CN110010443A - A kind of progressive multistage bar ion focusing transmission device of broken line and device - Google Patents
A kind of progressive multistage bar ion focusing transmission device of broken line and device Download PDFInfo
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- CN110010443A CN110010443A CN201910286636.XA CN201910286636A CN110010443A CN 110010443 A CN110010443 A CN 110010443A CN 201910286636 A CN201910286636 A CN 201910286636A CN 110010443 A CN110010443 A CN 110010443A
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- 230000000750 progressive effect Effects 0.000 title claims abstract description 31
- 230000005540 biological transmission Effects 0.000 title claims abstract description 27
- 239000004429 Calibre Substances 0.000 claims abstract description 18
- 230000007423 decrease Effects 0.000 claims abstract description 10
- 238000010884 ion-beam technique Methods 0.000 claims description 50
- 238000005192 partition Methods 0.000 claims description 41
- 238000005452 bending Methods 0.000 claims description 35
- 230000005684 electric field Effects 0.000 claims description 26
- 238000009826 distribution Methods 0.000 claims description 12
- 230000015572 biosynthetic process Effects 0.000 claims description 8
- 239000002184 metal Substances 0.000 claims description 8
- 229910052751 metal Inorganic materials 0.000 claims description 8
- 239000011248 coating agent Substances 0.000 claims description 6
- 238000000576 coating method Methods 0.000 claims description 6
- 238000002347 injection Methods 0.000 claims description 6
- 239000007924 injection Substances 0.000 claims description 6
- 230000003247 decreasing effect Effects 0.000 claims description 3
- 238000007689 inspection Methods 0.000 claims description 3
- 238000009434 installation Methods 0.000 claims 1
- 238000005303 weighing Methods 0.000 claims 1
- 238000001514 detection method Methods 0.000 abstract description 11
- 230000035945 sensitivity Effects 0.000 abstract description 6
- 230000007246 mechanism Effects 0.000 abstract description 3
- 150000002500 ions Chemical class 0.000 description 89
- 238000010586 diagram Methods 0.000 description 9
- 230000000694 effects Effects 0.000 description 7
- 230000008901 benefit Effects 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 6
- 239000012491 analyte Substances 0.000 description 4
- 239000002245 particle Substances 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 230000007935 neutral effect Effects 0.000 description 3
- 230000002776 aggregation Effects 0.000 description 2
- 238000004220 aggregation Methods 0.000 description 2
- 210000000988 bone and bone Anatomy 0.000 description 2
- 239000000571 coke Substances 0.000 description 2
- 238000011038 discontinuous diafiltration by volume reduction Methods 0.000 description 2
- 239000004744 fabric Substances 0.000 description 2
- 230000005764 inhibitory process Effects 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 238000004949 mass spectrometry Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000006641 stabilisation Effects 0.000 description 2
- 238000011105 stabilization Methods 0.000 description 2
- 102100022704 Amyloid-beta precursor protein Human genes 0.000 description 1
- 101000823051 Homo sapiens Amyloid-beta precursor protein Proteins 0.000 description 1
- DZHSAHHDTRWUTF-SIQRNXPUSA-N amyloid-beta polypeptide 42 Chemical compound C([C@@H](C(=O)N[C@@H](C)C(=O)N[C@@H](CCC(O)=O)C(=O)N[C@@H](CC(O)=O)C(=O)N[C@H](C(=O)NCC(=O)N[C@@H](CO)C(=O)N[C@@H](CC(N)=O)C(=O)N[C@@H](CCCCN)C(=O)NCC(=O)N[C@@H](C)C(=O)N[C@H](C(=O)N[C@@H]([C@@H](C)CC)C(=O)NCC(=O)N[C@@H](CC(C)C)C(=O)N[C@@H](CCSC)C(=O)N[C@@H](C(C)C)C(=O)NCC(=O)NCC(=O)N[C@@H](C(C)C)C(=O)N[C@@H](C(C)C)C(=O)N[C@@H]([C@@H](C)CC)C(=O)N[C@@H](C)C(O)=O)[C@@H](C)CC)C(C)C)NC(=O)[C@H](CC=1C=CC=CC=1)NC(=O)[C@@H](NC(=O)[C@H](CC(C)C)NC(=O)[C@H](CCCCN)NC(=O)[C@H](CCC(N)=O)NC(=O)[C@H](CC=1N=CNC=1)NC(=O)[C@H](CC=1N=CNC=1)NC(=O)[C@@H](NC(=O)[C@H](CCC(O)=O)NC(=O)[C@H](CC=1C=CC(O)=CC=1)NC(=O)CNC(=O)[C@H](CO)NC(=O)[C@H](CC(O)=O)NC(=O)[C@H](CC=1N=CNC=1)NC(=O)[C@H](CCCNC(N)=N)NC(=O)[C@H](CC=1C=CC=CC=1)NC(=O)[C@H](CCC(O)=O)NC(=O)[C@H](C)NC(=O)[C@@H](N)CC(O)=O)C(C)C)C(C)C)C1=CC=CC=C1 DZHSAHHDTRWUTF-SIQRNXPUSA-N 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000001819 mass spectrum Methods 0.000 description 1
- 238000000816 matrix-assisted laser desorption--ionisation Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/062—Ion guides
- H01J49/063—Multipole ion guides, e.g. quadrupoles, hexapoles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/422—Two-dimensional RF ion traps
- H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles
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- Electron Sources, Ion Sources (AREA)
Abstract
The invention discloses a kind of progressive multistage bar ion focusing transmission device of broken line, including ion source component, ion lens component, focusing block, analyzer component and detector elements, the focusing block includes the focusing unit of multiple straight line arrangements；Ion lens component, the first focusing unit, the second focusing unit are until the n-th focusing unit, analyzer component are all coupled with vacuum system, inner vacuum vessel is formed under working condition, until being equipped with multistage bar ion focusing transmission part inside the n-th focusing unit, multistage bar ion focusing transmission part includes entrance greatly and exports the multistage bar focusing structure that the small and described inlet calibre smoothly successively decreases to the exit caliber first focusing unit；The invention enables mechanisms to make simple and convenient, compared with the volume and cost that straight line arrangement can more further decrease integral device, ion focusing ability can be more improved, final detection sensitivity is promoted, simultaneously compared with the corresponding focusing structure of used aloned, its overall volume can be substantially reduced.
