CN109979373B - Shift register unit, shift register, display device and test method thereof - Google Patents

Shift register unit, shift register, display device and test method thereof Download PDF

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Publication number
CN109979373B
CN109979373B CN201910376161.3A CN201910376161A CN109979373B CN 109979373 B CN109979373 B CN 109979373B CN 201910376161 A CN201910376161 A CN 201910376161A CN 109979373 B CN109979373 B CN 109979373B
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repair
module
sub
input
pull
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CN109979373A (en
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陈帅
唐秀珠
吴海龙
周小柯
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BOE Technology Group Co Ltd
Chongqing BOE Optoelectronics Technology Co Ltd
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BOE Technology Group Co Ltd
Chongqing BOE Optoelectronics Technology Co Ltd
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    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C19/00Digital stores in which the information is moved stepwise, e.g. shift registers
    • G11C19/28Digital stores in which the information is moved stepwise, e.g. shift registers using semiconductor elements
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2310/00Command of the display device
    • G09G2310/02Addressing, scanning or driving the display screen or processing steps related thereto
    • G09G2310/0264Details of driving circuits
    • G09G2310/0286Details of a shift registers arranged for use in a driving circuit

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)

Abstract

The invention provides a shift register unit, which comprises a shift register unit main body module and a scanning signal output end, wherein the output end of the shift register unit main body module is electrically connected with the scanning signal output end, the shift register unit further comprises a repair subunit which comprises a repair module, the repair module comprises a repair input subunit and a repair output subunit, the output end of the repair input subunit is electrically connected with the control end of the repair output subunit, and the input end of the repair input subunit is electrically connected with the input end of the shift register unit main body module. The invention also provides a shift register, a display device, a testing method of the display device and a driving method of the display device. The main body module of the shift register unit can be repaired when faults occur, so that the yield of the display device can be improved.

Description

Shift register unit, shift register, display device and test method thereof
Technical Field
The present invention relates to the field of display technologies, and in particular, to a shift register unit, a shift register including the shift register unit, a display device including the shift register, and a test method of the display device.
Background
The display panel of the display device includes a plurality of pixel units arranged in a plurality of rows and a plurality of columns, and when driving the respective pixel units to emit light, a scan signal needs to be supplied to the pixel units row by row using a shift register.
The shift register comprises cascaded multi-stage shift register units, and if the shift register units are abnormal, normal driving cannot be caused. At present, the abnormality of the shift register unit cannot be repaired, and once the abnormality of the shift register unit is found, the display device can only be judged as defective, thereby increasing the cost of manufacturing the display device.
The inventor of the present invention repeatedly researches and discovers that two main reasons for the bad shift register unit are: one is that the output module of the shift register unit fails, and the other is that the input module of the shift register unit fails.
Fig. 1 is a schematic block diagram of an nth stage shift register unit in a conventional shift register, and as shown in the drawing, the shift register unit includes an input module 11, a pull-up module 12, a reset module 14, a noise control module 15, a first noise reduction module 15a, a second noise reduction module 15b, and a pull-down module 13. The Input terminal Input of the Input module 11 is configured to receive a trigger signal (typically, a signal output by the output terminal out_n-1 of the previous stage shift register unit), and send the trigger signal to the control terminal (i.e., the pull-up node PU) of the sub-pull-up module. The input terminal of the pull-up module 12 is electrically connected to the first clock signal terminal CLK. When the pull-up node PU receives a valid signal, the input terminal of the pull-up module 12 is turned on with the output terminal, so that the first clock signal is output at the scan signal output terminal.
Through a large number of tests and practices, common defects in the existing shift register unit are poor pull-up modules or poor input modules.
Therefore, how to reduce the defects of the display device caused by the abnormal shift register unit is a technical problem to be solved in the art.
Disclosure of Invention
The invention aims to provide a shift register unit, a shift register comprising the shift register unit, a display device and a testing method of the display device. When the test method is used for lighting detection of the display device, once the defect of the shift register unit is found, the shift register unit can be repaired, so that waste can be avoided.
In order to achieve the above object, as one aspect of the present invention, there is provided a shift register unit including a shift register unit body module and a scan signal output terminal, the output terminal of the shift register unit body module being electrically connected to the scan signal output terminal, wherein the shift register unit further includes a repair sub-unit including a repair module including a repair input sub-module and a repair output sub-module,
The output end of the repair input sub-module is electrically connected with the control end of the repair output sub-module, the input end of the repair input sub-module is electrically connected with the input end of the shift register unit main body module, and the repair input sub-module is used for outputting under the control of signals received by the control end of the repair input sub-module and the input end of the repair input sub-module;
the output end of the repair output sub-module is electrically connected with the scanning signal output end, and the repair output sub-module is used for outputting under the control of the signal output by the output end of the repair input sub-module and the signal received by the input end of the repair output sub-module.
Preferably, the repair output submodule comprises a repair pull-up submodule and a repair pull-down submodule,
the control end of the repair pull-up sub-module is electrically connected with the output end of the repair input sub-module, the input end of the repair pull-up sub-module is formed into the input end of the repair output sub-module, the output end of the repair pull-up sub-module is electrically connected with the scanning signal output end, and the repair pull-up sub-module is used for outputting under the control of signals received by the input end of the repair pull-up sub-module and the control end of the repair pull-up sub-module;
The input end of the repair pull-down submodule is electrically connected with the reference level signal end, the output end of the repair pull-down submodule is electrically connected with the scanning signal output end, and the repair pull-down submodule is used for outputting under the control of signals received by the input end of the repair pull-down submodule and the control end of the repair pull-down submodule.
Preferably, the repair pull-up submodule includes a repair pull-up transistor and a repair storage capacitor,
the grid electrode of the repair pull-up transistor is formed into the control end of the repair pull-up sub-module, the first pole of the repair pull-up transistor is formed into the input end of the repair pull-up sub-module, and the second pole of the repair pull-up transistor is formed into the output end of the repair pull-up sub-module;
the first end of the repair storage capacitor is electrically connected with the grid electrode of the repair pull-up transistor, and the second end of the repair storage capacitor is electrically connected with the second electrode of the repair pull-up transistor.
Preferably, the repair pull-down sub-module includes a repair pull-down transistor, a gate of the repair pull-down transistor being formed as a control terminal of the repair pull-down sub-module, a first pole of the repair pull-down transistor being formed as an input terminal of the repair pull-down sub-module, and a second pole of the repair pull-down transistor being formed as an output terminal of the repair pull-down sub-module.
