CN109917264A - A kind of converter valve thyristor level short-circuit test device and method - Google Patents
A kind of converter valve thyristor level short-circuit test device and method Download PDFInfo
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Abstract
The present invention relates to a kind of converter valve thyristor level short-circuit test device and methods, described device includes single-chip microcontroller, experiment power supply module, acquisition processing module, photoelectric conversion module and data analysis module, first output end of single-chip microcontroller is connected to the input terminal of experiment power supply module, the output end of experiment power supply module is connected to the input terminal of thyristor grade, the output end of thyristor grade is connected to the input terminal of acquisition processing module, the output end of acquisition processing module is connected to the first input end of data analysis module, the input terminal of photoelectric conversion module is connected to the output end of thyristor electronic equipment TE, the output end of photoelectric conversion module is connected to the input terminal of single-chip microcontroller, the second output terminal of single-chip microcontroller is connected to the second input terminal of data analysis module.The present invention can push back road to Thyristor and simultaneously and carry out short-circuit detecting, and can provide specific test data, the method for only providing indicator light better than import VTE equipment.
Description
Technical field
The present invention relates to electric system devices field, more particularly, to a kind of converter valve thyristor level short-circuit test device and
Method.
Background technique
Thyristor is the core component of converter valve, it determines that the through-current capability of converter valve, converter valve generally use multistage
Thyristors in series work, to obtain desired system voltage.For the normal work for ensuring converter valve, need to every in converter valve
Level-one thyristor carries out short-circuit test.
Currently used method be by valve routine examination unit (VTE) generate test voltage, by test voltage be applied to by
It surveys on thyristor, checks whether the related indicator light on VTE panel is lighted later, if not lighting, that is, be considered as pass the test, the quilt
Thyristor is surveyed without short circuit.It follows that although the test method is simple, without embodying specific test during entire test
Data, only using indicator light whether lighting as judgment basis, not can guarantee the accuracy of test result.
In addition, thyristor grade presses antihunt circuit, gate units to link together by Thyristor and its in converter valve
It constitutes, therefore, the short-circuit test of thyristor grade actually should include Thyristor and push back the two-part detection in road, but
The method that conventionally employed VTE is tested only has carried out short-circuit detecting to Thyristor, and there is no to push back road into
Row short-circuit detecting.
Summary of the invention
It is an object of the present invention to overcome the above-mentioned drawbacks of the prior art and provide a kind of converter valve thyristors
Grade short-circuit test device and method.
The purpose of the present invention can be achieved through the following technical solutions: a kind of converter valve thyristor level short-circuit test dress
It sets, including single-chip microcontroller, experiment power supply module, acquisition processing module, photoelectric conversion module and data analysis module, the single-chip microcontroller
The first output end be connected to the input terminal of the experiment power supply module, the output end of the experiment power supply module is connected to brilliant lock
The input terminal of pipe grade, the output end of thyristor grade are connected to the input terminal of the acquisition processing module, the acquisition processing module
Output end be connected to the first input end of the data analysis module, the input terminal of the photoelectric conversion module is connected to brilliant lock
The output end of pipe electronic equipment TE, the output end of the photoelectric conversion module are connected to the input terminal of the single-chip microcontroller, the list
The second output terminal of piece machine is connected to the second input terminal of the data analysis module；
The single-chip microcontroller is for output waveform control signal and decoding pulse signal；
The experiment power supply module is for generating test alternating voltage；
The acquisition processing module is used to acquire the voltage and current signals of thyristor grade, and carries out signal processing；
The photoelectric conversion module is for receiving TE return pulse signal；
The data analysis module is for storing and analyzing test data.
Preferably, the acquisition processing module is attached by Ethernet and the data analysis module.
Preferably, the photoelectric conversion module is attached by optical fiber and TE.
Preferably, the single-chip microcontroller is attached by serial ports and the data analysis module.
