CN109946522B - Resistance test fixture - Google Patents
Resistance test fixture Download PDFInfo
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- CN109946522B CN109946522B CN201910178499.8A CN201910178499A CN109946522B CN 109946522 B CN109946522 B CN 109946522B CN 201910178499 A CN201910178499 A CN 201910178499A CN 109946522 B CN109946522 B CN 109946522B
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- adapter plate
- assembly
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- 238000012360 testing method Methods 0.000 title claims abstract description 30
- 239000000523 sample Substances 0.000 claims abstract description 129
- 239000000758 substrate Substances 0.000 claims abstract description 25
- 230000000712 assembly Effects 0.000 description 4
- 238000000429 assembly Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- 230000003028 elevating effect Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
A resistance test fixture comprises a substrate, an electric linear module, a movable probe assembly and a fixed probe assembly, wherein the electric linear module is installed on the substrate; the electric linear module comprises a base connected with the substrate, a driving motor connected with the base and a sliding table arranged on the base in a sliding manner; the movable probe assembly is connected with the sliding table, and the driving motor drives the sliding table to drive the movable probe assembly to move relative to the fixed probe assembly; the fixed probe assembly and the movable probe assembly are correspondingly arranged; the first carrier assembly is connected with the sliding table and comprises a first adapter plate connected with the sliding table, a first clamping plate connected with the first adapter plate and a first carrier plate; the sliding table is driven by the driving motor to move relative to the base, and the movable probe assembly is connected with the sliding table, so that the distance between the movable probe assembly and the fixed probe assembly can be accurately adjusted, and the distance between the movable probe assembly and two ports of the resistor can be accurately corresponding to the distance between the movable probe assembly and the fixed probe assembly.
Description
Technical Field
The present invention relates to testing aids, and more particularly to a resistor testing fixture.
Background
In the mass production process of the chip resistor, sampling inspection is needed, and multiple chips are extracted from the resistor in the same batch to carry out resistance measurement; when the resistance value is measured, two groups of probes are needed to be respectively close to ports at two ends of the resistor; because the specifications of the resistors in different batches are different, the distances between the ports on two sides of the resistors in different specifications are different, the distance between the two groups of probes is generally corresponding to the distance between the ports on two sides of the resistor through manual adjustment of the probes in the conventional scheme, however, the precision of the manual adjustment of the probes is lower, so that the probes cannot be in contact with the ports of the resistor, and the resistance measurement of the resistor cannot be accurately realized.
Disclosure of Invention
Based on this, it is necessary to provide a resistance test fixture that automatically realizes probe adjustment.
A resistance test fixture, comprising: the probe comprises a substrate, an electric linear module, a movable probe assembly and a fixed probe assembly, wherein the electric linear module is arranged on the substrate; the electric linear module comprises a base connected with the base plate, a driving motor connected with the base and a sliding table arranged on the base in a sliding manner; the movable probe assembly is connected with the sliding table, and the driving motor drives the sliding table to drive the movable probe assembly to move relative to the fixed probe assembly; the fixed probe assembly is arranged corresponding to the movable probe assembly.
According to the resistance test jig, the sliding table is driven by the driving motor to move relative to the base, and the movable probe assembly is connected with the sliding table, so that the distance between the movable probe assembly and the fixed probe assembly can be accurately adjusted, and the distance between the movable probe assembly and two ports of the resistance can be accurately corresponding to the distance between the movable probe assembly and the fixed probe assembly.
In one embodiment, the sliding table further comprises a first carrier assembly connected with the sliding table, wherein the first carrier assembly comprises a first adapter plate connected with the sliding table, a first clamping plate connected with the first adapter plate, and a first carrier plate mounted on the first adapter plate; a first clamping groove is formed between the first adapter plate and the first clamping plate, and the first carrier plate is arranged in the first clamping groove; the movable probe assembly is connected with the first carrier plate.
In one embodiment, the first clamping plate is arranged in a U shape; the first carrier plate is connected with a first pushing handle, and the first clamping plate and the first pushing handle are correspondingly arranged.
