CN109959289B - A kind of preparation method of anti-gravity ultra-thin micro heat pipe - Google Patents
A kind of preparation method of anti-gravity ultra-thin micro heat pipe Download PDFInfo
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- 238000002360 preparation method Methods 0.000 title claims abstract description 11
- 229910021421 monocrystalline silicon Inorganic materials 0.000 claims abstract description 138
- 235000012431 wafers Nutrition 0.000 claims abstract description 97
- 238000000034 method Methods 0.000 claims abstract description 33
- 238000005516 engineering process Methods 0.000 claims abstract description 18
- 239000007788 liquid Substances 0.000 claims abstract description 18
- 230000005496 eutectics Effects 0.000 claims abstract description 14
- 238000005553 drilling Methods 0.000 claims abstract description 13
- 238000003466 welding Methods 0.000 claims abstract description 12
- 238000012545 processing Methods 0.000 claims description 23
- 239000008367 deionised water Substances 0.000 claims description 12
- 229910021641 deionized water Inorganic materials 0.000 claims description 12
- 238000001035 drying Methods 0.000 claims description 12
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 12
- 238000004140 cleaning Methods 0.000 claims description 6
- 238000005520 cutting process Methods 0.000 claims description 5
- SBEQWOXEGHQIMW-UHFFFAOYSA-N silicon Chemical compound [Si].[Si] SBEQWOXEGHQIMW-UHFFFAOYSA-N 0.000 claims description 5
- 239000003507 refrigerant Substances 0.000 claims description 3
- 238000003491 array Methods 0.000 claims 1
- 238000005498 polishing Methods 0.000 claims 1
- 238000012546 transfer Methods 0.000 abstract description 8
- 239000012530 fluid Substances 0.000 abstract description 5
- 230000017525 heat dissipation Effects 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- 238000003698 laser cutting Methods 0.000 description 5
- 229910052710 silicon Inorganic materials 0.000 description 5
- 239000010703 silicon Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
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- 229910021419 crystalline silicon Inorganic materials 0.000 description 3
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- 238000011161 development Methods 0.000 description 2
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- 238000005086 pumping Methods 0.000 description 2
- LVGUZGTVOIAKKC-UHFFFAOYSA-N 1,1,1,2-tetrafluoroethane Chemical compound FCC(F)(F)F LVGUZGTVOIAKKC-UHFFFAOYSA-N 0.000 description 1
- LDTMPQQAWUMPKS-UHFFFAOYSA-N 1-chloro-3,3,3-trifluoroprop-1-ene Chemical compound FC(F)(F)C=CCl LDTMPQQAWUMPKS-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F28—HEAT EXCHANGE IN GENERAL
- F28D—HEAT-EXCHANGE APPARATUS, NOT PROVIDED FOR IN ANOTHER SUBCLASS, IN WHICH THE HEAT-EXCHANGE MEDIA DO NOT COME INTO DIRECT CONTACT
- F28D15/00—Heat-exchange apparatus with the intermediate heat-transfer medium in closed tubes passing into or through the conduit walls ; Heat-exchange apparatus employing intermediate heat-transfer medium or bodies
- F28D15/02—Heat-exchange apparatus with the intermediate heat-transfer medium in closed tubes passing into or through the conduit walls ; Heat-exchange apparatus employing intermediate heat-transfer medium or bodies in which the medium condenses and evaporates, e.g. heat pipes
- F28D15/0283—Means for filling or sealing heat pipes
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F28—HEAT EXCHANGE IN GENERAL
- F28D—HEAT-EXCHANGE APPARATUS, NOT PROVIDED FOR IN ANOTHER SUBCLASS, IN WHICH THE HEAT-EXCHANGE MEDIA DO NOT COME INTO DIRECT CONTACT
- F28D15/00—Heat-exchange apparatus with the intermediate heat-transfer medium in closed tubes passing into or through the conduit walls ; Heat-exchange apparatus employing intermediate heat-transfer medium or bodies
- F28D15/02—Heat-exchange apparatus with the intermediate heat-transfer medium in closed tubes passing into or through the conduit walls ; Heat-exchange apparatus employing intermediate heat-transfer medium or bodies in which the medium condenses and evaporates, e.g. heat pipes
- F28D15/04—Heat-exchange apparatus with the intermediate heat-transfer medium in closed tubes passing into or through the conduit walls ; Heat-exchange apparatus employing intermediate heat-transfer medium or bodies in which the medium condenses and evaporates, e.g. heat pipes with tubes having a capillary structure
- F28D15/046—Heat-exchange apparatus with the intermediate heat-transfer medium in closed tubes passing into or through the conduit walls ; Heat-exchange apparatus employing intermediate heat-transfer medium or bodies in which the medium condenses and evaporates, e.g. heat pipes with tubes having a capillary structure characterised by the material or the construction of the capillary structure
