CN109946551A

CN109946551A - It is a kind of for testing laser source, the device of detector and its test method

Info

Publication number: CN109946551A
Application number: CN201910426388.4A
Authority: CN
Inventors: 陈建; 申子要; 高天
Original assignee: Beijing Chuangchuang Nanjing Quantum Communication Technology Co Ltd
Current assignee: Beijing Chuangchuang Nanjing Quantum Communication Technology Co Ltd
Priority date: 2019-05-22
Filing date: 2019-05-22
Publication date: 2019-06-28
Anticipated expiration: 2039-05-22
Also published as: CN109946551B

Abstract

The invention discloses a kind of for testing laser source, the device of detector, including testing circuit, the test circuit includes controller, clock module, time location measurement module, light source module, optical attenuation module, optical splitter module, and the test circuit that above-mentioned component is constituted can test single-photon detector equipment；The light source module includes that burst pulse adjusts circuit, Distributed Feedback Laser driving circuit, Distributed Feedback Laser fixture, and the test circuit that the light source module including above-mentioned component and controller are constituted can test Distributed Feedback Laser.The device of the invention can be avoided external light source equipment, optical attenuator, and the test calibration problem of the detection efficient of single-photon detector, dark counting probability, afterpulse probability, effective gate-width is able to solve using the test method of the device；Optical parameter to the Distributed Feedback Laser in quantum secret communication can be completed using the test method of the device, technical indicator is tested.

Description

It is a kind of for testing laser source, the device of detector and its test method

Technical field

The present invention relates to the Distributed Feedback Lasers and list in Quantum Secure Communication field more particularly to quantum secret communication Photon detector, it is specifically a kind of for testing laser source, the device of detector and its test method；The test device and Test method is able to solve the survey of the detection efficient of single-photon detector equipment, dark counting probability, afterpulse probability, effective gate-width Try problem of calibrating；Can complete the optical parameter to the Distributed Feedback Laser in quantum secret communication, technical indicator is tested, and The factory parameter testing of DFB producer can be covered.

Background technique

In existing field of quantum secure communication, laser source is carried out luminous using Distributed Feedback Laser；It is carried out in existing manufacturer Usually increase a power supply (voltage source or current source) in the anode of laser and the end RF- or DC- in Distributed Feedback Laser test, By regulating power source voltage size (or size of current) come the luminescent spectrum of testing laser device, P-I curve and power stability Property etc..The factory test schematic diagram of existing producer's Distributed Feedback Laser is as shown in Figure 1, the program can test out the one of Distributed Feedback Laser A little general parameters and technical indicator.In classical communication application, the current value for usually loading the end DC- is larger (to be much larger than it Arrange heating current Ith value), the size of current by changing the end RF- generates different LED pulses, and laser is in hair always Light state.The testing scheme of Distributed Feedback Laser producer is highly suitable for classical communication field.

But there are larger differences for the application method in the test method and field of quantum secure communication of existing Distributed Feedback Laser Different, Distributed Feedback Laser shines to ensure luminescence phase randomness in field of quantum secure communication, general in the design to use The end DC- loading current is less than Ith, and the luminous control that a biggish short duration current realizes Distributed Feedback Laser is loaded on the end RF- System.Therefore the laser of DFB producer factory test differs greatly with the application in field of quantum secure communication, cannot test well The characteristics of luminescence of Distributed Feedback Laser in field of quantum secure communication.Such as: existing DFB producer laser test method cannot One short duration current (it is required that pulse width is in hundred ps magnitudes) is increased to the end Distributed Feedback Laser RF-, is unable to test out DFB laser Device increases the characteristics such as extinction ratio, spectrum under currents combination in different short duration currents and the end DC-.

Single-photon detecting survey technology is one of the core technology in field of quantum secure communication.Currently, quantum secret communication is led Single-photon detector in domain is based primarily upon the avalanche diode APD of InGaAs/InP material as its detecting element.Its work Operation mode is to work as single photon by being at " Geiger " mode plus the bias voltage higher than avalanche voltage on APD pipe It reaches certain probability triggering APD on APD pipe and " self-holding snowslide " occurs, generate biggish avalanche current, electricity is handled by rear class Road completes to detect it, to realize the detection of single photon.In order to ensure the continuous probe of single-photon detector, it is necessary to The avalanche process is quenched after snowslide generation, before the arrival of next photon, mode general at present realizes snowslide using gating patterns Process is quenched.

In quantum secret communication, in order to ensure that QKD process generates the safety of key, usually to multi-pass in detector device The performances such as detection efficient, dark counting probability, afterpulse probability, the effective gate-width of road single-photon detector propose relatively stringent With requirement.Currently, all big enterprises propose different test conditions to single photon detection parameter testing.Such as: Switzerland IDQ is public Department, PrincetonLightwave company, the U.S. and Guo Dun company, Chinese University of Science and Technology are proposed different test methods, wherein It is more detailed in big country, section shield " a kind of test device and its test method of single-photon detector " to propose single photon detection The test method of each technical indicator of device.A kind of test device for single-photon detector that big country, section shield proposes and its test side The technical solution of method is as shown in Figure 2.The test method that shield company, big country, section proposes are as follows: soft by human-computer exchange equipment (containing software) Part realizes that the parameter in test is issued and calculates, counts with numerical value；Output light source triggers driving signal to burst pulse in governor circuit Light source is generating single photon for testing by optical attenuator after burst pulse light source luminescent, while the gate touching in governor circuit It signals to drive and gives single photon detector module, delay adjustment is realized in governor circuit (test fixture), single photon detection Device module output countings give on motherboard circuit carry out data processing after obtain single photon detector module detection efficient, secretly Count the counting index such as probability, afterpulse probability, effective gate-width." a kind of test of single-photon detector that big country, section shield proposes Device and its test method " can be effectively solved single-photon detector Specifications in field of quantum secure communication and survey Why inscribe.But existing test device needs to provide external burst pulse light source and optical attenuator, occupy more equipment with Instrument.

