CN110030922B - Multipoint synchronous measurement method and system and storage medium - Google Patents
Multipoint synchronous measurement method and system and storage medium Download PDFInfo
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- CN110030922B CN110030922B CN201810029091.XA CN201810029091A CN110030922B CN 110030922 B CN110030922 B CN 110030922B CN 201810029091 A CN201810029091 A CN 201810029091A CN 110030922 B CN110030922 B CN 110030922B
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- G01—MEASURING; TESTING
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- G01B11/00—Measuring arrangements characterised by the use of optical techniques
Abstract
The embodiment of the invention discloses a multipoint synchronous measurement method, a multipoint synchronous measurement system and a storage medium, and relates to the field of circuit board processing equipment. The multipoint synchronous measurement method comprises the following steps: controlling a device to be tested to move according to one or more test points, and controlling one or more laser head assemblies to emit one or more laser beams, so that each laser beam is divided into two secondary laser beams, wherein one secondary laser beam irradiates on the device to be tested, and the other secondary laser beam returns to the laser head assembly; and acquiring one or more laser beams returned by irradiating the test equipment, and obtaining the displacement value of each reflecting point on the test equipment according to the laser beam returned by the test equipment and the other divided secondary laser beam. The multipoint synchronous measurement method, the multipoint synchronous measurement system and the storage medium of the embodiment of the invention realize the precision test of a plurality of parts of the workbench of the processing equipment and obtain accurate and intuitive test results.
Description
Technical Field
The embodiment of the invention relates to the field of circuit board processing equipment, in particular to a multipoint synchronous measurement method, a multipoint synchronous measurement system and a storage medium.
Background
In an industrial process, a Printed Circuit Board (PCB) is generally subjected to a punching process using a mechanical drill.
The inventor finds that in the process of researching the application, in the production process, a six-axis PCB mechanical drilling machine does point position movement, and at the moment, the positioning precision of a workbench directly influences the drilling precision. In practical situations, the positioning accuracy of each part of the workbench is inconsistent due to the reasons that the rigidity of the workbench cannot be infinite, the two sides of the workbench are not completely symmetrical, the guide rail is provided with deviation, the driving force of the motor is not at the absolute center and the like. When the accuracy of the whole machine is reflected, namely the processing accuracy of a plurality of shafts is different, the positioning accuracy of two sides of the workbench has larger deviation, so that the positioning accuracy conditions of different position points of the workbench must be accurately grasped in the stage of equipment research and development and verification. Therefore, how to realize the precision test of a plurality of parts of the worktable of the processing equipment and obtain an accurate and intuitive test result becomes a problem to be solved urgently.
Disclosure of Invention
The technical problem to be solved by the embodiment of the invention is to realize the precision test of a plurality of parts of a workbench of processing equipment and obtain an accurate and intuitive test result.
In order to solve the technical problem, the embodiment of the invention adopts the following technical scheme:
in one aspect, a multipoint synchronization measurement method includes:
controlling a device to be tested to move according to one or more test points at a preset test interval, and controlling one or more laser head assemblies to emit one or more laser beams, so that each laser beam is divided into two secondary laser beams, wherein one secondary laser beam irradiates on the device to be tested, and the other secondary laser beam returns into the laser head assemblies;
acquiring one or more laser beams returned by irradiating the test equipment, and obtaining displacement values of all reflection points on the test equipment according to the laser beams returned by the test equipment and the other divided secondary laser beam;
and obtaining a data curve according to one or more displacement values obtained by moving the device to be tested at one or more test points.
In one or more embodiments of the invention, each laser head assembly splits the laser beam into two secondary laser beams of equal intensity after the laser beam is emitted.
In one or more embodiments of the present invention, the laser beam reflected by each device to be tested is compared with another divided secondary laser beam by the interference principle, and a displacement value of the device to be tested moved by each reflection point on the current test point is obtained through conversion.
In one or more embodiments of the present invention, the controlling the one or more laser head assemblies to emit one or more laser beams includes: the laser head assemblies are respectively arranged in front of the to-be-tested equipment and are respectively fixed at two ends and in front of the middle of the to-be-tested equipment, and each laser head assembly is triggered at the same moment to uniformly collect reflected laser beams.