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F28—HEAT EXCHANGE IN GENERAL
- F28D—HEAT-EXCHANGE APPARATUS, NOT PROVIDED FOR IN ANOTHER SUBCLASS, IN WHICH THE HEAT-EXCHANGE MEDIA DO NOT COME INTO DIRECT CONTACT
- F28D15/00—Heat-exchange apparatus with the intermediate heat-transfer medium in closed tubes passing into or through the conduit walls ; Heat-exchange apparatus employing intermediate heat-transfer medium or bodies
- F28D15/02—Heat-exchange apparatus with the intermediate heat-transfer medium in closed tubes passing into or through the conduit walls ; Heat-exchange apparatus employing intermediate heat-transfer medium or bodies in which the medium condenses and evaporates, e.g. heat pipes
- F28D2015/0225—Microheat pipes
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Abstract
本发明公开一种抗重力超薄微热管及其制备方法,制备方法为通过在单晶硅片上进行连续两次激光加工,加工出凹槽和可进行单向运输液体的阵列排布的梭形结构作为毛细吸液芯,然后在带有该梭形结构的两片单晶硅片间放置一片单晶硅支架,采用共晶键合技术将单晶硅片与单晶硅支架之间进行密封,再采用飞秒激光钻孔在一侧单晶硅片上钻真空灌液孔,通过真空灌注机对微热管抽真空并灌注工质液体,然后对真空灌液孔进行激光焊接密封,得到所述的抗重力超薄微热管。本抗重力超薄微热管,采用在内壁上直接加工出可进行单向运输液体的梭形阵列吸液芯结构,具有更大的蒸汽回流通道;梭形阵列结构带来了极大的毛细回流压力,传热性能好,具有抗重力特性。
The invention discloses an anti-gravity ultra-thin micro-heat pipe and a preparation method thereof. The preparation method is to process a single-crystal silicon wafer by two consecutive laser processes to process grooves and a shuttle capable of unidirectionally transporting liquid in an array arrangement. Then, a single crystal silicon support is placed between the two single crystal silicon wafers with the fusiform structure, and the single crystal silicon wafer and the single crystal silicon support are connected by eutectic bonding technology. Then use femtosecond laser drilling to drill a vacuum filling hole on one side of the single crystal silicon wafer, vacuum the micro heat pipe and pour the working fluid through a vacuum filling machine, and then carry out laser welding to seal the vacuum filling hole to obtain The anti-gravity ultra-thin micro heat pipe. The anti-gravity ultra-thin micro heat pipe adopts a shuttle-shaped array liquid wick structure that can transport liquid in one direction directly on the inner wall, and has a larger vapor return channel; the shuttle-shaped array structure brings great capillary return flow Pressure, heat transfer performance is good, with anti-gravity characteristics.
Description
技术领域technical field
本发明涉及微热管制备技术领域,特别涉及一种抗重力超薄微热管制备方法。The invention relates to the technical field of micro heat pipe preparation, in particular to a preparation method of an anti-gravity ultra-thin micro heat pipe.
背景技术Background technique
随着微电子技术及大规模集成电路技术的飞速发展,通过高功率电子芯片的热流密度大幅增加,大规模高度集成化的电路也导致电子元器件的散热空间非常狭小。研究资料表明,电子元器件的失效率随着其温度的上升而呈指数增加,当温度超过电子元器件的额定工作温度时,其可靠性将会显著下降。超过55%的电子设备失效是由于散热不及时导致温度过高而引起的。With the rapid development of microelectronics technology and large-scale integrated circuit technology, the heat flow density through high-power electronic chips has increased significantly, and the large-scale and highly integrated circuits have also resulted in a very small heat dissipation space for electronic components. Research data show that the failure rate of electronic components increases exponentially with the rise of its temperature, and when the temperature exceeds the rated operating temperature of electronic components, its reliability will decrease significantly. More than 55% of electronic equipment failures are caused by excessive temperature caused by untimely heat dissipation.
热管作为一种高效的相变传热元件,其具有高热导率、高稳定性和使用寿命长等优点,能够快速将热量传走,防止局部热点的产生,因此成为微电子领域使用最为广泛散热元器件之一。但是随着电子产品不断朝着小型化、高度集成化方向发展,传统的圆柱形热管或压扁管已经不能满足在狭小空间内高效散热的要求,难以应用于紧凑轻薄型电子设备上,同时由于吸液芯结构带来的毛细压力不足,热管在抗重力场合无法应用。此外,传统的热管一般都可以双向传热,这样对于电子元器件来说,当外界温度过高时,传统的微热管会将外界热量传到电子元器件上,导致电子元器件因温度过高而损坏。As an efficient phase change heat transfer element, the heat pipe has the advantages of high thermal conductivity, high stability and long service life. It can quickly transfer heat away and prevent the generation of local hot spots. one of the components. However, with the continuous development of electronic products towards miniaturization and high integration, traditional cylindrical heat pipes or flattened pipes can no longer meet the requirements of efficient heat dissipation in a small space, and are difficult to apply to compact, light and thin electronic devices. The capillary pressure brought by the wick structure is insufficient, and the heat pipe cannot be used in anti-gravity occasions. In addition, traditional heat pipes can generally transfer heat in two directions, so for electronic components, when the external temperature is too high, the traditional micro heat pipe will transfer the external heat to the electronic components, resulting in the electronic components due to excessive temperature. and damaged.