In one embodiment, the device further comprises a second carrier assembly, wherein the second carrier assembly comprises a guide rail connected with the base plate, a second adapter plate connected with the guide rail, and a locking piece connected with the second adapter plate; the fixed probe assembly is connected with the second adapter plate; the second adapter plate is provided with a first waist-shaped hole, and the substrate is provided with a second screw hole corresponding to the first waist-shaped hole; the locking piece is respectively penetrated in the first waist-shaped hole and the second screw hole.
In one embodiment, the second carrier assembly further comprises an adjustor mounted on the base plate, and a spring member connected to the base plate; a top block extends on the second adapter plate, and the movable end of the regulator is arranged corresponding to the top block; the spring member makes the top block abut against the movable end of the regulator.
In one embodiment, the second carrier assembly further includes a second clamping plate connected to the second adapter plate, and a second carrier plate mounted on the second adapter plate; a second clamping groove is formed between the second clamping plate and the second adapter plate, and the second carrier plate is arranged in the second clamping groove; the fixed probe assembly is connected with the second carrier plate.
In one embodiment, the second clamping plate is arranged in a U shape; the second carrier plate is connected with a second pushing handle, and the second clamping plate and the second pushing handle are correspondingly arranged.
In one embodiment, a third screw hole is formed in the second adapter plate, and a second waist-shaped hole corresponding to the third screw hole is formed in the second carrier plate; the extending direction of the second waist-shaped hole is corresponding to the sliding direction of the sliding table.
In one embodiment, the guide rail comprises a track bar connected with the base plate and a sliding block arranged on the track bar in a sliding manner; the second carrier assembly further comprises a limiting block connected with the base plate, and the limiting block is arranged corresponding to the sliding block.
In one embodiment, the substrate comprises a side connecting part, a first boss part and a second boss part, wherein the side connecting part is vertically arranged, and the first boss part and the second boss part extend from the same side of the lower part of the side connecting part; the first boss portion and the second boss portion are arranged at intervals, one end of the first adapter plate corresponding to the first carrier plate extends to the lower side of the first boss portion, and one end of the second adapter plate corresponding to the second carrier plate extends to the lower side of the second boss portion.
Drawings
FIG. 1 is a schematic perspective view of a resistance testing fixture according to a preferred embodiment of the present invention;
FIG. 2 is an exploded view of the resistance test fixture shown in FIG. 1;
FIG. 3 is an exploded view of the electric linear module and the first carrier assembly of FIG. 2;
FIG. 4 is an exploded view of the electric linear module and the first carrier assembly of FIG. 2 at another angle;
FIG. 5 is an exploded view of the second carrier assembly of FIG. 2;
FIG. 6 is an exploded view of the second carrier assembly of FIG. 2 at another angle;
fig. 7 is a block diagram of a control circuit in the resistance test fixture.
Detailed Description
The present invention will be described more fully hereinafter in order to facilitate an understanding of the present invention. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention.
Referring to fig. 1 to 7, a resistor testing jig 100 according to a preferred embodiment of the invention is used for contacting probes to ports of resistors. The resistance test fixture 100 comprises a substrate 20, an electric linear module 30 mounted on the substrate 20, a movable probe assembly 40 connected with the electric linear module 30, and a fixed probe assembly 50 connected with the substrate 20; the electric linear module 30 comprises a base 31 connected with the substrate 20, a driving motor 32 connected with the base 31, and a sliding table 33 arranged on the base 31 in a sliding manner; the movable probe assembly 40 is connected with the sliding table 33, and the driving motor 32 drives the sliding table 33 to drive the movable probe assembly 40 to move relative to the fixed probe assembly 50; the fixed probe assembly 50 is disposed in correspondence with the movable probe assembly 40.
The sliding table 33 is driven by the driving motor 32 to move relative to the base 31, and the movable probe assembly 40 is connected with the sliding table 33, and the fixed probe assembly 50 is connected with the substrate 20, so that the distance between the movable probe assembly 40 and the fixed probe assembly 50 can be accurately adjusted, the distance between the movable probe assembly and two ports of the resistor can be accurately corresponding to each other, the probe can be accurately contacted with the port of the resistor to be measured, and the accurate measurement of the resistance value is facilitated.
