CN109884443B - Common mode inductance test mechanism - Google Patents
Common mode inductance test mechanism Download PDFInfo
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- CN109884443B CN109884443B CN201910053489.1A CN201910053489A CN109884443B CN 109884443 B CN109884443 B CN 109884443B CN 201910053489 A CN201910053489 A CN 201910053489A CN 109884443 B CN109884443 B CN 109884443B
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Abstract
The invention discloses a common-mode inductance testing mechanism which comprises a rack, a production line, an inductance withstand voltage testing device, a withstand voltage bad discharging device and an inductance comprehensive electrical parameter testing device, wherein the production line is arranged on the rack and used for conveying inductors, the inductance withstand voltage testing device, the withstand voltage bad discharging device and the inductance comprehensive electrical parameter testing device are arranged along the conveying direction of the production line, the inductance withstand voltage testing device is used for carrying out withstand voltage testing on the inductors, the inductance comprehensive electrical parameter testing device is used for testing electrical parameters of the inductors, and the withstand voltage bad discharging device removes unqualified inductors from the production line when the inductance. The invention realizes the unmanned test of the electrical performance parameters of the common mode inductance product, automatically distinguishes the OK product from the NG product, eliminates the subjectivity of artificial distinction and brings about the quality optimization.
Description
Technical Field
The invention relates to the technical field of automatic inductance testing.
Background
At present, the conventional modes of voltage resistance detection and comprehensive electrical parameter detection of electronic products adopt single-person operation, instruments prompt good products or poor products, and manual screening of OK products and NG products. Because the artificial discrimination has certain subjective consciousness, the instrument can be influenced by the whole workshop environment when prompting the alarm sound. Therefore, a conventional instrument testing mode has certain hidden trouble, namely, a defective product flows out to a client.
Disclosure of Invention
The invention aims to provide a common mode inductance testing mechanism, which realizes automatic testing of inductance and automatically separates bad inductance from good inductance.
In order to solve the technical problems, the invention adopts the following technical scheme: a common mode inductance testing mechanism comprises a rack, a production line, an inductance withstand voltage testing device, a withstand voltage bad discharging device and an inductance comprehensive electrical parameter testing device, wherein the production line is arranged on the rack and used for conveying inductors, the inductance withstand voltage testing device, the withstand voltage bad discharging device and the inductance comprehensive electrical parameter testing device are arranged along the conveying direction of the production line, the inductance withstand voltage testing device is used for carrying out withstand voltage testing on the inductors, the inductance comprehensive electrical parameter testing device is used for testing electrical parameters of the inductors, and the withstand voltage bad discharging device removes unqualified inductors from the production line when the inductance withstand.
Preferably, the assembly line adopts the straight line flat vibration feeder to realize the automatic inductance conveying, and a limiting baffle plate for correcting the inductance deviation so as to enable the inductance to be conveyed linearly is arranged on the conveying plane of the assembly line.
Preferably, the limiting baffle is connected with the assembly line through a position adjusting structure.
Preferably, the inductance voltage withstand test device comprises a bridge type support crossing the assembly line and an inductance voltage withstand tester arranged on the bridge type support, wherein the inductance voltage withstand tester is provided with two adjustable metal wires, and the metal wires contact pins of the inductor during testing.
Preferably, withstand voltage bad discharge device is including being located the wherein row's of assembly line material cylinder of one side, being located the bad inductance receiver of the other side of assembly line, the piston ejector pin that pushes away the material cylinder is connected with the material pushing head that promotes bad inductance and falls into bad inductance receiver from the assembly line.
