CN110031100B - Multi-dimensional short wave infrared spectrum imaging detection device - Google Patents
Multi-dimensional short wave infrared spectrum imaging detection device Download PDFInfo
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- CN110031100B CN110031100B CN201910360420.3A CN201910360420A CN110031100B CN 110031100 B CN110031100 B CN 110031100B CN 201910360420 A CN201910360420 A CN 201910360420A CN 110031100 B CN110031100 B CN 110031100B
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- 238000003384 imaging method Methods 0.000 title claims abstract description 90
- 238000001514 detection method Methods 0.000 title claims abstract description 24
- 238000002329 infrared spectrum Methods 0.000 title claims abstract description 8
- 230000003287 optical effect Effects 0.000 claims abstract description 25
- 238000001228 spectrum Methods 0.000 claims abstract description 24
- 238000004088 simulation Methods 0.000 claims abstract description 18
- 238000000701 chemical imaging Methods 0.000 claims abstract description 9
- 238000012360 testing method Methods 0.000 claims abstract description 9
- 230000015572 biosynthetic process Effects 0.000 claims description 5
- 238000004566 IR spectroscopy Methods 0.000 claims description 3
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- 238000003032 molecular docking Methods 0.000 description 2
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- 238000001311 chemical methods and process Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000003331 infrared imaging Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2823—Imaging spectrometer
Abstract
The invention discloses a multidimensional shortwave infrared spectrum imaging detection device, wherein: the position of the target surface of the focal plane adjustable collimator can be adjusted within a certain range; the optical filter is arranged at the light outlet of the focal plane adjustable collimator; placing the spectral imaging system under test behind the filter; the imaging phase surface simulation board is placed at the phase surface position of the measured spectrum imaging system, and the reflective imaging microscope system is placed on the other surface of the imaging phase surface simulation board; and placing the short wave imaging detector at a light outlet of the reflective imaging microscope system, and receiving an imaging picture processed by the reflective imaging microscope system through the short wave imaging detector. The device can effectively solve the short wave infrared optical design theory verification and the structure debugging verification, and the device overlap joint is simple, very big improvement the detection precision to the detection degree of difficulty has been reduced.
Description
Technical Field
The invention relates to the technical field of precision instrument detection, in particular to a multi-dimensional short-wave infrared spectrum imaging detection device.
Background
The infrared remote sensing is another optical remote sensing means developed after the visible light remote sensing, can acquire related information of a target by detecting infrared radiation energy of the target, and has the advantages of no limitation of dark night and no penetration of cloud and mist. With the continuous progress of the infrared detection technology, the infrared remote sensing capability is continuously enhanced, and the infrared remote sensing is widely applied to the military field and civil fields such as earth survey, weather forecast, forest fire monitoring and the like.
The imaging spectrum is a continuous ground object spectrum image obtained simultaneously with high spectral resolution in the specific spectrum field, so that remote sensing application can be spatially expanded in a spectrum dimension to quantitatively analyze the biophysical and chemical processes and parameters of the earth surface layer. In recent years, the development of infrared detector technology and various auxiliary devices provides possibility for developing high-performance infrared imaging spectrometers, but the development of short-wave infrared instruments is greatly limited due to the limitation of the performance and the characteristics of the detectors on infrared bands.
Disclosure of Invention
The invention aims to provide a multi-dimensional short-wave infrared spectrum imaging detection device which can effectively solve short-wave infrared optical design theory verification and structure debugging verification, is simple in lap joint, greatly improves detection precision and reduces detection difficulty.
The purpose of the invention is realized by the following technical scheme:
the utility model provides a multidimension degree shortwave infrared spectrum formation of image detection device, includes that the adjustable collimator of focal plane, is surveyed spectral imaging system, reflective imaging microsystem, shortwave imaging detector, microscope, formation of image looks face analog board, light filter, regulation platform, target, broad spectrum light source and target wheel, wherein:
the position of the target surface of the focal plane adjustable collimator can be adjusted within a certain range, and the light emitted by the focal plane adjustable collimator is divergent light, parallel light or convergent light by adjusting different positions of the target surface;
the adjusting platform, the target and the target wheel are integrally arranged between the light inlet of the focal plane adjustable collimator and the wide-spectrum light source; different targets are arranged on the target wheel, and the target wheel is arranged on the adjusting table so as to ensure that the positions of the targets are adjustable;
the optical filter is arranged at the light outlet of the focal plane adjustable collimator;
placing the measured spectral imaging system behind the optical filter, wherein a light inlet of the measured spectral imaging system is aligned with the optical filter;
the imaging phase surface simulation board is placed at the phase surface position of the measured spectrum imaging system, the reflective imaging microscope system is placed on the other surface of the imaging phase surface simulation board, and the light inlet of the reflective imaging microscope system is aligned to the imaging phase surface simulation board;
the microscope is positioned in the reflective imaging microscope system, and imaging details are amplified through the microscope;
and placing the short wave imaging detector at a light outlet of the reflective imaging microscope system, receiving an imaging picture processed by the reflective imaging microscope system through the short wave imaging detector, and judging the imaging quality of the measured spectrum imaging system according to the imaging picture.