Preferably, the repairing sub-unit further comprises a repairing noise reduction module, the output end of the repairing noise reduction module is electrically connected with the control end of the repairing output sub-module, the input end of the repairing noise reduction module is electrically connected with the reference level signal end,
the repair noise reduction module is used for outputting under the control of signals received by the control end of the repair noise reduction module and the input end of the repair noise reduction module.
Preferably, the control end of the repair noise reduction module is electrically connected with the control end of the repair pull-down sub-module.
Preferably, the shift register unit body module includes a body resetting sub-module,
the input end of the main body reset submodule is electrically connected with the reference level signal end, the output end of the main body reset submodule is electrically connected with a pull-up node of the main body module of the shift register unit, and the control end of the repair noise reduction module is electrically connected with the control end of the main body reset submodule.
Preferably, the repair noise reduction module includes a main repair noise reduction transistor, a first pole of the main repair noise reduction transistor is formed as an input terminal of the repair noise reduction module, a second pole of the main repair noise reduction transistor is formed as an input terminal of the repair noise reduction module, and a gate of the main repair noise reduction transistor is formed as a control terminal of the repair noise reduction module.
Preferably, the repair noise reduction module further includes an auxiliary repair noise reduction transistor, a gate of the auxiliary repair noise reduction transistor is electrically connected with a gate of the main repair noise reduction transistor, a first pole of the auxiliary repair noise reduction transistor is electrically connected with the reference level signal terminal, a second pole of the auxiliary repair noise reduction transistor is electrically connected with the scanning signal output terminal, and a type of the auxiliary repair noise reduction transistor is the same as a type of the main repair noise reduction transistor.
Preferably, the repair input sub-module includes a repair input transistor, a gate of the repair input transistor is formed as a control terminal of the repair input sub-module, a first pole of the repair input transistor is formed as an input terminal of the repair input sub-module, and a second pole of the repair input transistor is formed as an output terminal of the repair input transistor.
As a second aspect of the present invention, there is provided a shift register, which includes cascaded multi-stage shift register units, wherein the shift register units are the shift register units provided by the present invention.
Preferably, in the adjacent two-stage shift register units, the control end of the repair pull-down sub-module of the previous stage shift register unit is electrically connected with the pull-down node of the shift register unit main body module of the next stage shift register unit.
As a third aspect of the present invention, there is provided a display device including a shift register, wherein the shift register includes the shift register provided by the present invention.
As a fourth aspect of the present invention, there is provided a method for testing a display device, wherein the display device is the above display device provided by the present invention, the method for testing a display device includes:
providing test signals for the shift registers so as to drive the scanning signal output ends of the shift register units at all stages to output scanning signals;
when the shift register unit with abnormal output exists, the output end of the shift register unit with abnormal output is disconnected with the corresponding scanning signal output end, so that the repaired shift register unit is obtained.
As a fifth aspect of the present invention, there is provided a display device having a repaired shift register unit, which is obtained after the test by the above-described test method provided by the present invention.
As a sixth aspect of the present invention, there is provided a driving method of a display device, wherein the display device is the above display device provided by the present invention, and in an output stage of a shift register unit after repair, the driving method includes:
In the input sub-stage, an effective control signal is provided for the control end of the repair input sub-module so as to control the input end of the repair input sub-module to be conducted with the output end of the repair input sub-module, signals input through the input end of the repair input sub-module are stored in the control end of the repair output sub-module, and a grid closing signal is provided for the input end of the repair input sub-module;
in the output sub-stage, an invalid control signal is provided for the control end of the repair input sub-module so as to control the input end of the repair input sub-module to be disconnected with the output end of the repair input sub-module, the control end of the repair output sub-module floats, and a grid opening signal is provided for the input end of the repair input sub-module;
in the pull-down sub-stage, an invalid control signal is provided to the control end of the repair input sub-module to control the input end of the repair input sub-module to be disconnected from the output end of the repair input sub-module, and a grid closing signal is provided to the input end of the repair input sub-module.
Drawings
The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification, illustrate the invention and together with the description serve to explain, without limitation, the invention. In the drawings:
FIG. 1 is a block diagram of a conventional shift register unit;
FIG. 2 is a schematic diagram of a shift register unit according to the present invention;
FIG. 3 is a circuit diagram of a preferred embodiment of a shift register cell provided by the present invention;
FIG. 4 is a schematic diagram of a repaired shift register cell;
FIG. 5 is a timing diagram of the control signals of the repaired shift register unit;
FIG. 6 is a simulated diagram of the operation of the repaired shift register cell;
FIG. 7 is a circuit diagram of another preferred embodiment of a shift register cell provided by the present invention;
fig. 8 is a flowchart of a testing method of a display device provided by the present invention.
Detailed Description
The following describes specific embodiments of the present invention in detail with reference to the drawings. It should be understood that the detailed description and specific examples, while indicating and illustrating the invention, are not intended to limit the invention.
As an aspect of the present invention, there is provided a shift register unit including a shift register unit body module 100 and a scan signal output terminal, as shown in fig. 2, the output terminal of the shift register unit body module 100 being electrically connected to the scan signal output terminal. The shift register unit further includes a repair subunit 200, where the repair subunit 200 includes a repair module 210, a repair input subunit 211, and a repair output subunit 212.
The output end of the repair Input sub-module 211 is electrically connected with the control end PU2 of the repair Input sub-module 212, the Input end of the repair Input sub-module 211 is electrically connected with the Input end Input of the shift register unit main body module 100, and the repair Input sub-module 211 is configured to output under the control of signals received by the control end ctr1 of the repair Input sub-module 211 and the Input end of the repair Input sub-module 211.
The output end of the repair input sub-module 212 is electrically connected to the scan signal output end, and the repair input sub-module 212 is configured to output a signal output by the output end of the repair input sub-module 211 and a signal received by the input end ctr2 of the repair input sub-module 212.
It should be explained that the shift register unit is applied to shift registers, each of which includes a plurality of shift register units, an nth shift register unit is shown in fig. 2, and reference numeral "out_n" denotes a scan signal output terminal of the nth shift register unit. The working principle of the shift register unit provided by the invention is described below by taking an nth stage shift register unit as an example.
The shift register unit body module 100 can completely implement the basic functions of the shift register unit without any element occurrence of a defect (i.e., output a scan signal to the scan signal output terminal out_n under the control of an input signal and a clock signal).