Preferably, the inductance comprehensive electrical parameter testing device comprises an electrical parameter testing jig and a double-manipulator mechanism, the electrical parameter testing jig is arranged above the assembly line, the double-manipulator mechanism comprises a first manipulator and a second manipulator, the first manipulator grabs the inductance on the upper stream of the inductance comprehensive electrical parameter testing device and places the inductance on the testing jig for electrical parameter testing, and the second manipulator grabs the inductance on which the electrical parameter testing is completed and places the inductance on the lower stream of the inductance comprehensive electrical parameter testing device
Preferably, a comprehensive test material waiting port is arranged at the upper stream of the inductor comprehensive electrical parameter testing device, a sensor for sensing the in-place of the inductor is arranged at the comprehensive test material waiting port, the sensor synchronously triggers the first manipulator and the second manipulator to start to act after sensing the in-place of the inductor, and the comprehensive tester is triggered to start to test in a delayed mode.
Preferably, the inductance comprehensive electrical parameter testing device further comprises a limiting platform for limiting the downward stroke of the first manipulator and the second manipulator, and the testing jig is arranged on the limiting platform.
Preferably, the assembly line is provided with a good product material channel and a defective product material channel for distinguishing whether the inductor comprehensive electrical parameter test is qualified or unqualified at the downstream of the inductor comprehensive parameter test device.
By adopting the technical scheme, the inductor withstand voltage testing device, the withstand voltage bad discharging device and the inductor comprehensive electrical parameter testing device are sequentially arranged along the conveying direction of the production line, the inductor withstand voltage testing device is used for carrying out withstand voltage testing on the inductor, and the inductor comprehensive electrical parameter testing device is used for testing the electrical parameters of the inductor, so that the electrical property parameter testing of common-mode inductor products is unmanned, OK products and NG products are automatically distinguished, the subjectivity of artificial distinguishing is eliminated, and the quality is optimized. Meanwhile, manual discrimination and intervention are eliminated, so that automation is improved, and certain economic benefit is brought to enterprises.
The following detailed description of the present invention will be provided in conjunction with the accompanying drawings.
Drawings
The invention is further described with reference to the accompanying drawings and the detailed description below:
FIG. 1 is a schematic structural diagram of an inductor withstand voltage testing device and a withstand voltage bad discharging device in the invention;
FIG. 2 is a schematic structural diagram of an apparatus for testing comprehensive electrical parameters of an inductor according to the present invention;
FIG. 3 is a schematic view of the positioning of the limiting platform according to the present invention;
FIG. 4 is a first schematic structural diagram of a pipeline interrupt according to a second embodiment of the present invention;
fig. 5 is a second schematic structural diagram of a pipeline interrupt location in the second embodiment of the present invention.
Detailed Description
In a first embodiment, referring to fig. 1 to 3, a general common-mode inductor electrical parameter testing apparatus includes a rack, a production line 1 disposed on the rack and used for conveying inductors, an inductor withstand voltage testing device 2 disposed along a conveying direction of the production line, a voltage withstand voltage discharging device, and an inductor comprehensive electrical parameter testing device 3, where the inductor withstand voltage testing device is used for performing a voltage withstand test on inductors, the inductor comprehensive electrical parameter testing device is used for testing electrical parameters of inductors, and the voltage withstand voltage discharging device removes unqualified inductors from the production line when the inductor withstand voltage test is unqualified. The invention utilizes the assembly line to directionally feed, and the inductor to be tested respectively passes through a voltage-withstanding testing station (correspondingly provided with an inductor voltage-withstanding testing device) and a comprehensive electrical parameter testing station (correspondingly provided with an inductor comprehensive electrical parameter testing device) to complete the voltage-withstanding and comprehensive electrical parameter testing.
The assembly line 1 adopts a linear flat vibration feeder to realize automatic inductor conveying, the inductors are provided with limiting baffles 11 on two sides of the assembly line when being directionally conveyed on the assembly line, the limiting baffles 11 correct the inductor deviation to enable the inductors to be linearly conveyed, a limiting channel is formed between the two limiting baffles arranged side by side, and the inductors passing through the limiting channels are regularly and directionally arranged.