Description
Technical field
The present invention relates to ion focusing transmission field, the progressive multistage bar ion focusing transmission device of especially a kind of broken line
And device.
Background technique
Mass spectrograph is a kind of for detecting highly sensitive, the high-resolution instrument of substance chemical component, it is first by sample
Product are converted into gas ion, are then separated ion according to the size of mass-to-charge ratio (m/z) by electric field or magnetic field, then measure
The intensity of ion forms mass spectrogram out, qualitatively or quantitatively can obtain the chemical component of substance according to mass spectrogram.
It can be produced by any system in various ionizing systems for the analyte ions by mass-spectrometry analysis
It is raw.For example, AP-MALDI, APPI, ESI, APCI and ICP system can be used in mass spectrometry system and generate ion.This
Many (760Torr) under atmospheric or near atmospheric pressure in a little systems generate ion.After generating ion, analyte from
Son must be guided into or sample in mass spectrum.In general, mass spectrometric analyzer part is maintained at from 10-4Torr to 10-8Torr
High vacuum levels.In practice, to ion carry out sampling include by analyte ions in the form of the ion beam finely limited from
Ion source is transferred to high vacuum mass spectrograph room via one or more middle vacuum rooms.Before each of middle vacuum room is held at
Vacuum level between rear chamber.Therefore, wherein analyte ions form associated pressure water from ion in a stepped fashion
It is flat to be transitioned into mass spectrometric stress level.In most applications, it is expected that by ion not significant losses of ions state
Under be transmitted through each of various rooms of spectrometer system.Ion guidance is usually used to come so that ion edge in MS system
The direction that limits it is mobile.
Ion transmission product is six grades of bars of homogeneous diameter currently on the market, and entering of constituting of 6 six grades of bar inscribed circles
As mouthful diameter with outlet diameter is.After six grades of bars apply rf electric field and axial gradient electric field, ion convergent coke is at six grades
Inside bar, outlet then is entered from entrance, is ion and neutral gas one in the atmospheric pressure outside vacuum due to ion source
Rise and driven by vacuum and the pressure difference of atmospheric pressure, entered by the narrower bore of a very little, borehole enlargement, can enter vacuum from
The total amount of son amount and neutral gas will increase, but be needed the vacuum pump of bigger pumping speed, could maintain separation, detection ion must
The base vacuum of palpus.And correspondingly, the inscribed circle of six grades of bars needs bigger, can just make most of ion, anxious after small holes
After speed expansion, into six grades of bars, by the constraint of AC field, it is then focused into.But six grades of bar inscribe garden circular diameters are big
After, the focusing effect in exit is deteriorated, and will lead to after more ions have gone out six grades of bars, diverging has lost, it is difficult under entrance
In grade ion optical path, it is therefore desirable to which the measured ion to be checked of more quantity can be obtained in inlet and go out by finding one kind
Mouthful better focused ion of place's acquisition, at the same also available better detection background to obtain more highly sensitive mode and side
Method.
Summary of the invention
In view of this, needing to overcome at least one of drawbacks described above in the prior art, it is more that the present invention provides one kind
Grade bar ion focusing transmission device, including being located at the ion source component of the first cis-position, the ion lens component of the second cis-position, being located at
The focusing block of third cis-position, the analyzer component positioned at the 4th cis-position and the detector elements positioned at the 5th cis-position, it is described
Focusing block includes the focusing unit of multiple broken lines arrangement, i.e. the first focusing unit, the second focusing unit to the n-th focusing unit,
It is equipped between the ion source component and the ion lens component and is provided through the ion that the ion source component generates
The first partition of the first through hole of beam is equipped between the ion lens component and the focusing block and is provided through through institute
State the second partition of the second through-hole of the ion beam of ion lens focusing, first focusing unit and second focusing unit
Between be equipped be provided through the ion beam through first focusing unit first focus through-hole first focus partition, institute
It states to be equipped between the second focusing unit and the tertiary focusing unit and is provided through the ion through second focusing unit
The second of beam focuses the second focusing partition of through-hole, until, between (n-1) focusing unit and n-th focusing unit
Be equipped be provided through the ion beam through (n-1) focusing unit (n-1) focus through-hole (n-1) focus every
Plate is equipped between n-th focusing unit and the detector elements and is provided through the ion through n-th focusing unit
The n-th of beam focuses the n-th focusing partition of through-hole, is equipped with to be provided between the detector elements and the analyzer component and lead to
Cross the 4th partition of the fourth hole of the ion beam from the analyzer component；The ion lens component, described first gather
Burnt unit, the second focusing unit are until the n-th focusing unit, the analyzer component are all coupled with vacuum system, and work shape
Inner vacuum vessel is formed under state, first focusing unit gathers until being equipped with multistage bar ion inside n-th focusing unit
Burnt transmission part, the multistage bar ion focusing transmission part include that entrance is big and outlet is small and the inlet calibre to it is described go out
The multistage bar focusing structure that mouth bore smoothly successively decreases；
The ion source component emits ion beam, and the vacuum chamber of the ion lens components interior, warp are entered by first through hole
After the ion lens component is focused, described first entered in the focusing block by second through-hole focuses single
The vacuum chamber of member, the second partition and the entrance, described export have gap between the third plate, and described second
The aperture of through-hole according to shaped ion beam at diameter set, the multiple multistage bars of the ion beam by straight line arrangement
Focusing structure, which is focused, focuses through-hole injection by described n-th, and described n-th focuses the bore of through-hole according to the injection
The ion beam of outlet is set, and focuses the inspection that through-hole enters the analyzer component and the 5th cis-position through described n-th
Device component is surveyed to be analyzed and detected.