In addition, in the case where no failure occurs in any element, it is not necessary to supply an effective control signal to the control terminal ctr1 of the repair input sub-module 211 of the repair module 210, nor to supply an effective signal to the input terminal ctr2 of the repair input sub-module 212. Even if the input end of the repair input sub-module 211 of the repair module 210 receives a valid input signal (i.e., the shift register unit body module 100), the repair input sub-module 212 does not output a signal, and thus, the normal output of the shift register unit body module 100 is not affected.
Once the shift register unit main body module 100 has bad elements and cannot normally output the scan signal, the electrical connection between the output end of the shift register unit main body module 100 and the scan signal output end out_n can be disconnected, so that the shift register unit main body module 100 no longer affects the output of the scan signal output end out_n. Meanwhile, in order to ensure that the defective shift register unit is normally output, it is necessary to provide an effective control signal to the control terminal ctr1 of the repair input sub-module 211 of the repair module 210 and an effective gate-on signal to the input terminal ctr2 of the repair output sub-module 212 of the repair module 210.
Specifically, when the control terminal ctr1 of the repair Input sub-module 211 receives a valid control signal, the Input terminal of the repair Input sub-module 211 is turned on with the output terminal of the repair Input sub-module 211, so that a signal Input through the Input terminal of the repair Input sub-module 211 (i.e., a signal Input through the Input terminal Input of the shift register unit main body module 100) can be provided to the control terminal PU2 of the repair output sub-module 212. When the signal of the control terminal PU2 of the repair output sub-module 212 is a valid control signal, the input terminal of the repair output sub-module 212 is turned on with the output terminal of the repair output sub-module 212. When the control end of the repair output sub-module 212 receives an effective control signal and the input end of the repair output sub-module 212 receives a gate-on signal, the gate-on signal may be provided to the output end of the repair output sub-module 212 and further to the scan signal output end out_n.
It should be noted that, the "gate-on signal" herein is the same as the gate-on signal of the output end of the normal shift register unit body module 100 in the normal state. The scanning signal output end is electrically connected with the grid line in the display panel, and the grid electrode starting signal can enable the thin film transistor with the grid electrode electrically connected with the grid line to be started.
Before the display device including the shift register unit leaves the factory, it is necessary to perform a lighting test on the display device. During the lighting test, no valid control signal is provided to the control terminal ctr1 of the repair input sub-module 211, and no valid signal is provided to the input terminal of the repair output sub-module 212, that is, during the lighting test, whether or not there is an abnormality in the shift register unit main body module 100 is detected.
In the course of the lighting test, when a shift register unit having an output abnormality is found (for example, when a high level signal should be output, a low level signal should be output, or when the output signal does not reach a predetermined on voltage, etc., the shift register unit may be regarded as having an output abnormality), it is indicated that the shift register unit main body module 100 of the shift register unit has an abnormality. In this case, the electrical connection between the scan signal output terminal of the shift register unit body unit and the output terminal of the shift register unit body module 100 is disconnected, so that a repaired shift register unit can be obtained. At this time, the shift register unit is repaired from defective products to good products capable of outputting gate-on signals at the correct time under the control of the specific signals.
Assuming that the nth shift register unit is a repaired shift register unit, a signal output from the N-1 th shift register unit passes through an input terminal of the repair output module 211 of the nth shift register unit, and accordingly, a scan signal output terminal out_n of the nth shift register unit may be caused to output a gate-on signal by providing an effective control signal to the control terminal ctr1 of the repair input sub-module 211 and an effective signal to the input terminal ctr2 of the repair output sub-module.
At the non-output timing of the nth stage shift register unit, an invalid control signal is supplied to the control terminal ctr1 of the repair input sub-module 211, and an invalid signal is supplied to the input terminal ctr2 of the repair output sub-module.
That is, by providing signals to the control terminal ctr1 of the repair input sub-module 211 and the input terminal ctr2 of the repair output sub-module, and disconnecting the scan signal output terminal out_n from the nth stage shift register unit main body module, normal output of the repaired nth stage shift register unit can be achieved, and the yield of the display device including the shift register unit can be improved.
In the present invention, the specific structure of the repair output sub-module 212 is not particularly limited. As a preferred embodiment, as shown in fig. 2 and 7, the repair output submodule 212 includes a repair pull-up submodule 212a and a repair pull-down submodule 212b.
The control terminal PU2 of the repair pull-up sub-module 212a is electrically connected to the output terminal of the repair input sub-module 211, the input terminal of the repair pull-up sub-module 212a is formed as the input terminal ctr2 of the repair input sub-module 210, the output terminal of the repair pull-up sub-module 212a is electrically connected to the scan signal output terminal out_n, and the repair pull-up sub-module 212a is configured to output under control of signals received by the input terminal of the repair pull-up sub-module 212a and the control terminal PU2 of the repair pull-up sub-module 212 a. Specifically, when the control terminal PU2 of the repair pull-up submodule 212a receives a valid signal, the input terminal of the repair pull-up submodule 212a is turned on with the output terminal of the repair pull-up submodule 212 a. As described above, the signal received by the control terminal PU2 of the repair pull-up sub-module 212a is the signal provided by the signal Input terminal Input (i.e., the signal output by the shift register unit at the previous stage), where the effective control signal for repairing the pull-up sub-module 212a is a voltage signal having the same sign as the gate-on voltage and an absolute voltage value not lower than the voltage value of the gate-on signal.
The input end of the repair pull-down sub-module 212b is electrically connected with the reference level signal end VSS, the output end of the repair pull-down sub-module 212b is electrically connected with the scanning signal output end out_n, and the repair pull-down sub-module 212b is used for outputting under the control of signals received by the input end of the repair pull-down sub-module and the control end of the repair pull-down sub-module 212 b. Specifically, when the control end of the repair pull-down submodule 212b receives an effective control signal, the input end of the repair pull-down submodule 212b is conducted with the output end of the repair pull-down submodule 212b, so that the scan signal output end out_n is conducted with the reference level signal end VSS, and the potential of the scan signal output end can be pulled down.
The working period of the shift register unit in the prior art comprises an input stage, an output stage and a pull-down stage. Accordingly, the duty cycle of the repair subunit should also include an input phase, an output phase, and a pull-down phase. In the input phase, a signal is written to the control terminal PU2 of the repair pull-up submodule 212a by the repair input submodule 211. The repair pull-up submodule 212a should be able to hold the signal written to the control terminal PU2 of the repair pull-up submodule 212a at least to the output phase.