Those skilled in the art can understand that the limiting baffles are arranged on the assembly line in a segmented manner, the inductors are freely conveyed on the assembly line at the position where the limiting baffle 11 is not arranged, and before entering a test station, the limiting baffles 11 need to be arranged to enable the inductors to be arranged in a row regularly, for example, two side-by-side limiting baffles on the upstream side of the inductor withstand voltage test device 2 are provided with arc-shaped guide ports 111 to guide the inductors on the assembly line to be arranged in a row orderly after entering a limiting channel.
The width of the limiting channel formed by the two side-by-side limiting baffles on the two sides of the production line can be adjusted, so that adjustment and switching among different products can be realized. Therefore, the limiting baffle is connected with the assembly line through the position adjusting structure, and can be selected, the position adjusting structure comprises an adjusting groove formed in the limiting baffle, the adjusting bolt penetrates through the adjusting groove to fix the limiting baffle on the assembly line, the adjusting bolt is loosened, the position of the limiting baffle can be adjusted along the adjusting groove, and therefore the width of the limiting channel is adjusted to adapt to inductances with different widths.
The inductance voltage-withstand test device comprises a bridge support crossing a production line, and an inductance voltage-withstand tester arranged on the bridge support, wherein the inductance voltage-withstand tester is the prior art, and can be understood as the inductance voltage-withstand tester is provided with two adjustable metal wires which are in contact with pins of an inductor during testing. When the inductor flows to a voltage-withstand test station, the high-voltage detection of the inductor flowing through the station is realized by contacting pins of the inductor with metal wires (such as steel wires) which can be adjusted on two sides of an inductor voltage-withstand tester.
If the inductor flowing through is detected to be a high-voltage defective product, the voltage-resistant defective discharging device can be automatically started to remove the defective inductor. Withstand voltage bad discharge device is including being located the material cylinder 23 of arranging of one side wherein of assembly line, being located the bad inductance receiver 24 of the other side of assembly line, the piston ejector pin that pushes away the material cylinder is connected with the material pushing head that promotes bad inductance and falls into bad inductance receiver from the assembly line. Because bad inductance is incessantly carried on the assembly line, in this embodiment, bad inductance receiver is located row material cylinder 23 downstream direction, row material cylinder 23 pushes away bad inductance to the spacing passageway one side position of skew through pushing away the stub bar, pushes away the spacing baffle that material cylinder downstream side is close to bad inductance receiver 24 one side and has the guide circular arc 112 that the guide inductance got into bad inductance receiver 24.
And if the inductor is subjected to voltage-withstanding detection OK, the inductor automatically flows into a comprehensive electrical parameter testing station along with the production line to perform comprehensive electrical parameter testing. The inductance comprehensive electrical parameter testing device comprises an electrical parameter testing jig and a double-manipulator mechanism, wherein the electrical parameter testing jig and the double-manipulator mechanism are arranged above a production line, the double-manipulator mechanism comprises a first manipulator and a second manipulator, the first manipulator grabs an inductor on the upper portion of the inductance comprehensive electrical parameter testing device and places the inductor on the testing jig for electrical parameter testing, and the second manipulator grabs the inductor completing the electrical parameter testing and places the inductor on the lower portion of the inductance comprehensive electrical parameter testing device.
Among them, there are five important electrical parameters of inductance: inductance, tolerance, quality factor, distributed capacitance, and rated current. The inductance comprehensive electrical parameter testing device of the embodiment can test at least one or more of the inductance comprehensive electrical parameter testing devices. The testing principle and the testing apparatus are prior art and are not described herein again. The test fixture is detachable, and if the test inductance changes, the corresponding test fixture needs to be replaced.
The comprehensive testing material waiting port is arranged at the upper stream of the inductor comprehensive electrical parameter testing device, the comprehensive testing material waiting port is provided with a first inductor for inducing the inductor to be in place, the first inductor synchronously triggers the first manipulator and the second manipulator to start to act after inducing the inductor to be in place, and the comprehensive tester is triggered to start testing in a delayed mode. The first mechanical arm and the second mechanical arm are in equidistant translation, the first mechanical arm and the second mechanical arm are controlled by the same translation cylinder to move horizontally, after the first mechanical arm translates in place in the upstream direction, the first mechanical arm downwards grabs the inductor to be detected and then rises, meanwhile, the second mechanical arm downwards grabs the inductor to be detected and then rises, after the second mechanical arm translates in place in the downstream direction, the first mechanical arm downwards moves and releases the inductor to be detected onto a test fixture for electrical parameter testing, and meanwhile, the second mechanical arm downwards moves and releases the inductor to a downstream production line after detection and then rises.
Because test fixture and assembly line plane of delivery have the difference in height, and first manipulator, second manipulator go up and down by cylinder control, when first manipulator, second manipulator shift the inductance from the assembly line to test fixture on, the cylinder stroke can diminish relatively in assembly line operation, in order to restrict the cylinder stroke, inductance integrated electrical parameter testing arrangement still includes carries out spacing platform 38 to first manipulator and second manipulator downward stroke, test fixture locates on spacing platform. The inductor on the assembly line is grabbed to the test fixture with a little high through the limiting sample table, so that the inductor can be smoothly moved.
The assembly line is provided with a good product material channel 36 and a defective product material channel 37 at the downstream of the inductor comprehensive parameter testing device, wherein the good product material channel 36 and the defective product material channel 37 are used for distinguishing whether the inductor comprehensive parameter testing is qualified or unqualified, and the second mechanical hand 34 places the tested inductor into the good product material channel 36 or the defective product material channel 37 according to the comprehensive electrical parameter testing result. Meanwhile, the good product storage box and the defective product storage box are correspondingly arranged below the tail end of the production line, and the good product inductor and the defective product inductor which fall onto the production line from the good product material channel 36 and the defective product material channel 34 fall off from the production line after one end distance is temporarily conveyed on the production line, and then respectively enter the good product storage box and the defective product storage box.
The specific flow of this embodiment is as follows: and (3) placing the inductor with good appearance inspection at the front end of the production line by an appearance inspector, completing the voltage-withstanding test of the inductor through a voltage-withstanding test station, and continuously flowing on the production line until the inductor flows to a material waiting port for comprehensive test if the inductor is a good product and the voltage-withstanding test is good. After the first sensor of the material port is sensed to the product and put in place in the comprehensive test, the mechanical handle on the left of the two-manipulator equidistant moving mechanism clamps the product to the test fixture connected with the instrument, and meanwhile, the product clamp on the scanning box originally is placed on the corresponding good product or defective product channel. The integrated tester is then triggered to begin testing, while the machine remembers the results of the testing at that time by the tester. And after waiting for the next pressure-resistant test to flow to the comprehensive test station material waiting area for a good product, carrying out material taking action at equal intervals, wherein the second manipulator can grab the good product material channel when the comprehensive test result of the previous product is a good product, and the second manipulator can grab the defective product material channel when the comprehensive test result of the previous product is a bad product.
The main characteristics and advantages of the device are that the tested product can be flexibly replaced while the labor is saved and the efficiency is improved. When a product is replaced, only a test die with the value of about 150 RMB is needed to be replaced, and meanwhile, the limit edge strips on the production line are adjusted downwards.
In the second embodiment, referring to fig. 4 and fig. 5, on the basis of the first embodiment, in order to further detect other performance parameters of the inductor. And a third test station is arranged at the downstream of the inductor comprehensive electrical parameter test device, and the test of other performances of the inductor can be carried out at the third test station. Thus, a good product material channel and a bad product material channel in the first embodiment are not needed. However, in order to remove the defective inductor from the assembly line to ensure that the defective inductor is conveyed to the third testing station along the assembly line for detection, in the embodiment, the assembly line is provided with an interruption portion 12 between the inductor comprehensive electrical parameter testing device and the third testing station, and a defective product discharging channel 121 which is obliquely arranged is arranged below the interruption portion. Meanwhile, a third manipulator 4, a third testing station and a limiting cylinder 41 are designed, a movable baffle is arranged at one end of the upstream of the interruption part of the production line, the movable baffle is connected with a first connecting rod mechanism, the first connecting rod mechanism is driven by a first connecting rod driving cylinder, when the inductance test is carried out or after the test is finished, the third manipulator is ready to translate the inductance from the upstream of the interrupt part to the downstream of the interrupt part, the first connecting rod drives the cylinder to drive the first connecting rod mechanism to be sequentially linked with the movable blocking sheet, so that the movable blocking sheet falls from the position of blocking the assembly line to convey the inductance and gives out a channel for the translation of the inductance, when the inductance test is unqualified, the limiting cylinder stretches out to prevent the third mechanical arm from translating to the downstream of the interrupted part and enable the third mechanical arm to stay at the position above the defective product discharging channel, and the third mechanical arm is loosened to release the inductance to the defective product discharging channel.
After the inductance comprehensive electrical parameter testing device completes testing, the second mechanical arm 34 grabs the tested inductance to the position of the assembly line of the inductance comprehensive electrical parameter testing device, then the inductance is continuously conveyed by a section along the assembly line or is directly grabbed by the third mechanical arm 4, and then the movable baffle plate drives the cylinder by the first connecting rod to drive the first connecting rod mechanism to be opened. If the inductance test is qualified, the third manipulator directly moves to the downstream in the horizontal direction, and the tested product is placed on a downstream assembly line of the interrupt part to be prepared to be tested at a third test station; if the inductance test is unqualified, the limiting cylinder is opened on the distance of the third manipulator passing through the interruption part in the translation process, and the third manipulator can only stop at the interruption part due to the blocking of the limiting cylinder to release the inductance to a defective product material channel, so that the good product and the defective product are distinguished.
The assembly line is equipped with stopping block 122 in interrupt site low reaches one end, the stopping block is connected second link mechanism, second link mechanism is driven by second connecting rod drive actuating cylinder, and when third manipulator translated the inductance from interrupt site upper reaches to interrupt site low reaches, second connecting rod drive actuating cylinder drive second link mechanism and stopping block linked in proper order, made stopping block be close to interrupt site one end and upwards lifted, prevented the inductance and backed down.
The assembly line is provided with a second sensor at one end of the upstream of the interruption part and close to the position of the movable blocking piece, when the second sensor senses that the inductor is about to reach the position of the movable blocking piece, a sensing signal is sent to control the third mechanical arm 4 to act, and then the first connecting rod driving cylinder and the second connecting rod driving cylinder act in sequence.
Of course, it can be understood by those skilled in the art that the first link driving cylinder and the second link driving cylinder can also be integrated together, that is, the same cylinder is used to drive the first link mechanism and the second link mechanism simultaneously, so as to save cost. In addition, the first link mechanism and the second link mechanism are adopted for saving space, and under the condition of not considering space, a single air cylinder can be used for directly driving the movable blocking piece or the backstop block to move up and down.
While the invention has been described with reference to specific embodiments, it will be understood by those skilled in the art that the invention is not limited thereto, and may be embodied in other forms without departing from the spirit or essential characteristics thereof. Any modification which does not depart from the functional and structural principles of the present invention is intended to be included within the scope of the claims.
Claims (1)
1. The utility model provides a common mode inductance accredited testing organization which characterized in that: the device comprises a rack, a production line arranged on the rack and used for conveying the inductor, an inductor withstand voltage testing device arranged along the conveying direction of the production line, a withstand voltage bad discharging device and an inductor comprehensive electrical parameter testing device, wherein the inductor withstand voltage testing device is used for carrying out withstand voltage test on the inductor, the inductor comprehensive electrical parameter testing device is used for testing electrical parameters of the inductor, the withstand voltage bad discharging device removes unqualified inductor from the production line when the inductor withstand voltage test is unqualified, the production line adopts a linear flat vibration feeder to realize automatic inductor conveying, a limiting baffle plate for correcting inductor deviation to enable the inductor to be conveyed linearly is arranged on a conveying plane of the production line, the limiting baffle plate is connected with the production line through a position adjusting structure, the inductor withstand voltage testing device comprises a bridge type support crossing the production line and an inductor withstand voltage tester arranged, the inductance voltage resistance tester is provided with two adjustable metal wires, the metal wires contact pins of an inductor during testing, the voltage resistance bad discharging device comprises a discharging cylinder positioned on one side of the assembly line and a bad inductor containing box positioned on the other side of the assembly line, a piston mandril of the discharging cylinder is connected with a material pushing head for pushing the bad inductor to fall into the bad inductor containing box from the assembly line, the inductance comprehensive electrical parameter testing device comprises an electrical parameter testing jig and a double-manipulator mechanism which are arranged above the assembly line, the double-manipulator mechanism comprises a first manipulator and a second manipulator, the first manipulator grabs the inductor on the upper stream of the inductance comprehensive electrical parameter testing device and places the inductor on the testing jig for electrical parameter testing, the second manipulator grabs the inductor completing the electrical parameter testing and places the inductor on the lower stream of the inductance comprehensive electrical parameter testing device, the device comprises an inductance comprehensive electrical parameter testing device, a comprehensive testing material waiting hole and a production line, wherein the upstream of the inductance comprehensive electrical parameter testing device is provided with an inductor for inducing the inductor to be in place, the inductor synchronously triggers a first mechanical arm and a second mechanical arm to start acting after inducing the inductor to be in place and delays to trigger a comprehensive tester to start testing, the inductance comprehensive electrical parameter testing device further comprises a limiting platform for limiting the downward strokes of the first mechanical arm and the second mechanical arm, a testing jig is arranged on the limiting platform, and the production line is provided with a good material channel and a defective material channel for distinguishing the qualification and the non-qualification of the inductance comprehensive electrical parameter testing at the downstream of the inductance comprehensive parameter testing device; the lower stream of the inductance comprehensive electrical parameter testing device is provided with a third testing station, the assembly line is provided with an interruption part between the inductance comprehensive electrical parameter testing device and the third testing station, a defective product blanking channel which is obliquely arranged is arranged below the interruption part, and the assembly line is simultaneously provided with a third manipulator, a third testing station and a limiting cylinder, one end of the upper stream of the interruption part of the assembly line is provided with a movable blocking sheet which is connected with a first connecting rod mechanism, the first connecting rod mechanism is driven by a first connecting rod driving cylinder, the third manipulator prepares to translate the inductance from the upper stream of the interruption part to the lower stream of the interruption part during the inductance testing or after the inductance testing is finished, the first connecting rod driving cylinder drives the first connecting rod mechanism to be sequentially linked with the movable blocking sheet, so that the movable blocking assembly line conveys the inductance to fall, a channel for translating the inductance is avoided, and when the inductance testing, the limiting cylinder stretches out to prevent the third mechanical arm from translating towards the downstream of the interruption part and enable the third mechanical arm to stay at the position above the defective product discharging channel, and the third mechanical arm is loosened to release the inductor to the defective product discharging channel.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201910053489.1A CN109884443B (en) | 2019-01-21 | 2019-01-21 | Common mode inductance test mechanism |
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| CN201910053489.1A CN109884443B (en) | 2019-01-21 | 2019-01-21 | Common mode inductance test mechanism |
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| CN109884443A CN109884443A (en) | 2019-06-14 |
| CN109884443B true CN109884443B (en) | 2021-05-11 |
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| CN110328160A (en) * | 2019-08-01 | 2019-10-15 | 中山市博测达电子科技有限公司 | Minitype paster inductance automatic test equipment |
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| CN102698969A (en) * | 2012-05-29 | 2012-10-03 | 格兰达技术（深圳）有限公司 | Automatic testing and sorting machine for integrated circuit IC chip |
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