Referring to fig. 3 and 4, in one embodiment, to facilitate replacement of the movable probe assembly 40 to adapt to different specifications of resistors or cope with wear, the resistor test fixture 100 further includes a first carrier assembly 60 connected to the sliding table 33, the first carrier assembly 60 includes a first adapter plate 61 connected to the sliding table 33, a first clamping plate 62 connected to the first adapter plate 61, and a first carrier 63 mounted on the first adapter plate 61; a first clamping groove 610 is formed between the first adapter plate 61 and the first clamping plate 62, and the first carrier plate 63 is installed in the first clamping groove 610; the movable probe assembly 40 is connected with the first carrier plate 63; specifically, when the movable probe assembly 40 needs to be replaced, the first carrier plate 63 is taken out from the first clamping groove 610, and then the first carrier plate 63 connected with other movable probe assemblies 40 is installed in the first clamping groove 610, so that the movable probe assembly 40 can be replaced for different tested resistors, for example, the movable probe assemblies 40 with different elasticity, length and spacing can be replaced for different tested resistors, or the movable probe assembly 40 can be replaced after being worn for a long time by replacing the first carrier plate 63, so that the movable probe assembly 40 can be replaced, and the reliable contact between the movable probe assembly 40 and the tested resistor can be kept.
In one embodiment, to facilitate the moving operation of the first carrier 63 in the first card slot 610, the first card 62 is disposed in a U shape; the first carrier plate 63 is connected with a first pushing handle 630, and the first clamping plate 62 is arranged corresponding to the first pushing handle 630; after the first carrier 63 is mounted in the first clamping groove 610, the first pushing handle 630 can be accommodated in the first clamping plate 62, and the first carrier 63 can be moved in the first clamping groove 610 by pushing the first pushing handle 630, so that the first carrier 63 is convenient to mount and dismount; further, in order to achieve reliable fixing between the first carrier 63 and the first adapter plate 61, the first adapter plate 61 is provided with a first screw hole 611, the first carrier 63 is provided with a first through hole 631 corresponding to the first screw hole 611, and the first carrier 63 and the first adapter plate 61 can be reliably fixed by sequentially passing through the first through hole 631 and the first screw hole 611 through the screw member.
Referring to fig. 1 and 5, in one embodiment, the direction in which the sliding table 33 moves relative to the base 31 is a first direction, and the direction parallel to the resistor mounting surface and perpendicular to the first direction is a second direction, so as to eliminate the mechanical error between the movable probe assembly 40 and the fixed probe assembly 50 in the second direction, the resistor testing fixture 100 further includes a second carrier assembly 70, where the second carrier assembly 70 includes a guide rail 71 connected to the substrate 20, a second adapter plate 72 connected to the guide rail 71, and a locking member 73 connected to the second adapter plate 72; the stationary probe assembly 50 is connected to the second adapter plate 72; the second adapter plate 72 is provided with a first waist-shaped hole 721, and the base plate 20 is provided with a second screw hole 21 corresponding to the first waist-shaped hole 721; the locking piece 73 is respectively penetrated into the first waist-shaped hole 721 and the second screw hole 21; in the present embodiment, the movable probe assembly 40 includes the first probe 41 and the second probe 42, the fixed probe assembly 50 includes the third probe 51 and the fourth probe 52, and the first probe 41, the second probe 42, the third probe 51, and the fourth probe 52 measure the resistance value of the resistor by the four-terminal sensing method; specifically, the guide rail 71 is disposed along the second direction, the second adapter plate 72 is slidably connected with the substrate 20 through the guide rail 71, and by sliding the second adapter plate 72 along the guide rail 71, the fixed probe assembly 50 and the movable probe assembly 40 can accurately correspond in the second direction, and after the position adjustment of the movable probe assembly 40 is completed, both the movable probe assembly 40 and the fixed probe assembly 50 can fully contact with both ends of the resistor; specifically, the locking member 73 is a screw member, the first waist-shaped hole 721 extends in the second direction, and after the adjustment of the fixing probe assembly 50 is completed, the locking member 73 is tightened, so that the second adapter plate 72 is snugly fixed to the base plate 20.