In the present invention, the specific structure of the repair pull-up sub-module 212a is not particularly limited as long as it has a control terminal for storing a voltage signal and controls on and off between an input terminal and an output terminal under the control of the signal of the control terminal. To simplify the structure of the repair pull-up sub-module 212a, it is preferable that the repair pull-up sub-module 212a may include a repair pull-up transistor M15 and a repair storage capacitor C2.
The gate of the repair pull-up transistor M15 is formed as the control terminal PU2 of the repair pull-up sub-module 212a, the first pole of the repair pull-up transistor M15 is formed as the input terminal of the repair pull-up sub-module 212a, and the second pole of the repair pull-up transistor M15 is formed as the output terminal of the repair pull-up sub-module 212 a. Specifically, when the gate of the repair pull-up transistor M15 receives a valid control signal, the first pole of the repair pull-up transistor M15 and the second pole of the repair pull-up transistor M15 are turned on, and when the gate of the repair pull-up transistor M15 receives an invalid control signal, the first pole of the repair pull-up transistor M15 and the second pole of the repair pull-up transistor M15 are turned off.
The first terminal of the repair storage capacitor C2 is electrically connected to the gate of the repair pull-up transistor M15, and the second terminal of the repair storage capacitor C2 is electrically connected to the second terminal of the repair pull-up transistor M15.
The repair storage capacitor C2 is used for storing the control signal input through the repair input sub-module 211, and the control signal is input through the output end of the repair input sub-module 211 and stored in the repair capacitor C2 at the input stage of the working period of the shift register unit. In the output stage, the first end of the repair storage capacitor C2 and the gate of the repair pull-up transistor M15 are both floating, and under the bootstrap action of the repair capacitor C2, the gate voltage of the repair pull-up transistor M15 can be coupled to a voltage with a larger voltage value, so that it can be ensured that the repair pull-up transistor M15 can maintain the first pole and the second pole in a conductive state.
In the present invention, there is no special requirement for the specific structure of the repair pull-down submodule 212b, as long as the scan signal output terminal out_n can be turned on with the reference level signal terminal VSS in the pull-down stage.
In order to simplify the structure of the shift register unit, it is preferable that the repair pull-down sub-module 212b includes a repair pull-down transistor M17, a gate of the repair pull-down transistor M17 is formed as a control terminal of the repair pull-down sub-module 212b, a first pole of the repair pull-down transistor M17 is formed as an input terminal of the repair pull-down sub-module 212b, and a second pole of the repair pull-down transistor M17 is formed as an output terminal of the repair pull-down sub-module 212 b. When the gate of the repair pull-down transistor M17 receives an effective pull-down signal, the first pole of the repair pull-down transistor M17 and the second pole of the repair pull-down transistor M17 are turned on, so that the potential of the scan signal output terminal out_n can be pulled down to the same potential as the reference level signal terminal VSS.
In the embodiment shown in fig. 3 and 7, the repair pull-up transistor M15 and the repair pull-down transistor M17 are both N-type transistors.
In order to ensure that the output of the shift register unit in the non-output stage can disconnect the input terminal of the repair pull-up sub-module 212a from the scan signal output terminal out_n, the repair sub-unit 200 may further include a repair noise reduction module 220, wherein an output terminal of the repair noise reduction module 220 is electrically connected to the control terminal PU2 of the repair output sub-module 210, and an input terminal of the repair noise reduction module 220 is electrically connected to the reference level signal terminal VSS.
The repair noise reduction module 220 is configured to output under control of a signal received by a control end of the repair noise reduction module 220 and an input end of the repair noise reduction module 220.
The shift register unit provided with the repair noise reduction module 220 is suitable for both direct current noise reduction and alternating current noise reduction.
When the control end of the repair noise reduction module 220 receives an effective noise reduction control signal, the input end of the repair noise reduction module 220 is conducted with the output end of the repair noise reduction module 220, so that the potential of the control end PU2 of the repair module 210 can be pulled down to the potential of the reference level signal end VSS.
In the present invention, no special regulation is made on how to provide an effective noise reduction control signal to the control terminal of the repair noise reduction module 220, as long as the effective repair noise reduction control module can be provided to the control terminal of the repair noise reduction module 220 after the gate turn-on signal is output from the scan signal output terminal out_n of the shift register unit including the repair noise reduction module 220.
As a preferred embodiment, as shown in FIG. 3, the control terminal of the repair noise reduction module 220 is electrically connected to the control terminal of the repair pull-down sub-module 212 b. The repair noise reduction module 220 may be controlled with a control signal that controls the repair pull-down submodule 212 b. Specifically, in the pull-down stage, the input terminal of the repair pull-down submodule 212b is controlled to be conducted with the output terminal of the repair pull-down submodule 212b to pull the potential of the scan signal output terminal out_n low, and the input terminal of the repair noise reduction module 220 is controlled to be conducted with the output terminal of the repair noise reduction module 220, so that the potential of the control terminal of the repair pull-up submodule 212a can be pulled down, and disconnection between the input terminal of the repair pull-up submodule 212a and the scan signal output terminal out_n is ensured.
Of course, the present invention is not limited thereto, and the control terminal of the repair noise reduction module 220 may be electrically connected to the reset terminal of the shift register unit main body module 100. Specifically, as shown in fig. 7, the shift register unit main body module 100 includes a main body reset sub-module 110, an input end of the main body reset sub-module 110 is electrically connected to the reference level signal end VSS, an output end of the main body reset sub-module 110 is electrically connected to the pull-up node PU1 of the shift register unit main body module 100, and a control end of the repair noise reduction module 220 is electrically connected to a control end reset of the main body reset sub-module 100 (i.e., a reset end of the shift register unit main body module 100 shown above). After the control end of the repair noise reduction module 220 receives the effective reset control signal, the input end of the repair noise reduction module 220 is conducted with the output end of the repair noise reduction module 220, so that the potential of the control end PU2 of the repair output sub-module 212 can be pulled down.
When the shift register unit is applied to the shift register, the reset terminal of the N-th shift register unit is electrically connected to the output terminal out_n+1 of the n+1-th shift register unit, so that the pull-up node PU1 of the shift register unit main body module 100 and the control terminal PU2 of the repair output sub-module 212 can be pulled down in the pull-down stage of the N-th shift register unit.