Preferably, the experiment power supply module includes being sequentially connected the waveform generator, signal conditioner, power amplification connect
Device, isolating transformer and current limiting unit, wherein the input of the waveform generator is that the waveform of single-chip microcontroller output controls letter
Number, the output end of the current limiting unit is connected to the input terminal of thyristor grade,
The waveform generator is for generating power frequency sinusoidal AC voltage signal；
The signal conditioner is used to adjust the voltage value of power frequency sinusoidal AC voltage signal；
The power amplifier is for amplifying power frequency sinusoidal AC voltage signal；
The isolating transformer is used to inhibit the high frequency spurs in power frequency sinusoidal AC voltage signal；
The short circuit current when current limiting unit is for limit assay is excessive.
Preferably, the acquisition processing module includes voltage acquisition unit, current acquisition unit and signal processing unit, institute
The output end for stating voltage acquisition unit and the current acquisition unit is connected respectively to the input terminal of the signal processing unit, institute
The output end for stating signal processing unit is connected to the first input end of the data analysis module,
The voltage acquisition unit is used to acquire the voltage signal of thyristor grade；
The current acquisition unit is used to acquire the current signal of thyristor grade；
The signal processing unit for collected thyristor step voltage and current signal are filtered, amplify and
A/D conversion.
Preferably, the voltage acquisition unit and the current acquisition unit pass through high-speed collection card and realize collection voltages
With the purpose of electric current.
Preferably, the current acquisition unit has overcurrent protection function.
Preferably, the data analysis module includes analysis mainboard and display screen, and the analysis mainboard is for storing test
Data, and it is for statistical analysis to test data, to judge whether tested thyristor grade occurs short circuit；The display screen is for real
When show test waveform, test data and analysis result.
Preferably, the analysis mainboard is technical grade embedded main board, and the display screen is LCD display.
A method of using the converter valve thyristor level short-circuit test device, comprising:
Step 1, simultaneously load test alternating voltage: the control signal exported according to single-chip microcontroller is generated, experiment power supply module is raw
At test power frequency AC sine wave voltage, and by alternating voltage load between the anode and cathode of tested thyristor grade；
Step 2, acquisition process thyristor step voltage and current signal: acquisition processing module acquires the electricity of thyristor grade respectively
Pressure and current signal, collected voltage and current signals are successively filtered respectively later, amplify and A/D conversion, with
The voltage digital signal and current digital signal for exporting thyristor grade are to data analysis module；
Step 3, decoding TE returns pulse signal: photoelectric conversion module receives TE by optical fiber and returns pulse signal, and will
The TE returns pulse signal transmission to single-chip microcontroller, and output TE returns pulse cracking after single-chip microcontroller is decoded TE return pulse signal
Code data are to data analysis module；
Step 4, analysis test data and output test result: selection data analytical model, if selection analysis mode one,
Data analysis module is analyzed TE return pulse decoding data and output test as a result, show test waveform simultaneously；If choosing
Analytical model two is selected, then data analysis module analyze simultaneously output test knot to the voltage and current digital signal of thyristor grade
Fruit, while showing test waveform.
Compared with prior art, the invention has the following advantages:
One, device proposed by the present invention has the function of output test voltage and detection thyristor grade short circuit, this hair simultaneously
The method of bright proposition is analyzed based on specific test data, is had the advantages that simple and reliable, easily operated.
Two, the present invention provides two kinds of data analytical models: returning pulse signal by receiving TE, is able to achieve to thyristor
The short-circuit detecting of element；By acquiring the voltage and current signals of thyristor grade, it is able to achieve to the short-circuit detecting for pushing back road.
Three, test data of the invention and test waveform pass through display screen and are shown, and test data is stored,
The trackability that ensure that test result is conducive to accurately analyze test result.