Summary of the invention

In response to the problems existing in the prior art, the purpose of the present invention is to provide a kind of for testing laser source, detector Device and its test method；The test device and test method are able to solve the detection efficient of single-photon detector equipment, dark count Number probability, afterpulse probability, effective gate-width test calibration problem；It can complete to the Distributed Feedback Laser in quantum secret communication Optical parameter, technical indicator tested, and can cover the factory parameter testing of DFB producer.

The purpose of the present invention is what is solved by the following technical programs:

It is a kind of for testing laser source, the device of detector, including test circuit, it is characterised in that: the test circuit packet Include controller, clock module, time location measurement module, light source module, optical attenuation module, optical splitter module；

Controller refers to for receiving the instruction of man-machine switching equipment sending and generating corresponding control according to the instruction received It enables, and the control instruction is sent to respective modules, and the next information of the respective modules transmission can be received and be transferred to The human-computer exchange equipment；Be provided on the controller the port that can be connected with human-computer exchange equipment and it is multiple with it is corresponding The port that module is connected；

Clock module, for receiving the control instruction of the controller sending and generating synchronised clock letter according to the control instruction Number, the synchronizing clock signals are sent to single-photon detector equipment and time location measurement module；It is set on clock module It is equipped with the port being connected with single-photon detector equipment and time location measurement module；

Time location measurement module, for receiving described in the counting pulse signal and reception that the single-photon detector equipment issues The synchronizing clock signals of clock module output, are transferred directly to the controller or root for the counting pulse signal The knot for carrying out time location measurement according to the counting pulse signal and the synchronizing clock signals and measuring the time location Fruit is transferred to the controller；The port being connected with single-photon detector equipment is provided on time location measurement module；

Light source module, for receiving the luminous instruction of the controller sending and generating Laser emission to the optical attenuation mould Block；

Optical attenuation module, for receiving the laser and the control instruction for receiving the controller sending that the light source module issues, And the laser attenuation received is generated to the decaying laser of certain light intensity according to the control instruction；

Optical splitter module, for receiving the decaying laser of the certain light intensity, and by the decaying laser of single-photon state export to The single-photon detector equipment；The port being connected with the single-photon detector equipment is provided on optical splitter module；

Above controller, clock module, time location measurement module, light source module, optical attenuation module, optical splitter module are constituted Test circuit is able to carry out the performance test of single-photon detector equipment；

The light source module includes that burst pulse adjusts circuit, Distributed Feedback Laser driving circuit, Distributed Feedback Laser fixture；

Burst pulse adjusts circuit, for receiving the driving signal of the controller output, and generates the burst pulse electricity of hundred ps magnitudes Stream；

Distributed Feedback Laser driving circuit, for receiving the short duration current of the hundred ps magnitude, and under the control of the controller The short duration current of the hundred ps magnitude is passed to the end RF- of the Distributed Feedback Laser on Distributed Feedback Laser fixture, the end DC- makes its hair Light, for setting the end RF- of the Distributed Feedback Laser on Distributed Feedback Laser fixture, the electric current at the end DC- under the control of the controller Value；

Distributed Feedback Laser fixture, tests the performance of Distributed Feedback Laser for placing Distributed Feedback Laser, and can to optical attenuation module or Person's measuring instrument emits laser；Be provided on Distributed Feedback Laser fixture can respectively with the end RF- of Distributed Feedback Laser, the end DC-, swash The pin that light output end is connected, and be connected respectively with Distributed Feedback Laser driving circuit, optical attenuation module or measuring instrument Pin；

Above-mentioned controller, burst pulse adjust the test circuit that circuit, Distributed Feedback Laser driving circuit, Distributed Feedback Laser fixture are constituted The performance of Distributed Feedback Laser can be tested.

The clock module includes:

Output comparator, the control instruction for exporting controller is converted into the level signal of standard, and the level is believed Number output to clock driver；

Clock driver, for receiving the level signal of the output comparator output, and it is raw according to the level signal At clock signal, the clock signal is exported to the single-photon detector equipment and the time location measurement module.

The time location measurement module includes:

Input comparator, for receiving the counting pulse signal and the electricity for being converted into standard that the single-photon detector equipment issues Ordinary mail number, and the level signal is exported and gives 1:2 clock driver；

1:2 clock driver for receiving the level signal of the input comparator output, and generates clock signal output To time location measuring unit and the controller；

Time location measuring unit, for receiving the clock signal and the clock mould that the 1:2 clock driver exports The synchronizing clock signals of block output carry out time location measurement simultaneously according to the clock signal and the synchronizing clock signals The result that the time location measures is transferred to the controller.

The light source module includes:

Distributed Feedback Laser TEC control circuit, for receiving the control instruction of the controller, and it is raw according to the control instruction The temperature of the Distributed Feedback Laser on Distributed Feedback Laser fixture is controlled at temperature adjustment instructions.

The light source module includes:

Distributed Feedback Laser temperature collection circuit, for acquiring the inside real time temperature of the Distributed Feedback Laser on Distributed Feedback Laser fixture simultaneously Feed back to controller.

The optical attenuation module includes:

VOA attenuation circuit generates VOA attenuation for receiving the control instruction of the controller, and according to the control instruction Control instruction；

VOA, for receiving the laser of the transmitting of the Distributed Feedback Laser on the Distributed Feedback Laser fixture and receiving the VOA attenuation Control instruction generates the decaying laser with certain light intensity；The output end that can be connected with optical splitter module is equipped on VOA Mouthful.

The optical splitter module includes:

Optical splitter is conveyed to list for receiving the decaying laser of optical attenuation module output, and according to the characteristic of decaying laser respectively Photon detector equipment and the power meter that can be directly connected with human-computer exchange equipment.