In the present invention, the specific structure of the repair noise reduction module 220 is not particularly limited, and in order to simplify the structure, as shown in fig. 3 and 7, the repair noise reduction module 220 includes a main repair noise reduction transistor M15, a first pole of the main repair noise reduction transistor M15 is formed as an input terminal of the repair noise reduction module 220, a second pole of the main repair noise reduction transistor M15 is formed as an input terminal of the repair noise reduction module 220, and a gate of the main repair noise reduction transistor M15 is formed as a control terminal of the repair noise reduction module 220. When the control terminal of the main repair noise reduction transistor M15 receives a valid control signal, the first pole of the main repair noise reduction transistor M15 and the second pole of the main repair noise reduction transistor M15 are turned on, and when the control terminal of the main repair noise reduction transistor M15 receives an invalid control signal, the first pole of the main repair noise reduction transistor M15 and the second pole of the main repair noise reduction transistor M15 are disconnected.
To further reduce noise at the scan signal output terminal out_n, preferably, as shown in fig. 7, the repair noise reduction module 220 may further include an auxiliary repair noise reduction transistor M18, a gate of the auxiliary repair noise reduction transistor M18 is electrically connected to a gate of the main repair noise reduction transistor M16, a first pole of the auxiliary repair noise reduction transistor M18 is electrically connected to the reference level signal terminal VSS, and a second pole of the auxiliary repair noise reduction transistor M18 is electrically connected to the scan signal output terminal out_n.
It should be noted that the type of the auxiliary repair noise reduction transistor M18 is the same as the type of the main repair noise reduction transistor M15. When the main repair noise reduction transistor M15 is an N-type transistor, the auxiliary repair noise reduction transistor M18 is also an N-type transistor, and when the main repair noise reduction transistor M15 is a P-type transistor, the auxiliary repair noise reduction transistor M18 is also a P-type transistor. When the main repair noise reduction transistor M15 is turned on under the control of the active control signal to pull the potential of the control terminal PU2 of the repair output sub-module 212 low, the auxiliary repair noise reduction transistor M18 is also turned on to further pull the scan signal output terminal out_n low.
In the present invention, the specific structure of the repair input sub-module 211 is not particularly limited either, and in order to simplify the structure, as shown in fig. 3 and 7, the repair input sub-module 211 includes a repair input transistor M14, a gate of the repair input transistor M14 is formed as a control terminal ctr1 of the repair input sub-module 211, a first pole of the repair input transistor M14 is formed as an input terminal of the repair input sub-module 211, and a second pole of the repair input transistor M14 is formed as an output terminal of the repair input transistor M14. When the gate of the repair input transistor M14 receives a valid signal, the first pole of the repair input transistor M14 and the second pole of the repair input transistor M14 are turned on, and when the gate of the repair input transistor M14 receives an invalid signal, the first pole of the repair input transistor M14 and the second pole of the repair input transistor M14 are turned on.
In the present invention, the circuit configuration of the shift register unit main body module 100 is not particularly limited. Specifically, as shown in fig. 2, the shift register unit main body module 100 includes a main body resetting sub-module 110, a main body pull-up sub-module 120, a main body pull-down sub-module 130, a main body input sub-module 140, a noise control sub-module 150, a first noise reduction sub-module 151, and a second noise reduction sub-module 152.
The input end of the body input sub-module 140 is formed as the input end of the shift register unit body module 100, and the output end of the body input sub-module 140 is electrically connected with the control end of the body pull-up sub-module 120 (i.e., the pull-up node of the shift register unit body module 100).
The input terminal of the body pull-up sub-module 120 is electrically connected to the first clock signal terminal CLK, and the output terminal of the body pull-up sub-module 120 is electrically connected to the scan signal output terminal out_n.
The input terminal of the main body pull-down sub-module 130 is electrically connected to the reference level signal terminal VSS, the output terminal of the main body pull-down sub-module 130 is electrically connected to the scan signal output terminal out_n, and the control terminal of the main body pull-down sub-module 130 is electrically connected to the reset terminal reset.
The input terminal of the noise control sub-module 150 is electrically connected to the second clock signal terminal CLKB, the output terminal of the noise control sub-module 150 is electrically connected to the control terminal pd_n of the second noise reduction sub-module 152 (i.e., the pull-down node of the shift register main body module 100), and the control terminal pd_cn of the noise control sub-module 150 is electrically connected to the output terminal of the first noise reduction sub-module 151.
The control end of the first noise reduction sub-module 151 is electrically connected to the pull-up node PU1 of the shift register unit main body module 100, and the input end of the first noise reduction sub-module 151 is electrically connected to the reference level signal end VSS.
The first output terminal of the second noise reduction sub-module 152 is electrically connected to the scan signal output terminal out_n, and the second output terminal of the second noise reduction sub-module 152 is electrically connected to the pull-up node PU 1.
The control end of the main body Reset sub-module 110 is electrically connected with the Reset end Reset, the input end of the main body Reset sub-module 110 is electrically connected with the reference level signal end VSS, and the output end of the main body Reset sub-module is electrically connected with the pull-up node PU 1.
In the embodiment shown in fig. 3 and 7, the main body Input sub-module 140 includes a first Input transistor M1 and a second Input transistor M13, wherein a gate and a first pole of the first Input transistor M1 are electrically connected to the Input terminal Input, a second pole of the first Input transistor M1 is formed as an output terminal of the main body Input sub-module 140, a gate of the second Input transistor M13 is electrically connected to the second clock signal terminal, and a second pole of the second Input transistor M13 is electrically connected to a second pole of the first Input transistor M1.
The body pull-up sub-module 120 includes a body pull-up transistor M3 and a body storage capacitor C1, the gate of the body pull-up transistor M3 is electrically connected to the pull-up node PU1, the first pole of the body pull-up transistor M3 is electrically connected to the first clock signal terminal CLK, and the second pole of the body pull-up transistor M3 is electrically connected to the scan signal output terminal out_n.
The body pull-down sub-module 130 includes a body pull-down transistor M4, a gate of the body pull-down transistor M4 is electrically connected to the reset terminal reset, a first pole of the body pull-down transistor M4 is electrically connected to the reference level signal terminal VSS, and a second pole of the body pull-down transistor M4 is electrically connected to the scan signal output terminal out_n.
