necessarily lower than the comparator threshold, so the comparison result is high.
And whether the four-terminal clamp is in good contact can be determined by judging the height of the direct current level signal.
The present invention is not limited to the structure that has been described above and shown in the drawings, and various modifications and changes can be made without departing from the scope thereof. The scope of the invention is limited only by the appended claims.
Claims (10)
1. A four terminal test line contact detection method, comprising:
respectively carrying out voltage acquisition on an anode connecting contact and a cathode connecting contact between the four-terminal testing device and an object to be tested to obtain an anode contact voltage signal and a cathode contact voltage signal;
performing signal processing on the positive contact voltage signal and the negative contact voltage signal to obtain corresponding level signals; judging whether the contact is in poor contact or not according to the value corresponding to the level signal;
wherein the positive connection contact includes a drive+ contact and a sense+ contact, and the negative connection contact includes a DRIVE-contact and a SENSE-contact.
2. The four-terminal test line contact detection method according to claim 1, wherein the step of performing voltage acquisition on the positive electrode connection contact between the four-terminal test device and the object to be tested to obtain a positive electrode contact voltage signal includes:
respectively carrying out voltage acquisition on the DRIVE+ contact and the SENSE+ contact to obtain two paths of voltage acquisition signals;
and carrying out differential amplification processing on the two paths of voltage acquisition signals to obtain a positive contact voltage signal.
3. The four-terminal test line contact detection method according to claim 2, wherein the step of performing voltage acquisition on the negative electrode connection contact between the four-terminal test device and the object to be tested to obtain a negative electrode contact voltage signal includes:
respectively carrying out voltage acquisition on the DRIVE-contact and the SENSE-contact to obtain two paths of voltage acquisition signals;
and carrying out differential amplification processing on the two paths of voltage acquisition signals to obtain a negative electrode contact voltage signal.
4. The four-terminal test line contact detection method according to claim 3, further comprising:
performing signal inversion processing on the positive contact voltage signal and the negative contact voltage signal to obtain corresponding inversion voltage signals;
And periodically sampling based on the positive contact voltage signal and the corresponding reverse phase voltage signal, the negative contact voltage signal and the corresponding reverse phase voltage signal to obtain a final positive contact voltage output signal and a final negative contact voltage output signal.
5. The four-terminal test line contact detection method of claim 4, wherein performing signal processing on the positive contact voltage signal and the negative contact voltage signal to obtain corresponding level signals comprises:
and respectively carrying out signal amplification processing on the positive contact voltage output signal and the negative contact voltage output signal to obtain corresponding amplified signals, and carrying out comparator processing on the obtained amplified signals to obtain corresponding level signals.
6. A four-terminal test line contact detection system, comprising:
the signal acquisition module is used for respectively carrying out voltage acquisition on an anode connection contact and a cathode connection contact between the four-terminal testing device and an object to be tested to obtain an anode contact voltage signal and a cathode contact voltage signal, wherein the anode connection contact comprises a drive+ contact and a sense+ contact, and the cathode connection contact comprises a DRIVE-contact and a SENSE-contact;
The signal processing module is used for performing signal processing on the positive contact voltage signal and the negative contact voltage signal to obtain corresponding level signals;
and the signal judging module is used for judging whether the contact is in poor contact or not according to the value corresponding to the level signal.
7. The four-terminal test line contact detection system according to claim 6, wherein the signal acquisition module comprises a first sampling module, and the first sampling module is used for acquiring voltage of an anode connection contact between the four-terminal test device and the object to be tested to obtain an anode contact voltage signal;
when the first sampling module acquires voltage of a positive electrode connecting contact between the four-terminal testing device and an object to be tested to obtain a positive electrode contact voltage signal, the first sampling module acquires voltage of the drive+ contact and the sense+ contact respectively to obtain two paths of voltage acquisition signals; and differential amplification processing is carried out on the two paths of voltage acquisition signals to obtain a positive contact voltage signal.
8. The four-terminal test line contact detection system according to claim 7, wherein the signal acquisition module comprises a second sampling module, and the second sampling module is used for performing voltage acquisition on a negative electrode connection contact between the four-terminal test device and the object to be tested to obtain a negative electrode contact voltage signal;
When the second sampling module acquires voltage of a negative electrode connecting contact between the four-terminal testing device and an object to be tested to obtain a negative electrode contact voltage signal, the second sampling module acquires voltage of the DRIVE-contact and the SENSE-contact respectively to obtain two paths of voltage acquisition signals; and differential amplification processing is carried out on the two paths of voltage acquisition signals to obtain a negative electrode contact voltage signal.
9. The four-terminal test line contact detection system of claim 8, further comprising:
the signal inversion processing module is used for performing signal inversion processing on the positive contact voltage signal and the negative contact voltage signal to obtain corresponding inversion voltage signals;
the signal period acquisition module is used for periodically sampling based on the positive contact voltage signal and the corresponding reverse phase voltage signal, the negative contact voltage signal and the corresponding reverse phase voltage signal to obtain a final positive contact voltage output signal and a final negative contact voltage output signal.
10. The four-terminal test line contact detection system of claim 9, wherein the signal processing module comprises a signal amplification module and a signal comparison module, wherein,
The signal amplifying module is used for respectively amplifying the positive contact voltage output signal and the negative contact voltage output signal to obtain corresponding amplified signals;
and the signal comparison module is used for carrying out comparator processing on the obtained amplified signal to obtain a corresponding level signal.
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