In one or more embodiments of the present invention, a first displacement value corresponding to a left end of a device to be tested, a second displacement value corresponding to a right end of the device to be tested, and a third displacement value corresponding to a middle of the device to be tested are obtained through laser beams reflected from two ends and the middle of the device to be tested;
in another aspect, a measurement system is used to implement the multipoint synchronous measurement method, and includes: one or more laser head assemblies, one or more light splitting assemblies, one or more light reflecting assemblies, a trigger and a processor;
the processor controls the equipment to be tested to move according to one or more test points at a preset test interval, and controls one or more laser head assemblies to emit one or more laser beams, and one or more light splitting assemblies enable each laser beam to be divided into two secondary laser beams, wherein one secondary laser beam irradiates the equipment to be tested, and the other secondary laser beam returns to the laser head assemblies;
one or more laser head assemblies collect one or more laser beams reflected by the equipment to be tested and returned by irradiating the equipment to be tested, and the displacement value of each reflection point on the equipment to be tested is obtained according to the laser beams returned by the equipment to be tested and the other divided secondary laser beam;
the processor obtains one or more displacement values according to the movement of the device to be tested on one or more test points, and obtains a data curve.
In one or more embodiments of the invention, after each laser head assembly emits a laser beam, the beam splitting assembly splits the laser beam into two secondary laser beams of equal intensity.
In one or more embodiments of the present invention, the laser head assembly compares the laser beam reflected by each device to be tested with another divided secondary laser beam by using the principle of interference, and converts to obtain the displacement value of each reflection point of the device to be tested on the current test point.
In one or more embodiments of the invention, three laser head assemblies are respectively arranged in front of the equipment to be tested, and the laser head assemblies are respectively fixed in front of the two ends and the middle part of the equipment to be tested, so that each laser head assembly is triggered at the same time to uniformly collect reflected laser beams;
and obtaining a first displacement value corresponding to the left end of the device to be tested, a second displacement value corresponding to the right end of the device to be tested and a third displacement value corresponding to the middle of the device to be tested through the laser beams reflected by the two ends and the middle of the device to be tested.
In another aspect, a storage medium has instructions stored therein, which when executed by a processor, cause the processor to perform the multipoint synchronization measurement method.
Compared with the prior art, the embodiment of the invention has the following beneficial effects:
the multipoint synchronous measurement method provided by the embodiment of the invention comprises the following steps: controlling a device to be tested to move according to one or more test points at a preset test interval, and controlling one or more laser head assemblies to emit one or more laser beams, so that each laser beam is divided into two secondary laser beams, wherein one secondary laser beam irradiates on the device to be tested, and the other secondary laser beam returns into the laser head assemblies; acquiring one or more laser beams returned by irradiating the test equipment, and obtaining displacement values of all reflection points on the test equipment according to the laser beams returned by the test equipment and the other divided secondary laser beam; and obtaining a data curve according to one or more displacement values obtained by moving the device to be tested at one or more test points. The device to be tested is debugged to move in the test points and is tested through one or more laser head assemblies, so that the device to be tested can move and be tested on the test points with the preset number, displacement values of a plurality of positions on the device to be tested are obtained, and the state of the device to be tested is visually obtained. In summary, the multipoint synchronous measurement method provided by the embodiment of the invention realizes precision testing of multiple parts of the workbench of the processing equipment, obtains an accurate and intuitive test result, and improves the testing efficiency of the equipment.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without inventive exercise.
FIG. 1 is a diagram illustrating a multipoint synchronization measurement method according to an embodiment of the present invention;
FIG. 2 is a schematic illustration of the installation of a measurement system in an embodiment of the invention;
FIG. 3 is a schematic diagram of a measurement system in an embodiment of the invention;
FIG. 4 is a diagram of a flip-flop according to an embodiment of the present invention.
Description of reference numerals: 100-laser head assembly, 200-light splitting assembly, 300-light reflecting assembly, 400-trigger and 500-processor.
Detailed Description
To facilitate an understanding of the invention, the invention will now be described more fully with reference to the accompanying drawings. Preferred embodiments of the present invention are shown in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. The terms "first", "second", and the like in the claims, the description, and the drawings of the specification of the present application are used for distinguishing between different objects and not for describing a particular order.
