CN109786204B - 一种利用气体团簇溅射靶材引出离子束流的方法及离子源 - Google Patents
一种利用气体团簇溅射靶材引出离子束流的方法及离子源 Download PDFInfo
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- CN109786204B CN109786204B CN201910047089.XA CN201910047089A CN109786204B CN 109786204 B CN109786204 B CN 109786204B CN 201910047089 A CN201910047089 A CN 201910047089A CN 109786204 B CN109786204 B CN 109786204B
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- 238000000034 method Methods 0.000 title claims abstract description 36
- 238000010884 ion-beam technique Methods 0.000 title claims abstract description 29
- 238000005477 sputtering target Methods 0.000 title claims abstract description 17
- 150000002500 ions Chemical class 0.000 claims abstract description 70
- 238000004544 sputter deposition Methods 0.000 claims abstract description 36
- 239000013077 target material Substances 0.000 claims abstract description 27
- 239000000178 monomer Substances 0.000 claims abstract description 14
- 230000005684 electric field Effects 0.000 claims abstract description 10
- 239000007787 solid Substances 0.000 claims abstract description 9
- 238000007885 magnetic separation Methods 0.000 claims abstract description 4
- 230000007935 neutral effect Effects 0.000 claims description 8
- 239000000843 powder Substances 0.000 claims description 7
- 239000002245 particle Substances 0.000 claims description 5
- 238000001816 cooling Methods 0.000 claims description 4
- 230000000694 effects Effects 0.000 claims description 4
- 238000003825 pressing Methods 0.000 claims description 4
- 230000005476 size effect Effects 0.000 claims description 4
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 4
- 229910052721 tungsten Inorganic materials 0.000 claims description 4
- 239000010937 tungsten Substances 0.000 claims description 4
- 238000005507 spraying Methods 0.000 claims description 3
- 229910052792 caesium Inorganic materials 0.000 abstract description 9
- TVFDJXOCXUVLDH-UHFFFAOYSA-N caesium atom Chemical compound [Cs] TVFDJXOCXUVLDH-UHFFFAOYSA-N 0.000 abstract description 9
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 abstract description 6
- 229910052715 tantalum Inorganic materials 0.000 abstract description 4
- 239000007789 gas Substances 0.000 description 52
- 239000005543 nano-size silicon particle Substances 0.000 description 6
- 150000001485 argon Chemical class 0.000 description 5
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 5
- 235000012431 wafers Nutrition 0.000 description 5
- BGPVFRJUHWVFKM-UHFFFAOYSA-N N1=C2C=CC=CC2=[N+]([O-])C1(CC1)CCC21N=C1C=CC=CC1=[N+]2[O-] Chemical compound N1=C2C=CC=CC2=[N+]([O-])C1(CC1)CCC21N=C1C=CC=CC1=[N+]2[O-] BGPVFRJUHWVFKM-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- NCMHKCKGHRPLCM-UHFFFAOYSA-N caesium(1+) Chemical compound [Cs+] NCMHKCKGHRPLCM-UHFFFAOYSA-N 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 231100000252 nontoxic Toxicity 0.000 description 2
- 230000003000 nontoxic effect Effects 0.000 description 2
- 241001391944 Commicarpus scandens Species 0.000 description 1
- 238000004760 accelerator mass spectrometry Methods 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- -1 atom ions Chemical class 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000001678 elastic recoil detection analysis Methods 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000003344 environmental pollutant Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000003116 impacting effect Effects 0.000 description 1
- 238000007737 ion beam deposition Methods 0.000 description 1
- 238000005372 isotope separation Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000004949 mass spectrometry Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 239000011858 nanopowder Substances 0.000 description 1
- 231100000719 pollutant Toxicity 0.000 description 1
- 238000001959 radiotherapy Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000005001 rutherford backscattering spectroscopy Methods 0.000 description 1
- 238000001004 secondary ion mass spectrometry Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000011863 silicon-based powder Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000013076 target substance Substances 0.000 description 1
- 231100000331 toxic Toxicity 0.000 description 1
- 230000002588 toxic effect Effects 0.000 description 1
- 238000004846 x-ray emission Methods 0.000 description 1
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CN110670043B (zh) * | 2019-11-12 | 2022-04-08 | 武汉大学深圳研究院 | 一种基于气体团簇离子束溅射的薄膜沉积方法 |
CN114864364A (zh) * | 2021-06-21 | 2022-08-05 | 武汉大学深圳研究院 | 一种靶材温度可控范围广的团簇离子束高温抛光装置 |
CN113458876A (zh) * | 2021-06-21 | 2021-10-01 | 武汉大学深圳研究院 | 一种团簇能量逐级递减的团簇离子束表面抛光方法 |
CN113643950B (zh) * | 2021-07-29 | 2024-01-30 | 武汉纽飞格纳米科技有限公司 | 一种产生掺杂碱金属或卤素的耦合气体团簇离子束的装置和方法 |
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JP4636862B2 (ja) * | 2004-11-29 | 2011-02-23 | 株式会社日立製作所 | ガスクラスターイオンビーム照射装置 |
JP2007277708A (ja) * | 2006-03-17 | 2007-10-25 | Canon Inc | 成膜装置および成膜方法 |
CN107393794B (zh) * | 2017-08-07 | 2019-09-10 | 深圳江海行纳米科技有限公司 | 一种气体团簇离子源产生方法及装置 |
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