According to the bore phase described in the prior art, exported due to ion beam entrance and ion beam in this patent background technique
Together, lead to not meet simultaneously and reach the cost that can not go to increase integral device with lower cost or simple method and answer
Miscellaneous degree, while the problem of focusing capability can be promoted again；And the progressive multistage bar ion focusing transmission of broken line disclosed by the invention is set
It is standby, by using the progressive multistage bar ion focusing transmission of the broken line for being greater than ion beam exit caliber with ion beam inlet calibre
Equipment can make mechanism make simple and convenient, can more further decrease the volume of integral device, while can also reduce into
This, can more improve ion focusing ability, promote final detection sensitivity, meanwhile, the structure of this case application is more due to using
The focusing structure that a entrance hole diameter is greater than outlet aperture is used in series, compared with the corresponding focusing structure of used aloned, Neng Gou great
Reduce its overall volume greatly, and use broken line it is progressive it is progressive compared with straight line can further decrease background, promote whole detection
Sensitivity and accuracy, and then further volume can be reduced, simultaneously because effect has obtained circle described in this case
Columnar structures and conical structure should also gradually contract comprising cross section and the consistent structure of size and cross section and size
The structure subtracted should not be limited to the specific word face meaning of this case institute.
Ion source is in the atmospheric pressure outside vacuum, and ion and neutral gas are together by the pressure difference of vacuum and atmospheric pressure
Driving, enters the space structure that entrance is big and outlet is small by first through hole and the second through-hole at a high speed, and bar body applies radio frequency electrical
Behind field and axial gradient electric field, ion convergent coke enters outlet inside multistage bar, from entrance, on the one hand multistage bar entrance mouth
Diameter is big, can make more ions, after small holes rapid expansion, into multistage bar, by the constraint of AC field, then
It focuses；On the other hand due to the device structure of this case application of use, the field strength in space structure can not only be made to further increase,
And outlet size can be made to further decrease, which in turn enhances ion focusing performances, simultaneously as outlet size is further
Reduce, the background of detection can also be further decreased, promote the overall sensitivity of detection.
Meanwhile invention further provides a kind of progressive multistage bar ion focusing transmitting device of broken line, including it is multiple
The focusing unit of broken line arrangement, i.e. the first focusing unit, the second focusing unit to the n-th focusing unit, first focusing unit
It is equipped with to be provided through first of the ion beam through first focusing unit and focus between second focusing unit and lead to
The first of hole focuses partition, is equipped with and is provided through through described between second focusing unit and the tertiary focusing unit
The second of the ion beam of second focusing unit focuses the second focusing partition of through-hole, until, (n-1) focusing unit and institute
It states that (n-1) that is provided through the ion beam through (n-1) focusing unit is installed between the n-th focusing unit and is focused and leads to
(n-1) in hole focuses partition, be equipped on rear side of n-th focusing unit be provided through through n-th focusing unit from
Beamlet n-th focus through-hole n-th focus partition, first focusing unit, the second focusing unit until the n-th focusing unit all
It is coupled with vacuum system, forms inner vacuum vessel under working condition, first focusing unit is until described n-th focuses list
First inside is equipped with multistage bar ion focusing transmission part, and the multistage bar ion focusing transmission part includes entrance greatly and exports
The multistage bar focusing structure that the small and described inlet calibre to the exit caliber is smoothly successively decreased.
Using the use of this multiple cascaded structure, can not only in the case where equivalent effect, substantially reduce integral device or
The volume of device, and better effect can be obtained.
In addition, according to the present invention a kind of progressive multistage bar ion focusing transmitting device of disclosed broken line also have it is following attached
Add technical characteristic:
Further, the multistage bar focusing structure includes more conductive rod pieces, and the conduction rod piece surrounds same central axis
The space symmetr structure that the entrance hole diameter of formation is big, exit caliber is small；Multiple support bases with hollow via-hole, the conducting rod
Part fixed connection is in the hollow cavity of the support base.
Further, the conductive rod piece 4 or 6 or 8.
Further, the conductive rod piece is metal rod or the rod piece or internal with gold with package metal coating
Belong to the rod piece that rod piece outer layer has insulating coating.
Further, the multistage bar focusing structure be include more isometrical conducting rods of root long axis, the long axis is isometrical to lead
Electric pole, at space symmetr structure, forms the isometrical pyramidal structure of long axis that inlet calibre is greater than outlet aperture around same axle center；It is more
A support base, the support base have interior bone, and the isometrical conducting rod fixed connection of long axis is described on the inside of the through-hole
Exit caliber is more than or equal to 2mm, and the isometrical conductive shank diameter of the long axis is more than or equal to1Mm, and be less than or equal to50Mm, the support
Seat is staggeredly coupled with the isometrical conducting rod of the long axis, and is coupled and can be formed inside the conical structure with the long axis conductive electrode bar
Rf electric field and axial gradient electric field external power supply；
Or
The multistage bar focusing structure be include more tapered conductive bars, support base, the more tapered conductive bars surround axis
Line distribution in a center of symmetry and the internal cone space structure with open chamber of formation, the both ends of the cone space structure
Entrance and exit is formed, the inlet calibre is greater than the exit caliber；The support base includes fixing piece, the first conductive plate
With the second conductive plate, the tapered conductive bar and first conductive plate and second conductive plate form the opening
The successively connection of formula chamber interior high-frequency electric field and axial gradient electric field, first conductive plate and second conductive plate
It is fixedly mounted on the fixing piece, the more tapered conductive bar fixed connections are on the inside of the hollow hole of the fixing piece, institute
It states the first conductive plate and second conductive plate is coupled external power supply.
Or
The multistage bar focusing structure be include more bending-type conducting rods, support base, the more bending-type conducting rods surround
Central axes distribution in a center of symmetry and the internal bending space structure with open chamber of formation, shown bending-type conducting rod packet
Flat segments and bending section are included, shown flat segments are cylindrical structure or pyramidal structure, and shown bending section is cylindrical structure or cone
Shape structure, the top end faces of the flat segments are the bottom face of the bending section, and the top of the bending section is to the axis congruence
Combinate form forms inlet calibre greatly and outlet mouth at central axes distributed architecture in a center of symmetry, the bending space structure is surrounded
The small bending space structure of diameter；The support base includes fixing piece, the first conductive plate and the second conductive plate, and described first leads
Electrode plate and second conductive plate are fixedly mounted on the fixing piece, and the more bending-type conducting rod fixed connections exist
On the inside of the hollow hole of the fixing piece, first conductive plate and second conductive plate are coupled external power supply, the folding
Curved conducting rod and first conductive plate and second conductive plate form the open chamber internal high frequency electric field
With the successively connection of axial gradient electric field.