发明内容SUMMARY OF THE INVENTION
本发明的目的在于克服现有技术的不足,提供一种抗重力超薄微热管制备方法,该方法可高精度、批量生产抗重力超薄微热管,本方法制备出的抗重力超薄微热管结构紧凑、厚度超薄、抗重力、具有单方向传热特性,适用于在狭小空间内高效散热。The object of the present invention is to overcome the deficiencies of the prior art and provide a method for preparing an anti-gravity ultra-thin micro-heat pipe, which can produce the anti-gravity ultra-thin micro-heat pipe with high precision and mass production, and the anti-gravity ultra-thin micro-heat pipe prepared by this method Compact structure, ultra-thin thickness, anti-gravity, and unidirectional heat transfer characteristics, suitable for efficient heat dissipation in small spaces.
本发明的技术方案为:一种抗重力超薄微热管制备方法,包括下列步骤:The technical scheme of the present invention is: a preparation method of an anti-gravity ultra-thin micro heat pipe, comprising the following steps:
(1)将单晶硅片和单晶硅支架清洗并烘干;选用的单晶硅片为适合激光加工和具有较高热导率的单晶硅片;(1) Clean and dry the single crystal silicon wafer and the single crystal silicon support; the selected single crystal silicon wafer is a single crystal silicon wafer suitable for laser processing and with high thermal conductivity;
(2)将单晶硅片的单面先后连续进行两次激光加工,加工出阵列排布的梭形结构和沿单晶硅片长度方向的多条横截面为矩形的凹槽,再清洗并烘干;(2) The single side of the single crystal silicon wafer is subjected to two consecutive laser processing, and the shuttle-shaped structure arranged in an array and a plurality of grooves with rectangular cross-sections along the length of the single crystal silicon wafer are processed, and then cleaned and processed. drying;
(3)通过步骤(2)加工出两片单晶硅片,将两片单晶硅片带有梭形阵列的一面相对、并在两片单晶硅片之间放入单晶硅支架,通过共晶键合技术将两片单晶硅片和单晶硅支架密封,单晶硅片和单晶硅支架之间形成内腔;(3) Two single crystal silicon wafers are processed by step (2), the sides of the two single crystal silicon wafers with the shuttle array are opposite to each other, and a single crystal silicon support is placed between the two single crystal silicon wafers, The two single crystal silicon wafers and the single crystal silicon support are sealed by eutectic bonding technology, and an inner cavity is formed between the single crystal silicon wafer and the single crystal silicon support;
(4)在微热管的其中一片单晶硅片上进行激光钻孔,加工出真空灌液孔,通过真空灌液孔对内腔抽真空并向内腔灌注工质液体,再对真空灌液孔进行激光焊接密封,即得到抗重力超薄微热管。(4) Laser drilling is carried out on one of the single crystal silicon wafers of the micro heat pipe, and a vacuum filling hole is processed, and the inner cavity is evacuated through the vacuum filling hole and the working medium liquid is poured into the inner cavity, and then the vacuum filling liquid is poured into the inner cavity. The hole is sealed by laser welding, that is, the anti-gravity ultra-thin micro heat pipe is obtained.
步骤(1)中,所述清洗为采用去离子水超声振动清洗至少20分钟,烘干为单晶硅片在80~95℃的温度中烘干10~15分钟。In step (1), the cleaning is to use deionized water for ultrasonic vibration cleaning for at least 20 minutes, and the drying is to dry the single crystal silicon wafer at a temperature of 80-95° C. for 10-15 minutes.
步骤(1)中,所述单晶硅片为矩形,单晶硅片预先经过两面抛光处理,单晶硅片的长为100~200mm,宽为30~50mm,厚度为0.2~0.25mm。In step (1), the single crystal silicon wafer is rectangular, and the single crystal silicon wafer is polished on both sides in advance. The length of the single crystal silicon wafer is 100-200 mm, the width is 30-50 mm, and the thickness is 0.2-0.25 mm.
步骤(1)中,所述单晶硅支架为矩形框架结构,单晶硅支架的长、宽、厚度分别与单晶硅片的长、宽、厚度相同,单晶硅支架的边框宽为8~12mm。In step (1), the monocrystalline silicon support has a rectangular frame structure, the length, width and thickness of the monocrystalline silicon support are respectively the same as the length, width and thickness of the single crystal silicon wafer, and the frame width of the single crystal silicon support is 8 ~12mm.
步骤(2)中,在两次激光加工过程中,第一次加工出沿单晶硅片长度方向的多条横截面为矩形的凹槽,第二次加工出阵列排布的梭形结构;或者,第一次加工出阵列排布的梭形结构,第二次加工出沿单晶硅片长度方向的多条横截面为矩形的凹槽。In step (2), in the two laser processing processes, a plurality of grooves with rectangular cross-sections along the length direction of the single crystal silicon wafer are processed for the first time, and a shuttle-shaped structure arranged in an array is processed for the second time; Alternatively, a shuttle-shaped structure arranged in an array is processed for the first time, and a plurality of grooves with rectangular cross-sections along the length direction of the single crystal silicon wafer are processed for the second time.