The device is characterized by further comprising an industrial personal computer, wherein the control cables of the short wave imaging detector and the target wheel are connected to the industrial personal computer, and the industrial personal computer is used for controlling target adjustment, detector imaging display and adjustment of various parameters.
The imaging phase simulation board is further arranged on a multi-degree-of-freedom adjusting frame, and the position of the imaging phase simulation board can be adjusted in multiple dimensions by utilizing the multi-degree-of-freedom adjusting frame.
The detection device is built on a high-precision optical test platform, and the optical test platforms with different specifications are selected according to use requirements.
The manual target can be directly arranged on the target wheel.
According to the technical scheme provided by the invention, the device can effectively solve the short wave infrared optical design theory verification and the structure debugging verification, is simple in lap joint, greatly improves the detection precision, reduces the detection difficulty, and can be widely applied to detection of various infrared optical designs.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on the drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a multi-dimensional short-wave infrared spectroscopy imaging detection apparatus provided in an embodiment of the present invention;
FIG. 2 is a schematic diagram of an image obtained by directly docking a system under test to a detector according to an exemplary embodiment of the present invention;
FIG. 3 is a schematic view of an image formed using an apparatus according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention are clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments of the present invention without making any creative effort, shall fall within the protection scope of the present invention.
The following will describe the embodiments of the present invention in further detail with reference to the accompanying drawings, and as shown in fig. 1, is a schematic structural diagram of a multidimensional short wave infrared spectrum imaging detection apparatus provided by the embodiments of the present invention, the detection apparatus mainly includes a focal plane adjustable collimator 1, a measured spectrum imaging system 2, a reflective imaging microscope system 3, a short wave imaging detector 5, a microscope 6, an imaging phase plane simulation plate 8, an optical filter 9, an adjusting table 10, a target 11, a wide spectrum light source 12, and a target wheel 13, where the connection and working relationship of each component is specifically:
the position of the target surface of the focal plane adjustable collimator 1 can be adjusted within a certain range, and the light emitted by the focal plane adjustable collimator is divergent light, parallel light or convergent light by adjusting different positions of the target surface; the focal plane adjustable collimator 1 is specially manufactured according to the optical object-image relationship, and mainly has the advantages that a detector is fixed at one position of an imaging spectrum, the position of the optimal image plane of a system is converted by using the adjustment quantity of the target position of the focal plane adjustable collimator 1, and therefore the thickness of a trimming pad can be determined at one time, the operation is simple, and time and labor are saved.
The adjusting table 10, the target 11 and the target wheel 13 are integrally arranged between the light inlet of the focal plane adjustable collimator 1 and the wide spectrum light source 12; different targets 11 are mounted on the target wheel 13, and the target wheel 13 is mounted on the adjusting table 10 to ensure that the positions of the targets 11 are adjustable; in a specific implementation, the mechanism of the target wheel 13 can simplify the process and can be directly provided with a manual target.
The optical filter 9 is arranged at the light outlet of the focal plane adjustable collimator 1;
the measured spectral imaging system 2 is placed behind the optical filter 9, and a light inlet of the measured spectral imaging system 2 is aligned with the optical filter 9;
the imaging phase surface simulation plate 8 is placed at the phase surface position of the measured spectrum imaging system 2, the reflective imaging microscope system 3 is placed on the other surface of the imaging phase surface simulation plate 8, and the light inlet of the reflective imaging microscope system 3 is aligned with the imaging phase surface simulation plate 8;
the microscope 6 is positioned in the reflective imaging microscope system 3, and imaging details are amplified through the microscope 6; in the specific implementation, because the general pixel of the short-wave infrared detector is large, and the image point dispersion designed by the optical system is almost in one pixel, if the detector is directly butted with the optical system, the resolution details and the point diffuse spot shape of the whole system cannot be detected, and the main aberration of the spectral imaging system cannot be further judged, so that the details need to be amplified by the reflective imaging microscope system 3, and the subsequent imaging quality can be conveniently judged;
the short wave imaging detector 5 is placed at the light outlet of the reflective imaging microscope system 3, and the imaging picture processed by the reflective imaging microscope system 3 is received by the short wave imaging detector 5, so as to judge the imaging quality of the measured spectrum imaging system 2.
In addition, in the concrete realization, the device still can include industrial computer 4, the control cable of short wave imaging detector 5 and target wheel 13 is connected on industrial computer 4, industrial computer 4 is used for controlling target regulation, detector formation of image demonstration and the regulation of various parameters. In particular implementations, the industrial personal computer may be a ruggedized, enhanced computer having various operating systems installed therein.
The imaging phase simulation plate 8 can be further arranged on a multi-degree-of-freedom adjusting frame 7, and the position of the imaging phase simulation plate 8 can be adjusted in multiple dimensions by utilizing the multi-degree-of-freedom adjusting frame 7.
The detection device can be built on a high-precision optical test platform, and the optical test platforms with different specifications can be selected according to use requirements.