It is a kind of for testing laser source, the test method of the device of detector, it is characterised in that: the test method is for surveying The step of when examination single-photon detector equipment are as follows:

A1, by the controller for testing circuit by serial ports connect with human-computer exchange equipment and human-computer exchange equipment pass through cable it is direct It is connected with the control interface of single-photon detector equipment, tests clock driver, input comparator, the optical splitter point in circuit It is not connect with the corresponding port of single-photon detector equipment, human-computer exchange equipment is by control interface directly to single-photon detector Equipment sends enabling signal, and start-up parameter is demarcated after single-photon detector equipment receives enabling signal；

Gate-control signal, temperature parameter, the bias voltage that A2, human-computer exchange equipment will be obtained in step (A1) by parameter calibration Value, delay value, effective gate-width are handed down to single-photon detector equipment, and control light source module by controller and do not shine, monochromatic light Sub- detector device output counts pulse and is transferred to time location measurement list after input comparator and 1:2 clock driver Member, the count value in the time location measuring unit statistical unit time are C1 and pass to controller；

A3, human-computer exchange equipment is shone by controller control light source module to VOA and controller passes through VOA attenuation circuit control The light intensity of VOA output, gives the light that the light of the light intensity exports single photon intensity after optical splitter to single-photon detector equipment, single It is single that the output of photon detector equipment counts pulse input time position measurement after input comparator and 1:2 clock driver Member, the count value in the time location measuring unit statistical unit time are that count maximum is C3 and passes to control in C2 and C2 Device processed；

Count value C1, C2 is sent to human-computer exchange equipment by A4, test circuit, calculates single-photon detecting in human-computer exchange equipment Survey detection efficient, the dark counting probability, afterpulse probability of device equipment, detection efficient, whereinWhen being dead Between；Dark counting probability, whereinFor luminous frequency；Afterpulse probability。

Parameter calibration detailed step in the step (A1) is as follows:

A11, human-computer exchange equipment only control single-photon detector equipment, and steps are as follows:

A111, single-photon detector equipment receive the synchronizing clock signals that clock driver is sent and carry out frequency multiplication, are gated Signal；

A112, human-computer exchange equipment issue temperature parameter and give single-photon detector equipment, the master inside single-photon detector equipment Control circuit control refrigeration equipment freezes to single photon APD pipe；

A12, human-computer exchange equipment control single-photon detector equipment and test circuit, steps are as follows:

A121, human-computer exchange equipment issue APD bias parameters and give single-photon detector equipment, single-photon detector equipment output meter Rapid pulse punching is transferred to controller after input comparator and 1:2 clock driver, and controller carries out counting statistics and will meter Numerical value is sent to human-computer exchange equipment, constantly changes the bias parameters of single photon APD pipe, until count value reaches threshold value and terminates, Corresponding voltage is bias voltage when reaching threshold value, obtains bias voltage value；

A122, controller control light source module shine to VOA and controller passes through the light intensity that VOA attenuation circuit control VOA is exported, Give the light that the light of the light intensity exports single photon intensity after optical splitter to single-photon detector equipment, single-photon detector equipment Output counts pulse input time location measurement unit, human-computer exchange after input comparator and 1:2 clock driver and sets The standby delay positions that time location measuring unit is controlled by controller, as soon as every adjustment delay positions, to the delay positions Counting counted, the corresponding count value of each delay positions is sent to human-computer exchange equipment, finds prolonging for maximum count value When position, the corresponding delay value of the delay positions be find delay value, according to counting to get for each delay positions of statistics Effective gate-width.

It is a kind of for testing laser source, the test method of the device of detector, it is characterised in that: the test method is for surveying The step of when examination Distributed Feedback Laser are as follows:

B1, test circuit is connected with human-computer exchange equipment and measuring instrument respectively, then Distributed Feedback Laser is accurately placed in In the Distributed Feedback Laser fixture for stating test circuit；

B2, human-computer exchange equipment pass sequentially through controller, the value at the end DC- of Distributed Feedback Laser is arranged Distributed Feedback Laser driving circuit CmA, value of the E value less than Ith and C value are set as adjacent to the maximum current value of Distributed Feedback Laser for the value at the end EmA, RF-；

By controller output drive signal, driving signal is adjusted after circuit is adjusted through burst pulse and is exported for B3, human-computer exchange equipment The burst pulse of hundred ps magnitudes gives Distributed Feedback Laser driving circuit, and human-computer exchange equipment drives electricity to Distributed Feedback Laser by controller Road is enabled, makes Distributed Feedback Laser driving circuit that driving Distributed Feedback Laser be gone to shine, the luminous function of measuring instrument records Distributed Feedback Laser Rate, optical pulse waveform, spectral characteristic；

B4, step (B2) is repeated, human-computer exchange equipment adjusts electricity through burst pulse by controller output drive signal, driving signal Road exports 0ps burst pulse after adjusting gives Distributed Feedback Laser driving circuit, and human-computer exchange equipment passes through controller to DFB laser Device driving circuit is enabled, makes Distributed Feedback Laser driving circuit that driving Distributed Feedback Laser be gone to shine, measuring instrument records Distributed Feedback Laser Luminous power, optical pulse waveform, spectral characteristic.

The test method is used to test specific steps when Distributed Feedback Laser are as follows:

B1, test circuit is connected with human-computer exchange equipment and measuring instrument respectively, is then accurately placed in Distributed Feedback Laser In the Distributed Feedback Laser fixture of above-mentioned test circuit, human-computer exchange equipment passes sequentially through controller, Distributed Feedback Laser driving circuit comes The end RF- of Distributed Feedback Laser, the current value at the end DC- are set, and human-computer exchange equipment passes sequentially through controller, Distributed Feedback Laser TEC Control circuit makes the centre of luminescence wavelength of Distributed Feedback Laser reach requirement to control to adjust the temperature of Distributed Feedback Laser, records temperature Value and wavelength value；

B2, human-computer exchange equipment set the temperature of Distributed Feedback Laser as the temperature value in step (B1), by the end DC- of Distributed Feedback Laser Value be set as the value at the end EmA, RF- and be set as CmA, the maximum current of value of the E value less than Ith and C value adjacent to Distributed Feedback Laser Value；

B4, human-computer exchange equipment set the temperature of Distributed Feedback Laser as the temperature value in step (B1) and repeat step (B2), man-machine Switching equipment adjusts the burst pulse of output 0ps after circuit is adjusted through burst pulse by controller output drive signal, driving signal Distributed Feedback Laser driving circuit is given, and human-computer exchange equipment is enabled to Distributed Feedback Laser driving circuit by controller, makes DFB laser Device driving circuit goes driving Distributed Feedback Laser to shine, luminous power, optical pulse waveform, the spectrum of measuring instrument records Distributed Feedback Laser Characteristic.

The present invention has the following advantages compared with prior art:

The device of the invention be able to solve the detection efficient of single-photon detector equipment, dark counting probability, afterpulse probability, effectively The test calibration problem of gate-width is solved and is needed in existing single-photon detector equipment test using light source equipment, optical attenuation The problem of device；And the controller in the device receives man-machine switching equipment instruction output drive signal and adjusts circuit drive to burst pulse Dynamic Distributed Feedback Laser shines, and reaches single photon level by VOA attenuation circuit and the adjusting of rear class optical attenuator；Controller passes through Output comparator, clock driver export synchronizing clock signals and carry out frequency multiplication output to the main control module of single-photon detector equipment And handled to obtain gate-control signal in the main control module of single-photon detector equipment and be handed down to single photon APD pipe, lead to simultaneously Cross the main control module start-up parameter demarcation flow of man-machine switching equipment control single-photon detector equipment, single-photon detector equipment It exports counting pulse signal and gives time location survey respectively to test circuit and through 1:2 clock driver output two-way clock signal Unit, controller are measured to complete counting statistics；By above-mentioned method can complete single-photon detector equipment detection efficient, The calibration of dark counting probability, afterpulse probability, effective gate-width, and relevant parameter is recorded to the storage unit of human-computer exchange equipment In, it is automatically performed parameter testing, the record of a set of single-photon detector equipment.

The device of the invention controls the realization pair of Distributed Feedback Laser TEC control circuit by human-computer exchange equipment, controller The temperature of Distributed Feedback Laser controls, and then realizes and control is adjusted to wherein cardiac wave length；Pass through Distributed Feedback Laser temperature acquisition electricity Road, which feeds back the internal temperature of Distributed Feedback Laser and adjusts Distributed Feedback Laser TEC control circuit by controller, realizes temperature stability maintenance, protects It is constant to hinder its central wavelength；Human-computer exchange equipment is controlled by controller exports the driving signal of Distributed Feedback Laser and through narrow arteries and veins It reconstitutes that output pulse width after economize on electricity road is adjusted is adjustable or changeless burst pulse, gives Distributed Feedback Laser driving circuit use To carry out the end RF- of Distributed Feedback Laser and the end DC- drive control, the driving current size at the end RF- and the end DC- is led to by controller It crosses Distributed Feedback Laser driving circuit and independently realizes control；The Distributed Feedback Laser on Distributed Feedback Laser fixture is placed on convenient for removing；The survey Trial assembly, which is set, can complete the optical parameter to the Distributed Feedback Laser in quantum secret communication, technical indicator is tested, and can cover The factory parameter testing for covering DFB producer, ensures that it is reliably applied in the light source of quantum secret communication product.

Detailed description of the invention

Attached drawing 1 is the schematic diagram of the test device of Distributed Feedback Laser in the prior art；

Attached drawing 2 is the schematic diagram of the test device of single-photon detector in the prior art；

Attached drawing 3 is the modular structure schematic diagram of the device for testing testing laser source, detector of the invention；

Attached drawing 4 is the detailed construction schematic diagram of the device for testing testing laser source, detector of the invention；

Attached drawing 5 is effective gate-width that parameter calibration process when the device of the invention is tested for single-photon detector equipment obtains When delay positions-counting relational graph；

Attached drawing 6 is that position-counting when obtaining count value C1 when the device of the invention is tested for single-photon detector equipment is closed System's figure；

Attached drawing 7 is position-counting when obtaining count value C2, C3 when the device of the invention is tested for single-photon detector equipment Relational graph.

Specific embodiment

The present invention will be further described below with reference to the accompanying drawings and embodiments.

As shown in Figure 3: a kind of for test probe, the device of optical device, including test circuit, test circuit can Synchronizing clock signals and single photon are exported to single-photon detector equipment, and single-photon detector equipment can be defeated to test circuit Enter to count pulse, which includes including controller, clock module, time location measurement module, light source module, optical attenuation Module, optical splitter module；It is provided with the port that can be connected with human-computer exchange equipment (containing software) and more on the controller A port being connected with respective modules；The input terminal of clock module is connected with controller and the synchronised clock of clock module is believed Number output end can be connected with single-photon detector equipment and time location measurement module respectively；Time location measurement module Input terminal respectively with single-photon detector equipment counting pulse output end and clock module synchronizing clock signals output end phase The output end of connection and time location measurement module is connected with controller；The input terminal of light source module be connected with controller and The output end of light source module is connected with optical attenuation module, and the output end of optical attenuation module is connected with optical splitter module, light splitting The output end of device module is connected with single-photon detector equipment and power meter；Above controller, clock module, when meta position The test circuit that measurement module, light source module, optical attenuation module, optical splitter module are constituted is set to be able to carry out single-photon detector and set Standby performance test.Light source module includes that burst pulse adjusts circuit, Distributed Feedback Laser driving circuit, Distributed Feedback Laser fixture；Narrow arteries and veins The input terminal for reconstituting economize on electricity road is connected with controller and the output end and Distributed Feedback Laser driving circuit phase of burst pulse adjusting circuit Connection；The input terminal of Distributed Feedback Laser driving circuit adjusts the output end of circuit with burst pulse respectively and controller is connected, and The output end of Distributed Feedback Laser driving circuit draws with the end the RF- pin of the Distributed Feedback Laser on Distributed Feedback Laser fixture, the end DC- respectively Foot is connected；Distributed Feedback Laser fixture for place Distributed Feedback Laser and respectively with Distributed Feedback Laser driving circuit, optical attenuation module or Person's measuring instrument is connected；Above-mentioned controller, burst pulse adjust circuit, Distributed Feedback Laser driving circuit, Distributed Feedback Laser fixture The test circuit of composition can test the performance of Distributed Feedback Laser.