Detailed description of the invention
Fig. 1 is the device of the invention structural schematic diagram；
Fig. 2 is flow chart of the method for the present invention；
Fig. 3 is the Thyristor short-circuit analysis test waveform figure of embodiment；
Fig. 4 pushes back road short-circuit analysis test waveform figure for embodiment；
In diagram, 10 be single-chip microcontroller, and 20 be experiment power supply module, and 30 be acquisition processing module, and 40 be photoelectric conversion module,
50 be data analysis module, and 201 be waveform generator, and 202 be signal conditioner, and 203 be power amplifier, and 204 become for isolation
Depressor, 205 be current limiting unit, and 301 be voltage acquisition unit, and 302 be current acquisition unit, and 303 be signal processing unit, 501
To analyze mainboard, 502 be display screen.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiment is a part of the embodiments of the present invention, rather than whole embodiments.Based on this hair
Embodiment in bright, those of ordinary skill in the art's every other reality obtained without making creative work
Example is applied, all should belong to the scope of protection of the invention.
As shown in Figure 1, a kind of converter valve thyristor level short-circuit test device, including single-chip microcontroller 10, experiment power supply module 20,
First output end of acquisition processing module 30, photoelectric conversion module 40 and data analysis module 50, single-chip microcontroller 10 is connected to test
The input terminal of power module 20, the output end of experiment power supply module 20 are connected to the input terminal of thyristor grade, and single-chip microcontroller 10 exports
Waveform control signal makes experiment power supply module 20 generate test alternating voltage, and the test alternating voltage is loaded on thyristor
Grade；
The output end of thyristor grade is connected to the input terminal of acquisition processing module 30, and the output end of acquisition processing module 30 is logical
The first input end that Ethernet is connected to data analysis module 50 is crossed, acquisition processing module 30 acquires and handles the electricity of thyristor grade
Pressure and current signal, data analysis module 50 analyzes the thyristor step voltage and current digital signal handled well, to sentence
It is disconnected to push back whether road occurs short circuit；
The input terminal of photoelectric conversion module 40 is connected to the output end of TE (thyristor electronic equipment) by optical fiber, and photoelectricity turns
The output end of mold changing block 40 is connected to the input terminal of single-chip microcontroller 10, and the second output terminal of single-chip microcontroller 10 is connected to data by serial ports
Second input terminal of analysis module 50, photoelectric conversion module 40 receives TE by optical fiber and returns pulse signal, right by single-chip microcontroller 10
TE return pulse signal is decoded output TE return pulse decoding data, and data analysis module 50 returns pulse cracking yardage to TE
According to being analyzed, to judge whether thyristor grade occurs short circuit.
Wherein, experiment power supply module 20 is by being sequentially connected the waveform generator connect 201, signal conditioner 202, power amplification
Device 203, isolating transformer 204 and current limiting unit 205 are constituted, and the input of waveform generator 201 is the waveform that single-chip microcontroller 10 exports
Signal is controlled, for generating power frequency sinusoidal AC voltage signal, signal conditioner 202 is for adjusting power frequency sinusoidal voltage letter
Number voltage value, power amplifier 203 is for amplifying power frequency sinusoidal AC voltage signal, and isolating transformer 204 is for inhibiting work
High frequency spurs in frequency sinusoidal AC voltage signal, the output end of current limiting unit 205 are connected to the input terminal of thyristor grade, are used for
Short circuit current when limit assay is excessive；
Acquisition processing module 30 includes voltage acquisition unit 301, current acquisition unit 302 and signal processing unit 303, electricity
Pressure acquisition unit 301 and current acquisition unit 302 are respectively used to the voltage signal and current signal of acquisition thyristor grade, respectively
Output end be connected respectively to the input terminal of signal processing unit 303, signal processing unit 303 is used for collected thyristor
Step voltage and current signal be filtered, amplify and A/D conversion, the output end of signal processing unit 303 are connected to data point
Analyse the first input end of module 50；
In addition, data analysis module 50 includes analysis mainboard 501 and display screen 502, analysis mainboard 501 is embedding using technical grade
Enter formula mainboard, for for statistical analysis to TE return pulse decoding data, the voltage and current digital signal of thyristor grade, sentences
Whether disconnected tested thyristor grade occurs short circuit, and display screen 502 uses LCD display, returns pulse signal for real-time exhibition TE
Waveform, the voltage and current signals waveform of thyristor grade, test data and analysis result.