The first embodiment is as follows:
fig. 1 is a schematic diagram of a multipoint synchronous measurement method according to an embodiment of the present invention. The multipoint synchronous measurement method in the embodiment of the invention comprises the following steps:
step 101: and controlling the equipment to be tested to move according to one or more test points at a preset test interval, and controlling one or more laser head assemblies to emit one or more laser beams, so that each laser beam is divided into two secondary laser beams, wherein one secondary laser beam irradiates on the equipment to be tested, and the other secondary laser beam returns to the laser head assembly.
Step 102: and acquiring one or more laser beams reflected by the equipment to be tested and returned by irradiating the equipment to be tested, and obtaining the displacement value of each reflection point on the equipment to be tested according to the laser beams returned by the equipment to be tested and the other divided secondary laser beams.
Step 103: and obtaining a data curve according to one or more displacement values obtained by moving the device to be tested at one or more test points. And further, correspondingly converting to obtain the displacement difference value of the equipment to be tested at the two ends of the current test point according to the one or more displacement values.
In the embodiment of the invention, after each laser head assembly emits the laser beam, the laser beam is divided into two secondary laser beams with the same intensity. The two secondary laser beams with the same intensity are divided, so that the comparison of the two divided secondary laser beams is facilitated.
In the embodiment of the invention, the laser beam reflected by each piece of equipment to be tested is compared with the other divided secondary laser beam by the interference principle, and the displacement value of each reflection point of the equipment to be tested on the current test point is obtained by conversion. Namely: and when the device to be tested moves the preset test point, testing the device to be tested after moving one test point. And the device to be tested stops moving at the test point, one of the divided secondary laser beams is emitted to the device to be tested through the laser head assembly, and the device to be tested reflects the secondary laser beam. At this time, the displacement value of the movement of the reflection point of the currently reflected laser beam is the displacement value obtained by comparing and converting the reflected laser beam and the other divided laser beam returned to the laser head assembly.
In an embodiment of the present invention, the controlling one or more laser head assemblies to emit one or more laser beams specifically includes: the laser head assemblies are respectively arranged in front of the to-be-tested equipment and are respectively fixed at two ends and in front of the middle of the to-be-tested equipment, and each laser head assembly is triggered at the same moment to uniformly collect reflected laser beams.
In the embodiment of the invention, the first displacement value corresponding to the left end of the device to be tested, the second displacement value corresponding to the right end of the device to be tested and the third displacement value corresponding to the middle of the device to be tested are obtained through the laser beams reflected by the two ends and the middle of the device to be tested. In the embodiment of the invention, the displacement values at the two ends and the displacement value in the middle part can be optionally adopted to obtain the displacement difference value at the two ends. As the adopted equipment to be tested is processing equipment with the driving motor positioned in the middle of the equipment, the vector value of the displacement difference value at the left end is obtained by subtracting the third displacement value from the first displacement value by taking the third displacement value corresponding to the driving motor positioned in the middle as a reference value, and the vector value of the displacement difference value at the right end is obtained by subtracting the third displacement value from the second displacement value. And obtaining the displacement difference value of the two ends by adding or subtracting the displacement difference value of the right end from the displacement difference value of the left end. That is, in the obtained data curve, displacement values of one or more parts collected when the device to be tested moves on one or more test points exist, and the obtained displacement values of the one or more parts are further converted into changes of displacement difference values at two ends of the identification device in the data curve, so that the control of the performance of the device by a tester is facilitated.
The multipoint synchronous measurement method provided by the embodiment of the invention mainly has the following technical effects:
the multipoint synchronous measurement method comprises the following steps: controlling a device to be tested to move according to one or more test points at a preset test interval, and controlling one or more laser head assemblies to emit one or more laser beams, so that each laser beam is divided into two secondary laser beams, wherein one secondary laser beam irradiates on the device to be tested, and the other secondary laser beam returns into the laser head assemblies; acquiring one or more laser beams returned by irradiating the test equipment, and obtaining displacement values of all reflection points on the test equipment according to the laser beams returned by the test equipment and the other divided secondary laser beam; and obtaining a data curve according to one or more displacement values obtained by moving the device to be tested at one or more test points. The device to be tested is debugged to move in the test points and is tested through one or more laser head assemblies, so that the device to be tested can move and be tested on the test points with the preset number, displacement values of a plurality of positions on the device to be tested are obtained, and the state of the device to be tested is visually obtained. In summary, the multipoint synchronous measurement method provided by the embodiment of the invention realizes precision testing of multiple parts of the workbench of the processing equipment, obtains an accurate and intuitive test result, and improves the testing efficiency of the equipment.
