CN109991529A - A kind of test circuit of panel detection - Google Patents
A kind of test circuit of panel detection Download PDFInfo
- Publication number
- CN109991529A CN109991529A CN201910131325.6A CN201910131325A CN109991529A CN 109991529 A CN109991529 A CN 109991529A CN 201910131325 A CN201910131325 A CN 201910131325A CN 109991529 A CN109991529 A CN 109991529A
- Authority
- CN
- China
- Prior art keywords
- panel
- resistor
- counter
- trigger
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 11
- 238000012360 testing method Methods 0.000 title claims abstract description 11
- 238000012544 monitoring process Methods 0.000 abstract description 2
- 238000002474 experimental method Methods 0.000 description 11
- 239000004973 liquid crystal related substance Substances 0.000 description 9
- 238000010586 diagram Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 239000013256 coordination polymer Substances 0.000 description 3
- 230000005611 electricity Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 208000035795 Hypocalcemic vitamin D-dependent rickets Diseases 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 208000033584 type 1 vitamin D-dependent rickets Diseases 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000007688 edging Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000006386 memory function Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Liquid Crystal (AREA)
Abstract
A kind of test circuit of panel detection, including comparator, first resistor, second resistance, clock trigger, counter, output end；The connection of one end of the comparator output terminal and first resistor, the other end of first resistor is grounded by second resistance, the other end of first resistor is also connect with clock trigger, and the clock trigger is connect with counter, solves the technical issues of performance real-time monitoring in panel test.
Description
Technical field
The present invention relates to liquid crystal display panel detection field more particularly to a kind of test circuits for detecting liquid crystal display panel.
Background technique
In the reliability test experience of display panel, experiment in-furnace temperature be more than liquid crystal can tolerance range so that liquid crystal
In the case where can not work normally, need manually to carry out to observe the picture of panel to confirm its working condition.In RA experimentation
In, the case where V-x talk phenomenon will appear the following two kinds: it is long that one is time of occurrence, and number is few；And another kind is when occurring
Between it is short, often, specific phenomenon schematic diagram is as shown in the drawing.For the first case, related colleague still relies on observation
Phenomenon is observed and recorded in the daily work, and for second situation, colleague may specifically can not be recorded in detail.Therefore in order to
The experimental status of Panel is specifically monitored in RA experiment.Need to provide a kind of novel detection method and device.
Summary of the invention
For this reason, it may be necessary to provide a kind of VGL state-detection for being able to carry out different Panel, reflect Panel state and make it
The method that can be preferably recorded,
To achieve the above object, a kind of test circuit of panel detection, including comparator, the first electricity are inventor provided
Resistance, second resistance, clock trigger, counter, output end；
The connection of one end of the comparator output terminal and first resistor, the other end of first resistor are connect by second resistance
The other end on ground, first resistor is also connect with clock trigger, and the clock trigger is connect with counter,
The comparator includes reference voltage input, voltage end to be measured, the driving electricity of the voltage end to be measured and panel
Pressure connection.
It is different from the prior art, above-mentioned technical proposal, can be in test by grasping at panel by design foregoing circuit
Relevant each road voltage (such as: VIN is equal to VSP, VSN etc.) understands and monitors the actual conditions of Panel.
Detailed description of the invention
Fig. 1 is the panel V-x talk phenomenon schematic diagram of the experiment of RA described in background technique；
Fig. 2 is that the VGL shift of Panel described in specific embodiment during the experiment changes schematic diagram；
Fig. 3 is panel detection circuit diagram described in specific embodiment；
Fig. 4 is circuit theory and waveform diagram described in specific embodiment.
Specific embodiment
Technology contents, construction feature, the objects and the effects for detailed description technical solution, below in conjunction with specific reality
It applies example and attached drawing is cooperated to be explained in detail.
A kind of test circuit of panel detection, as shown in figure 3, including comparator, first resistor, second resistance, clock touching
Send out device, counter, output end；
The connection of one end of the comparator output terminal and first resistor, the other end of first resistor are connect by second resistance
The other end on ground, first resistor is also connect with clock trigger, and the clock trigger is connect with counter,
The comparator includes reference voltage input, voltage end to be measured, the driving electricity of the voltage end to be measured and panel
Pressure connection.