It is cheaper in manufacturing cost using the isometrical conducting rod of long axis, processing and assembly, safeguard it is more convenient, but its
Production when, outlet diameter minimum value is restricted, thus for integral device overall volume reduce there are disadvantages；
Using tapered conductive rod structure, relative to, processing and assembly, maintenance higher using the isometrical conducting rod of long axis in manufacturing cost
Upper slightly complicated, but theoretically exist outlet diameter can infinitesimal advantage, reduce integral device volume on advantage extremely
Obviously；
Using bending conducting rod, the ion beam of inlet can be stablized on the basis of using tapered conductive rod structure, be subsequent
Every process bring better effect, but in terms of volume reduction it is weak with use tapered conductive structure.
Further, the multistage bar focusing structure is tapered conductive bar position when including more tapered conductive bars
There is the first end face around central axes central symmetry distribution, the inclined-plane and the end face in the end face of the inlet
The lesser second end face of opposed facets is being formed close to central axes side；
Or
The multistage bar focusing structure is when including more bending-type conducting rods, and the bending-type conducting rod is located at the inlet
End face there is the first end face around central axes central symmetry distribution, the inclined-plane and the end face are close to central axes
Side forms the lesser second end face of opposed facets；The flat segments are cylindrical structure or pyramidal structure, and shown bending section is
Cylindrical structure or pyramidal structure, the bending-type conducting rod are the independent assortment of above structure.
Preferably, the tapered conductive bar or the bending-type conducting rod are integrally formed.
If larger, the aggregation of this particle size is more for the end face of conducting rod lower end, can generate to entering for ion
Certain inhibition, therefore the end face herein close to central axes is reduced as far as possible, can greatly reduce particle size into
Enter the repulsive interaction of ion, it is possible thereby to make more ions enter cone space inside configuration, so that the result finally detected
More accurate, the specific area of first end face can be adjusted according to specific empirical data, while the tapered conductive bar is
It is integrally formed, as guarantees enough measures of precision, same root timber material is needed to be made.
Further, first focusing unit, the second focusing unit are until the n-th focusing unit is all carried out with vacuum system
It is coupled, forms inner vacuum vessel under working condition, internal vacuum successively increases according to sequence from small to large.
Further, the progressive multistage bar ion focusing transmitting device of the broken line is multiple multistage bar focusing structures
The dislocation of progress is arranged, i.e., the central axes of the described multistage bar focusing structure have dislocation not in same straight line.
Preferably, the dislocation arrangement can be the dislocation arrangement of the circumference on coaxial line, be also possible to coplanar
Dislocation arrangement up and down.
Further, described n-th through-hole aperture is focused less than (n-1) focusing through-hole aperture, until, described second
It focuses through-hole aperture and is less than the first focusing through-hole aperture, described first, which focuses through-hole bore, is less than second openings
Diameter.
Further, the taper that the focusing unit forms space symmetr structure is less than or equal to 30 degree and is greater than 0 degree.
Further, the taper of the space symmetr structure is more than or equal to 0.01 degree.
The additional aspect of the present invention and advantage will be set forth in part in the description, and will partially become from the following description
Obviously, or practice through the invention is recognized.
Detailed description of the invention
Above-mentioned and/or additional aspect of the invention and advantage will become from the following description of the accompanying drawings of embodiments
Obviously and it is readily appreciated that, in which:
Fig. 1 is the structural schematic diagram of the embodiment of the present invention (using 3 focusing block schematic diagrames)；
Fig. 2 is multiple focusing block schematic diagrames that focusing block is progressive using broken line in Fig. 1；
Fig. 3 is the multistage bar focusing structure schematic diagram that the present invention uses the isometrical conducting rod of long axis；
Fig. 4 is the multistage bar focusing structure schematic diagram that the present invention uses tapered conductive bar；
Fig. 5 is the tapered conductive bar schematic diagram in Fig. 4；
Fig. 6 is the multistage bar focusing structure schematic diagram that the present invention uses bending-type conducting rod；
Fig. 7 is the bending-type conducting rod schematic diagram in Fig. 6；
Fig. 8 is partial enlargement diagram in Fig. 5, and end and the corresponding end in Fig. 7 are similar；
Wherein, Figure 1A ion source component, B ion lens component, C focusing block, D analyzer component, E detector elements, downwards
Arrow be vacuumize signal, A1 first through hole, A2 first partition, the second through-hole of B1, B2 second partition, the first focus portion of C1
Part, the second focusing block of C2, C3 tertiary focusing component, C11 first focus through-hole, and C12 first focuses partition, and C21 second is focused
Through-hole, C22 second focus partition, C31 tertiary focusing through-hole, C32 tertiary focusing partition, D1 fourth hole, the 4th partition of D2；.
Specific embodiment
The embodiment of the present invention is described below in detail, examples of the embodiments are shown in the accompanying drawings, wherein from beginning to end
Same or similar label indicates same or similar element or element with the same or similar functions；Below with reference to attached
The embodiment of figure description is exemplary, and for explaining only the invention, and is not construed as limiting the claims.
In the description of the present invention, it is to be understood that, term " on ", "lower", "bottom", "top", "front", "rear",
The orientation or positional relationship of the instructions such as "inner", "outside", " cross ", " perpendicular " is to be based on the orientation or positional relationship shown in the drawings, and is only
For the convenience of describing the present invention and simplifying the description, rather than the device or element of indication or suggestion meaning must have specific side
Position is constructed and operated in a specific orientation, therefore is not considered as limiting the invention.
In the description of the present invention, it should be noted that unless otherwise clearly defined and limited, term " connection " " connects
It is logical ", " connected ", " connection ", " cooperation " shall be understood in a broad sense, for example, it may be being fixedly connected, be integrally connected, be also possible to
It is detachably connected；It can be the connection inside two elements；It can be directly connected, the indirect phase of intermediary can also be passed through
Even；" cooperation " can be the cooperation in face and face, be also possible to the cooperation a little with face or line and face, also include the cooperation of hole axle, right
For those skilled in the art, the concrete meaning of above-mentioned term in the present invention can be understood with concrete condition.
