CN110010163A - A kind of data in magnetic disk holding capacity test method and relevant apparatus - Google Patents
A kind of data in magnetic disk holding capacity test method and relevant apparatus Download PDFInfo
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- CN110010163A CN110010163A CN201910304980.7A CN201910304980A CN110010163A CN 110010163 A CN110010163 A CN 110010163A CN 201910304980 A CN201910304980 A CN 201910304980A CN 110010163 A CN110010163 A CN 110010163A
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Abstract
The invention discloses a kind of data in magnetic disk holding capacity test methods, system, device and computer readable storage medium, uninterrupted test is carried out to the first test sample in the first preset temperature range, it is that its P/E reaches 100%, first test sample is carried out again verify write operation totally in the second preset temperature range and obtains the first disk to be verified, the first failed disk number that loss of data occurs is determined by carrying out write check to the first disk to be verified that room temperature is transferred to the first preset time, and judge whether the data retention of the corresponding all disks to be measured of the first test sample is qualified with this.It can be seen that, in this programme, it needs to carry out different test operations in different temperatures before testing test sample, to make test sample closer to the disk of maximum consumption state within the scope of true data retention period, so as to carry out the test of data holding ability to disk, and test result is also more accurate.
Description
Technical field
The present invention relates to magnetic disc field, more specifically to a kind of data in magnetic disk holding capacity test method,
System, device and computer readable storage medium.
Background technique
Nand flash memory is a kind of storage equipment more better than hard disk drive, the table in the low capacity application no more than 4GB
Now be still obvious.As people persistently pursue, power consumption is lower, weight is lighter and performance more preferably product, NAND are proved to pole
It is attractive.Nand flash memory is a kind of nonvolatile storage technologies, that is, remains to save data after powering off.Its developing goal is just
It is to reduce every bit storage cost, improve memory capacity.
Due to the characteristic of nand flash memory medium itself, charge can leak as time goes by, eventually result in
Corrupt data cannot normally be read.
Floating transistor is NAND basic unit, its structure is topmost control layer, and centre is floating gate layer, on floating gate
Face is polysilicon oxide layer.When control voltage is very high, quantum tunneling effect can be generated, electronics goes out from substrate substrate
Hair, oxide layer of passing through tunnel save into floating gate, just complete write operation.Conversely, adding very strong negative electricity in control layer
Pressure, electronics just from floating gate quantum tunneling, return to substrate, this operation is called erasing.But, when voltage is not added in control layer,
Still there is electric field to generate in oxide layer, be called intrinsic electrical field, it be by floating gate inside electronics generate.In this electricity
Under the action of, electrons are slowly leaked from floating gate, and when leakage rate is larger, mistake will occur for data.From write operation, arrive
Electronics slowly leaks, and until corrupt data, this time limit is called data retention period, and data retention period embodies the data of disk
Holding capacity does not lose the ability of data, very heavy to the detection of data holding ability for the reliability that disk uses
It wants.
Therefore, how data in magnetic disk holding capacity is accurately tested, is those skilled in the art's problem to be solved.
Summary of the invention
The purpose of the present invention is to provide a kind of data in magnetic disk holding capacity test method, system, device and computers can
Storage medium is read, to solve the problems, such as how accurately to test data in magnetic disk holding capacity.
To achieve the above object, the embodiment of the invention provides following technical solutions:
A kind of data in magnetic disk holding capacity test method, comprising:
The first test sample is determined in disk to be measured, to first test sample in the first preset temperature range
Uninterrupted load testing is carried out, the P/E value of first test sample is made to reach 100%；
First test sample for reaching 100% to P/E value in the second preset temperature range carries out verification totally and writes
Operation, obtains the first disk to be verified；Wherein, the minimum value of second preset temperature range is greater than the described first default temperature
Range maximum value is spent, and difference is the first default value；
Write check operation is carried out to the described first disk to be verified for placing the first preset time at normal temperature, determines hair
First failed disk number of raw loss of data；
The data retention of the disk to be measured is determined using the first failed disk number and default disk failure rate
It is whether qualified.