In one embodiment, the resistance testing fixture 100 is used for measuring the resistance of the thin film resistor, and because the thin film resistor has a smaller volume, the second adapter plate 72 needs to be moved accurately to eliminate the mechanical error, and the second carrier assembly 70 further includes a regulator 74 mounted on the substrate 20 and a spring member 75 connected to the substrate 20; a top block 723 extends on the second adapter plate 72, and the movable end of the regulator 74 is arranged corresponding to the top block 723; the spring member 75 urges the top block 723 against the movable end of the adjuster 74; specifically, the first supporting rod 22 is connected to the base plate 20, and the second supporting rod 722 is connected to the second adapter plate 72; the first support rod 22 is arranged close to the regulator 74, the second support rod 722 is arranged far away from the regulator 74, and two ends of the spring piece 75 are respectively connected with the first support rod 22 and the second support rod 722; in the present embodiment, the regulator 74 is a micro head; the fixed probe assembly 50 can precisely move relative to the movable probe assembly 40 in the second direction by adjusting the regulator 74, so that small mechanical errors are eliminated, and the method is suitable for measuring the resistance value of thin film resistors with small volumes.
Referring to fig. 5 and 6, in one embodiment, to facilitate replacement of the fixed probe assembly 50 to accommodate different specifications of resistances or to cope with wear, the second carrier assembly 70 further includes a second clamping plate 76 connected to the second adapter plate 72, and a second carrier plate 77 mounted on the second adapter plate 72; a second clamping groove 724 is formed between the second clamping plate 76 and the second adapter plate 72, and the second carrier plate 77 is installed in the second clamping groove 724; the fixed probe assembly 50 is connected to a second carrier plate 77; specifically, when the fixed probe assembly 50 needs to be replaced, the fixed probe assembly 50 can be replaced by taking the second carrier plate 77 out of the second clamping groove 724 and then loading the second carrier plate 77 connected with other fixed probe assemblies 50 into the second clamping groove 724, so that the fixed probe assemblies 50 with different specifications can be replaced for different tested resistors, or the fixed probe assembly 50 can be replaced by replacing the second carrier plate 77 after the fixed probe assembly 50 is worn, and reliable contact between the fixed probe assembly 50 and the tested resistor is maintained.
In one embodiment, to facilitate the movement of the second carrier 77 in the second card slot 724, the second card 76 is disposed in a U shape; the second carrier plate 77 is connected with a second pushing handle 771, and the second clamping plate 76 is arranged corresponding to the second pushing handle 771; after the second carrier plate 77 is mounted in the second clamping groove 724, the second pushing handle 771 can be accommodated in the second clamping plate 76, and the second carrier plate 77 can be moved in the second clamping groove 724 by pushing the second pushing handle 771, so that the mounting and dismounting of the second carrier plate 77 are facilitated.
In one embodiment, to facilitate adjusting the position of the fixed probe assembly 50 along the first direction to eliminate the mechanical error of fixing the probe assembly 50 relative to the measured resistor in the first direction, the second adapter plate 72 is provided with a third screw hole 725, and the second carrier plate 77 is provided with a second waist-shaped hole 770 corresponding to the third screw hole 725; the extending direction of the second waist-shaped hole 770 is provided corresponding to the sliding direction of the slide table 33; the screw member sequentially passes through the second waist-shaped hole 770 and the third screw hole 725, so that after the second carrier plate 77 is adjusted, the second carrier plate 77 and the second adapter plate 72 can be fixed.
In one embodiment, to prevent the second adapter plate 72 from being separated from the base plate 20, the guide rail 71 includes a rail bar 711 connected to the base plate 20, and a slider 712 slidably disposed on the rail bar 711; the second carrier assembly 70 further includes a stopper 78 connected to the substrate 20, where the stopper 78 is disposed corresponding to the slider 712; therefore, the limiting block 78 is used for limiting the moving distance of the sliding block 712, so that the second adapter plate 72 is prevented from being separated from the base plate 20 in the sliding process.