Inventive concept of the invention is as follows, provides a kind of broken line progressive multistage bar ion focusing transmission device, by adopting
The sky small greater than the multistage bar entrance large outlet of ion beam exit caliber with ion beam inlet calibre arranged with multiple straight lines
Between structure, mechanism can be made to make simple and convenient, while certain cost can also be reduced, can more improve ion focusing energy
Power promotes final detection sensitivity, simultaneously because the space structure that this entrance large outlet used is small, can make detection point
The entrance opening dimension for analysing component, can not only greatly promote the precision of detection, and can substantially reduce background noise, simultaneously because
Using this structure, integral device volume is enabled to more to reduce, while can cost be also reduced.
As shown, according to an embodiment of the invention, a kind of progressive multistage bar ion focusing transmission device of broken line,
Including being located at the ion source component of the first cis-position, the ion lens component of the second cis-position, the focusing block positioned at third cis-position, position
Analyzer component in the 4th cis-position and the detector elements positioned at the 5th cis-position, the focusing block include multiple broken line rows
The focusing unit of cloth, i.e. the first focusing unit, the second focusing unit to the n-th focusing unit, the ion source component and it is described from
The first partition for being provided through the first through hole for the ion beam that the ion source component generates is installed between sub-lens component,
The ion beam for being provided through and focusing through the ion lens is installed between the ion lens component and the focusing block
The second through-hole second partition, be equipped between first focusing unit and second focusing unit be provided through through
What the first of the ion beam of first focusing unit focused through-hole first focuses partition, second focusing unit and described the
The second of the second focusing through-hole for being provided through the ion beam through second focusing unit is equipped between three focusing units
Partition is focused, until, it is equipped with and is provided through through described between (n-1) focusing unit and n-th focusing unit
(n-1) that (n-1) of the ion beam of (n-1) focusing unit focuses through-hole focuses partition, n-th focusing unit and institute
It states and the n-th poly- of the be provided through the ion beam through n-th focusing unit n-th focusing through-hole is installed between detector elements
Burnt partition is equipped between the detector elements and the analyzer component and is provided through from the analyzer component
4th partition of the fourth hole of ion beam；The ion lens component, first focusing unit, the second focusing unit until
N-th focusing unit, the analyzer component are all coupled with vacuum system, and inner vacuum vessel is formed under working condition, described
First focusing unit until be equipped with multistage bar ion focusing transmission part inside n-th focusing unit, the multistage bar from
Son focuses transmission part and includes entrance greatly and export the multistage bar that the small and described inlet calibre smoothly successively decreases to the exit caliber
Focusing structure；
The ion source component emits ion beam, and the vacuum chamber of the ion lens components interior, warp are entered by first through hole
After the ion lens component is focused, described first entered in the focusing block by second through-hole focuses single
The vacuum chamber of member, the second partition and the entrance, described export have gap between the third plate, and described second
The aperture of through-hole according to shaped ion beam at diameter set, the multiple multistage bars of the ion beam by straight line arrangement
Focusing structure, which is focused, focuses through-hole injection by described n-th, and described n-th focuses the bore of through-hole according to the injection
The ion beam of outlet is set, and focuses the inspection that through-hole enters the analyzer component and the 5th cis-position through described n-th
Device component is surveyed to be analyzed and detected.
Invention further provides a kind of progressive multistage bar ion focusing transmitting devices of broken line, according to the implementation of this case
Example, the focusing unit including the arrangement of multiple broken lines, i.e. the first focusing unit, the second focusing unit to the n-th focusing unit, described the
It is equipped between one focusing unit and second focusing unit and is provided through the ion beam through first focusing unit
First focuses the first focusing partition of through-hole, is equipped with and is provided between second focusing unit and the tertiary focusing unit
Focus through-hole by second of the ion beam through second focusing unit second focuses partition, until, (n-1) is poly-
It is equipped between burnt unit and n-th focusing unit and is provided through of the ion beam through (n-1) focusing unit
(n-1) (n-1) for focusing through-hole focuses partition, is equipped with to be provided through on rear side of n-th focusing unit and gather through described n-th
The n-th of the ion beam of burnt unit focuses the n-th focusing partition of through-hole, and first focusing unit, the second focusing unit are until n-th
Focusing unit is all coupled with vacuum system, and inner vacuum vessel is formed under working condition, and first focusing unit is until institute
It states and multistage bar ion focusing transmission part is installed inside the n-th focusing unit, the multistage bar ion focusing transmission part includes
Entrance is big and exports the multistage bar focusing structure that the small and described inlet calibre smoothly successively decreases to the exit caliber, is arranged using broken line
Cloth can further decrease volume compared with straight line arrangement and improve whole detection effect.
In addition, a kind of also having for the progressive multistage bar ion focusing transmitting device of broken line disclosed according to the present invention is as follows
Additional technical feature:
According to some embodiments of the present invention, the multistage bar focusing structure includes more conductive rod pieces, and the conduction rod piece encloses
Around the space symmetr structure that the entrance hole diameter that same central axis is formed is big, exit caliber is small；Multiple branch with hollow via-hole
Seat is supportted, the conduction rod piece fixed connection is in the hollow cavity of the support base.
According to some embodiments of the present invention, the conductive rod piece 4 or 6 or 8.
Further, the conductive rod piece is metal rod or has with the rod piece or inside for wrapping up metal coating
Metal rod outer layer has the rod piece of insulating coating.
According to some embodiments of the present invention, the multistage bar focusing structure be include more isometrical conducting rods of root long axis, institute
The isometrical conducting rod of long axis is stated around same axle center into space symmetr structure, it is isometrical greater than the long axis of outlet aperture to form inlet calibre
Pyramidal structure；Multiple support bases, the support base have interior bone, and the isometrical conducting rod fixed connection of long axis is described logical
On the inside of hole, the exit caliber is more than or equal to 2mm, and the isometrical conductive shank diameter of the long axis is more than or equal to1Mm, and be less than or equal to50Mm, the support base are staggeredly coupled with the isometrical conducting rod of the long axis, and are coupled and can form institute with the long axis conductive electrode bar
State the external power supply of the rf electric field and axial gradient electric field inside conical structure；
Or
According to some embodiments of the present invention, the multistage bar focusing structure be include more tapered conductive bars, support base, more
The tapered conductive bar is around central axes distribution in a center of symmetry and formation inside has the cone space structure of open chamber,
The both ends of the cone space structure form entrance and exit, and the inlet calibre is greater than the exit caliber；The support base
Including fixing piece, the first conductive plate and the second conductive plate, the tapered conductive bar and first conductive plate and described
Second conductive plate forms the successively connection of the open chamber internal high frequency electric field and axial gradient electric field, and described first leads
Electrode plate and second conductive plate are fixedly mounted on the fixing piece, and the more tapered conductive bar fixed connections are in institute
On the inside of the hollow hole for stating fixing piece, first conductive plate and second conductive plate are coupled external power supply.
Or
According to some embodiments of the present invention, the multistage bar focusing structure be include more bending-type conducting rods, support base is more
Bending-type conducting rod described in root is around central axes distribution in a center of symmetry and the internal bending space with open chamber of formation
Structure, shown bending-type conducting rod include flat segments and bending section, and shown flat segments are cylindrical structure or pyramidal structure, shown
Bending section is cylindrical structure or pyramidal structure, and the top end face of the flat segments is the bottom face of the bending section, the bending
It converges to be formed around central axes distributed architecture in a center of symmetry, the bending space structure to the central axes in the top of section
Form the bending space structure that inlet calibre is big and exit caliber is small；The support base include fixing piece, the first conductive plate and
Second conductive plate, first conductive plate and second conductive plate are fixedly mounted on the fixing piece, more institutes
Bending-type conducting rod fixed connection is stated on the inside of the hollow hole of the fixing piece, first conductive plate and second conduction
Pole plate is coupled external power supply, and the bending-type conducting rod forms described with first conductive plate and second conductive plate
The successively connection of open chamber internal high frequency electric field and axial gradient electric field.
It is cheaper in manufacturing cost using the isometrical conducting rod of long axis, processing and assembly, safeguard it is more convenient, but its
Production when, outlet diameter minimum value is restricted, thus for integral device overall volume reduce there are disadvantages；
Using tapered conductive rod structure, relative to, processing and assembly, maintenance higher using the isometrical conducting rod of long axis in manufacturing cost
Upper slightly complicated, but theoretically exist outlet diameter can infinitesimal advantage, reduce integral device volume on advantage extremely
Obviously；
Using bending conducting rod, the ion beam of inlet can be stablized on the basis of using tapered conductive rod structure, be subsequent
Every process bring better effect, but in terms of volume reduction it is weak with use tapered conductive structure.
According to some embodiments of the present invention, the multistage bar focusing structure is when including more tapered conductive bars, described
The end face that tapered conductive bar is located at the inlet has the first end face around central axes central symmetry distribution, described oblique
Face and the end face are forming the lesser second end face of opposed facets close to central axes side；
Or
According to some embodiments of the present invention, the multistage bar focusing structure is folding when including more bending-type conducting rods
The end face that curved conducting rod is located at the inlet has the first end face around central axes central symmetry distribution, described oblique
Face and the end face are forming the lesser second end face of opposed facets close to central axes side；The flat segments are cylindrical structure
Or pyramidal structure, shown bending section are cylindrical structure or pyramidal structure, the bending-type conducting rod is the freedom of above structure
Combination.
Preferably, the tapered conductive bar or the bending-type conducting rod are integrally formed.
If larger, the aggregation of this particle size is more for the end face of conducting rod lower end, can generate to entering for ion
Certain inhibition, therefore the end face herein close to central axes is reduced as far as possible, can greatly reduce particle size into
Enter the repulsive interaction of ion, it is possible thereby to make more ions enter cone space inside configuration, so that the result finally detected
More accurate, the specific area of first end face can be adjusted according to specific empirical data, while the tapered conductive bar is
It is integrally formed, as guarantees enough measures of precision, same root timber material is needed to be made.
According to some embodiments of the present invention, flat segments described in the bending-type conducting rod are cylindrical structure or taper
Structure, shown bending section are cylindrical structure or pyramidal structure, and the bending-type conducting rod is the independent assortment of above structure.
According to one embodiment of present invention, the flat segments are cylindrical type, and the bending section is cylindrical type, straight at this time
Space electric field in section is uniform, and bending section space electric field can gradually becoming smaller and enhance due to space bore, but the outlet
Bore can not further reduce because cylinder type end side is uniform, i.e., caliber size will receive limitation.
According to one embodiment of present invention, the flat segments are cylindrical type, and the bending section is pyramid type, straight at this time
Space electric field in section is uniform, and bending section space electric field can gradually becoming smaller and enhance due to space bore, simultaneously because circle
Itself cross sectional dimensions of tapered rod piece is also reducing, and will also result in the enhancing of corresponding field strength, meanwhile, the exit caliber can be with
Further reduce, theoretically can be infinitely small, this can greatly improve the environment in exit, specific number can by test into
Row determines.
According to one embodiment of present invention, the flat segments are pyramid type, and the bending section is cylindrical type, this embodiment
In, the flat segments conical structure variation then needs gently, and in favor of entering the stabilization of air-flow at a high speed, bending section then can be according to reality
Border needs to be adjusted, and major function is for ion focusing.
According to one embodiment of present invention, the flat segments are pyramid type, and the bending section is pyramid type, this embodiment
In, flat segments conical structure variation then need it is gentle, in favor of entering the stabilization of air-flow at a high speed, flat segments itself taper and
Flat segments angle, is determined according to actual needs, and bending section can then be adjusted according to actual needs, in the present embodiment, institute
The bore for stating outlet theoretically can also be infinitely small, and major function is for ion focusing.
According to one embodiment of present invention, first focusing unit, the second focusing unit until the n-th focusing unit all
Be coupled with vacuum system, form inner vacuum vessel under working condition, internal vacuum according to sequence from small to large successively
Increase.
According to some embodiments of the present invention, the progressive multistage bar ion focusing transmitting device of the broken line is multiple described
The dislocation arrangement that multistage bar focusing structure carries out, i.e., the central axes of the described multistage bar focusing structure are not in same straight line, and there are mistakes
Position.
According to some embodiments of the present invention, the dislocation arrangement can be the dislocation arrangement of the circumference on coaxial line,
It is also possible to the coplanar arrangement of dislocation up and down, but the structure arranged not avoid ion beam from occurring deviating or losing showing for ion
As to guarantee the accuracy and sensitivity that finally detect.
According to some embodiments of the present invention, described n-th through-hole aperture is focused less than (n-1) focusing through-hole hole
Diameter, until, described second, which focuses through-hole aperture, is less than the first focusing through-hole aperture, and the first focusing through-hole bore is less than
The second through-hole bore.
According to some embodiments of the present invention, the taper that the focusing unit forms space symmetr structure is less than or equal to 30 degree
And it is greater than 0 degree.
According to some embodiments of the present invention, the taper of the space symmetr structure is more than or equal to 0.01 degree.
It is any to refer to that " one embodiment ", " embodiment ", " illustrative examples " etc. mean to combine embodiment description
Specific component, structure or feature are included at least one embodiment of the present invention；This specification everywhere this schematically
Statement is not necessarily referring to identical embodiment；Moreover, when combining any embodiment to describe specific component, structure or feature
When, advocated, component, structure or feature in conjunction with as the realization of other embodiments all fall within those skilled in the art
Within the scope of.
Although having carried out detailed retouch to a specific embodiment of the invention referring to multiple illustrative examples of the invention
It states, it must be understood that those skilled in the art can be designed that various other improvement and embodiment, these improve and implement
Example will be fallen within spirit and scope；Specifically, in aforementioned disclosure, attached drawing and the scope of the claims
Within, reasonable variations and modifications can be made in terms of the arrangement that components and/or sub-combination are laid out, without departing from
Spirit of the invention；In addition to components and/or the variations and modifications of layout aspect, range is by appended claims and its is equal
Object limits.
Claims (12)
1. a kind of progressive multistage bar ion focusing transmission device of broken line, which is characterized in that the ion including being located at the first cis-position
Source block, the ion lens component of the second cis-position, positioned at the focusing block of third cis-position, positioned at the analyzer component of the 4th cis-position
And the detector elements positioned at the 5th cis-position, the focusing block include the focusing unit of multiple broken line arrangements, i.e., first is poly-
Burnt unit, the second focusing unit to the n-th focusing unit, are equipped between the ion source component and the ion lens component and set
Set the first partition of the first through hole of the ion beam generated by the ion source component, the ion lens component with it is described
The second partition for being provided through the second through-hole of the ion beam focused through the ion lens, institute are installed between focusing block
It states to be equipped between the first focusing unit and second focusing unit and is provided through the ion through first focusing unit
The first of beam focuses the first focusing partition of through-hole, is equipped with and sets between second focusing unit and the tertiary focusing unit
The the second focusing partition for focusing through-hole by second of the ion beam through second focusing unit has been set, until, (the n-
1) it is equipped between focusing unit and n-th focusing unit and is provided through the ion beam through (n-1) focusing unit
(n-1) focus through-hole (n-1) focus partition, be equipped between n-th focusing unit and the detector elements
It is provided through n-th of the ion beam through n-th focusing unit the n-th focusing partition for focusing through-hole, the detector elements
The of the fourth hole for being provided through the ion beam from the analyzer component is equipped between the analyzer component
Four partitions；The ion lens component, first focusing unit, the second focusing unit are until the n-th focusing unit, the analysis
Device component is all coupled with vacuum system, and inner vacuum vessel is formed under working condition, and first focusing unit is until described
Multistage bar ion focusing transmission part is installed inside the n-th focusing unit, the multistage bar ion focusing transmission part include into
Mouth is big and exports the multistage bar focusing structure that the small and described inlet calibre smoothly successively decreases to the exit caliber；
The ion source component emits ion beam, and the vacuum chamber of the ion lens components interior, warp are entered by first through hole
After the ion lens component is focused, described first entered in the focusing block by second through-hole focuses single
The vacuum chamber of member, the second partition and the entrance, described export have gap between the third plate, and described second
The aperture of through-hole according to shaped ion beam at diameter set, the multiple multistage bars of the ion beam by straight line arrangement
Focusing structure, which is focused, focuses through-hole injection by described n-th, and described n-th focuses the bore of through-hole according to the injection
The ion beam of outlet is set, and focuses the inspection that through-hole enters the analyzer component and the 5th cis-position through described n-th
Device component is surveyed to be analyzed and detected.
2. a kind of for weighing the progressive multistage bar ion of broken line of the progressive multistage bar ion focusing transmission device of broken line described in 1
Focus transmitting device, which is characterized in that the focusing unit including the arrangement of multiple broken lines, i.e. the first focusing unit, second focus list
Member is equipped between first focusing unit and second focusing unit and is provided through through described to the n-th focusing unit
The first of the ion beam of first focusing unit focuses the first focusing partition of through-hole, and second focusing unit and the third are poly-
It is equipped between burnt unit and is provided through second of the ion beam through second focusing unit the second focusing for focusing through-hole
Partition, until, it is equipped with and is provided through through (the n- between (n-1) focusing unit and n-th focusing unit
1) (n-1) that (n-1) of the ion beam of focusing unit focuses through-hole focuses partition, installation on rear side of n-th focusing unit
There is be provided through the ion beam through n-th focusing unit n-th to focus the n-th of through-hole and focus partition, described first focuses
Unit, the second focusing unit until the n-th focusing unit be all coupled with vacuum system, form inner vacuum under working condition
Room, first focusing unit is equipped with multistage bar ion focusing transmission part inside n-th focusing unit, described more
Grade bar ion focusing transmission part is big comprising entrance and exports what the small and described inlet calibre smoothly successively decreased to the exit caliber
Multistage bar focusing structure.
