CN109883952B - Nonlinear coefficient measuring device based on weak measurement technology and measuring method thereof - Google Patents
Nonlinear coefficient measuring device based on weak measurement technology and measuring method thereof Download PDFInfo
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- CN109883952B CN109883952B CN201910179334.2A CN201910179334A CN109883952B CN 109883952 B CN109883952 B CN 109883952B CN 201910179334 A CN201910179334 A CN 201910179334A CN 109883952 B CN109883952 B CN 109883952B
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Abstract
The invention provides a nonlinear coefficient measuring device based on weak measurement technology and a measuring method thereof, comprising a detection part and a nonlinear generation part; the non-linearity generating section: irradiating the pump light on the nonlinear material to be detected to generate a nonlinear phenomenon; the detection section: and (3) enabling the probe light to pass through the center of a light spot of the pump light on the nonlinear material to be measured, generating central frequency spectrum offset, and measuring a nonlinear coefficient. The invention utilizes weak measurement technology to measure the nonlinear coefficient of the center frequency spectrum offset, and has the characteristics of high measurement accuracy, suitability for measuring the nonlinear coefficients of different optical materials, simple device structure, convenient use, strong environmental interference resistance and the like.
Description
Technical Field
The invention relates to the technical field of measurement, in particular to a nonlinear coefficient measuring device based on a weak measurement technology and a measuring method thereof.
Background
With the rapid development of technologies in the fields of optical communication, optical information processing, and the like, the research on nonlinear optical materials is becoming more and more important. The nonlinear characteristic of the medium has important application in the fields of communication, precision measurement and the like, wherein the precision measurement of the nonlinear coefficient of the medium has important significance. Having a convenient and reliable measurement method is a necessary tool to find an ideal nonlinear material.
At present, the measurement of the nonlinear coefficient is performed by an indirect method, such as the patent of CN105092477A, "optical nonlinear measurement device and measurement method of nonlinear thick photonic material", where the sensitivity and accuracy of the measurement are affected by a measurement instrument.
The weak measurement technology is that the measurement result can be obviously amplified under the condition of post selection, the coupling strength between a measurement system and a measurement instrument considered in weak measurement is weak, and the post selection is utilized to screen the measurement result, so that the measurement result can obtain obvious amplification effect under the condition of weak coupling strength. The weak measurement technology is the hot direction of the current research in precision measurement and has important research significance.
Disclosure of Invention
Aiming at the defects in the prior art, the invention aims to provide a nonlinear coefficient measuring device based on a weak measuring technology and a measuring method thereof.
The invention provides a nonlinear coefficient measuring device based on weak measurement technology, which comprises a detection part and a nonlinear generation part;
the non-linearity generating section: irradiating the pump light on the nonlinear material 7 to be detected to generate a nonlinear phenomenon;
the detection section: and (3) enabling the probe light to pass through the center of a light spot of the pump light on the nonlinear material 7 to be measured to generate central frequency spectrum offset, and measuring a nonlinear coefficient.
Preferably, the detection section includes: the device comprises a detection light source 1, a first Glan Taylor prism 4, a second Glan Taylor prism 12, a polarization beam splitter 5, a reflecting mirror 6, a wave plate 11 and a spectrometer 13;
the detection light emitted by the detection light source 1 passes through the first Glan Taylor prism 4 to generate linearly polarized light, the linearly polarized light enters the polarization beam splitter 5 and is then divided into two beams of light, the nonlinear material to be detected 7 is located on the light path of one beam of light, the two beams of light pass through the polarization beam splitter 5 again through the reflector 6 respectively and are output to the wave plate 11 and enter the second Glan Taylor prism 12, and the measurement is carried out by the spectrometer 13.
Preferably, the first glan-taylor prism 4 and the second glan-taylor prism 12 are in a non-orthogonal state with respect to an epsilon angle.
Preferably, the value range of epsilon is 0< epsilon < 1.
Preferably, the nonlinear coefficient measurement includes:
detecting the phase change of the light in the nonlinear material 7 to be measured
Comprises the following steps:
n＝n0+n2|E|2，Δn＝n2Ip，
wherein n is the total refractive index, n0Is a linear refractive index, n2Is the nonlinear coefficient of the nonlinear material 7 to be measured, E is the optical electric field, Delta n is the refractive index change of the nonlinear material 7 to be measured, IpThe intensity of the pump light is pi is 3.14, the lambda is the wavelength of the pump light, and d is the thickness of the nonlinear material 7 to be measured;
the central spectral shift Δ ω produced by the probe light is:
wherein, ω is the frequency of the detecting light, τ is the time delay generated after passing through the nonlinear material 7 to be detected, and σ is the line width of the detecting light;
nonlinear coefficient n of nonlinear material 7 to be measured2Comprises the following steps:
where c is the speed of light and σ is the linewidth of the probe light.
Preferably, the detecting light source 1 and the first glan-taylor prism 4 further include: a first lens 2 and a first aperture 3.
Preferably, the heights of the optical axes of the first lens 2, the first small hole 3, the polarization beam splitter 5, the reflecting mirror 6, the wave plate 11 and the spectrometer 13 through which the detection light emitted by the detection light source 1 passes are the same.
Preferably, the wave plate 11 comprises a quarter wave plate.
Preferably, the non-linearity generating section includes: a pump light source 10, a second lens 8 and a second aperture 9;
the pump light emitted by the pump light source 10 irradiates on the nonlinear material 7 to be measured through the second small hole 9 and the second lens 8.
According to the nonlinear coefficient measuring method based on the weak measurement technology, the nonlinear coefficient measuring device based on the weak measurement technology is adopted, and the following steps are executed:
s1, adjusting the pump light irradiated on the nonlinear material 7 to be detected to generate a nonlinear phenomenon;
s2, leading the probe light to pass through the light spot center of the pump light on the nonlinear material 7 to be detected, and generating central frequency spectrum offset;
and S3, calculating the nonlinear coefficient of the nonlinear material 7 to be measured.
Compared with the prior art, the invention has the following beneficial effects:
the invention utilizes weak measurement technology to measure the nonlinear coefficient of the center frequency spectrum offset, and has the characteristics of high measurement accuracy, suitability for measuring the nonlinear coefficients of different optical materials, simple device structure, convenient use, strong environmental interference resistance and the like.
Drawings
Other features, objects and advantages of the invention will become more apparent upon reading of the detailed description of non-limiting embodiments with reference to the following drawings:
FIG. 1 is a light path diagram of a measuring device according to the present invention;
reference numerals: 1-a detection light source; 2-a first lens; 3-a first orifice; 4-a first glan-taylor prism; 5-a polarizing beam splitter; 6-a reflector; 7-nonlinear material to be tested; 8-a second lens; 9-a second orifice; 10-a pump light source; 11-a wave plate; 12-a second glan taylor prism; 13-spectrometer.
Detailed Description
The present invention will be described in detail with reference to specific examples. The following examples will assist those skilled in the art in further understanding the invention, but are not intended to limit the invention in any way. It should be noted that it would be obvious to those skilled in the art that various changes and modifications can be made without departing from the spirit of the invention. All falling within the scope of the present invention.
As shown in fig. 1, a nonlinear coefficient measuring apparatus based on a weak measurement technique according to the present invention includes a detecting section and a nonlinear generating section.
The nonlinear generation part irradiates the pump light on the nonlinear material 7 to be detected to generate a nonlinear phenomenon; the detection part generates central frequency spectrum shift by the detection light through the light spot center of the pump light on the nonlinear material 7 to be measured, and nonlinear coefficient measurement is carried out.
Specifically, the detection section includes: the device comprises a detection light source 1, a first lens 2, a first small hole 3, a first Glan Taylor prism 4, a second Glan Taylor prism 12, a polarization beam splitter 5, a reflecting mirror 6, a wave plate 11 and a spectrometer 13;
the detection light emitted by the detection light source 1 enters the first Glan Taylor prism 4 to generate linear polarized light after being collimated by the first lens 2 and the first small hole 3, the linear polarized light enters the polarization beam splitter 5 and then is divided into two beams of light, the nonlinear material 7 to be detected is positioned on the light path of one beam of light, the two beams of light are output to the wave plate 11 through the polarization beam splitter 5 again through the reflector 6 respectively and enter the second Glan Taylor prism 12, and the measurement is carried out by the spectrometer 13. Wherein, the first Glan Taylor prism 4 and the second Glan Taylor prism 12 are in a non-orthogonal state of an epsilon angle, and the value range of epsilon is 0< epsilon < 1. The heights of the optical axes of the first lens 2, the first small hole 3, the polarization beam splitter 5, the reflecting mirror 6, the wave plate 11 and the spectrometer 13 through which the detection light emitted by the detection light source 1 passes are the same. In the embodiment, the first glan-taylor prism 4 forms an angle of 45 ° with the horizontal, and the wave plate 11 is a quarter wave plate, but the invention is not limited thereto.
The non-linearity generating section includes: a pump light source 10, a second lens 8 and a second aperture 9; the pump light emitted by the pump light source 10 passes through the second aperture 9 and the second lens 8, expands the beam area, and then irradiates the nonlinear material 7 to be measured. The second lens 8 may be a convex lens.
The nonlinear coefficient measurement includes:
detecting the phase change of the light in the nonlinear material 7 to be measured
Comprises the following steps:
n＝n0+n2|E|2，Δn＝n2Ip，
wherein n is the total refractive index, n0Is a linear refractive index, n2Is the nonlinear coefficient of the nonlinear material 7 to be measured, E is the optical electric field, Delta n is the refractive index change of the nonlinear material 7 to be measured, IpThe intensity of the pump light is pi is 3.14, the lambda is the wavelength of the pump light, and d is the thickness of the nonlinear material 7 to be measured;
the central spectral shift Δ ω produced by the probe light is:
wherein, ω is the frequency of the detecting light, τ is the time delay generated after passing through the nonlinear material 7 to be detected, and σ is the line width of the detecting light;
nonlinear coefficient n of nonlinear material 7 to be measured2Comprises the following steps:
where c is the speed of light and σ is the linewidth of the probe light.
The non-linearity generating section includes: a pump light source 10, a second lens 8 and a second aperture 9;
the pump light emitted by the pump light source 10 irradiates on the nonlinear material 7 to be measured through the second aperture 9 and the second lens 8.
On the basis of the nonlinear coefficient measuring device based on the weak measurement technology, according to the nonlinear coefficient measuring method based on the weak measurement technology provided by the invention, the nonlinear coefficient measuring device based on the weak measurement technology is adopted to execute the following steps:
s1, adjusting the pump light irradiated on the nonlinear material 7 to be detected to generate a nonlinear phenomenon;
s2, generating central frequency spectrum offset by the probe light through the light spot center of the pump light on the nonlinear material 7 to be detected;
and S3, calculating the nonlinear coefficient of the nonlinear material 7 to be measured.
The foregoing description of specific embodiments of the present invention has been presented. It is to be understood that the present invention is not limited to the specific embodiments described above, and that various changes or modifications may be made by one skilled in the art within the scope of the appended claims without departing from the spirit of the invention. The embodiments and features of the embodiments of the present application may be combined with each other arbitrarily without conflict.
Claims (8)
1. A nonlinear coefficient measuring device based on weak measurement technology is characterized by comprising a detection part and a nonlinear generation part;
the non-linearity generating section: irradiating the pump light on the nonlinear material (7) to be detected to generate a nonlinear phenomenon;
the detection section: the detection light passes through the light spot center of the pump light on the nonlinear material (7) to be measured to generate central frequency spectrum shift, and nonlinear coefficient measurement is carried out;
the detection section includes: the device comprises a detection light source (1), a first Glan Taylor prism (4), a second Glan Taylor prism (12), a polarization beam splitter (5), a reflector (6), a wave plate (11) and a spectrometer (13);
the detection light emitted by the detection light source (1) generates linear polarized light through the first Glan Taylor prism (4), the linear polarized light enters the polarization beam splitter (5) and then is divided into two beams of light, the nonlinear material (7) to be detected is located on the light path of one beam of light, the two beams of light respectively pass through the reflector (6) again through the polarization beam splitter (5) and are output to the wave plate (11) and enter the second Glan Taylor prism (12), and the spectrometer (13) is used for measuring.
2. The weak measurement technique based nonlinear coefficient measurement apparatus according to claim 1, characterized in that the first and second glan-taylor prisms (4, 12) are in a non-orthogonal state with an epsilon angle therebetween.
3. The weak measurement technique-based nonlinear coefficient measurement apparatus according to claim 2, wherein the nonlinear coefficient measurement includes:
the central spectral shift Δ ω produced by the probe light is:
wherein, delta omega is the frequency of the detection light, tau is the time delay generated after the nonlinear material (7) to be detected passes through, and sigma is the line width of the detection light;
detecting phase changes of light in a nonlinear material (7) to be measured
Comprises the following steps:
wherein n is the total refractive index, n0Is a linear refractive index, n2Is the nonlinear coefficient of the nonlinear material (7) to be measured, E is the optical electric field, Delta n is the refractive index change of the nonlinear material (7) to be measured, IpThe intensity of the pump light is pi is 3.14, the lambda is the wavelength of the pump light, and d is the thickness of the nonlinear material (7) to be measured;
the nonlinear coefficient n of the nonlinear material (7) to be measured2Comprises the following steps:
where c is the speed of light and σ is the linewidth of the probe light.
4. The weak measurement technique-based nonlinear coefficient measurement apparatus according to claim 1, wherein between the probe light source (1) and the first glan taylor prism (4) further comprises: a first lens (2) and a first aperture (3).
5. The nonlinear coefficient measurement device based on the weak measurement technology according to claim 4, wherein the heights of the optical axes of the first lens (2), the first aperture (3), the polarization beam splitter (5), the reflecting mirror (6), the wave plate (11) and the spectrometer (13) through which the detection light emitted by the detection light source (1) passes are the same.
6. The weak measurement technique based nonlinear coefficient measurement apparatus according to claim 1, characterized in that the wave plate (11) comprises a quarter wave plate.
7. The weak measurement technique-based nonlinear coefficient measurement apparatus according to claim 1, wherein the nonlinearity generation section includes: a pumping light source (10), a second lens (8) and a second aperture (9);
and the pump light emitted by the pump light source (10) irradiates on the nonlinear material (7) to be measured through the second small hole (9) and the second lens (8).
8. A weak measurement technique-based nonlinear coefficient measurement method, characterized in that, with the weak measurement technique-based nonlinear coefficient measurement apparatus of any one of claims 1 to 7, the following steps are executed:
s1, adjusting the pump light irradiated on the nonlinear material (7) to be detected to generate a nonlinear phenomenon;
s2, enabling the probe light to pass through the center of a light spot of the pump light on the nonlinear material (7) to be detected to generate central frequency spectrum offset;
and S3, calculating the nonlinear coefficient of the nonlinear material (7) to be measured.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN201222032Y (en) * | 2008-07-17 | 2009-04-15 | 苏州大学 | Pump detection device based on Z scanning |
| CN104390935A (en) * | 2014-12-10 | 2015-03-04 | 上海理工大学 | Device and method for testing nonlinear polarization coefficient and absorption coefficient at terahertz band |
| CN104914644B (en) * | 2015-05-25 | 2019-02-05 | 西安交通大学 | A kind of femtosecond light Kerr-gate gating imaging device and method based on trend pass filtering |
| CN105403534A (en) * | 2015-06-18 | 2016-03-16 | 苏州微纳激光光子技术有限公司 | Method for measuring transient state optical nonlinearity of material |
| CN105092477A (en) * | 2015-08-26 | 2015-11-25 | 中国工程物理研究院激光聚变研究中心 | Optical nonlinearity measuring device and measuring method for nonlinearity thick photonics materials |
| CN204903381U (en) * | 2015-09-06 | 2015-12-23 | 中国工程物理研究院激光聚变研究中心 | Nonlinearity thin film materials's optical nonlinearity measuring device |
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