As shown in the figure, in the comparator in left side, two input terminals are respectively connected to VREF and VIN, and enable end is respectively connected to work
Make voltage VCC and 0V voltage or ground connection or negative voltage.Wherein, 1. VREF is adjustable reference voltage；According to the need of practical operation
It wanting, user can be configured, such as be set as between 0.7V~3V, the VGL voltage value lower than normal panel is generally required,
Meanwhile VIN is the voltage for needing to measure, and such as can directly be inputted the VGL voltage value of Panel；In this way when VGL voltage with
Experimental temperature increase after, if there is power down, then comparator will invert, thus reflection in the output signal, figure
In VCC be comparator operating voltage, in the particular embodiment, for controlling D flip-flop's (voltage trigger)
Input level, according to the following formula,
VCC*R2/(R1+R2)。
The incoming level of voltage trigger can be set as needed, preferably can be set to 0~3.3V,
D flip-flop is trigger, and trigger, which is one, has memory function, and there are two the information of stable state for tool
Memory device is a kind of important unit in the most basic logic unit and Digital Logical Circuits for constitute a variety of sequence circuits
Circuit.It has a wide range of applications in digital display circuit and computer.There are two trigger tools stable state, i.e. " 0 " and " 1 ",
Under certain outer signals effect, another stable state can be turned to from a stable state.Trigger has integrated touching
Send out the trigger of device and gate circuit composition.Triggering mode has level triggers and two kinds of edging trigger.D type flip flop is in Clock pulse CP
Forward position (positive transition 0 → 1) be flipped, the state at the end D before the next state of trigger arrives depending on the rising edge of a pulse of CP,
That is next state=D.Because therefore, it has the function of to set 0, sets 1 two kinds.Since circuit has maintenance blocking action during CP=1,
So the data mode at the end D changes during CP=1, the output state of trigger will not influence.In the application example, we
Trigger be timing triggers, due to being integrated with clock crystal oscillator, can achieve the effect of timing triggering, time of CLK can be with
It needs voluntarily to adjust according to user, then enabling to the frequency of CLK is 1/tth；Here the clock cycle is tth, while it is also used
To limit power down time, i.e. threshold.
D type flip flop application is very wide, can be used as the deposit of digital signal, shift LD, frequency dividing and waveform generator, in this hair
In bright some embodiments, our trigger and the counter (counter) of next stage circuit are connected, when for screening power down
Between the VIN that exceeds schedule time, so in the embodiment shown in fig. 4 it will be seen that when VIN is less than the power down of VREF
Between t1 > tth when, trigger triggers enabled junior's counter and is counted；Second subsequent of power down time t2 < tth, then
Trigger does not trigger, and does not issue enable signal to junior's counter, then counter is without counting；Third time has for another example been arrived to fall
Electric time t3 > tth, duration have been more than clk cycle again, then trigger issues enable signal enablement count, and final counter exists
2 are shown as in the present embodiment.So user can recognize that liquid crystal display panel is due to RA in specific duration by counter
The objective serious conditions for the unstable caused power down phenomenon that the temperature of experiment is excessively high and comes, especially short time multiple power down
Judgement, by applying the panel detection circuit, has in the case where can not just be measured originally by conventional means such as naked eyes
Effect is solved in 85 DEG C/85% experiment: in experiment in-furnace temperature be more than liquid crystal can tolerance range so that liquid crystal can not normal work
Make, it is aobvious so as to cause nothing, and experimenter's diameter row is by observing the problem of picture of Panel confirms its situation.
In some other embodiment, can also the value to VREF artificially adjusted so that its equivalence in different volumes
Constant voltage,
Such as work as VREF=VGH (nominal gate high voltage)；VINWhen=VSH (reality), if VIN<VREF, pass through control CLK's
Frequency, D flip-flop filter out effective VGH Shift (gate high-voltage offset).Every to occur once, counter will
Add 1.
Work as VREF=VSN (specified)；VINWhen=VSN (reality), if VIN<VREF, by controlling the frequency of CLK, D flip-
Flop filters out effective VSN Shift.Every to occur once, counter will add 1.
Work as VREF=VSP (specified)；VINWhen=VSP (reality), if VIN<VREF, by controlling the frequency of CLK, D flip-
Flop filters out effective VSP Shift.Every to occur once, counter will add 1.
Work as VREF=VDDI (specified)；VINWhen=VDDI (reality), if VIN<VREF, by controlling the frequency of CLK, D
Flip-flop filters out effective VGH Shift.Every to occur once, counter will add 1.
To sum up, 85 DEG C/85% experiment in, in experiment in-furnace temperature be more than liquid crystal can tolerance range so that liquid crystal can not
It works normally, it is aobvious so as to cause nothing, so under normal circumstances, the picture of observation Panel can not be passed through during experiment is through row
Confirm its situation, and use this design scheme can in an experiment by the relevant each road voltage of crawl Panel (such as: VIN etc.
In VSP, VSN etc.) technology that solves performance real-time monitoring in panel test to understand and monitor the actual conditions of Panel asks
Topic.
It should be noted that being not intended to limit although the various embodiments described above have been described herein
Scope of patent protection of the invention.Therefore, it based on innovative idea of the invention, change that embodiment described herein is carried out and is repaired
Change, or using equivalent structure or equivalent flow shift made by description of the invention and accompanying drawing content, it directly or indirectly will be with
Upper technical solution is used in other related technical areas, is included within scope of patent protection of the invention.
