CN109791112A - Mura检测方法和Mura检测系统 - Google Patents

Mura检测方法和Mura检测系统 Download PDF

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Publication number
CN109791112A
CN109791112A CN201780058735.1A CN201780058735A CN109791112A CN 109791112 A CN109791112 A CN 109791112A CN 201780058735 A CN201780058735 A CN 201780058735A CN 109791112 A CN109791112 A CN 109791112A
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China
Prior art keywords
mura
image
shooting image
detected
display panel
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CN201780058735.1A
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English (en)
Inventor
朱广飞
黄顺宏
章勇
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Shenzhen Royole Technologies Co Ltd
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Shenzhen Royole Technologies Co Ltd
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Publication of CN109791112A publication Critical patent/CN109791112A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)

Abstract

一种Mura检测方法。Mura检测方法包括：(S10)获取待检测显示面板的拍摄图像；(S20)将拍摄图像与Mura图像库中的Mura图像进行比较；和(S30)根据比较的结果判断待检测显示面板是否存在Mura。此外，还公开了一种Mura检测系统(100)。

Description

PCT国内申请，说明书已公开。

Claims (18)

  1. PCT国内申请，权利要求书已公开。
CN201780058735.1A 2017-08-04 2017-08-04 Mura检测方法和Mura检测系统 Pending CN109791112A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2017/096050 WO2019024094A1 (zh) 2017-08-04 2017-08-04 Mura检测方法和Mura检测系统

Publications (1)

Publication Number Publication Date
CN109791112A true CN109791112A (zh) 2019-05-21

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CN201780058735.1A Pending CN109791112A (zh) 2017-08-04 2017-08-04 Mura检测方法和Mura检测系统

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CN (1) CN109791112A (zh)
WO (1) WO2019024094A1 (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111179795B (zh) * 2020-02-19 2023-07-21 京东方科技集团股份有限公司 显示面板的检测方法及其装置

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CN1928535A (zh) * 2006-09-07 2007-03-14 哈尔滨工业大学 一种基于机器视觉的液晶显示器斑痕缺陷检测方法与系统
EP1975915A2 (en) * 2007-03-29 2008-10-01 Sharp Kabushiki Kaisha Reduction of mura effects, and display
CN103558229A (zh) * 2013-11-25 2014-02-05 苏州富鑫林光电科技有限公司 一种tft-lcd制程的mura视觉自动检测方法及装置
CN105069042A (zh) * 2015-07-23 2015-11-18 北京航空航天大学 基于内容的无人机侦察图像数据检索方法
CN105158942A (zh) * 2015-09-24 2015-12-16 昆山龙腾光电有限公司 一种Mura自动检测方法及系统
CN105380590A (zh) * 2015-10-27 2016-03-09 杭州镜之镜科技有限公司 一种具有眼位检测功能的设备及其实现方法
CN105589230A (zh) * 2016-03-09 2016-05-18 深圳市华星光电技术有限公司 面板标记侦测方法及面板标记区域的Mura补偿方法
CN105845062A (zh) * 2016-03-31 2016-08-10 京东方科技集团股份有限公司 检测显示面板的方法及系统和显示面板的批量检测方法
CN105913419A (zh) * 2016-04-07 2016-08-31 南京汇川图像视觉技术有限公司 基于ICA学习和多通道融合的TFT-LCD mura缺陷检测方法
CN106126574A (zh) * 2016-06-16 2016-11-16 深圳市矽伟智科技有限公司 图片的识别方法、系统及物联网摄像设备
CN106157310A (zh) * 2016-07-06 2016-11-23 南京汇川图像视觉技术有限公司 基于混合自适应水平集模型与多通道结合的TFT LCD mura缺陷检测方法
CN106383124A (zh) * 2016-08-30 2017-02-08 四川石棉华瑞电子有限公司 电容铝箔表面缺陷视觉在线检查系统及方法
CN106650770A (zh) * 2016-09-29 2017-05-10 南京大学 一种基于样本学习和人眼视觉特性的mura缺陷检测方法
US20170206821A1 (en) * 2016-01-20 2017-07-20 Samsung Display Co., Ltd. Method of compensating for an excimer laser annealing mura and display device employing the same

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KR101374989B1 (ko) * 2006-12-27 2014-03-17 엘지디스플레이 주식회사 무라 검출장치 및 그의 구동방법
US20100188412A1 (en) * 2009-01-28 2010-07-29 Microsoft Corporation Content based cache for graphics resource management
CN101840078B (zh) * 2009-03-20 2016-02-10 北京京东方光电科技有限公司 水波纹级别测试方法

Patent Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1928535A (zh) * 2006-09-07 2007-03-14 哈尔滨工业大学 一种基于机器视觉的液晶显示器斑痕缺陷检测方法与系统
EP1975915A2 (en) * 2007-03-29 2008-10-01 Sharp Kabushiki Kaisha Reduction of mura effects, and display
CN103558229A (zh) * 2013-11-25 2014-02-05 苏州富鑫林光电科技有限公司 一种tft-lcd制程的mura视觉自动检测方法及装置
CN105069042A (zh) * 2015-07-23 2015-11-18 北京航空航天大学 基于内容的无人机侦察图像数据检索方法
CN105158942A (zh) * 2015-09-24 2015-12-16 昆山龙腾光电有限公司 一种Mura自动检测方法及系统
CN105380590A (zh) * 2015-10-27 2016-03-09 杭州镜之镜科技有限公司 一种具有眼位检测功能的设备及其实现方法
US20170206821A1 (en) * 2016-01-20 2017-07-20 Samsung Display Co., Ltd. Method of compensating for an excimer laser annealing mura and display device employing the same
CN105589230A (zh) * 2016-03-09 2016-05-18 深圳市华星光电技术有限公司 面板标记侦测方法及面板标记区域的Mura补偿方法
CN105845062A (zh) * 2016-03-31 2016-08-10 京东方科技集团股份有限公司 检测显示面板的方法及系统和显示面板的批量检测方法
CN105913419A (zh) * 2016-04-07 2016-08-31 南京汇川图像视觉技术有限公司 基于ICA学习和多通道融合的TFT-LCD mura缺陷检测方法
CN106126574A (zh) * 2016-06-16 2016-11-16 深圳市矽伟智科技有限公司 图片的识别方法、系统及物联网摄像设备
CN106157310A (zh) * 2016-07-06 2016-11-23 南京汇川图像视觉技术有限公司 基于混合自适应水平集模型与多通道结合的TFT LCD mura缺陷检测方法
CN106383124A (zh) * 2016-08-30 2017-02-08 四川石棉华瑞电子有限公司 电容铝箔表面缺陷视觉在线检查系统及方法
CN106650770A (zh) * 2016-09-29 2017-05-10 南京大学 一种基于样本学习和人眼视觉特性的mura缺陷检测方法

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Address after: Building 43, Dayun software Town, No. 8288 Longgang Avenue, Henggang street, Longgang District, Shenzhen City, Guangdong Province

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Application publication date: 20190521