Referring to fig. 1 and 2, in one embodiment, to avoid the shielding effect of the substrate 20 on the movement of the movable probe assembly 40 relative to the fixed probe assembly 50, the substrate 20 includes a side connecting portion 23 vertically disposed, and a first boss portion 24 and a second boss portion 25 extending from the same side of the lower portion of the side connecting portion 23; the first boss portion 24 and the second boss portion 25 are arranged at intervals, one end of the first adapter plate 61 corresponding to the first carrier plate 63 extends to the lower side of the first boss portion 24, and one end of the second adapter plate 72 corresponding to the second carrier plate 77 extends to the lower side of the second boss portion 25; specifically, the movable probe assembly 40 and the fixed probe assembly 50 are disposed between the first boss portion 24 and the second boss portion 25, so that the movement of the movable probe assembly 40 relative to the fixed probe assembly 50 is prevented from being affected by the substrate 20, and the detection action of the resistance test fixture 100 can be conveniently observed and monitored; specifically, the external elevating and moving mechanism is connected to the side connection portion 23, and the movable probe assembly 40 and the fixed probe assembly 50 are brought into contact with different measured resistors, respectively, by the external elevating and moving mechanism.
Referring to fig. 7, specifically, since the resistance test fixture 100 may perform alternating tests on several specifications of resistances, in order to rapidly switch the position of the movable probe assembly 40 and avoid manual repeated adjustment, the resistance test fixture 100 further includes a control circuit 80, wherein the control circuit 80 includes an input unit 81, a comparison unit 82 connected to the input unit 81, a storage unit 83 connected to the comparison unit 82, and an output unit 84 connected to the comparison unit 82; the output unit 84 is used for inputting the specification of the resistor lot to be tested; specifically, the specification of the resistor to be tested may be input to the input unit 81 through a key, an input signal port, or other input device; the storage unit 83 records the current position value of the movable probe assembly 40 and the target position value of the movable probe assembly 40 corresponding to the resistors with different specifications; the comparison unit 82 obtains the corresponding target position value of the movable probe assembly 40 in the storage unit 83 according to the resistance specification input by the input unit 81, compares the target position value of the movable probe assembly 40 with the current position value of the movable probe assembly 40, and generates a position difference value between the target position value of the movable probe assembly 40 and the current position value of the movable probe assembly 40; the output unit 84 outputs a rotation signal to the driving motor 32 according to the position difference value, so that the movable probe assembly 40 moves by a predetermined distance, and the distance between the movable probe assembly 40 and the fixed probe assembly 50 just corresponds to the distance between two ports of the resistor to be tested, thereby avoiding repeated adjustment of the electric linear module 30 by manpower; specifically, the driving motor 32 is a stepping motor or a servo motor, and the driving motor 32 drives the slide table 33 to move accurately through a ball screw.
In this embodiment, the sliding table is driven by the driving motor to move relative to the base, and the movable probe assembly is connected with the sliding table, so that the distance between the movable probe assembly and the fixed probe assembly can be accurately adjusted, and the distance between the movable probe assembly and two ports of the resistor can be accurately corresponding to the distance between the movable probe assembly and the fixed probe assembly.
The technical features of the above-described embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above-described embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
The above examples illustrate only a few embodiments of the invention, which are described in detail and are not to be construed as limiting the scope of the invention. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the invention, which are all within the scope of the invention. Accordingly, the scope of protection of the present invention is to be determined by the appended claims.
Claims (10)
1. Resistance test tool, its characterized in that includes: the probe comprises a substrate, an electric linear module, a movable probe assembly and a fixed probe assembly, wherein the electric linear module is arranged on the substrate; the electric linear module comprises a base connected with the base plate, a driving motor connected with the base and a sliding table arranged on the base in a sliding manner; the movable probe assembly is connected with the sliding table, and the driving motor drives the sliding table to drive the movable probe assembly to move relative to the fixed probe assembly; the fixed probe assembly is arranged corresponding to the movable probe assembly;
The second carrier assembly comprises a guide rail connected with the base plate, a second adapter plate connected with the guide rail, and a locking piece connected with the second adapter plate; the fixed probe assembly is connected with the second adapter plate, a first waist-shaped hole is formed in the second adapter plate, and a second screw hole corresponding to the first waist-shaped hole is formed in the substrate; the locking piece is respectively penetrated into the first waist-shaped hole and the second screw hole; the second carrier assembly further comprises a regulator mounted on the base plate and a spring member connected with the base plate; a top block extends on the second adapter plate, and the movable end of the regulator is arranged corresponding to the top block; the spring piece enables the top block to be propped against the movable end of the regulator; the substrate is connected with a first supporting rod, and the second adapter plate is connected with a second supporting rod; the first support rod is close to the regulator, the second support rod is far away from the regulator, and two ends of the spring piece are respectively connected with the first support rod and the second support rod; the second adapter plate is provided with a third screw hole, and the second carrier plate is provided with a second waist-shaped hole corresponding to the third screw hole; the extending direction of the second waist-shaped hole is corresponding to the sliding direction of the sliding table; the guide rail comprises a rail strip connected with the base plate and a sliding block arranged on the rail strip in a sliding manner; the second carrier assembly further comprises a limiting block connected with the base plate, and the limiting block is arranged corresponding to the sliding block; the substrate comprises a side connecting part, a first boss part and a second boss part, wherein the side connecting part is vertically arranged, and the first boss part and the second boss part extend from the same side of the lower part of the side connecting part; the first boss portion and the second boss portion are arranged at intervals, and one end of the second adapter plate corresponding to the second carrier plate extends to the lower side of the second boss portion.