Fig. 1 describes the generation of experiment power supply, the collection process of voltage, electric current, the current acquisition unit in the present embodiment
302 increase overcurrent protection function, and single-chip microcontroller 10 receives the pulse signal of TE plate return, and this signal is sent to analysis mainboard
501 are judged, the acquisition of voltage, current signal is completed by high speed acquisition chip, and by network cable transmission to analyzing mainboard
501, analysis 501 return pulse signal of mainboard, voltage signal, current signal are for statistical analysis, and result and waveform diagram are led to
It crosses display screen 502 to show, measured data can also store, and can transmit data by WIFI, test method is simple
Easy, work efficiency is high.
Wherein, experiment power supply is to control the power-frequency voltage signal that waveform generator 201 exports by single-chip microcontroller 10 to pass through signal
Adjusting, power amplification, isolation transformation, then current limliting output.The voltage stabilization of output is reliable, is the sinusoidal ac signal of standard, defeated
The height of voltage can reach voltage value required for test by signal conditioner 202 out, and this voltage value is shown in display
On screen 502.
The acquisition of voltage, current signal is realized by the capture card of high speed, and the sampling rate of capture card is reachable
1MSPS, then analysis mainboard 501 is transmitted to by Ethernet and carries out accident analysis, and the waveform diagram real-time display of sampling in aobvious
In display screen 502, waveform diagram can intuitively show the current voltage loaded at thyristor both ends, current conditions.If thyristor is deposited
In short circuit phenomenon, the waveform diagram of voltage and current and real-time voltage and current value intuitively can be accurately embodied on display screen 502,
Operator is facilitated to analyze.
TE returns pulse signal by optical fiber transmission, photoelectric conversion, and pulse signal is finally transmitted to single-chip microcontroller in real time
10 are counted, are analyzed, and data are transmitted to analysis mainboard 501 by serial ports by single-chip microcontroller 10, and real-time display is in display screen 502
On, display screen 502 can real time inspection current TE return pulse the case where.
As shown in Fig. 2, a kind of converter valve thyristor level short-circuit test method based on above-mentioned apparatus, comprising:
Step 1, simultaneously load test alternating voltage: the control signal exported according to single-chip microcontroller 10, experiment power supply module is generated
20 generate test power frequency AC sine wave voltages, and by alternating voltage load tested thyristor grade anode and cathode it
Between；
Step 2, acquisition process thyristor step voltage and current signal: acquisition processing module 30 acquires thyristor grade respectively
Voltage and current signals, collected voltage and current signals are successively filtered respectively later, amplify and A/D conversion,
With export thyristor grade voltage digital signal and current digital signal to data analysis module 50；
Step 3, decoding TE returns pulse signal: photoelectric conversion module 40 receives TE by optical fiber and returns pulse signal, and
By TE return pulse signal transmission to single-chip microcontroller 10, output TE return after single-chip microcontroller 10 is decoded TE return pulse signal
Pulse decoding data are to data analysis module 50；
Step 4, analysis test data and output test result: selection data analytical model, if selection analysis mode one,
Data analysis module 50 is analyzed TE return pulse decoding data and output test as a result, show test waveform simultaneously；If
Selection analysis mode two, then data analysis module 50 analyzes the voltage and current digital signal of thyristor grade and exports examination
It tests as a result, showing test waveform simultaneously.
In the present embodiment, experiment power supply module 20 export test alternating voltage virtual value be 400V, period 20ms,
The test alternating voltage is applied in tested thyristor grade, continues 40 cycles, i.e. 800ms, analytical model one the case where
Under, it shows the Thyristor short-circuit analysis test waveform figure of screen display and is tied as shown in figure 3, returning pulse as test using TE
The foundation of fruit judgement, if there is no short circuits for Thyristor, at least receive 10 TE return pulses (pulse width 13~
17us)；
In the case where analytical model two, show screen display pushes back road short-circuit analysis test waveform figure such as Fig. 4 institute
Show, the foundation judged using thyristor step voltage, electric current as test result, whether detection thyristor step voltage declines, if electric
Pressure value is less than the 80% of normal value, while electric current is greater than the 120% of normal value, that is, thinks that short circuit occurs for Thyristor.
The operation principle of the present invention is that: power-frequency voltage signal is exported by single-chip microcontroller control waveform generator, the signal is through adjusting
Input power amplifier after solution, and alternating voltage is connected to through isolating transformer the anode and cathode of tested thyristor, to prevent
Short circuit current is excessive, and voltage output end is serially connected with current-limiting resistance.By detection thyristor grade both end voltage and electric current, receive TE times
Pulse is reported, the number of pulses for generating voltage oscillogram, current waveform figure and the return of TE plate is shown on LCD display.Short circuit
There are two types of analysis of experiments modes for test, and one is judged that another kind is according to thyristor step voltage, electricity according to return pulse
Whether stream accurately distinguishes thyristor grade short-circuit.Switching may be selected in two kinds of test models, and measured data, waveform diagram are storable in
To facilitate inquiry on embedded main board.
The above description is merely a specific embodiment, but scope of protection of the present invention is not limited thereto, any
Those familiar with the art in the technical scope disclosed by the present invention, can readily occur in various equivalent modifications or replace
It changes, these modifications or substitutions should be covered by the protection scope of the present invention.Therefore, protection scope of the present invention should be with right
It is required that protection scope subject to.
Claims (10)
1. a kind of converter valve thyristor level short-circuit test device, which is characterized in that including single-chip microcontroller, experiment power supply module, acquisition
First output end of processing module, photoelectric conversion module and data analysis module, the single-chip microcontroller is connected to the experiment power supply
The output end of the input terminal of module, the experiment power supply module is connected to the input terminal of thyristor grade, the output end of thyristor grade
It is connected to the input terminal of the acquisition processing module, the output end of the acquisition processing module is connected to the data analysis module
First input end, the input terminal of the photoelectric conversion module is connected to the output end of thyristor electronic equipment TE, the photoelectricity
The output end of conversion module is connected to the input terminal of the single-chip microcontroller, and the second output terminal of the single-chip microcontroller is connected to the data
Second input terminal of analysis module；
The single-chip microcontroller is for output waveform control signal and decoding pulse signal；
The experiment power supply module is for generating test alternating voltage；
The acquisition processing module is used to acquire the voltage and current signals of thyristor grade, and carries out signal processing；
The photoelectric conversion module is for receiving TE return pulse signal；
The data analysis module is for storing and analyzing test data.
2. a kind of converter valve thyristor level short-circuit test device according to claim 1, which is characterized in that at the acquisition
Reason module is attached by Ethernet and the data analysis module.
3. a kind of converter valve thyristor level short-circuit test device according to claim 1, which is characterized in that the photoelectricity turns
Mold changing block is attached by optical fiber and TE.
4. a kind of converter valve thyristor level short-circuit test device according to claim 1, which is characterized in that the single-chip microcontroller
It is attached by serial ports and the data analysis module.
5. a kind of converter valve thyristor level short-circuit test device according to claim 1, which is characterized in that the test electricity
Source module includes being sequentially connected the waveform generator connect, signal conditioner, power amplifier, isolating transformer and current limiting unit,
Wherein, the input of the waveform generator is the waveform control signal of single-chip microcontroller output, the output end of the current limiting unit
It is connected to the input terminal of thyristor grade；
The waveform generator is for generating power frequency sinusoidal AC voltage signal；
The signal conditioner is used to adjust the voltage value of power frequency sinusoidal AC voltage signal；
The power amplifier is for amplifying power frequency sinusoidal AC voltage signal；
The isolating transformer is used to inhibit the high frequency spurs in power frequency sinusoidal AC voltage signal；
The short circuit current when current limiting unit is for limit assay is excessive.
6. a kind of converter valve thyristor level short-circuit test device according to claim 1, which is characterized in that at the acquisition
Reason module includes voltage acquisition unit, current acquisition unit and signal processing unit, the voltage acquisition unit and the electric current
The output end of acquisition unit is connected respectively to the input terminal of the signal processing unit, and the output end of the signal processing unit connects
It is connected to the first input end of the data analysis module,
The voltage acquisition unit is used to acquire the voltage signal of thyristor grade；
The current acquisition unit is used to acquire the current signal of thyristor grade；
The signal processing unit is for being filtered collected thyristor step voltage and current signal, amplifying and A/D
Conversion.
7. a kind of converter valve thyristor level short-circuit test device according to claim 6, which is characterized in that the voltage is adopted
Collect the purpose that unit and the current acquisition unit realize collection voltages and electric current by high-speed collection card, the current acquisition
Unit has overcurrent protection function.
8. a kind of converter valve thyristor level short-circuit test device according to claim 1, which is characterized in that the data point
Analysing module includes analysis mainboard and display screen, and the analysis mainboard counts test data for storing test data
Analysis, to judge whether tested thyristor grade occurs short circuit；The display screen for real-time exhibition test waveform, test data and
Analyze result.
9. a kind of converter valve thyristor level short-circuit test device according to claim 8, which is characterized in that the analysis master
Plate is technical grade embedded main board, and the display screen is LCD display.
10. a kind of method using converter valve thyristor level short-circuit test device described in claim 1, which is characterized in that packet
It includes:
Step 1, simultaneously load test alternating voltage: the control signal exported according to single-chip microcontroller is generated, experiment power supply module generates examination
It tests and uses power frequency AC sine wave voltage, and by alternating voltage load between the anode and cathode of tested thyristor grade；
Step 2, acquisition process thyristor step voltage and current signal: acquisition processing module acquire respectively thyristor grade voltage and
Current signal, collected voltage and current signals are successively filtered respectively later, amplify and A/D conversion, with output
The voltage digital signal and current digital signal of thyristor grade are to data analysis module；
Step 3, decoding TE returns pulse signal: photoelectric conversion module receives TE return pulse signal by optical fiber, and by the TE
Pulse signal transmission is returned to single-chip microcontroller, output TE returns pulse cracking yardage after single-chip microcontroller is decoded TE return pulse signal
According to data analysis module；
Step 4, analysis test data and output test result: selection data analytical model, if selection analysis mode one, data
Analysis module is analyzed TE return pulse decoding data and output test as a result, show test waveform simultaneously；If selection point
Analysis mode two, then data analysis module to the voltage and current digital signal of thyristor grade analyze and output test as a result,
Test waveform is shown simultaneously.
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| CN110441668A (en) * | 2019-08-19 | 2019-11-12 | 西安易恩电气科技有限公司 | A kind of high-power IGBT test macro |
| CN112269061A (en) * | 2020-09-14 | 2021-01-26 | 中国南方电网有限责任公司超高压输电公司广州局 | Valve section module component impedance measurement system |
| CN112505496A (en) * | 2020-11-03 | 2021-03-16 | 西安交通大学 | Thyristor real-time diagnosis and prediction method for insulation abnormity in converter valve |
| CN113325290A (en) * | 2021-06-25 | 2021-08-31 | 西安派瑞功率半导体变流技术股份有限公司 | Thyristor life aging screening device for high-voltage direct-current transmission valve |
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Application publication date: 20190621 |