The following describes in detail the testing procedure of the above-described apparatus by way of specific examples:
firstly, a measured spectrum imager is placed in front of a focal plane adjustable collimator, the working object side of the measured spectrum imager faces the focal plane adjustable collimator, a discrimination plate is placed on the focal plane of an objective lens of the focal plane adjustable collimator, the measured spectrum imager is adjusted, the position where a target image is most clear is found by a microscope, and the discrimination plate is observed for imaging;
the selection of the magnification of the microscope is based on whether the resolution is clear when the observation is carried out by human eyes, and the included angle between the focal plane adjustable collimator and the spectral imager to be measured is adjusted to measure the star point image of the maximum field of view of the spectral imager to be measured.
One single-color integrating sphere (or a single-color light source) is used as a light source, and a group of corresponding line widths of the measured spectrum imager on the resolution discrimination plate are converted according to the focal length of the measured spectrum imager and the focal length of the focal plane adjustable collimator.
Fig. 2 is a schematic diagram of an image obtained by directly docking the system under test to the detector in the example of the present invention, and it can be seen from fig. 2 that: details of the contrast cannot be observed without magnification.
Fig. 3 is a schematic diagram of an image formed by the apparatus according to the embodiment of the present invention, and it can be known from fig. 3 that: after 5 times of microscopic amplification, the contrast ratio of the spectral imager to be measured can be clearly distinguished. In the same way, the target of the focal plane adjustable parallel light tube is replaced by the star point plate, and the aberration characteristic of the system can be measured.
It is noted that those skilled in the art will recognize that embodiments of the present invention are not described in detail herein.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (3)
1. The utility model provides a multidimension degree shortwave infrared spectrum formation of image detection device which characterized in that, includes that the adjustable collimator of focal plane, measured spectrum imaging system, reflective imaging microsystem, shortwave imaging detector, microscope, formation of image looks analog board, light filter, regulation platform, target, wide spectrum light source and target wheel, wherein:
the position of the target surface of the focal plane adjustable collimator can be adjusted within a certain range, and the light emitted by the focal plane adjustable collimator is divergent light, parallel light or convergent light by adjusting different positions of the target surface;
the adjusting platform, the target and the target wheel are integrally arranged between the light inlet of the focal plane adjustable collimator and the wide-spectrum light source; different targets are arranged on the target wheel, and the target wheel is arranged on the adjusting table so as to ensure that the positions of the targets are adjustable;
the optical filter is arranged at the light outlet of the focal plane adjustable collimator;
placing the measured spectral imaging system behind the optical filter, wherein a light inlet of the measured spectral imaging system is aligned with the optical filter;
the imaging phase surface simulation board is placed at the phase surface position of the measured spectrum imaging system, the reflective imaging microscope system is placed on the other surface of the imaging phase surface simulation board, and the light inlet of the reflective imaging microscope system is aligned to the imaging phase surface simulation board;
the microscope is positioned in the reflective imaging microscope system, and imaging details are amplified through the microscope;
placing the short wave imaging detector at a light outlet of the reflective imaging microscope system, receiving an imaging picture processed by the reflective imaging microscope system through the short wave imaging detector, and judging the imaging quality of the measured spectrum imaging system according to the imaging picture;
the device also comprises an industrial personal computer, wherein control cables of the short wave imaging detector and the target wheel are connected to the industrial personal computer, and the industrial personal computer is used for controlling target adjustment, detector imaging display and adjustment of various parameters;
the imaging phase simulation board is further arranged on a multi-degree-of-freedom adjusting frame, and the position of the imaging phase simulation board can be adjusted in multiple dimensions by utilizing the multi-degree-of-freedom adjusting frame.
2. The multi-dimensional short wave infrared spectroscopy imaging detection apparatus of claim 1,
the detection device is built on a high-precision optical test platform, and the optical test platforms with different specifications are selected according to use requirements.
3. The multi-dimensional short wave infrared spectroscopy imaging detection apparatus of claim 1,
the manual target can be directly arranged on the target wheel.
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| CN201910360420.3A CN110031100B (en) | 2019-04-30 | 2019-04-30 | Multi-dimensional short wave infrared spectrum imaging detection device |
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| CN111707449B (en) * | 2020-05-21 | 2021-05-14 | 中国科学院西安光学精密机械研究所 | Multi-spectral optical axis parallelism testing device and testing method |
| CN113804296A (en) * | 2021-09-30 | 2021-12-17 | 上海卫星装备研究所 | Performance detection device and method for imaging spectrometer in vacuum low-temperature environment |
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| CN105092048A (en) * | 2015-08-19 | 2015-11-25 | 天津中环创新科技有限公司 | Infrared image imager detector and infrared imaging detection method |
| CN105784681A (en) * | 2016-04-15 | 2016-07-20 | 中国科学院上海技术物理研究所 | Multifunctional system for LIBS spectrum detection and microimaging |
| CN106768391B (en) * | 2016-11-21 | 2019-01-18 | 上海卫星工程研究所 | Imager difference focal plane spectral coverage registration accuracy test method |
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