The main body reset sub-module 110 includes a gate of the main body reset transistor M2 formed as a control terminal of the main body reset sub-module 110, a first pole of the main body reset transistor M2 is electrically connected to the reference level signal terminal VSS, and a second pole of the main body reset transistor M2 is electrically connected to the pull-up node PU 1.
The noise control sub-module 150 includes a first noise control transistor M9 and a second noise control transistor M5, where a first pole and a gate of the first noise control transistor M9 are electrically connected to the second clock signal terminal, a second pole of the first noise control transistor M9 is electrically connected to a gate of the second noise control transistor M5, a first pole of the second noise control transistor M5 is electrically connected to the second clock signal terminal, and a second pole of the second noise control transistor M5 is electrically connected to the control terminal pd_n of the second noise reduction sub-module 152.
The first noise reduction sub-module 151 includes a first noise reduction transistor M8, a second noise reduction sub-module M6, and a third noise reduction transistor M12.
The gate of the first noise reduction transistor M8 is electrically connected to the pull-up node PU1, the first pole of the first noise reduction transistor M8 is electrically connected to the control terminal pd_cn of the noise control submodule 150, and the second pole of the first noise reduction transistor M8 is electrically connected to the reference level signal terminal VSS. The gate of the second noise reduction transistor M6 is electrically connected to the gate of the first noise reduction transistor M8, the first pole of the second noise reduction transistor M6 is electrically connected to the control terminal pd_n of the second noise reduction sub-module 152, and the second pole of the second noise reduction transistor M6 is electrically connected to the reference level signal terminal VSS. The gate of the third noise reduction transistor M12 is electrically connected to the second clock signal terminal CLKB, the first pole of the third noise reduction transistor M12 is electrically connected to the scan signal output terminal VSS, and the second pole of the third noise reduction transistor M12 is electrically connected to the reference level signal terminal VSS.
The second noise reduction sub-module 152 includes a fourth noise reduction transistor M10 and a fifth noise reduction transistor M11, where the gate of the fourth noise reduction transistor M10 and the gate of the fifth noise reduction transistor M11 are electrically connected to the control terminal pd_n of the second noise reduction sub-module 152. The first pole of the fourth noise reduction transistor M10 is electrically connected to the pull-up node PU1, the second pole of the fourth noise reduction transistor M10 is electrically connected to the reference level signal terminal VSS, the first pole of the fifth noise reduction transistor M11 is electrically connected to the scan signal output terminal out_n, and the second pole of the fifth noise reduction transistor M11 is electrically connected to the reference level signal terminal.
The following briefly describes the operation of the shift register unit according to the present invention with reference to fig. 3 to 5.
Fig. 3 is a circuit diagram of a shift register unit, and fig. 4 is a circuit diagram of a shift register unit, in which when the shift register unit body module 100 fails, an output terminal of the shift register unit body module 100 is disconnected from the scan signal output terminal out_n to obtain a repaired shift register unit.
In the input sub-stage (1), a high level signal is input through the input terminal input, and a high level signal is provided to the control terminal ctr1 of the repair input sub-module 211, a low level signal is provided to the input terminal ctr2 of the repair input sub-module 212, at this time, the pull-down node pd_n+1 of the n+1st stage shift register unit is low level, so that the repair input transistor M14 is turned on, the repair pull-up transistor M15 is turned on, the repair pull-down transistor M17 and the repair noise reduction transistor M16 are both turned off, the signal input through the input terminal input is stored in the repair storage capacitor C2, so that the control terminal PU2 potential of the repair output sub-module 212 is high level, and the scan signal output terminal out_n outputs a low level signal because the input terminal ctr2 of the repair input sub-module 212 is low level signal;
In the output sub-stage (2), a low level signal is input through the input terminal input, and a low level signal is supplied to the control terminal ctr1 of the repair input sub-module 211, a high level signal is supplied to the input terminal ctr2 of the repair input sub-module 212, and at this time, the pull-down node pd_n+1 of the n+1th stage shift register unit is at a low level. The repair input transistor M14 is disconnected, so that one pole of the repair storage capacitor C2 connected with the control end PU2 is floated, the potential of the control end PU2 is coupled to a higher potential under the bootstrap action of the storage capacitor C2, the repair pull-up transistor M15 is turned on, the repair pull-down transistor M17 and the repair noise reduction transistor M16 are both disconnected, and therefore, the scanning signal output end Out_N outputs a high-level signal;
in the pull-down sub-stage (3), a low level signal is input through the input terminal input, a high level signal is provided to the control terminal ctr1 of the repair input sub-module 211, a low level signal is provided to the input terminal ctr2 of the repair input sub-module 212, at this time, the pull-down node pd_n+1 of the n+1st stage shift register unit is at a low level, so that the repair input transistor M14 is turned off, the repair pull-up transistor M15 is turned on, the repair pull-down transistor M17 and the repair noise reduction transistor M16 are both turned off, and the scan signal output terminal out_n outputs a low level signal;
In the noise reduction sub-stage (4), only the pull-down node pd_n+1 of the n+1th stage shift register unit is at a high level, the repair pull-down transistor M17 and the repair noise reduction transistor M16 are both turned on, and the potentials of the control terminal PU2 and the scan signal output terminal out_n are pulled down to a low level.
It can be seen that the normal output of the shift register unit after repair can be achieved by providing the electrical signal to the control terminal ctr1 of the repair input sub-module 211 and the input terminal ctr2 of the repair input sub-module 212.
It should be noted that, in fig. 5, N-3 represents a period in which the N-3 th stage shift register unit outputs the gate-on signal, N-2 represents a period in which the N-2 th stage shift register unit outputs the gate-on signal, and N-1 represents a period in which the N-1 th stage shift register unit outputs the gate-on signal; n represents a period in which the N-th shift register unit outputs the gate-on signal, n+1 represents a period in which the n+1-th shift register unit outputs the gate-on signal, and n+2 represents a period in which the n+2-th shift register unit outputs the gate-on signal.
Fig. 6 is an analog circuit diagram of the repaired shift register unit shown in fig. 4, the vertical axis represents voltage, the horizontal axis represents time, and it can be seen from fig. 6 that the repaired shift register unit can operate normally.
As a second aspect of the present invention, there is provided a shift register, which includes cascaded multi-stage shift register units, wherein the shift register units are the shift register units provided by the present invention.
The shift register unit mainly depends on the shift register unit main body module to work, and even if one or a plurality of shift register unit main body modules are bad, the output end of the shift register unit main body module is disconnected from the responsive scanning signal output end, so that the repair of the shift register unit can be realized, and the shift register with good products is obtained.