As shown in Figure 4: a kind of for test probe, the device of optical device, including test circuit, test circuit can Synchronizing clock signals and single photon are exported to single-photon detector equipment, and single-photon detector equipment can be defeated to test circuit Enter to count pulse, which includes controller, clock driver, input comparator and optical splitter, is set on the controller It is equipped with the port that can be connected with human-computer exchange equipment (containing software), controller uses programmable chip or programmable module, And the port being connected with single-photon detector equipment is respectively arranged on clock driver, input comparator, optical splitter, it controls Device processed also passes through route and is successively connected with output comparator and clock driver, and controller passes through output comparator and clock Driver inputs synchronizing clock signals to the synchronizing clock signals input port of single-photon detector equipment, and clock driver passes through Route is connected with time location measuring unit, and clock driver exports synchronizing clock signals to time location measuring unit conduct The enabling signal of time location measuring unit；Controller is successively driven with time location measuring unit, 1:2 clock by route Device, input comparator are connected, and 1:2 clock driver directly passes through route and is connected with controller, on input comparator Count signal receiving port can receive the count signal of single-photon detector equipment output, and 1:2 clock driver receives input The level signal of comparator output, the clock signal a-road-through that 1:2 clock driver issues cross the output of time location measuring unit Controller is directly output to controller, another way；The controller is successively connected with light source module and VOA and optical splitter It connects, and controller is connected by VOA attenuation circuit with VOA and the controller issues VOA to VOA by VOA attenuation circuit and declines Down control instruction, controller can be such that optical splitter connect with single-photon detector equipment by the control to light source module and VOA Output port can export single photon；Light source module includes that burst pulse adjusts circuit, Distributed Feedback Laser driving circuit, DFB laser Device fixture, controller, burst pulse adjust circuit, Distributed Feedback Laser driving circuit is sequentially connected by route and is connect, and controller passes through Route is directly connected with Distributed Feedback Laser driving circuit, Distributed Feedback Laser driving circuit respectively with the DFB on Distributed Feedback Laser fixture The end RF-, the end DC- of laser are connected；Human-computer exchange equipment (containing software) passes sequentially through controller, Distributed Feedback Laser driving electricity Road sets the end RF- of Distributed Feedback Laser, the current value at the end DC-；Distributed Feedback Laser on Distributed Feedback Laser fixture can pass through optical fiber Be connected with VOA (receiving end of VOA is used to receive the laser of Distributed Feedback Laser transmitting, output end for output attenuatoin laser) or Person is connected with measuring instrument, and measuring instrument is one or more of combinations of oscillograph, power meter, spectrometer.The device pair When single-photon detector equipment is tested, it is provided in single-photon detector equipment straight with human-computer exchange equipment (containing software) Connect the control interface being connected.

In device described in Fig. 4, light source module further includes Distributed Feedback Laser TEC control circuit, Distributed Feedback Laser TEC control The input terminal of circuit is connected by route with controller and its output end is connected by route with Distributed Feedback Laser fixture, control Device processed adjusts the temperature of the Distributed Feedback Laser on Distributed Feedback Laser fixture by control Distributed Feedback Laser TEC control circuit；DFB laser It further includes Distributed Feedback Laser temperature collection circuit, one end of Distributed Feedback Laser temperature collection circuit and Distributed Feedback Laser that device, which tests circuit, Fixture is connected, the other end is connected with controller, and Distributed Feedback Laser temperature collection circuit is able to detect on Distributed Feedback Laser fixture Distributed Feedback Laser inside real time temperature and feed back to controller, controller is acquired according to Distributed Feedback Laser temperature collection circuit Temperature value adjusts the temperature of the Distributed Feedback Laser on Distributed Feedback Laser fixture by control Distributed Feedback Laser TEC control circuit, so that The temperature of Distributed Feedback Laser is constant.

In device described in Fig. 4, optical splitter selection at least exports the optical splitter of two-way, sets all the way with single-photon detector Standby to connect and export single photon intensity, another way is connect with power meter and the power meter passes through route and human-computer exchange equipment (containing software) is connected directly；In use, controller, which issues voltage, gives VOA attenuation circuit, VOA attenuation circuit control VOA is opened from 0V When beginning to increase voltage, 0V and each pressurization, power meter measures a light intensity and is delivered to human-computer exchange equipment (containing software), Until terminating after the voltage (such as 5V) of VOA a cycle, the curve of human-computer exchange equipment (containing software) output voltage and light intensity is closed System.

Specifically: the effect of power meter is as follows: when being measured using single-photon detector equipment, the effect of power meter It is whether detection optical splitter exports single photon and give single-photon detector equipment, specifically, VOA control circuit control VOA attenuation Degree will meet the light that optical splitter exports single photon intensity all the way, the specification of the selection of the light intensity and optical splitter of remaining route output It is related, such as 1:999BS, when the intensity value for exporting single photon intensity is expressed as 1, the intensity of another output is represented by 999, therefore by checking that power meter measures light intensity whether in reasonable range, it can be learnt that single-photon detector equipment receives To light intensity whether be single photon intensity light；If power meter, which measures light intensity, exceeds reasonable range, can also be according to power meter Measurement result control VOA control circuit is in VOA to the attenuation degree of light in reasonable range.

Illustrate use provided by the invention by being tested single-photon detector equipment, Distributed Feedback Laser separately below In testing laser source, the device of detector.