步骤(2)中,所述激光加工采用飞秒激光加工,激光的波长为400nm~800nm,激光的能量为80~100mW,激光的切割速度不超过30μm/s。In step (2), the laser processing adopts femtosecond laser processing, the wavelength of the laser is 400-800 nm, the energy of the laser is 80-100 mW, and the cutting speed of the laser does not exceed 30 μm/s.
步骤(3)中,所述共晶键合技术为硅-硅直接共晶键合技术。In step (3), the eutectic bonding technology is a silicon-silicon direct eutectic bonding technology.
步骤(4)中,所述激光钻孔采用飞秒激光钻孔技术,抽真空为将微热管腔内的压力抽至10~20pa,工质液体采用冷媒。其中,冷媒包括去离子水、乙醇、丙酮、四氟乙烷、三氟氯丙烯。In step (4), femtosecond laser drilling technology is used for the laser drilling, the pressure in the micro-heat tube cavity is evacuated to 10-20 Pa, and the refrigerant is used as the working fluid. Among them, the refrigerant includes deionized water, ethanol, acetone, tetrafluoroethane, and chlorotrifluoropropene.
步骤(3)中,多对单晶硅片和单晶硅支架同时通过共晶键合技术密封。可通过一次键合工艺获得多根抗重力超薄微热管,提高生产效率。In step (3), multiple pairs of single crystal silicon wafers and single crystal silicon supports are simultaneously sealed by eutectic bonding technology. Multiple anti-gravity ultra-thin micro heat pipes can be obtained through a single bonding process to improve production efficiency.
步骤(4)中,对内腔抽真空并向内腔灌注工质液体时,采用真空灌注机。In step (4), a vacuum perfusion machine is used when the inner cavity is evacuated and the working medium liquid is poured into the inner cavity.
本发明相对于现有技术,具有以下有益效果:Compared with the prior art, the present invention has the following beneficial effects:
本抗重力超薄微热管制备方法,采用在内壁上直接加工出可进行单向运输液体的梭形阵列吸液芯结构,区别于传统的沟槽及烧粉吸液芯结构,具有更大的蒸汽回流通道;同时梭形阵列吸液芯结构带来了极大的毛细回流压力,传热性能好,具有抗重力特性。The preparation method of the anti-gravity ultra-thin micro-heat pipe adopts a shuttle-shaped array liquid-absorbing core structure that can transport liquid in one direction directly on the inner wall. Steam return channel; at the same time, the shuttle-shaped array liquid-absorbing core structure brings great capillary return pressure, good heat transfer performance, and anti-gravity characteristics.
本抗重力超薄微热管制备方法,采用激光加工技术,槽道宽度极窄、切割表面光洁、切割过程无热影响层、加工材料表面不产生内应力、加工精度高。本发明方法制备的抗重力超薄微热管,由于采用全硅基材料,同时采用紧密共晶键合技术,区别于基质与吸液芯采用不同材料的微热管,具有极小的热阻,具有结构紧凑、厚度超薄和单方向传热的优点,是适用于散热空间狭小的散热装置。The anti-gravity ultra-thin micro heat pipe preparation method adopts laser processing technology, the groove width is extremely narrow, the cutting surface is smooth, the cutting process has no heat-affected layer, the surface of the processing material does not generate internal stress, and the processing precision is high. The anti-gravity ultra-thin micro-heat pipe prepared by the method of the present invention adopts all-silicon-based material and adopts the tight eutectic bonding technology, which is different from the micro-heat pipe using different materials for the matrix and the liquid-absorbing core, and has extremely small thermal resistance and has The advantages of compact structure, ultra-thin thickness and unidirectional heat transfer are suitable for heat dissipation devices with small heat dissipation space.
本抗重力超薄微热管制备方法工艺简单,加工精度高,通过一次共晶键合工艺可同时键合多片单晶硅片,实现单根或多根大批量生产,适合产品的应用与推广。The preparation method of the anti-gravity ultra-thin micro heat pipe has simple process and high processing accuracy, and can bond multiple single crystal silicon wafers at the same time through a single eutectic bonding process to realize single or multiple mass production, which is suitable for product application and promotion. .
附图说明Description of drawings
图1为本抗重力超薄微热管的结构示意图。FIG. 1 is a schematic diagram of the structure of the anti-gravity ultra-thin micro heat pipe.
图2为单晶硅片在激光加工后的俯视图。FIG. 2 is a top view of a single crystal silicon wafer after laser processing.
图3为单晶硅片在激光加工后的结构示意图。FIG. 3 is a schematic structural diagram of a single crystal silicon wafer after laser processing.
图4为单晶硅片单个梭形结构的示意图。FIG. 4 is a schematic diagram of a single fusiform structure of a single crystal silicon wafer.
图5为本抗重力超薄微热管的横截面示意图。FIG. 5 is a schematic cross-sectional view of the anti-gravity ultra-thin micro heat pipe.
其中,图中所示,1为单晶硅片、2为单晶硅支架、3为梭形结构、4为凹槽、5为内腔。Among them, as shown in the figure, 1 is a single crystal silicon wafer, 2 is a single crystal silicon support, 3 is a shuttle structure, 4 is a groove, and 5 is an inner cavity.