Preferably, in the adjacent two-stage shift register units, the control end of the repair pull-down sub-module of the previous stage shift register unit is electrically connected with the pull-down node of the shift register unit main body module of the next stage shift register unit. And reducing noise of the scanning signal output end of the repaired shift register unit and the control end of the repair output sub-module by using the pull-down node of the next shift register unit of the repaired shift register unit, so that the introduction of control signals can be reduced.
As a fourth aspect of the present invention, there is provided a display device including a shift register, wherein the shift register includes the shift register provided by the present invention.
As a fifth aspect of the present invention, there is provided a testing method of a display device, where the display device is the above display device provided by the present invention, as shown in fig. 8, the testing method includes:
in step S510, a test signal is provided to the shift register to drive the scan signal output terminals of the shift register units of each stage to output a scan signal;
in step S520, when there is a shift register unit with an output abnormality, the output terminal of the shift register unit with an output abnormality is disconnected from the corresponding scan signal output terminal, so as to obtain a repaired shift register unit.
The display device with the repaired shift register unit is still good, so the display device provided by the invention has higher yield.
As a sixth aspect of the present invention, there is provided a display device having a repaired shift register unit, wherein the display device is obtained after the test provided by the present invention.
In other words, in the shift register of the display device, the output terminal of the shift register unit body module of at least one shift register unit is electrically disconnected from the scan signal output terminal.
As a seventh aspect of the present invention, there is provided a driving method of a display device provided by the present invention, wherein the display device has a shift register unit after repair, and the driving method includes, in an output period of the shift register unit after repair:
in the input sub-stage, an effective control signal is provided for the control end of the repair input sub-module so as to control the input end of the repair input sub-module to be conducted with the output end of the repair input sub-module, signals input through the input end of the repair input sub-module are stored in the control end of the repair output sub-module, and a grid closing signal is provided for the input end of the repair input sub-module;
in the output sub-stage, an invalid control signal is provided for the control end of the repair input sub-module so as to control the input end of the repair input sub-module to be disconnected with the output end of the repair input sub-module, the control end of the repair output sub-module floats, and a grid opening signal is provided for the input end of the repair input sub-module;
in the pull-down sub-stage, an invalid control signal is provided to the control end of the repair input sub-module to control the input end of the repair input sub-module to be disconnected from the output end of the repair input sub-module, and a grid closing signal is provided to the input end of the repair input sub-module.
Preferably, in the output period of the repaired shift register unit, the driving method includes:
in the noise reduction sub-stage, an invalid control signal is provided for the control end of the repair input sub-module so as to control the input end of the repair input sub-module to be disconnected with the output end of the repair input sub-module, and a grid closing signal is provided for the input end of the repair input sub-module.
After the driving method provided by the invention is used, the repaired shift register unit is independently controlled, so that the interference caused by other normal shift register units in the concentration of the repaired shift register unit can be avoided.
It is to be understood that the above embodiments are merely illustrative of the application of the principles of the present invention, but not in limitation thereof. Various modifications and improvements may be made by those skilled in the art without departing from the spirit and substance of the invention, and are also considered to be within the scope of the invention.

Claims (8)

1. The shift register comprises cascaded multistage shift register units, the shift register units comprise shift register unit main body modules and scanning signal output ends, the output ends of the shift register unit main body modules are electrically connected with the scanning signal output ends, the shift register unit is characterized in that,
The main body module of the shift register unit comprises a main body resetting sub-module, a main body pull-up sub-module, a main body pull-down sub-module, a main body input sub-module, a noise control sub-module, a first noise reduction sub-module and a second noise reduction sub-module,
the input end of the main body input sub-module is formed as the input end of the main body module of the shift register unit, and the output end of the main body input sub-module is electrically connected with the control end of the main body pull-up sub-module;
the input end of the main body pull-up sub-module is electrically connected with the first clock signal end, and the output end of the main body pull-up sub-module is electrically connected with the scanning signal output end;
the input end of the main body pull-down sub-module is electrically connected with the reference level signal end, the output end of the main body pull-down sub-module is electrically connected with the scanning signal output end, and the control end of the main body pull-down sub-module is electrically connected with the reset end;
the input end of the noise control submodule is electrically connected with the second clock signal end, the output end of the noise control submodule is electrically connected with the control end of the second noise reduction submodule, and the control end of the noise control submodule is electrically connected with the output end of the first noise reduction submodule;
The control end of the first noise reduction sub-module is electrically connected with a pull-up node of the shift register unit main body module, and the input end of the first noise reduction sub-module is electrically connected with a reference level signal end;
the first output end of the second noise reduction sub-module is electrically connected with the scanning signal output end, and the second output end of the second noise reduction sub-module is electrically connected with the pull-up node;
the control end of the main body resetting sub-module is electrically connected with the resetting end, the input end of the main body resetting sub-module is electrically connected with the reference level signal end, and the output end of the main body resetting sub-module is electrically connected with the pull-up node;
the shift register unit further comprises a repair subunit, the repair subunit comprises a repair input subunit and a repair output subunit, the repair output subunit comprises a repair pull-up subunit, the control end of the repair pull-up subunit is electrically connected with the output end of the repair input subunit, the input end of the repair pull-up subunit is formed into the input end of the repair output subunit, the output end of the repair pull-up subunit is electrically connected with the scanning signal output end, and the repair pull-up subunit is used for outputting signals received by the input end of the repair pull-up subunit and the control end of the repair pull-up subunit under control; the input end of the repair pull-up sub-module independently receives signals; the repair pull-up submodule comprises a repair storage capacitor, a first end of the repair storage capacitor is connected with the control end of the repair pull-up submodule, and a second end of the repair storage capacitor is connected with the output end of the repair pull-up submodule;
The output end of the repair input sub-module is electrically connected with the control end of the repair output sub-module, the input end of the repair input sub-module is electrically connected with the input end of the shift register unit main body module, and the repair input sub-module is used for outputting under the control of signals received by the control end of the repair input sub-module and the input end of the repair input sub-module; the control end of the repair input sub-module independently receives signals;
the output end of the repair output sub-module is electrically connected with the scanning signal output end, and the repair output sub-module is used for outputting under the control of the signal output by the output end of the repair input sub-module and the signal received by the input end of the repair output sub-module;