2. The resistance testing jig of claim 1, further comprising a first carrier assembly connected to the slipway, the first carrier assembly comprising a first adapter plate connected to the slipway, a first clamping plate connected to the first adapter plate, and a first carrier plate mounted on the first adapter plate; a first clamping groove is formed between the first adapter plate and the first clamping plate, and the first carrier plate is arranged in the first clamping groove; the movable probe assembly is connected with the first carrier plate, and one end of the first adapter plate corresponding to the first carrier plate extends to the lower side of the first boss portion.
3. The resistance test fixture of claim 2, wherein the first clamping plate is U-shaped; the first carrier plate is connected with a first pushing handle, and the first clamping plate and the first pushing handle are correspondingly arranged.
4. The resistance test fixture according to claim 2, wherein the first adapter plate is provided with a first screw hole, the first carrier plate is provided with a first through hole corresponding to the first screw hole, and the screw member sequentially passes through the first through hole and the first screw hole.
5. The resistance testing jig of claim 1, wherein the locking member is a screw member.
6. The resistance testing jig of claim 1, wherein the second carrier assembly further comprises a second clamping plate connected to the second adapter plate, and a second carrier plate mounted on the second adapter plate; a second clamping groove is formed between the second clamping plate and the second adapter plate, and the second carrier plate is arranged in the second clamping groove; the fixed probe assembly is connected with the second carrier plate.
7. The resistance test fixture of claim 6, wherein the second clamping plate is arranged in a U-shape; the second carrier plate is connected with a second pushing handle, and the second clamping plate and the second pushing handle are correspondingly arranged.
8. The resistance test fixture of claim 1, wherein the regulator is a differential head.
9. The resistance test fixture of claim 1, wherein the movable probe assembly and the fixed probe assembly are disposed between the first boss portion and the second boss portion.
10. The resistance test fixture of claim 1, wherein the side connection is connected to an external lifting movement mechanism.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910178499.8A CN109946522B (en) | 2019-03-11 | 2019-03-11 | Resistance test fixture |
| PCT/CN2020/078797 WO2020182149A1 (en) | 2019-03-11 | 2020-03-11 | Resistance test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910178499.8A CN109946522B (en) | 2019-03-11 | 2019-03-11 | Resistance test fixture |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109946522A CN109946522A (en) | 2019-06-28 |
| CN109946522B true CN109946522B (en) | 2024-05-24 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910178499.8A Active CN109946522B (en) | 2019-03-11 | 2019-03-11 | Resistance test fixture |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN109946522B (en) |
| WO (1) | WO2020182149A1 (en) |
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| CN212364423U (en) * | 2020-03-03 | 2021-01-15 | 瑞声科技(新加坡)有限公司 | Resistance test tool |
| CN111487465B (en) * | 2020-03-25 | 2022-08-26 | 桂林电子科技大学 | Probe spacing calibration method and contact resistivity and interface resistivity testing method |
| CN113759228A (en) * | 2021-09-10 | 2021-12-07 | 长江存储科技有限责任公司 | Acceptance test system and method |
| CN115015603A (en) * | 2022-05-20 | 2022-09-06 | 迪赛康科技(深圳)有限公司 | Bandwidth 40G interval adjustable differential probe |
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| Publication number | Publication date |
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| WO2020182149A1 (en) | 2020-09-17 |
| CN109946522A (en) | 2019-06-28 |
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