Wherein, first preset range is less than or equal to 25 degrees Celsius；Second preset temperature range is taken the photograph for 40
Family name's degree.
Wherein, first preset time is the time more than or equal to 50h.
Wherein, the number that the disk to be measured is determined using the first failed disk number and default disk failure rate
According to hold capacity it is whether qualified before, further includes:
The second test sample is determined in the disk to be measured, to second test in third preset temperature range
Sample carries out uninterrupted load testing, and the P/E value of second test sample is made to reach 100%；Wherein, the third is pre-
If the minimum value of temperature range is greater than the maximum value of first preset temperature range, and difference is the second default value, described
Second default value is greater than first default value；
Second test sample for reaching 100% to P/E value in second preset temperature range carries out overall school
Write operation is tested, the second disk to be verified is obtained；
Write check is carried out to the described second disk to be verified for placing the second preset time in the 4th preset temperature range
Operation determines the second failed disk number that loss of data occurs；Wherein, the minimum value of the 4th preset temperature range is greater than
The minimum value of the third preset temperature range；
It is then described to determine whether the disk to be measured closes with default disk failure rate using the first failed disk number
Lattice, comprising:
Institute is determined using the first failed disk number, the second failed disk number and the default disk failure rate
Whether the data retention for stating disk to be measured is qualified.
Wherein, the third preset temperature range is between 60 degrees Celsius and 74 degrees Celsius, including 60 degrees Celsius are taken the photograph with 74
Family name's degree；4th preset temperature range is more than or equal to 66 degrees Celsius.
Wherein, second preset time is the time more than or equal to 4 days.
Wherein, the uninterrupted load testing, comprising:
Software, which is generated, using load runs JESD219workload.
To achieve the above object, present invention also provides a kind of data in magnetic disk holding capacity test macros, comprising:
Low temperature load testing module, for determining the first test sample in disk to be measured, to the first preset temperature range
Interior first test sample carries out uninterrupted load testing, and the P/E value of first test sample is made to reach 100%；
Low temperature verifies writing module, and described first for reaching 100% to P/E value in the second preset temperature range is surveyed
This progress of sample verifies write operation totally, obtains the first disk to be verified；Wherein, the minimum of second preset temperature range
Value is greater than the first preset temperature range maximum value, and difference is the first default value；
Low temperature write check module, for place at normal temperature the described first disk to be verified of the first preset time into
Row write verification operation determines the first failed disk number that loss of data occurs；
Crash rate test module, for using the first failed disk number and default disk failure rate determine it is described to
Whether the data retention for surveying disk is qualified.
To achieve the above object, present invention also provides a kind of data in magnetic disk holding capacity test devices, comprising:
Memory, for storing computer program；
Processor is realized when for executing the computer program such as the data in magnetic disk holding capacity test method
Step.
To achieve the above object, described computer-readable to deposit present invention also provides a kind of computer readable storage medium
It is stored with computer program on storage media, realizes that the data in magnetic disk such as is kept when the computer program is executed by processor
The step of aptitude tests method.
By above scheme it is found that a kind of data in magnetic disk holding capacity test method provided by the invention, comprising: to
It surveys and determines the first test sample in disk, first test sample in the first preset temperature range is uninterruptedly born
Test is carried, the P/E value of first test sample is made to reach 100%；P/E value is reached in the second preset temperature range
100% first test sample carries out verification write operation totally, obtains the first disk to be verified；Wherein, described second is pre-
If the minimum value of temperature range is greater than the first preset temperature range maximum value, and difference is the first default value；To normal
Lower the described first disk to be verified for placing the first preset time of temperature carries out write check operation, determines and occurs the of loss of data
One failed disk number；Determine that the data of the disk to be measured are protected using the first failed disk number and default disk failure rate
Whether qualified deposit ability.
It can be seen that a kind of data in magnetic disk holding capacity test method provided by the present application, to the first preset temperature range
The first interior test sample carries out uninterrupted test, is that its P/E reaches 100%, then presets to first test sample second
Verification write operation totally is carried out in temperature range and obtains the first disk to be verified, by transferring room temperature to the first preset time
The first disk to be verified carry out write check to determine the first failed disk number that loss of data occurs, and judge first with this
Whether the data retention of the corresponding all disks to be measured of test sample is qualified.As it can be seen that in the present solution, to test sample
It needs to carry out different test operations in different temperatures before being tested, to make test sample closer to true data
The disk of maximum consumption state within the scope of storage life so as to carry out the test of data holding ability to disk, and is tested
As a result also more accurate.Present invention also provides a kind of data in magnetic disk holding capacity test macro, device and computer-readable deposit
Above-mentioned technical effect equally may be implemented in storage media.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, below will to embodiment or
Attached drawing needed to be used in the description of the prior art is briefly described, it should be apparent that, the accompanying drawings in the following description is only
Some embodiments of the present invention, for those of ordinary skill in the art, without creative efforts, also
Other drawings may be obtained according to these drawings without any creative labor.
Fig. 1 is a kind of data in magnetic disk holding capacity test method flow chart disclosed by the embodiments of the present invention；
Fig. 2 is a kind of specific data in magnetic disk holding capacity test method flow chart disclosed by the embodiments of the present invention；
Fig. 3 is a kind of data in magnetic disk holding capacity test system structure schematic diagram disclosed by the embodiments of the present invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts it is all its
His embodiment, shall fall within the protection scope of the present invention.
The embodiment of the invention discloses a kind of data in magnetic disk holding capacity test method, system, devices and computer-readable
Storage medium, to solve the problems, such as how accurately to test data in magnetic disk holding capacity.
Referring to Fig. 1, a kind of data in magnetic disk holding capacity test method provided in an embodiment of the present invention is specifically included:
S101 determines the first test sample in disk to be measured, to first test in the first preset temperature range
Sample carries out uninterrupted load testing, and the P/E value of first test sample is made to reach 100%.
Whether test is qualified with the data holding ability of a batch of disk, needs to detect its NAND
Whether (NAND flash memory, computer flash memory device) occurs number within the scope of corresponding data retention period
According to the problem of loss.In order to shorten test period, disk can't used naturally data retention period corresponding in this programme
Time after tested again, but testability consumption is carried out to disk under particular circumstances, it is made to reach most true in advance
Data retention period within the scope of maximum consumption degree, then carry out the test of data loss rate again.
Firstly, determining the first test sample in disk to be tested, the first test sample is then placed in the first default temperature
It spends in range.It should be noted that the first test sample can be multiple.Continual load is carried out to the first test sample
Test, makes its P/E value reach the index that 100%, P/E is solid state hard disk.Mean data writing how many.It needs to illustrate
, data retention goes wrong typically in disk using just occurring after repeatedly, and new disk will not go out substantially
Existing data retention issues, therefore, more accurate test result in order to obtain, first to the first test sample in this programme
Load testing is carried out, it is made to become " old disk " from " new disk ".
S102, first test sample for reaching 100% to P/E value in the second preset temperature range carry out overall
Write operation is verified, the first disk to be verified is obtained；Wherein, the minimum value of second preset temperature range is greater than described first
Preset temperature range maximum value, and difference is the first default value.
After the P/E value of all first test samples reaches 100%, verification is carried out to all first test samples and is write
Operation.That is, the data whether lost for verifying data are written totally to the first test sample.
It should be noted that verification write operation is that data are first written into disk, then in subsequent progress write operation verification
During, consistent when reading the data of write-in, and whether judging the data read out with write-in, unanimously then explanation does not have
Otherwise loss of data illustrates that data have loss.It should be noted that verification write operation refers to that " writing " operates, and write check operates
Refer to that " verification " operates.
Generally, it when verification is write, on the one hand needs to write data into disk, on the other hand also needs to record write-in magnetic
What the data of disk are, to verify.It is specifically verified in the operational instances write at one, can recorde the number of write-in disk
According to MD5 value, then the later period carry out write check operation when, calculate the MD5 value of the data read, judge that two MD5 values are
It is no identical, if the same illustrate that data are not lost, otherwise illustrate loss of data, to obtain whether data are lost.
It is understood that also can choose the calculated result of other Encryption Algorithm as verification foundation, in this programme in addition to MD5 value
In, it does not do specifically defined.
S103 carries out write check operation to the described first disk to be verified for placing the first preset time at normal temperature, really
Surely the first failed disk number of loss of data occurs.
Specifically, after placing above-mentioned first the first preset time of disk to be tested at normal temperature, to the first disk to be verified
Write check operation is carried out, that is, determines whether data have occurred loss situation, and is determined in the first test sample, data occur and lose
The disk number for losing situation, as the first failed disk number.
S104 determines that the data of the disk to be measured are protected using the first failed disk number and default disk failure rate
Whether qualified deposit ability.
In the present solution, be preset with disk failure rate, if in test sample, the total number of samples of failed disk Zhan
Ratio within the scope of default disk failure rate, then it is assumed that the data retention of disk to be tested is qualified, otherwise unqualified.
It should be noted that above-mentioned first preset temperature range, the second preset temperature range, the first preset time
To be determined according to the optimum temperature of the data storage capacities of the data retention period and NAND of disk, disk can be made according to temperature
Difference reach maximum consumption degree in data retention period as early as possible.
The data retention period of disk is generally 3 months at present, the optimum temperatures of the data storage capacities of NAND be T≤
25 DEG C, T is temperature.In a specific embodiment, first preset range is less than or equal to 25 degrees Celsius；Institute
Stating the second preset temperature range is 40 degrees Celsius.
First preset time is the time more than or equal to 50h in another particular embodiment of the invention.
It can be seen that a kind of data in magnetic disk holding capacity test method provided by the embodiments of the present application, to the first default temperature
The first test sample spent in range carries out uninterrupted test, is that its P/E reaches 100%, then to first test sample the
Verification write operation totally is carried out in two preset temperature ranges and obtains the first disk to be verified, by transferring to first in advance to room temperature
If the disk to be verified of the first of time carries out write check to determine the first failed disk number that loss of data occurs, and is sentenced with this
Whether the data retention of the disconnected corresponding all disks to be measured of first test sample is qualified.As it can be seen that in the present solution, to survey
Sample needs to carry out different test operations in different temperatures before originally being tested, to make test sample closer to really
Data retention period within the scope of maximum consumption state disk, so as to disk carry out data holding ability test,
And test result is also more accurate.
A kind of specific data in magnetic disk holding capacity test method provided by the embodiments of the present application is introduced below,
A kind of data in magnetic disk holding capacity test method described below can be cross-referenced with above-described embodiment.
Referring to fig. 2, a kind of specific data in magnetic disk holding capacity test method provided by the embodiments of the present application is specific to wrap
It includes:
S201 determines the first test sample in disk to be measured, to first test in the first preset temperature range
Sample carries out uninterrupted load testing, and the P/E value of first test sample is made to reach 100%.
S202, first test sample for reaching 100% to P/E value in the second preset temperature range carry out overall
Write operation is verified, the first disk to be verified is obtained；Wherein, the minimum value of second preset temperature range is greater than described first
Preset temperature range maximum value, and difference is the first default value；
S203 carries out write check operation to the described first disk to be verified for placing the first preset time at normal temperature, really
Surely the first failed disk number of loss of data occurs.
S204 determines the second test sample, to described second in third preset temperature range in the disk to be measured
Test sample carries out uninterrupted load testing, and the P/E value of second test sample is made to reach 100%；Wherein, described
The minimum value of three preset temperature ranges is greater than the maximum value of first preset temperature range, and difference is the second default value,
Second default value is greater than first default value.
In the present solution, in order to choose test result more fully, really on the basis of the first test sample, then
A part of sample is tested at relatively high temperatures as the second test sample.
Specifically, the second test sample is determined in disk to be measured, to the second test specimens in third preset temperature range
The uninterrupted load testing of this progress, the particular content about uninterrupted load testing is same as the previously described embodiments, in this programme
No longer repeated.
In a specific embodiment, the uninterrupted load testing, comprising: generate software using load and run
JESD219workload.JESD tissue is the global standards setting organizations about solid state technology, is in industry weighed
Prestige is higher, so JESD219workload is preferentially selected to carry out load testing.
It should be noted that the minimum value of the default warm range of third is greater than the maximum value of the first preset temperature range, also
It is to say, the load testing environment temperature of the second test sample is higher than the first test sample.And difference is the second present count
Value, the second default value are greater than the first default value, that is to say, that the minimum value of third preset temperature range is than above-mentioned reality
The minimum value for applying the second preset temperature range that verification write operation is carried out in example is big.
S205, second test sample for reaching 100% to P/E value in second preset temperature range carry out
Verification write operation totally, obtains the second disk to be verified.
In the present solution, first again in the second preset temperature range to P/E value reach 100% the second test sample into
Row verifies write operation totally, obtains the second disk to be verified.
S206 carries out the described second disk to be verified that the second preset time is placed in the 4th preset temperature range
Write check operation, determines the second failed disk number that loss of data occurs；Wherein, the minimum of the 4th preset temperature range
Value is greater than the minimum value of the third preset temperature range.
Firstly, the above-mentioned second disk to be verified is placed the second preset time in the 4th preset temperature range, to second
Disk to be verified carries out write check operation, so that it is determined that the second failed disk number that the second test sample is sent.
S207, it is true using the first failed disk number, the second failed disk number and the default disk failure rate
Whether the data retention of the fixed disk to be measured is qualified.
In the present solution, can more fully test magnetic to be measured using the first failed disk number and the second failed disk number
Whether the data retention of disk is qualified.
The data retention period of disk is generally 3 months at present, the optimum temperatures of the data storage capacities of NAND be T≤
25 DEG C, T is temperature.Corresponding such disk, in a specific embodiment, the third preset temperature range is taken the photograph for 60
Between family name's degree and 74 degrees Celsius, including 60 degrees Celsius and 74 degrees Celsius；4th preset temperature range is more than or equal to 66
Degree Celsius.
Second preset time is the time more than or equal to 4 days in another particular embodiment of the invention.
A kind of specific data in magnetic disk holding capacity test method provided by the embodiments of the present application is introduced below,
A kind of specific data in magnetic disk holding capacity test method described below, specifically includes:
The first step, the test sample work of disk to be measured are 100 pieces of disks, and 50% disk conduct is determined in test sample
First test sample determines that 50% is used as the second test sample in test sample.
Second step generates software operation JESD219workload by load and is uninterruptedly surveyed to the first test sample
Examination, until the P/E value of the first test sample is write 100%.
Third step carries out verification totally using tool at 40 DEG C to the first test sample for completing second step and writes.
4th step is placed big to the first test sample for completing third step under the conditions of 10 DEG C≤T≤30 DEG C of temperature
In or equal to 50h.
5th step generates software operation by load under the conditions of temperature 60 C≤T≤74 DEG C
JESD219workload carries out uninterrupted test to the second test sample, until the P/E value of the second test sample is write
100%.
6th step carries out verification totally to the second test sample for completing the 5th step by tool at 40 DEG C and writes.
7th step, temperature T >=66 DEG C at, to complete the 6th step the second test sample place be greater than or equal to 4 days.
8th step determines in the first test sample for completing the 4th step, the disk number of loss of data occurs；It determines and completes
In second test sample of the 7th step, there is the disk number of loss of data.
9th step, determines whether the disk sum for loss of data occur is greater than or presets disk failure number 1, if so,
The corresponding data in magnetic disk hold capacity to be measured of test sample is unqualified, otherwise qualified.
A kind of data in magnetic disk holding capacity test macro provided by the embodiments of the present application is introduced below, is hereafter retouched
A kind of data in magnetic disk holding capacity test macro and any of the above-described embodiment stated can be cross-referenced.
Referring to Fig. 3, a kind of data in magnetic disk holding capacity test macro provided by the embodiments of the present application is specifically included:
Low temperature load testing module 301, for determining the first test sample in disk to be measured, to the first preset temperature
First test sample in range carries out uninterrupted load testing, reaches the P/E value of first test sample
100%.
Low temperature verifies writing module 302, for reaching described the first of 100% to P/E value in the second preset temperature range
Test sample carries out verification write operation totally, obtains the first disk to be verified；Wherein, second preset temperature range is most
Small value is greater than the first preset temperature range maximum value, and difference is the first default value.
Low temperature write check module 303, for the described first disk to be verified for placing the first preset time at normal temperature
Write check operation is carried out, determines the first failed disk number that loss of data occurs.
Crash rate test module 304, described in being determined using the first failed disk number and default disk failure rate
Whether the data retention of disk to be measured is qualified.
In a specific embodiment, first preset range is less than or equal to 25 degrees Celsius；Described second
Preset temperature range is 40 degrees Celsius.
In a specific embodiment, first preset time is the time more than or equal to 50h.
In a specific embodiment, the system, further includes:
High temperature loading test module, for determining the second test sample in the disk to be measured, to third preset temperature
Second test sample in range carries out uninterrupted load testing, reaches the P/E value of second test sample
100%；Wherein, the minimum value of the third preset temperature range is greater than the maximum value of first preset temperature range, and poor
Value is the second default value, and second default value is greater than first default value；
High temperature verifies writing module, for reaching described the of 100% to P/E value in second preset temperature range
Two test samples carry out verification write operation totally, obtain the second disk to be verified；
High temperature write check module, for placing described the second of the second preset time in the 4th preset temperature range
Disk to be verified carries out write check operation, determines the second failed disk number that loss of data occurs；Wherein, the described 4th is default
The minimum value of temperature range is greater than the minimum value of the third preset temperature range；
Then the crash rate test module 304 is specifically used for:
Institute is determined using the first failed disk number, the second failed disk number and the default disk failure rate
Whether the data retention for stating disk to be measured is qualified.
The data in magnetic disk holding capacity test macro of the present embodiment is tested for realizing data in magnetic disk holding capacity above-mentioned
Method, therefore the visible data in magnetic disk hereinbefore of specific embodiment in data in magnetic disk holding capacity test macro keeps energy
The embodiment part of force test method, for example, low temperature load testing module 301, low temperature verifies writing module 302, low temperature write check
Module 303, crash rate test module 304 are respectively used to realize step in above-mentioned data in magnetic disk holding capacity test method
S101, S102, S103 and S104, so, specific embodiment is referred to the description of corresponding various pieces embodiment,
Details are not described herein.
A kind of data in magnetic disk holding capacity test device provided by the embodiments of the present application is introduced below, is hereafter retouched
A kind of data in magnetic disk holding capacity test device and any of the above-described embodiment stated can be cross-referenced.
A kind of data in magnetic disk holding capacity test device provided by the embodiments of the present application, specifically includes:
Memory, for storing computer program；
Processor realizes that data in magnetic disk is kept as described in above-mentioned any embodiment when for executing the computer program
The step of aptitude tests method.
Specifically, memory includes non-volatile memory medium, built-in storage.The non-volatile memory medium is stored with
Operating system and computer-readable instruction, the built-in storage are that the operating system and computer in non-volatile memory medium can
The operation of reading instruction provides environment.Processor provides calculating and control ability for data in magnetic disk holding capacity test device, can be with
Realize step provided by any of the above-described data in magnetic disk holding capacity test method embodiment.
Present invention also provides another computer readable storage mediums, are stored thereon with computer program, the calculating
Step provided by above-described embodiment may be implemented in machine program when being executed by processor.The storage medium may include: USB flash disk, move
Dynamic hard disk, read-only memory (Read-Only Memory, ROM), random access memory (Random Access Memory,
RAM), the various media that can store program code such as magnetic or disk.
Each embodiment in this specification is described in a progressive manner, the highlights of each of the examples are with its
The difference of his embodiment, the same or similar parts in each embodiment may refer to each other.
The foregoing description of the disclosed embodiments enables those skilled in the art to implement or use the present invention.
Various modifications to these embodiments will be readily apparent to those skilled in the art, defined herein
General Principle can realize in other embodiments without departing from the spirit or scope of the present invention.Therefore, originally
Invention is not intended to be limited to the embodiments shown herein, and is to fit to special with principles disclosed herein and novelty
The consistent widest scope of point.
Claims (10)
1. a kind of data in magnetic disk holding capacity test method characterized by comprising
The first test sample is determined in disk to be measured, and first test sample in the first preset temperature range is carried out not
It is interrupted load testing, the P/E value of first test sample is made to reach 100%；
First test sample for reaching 100% to P/E value in the second preset temperature range carries out verification write operation totally,
Obtain the first disk to be verified；Wherein, the minimum value of second preset temperature range is greater than first preset temperature range
Maximum value, and difference is the first default value；
Write check operation is carried out to the described first disk to be verified for placing the first preset time at normal temperature, determines and data occurs
The the first failed disk number lost；
Using the first failed disk number and default disk failure rate determine the disk to be measured data retention whether
It is qualified.
2. the method according to claim 1, wherein first preset range is Celsius less than or equal to 25
Degree；Second preset temperature range is 40 degrees Celsius.
3. the method according to claim 1, wherein first preset time be more than or equal to 50h when
Between.
4. the method according to claim 1, wherein described utilize the first failed disk number and default disk
Before crash rate determines whether the data retention of the disk to be measured is qualified, further includes:
In the disk to be measured determine the second test sample, to second test sample in third preset temperature range into
The uninterrupted load testing of row, makes the P/E value of second test sample reach 100%；Wherein, the third preset temperature model
The minimum value enclosed is greater than the maximum value of first preset temperature range, and difference is the second default value, and described second is default
Numerical value is greater than first default value；
Second test sample for reaching 100% to P/E value in second preset temperature range carries out verification totally and writes
Operation, obtains the second disk to be verified；
Write check operation is carried out to the described second disk to be verified for placing the second preset time in the 4th preset temperature range,
Determine the second failed disk number that loss of data occurs；Wherein, the minimum value of the 4th preset temperature range is greater than described the
The minimum value of three preset temperature ranges；
It is then described to determine whether the disk to be measured is qualified with default disk failure rate using the first failed disk number, it wraps
It includes:
It is determined using the first failed disk number, the second failed disk number with the default disk failure rate described to be measured
Whether the data retention of disk is qualified.
5. according to the method described in claim 4, it is characterized in that, the third preset temperature range is taken the photograph for 60 degrees Celsius with 74
Between family name's degree, including 60 degrees Celsius and 74 degrees Celsius；4th preset temperature range is more than or equal to 66 degrees Celsius.
6. according to the method described in claim 4, it is characterized in that, second preset time be more than or equal to 4 days when
Between.
7. according to claim 1 to method described in 6 any one, which is characterized in that the uninterrupted load testing, comprising:
Software, which is generated, using load runs JESD219workload.
8. a kind of data in magnetic disk holding capacity test macro characterized by comprising
Low temperature load testing module, for determining the first test sample in disk to be measured, in the first preset temperature range
First test sample carries out uninterrupted load testing, and the P/E value of first test sample is made to reach 100%；
Low temperature verifies writing module, for reaching 100% first test sample to P/E value in the second preset temperature range
Verification write operation totally is carried out, the first disk to be verified is obtained；Wherein, the minimum value of second preset temperature range is greater than institute
The first preset temperature range maximum value is stated, and difference is the first default value；
Low temperature write check module, for carrying out writing school to the described first disk to be verified for placing the first preset time at normal temperature
Operation is tested, determines the first failed disk number that loss of data occurs；
Crash rate test module, for determining the disk to be measured using the first failed disk number and default disk failure rate
Data retention it is whether qualified.
9. a kind of data in magnetic disk holding capacity test device characterized by comprising
Memory, for storing computer program；
Processor realizes that data in magnetic disk keeps energy as described in any one of claim 1 to 7 when for executing the computer program
The step of force test method.
10. a kind of computer readable storage medium, which is characterized in that be stored with computer on the computer readable storage medium
Program realizes the data in magnetic disk holding capacity as described in any one of claim 1 to 7 when the computer program is executed by processor
The step of test method.
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