when an output abnormal shift register unit exists, disconnecting an output end of the output abnormal shift register unit from a corresponding scanning signal output end to obtain a repaired shift register unit, wherein the shift register unit with the output abnormal shift register unit comprises the shift register unit main body module and breaks down, and the output end of the output abnormal shift register unit is disconnected from the corresponding scanning signal output end to obtain the repaired shift register unit, and the shift register unit comprises: disconnecting the output end of the shift register unit main body module from the scanning signal output end to obtain a repaired shift register unit;
The repair subunit further comprises a repair noise reduction module, the output end of the repair noise reduction module is electrically connected with the control end of the repair output subunit, the input end of the repair noise reduction module is electrically connected with the reference level signal end,
the repair noise reduction module is used for outputting under the control of signals received by the control end of the repair noise reduction module and the input end of the repair noise reduction module;
the input end of the main body reset sub-module is electrically connected with the reference level signal end, the output end of the main body reset sub-module is electrically connected with a pull-up node of the main body module of the shift register unit, and the control end of the repair noise reduction module is electrically connected with the control end of the main body reset sub-module; wherein, the shift register unit is configured to, in an output stage of the shift register unit after repair, enable the following operations:
in the input sub-stage, a high-level signal is input through the input end of the repair input sub-module, a high-level signal is provided for the control end of the repair input sub-module, a low-level signal is provided for the input end of the repair input sub-module, and the signal input through the input end of the repair input sub-module is stored in the repair storage capacitor, so that the potential of the control end of the repair output sub-module is high;
In the output sub-stage, a low-level signal is input through the input end of the repair input sub-module, the low-level signal is provided for the control end of the repair input sub-module, a high-level signal is provided for the input end of the repair input sub-module, and the potential of the control end of the repair pull-up sub-module is coupled to a higher potential under the bootstrap action of the repair storage capacitor;
in a pull-down sub-stage, a low-level signal is input through an input end of the repair input sub-module, a high-level signal is provided for a control end of the repair input sub-module, and a low-level signal is provided for an input end of the repair input sub-module, so that the potential of the control end of the repair input sub-module is high, and the potential of the control end of the repair input sub-module is a potential between the high level and the low level of the output sub-stage;
in the noise reduction sub-stage, the potential of the control end of the repair input sub-module and the potential of the scanning signal output end are pulled down to low level;
the repair noise reduction module comprises a main repair noise reduction transistor, a first pole of the main repair noise reduction transistor is formed as an input end of the repair noise reduction module, a second pole of the main repair noise reduction transistor is formed as an output end of the repair noise reduction module, and a grid electrode of the main repair noise reduction transistor is formed as a control end of the repair noise reduction module;
The repair noise reduction module further comprises an auxiliary repair noise reduction transistor, wherein the grid electrode of the auxiliary repair noise reduction transistor is electrically connected with the grid electrode of the main repair noise reduction transistor, the first electrode of the auxiliary repair noise reduction transistor is electrically connected with the reference level signal end, the second electrode of the auxiliary repair noise reduction transistor is electrically connected with the scanning signal output end, and the type of the auxiliary repair noise reduction transistor is the same as that of the main repair noise reduction transistor;
the repair output submodule further comprises a repair pull-down submodule, the input end of the repair pull-down submodule is electrically connected with the reference level signal end, the output end of the repair pull-down submodule is electrically connected with the scanning signal output end, the repair pull-down submodule is used for outputting under the control of signals received by the input end of the repair pull-down submodule and the control end of the repair pull-down submodule, and the control end of the repair pull-down submodule is electrically connected with a pull-down node of the next-stage shift register unit.
2. The shift register of claim 1, wherein the repair pull-up sub-module further comprises a repair pull-up transistor,
The grid electrode of the repair pull-up transistor is formed into the control end of the repair pull-up sub-module, the first pole of the repair pull-up transistor is formed into the input end of the repair pull-up sub-module, and the second pole of the repair pull-up transistor is formed into the output end of the repair pull-up sub-module;
the first end of the repair storage capacitor is electrically connected with the grid electrode of the repair pull-up transistor, and the second end of the repair storage capacitor is electrically connected with the second electrode of the repair pull-up transistor;
the repair pull-down sub-module includes a repair pull-down transistor, a gate of the repair pull-down transistor being formed as a control terminal of the repair pull-down sub-module, a first pole of the repair pull-down transistor being formed as an input terminal of the repair pull-down sub-module, and a second pole of the repair pull-down transistor being formed as an output terminal of the repair pull-down sub-module.
3. The shift register of claim 1 or 2, wherein a control terminal of the repair noise reduction module is electrically connected to a control terminal of the repair pull-down sub-module.
4. A shift register according to claim 1 or 2, characterized in that the repair input sub-module comprises a repair input transistor, the gate of which is formed as the control terminal of the repair input sub-module, the first pole of which is formed as the input terminal of the repair input sub-module, and the second pole of which is formed as the output terminal of the repair input transistor.
5. A display device comprising a shift register, characterized in that the shift register comprises a shift register according to any one of claims 1 to 4.
6. A method for testing a display device, wherein the display device is the display device according to claim 5, the method comprising:
providing test signals for the shift registers so as to drive the scanning signal output ends of the shift register units at all stages to output scanning signals;
when the shift register unit with abnormal output exists, the output end of the shift register unit with abnormal output is disconnected with the corresponding scanning signal output end, so that the repaired shift register unit is obtained.
7. A display device, characterized in that the display device is a display device with a repaired shift register unit obtained after the test by the test method of claim 6.
8. A driving method of a display device, wherein the display device is the display device according to claim 7, and the driving method includes, in an output stage of the shift register unit after repair:
in the input sub-stage, an effective control signal is provided for the control end of the repair input sub-module so as to control the input end of the repair input sub-module to be conducted with the output end of the repair input sub-module, signals input through the input end of the repair input sub-module are stored in the control end of the repair output sub-module, and a grid closing signal is provided for the input end of the repair input sub-module;
In the output sub-stage, an invalid control signal is provided for the control end of the repair input sub-module so as to control the input end of the repair input sub-module to be disconnected with the output end of the repair input sub-module, the control end of the repair output sub-module floats, and a grid opening signal is provided for the input end of the repair input sub-module;
in the pull-down sub-stage, an invalid control signal is provided to the control end of the repair input sub-module to control the input end of the repair input sub-module to be disconnected from the output end of the repair input sub-module, and a grid closing signal is provided to the input end of the repair input sub-module.
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