Example two:
refer to fig. 2, 3 and 4. The measurement system in the embodiment of the present invention is configured to implement the multipoint synchronous measurement method, and includes: one or more laser head assemblies 100 for emitting a laser beam, one or more beam splitting assemblies 200 for splitting the laser beam, one or more light reflecting assemblies 300 for reflecting the laser beam, a trigger 400 for triggering one or more laser head assemblies 100, and a processor 500 for reading data within the laser head assemblies 100. The triggering of one or more laser head assemblies 100 is accomplished by trigger 400 and data is collected and statistically processed for one or more laser head assemblies 100 using processor 500.
The processor 500 controls the device to be tested to move according to one or more test points at a predetermined test interval, and controls the one or more laser head assemblies 100 to emit one or more laser beams, and the one or more beam splitting assemblies 200 to split each laser beam into two secondary laser beams, wherein one secondary laser beam irradiates the device to be tested, and the other secondary laser beam returns to the laser head assembly. One or more laser head assemblies 100 collect one or more laser beams reflected by the device to be tested and returned by irradiating the device to be tested, and obtain displacement values of the reflection points on the device to be tested according to the laser beams returned by the device to be tested and the other divided secondary laser beam. The processor 500 obtains one or more displacement values according to the movement of the device to be tested at one or more test points, and obtains a data curve.
In some embodiments of the present invention, after each laser head assembly 100 emits a laser beam, beam splitting assembly 200 splits the laser beam into two secondary laser beams of equal intensity, such that one of the secondary laser beams impinges perpendicularly on the device under test and the other secondary laser beam returns into laser head assembly 100. The two secondary laser beams with the same intensity are divided, so that the comparison of the two divided secondary laser beams is facilitated.
In some embodiments of the present invention, the laser head assembly 100 converts the displacement value of the device to be tested moving at each reflection point on the current test point by comparing the intensity of the laser beam reflected by each device to be tested and the intensity of the other divided secondary laser beam. Namely: when the device to be tested moves the preset test point, the test point is tested after one test point is moved. The device to be tested stops moving at the test point, one of the divided secondary laser beams is emitted on the device to be tested through the laser head assembly 100, and the device to be tested reflects the secondary laser beam. At this time, the displacement value of the movement of the reflection point of the currently reflected laser beam is the displacement value obtained by performing the comparison and conversion between the reflected laser beam and another laser beam returned to the laser head assembly 100.
In some embodiments of the present invention, it is preferable that three laser head assemblies 100 are respectively disposed in front of the devices to be tested, and the laser head assemblies 100 are respectively fixed in front of both ends and a middle portion of the devices to be tested, and each laser head assembly 100 is triggered at the same time to uniformly collect the reflected laser beams. And obtaining a first displacement value corresponding to the left end of the device to be tested, a second displacement value corresponding to the right end of the device to be tested and a third displacement value corresponding to the middle of the device to be tested through the laser beams reflected by the two ends and the middle of the device to be tested. In the embodiment of the invention, the displacement values at the two ends and the displacement value in the middle part can be optionally adopted to obtain the displacement difference value at the two ends. As the adopted equipment to be tested is processing equipment with the driving motor positioned in the middle of the equipment, the vector value of the displacement difference value at the left end is obtained by subtracting the third displacement value from the first displacement value by taking the third displacement value corresponding to the driving motor positioned in the middle as a reference value, and the vector value of the displacement difference value at the right end is obtained by subtracting the third displacement value from the second displacement value. And obtaining the displacement difference value of the two ends by adding or subtracting the displacement difference value of the right end from the displacement difference value of the left end. That is, in the obtained data curve, there are displacement values of one or more parts acquired when the device to be tested moves on one or more test points, and the obtained displacement values of one or more parts are further converted into changes of displacement difference values at two ends of the identification device in the data curve, so that the control of the performance of the device by the tester is facilitated.
In an alternative embodiment of the present invention, a laser head assembly 100, and a light splitting assembly 200 and a light reflecting assembly 300 used in cooperation with the laser head assembly 100 are disposed in the middle of a device to be tested, and a plurality of sets of matched laser head assemblies 100 are disposed on two sides of the laser head assembly 100 disposed in the middle, and the number of the laser head assemblies 100 disposed on the two sides is equal.