The device is used for the step of test method when testing single-photon detector equipment are as follows:

A1, the controller for testing circuit is connect by serial ports and human-computer exchange equipment (containing software) and human-computer exchange equipment (contains Software) directly it is connected with the control interface of single-photon detector equipment by cable, test the clock driver, defeated in circuit Enter comparator, optical splitter to connect with the corresponding port of single-photon detector equipment respectively, human-computer exchange equipment (containing software) passes through Control interface sends enabling signal directly to single-photon detector equipment, and single-photon detector equipment opens after receiving enabling signal Dynamic parameter calibration；Parameter calibration detailed step is as follows:

A11, human-computer exchange equipment (containing software) only control single-photon detector equipment, and steps are as follows: A111, single-photon detector Equipment receives the synchronizing clock signals that clock driver is sent and carries out frequency multiplication, obtains gate-control signal；A112, human-computer exchange equipment (containing software) issues temperature parameter and gives single-photon detector equipment, and the governor circuit inside single-photon detector equipment controls refrigeration Equipment freezes to single photon APD pipe；

A12, human-computer exchange equipment (containing software) control single-photon detector equipment and test circuit, steps are as follows: A121, people Machine switching equipment (containing software) issues APD bias parameters (since 0V) to single-photon detector equipment, and single-photon detector is set Standby output counts pulse and is transferred to controller after input comparator and 1:2 clock driver, and controller carries out counting system It counts and count value is sent to human-computer exchange equipment (containing software), constantly change the bias parameters of single photon APD pipe, until counting Value, which reaches threshold value (as detection counts the reverse bias voltage that can stop adjusting single photon APD pipe between 50~100), to be terminated, Corresponding voltage is bias voltage when reaching threshold value, obtains bias voltage value；A122, controller control laser transmission circuit hair Light is to VOA and controller passes through the light intensity that VOA attenuation circuit control VOA is exported, and the light of the light intensity is exported after optical splitter The light of single photon intensity gives single-photon detector equipment, the output of single-photon detector equipment count pulse by input comparator with And input time location measurement unit after 1:2 clock driver, human-computer exchange equipment (containing software) control the time by controller The delay positions of location measurement unit, as soon as every adjustment delay positions, count the counting of the delay positions, will respectively prolong When position corresponding count value be sent to human-computer exchange equipment (containing software), find the delay positions of maximum count value, the delay The corresponding delay value in position is the delay value found, and (is accorded with according to effective gate-width that counts to get of each delay positions of statistics Gate-width degree is closed, that is, counts the width for being greater than the threshold interval of setting, as shown in Figure 5).

A2, human-computer exchange equipment (containing software) join the gate-control signal obtained in step (A1) by parameter calibration, temperature Number, bias voltage value, delay value, effective gate-width are handed down to single-photon detector equipment, and control Laser emission by controller Circuit does not shine, and the output of single-photon detector equipment counts pulse and transmits after input comparator and 1:2 clock driver Time location measuring unit is given, the count value of (such as 1S) is C1 and passes to control in the time location measuring unit statistical unit time Device processed, as shown in fig. 6, it is C1 that wherein each position, which counts summation,；

A3, human-computer exchange equipment (containing software) is shone by controller control laser transmission circuit to VOA and controller passes through VOA Attenuator circuit controls the light intensity of VOA output, and the light of the light intensity is exported the light of single photon intensity to single photon after optical splitter Detector device, the output of single-photon detector equipment count pulse and input after input comparator and 1:2 clock driver Time location measuring unit, the count value of (such as 1S) is to count most in C2 and C2 in the time location measuring unit statistical unit time Big value is C3 and passes to controller, as shown in fig. 7, wherein for C2, maximum count value C3, i.e., each position counts summation Count value when 5000ns；

Count value C1, C2 is sent to human-computer exchange equipment (containing software) by A4, test circuit, in human-computer exchange equipment (containing software) In calculate detection efficient, the dark counting probability, afterpulse probability of single-photon detector equipment, detection efficient , whereinFor the dead time；Dark counting probability, whereinFor luminous frequency；Afterpulse probability。

The detection efficient of single-photon detector, dark counting probability, afterpulse probability, effectively can be completed through the above steps The test of gate-width and the parameter calibration process in single-photon detector.

The step of when test method is for testing Distributed Feedback Laser are as follows:

B1, test circuit is connected with human-computer exchange equipment (containing software) and measuring instrument respectively, then Distributed Feedback Laser is accurate It is placed in the Distributed Feedback Laser fixture of above-mentioned test circuit；

B2, human-computer exchange equipment (contain software) pass sequentially through controller, Distributed Feedback Laser driving circuit for the end DC- of Distributed Feedback Laser Value be set as the value at the end EmA, RF- and be set as CmA, the maximum current of value of the E value less than Ith and C value adjacent to Distributed Feedback Laser Value；

By controller output drive signal, driving signal adjusts circuit tune through burst pulse for B3, human-computer exchange equipment (containing software) The burst pulse that hundred ps magnitudes are exported after section gives Distributed Feedback Laser driving circuit, and human-computer exchange equipment (containing software) passes through controller It is enabled to Distributed Feedback Laser driving circuit, make Distributed Feedback Laser driving circuit that driving Distributed Feedback Laser be gone to shine, measuring instrument records The luminous power of Distributed Feedback Laser, optical pulse waveform, spectral characteristic；

B4, step (B2) is repeated, driving signal is through narrow arteries and veins by controller output drive signal for human-computer exchange equipment (containing software) It reconstitutes and export the burst pulse of 0ps after economize on electricity road is adjusted and give Distributed Feedback Laser driving circuit, and human-computer exchange equipment (containing software) passes through Controller is enabled to Distributed Feedback Laser driving circuit, makes Distributed Feedback Laser driving circuit that driving Distributed Feedback Laser be gone to shine, measuring instrument Record luminous power, the optical pulse waveform, spectral characteristic of Distributed Feedback Laser.

B1, test circuit is connected with human-computer exchange equipment (containing software) and measuring instrument respectively, then by Distributed Feedback Laser standard It is really placed in the Distributed Feedback Laser fixture of above-mentioned test circuit, human-computer exchange equipment (containing software) passes sequentially through controller, DFB Laser driving circuit sets the end RF- of Distributed Feedback Laser, the current value at the end DC-, and human-computer exchange equipment (containing software) is successively Controlled to adjust by controller, Distributed Feedback Laser TEC control circuit Distributed Feedback Laser temperature make Distributed Feedback Laser shine in Cardiac wave is long to reach requirement, records temperature value and wavelength value；

B2, human-computer exchange equipment set (containing software) temperature of Distributed Feedback Laser as the temperature value in step (B1), by DFB laser The value that the value at the end DC- of device is set as the end EmA, RF- is set as CmA, and E value is less than the value of Ith and C value adjacent to Distributed Feedback Laser Maximum current value；

B4, human-computer exchange equipment set (containing software) temperature of Distributed Feedback Laser as the temperature value in step (B1) and repeat step (B2), human-computer exchange equipment (containing software) is adjusted circuit through burst pulse and is adjusted by controller output drive signal, driving signal The burst pulse for exporting 0ps afterwards gives Distributed Feedback Laser driving circuit, and human-computer exchange equipment (containing software) is swashed by controller to DFB Light device driving circuit is enabled, makes Distributed Feedback Laser driving circuit that driving Distributed Feedback Laser be gone to shine, measuring instrument records Distributed Feedback Laser Luminous power, optical pulse waveform, spectral characteristic.

In the test method, the centre of luminescence wavelength in step (B1) refers to that DFE laser to be measured shines and reaches production The factory-designed wavelength of the wavelength of product demand or producer；And the E value in step (B2) can cooperate C value to change in testing. In addition after the temperature value and wavelength value record in step (B1), human-computer exchange equipment (containing software) setting DFE laser to be measured Temperature be step (B1) in temperature value, set 0mA, DFE laser to be measured for the value at the end RF- of DFE laser to be measured The value at the end DC- be modulated to the maximum current value of DFE laser to be measured always by 0mA, in the DC- for changing DFE laser to be measured Pass through the pass between the value and luminous intensity, spectrum at the end DC- of measuring instrument records DFE laser to be measured during the value at end System.Or after the temperature value and wavelength value record in step (B1), human-computer exchange equipment (containing software) setting DFE laser to be measured Temperature be step (B1) in temperature value, set 0mA, DFE laser to be measured for the value at the end RF- of DFE laser to be measured The end DC- value be 0mA~DFE to be measured laser maximum current value in a certain specific value, distinguished by measuring instrument Test luminous power, the wavelength of DFE laser to be measured, and luminous power, wavelength and the time of test record DFE laser to be measured The curve of t.The sequencing of above-mentioned two test process can be set as needed.Substantially, the technology contents of the part are only In order to show that test of the device of the invention under quantum condition and factory test can be used.

Illustrate Distributed Feedback Laser test method provided by the invention below by specific embodiment.

Device provided by the invention is built first, in accordance with structure shown in Fig. 4.Test process is as follows:

C1, test circuit is connected with human-computer exchange equipment (containing software) and measuring instrument respectively, then by Distributed Feedback Laser standard It is really placed in the Distributed Feedback Laser fixture of above-mentioned test circuit, to be ready for relevant parameter, technical indicator test, surveys DFB and swash The end RF-, the end DC- of light device need and Distributed Feedback Laser driving circuit is stably connected with, and Distributed Feedback Laser and Distributed Feedback Laser TEC are controlled The light source that circuit is connected and Distributed Feedback Laser issues can be transferred in test equipment by optical fiber；

C2, human-computer exchange equipment (containing software) pass sequentially through controller, Distributed Feedback Laser driving circuit to set Distributed Feedback Laser The end RF- is that the current value at the end 0mA, DC- is 100mA, and human-computer exchange equipment (containing software) passes sequentially through controller, DFB laser Device TEC control circuit makes the centre of luminescence wavelength of Distributed Feedback Laser reach requirement to control to adjust the temperature of Distributed Feedback Laser, hair Center wavelength of light refers to that Distributed Feedback Laser shines and reaches the factory-designed wavelength of wavelength or producer of product demand, and record is warm Angle value and wavelength value；

C3, human-computer exchange equipment set (containing software) temperature of Distributed Feedback Laser as the temperature value in step (C2), by DFB laser The value at the end RF- of device is set as 0mA, and the value at the end DC- of Distributed Feedback Laser is modulated to always the maximum current of Distributed Feedback Laser by 0mA Value (such as: 150mA), Distributed Feedback Laser is recorded by test equipment during changing the value at the end DC- of Distributed Feedback Laser Relationship between the value and luminous intensity, spectrum at the end DC-；

C4, human-computer exchange equipment set (containing software) temperature of Distributed Feedback Laser as the temperature value in step (C2), by DFB laser The value at the end RF- of device is set as 0mA, and the value at the end DC- of Distributed Feedback Laser is 100mA, tests DFB respectively by test equipment and swashs Luminous power, the wavelength of light device, and the curve of the luminous power of test record Distributed Feedback Laser, wavelength and time t；

C5, human-computer exchange equipment set (containing software) temperature of Distributed Feedback Laser as the temperature value in step (C2), by DFB laser The value that the value at the end DC- of device is set as the end EmA, RF- is set as CmA, and E value is less than the value of agreement heating current Ith and C value is neighbouring The maximum current value of Distributed Feedback Laser, E value can cooperate the change of C value to find optimal value in testing, and human-computer exchange equipment (contains Software) by controller output drive signal, driving signal through burst pulse adjust exported after circuit is adjusted the burst pulse of 500ps to Distributed Feedback Laser driving circuit, and human-computer exchange equipment (containing software) is enabled to Distributed Feedback Laser driving circuit by controller, makes Distributed Feedback Laser driving circuit goes driving Distributed Feedback Laser to shine, and test equipment records luminous power, the light pulse wave of Distributed Feedback Laser Shape, spectral characteristic；