具体实施方式Detailed ways
下面结合实施例,对本发明作进一步的详细说明,但本发明的实施方式不限于此。The present invention will be further described in detail below with reference to the examples, but the embodiments of the present invention are not limited thereto.
实施例1Example 1
本实施例一种抗重力超薄微热管制备方法,如图1所示,包括下列步骤:A method for preparing an anti-gravity ultra-thin micro-heat pipe of the present embodiment, as shown in FIG. 1 , includes the following steps:
(1)选择适合进行激光加工、具有较高热导率的单晶硅片作为原材料,将单晶硅片和单晶硅支架用去离子水超声振动清洗20分钟,超声波频率为25kHz,再将单晶硅片在95℃的烘干炉中烘干15分钟。(1) Select a single crystal silicon wafer with high thermal conductivity suitable for laser processing as the raw material, clean the single crystal silicon wafer and the single crystal silicon support with deionized water ultrasonic vibration for 20 minutes, the ultrasonic frequency is 25kHz, and then the single crystal silicon wafer and the single crystal silicon support The crystalline silicon wafers were dried in a drying oven at 95°C for 15 minutes.
(2)如图2~4所示,将单晶硅片的单面连续进行两次飞秒激光加工,加工出阵列排布的梭形结构;其中,第一次加工出阵列排布的梭形结构作为毛细吸液芯,第二次加工出沿单晶硅片长度方向的多条横截面为矩形的凹槽,具体为,第一步在长为240mm,宽为60mm的基板上,水平放置两片长为100mm、宽为40mm、截面厚度为0.2mm的单晶硅片,两片单晶硅片的间距为10mm,在硅片上采用激光加工出梭形结构的尖槽,激光的波长为800nm,激光的能量控制在100mW,激光切割速度为30μm/s,加工出的尖槽在长边方向的间距为150μm,在宽边方向的间距为65μm,激光发生器与硅片之间的角度为30°,得到梭形阵列;第二步在距离第一步激光加工过的梭形阵列两侧分别间隔15μm处采用飞秒激光进行两侧凹槽的切割,激光的波长为500nm,激光的能量控制在80mW,激光切割速度为15μm/s。经过两次激光加工得到带有梭形表面结构的吸液芯。采用去离子水超声振动清洗单晶硅片20分钟,超声波频率为25kHz,再将单晶硅片在95℃的烘干炉中烘干15分钟。(2) As shown in Figures 2-4, femtosecond laser processing is performed on a single side of a single crystal silicon wafer for two consecutive times to process a shuttle-shaped structure arranged in an array; among them, the shuttle in an array is processed for the first time. The shape structure is used as a capillary wick, and a plurality of grooves with rectangular cross-sections along the length of the single crystal silicon wafer are processed for the second time. Specifically, in the first step, on a substrate with a length of 240mm and a width of 60mm, horizontal Place two single crystal silicon wafers with a length of 100mm, a width of 40mm and a thickness of 0.2mm. The wavelength is 800nm, the laser energy is controlled at 100mW, the laser cutting speed is 30μm/s, the distance between the processed sharp grooves in the long side direction is 150μm, and the distance in the broad side direction is 65μm, between the laser generator and the silicon wafer In the second step, the femtosecond laser is used to cut the grooves on both sides at a distance of 15 μm from the two sides of the laser-processed shuttle array in the first step. The wavelength of the laser is 500 nm. The energy of the laser is controlled at 80mW, and the laser cutting speed is 15μm/s. The absorbent core with the fusiform surface structure was obtained after two laser processes. The single-crystal silicon wafers were cleaned by ultrasonic vibration of deionized water for 20 minutes, and the ultrasonic frequency was 25 kHz, and then the single-crystal silicon wafers were dried in a drying oven at 95°C for 15 minutes.
(3)如图5所示,通过步骤(2)加工出两片单晶硅片,将两片单晶硅片带有梭形阵列的一面相对、并在两片单晶硅片之间放入单晶硅支架,并用夹具进行定位、夹紧,夹紧压力约为1.45Pa,然后在1100℃真空环境中加热4小时,通过硅-硅直接共晶键合技术将两片单晶硅片和单晶硅支架密封,得到微热管,微热管为单晶硅片、单晶硅支架和单晶硅片的三层密封结构,两片单晶硅片和单晶硅支架共同形成内腔5。(3) As shown in FIG. 5 , two single crystal silicon wafers are processed through step (2), and the two single crystal silicon wafers with the shuttle-shaped array are placed opposite each other and placed between the two single crystal silicon wafers. Insert the monocrystalline silicon support, and use the clamp for positioning and clamping, the clamping pressure is about 1.45Pa, and then heated in a vacuum environment of 1100 ° C for 4 hours, and the two monocrystalline silicon wafers are bonded by the silicon-silicon direct eutectic bonding technology. It is sealed with a monocrystalline silicon support to obtain a micro heat pipe. The micro heat pipe is a three-layer sealing structure of a single crystal silicon wafer, a single crystal silicon support and a single crystal silicon wafer. The two single crystal silicon wafers and the single crystal silicon support form an
(4)在微热管的其中一片单晶硅片上,距离矩形单晶硅片上侧边和右侧边距离都为20mm处,采用无热影响区的飞秒激光钻孔,加工出真空灌液孔,钻孔直径为1mm,孔深为0.2mm,激光功率为50W,通过真空灌注机对微热管抽真空并向微热管灌注工质液体,抽真空为将微热管腔内的压力抽至15Pa,然后灌注工质去离子水0.08ml,再对真空灌液孔进行激光焊接密封,焊接速度为10m/min,激光焊接设备的输出功率为20kW,即得到抗重力超薄微热管,制备的抗重力超薄微热管的长为100mm、宽为40mm、截面厚度为0.6mm、管壳的壁厚为0.2mm。(4) On one of the single crystal silicon wafers of the micro heat pipe, the distances from the upper side and the right side of the rectangular single crystal silicon wafer are both 20mm, using femtosecond laser drilling without heat-affected zone to process the vacuum irrigation Liquid hole, the drilling diameter is 1mm, the hole depth is 0.2mm, and the laser power is 50W. The micro heat pipe is evacuated by the vacuum perfusion machine and the working fluid liquid is poured into the micro heat pipe. The vacuum pumping is to pump the pressure in the micro heat pipe cavity. To 15Pa, then pour 0.08ml of deionized water as the working medium, and then seal the vacuum filling hole by laser welding, the welding speed is 10m/min, and the output power of the laser welding equipment is 20kW, that is, the anti-gravity ultra-thin micro heat pipe is obtained. Preparation The anti-gravity ultra-thin micro heat pipe has a length of 100mm, a width of 40mm, a section thickness of 0.6mm, and a wall thickness of the tube shell of 0.2mm.
实施例2Example 2
本实施例一种抗重力超薄微热管制备方法,包括下列步骤:The present embodiment is a method for preparing an anti-gravity ultra-thin micro heat pipe, comprising the following steps:
(1)选择适合进行激光加工、具有较高热导率的单晶硅片作为原材料,将单晶硅片和单晶硅支架用去离子水超声振动清洗30分钟,超声波频率为25kHz,再将单晶硅片在80℃的烘干炉中烘干10分钟。(1) Select a single crystal silicon wafer suitable for laser processing and with high thermal conductivity as the raw material, clean the single crystal silicon wafer and the single crystal silicon support with ultrasonic vibration of deionized water for 30 minutes, the ultrasonic frequency is 25kHz, and then the single crystal silicon wafer and the single crystal silicon support are cleaned by ultrasonic vibration for 30 minutes. The crystalline silicon wafers were dried in a drying oven at 80°C for 10 minutes.
(2)将单晶硅片的单面连续进行两次飞秒激光加工,加工出阵列排布的梭形结构;其中,第一次加工出阵列排布的梭形结构作为毛细吸液芯,第二次加工出沿单晶硅片长度方向的多条横截面为矩形的凹槽,具体为,第一步在长为480mm,宽为60mm的基板上,水平放置两片长为200mm、宽为40mm、截面厚度为0.2mm的单晶硅片,两片单晶硅片的间距为10mm,在硅片上采用激光加工出梭形结构的尖槽,激光的波长为600nm,激光的能量控制在90mW,激光切割速度为20μm/s,加工出的尖槽在长边方向的间距为200μm,在宽边方向的间距为70μm,激光发生器与硅片之间的角度为40°,得到梭形阵列;第二步在距离第一步激光加工过的梭形阵列两侧分别间隔20μm处采用飞秒激光进行两侧凹槽的切割,激光的波长为450nm,激光的能量控制在75mW,激光切割速度为12μm/s。经过两次激光加工得到带有梭形表面结构的吸液芯。采用去离子水超声振动清洗单晶硅片30分钟,超声波频率为25kHz,再将单晶硅片在80℃的烘干炉中烘干10分钟。(2) Perform two femtosecond laser processing on a single side of a single crystal silicon wafer in succession to process a shuttle-shaped structure arranged in an array; wherein, the shuttle-shaped structure arranged in an array is processed for the first time as a capillary wick, For the second time, a plurality of grooves with rectangular cross-sections along the length of the single crystal silicon wafer are processed. Specifically, in the first step, two pieces of 200mm long and 60mm wide are placed horizontally on a substrate with a length of 480mm and a width of 60mm. It is a single crystal silicon wafer with a thickness of 40mm and a section thickness of 0.2mm. The distance between the two single crystal silicon wafers is 10mm. The sharp groove of the fusiform structure is processed on the silicon wafer by laser. The wavelength of the laser is 600nm, and the energy of the laser is controlled. At 90mW, the laser cutting speed is 20μm/s, the distance of the processed sharp grooves in the long side direction is 200μm, the distance in the wide side direction is 70μm, the angle between the laser generator and the silicon wafer is 40°, and the shuttle is obtained. In the second step, the femtosecond laser is used to cut the grooves on both sides at a distance of 20 μm from the two sides of the laser-processed shuttle array in the first step. The wavelength of the laser is 450 nm, and the energy of the laser is controlled at 75 mW. The cutting speed was 12 μm/s. The absorbent core with the fusiform surface structure was obtained after two laser processes. The single-crystal silicon wafers were cleaned by ultrasonic vibration of deionized water for 30 minutes, and the ultrasonic frequency was 25 kHz, and then the single-crystal silicon wafers were dried in a drying oven at 80°C for 10 minutes.
(3)通过步骤(2)加工出两片单晶硅片,将两片单晶硅片带有梭形阵列的一面相对、并在两片单晶硅片之间放入单晶硅支架,并用夹具进行定位、夹紧,夹紧压力约为2Pa,然后在500℃真空环境中加热2小时,通过硅-硅直接共晶键合技术将两片单晶硅片和单晶硅支架密封,得到微热管,微热管为单晶硅片、单晶硅支架和单晶硅片的三层密封结构,两片单晶硅片和单晶硅支架共同形成内腔。(3) Two single crystal silicon wafers are processed by step (2), the sides of the two single crystal silicon wafers with the shuttle array are opposite to each other, and a single crystal silicon support is placed between the two single crystal silicon wafers, And use a clamp for positioning and clamping, the clamping pressure is about 2Pa, and then heated in a vacuum environment of 500 ° C for 2 hours, and the two single-crystal silicon wafers and the single-crystal silicon support are sealed by the silicon-silicon direct eutectic bonding technology. A micro heat pipe is obtained. The micro heat pipe is a three-layer sealing structure of a single crystal silicon wafer, a single crystal silicon support and a single crystal silicon wafer, and the two single crystal silicon wafers and the single crystal silicon support jointly form an inner cavity.
(4)在微热管的其中一片单晶硅片上,距离矩形单晶硅片上侧边和右侧边距离都为20mm处,采用无热影响区的飞秒激光钻孔,加工出真空灌液孔,钻孔直径为2mm,孔深为0.2mm,激光功率为55W,通过真空灌注机对微热管抽真空并向微热管灌注工质液体,抽真空为将微热管腔内的压力抽至15Pa,然后灌注工质去离子水0.1ml,再对真空灌液孔进行激光焊接密封,焊接速度为5m/min,激光焊接设备的输出功率为15kW,即得到抗重力超薄微热管,制备的抗重力超薄微热管的长为200mm、宽为40mm、截面厚度为0.6mm、管壳的壁厚为0.2mm。(4) On one of the single crystal silicon wafers of the micro heat pipe, the distances from the upper side and the right side of the rectangular single crystal silicon wafer are both 20mm, using femtosecond laser drilling without heat-affected zone to process the vacuum irrigation Liquid hole, the drilling diameter is 2mm, the hole depth is 0.2mm, and the laser power is 55W. The micro-heat pipe is evacuated by the vacuum perfusion machine and the working fluid is poured into the micro-heat pipe. The vacuum is to pump the pressure in the micro-heat pipe cavity To 15Pa, then pour 0.1ml of deionized water as the working medium, and then seal the vacuum filling hole by laser welding, the welding speed is 5m/min, and the output power of the laser welding equipment is 15kW, that is, the anti-gravity ultra-thin micro heat pipe is obtained. The anti-gravity ultra-thin micro heat pipe has a length of 200mm, a width of 40mm, a section thickness of 0.6mm, and a wall thickness of the tube shell of 0.2mm.
实施例3Example 3
本实施例一种抗重力超薄微热管制备方法,包括下列步骤:The present embodiment is a method for preparing an anti-gravity ultra-thin micro heat pipe, comprising the following steps:
(1)选择适合进行激光加工、具有较高热导率的单晶硅片作为原材料,将单晶硅片和单晶硅支架用去离子水超声振动清洗20分钟,超声波频率为25kHz,再将单晶硅片在95℃的烘干炉中烘干15分钟。(1) Select a single crystal silicon wafer with high thermal conductivity suitable for laser processing as the raw material, clean the single crystal silicon wafer and the single crystal silicon support with deionized water ultrasonic vibration for 20 minutes, the ultrasonic frequency is 25kHz, and then the single crystal silicon wafer and the single crystal silicon support The crystalline silicon wafers were dried in a drying oven at 95°C for 15 minutes.
(2)将单晶硅片的单面连续进行两次飞秒激光加工,加工出阵列排布的梭形结构;其中,第一次加工出阵列排布的梭形结构作为毛细吸液芯,第二次加工出沿单晶硅片长度方向的多条横截面为矩形的凹槽,具体为,第一步在长为600mm,宽为120mm的基板上,水平放置长为100mm、宽为40mm、截面厚度为0.2mm的单晶硅片10片,每片单晶硅片的间距为20mm,在硅片上采用激光加工出梭形结构的尖槽,激光的波长为500nm,激光的能量控制在80mW,激光切割速度为15μm/s,加工出的尖槽在长边方向的间距为300μm,在宽边方向的间距为80μm,激光发生器与硅片之间的角度为45°,得到的梭形阵列;第二步在距离第一步激光加工过的梭形阵列两侧分别间隔25μm处采用飞秒激光进行两侧凹槽的切割,激光的波长为400nm,激光的能量控制在70mW,激光切割速度为10μm/s。经过两次激光加工得到的单个梭形凹坑的轴测示意图,从而得到带有梭形表面结构的吸液芯。采用去离子水超声振动清洗单晶硅片20分钟,超声波频率为25kHz,再将单晶硅片在95℃的烘干炉中烘干15分钟。(2) The single side of the single crystal silicon wafer is processed by femtosecond laser twice continuously, and the shuttle-shaped structure arranged in an array is processed; wherein, the shuttle-shaped structure arranged in an array is processed for the first time as a capillary wick, For the second time, a plurality of grooves with rectangular cross-sections along the length direction of the single crystal silicon wafer are processed. Specifically, in the first step, a substrate with a length of 600mm and a width of 120mm is placed horizontally with a length of 100mm and a width of 40mm. , 10 single-crystal silicon wafers with a section thickness of 0.2mm, the spacing between each single-crystal silicon wafer is 20mm, and the fusiform structure of the sharp groove is processed on the silicon wafer by laser. The wavelength of the laser is 500nm, and the energy of the laser is controlled. At 80 mW, the laser cutting speed is 15 μm/s, the pitch of the processed sharp grooves in the long-side direction is 300 μm, the pitch in the wide-side direction is 80 μm, and the angle between the laser generator and the silicon wafer is 45°, the obtained The shuttle-shaped array; in the second step, femtosecond laser is used to cut the grooves on both sides at a distance of 25 μm from the two sides of the laser-processed shuttle-shaped array in the first step. The wavelength of the laser is 400 nm, and the energy of the laser is controlled at 70 mW. The laser cutting speed is 10 μm/s. Axonometric schematic diagram of a single fusiform dimple obtained by two laser processes, thereby obtaining a wick with a fusiform surface structure. The single-crystal silicon wafers were cleaned by ultrasonic vibration of deionized water for 20 minutes, and the ultrasonic frequency was 25 kHz, and then the single-crystal silicon wafers were dried in a drying oven at 95°C for 15 minutes.
(3)通过步骤(2)加工出10片单晶硅片,将单晶硅片带有梭形阵列的一面相对、并在两片单晶硅片之间放入单晶硅支架,组成五对,并用夹具进行定位、夹紧,夹紧压力约为1.45Pa,然后在1100℃真空环境中加热4小时,通过硅-硅直接共晶键合技术将两片单晶硅片和单晶硅支架密封,得到微热管,微热管为单晶硅片、单晶硅支架和单晶硅片的三层密封结构,两片单晶硅片和单晶硅支架共同形成内腔。(3) 10 single crystal silicon wafers are processed through step (2), the side of the single crystal silicon wafer with the shuttle array is opposite to each other, and a single crystal silicon support is placed between the two single crystal silicon wafers to form five Yes, and use a clamp for positioning and clamping, the clamping pressure is about 1.45Pa, and then heated in a vacuum environment of 1100 ° C for 4 hours, through the silicon-silicon direct eutectic bonding technology, two single crystal silicon wafers and single crystal silicon The support is sealed to obtain a micro heat pipe. The micro heat pipe is a three-layer sealing structure of a single crystal silicon wafer, a single crystal silicon support and a single crystal silicon wafer, and the two single crystal silicon wafers and the single crystal silicon support jointly form an inner cavity.
(4)在微热管的其中一片单晶硅片上,距离矩形单晶硅片上侧边和右侧边距离都为20mm处,采用无热影响区的飞秒激光钻孔,加工出真空灌液孔,钻孔直径为1mm,孔深为0.2mm,激光功率为50W,通过真空灌注机对微热管抽真空并向微热管灌注工质液体,抽真空为将微热管腔内的压力抽至15Pa,然后灌注工质去离子水0.08ml,再对真空灌液孔进行激光焊接密封,焊接速度为10m/min,激光焊接设备的输出功率为20kW,即得到五对抗重力超薄微热管,制备的抗重力超薄微热管的长为100mm、宽为40mm、截面厚度为0.6mm、管壳的壁厚为0.2mm。(4) On one of the single crystal silicon wafers of the micro heat pipe, the distances from the upper side and the right side of the rectangular single crystal silicon wafer are both 20mm, using femtosecond laser drilling without heat-affected zone to process the vacuum irrigation Liquid hole, the drilling diameter is 1mm, the hole depth is 0.2mm, and the laser power is 50W. The micro heat pipe is evacuated by the vacuum perfusion machine and the working fluid liquid is poured into the micro heat pipe. The vacuum pumping is to pump the pressure in the micro heat pipe cavity. To 15Pa, then pour 0.08ml of deionized water as the working medium, and then seal the vacuum filling hole by laser welding, the welding speed is 10m/min, and the output power of the laser welding equipment is 20kW, that is, five anti-gravity ultra-thin micro heat pipes are obtained. The prepared anti-gravity ultra-thin micro heat pipe has a length of 100 mm, a width of 40 mm, a section thickness of 0.6 mm, and a wall thickness of the tube shell of 0.2 mm.
如上所述,便可较好地实现本发明,上述实施例仅为本发明的较佳实施例,并非用来限定本发明的实施范围;即凡依本发明内容所作的均等变化与修饰,都为本发明权利要求所要求保护的范围所涵盖。As described above, the present invention can be well realized, and the above-mentioned embodiments are only preferred embodiments of the present invention, and are not intended to limit the scope of implementation of the present invention; It is covered by the scope of protection of the claims of the present invention.
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