In some embodiments of the present invention, the flip-flop 400 comprises: diode D1, diode D2, diode D3, diode D4, diode D5, diode D6, resistor R2, resistor R1, and switch S1. One end of the switch S1 is grounded and connected with the cathode of the diode D2. The anode of the diode D2 is connected in series with the resistor R2 and then connected with the resistor R1, and the power supply is connected at one end connecting end of the resistor R2 and the resistor R1. The other end of the resistor R1 is connected to the anode of the diode D3. The diode D3, the diode D4, the diode D5, and the diode D6 are connected in series. The cathode of the diode D6 is connected to the anode of the diode D1, and the cathode of the diode D1 is connected to the other end of the switch S1. On the premise that the data of the device to be tested in the test process is required to be accurate, the trigger 400 is preferably adopted to trigger the laser head assemblies 100, so that the laser head assemblies 100 can be rapidly controlled, the laser head assemblies 100 can be triggered simultaneously, and the test accuracy is improved.
The working principle of the measuring system in the embodiment of the invention is as follows:
the laser head assemblies in the embodiment of the invention are arranged in front of the machine to be tested, and the light splitting assemblies are correspondingly arranged on the workbench or between the workbench and the laser head assemblies. And the plurality of light reflecting assemblies are mounted on the movable part of the device to be tested. In the testing process, the laser head assembly is kept in a state of emitting laser beams, the light splitting assembly is used for splitting the laser beams into two secondary laser beams, one secondary laser beam vertically irradiates on the equipment to be tested, and the other secondary laser beam returns to the laser head assembly according to the original light path. Wherein the trigger and the processor are respectively connected to the plurality of laser head assemblies. And when the plurality of laser head assemblies are triggered by the trigger, collecting the reflected laser beams. When the laser head assembly receives the laser beam returned by irradiating the equipment to be tested, the two laser beams are compared by an interference principle and converted into a displacement value of the movement of the equipment to be tested. The processor records the values by collecting the values in the plurality of laser head assemblies. Optionally, the value of the laser head assembly where the driving motor in the device to be tested is located is used as a reference value, and the displacement difference value is obtained by adding or subtracting the displacement values in the laser head assemblies at the two ends.
The measuring system provided by the embodiment of the invention mainly has the following technical effects:
the measurement system according to an embodiment of the present invention includes: one or more laser head assemblies 100 for emitting a laser beam, one or more beam splitting assemblies 200 for splitting the laser beam, one or more light reflecting assemblies 300 for reflecting the laser beam, a trigger 400 for triggering one or more laser head assemblies 100, and a processor 500 for reading data within the laser head assemblies 100. The triggering of one or more laser head assemblies 100 is accomplished by trigger 400 and data is collected and statistically processed for one or more laser head assemblies 100 using processor 500. The processor 500 controls the device to be tested to move according to one or more test points at a predetermined test interval, and controls the one or more laser head assemblies 100 to emit one or more laser beams, and the one or more beam splitting assemblies 200 to split each laser beam into two secondary laser beams, wherein one secondary laser beam irradiates the device to be tested, and the other secondary laser beam returns to the laser head assembly. One or more laser head assemblies 100 collect one or more laser beams reflected by the device to be tested and returned by irradiating the device to be tested, and obtain displacement values of the reflection points on the device to be tested according to the laser beams returned by the device to be tested and the other divided secondary laser beam. The processor 500 obtains one or more displacement values according to the movement of the device to be tested at one or more test points, and obtains a data curve. The device to be tested is debugged to move in the test points and is tested through one or more laser head assemblies, so that the device to be tested can move and be tested on the test points with the preset number, displacement values of a plurality of positions on the device to be tested are obtained, and the state of the device to be tested is visually obtained. In summary, the multipoint synchronous measurement method, the multipoint synchronous measurement system and the storage medium according to the embodiments of the present invention implement precision testing of multiple parts of a worktable of a processing device, obtain an accurate and intuitive test result, and improve the testing efficiency of the device.
Example three:
a storage medium having stored therein instructions that, when executed by a processor, cause the processor to perform a multipoint synchronization measurement method as described in method embodiments of the present invention.