3. a kind of progressive multistage bar ion focusing transmitting device of broken line according to claim 2, which is characterized in that described
Multistage bar focusing structure includes more conductive rod pieces, the conduction rod piece is big around the entrance hole diameter that same central axis is formed,
The small space symmetr structure of exit caliber；Multiple support bases with hollow via-hole, the conduction rod piece fixed connection is described
In the hollow cavity of support base.
4. a kind of progressive multistage bar ion focusing transmitting device of broken line according to claim 3, which is characterized in that described
Conductive rod piece 4 or 6 or 8.
5. a kind of progressive multistage bar ion focusing transmitting device of broken line according to claim 3, which is characterized in that described
Conductive rod piece is metal rod or has insulating coating with metal rod outer layer with the rod piece or inside for wrapping up metal coating
Rod piece.
6. a kind of progressive multistage bar ion focusing transmitting device of broken line according to claim 3, which is characterized in that described
Multistage bar focusing structure be include more isometrical conducting rods of root long axis, the isometrical conducting rod of long axis is around same axle center at space pair
Claim structure, forms the isometrical pyramidal structure of long axis that inlet calibre is greater than outlet aperture；Multiple support bases, the support base have interior
Portion's through-hole, for the isometrical conducting rod fixed connection of long axis on the inside of the through-hole, the exit caliber is more than or equal to 2mm, described
The isometrical conductive shank diameter of long axis is more than or equal to1Mm, and be less than or equal to50Mm, the support base and the isometrical conducting rod of the long axis are handed over
Error connection knot, and it is coupled the rf electric field and axial gradient electric field that can be formed with the long axis conductive electrode bar inside the conical structure
External power supply；
Or
The multistage bar focusing structure be include more tapered conductive bars, support base, the more tapered conductive bars surround axis
Line distribution in a center of symmetry and the internal cone space structure with open chamber of formation, the both ends of the cone space structure
Entrance and exit is formed, the inlet calibre is greater than the exit caliber；The support base includes fixing piece, the first conductive plate
With the second conductive plate, the tapered conductive bar and first conductive plate and second conductive plate form the opening
The successively connection of formula chamber interior high-frequency electric field and axial gradient electric field, first conductive plate and second conductive plate
It is fixedly mounted on the fixing piece, the more tapered conductive bar fixed connections are on the inside of the hollow hole of the fixing piece, institute
It states the first conductive plate and second conductive plate is coupled external power supply；
Or
The multistage bar focusing structure be include more bending-type conducting rods, support base, the more bending-type conducting rods surround
Central axes distribution in a center of symmetry and the internal bending space structure with open chamber of formation, shown bending-type conducting rod packet
Flat segments and bending section are included, shown flat segments are cylindrical structure or pyramidal structure, and shown bending section is cylindrical structure or cone
Shape structure, the top end faces of the flat segments are the bottom face of the bending section, and the top of the bending section is to the axis congruence
Combinate form forms inlet calibre greatly and outlet mouth at central axes distributed architecture in a center of symmetry, the bending space structure is surrounded
The small bending space structure of diameter；The support base includes fixing piece, the first conductive plate and the second conductive plate, and described first leads
Electrode plate and second conductive plate are fixedly mounted on the fixing piece, and the more bending-type conducting rod fixed connections exist
On the inside of the hollow hole of the fixing piece, first conductive plate and second conductive plate are coupled external power supply, the folding
Curved conducting rod and first conductive plate and second conductive plate form the open chamber internal high frequency electric field
With the successively connection of axial gradient electric field.
7. a kind of progressive multistage bar ion focusing transmitting device of broken line according to claim 6, which is characterized in that institute
It states multistage bar focusing structure to be when including more tapered conductive bars, the end face that the tapered conductive bar is located at the inlet has
Around the first end face of central axes central symmetry distribution, the inclined-plane is forming phase close to central axes side with the end face
To the lesser second end face in inclined-plane；
Or
The multistage bar focusing structure is when including more bending-type conducting rods, and the bending-type conducting rod is located at the inlet
End face there is the first end face around central axes central symmetry distribution, the inclined-plane and the end face are close to central axes
Side forms the lesser second end face of opposed facets；The flat segments are cylindrical structure or pyramidal structure, and shown bending section is
Cylindrical structure or pyramidal structure, the bending-type conducting rod are the independent assortment of above structure.
8. a kind of progressive multistage bar ion focusing transmitting device of broken line according to claim 7, which is characterized in that described
Tapered conductive bar or the bending-type conducting rod are integrally formed.
9. a kind of progressive multistage bar ion focusing transmitting device of broken line according to claim 2, which is characterized in that described
First focusing unit, the second focusing unit are until the n-th focusing unit is all coupled with vacuum system, under working condition in formation
Portion's vacuum chamber, internal vacuum successively increase according to sequence from small to large.
10. a kind of progressive multistage bar ion focusing transmitting device of broken line according to claim 2, which is characterized in that institute
Stating the progressive multistage bar ion focusing transmitting device of broken line is the dislocation arrangement that multiple multistage bar focusing structures carry out, i.e. institute
The central axes of multistage bar focusing structure are stated not in same straight line, there is dislocation.
11. according to claim 1 or a kind of progressive multistage bar ion focusing transmitting device of straight line described in power 2, feature
It is, described n-th, which focuses through-hole aperture, is less than (n-1) focusing through-hole aperture, until, described second focuses through-hole aperture
Through-hole aperture is focused less than described first, described first, which focuses through-hole bore, is less than the second through-hole bore.
12. a kind of progressive multistage bar ion focusing transmitting device of straight line according to claim 1, which is characterized in that
The taper that the focusing unit forms space symmetr structure is less than or equal to 30 degree and is greater than 0 degree.
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| CN201910286636.XA CN110010443B (en) | 2019-04-10 | 2019-04-10 | Broken line progressive multi-stage rod ion focusing transmission equipment and device |
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| CN201910286636.XA CN110010443B (en) | 2019-04-10 | 2019-04-10 | Broken line progressive multi-stage rod ion focusing transmission equipment and device |
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| CN110010443B (en) | 2024-09-03 |
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