Claims (1)
1. a kind of test circuit of panel detection, which is characterized in that including comparator, first resistor, second resistance, clock triggering
Device, counter, output end；
The other end of the connection of one end of the comparator output terminal and first resistor, first resistor is grounded by second resistance, the
The other end of one resistance is also connect with clock trigger, and the clock trigger is connect with counter,
The comparator includes reference voltage input, voltage end to be measured, the driving voltage company of the voltage end to be measured and panel
It connects.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910131325.6A CN109991529A (en) | 2019-02-22 | 2019-02-22 | A kind of test circuit of panel detection |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910131325.6A CN109991529A (en) | 2019-02-22 | 2019-02-22 | A kind of test circuit of panel detection |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109991529A true CN109991529A (en) | 2019-07-09 |
Family
ID=67130208
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910131325.6A Pending CN109991529A (en) | 2019-02-22 | 2019-02-22 | A kind of test circuit of panel detection |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109991529A (en) |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SU1026200A1 (en) * | 1981-11-17 | 1983-06-30 | Kuznetsov Aleksandr G | Automatic device for cell-by-cell storage battery checking |
| JP2001174513A (en) * | 1999-12-22 | 2001-06-29 | Mitsubishi Electric Corp | Semiconductor integrated circuit device |
| CN1302047A (en) * | 1999-12-29 | 2001-07-04 | 上海贝尔有限公司 | Clock signal pulse missing detecting circuit |
| CN1474508A (en) * | 2003-07-02 | 2004-02-11 | 西安大唐电信有限公司 | High frequency clock pulse loss monitoring detection circuit with low frequency clock |
| CN201348639Y (en) * | 2009-01-19 | 2009-11-18 | 深圳市振华微电子有限公司 | Test circuit for testing fusing time of fuse |
| CN203745534U (en) * | 2013-12-25 | 2014-07-30 | 绍兴文理学院 | Medical electric parameter detecting apparatus |
| CN106652420A (en) * | 2017-02-06 | 2017-05-10 | 广东美的制冷设备有限公司 | Remote controller |
| CN209961878U (en) * | 2019-02-22 | 2020-01-17 | 福建华佳彩有限公司 | Test circuit for panel detection |
-
2019
- 2019-02-22 CN CN201910131325.6A patent/CN109991529A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SU1026200A1 (en) * | 1981-11-17 | 1983-06-30 | Kuznetsov Aleksandr G | Automatic device for cell-by-cell storage battery checking |
| JP2001174513A (en) * | 1999-12-22 | 2001-06-29 | Mitsubishi Electric Corp | Semiconductor integrated circuit device |
| CN1302047A (en) * | 1999-12-29 | 2001-07-04 | 上海贝尔有限公司 | Clock signal pulse missing detecting circuit |
| CN1474508A (en) * | 2003-07-02 | 2004-02-11 | 西安大唐电信有限公司 | High frequency clock pulse loss monitoring detection circuit with low frequency clock |
| CN201348639Y (en) * | 2009-01-19 | 2009-11-18 | 深圳市振华微电子有限公司 | Test circuit for testing fusing time of fuse |
| CN203745534U (en) * | 2013-12-25 | 2014-07-30 | 绍兴文理学院 | Medical electric parameter detecting apparatus |
| CN106652420A (en) * | 2017-02-06 | 2017-05-10 | 广东美的制冷设备有限公司 | Remote controller |
| CN209961878U (en) * | 2019-02-22 | 2020-01-17 | 福建华佳彩有限公司 | Test circuit for panel detection |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103095265B (en) | Automatic reset detection circuit for power up and power failure | |
| CN101963949B (en) | Hot plug realization method, hot plug system and board card | |
| JP6076630B2 (en) | Driver circuit | |
| JP2009156643A (en) | Failure detection system and integrated circuit | |
| CN109031089B (en) | Synchronous rectification chip, automatic detection circuit and automatic detection method for power supply of synchronous rectification chip | |
| EP2656231B1 (en) | Input circuit arrangement | |
| CN107886883A (en) | A kind of circuit and method for detecting the short circuit of public electrode cabling | |
| CN109215562A (en) | A kind of display driver circuit and display driving method | |
| DE112017000318B4 (en) | Semiconductor device | |
| CN209961878U (en) | Test circuit for panel detection | |
| US7420791B1 (en) | Fault signature system for power management integrated circuits | |
| CN109991529A (en) | A kind of test circuit of panel detection | |
| US4499419A (en) | Methods and apparatus for assessing the quality of logic signals | |
| EP2359215B1 (en) | Field device for determining and/or monitoring a physical or chemical process parameter | |
| CN1333529C (en) | Clock signal detection method and apparatus in electronic devices | |
| CN108091061B (en) | IC card detection circuit for metering device | |
| CN106505980A (en) | Voltage detection circuit and electrification reset circuit | |
| CN107123383B (en) | Voltage monitoring device | |
| CN115144719A (en) | Power device testing device | |
| US20130093506A1 (en) | Solid state disk power supply system | |
| CN103487693B (en) | The detection method of machine frame slot | |
| CN108490817B (en) | Signal sampling processing circuit | |
| SU1049838A1 (en) | Device for checking integrated circuit | |
| US6542009B2 (en) | Signal hold circuit | |
| US20210183285A1 (en) | Control circuit and display device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |