CN109874008A - A method of crash problem is distinguished by fault test - Google Patents
A method of crash problem is distinguished by fault test Download PDFInfo
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- CN109874008A CN109874008A CN201910132802.0A CN201910132802A CN109874008A CN 109874008 A CN109874008 A CN 109874008A CN 201910132802 A CN201910132802 A CN 201910132802A CN 109874008 A CN109874008 A CN 109874008A
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Abstract
The present invention relates to ntelligent television technolog fields, a kind of more particularly to method that crash problem is distinguished by fault test, including: plural kind of different types of fault test step S1, is carried out to system on chip, to obtain a plurality of response situations that system on chip corresponds to different types of fault type, a plurality of response situations are summarized, and are stored together with corresponding fault type into a storage unit；Step S2, it according to the corresponding reaction information of system on chip to be measured, is matched with the response situation stored in storage unit, to obtain the current fault type of system on chip to be measured.Beneficial effect is: according to the corresponding reaction information of system on chip to be measured, it is matched with the response situation stored in storage unit, to obtain the current fault type of system on chip to be measured, in this way by exclusive method can quick positioning question or reduce problem range, provide good illustration for queueing problem.
Description
Technical field
The present invention relates to ntelligent television technolog field more particularly to a kind of sides that crash problem is distinguished by fault test
Method.
Background technique
Currently, the system function of smart television is more and more, CPU (Central Processing Unit, central processing
Device) dominant frequency it is also higher and higher, also can be higher and higher to the stability requirement of peripheral power supply.In order to guarantee the stability of product with
And the service life of product is considered, it needs to carry out a large amount of pressure test, including the high and low temperature test (45 degree of -15 degree) in development phase,
Or the test of alternating-current switch machine or remote control switch are tested.The characteristics of these tests is that sample size is more, and test period is long, when
When occurring some random loopholes during the test, problem investigation requires to take a long time with verifying, to entirely testing
Progress generates large effect, or even will affect the development progress of entire product.
Solution in the prior art is, in software architecture development process, debugging nodes more as far as possible is added, it is expected that
The operating status of whole system is recorded, if occurring exception in ageing process, the error log printed will
As most precious analysis of data, but it is relatively independent mark since the driving of system on chip has, when some module is being tested
Occurs exception in the process, error log can be directed toward relevant module, as (EmbeddedMultimedia Card is embedded EMMC
Formula memory), (radio is coordinated by DDR (Double Data Rate, Double Data Rate synchronous DRAM), TUNER
Device) etc. relevant module mistake, can clearly obtain information from error log, but the premise of error log output is on piece
System normal operation can not export any information if system on chip malfunctions, and in this case, can not just be believed by mistake
Breath goes problem analysis.And it is this be related to system depth exception, be most intractable and most time-consuming problem in senile experiment.
Summary of the invention
For the above-mentioned problems in the prior art, a kind of side that crash problem is distinguished by fault test is now provided
Method.
Specific technical solution is as follows:
A method of crash problem is distinguished by fault test, is used for smart television, including:
Step S1, plural kind of different types of fault test is carried out to system on chip, it is corresponding to obtain the system on chip
A plurality of response situations of different types of fault type summarize a plurality of response situations, and with it is corresponding therefore
Barrier type is stored together into a storage unit；
Step S2, and stored in the storage unit described anti-according to the corresponding reaction information of system on chip to be measured
Situation is answered to be matched, to obtain the current fault type of the system on chip to be measured.
Preferably, in Yu Suoshu step S1, corresponding reaction is obtained to each response situation of the system on chip
Information, the reaction information include that picture is shown and the error log of corresponding generation.
Preferably, the system on chip includes power module；And/or memory module；And/or radio tuner module.
Preferably, in Yu Suoshu step S1, the fault test to the power module includes fixed pin short-circuit test；
And/or crystal oscillator output short-circuit test.
Preferably, in Yu Suoshu step S1, the fault test to the memory module includes that memory clock data are short
Drive test examination；And/or memory data line short test.
Preferably, in Yu Suoshu step S1, in Yu Suoshu step S1, to the fault test packet of the radio tuner module
Include the short-circuit test of positive supply input pin Yu negative power input pin；And/or the non-inverting clock letter of Low Voltage Differential Signal
The short-circuit test of the negative Clock Signal pin of number pin and Low Voltage Differential Signal；And/or high-definition multimedia interface is just
The short-circuit test of clock signal pin and the negative Clock Signal pin of high-definition multimedia interface.
Preferably, the fixed pin short-circuit test includes memory short-circuit test.
Preferably, the fixed pin short-circuit test includes graphics processor short-circuit test.
Preferably, the fixed pin short-circuit test includes central processing unit short-circuit test.
Preferably, the fixed pin short-circuit test includes the power supply adjustment output pin of 3.3V or the voltage analog of 1.8V
The short-circuit test of front end pin.
Technical solution of the present invention beneficial effect is: a kind of method for distinguishing crash problem by fault test is provided,
According to the corresponding reaction information of system on chip to be measured, matched with the response situation stored in storage unit, with obtain to
It surveys the current fault type of system on chip, the range of problem quick positioning question or can be reduced by exclusive method in this way, to arrange
Except problem provides good illustration.
Detailed description of the invention
With reference to appended attached drawing, more fully to describe the embodiment of the present invention.However, appended attached drawing be merely to illustrate and
It illustrates, and is not meant to limit the scope of the invention.
Fig. 1 is the step flow chart of the method that crash problem is distinguished by fault test of the embodiment of the present invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, those of ordinary skill in the art without creative labor it is obtained it is all its
His embodiment, shall fall within the protection scope of the present invention.
It should be noted that in the absence of conflict, the feature in embodiment and embodiment in the present invention can phase
Mutually combination.
The present invention will be further explained below with reference to the attached drawings and specific examples, but not as the limitation of the invention.
Conventionally, as environment temperature and room temperature have larger difference, and the variation of temperature can draw in ageing process
Some differences occur for the performance for playing semiconductor, as leakage current increases；The effective capacitance that low temperature will lead to capacitor reduces, these variations
The ripple that will lead to power supply becomes larger, as long as system has the operation of burst that load will be caused to become larger, it is likely that will lead to system
Collapse, and since in the case where high temperature or low temperature, the power supply by instruments monitor multiple experiment porch, multiple modules is difficult
With realization.
Therefore, for the above-mentioned problems in the prior art, the present invention discloses a kind of distinguish by fault test and crashes
The method of problem is used for smart television, including:
Step S1, plural kind of different types of fault test is carried out to system on chip, it is corresponding different to obtain system on chip
A plurality of response situations of the fault type of type, summarize a plurality of response situations, and with corresponding fault type one
It is same to store into a storage unit；
Step S2, according to the corresponding reaction information of system on chip to be measured, with the response situation that is stored in storage unit into
Row matching, to obtain the current fault type of system on chip to be measured.
By distinguishing the technical solution of the method for crash problem above by fault test, as shown in Figure 1, this method application
In smart television, plural kind of different types of fault test is carried out to system on chip, corresponds to different type to obtain system on chip
Fault type a plurality of response situations, a plurality of response situations are summarized, and is deposited together with corresponding fault type
In Chu Zhiyi storage unit, wherein system on chip includes power module；And/or memory module；And/or radio tuner mould
Block is matched then according to the corresponding reaction information of system on chip to be measured with the response situation stored in storage unit, with
It obtains the current fault type of system on chip to be measured, the model of problem quick positioning question or can be reduced by exclusive method in this way
It encloses, provides good illustration for queueing problem.
In a kind of preferably embodiment, in step S1, each response situation of system on chip is obtained corresponding anti-
Information is answered, reaction information includes that picture is shown and the error log of corresponding generation.It in a short time can be by various hardware anomalies
The image of state is connected with error log, provides good example to the loophole that analysis is crashed at random, for further positioning
Problem, queueing problem provide good illustration.
In a kind of preferably embodiment, as shown in chart one, in step S1, the fault test to power module includes
Fixed pin short-circuit test；And/or crystal oscillator output short-circuit test.Wherein, fixed pin short-circuit test includes that memory short circuit is surveyed
The power supply adjustment output pin of examination, graphics processor short-circuit test, central processing unit short-circuit test and 3.3V or the voltage of 1.8V
The short-circuit test of AFE(analog front end) pin.
Specifically, when memory short-circuit test, the picture of corresponding DDR_1V2 is shown as picture and disappears, red screen, and/or
The error log of generation is to crash, and printing stops, no apparent error instruction；The picture of corresponding DDR_2V5 is shown as picture disappearance,
Blank screen, and/or the error log generated is to crash, printing stops, no apparent error instruction.
Further, when graphics processor short-circuit test, corresponding picture is shown as picture disappearance, blank screen, and/or life
At error log be to crash, printing stops, the instruction of no apparent error；When central processing unit short-circuit test, corresponding picture
It is shown as picture still, and/or the error log generated is to crash, printing stops, no apparent error instruction；When the power supply of 3.3V
When adjustment output pin makees short-circuit test, corresponding picture is shown as system reboot, and/or the error log generated is before restarting
Printing without exception；When the short-circuit test of the voltage analog front end pin of 1.8V, corresponding picture is shown as picture disappearance, black
Screen, and/or the error log generated is to crash, printing stops, no apparent error instruction；It is right when the test of crystal oscillator output short-circuit
The picture answered is shown as picture disappearance, red screen, and/or the error log generated is to crash, and printing stops, and no apparent error refers to
Show.Further, the image of various hardware abnormal status can be connected with error log in a short time, to analysis with
The loophole that machine crashes provides good example, is capable of the range of quick positioning question or diminution problem by exclusive method in this way, is
Queueing problem provides good illustration.
Table one
| Conflicting mode | Screen is shown | Error log prompt |
| Short-circuit DDR_1V2 | Picture disappears, red screen | It crashes, printing stops, no apparent error prompt |
| Short-circuit DDR_2V5 | Picture disappears, blank screen | It crashes, printing stops, no apparent error prompt |
| Short-circuit VDDEE (GPU) | Picture disappears, blank screen | It crashes, printing stops, no apparent error prompt |
| Short-circuit VCCK (CPU) | Picture still | It crashes, printing stops, no apparent error prompt |
| Short-circuit AO_3.3V | System reboot | Printing without exception before restarting |
| Short-circuit AFE_1.8V | Picture disappears, blank screen | It crashes, printing stops, no apparent error prompt |
| Short-circuit crystal oscillator output | Picture disappears, red screen | It crashes, printing stops, no apparent error prompt |
Further, plural kind of different types of fault test is carried out to system on chip, it is corresponding not to obtain system on chip
A plurality of response situations of the fault type of same type, summarize a plurality of response situations, and with corresponding fault type
It is stored together into a storage unit, then according to the corresponding reaction information of system on chip to be measured, and is stored in storage unit
Response situation matched, to obtain the current fault type of system on chip to be measured.
In a kind of preferably embodiment, in step S1, the fault test to memory module includes memory clock
Data short-circuit test；And/or memory data line short test.
Specifically, as shown in chart two, when memory DDR clock data short-circuit test, corresponding picture is shown as picture
Face disappears, red screen, and/or the error log generated is to crash to restart, no apparent error instruction；Or work as memory EMMC clock number
When according to short-circuit test, corresponding picture is shown as picture still, and/or the error log generated is the normal output of printing, is prompted
EMMC mistake；When memory EMMC data circuit short-circuit test, corresponding picture is shown as that picture is normal, and/or generate
Error log is the normal output of printing, prompts EMMC mistake.It further, in a short time can be by various hardware abnormal status
Image connected with error log, good example is provided to the loophole that crashes at random of analysis, in this way by exclusive method energy
Enough quick positioning questions or the range for reducing problem, provide good illustration for queueing problem.
In a kind of preferably embodiment, in step S1, the fault test to radio tuner module includes positive electricity
The short-circuit test of source input pin and negative power input pin；And/or the non-inverting clock signal pins of Low Voltage Differential Signal with
The short-circuit test of the negative Clock Signal pin of Low Voltage Differential Signal；And/or the non-inverting clock letter of high-definition multimedia interface
The short-circuit test of number pin and the negative Clock Signal pin of high-definition multimedia interface.
Specifically, as shown in chart two, when positive supply input pin makees short-circuit test with negative power input pin,
Corresponding picture is shown as picture still, and picture recovery is normal after stopping interference, and/or the error log generated is that printing is normal
Output prompts no signal output；When the non-inverting clock signal pins of Low Voltage Differential Signal and the negative clock of Low Voltage Differential Signal
When signal pins make short-circuit test, corresponding picture is shown as picture disappearance, and picture is normal after stopping interference, and/or generate
Error log is that printing is without exception；When the non-inverting clock signal pins of high-definition multimedia interface connect with high-definition multimedia
When the negative Clock Signal pin of mouth makees short-circuit test, corresponding picture is shown as picture disappearance, and picture is normal after stopping interference,
And/or the error log generated is the normal output of printing, prompts no signal output.It further, in a short time can will be each
The image of kind hardware abnormal status is connected with error log, provides good example to the loophole that analysis is crashed at random, this
Sample by exclusive method can quick positioning question or reduce problem range, provide good illustration for queueing problem.
Table two
Further, plural kind of different types of fault test is carried out to system on chip, it is corresponding not to obtain system on chip
A plurality of response situations of the fault type of same type, summarize a plurality of response situations, and with corresponding fault type
It is stored together into a storage unit, then according to the corresponding reaction information of system on chip to be measured, and is stored in storage unit
Response situation matched, to obtain the current fault type of system on chip to be measured.
The foregoing is merely preferred embodiments of the present invention, are not intended to limit embodiments of the present invention and protection model
It encloses, to those skilled in the art, should can appreciate that all with made by description of the invention and diagramatic content
Equivalent replacement and obviously change obtained scheme, should all be included within the scope of the present invention.
Claims (10)
1. a kind of method for distinguishing crash problem by fault test, is used for smart television characterized by comprising
Step S1, plural kind of different types of fault test is carried out to system on chip, it is corresponding different to obtain the system on chip
A plurality of response situations of the fault type of type summarize a plurality of response situations, and with corresponding failure classes
Type is stored together into a storage unit；
Step S2, according to the corresponding reaction information of system on chip to be measured, described feelings are reacted with stored in the storage unit
Condition is matched, to obtain the current fault type of the system on chip to be measured.
2. the method according to claim 1 for distinguishing crash problem by fault test, which is characterized in that Yu Suoshu step
In S1, corresponding reaction information is obtained to each response situation of the system on chip, the reaction information includes picture
It shows and the error log of corresponding generation.
3. the method according to claim 1 for distinguishing crash problem by fault test, which is characterized in that the on piece system
System includes power module；And/or memory module；And/or radio tuner module.
4. the method according to claim 3 for distinguishing crash problem by fault test, which is characterized in that Yu Suoshu step
In S1, the fault test to the power module includes fixed pin short-circuit test；And/or crystal oscillator output short-circuit test.
5. the method according to claim 3 for distinguishing crash problem by fault test, which is characterized in that Yu Suoshu step
In S1, the fault test to the memory module includes memory clock data short-circuit test；And/or memory data route
Short-circuit test.
6. the method according to claim 3 for distinguishing crash problem by fault test, which is characterized in that Yu Suoshu step
In S1, it is short with negative power input pin that the fault test to the radio tuner module includes positive supply input pin
Drive test examination；And/or the negative Clock Signal pin of the non-inverting clock signal pins and Low Voltage Differential Signal of Low Voltage Differential Signal
Short-circuit test；And/or high-definition multimedia interface non-inverting clock signal pins and high-definition multimedia interface negative
The short-circuit test of Clock Signal pin.
7. the method according to claim 4 for distinguishing crash problem by fault test, which is characterized in that the fixation is drawn
Foot short-circuit test includes memory short-circuit test.
8. the method according to claim 4 for distinguishing crash problem by fault test, which is characterized in that the fixation is drawn
Foot short-circuit test includes graphics processor short-circuit test.
9. the method according to claim 4 for distinguishing crash problem by fault test, which is characterized in that the fixation is drawn
Foot short-circuit test includes central processing unit short-circuit test.
10. the method according to claim 4 for distinguishing crash problem by fault test, which is characterized in that the fixation
Pin short-circuit test includes the short-circuit test of the power supply adjustment output pin of 3.3V or the voltage analog front end pin of 1.8V.
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| EP2389596B1 (en) * | 2009-01-23 | 2013-09-18 | Silicon Image, Inc. | Fault testing for interconnections |
| CN104460649A (en) * | 2014-10-21 | 2015-03-25 | 北京汽车股份有限公司 | Fault testing circuit and method |
| CN107027063A (en) * | 2017-04-19 | 2017-08-08 | 广州视源电子科技股份有限公司 | The record back method and system of TV menu Function detection |
| CN107783005A (en) * | 2017-10-11 | 2018-03-09 | 广东小天才科技有限公司 | For the method, apparatus of equipment fault diagnosis, equipment, system and storage medium |
-
2019
- 2019-02-21 CN CN201910132802.0A patent/CN109874008B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2389596B1 (en) * | 2009-01-23 | 2013-09-18 | Silicon Image, Inc. | Fault testing for interconnections |
| CN104460649A (en) * | 2014-10-21 | 2015-03-25 | 北京汽车股份有限公司 | Fault testing circuit and method |
| CN107027063A (en) * | 2017-04-19 | 2017-08-08 | 广州视源电子科技股份有限公司 | The record back method and system of TV menu Function detection |
| CN107783005A (en) * | 2017-10-11 | 2018-03-09 | 广东小天才科技有限公司 | For the method, apparatus of equipment fault diagnosis, equipment, system and storage medium |
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