Finally, it should be noted that: the above embodiments are preferred embodiments of the present invention, but the present invention is not limited to the above embodiments, and any other changes, modifications, substitutions, combinations, and simplifications which do not depart from the spirit and principle of the present invention should be construed as equivalents thereof, and all such changes, modifications, substitutions, combinations, and simplifications are intended to be included in the scope of the present invention.
Claims (9)
1. A multipoint synchronous measurement method is characterized by comprising the following steps:
controlling a device to be tested to move according to a plurality of test points with preset test intervals, and controlling one or more laser head assemblies to emit one or more laser beams, so that each laser beam is divided into two secondary laser beams, wherein one secondary laser beam irradiates on the device to be tested, and the other secondary laser beam returns to the laser head assembly;
acquiring one or more laser beams returned by irradiating the test equipment, and obtaining displacement values of all reflection points on the test equipment according to the laser beams returned by the test equipment and the other divided secondary laser beam; comparing the laser beam reflected by each piece of equipment to be tested with the other divided secondary laser beam by an interference principle, and converting to obtain a displacement value of each reflection point of the equipment to be tested on the current test point;
and obtaining a plurality of displacement values according to the movement of the equipment to be tested at the plurality of test points, obtaining a data curve, and further converting the change of the displacement difference value at the two ends of the identification equipment in the data curve by obtaining the displacement values of the plurality of parts.
2. The multipoint synchronous measuring method as claimed in claim 1, wherein after each laser head assembly emits a laser beam, the laser beam is divided into two secondary laser beams with the same intensity.
3. The multipoint synchronous measuring method according to claim 2, wherein said controlling the plurality of laser head assemblies to emit a plurality of laser beams comprises: the front of the to-be-tested equipment is respectively provided with three laser head assemblies, the laser head assemblies are respectively fixed at the two ends and the front of the middle part of the to-be-tested equipment, and each laser head assembly is triggered at the same moment to uniformly collect reflected laser beams.
4. The multipoint synchronous measurement method according to claim 3, wherein a first displacement value corresponding to the left end of the device to be tested, a second displacement value corresponding to the right end of the device to be tested, and a third displacement value corresponding to the middle of the device to be tested are obtained by the laser beams reflected from both ends and the middle of the device to be tested.
5. A measurement system for implementing the multipoint synchronization measurement method according to any one of claims 1 to 4, comprising: one or more laser head assemblies, one or more light splitting assemblies, one or more light reflecting assemblies, a trigger and a processor;
the processor controls the equipment to be tested to move according to a plurality of test points with preset test intervals, and controls one or more laser head assemblies to emit one or more laser beams, and one or more light splitting assemblies enable each laser beam to be split into two secondary laser beams, wherein one secondary laser beam irradiates the equipment to be tested, and the other secondary laser beam returns to the laser head assemblies;
one or more laser head assemblies collect one or more laser beams reflected by the equipment to be tested and returned by irradiating the equipment to be tested, and the displacement value of each reflection point on the equipment to be tested is obtained according to the laser beams returned by the equipment to be tested and the other divided secondary laser beam;
and the processor obtains a data curve according to a plurality of displacement values obtained by moving the device to be tested at the plurality of test points.
6. The measurement system of claim 5, wherein after each laser head assembly emits a laser beam, the beam splitting assembly splits the laser beam into two secondary laser beams of equal intensity.
7. The measuring system of claim 6, wherein the laser head assembly compares the laser beam reflected by each device to be tested with another divided secondary laser beam by the interference principle, and converts to obtain the displacement value of each reflection point of the device to be tested on the current test point.
8. The measuring system of claim 7, wherein three laser head assemblies are respectively arranged in front of the to-be-tested equipment, and the laser head assemblies are respectively fixed in front of the two ends and the middle part of the to-be-tested equipment, so that each laser head assembly is triggered at the same time to uniformly collect the reflected laser beams;
and obtaining a first displacement value corresponding to the left end of the device to be tested, a second displacement value corresponding to the right end of the device to be tested and a third displacement value corresponding to the middle of the device to be tested through the laser beams reflected by the two ends and the middle of the device to be tested.
9. A storage medium having stored therein instructions that, when executed by a processor, cause the processor to perform the multipoint synchronization measurement method according to any one of claims 1 to 4.
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