C6, human-computer exchange equipment set (containing software) temperature of Distributed Feedback Laser as the temperature value in step (C2), by DFB laser The value that the value at the end DC- of device is set as the end EmA, RF- is set as CmA, and E value is less than the value of agreement heating current Ith and C value is neighbouring The maximum current value of Distributed Feedback Laser, E value can cooperate the change of C value to find optimal value in testing, and human-computer exchange equipment (contains Software) by controller output drive signal, driving signal through burst pulse adjust exported after circuit is adjusted the burst pulse of 0ps to Distributed Feedback Laser driving circuit, and human-computer exchange equipment (containing software) is enabled to Distributed Feedback Laser driving circuit by controller, makes Distributed Feedback Laser driving circuit goes driving Distributed Feedback Laser to shine, and test equipment records luminous power, the light pulse wave of Distributed Feedback Laser Shape, spectral characteristic.

C1, C2, C3, C4 through the above steps, can complete Distributed Feedback Laser PI curve (containing agreement heating current Ith), The dependence test of power stability, spectrum stability and spectral characteristic, above test can complete Distributed Feedback Laser factory Photoelectric parameter testing is satisfied with parameter index test in classical communication application.C1, C2, C5, C6 through the above steps, can be complete It at the characteristics of luminescence of the Distributed Feedback Laser under burst pulse driving, notes down to its parameter index, judgement can reliably be applied to amount In sub- secret communication.

The device of the invention be able to solve the detection efficient of single-photon detector equipment, dark counting probability, afterpulse probability, The test calibration problem of effective gate-width is solved and is needed in existing single-photon detector equipment test using light source equipment, light The problem of attenuator.Controller in the device receives man-machine switching equipment instruction output drive signal and adjusts circuit to burst pulse It drives Distributed Feedback Laser to shine, reaches horizontal (such as 0.1 light of single photon by VOA attenuation circuit and the adjusting of rear class optical attenuator Son)；Controller gives single photon by output comparator, clock driver output synchronizing clock signals (such as 100KHz synchronised clock) The main control module of detector device carries out frequency multiplication output and is handled to obtain in the main control module of single-photon detector equipment Gate-control signal is handed down to single photon APD pipe, while the main control module of single-photon detector equipment is controlled by human-computer exchange equipment Start-up parameter demarcation flow, single-photon detector equipment export counting pulse signal to test circuit and through 1:2 clock driver Output two-way clock signal gives time location measuring unit, controller respectively to complete counting statistics；Pass through above-mentioned method The calibration of the detection efficient, dark counting probability, afterpulse probability, effective gate-width of single-photon detector equipment can be completed, and will Relevant parameter is recorded into the storage unit of human-computer exchange equipment, and the parameter for being automatically performed a set of single-photon detector equipment is surveyed Examination, record.The device is controlled Distributed Feedback Laser TEC control circuit by human-computer exchange equipment, controller and realized to DFB laser The temperature of device controls, and then realizes and control is adjusted to wherein cardiac wave length；It is fed back by Distributed Feedback Laser temperature collection circuit The internal temperature of Distributed Feedback Laser simultaneously adjusts the realization temperature stability maintenance of Distributed Feedback Laser TEC control circuit by controller, ensures wherein Cardiac wave length is constant；Human-computer exchange equipment controls the driving signal of output Distributed Feedback Laser by controller and adjusts by burst pulse Output pulse width is adjustable after circuit is adjusted or changeless burst pulse, gives Distributed Feedback Laser driving circuit and is used to DFB The driving current size at the end RF- of laser and the end DC- progress drive control, the end RF- and the end DC- is swashed by controller by DFB Light device driving circuit independently realizes control；The Distributed Feedback Laser on Distributed Feedback Laser fixture is placed on convenient for removing；The device can The optical parameter of the Distributed Feedback Laser in quantum secret communication, technical indicator are tested in completion, and can cover DFB producer Factory parameter testing, ensure that it is reliably applied in the light source of quantum secret communication product.

The above examples only illustrate the technical idea of the present invention, and this does not limit the scope of protection of the present invention, all According to the technical idea provided by the invention, any changes made on the basis of the technical scheme each falls within the scope of the present invention Within；The technology that the present invention is not directed to can be realized by the prior art.

Claims

1. a kind of for testing laser source, the device of detector, including test circuit, it is characterised in that: the test circuit Including controller, clock module, time location measurement module, light source module, optical attenuation module, optical splitter module；

2. according to claim 1 for testing laser source, the device of detector, it is characterised in that: the clock mould Block includes:

3. according to claim 1 or 2 for testing laser source, the device of detector, it is characterised in that: the time Position measuring module includes:

4. according to claim 1 for testing laser source, the device of detector, it is characterised in that: the light source die Block includes:

5. according to claim 1 or 4 for testing laser source, the device of detector, it is characterised in that: the light source Module includes:

6. according to claim 1 for testing laser source, the device of detector, it is characterised in that: the optical attenuation Module includes:

7. according to claim 1 for testing laser source, the device of detector, it is characterised in that: the optical splitter Module includes:

8. it is a kind of using it is as claimed in claim 1 for testing laser source, detector device test method, It is characterized in that: the step of test method is for when testing single-photon detector equipment are as follows:

9. according to claim 8 for testing laser source, the test method of the device of detector, it is characterised in that: institute The parameter calibration detailed step stated in step (A1) is as follows:

10. it is a kind of using it is as claimed in claim 1 for testing laser source, detector device test method, It is characterized by: the step of when the test method is for testing Distributed Feedback Laser are as follows:

11. according to claim 10 for testing laser source, the test method of the device of detector, it is characterised in that: The test method is used to test specific steps when Distributed Feedback Laser are as follows: