CN109715698A - Alkali soluble resins and alkali soluble type radiation sensitive resin composition containing unsaturated group - Google Patents

Alkali soluble resins and alkali soluble type radiation sensitive resin composition containing unsaturated group Download PDF

Info

Publication number
CN109715698A
CN109715698A CN201780056482.4A CN201780056482A CN109715698A CN 109715698 A CN109715698 A CN 109715698A CN 201780056482 A CN201780056482 A CN 201780056482A CN 109715698 A CN109715698 A CN 109715698A
Authority
CN
China
Prior art keywords
methyl
general formula
alkali soluble
acrylate
soluble resins
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201780056482.4A
Other languages
Chinese (zh)
Inventor
藤田贵史
六人部壮
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nagase Chemtex Corp
Original Assignee
Nagase Chemtex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nagase Chemtex Corp filed Critical Nagase Chemtex Corp
Publication of CN109715698A publication Critical patent/CN109715698A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F220/00Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and only one being terminated by only one carboxyl radical or a salt, anhydride ester, amide, imide or nitrile thereof
    • C08F220/02Monocarboxylic acids having less than ten carbon atoms; Derivatives thereof
    • C08F220/10Esters
    • C08F220/26Esters containing oxygen in addition to the carboxy oxygen
    • C08F220/32Esters containing oxygen in addition to the carboxy oxygen containing epoxy radicals
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F2/00Processes of polymerisation
    • C08F2/46Polymerisation initiated by wave energy or particle radiation
    • C08F2/48Polymerisation initiated by wave energy or particle radiation by ultraviolet or visible light
    • C08F2/50Polymerisation initiated by wave energy or particle radiation by ultraviolet or visible light with sensitising agents
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/20Filters
    • G02B5/22Absorbing filters
    • G02B5/223Absorbing filters containing organic substances, e.g. dyes, inks or pigments
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0005Production of optical devices or components in so far as characterised by the lithographic processes or materials used therefor
    • G03F7/0007Filters, e.g. additive colour filters; Components for display devices
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • G03F7/028Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/038Macromolecular compounds which are rendered insoluble or differentially wettable
    • G03F7/0385Macromolecular compounds which are rendered insoluble or differentially wettable using epoxidised novolak resin
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/038Macromolecular compounds which are rendered insoluble or differentially wettable
    • G03F7/0388Macromolecular compounds which are rendered insoluble or differentially wettable with ethylenic or acetylenic bands in the side chains of the photopolymer
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/67Thin-film transistors [TFT]

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Health & Medical Sciences (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Materials For Photolithography (AREA)
  • Polyesters Or Polycarbonates (AREA)
  • Optical Filters (AREA)
  • Macromonomer-Based Addition Polymer (AREA)

Abstract

The present invention provides a kind of low acid value, alkali solubility, development adaptation, resolution ratio and the excellent alkali soluble resins containing unsaturated group of electrology characteristic.A kind of alkali soluble resins containing unsaturated group is provided, it is characterized in that, its epoxy (methyl) acrylate and (c) reactant of tetrabasic carboxylic acid or its acid dianhydride for for (a) there is epoxy (methyl) acrylate of fluorene skeleton, (b) not to have fluorene skeleton.

Description

Alkali soluble resins and alkali soluble type radiation-sensitive resin group containing unsaturated group Close object
Technical field
The present invention relates to alkali soluble resins and alkali soluble type radiation sensitive resin composition containing unsaturated group.
Background technique
In the past, the alkali soluble resins with fluorene skeleton was due to the dispersibility of pigment, chemical resistance, electrology characteristic, resistance to It is hot, sensitivity is excellent, suitable for black matrix formation photoresist used in the manufacture in the colour filter of LCD, half The photoresist of conductor manufacture.As the alkali soluble resins with fluorene skeleton, for example, being proposed in patent document 1 following Photopolymerizable unsaturated compound, be using making to have the epoxy acrylate of bis-phenol fluorene skeleton to react with tetracarboxylic dianhydride and It is formed after oligomer and what the two-stage as envelope chain reacted is carried out to terminal hydroxyl using dicarboxylic anhydride.
But for the photopolymerizable unsaturated compound of patent document 1, generally to ensure that developability and it is necessary High acid value is designed to, as a result, the height requirement in recent years such as development adaptation, resolution ratio, electrology characteristic can not be coped with.Example Such as, if reducing acid value in order to improve electrology characteristic, there are alkali solubilities to significantly reduce, can not obtain and the balance of developability Problem.Although its reason not yet determines, however, it is thought that the resin with fluorene skeleton is easy to take packed structures, crystallinity high, because This alkali solubility in the case where reducing acid value can significantly reduce.
Existing technical literature
Patent document
Patent document 1: Japanese Unexamined Patent Publication 2001-354735 bulletin
Summary of the invention
Problems to be solved by the invention
A kind of the purpose of the present invention is to provide acid values low, alkali solubility, development adaptation, resolution ratio and electrology characteristic are excellent The alkali soluble resins containing unsaturated group.
Means for solving the problems
Present inventor has performed further investigations, as a result, it has been found that, by the way that a part of fluorene skeleton is replaced as non-fluorene skeleton, energy Enough destroy the packed structures of fluorene skeleton.And it was found that by the structure from epoxy (methyl) acrylate with fluorene skeleton A part is replaced as the alkali solubility containing unsaturated group of the structure from epoxy (methyl) acrylate for not having fluorene skeleton Even if resin, in the case where acid value is low, alkali solubility, development adaptation, resolution ratio and electrology characteristic are also excellent, this completes The present invention.
That is, the first alkali soluble resins of the invention containing unsaturated group is characterized in that, it is
(a) with fluorene skeleton epoxy (methyl) acrylate,
(b) without fluorene skeleton epoxy (methyl) acrylate and
(c) tetrabasic carboxylic acid or its acid dianhydride
Reactant.
First alkali soluble resins of the invention containing unsaturated group may be
(a) with fluorene skeleton epoxy (methyl) acrylate,
(b) without fluorene skeleton epoxy (methyl) acrylate,
(c) tetrabasic carboxylic acid or its acid dianhydride and
(d) dicarboxylic acids or tricarboxylic acids or its acid anhydrides
Reactant.
First alkali soluble resins of the invention containing unsaturated group is preferred: (b) ingredient has cyclic structure.
Second alkali soluble resins of the invention containing unsaturated group is characterized in that, is indicated by the following general formula (1).
[changing 1]
(in general formula (1), A indicates structure shown in the following general formula (2) or (3) independently of each other, ties shown in general formula (2) The molar ratio of structure shown in structure and general formula (3) is general formula (2): general formula (3)=90:10~20:80, B are indicated independently of each other Structure shown in the following general formula (4), C indicate structure shown in hydrogen atom or the following general formula (5) independently of each other, and l is repeat number Average value and independently of each other indicate 0~20, m be repeat number average value and indicate 1~20, n indicate 0 independently of each other ~20 integer.)
[changing 2]
(in general formula (2), D indicates to remove epoxy (methyl) acrylic acid from epoxy (methyl) acrylate with fluorene skeleton Bivalent group after esteratic site, R1Hydrogen atom or methyl are indicated independently of each other.)
[changing 3]
(in general formula (3), E indicates to remove epoxy (methyl) propylene from epoxy (methyl) acrylate for not having fluorene skeleton Multivalence group behind acid esters position, R1Indicate that hydrogen atom or methyl, n indicate 0~20 integer independently of each other.)
-CO-X(COOH)2-CO-(4)
(in general formula (4), X indicates tetrabasic carboxylic acid residue.)
-CO-Y-(COOH)y(5)
(in general formula (5), Y indicates that 2~4 yuan of polycarboxylic acid residues, y indicate 1~3 integer.)
Second alkali soluble resins of the invention containing unsaturated group is preferred: in general formula (2), D indicates the following general formula (6) Shown in structure.
[changing 4]
(in general formula (6), R2Hydrogen atom is indicated independently of each other, alkyl, phenyl or the halogen radical that carbon atom number is 1~5 Group, k indicate 0~10 integer.)
Second alkali soluble resins of the invention containing unsaturated group may is that in general formula (1), C indicates general formula (5) institute The structure shown, and in general formula (5), Y indicates that 2 yuan or 3 yuan of polycarboxylic acid residues, y indicate an integer of 1 or 2.
The first or second alkali soluble resins preferred acid number of the invention containing unsaturated group is 100 or less.
Alkali soluble type radiation sensitive resin composition of the invention is characterized in that, it includes:
(A) first or second alkali soluble resins of the invention containing unsaturated group,
(B) photopolymerization monomer and/or oligomer,
(C) Photoepolymerizationinitiater initiater and
(D) solvent.
Cured film of the invention is characterized in that, is to keep alkali soluble type radiation sensitive resin composition of the invention solid Made of change.
Colour filter of the invention is characterized in that it includes cured films of the invention.
Thin film transistor (TFT) of the invention is characterized in that it includes cured films of the invention.
The effect of invention
First and second alkali soluble resins of the invention containing unsaturated group are will be from the epoxy (first with fluorene skeleton Base) acrylate structure a part be replaced as from do not have fluorene skeleton epoxy (methyl) acrylate structure after Substance, therefore acid value is low, alkali solubility, develop adaptation, resolution ratio and excellent electrical characteristic.
Specific embodiment
<<the first alkali soluble resins of the invention containing unsaturated group>>
First alkali soluble resins of the invention containing unsaturated group is characterized in that, is
(a) with fluorene skeleton epoxy (methyl) acrylate,
(b) without fluorene skeleton epoxy (methyl) acrylate and
(c) tetrabasic carboxylic acid or its acid dianhydride
Reactant.
<epoxy (methyl) acrylate that (a) has fluorene skeleton>
Have epoxy (methyl) acrylate (being hereinafter also referred to as (a) ingredient) of fluorene skeleton without special as (a) It limits, it can be cited for example that bisphenol fluorene type ring oxygen (methyl) acrylate, 9,9- bis- (3- methyl -4- hydroxy phenyl) fluorenes type ring oxygen (methyl) acrylate, double phenylphenol fluorenes type ring oxygen (methyl) acrylate, double phenoxetol fluorenes type ring oxygen (methyl) third Olefin(e) acid ester, bis-naphthol fluorenes type ring oxygen (methyl) acrylate etc..They can be used alone or in combination with two or more.
It should be noted that epoxy (methyl) acrylate refers to (methyl) acrylic acid and contains epoxy group in this specification Compound ester.In addition, (methyl) acrylic acid refers to acrylic or methacrylic acid in this specification.
<epoxy (methyl) acrylate that (b) does not have fluorene skeleton>
Do not have epoxy (methyl) acrylate (being hereinafter also referred to as (b) ingredient) of fluorene skeleton without spy as (b) It does not limit, it can be cited for example that bisphenol type epoxy (methyl) acrylate, hydrogenated bisphenol A type epoxy (methyl) acrylate, double The epoxies (methyl) third containing bisphenol backbone such as phenol AP type ring oxygen (methyl) acrylate, bisphenol F type epoxy (methyl) acrylate Olefin(e) acid ester, epoxy (methyl) acrylate containing four phenol skeletons, contains naphthalene skeleton at epoxy (methyl) acrylate of the skeleton containing triphenol Epoxy (methyl) acrylate, epoxy (methyl) acrylate of the skeleton containing novolaks, the epoxy (first containing adamantane framework Base) acrylate, epoxy (methyl) acrylate containing isocyanuric acid skeleton, the skeleton containing xenol epoxy (methyl) acrylic acid Ester etc..They can be used alone or in combination with two or more.
It is good from developability, electrology characteristic, heat resistance in first alkali soluble resins of the invention containing unsaturated group From the aspect of, preferably (b) ingredient has cyclic structure.It is not particularly limited as cyclic structure, it can be cited for example that aromatic rings, Alicyclic ring, condensed ring, heterocycle etc..They can be separately existed in (b) ingredient, can also be existed simultaneously two or more.
<(c) tetrabasic carboxylic acid or its acid dianhydride>
It is not particularly limited as (c) tetrabasic carboxylic acid or its acid dianhydride (being hereinafter also referred to as (c) ingredient), example can be enumerated Such as pyromellitic acid, hydrogenation pyromellitic acid, benzophenone tetrabasic carboxylic acid, biphenyltetracarboxyacid acid, Biphenyl Ether tetrabasic carboxylic acid, diphenyl sulfonic acid tetracarboxylic acid Acid, 4,4 '-hexafluoro propylidene double phthalic acid, 1,2,4,5- cyclopentanetetracarboxylics etc. and their acid dianhydride etc..They can To be used alone, can also share two or more.
<(d) dicarboxylic acids or tricarboxylic acids or its acid anhydrides>
First alkali soluble resins of the invention containing unsaturated group may be
(a) with fluorene skeleton epoxy (methyl) acrylate,
(b) without fluorene skeleton epoxy (methyl) acrylate,
(c) tetrabasic carboxylic acid or its acid dianhydride and
(d) dicarboxylic acids or tricarboxylic acids or its acid anhydrides
Reactant.As (d) dicarboxylic acids or tricarboxylic acids or its acid anhydrides (being hereinafter also referred to as (d) ingredient) without spy It does not limit, it can be cited for example that maleic acid, succinic acid, itaconic acid, phthalic acid, tetrahydrophthalic acid, hexahydro neighbour benzene two Formic acid, methylendomethylenetetrahydrophthalic tetrahydrophthalic acid, chlorendic acid, methyl tetrahydrophthalic acid, succinic acid, glutaric acid, inclined benzene Three acid etc. and their acid anhydrides etc..They can be used alone or in combination with two or more.
<reaction of (a)~(d) ingredient>
In the reaction of (a)~(d) ingredient, the order of addition of each ingredient is not particularly limited, such as is not being used (d) in the case where ingredient, the method etc. for making (a)~(c) ingredient simultaneous reactions can be enumerated.In addition, in the feelings of use (d) ingredient Under condition, can enumerate makes the reaction of (a)~(c) ingredient, the method for then reacting (d) ingredient etc..
(a) ingredient and the molar ratio of (b) ingredient are not particularly limited, preferably 90:10~20:80, more preferably 80: 20~20:80.If (a) for the molar ratio of ingredient less than 20, developability is sometimes insufficient;If (a) molar ratio of ingredient is more than 90, Developability becomes inadequate sometimes when reducing acid value.
In the case where use (d) ingredient, (c) ingredient and the molar ratio of (d) ingredient are not particularly limited, usually 99:1~10:90, preferably 95:5~20:80.It is obtained containing unsaturated group if (d) molar ratio of ingredient is more than 90 The molecular weight of alkali soluble resins (A) reduces, thus it some times happens that the problem of film after prebake remains adherency.
The reaction temperature of (a)~(d) ingredient is not particularly limited, preferably 80~130 DEG C, more preferably 90~110 ℃.If reaction temperature, less than 80 DEG C, reaction carries out in which can not be successfully, it is possible to remaining unreacted reactant, if reaction temperature is more than 130 DEG C, the polymerization of (a) ingredient and (b) ingredient partly occurs, sometimes resulting in molecular weight increased dramatically.To the reaction time without spy It does not limit, preferably 2~24 hours, more preferably 4~20 hours.If the reaction time less than 2 hours, reaction be unable to fully into Row, it is possible to if the reaction time is more than 24 hours the polymerization of (a) ingredient and (b) ingredient partly occurs for remaining unreacted reactant, Sometimes resulting in molecular weight increased dramatically.
(a)~(d) reaction of ingredient can carry out in the presence of solvent, catalyst etc. as needed.In addition, anti-at this Ying Zhong optionally can also be such that other monomers are reacted other than (a)~(d) ingredient.It is not special as other monomers It limits, it can be cited for example that polyalcohol, epoxide, isocyanate compound, silane coupling agent etc..They can individually make With can also share two or more.
<<the second alkali soluble resins of the invention containing unsaturated group>>
Second alkali soluble resins of the invention containing unsaturated group is characterized in that, is indicated by the following general formula (1).
[changing 5]
In general formula (1), A indicates structure shown in the following general formula (2) or (3) independently of each other.
[changing 6]
In general formula (2), D indicates to remove epoxy (methyl) acrylate from epoxy (methyl) acrylate with fluorene skeleton Bivalent group behind position.As epoxy (methyl) acrylate with fluorene skeleton, can enumerate and as first present invention The alkali soluble resins containing unsaturated group raw material the same substance of (a) ingredient.They can be used alone, and can also close With two or more.
In general formula (2), from electrology characteristic, heat resistance it is good from the aspect of, D is preferably indicated shown in the following general formula (6) Structure.
[changing 7]
In general formula (6), R2Hydrogen atom is indicated independently of each other, alkyl, phenyl or the halogen group that carbon atom number is 1~5. The alkyl for being 1~5 as carbon atom number is not particularly limited, it can be cited for example that methyl, ethyl, propyl, butyl, amyl etc.. It is not particularly limited as halogen group, it can be cited for example that fluorine-based, chloro, bromo, iodo etc..
In general formula (6), k indicate 0~10 integer, preferably 0~7 integer, more preferably 0~5 integer.If k More than 10, then developability can significantly reduce sometimes.
In general formula (2), R1Hydrogen atom or methyl are indicated independently of each other.
[changing 8]
In general formula (3), E indicates to remove epoxy (methyl) acrylic acid from epoxy (methyl) acrylate for not having fluorene skeleton Multivalence group after esteratic site.As epoxy (methyl) acrylate for not having fluorene skeleton, can enumerate and as first The identical substance of (b) ingredient of the raw material of the alkali soluble resins containing unsaturated group of invention.They can be used alone, can also It is two or more to share.
In general formula (3), R1Hydrogen atom or methyl are indicated independently of each other.
In general formula (3), n indicate 0~20 integer, preferably 0~10 integer, more preferably 0~4 integer.If n is super 20 are crossed, not only resin viscosity increases, workability is deteriorated, but also molecular weight becomes excessive, therefore unexposed portion does not dissolve in developer solution, Sometimes it is unable to get target pattern.
In general formula (1), as long as the molar ratio of structure shown in structure shown in general formula (2) and general formula (3) is general formula (2): general formula (3)=90:10~20:80 is just not particularly limited, preferably 80~20:20~80.If being tied shown in general formula (2) Less than 20, developability becomes inadequate the molar ratio of structure sometimes, if the molar ratio of structure shown in general formula (2) is more than 90, makes Developability becomes inadequate sometimes when acid value reduces.
In general formula (1), B indicates structure shown in the following general formula (4) independently of each other.
-CO-X(COOH)2-CO-(4)
In general formula (4), X indicates tetrabasic carboxylic acid residue.As tetrabasic carboxylic acid, can enumerate with it is of the invention containing insatiable hunger as first Substance identical with (c) ingredient of the raw material of the alkali soluble resins of group.They can be used alone, can also share two kinds with On.
In general formula (1), C indicates structure shown in hydrogen atom or the following general formula (5) independently of each other.
-CO-Y-(COOH)y (5)
In general formula (5), Y indicates 2~4 yuan of polycarboxylic acid residues.As 2~4 yuan of polybasic carboxylic acid, dicarboxyl can be enumerated Acid, tricarboxylic acids, tetrabasic carboxylic acid.As dicarboxylic acids, tricarboxylic acids, can enumerate and as the first alkali of the invention containing unsaturated group The identical substance of (d) ingredient of the raw material of soluble resin.As tetrabasic carboxylic acid, can enumerate with it is of the invention containing insatiable hunger as first Substance identical with (c) ingredient of the raw material of the alkali soluble resins of group.They can be used alone, can also share two kinds with On.
In general formula (5), y indicates 1~3 integer, preferably expression an integer of 1 or 2.
In general formula (1), l be repeat number average value and independently of each other indicate 0~20, preferably 0~15, more preferably It is 0~10.If l is more than 20, not only resin viscosity is increased, workability is deteriorated, but also molecular weight becomes excessive, therefore unexposed portion Insoluble in developer solution, it is unable to get target pattern sometimes.
In general formula (1), m is the average value of repeat number and indicates 1~20, preferably 1~15, more preferably 1~10.If m More than 20, not only resin viscosity is increased, workability is deteriorated, but also molecular weight becomes excessive, therefore unexposed portion is insoluble in development Liquid is unable to get target pattern sometimes.
In general formula (1), n indicates that 0~20 integer, preferably 0~10 integer are more preferably 0~4 independently of each other Integer.If n is more than 20, not only resin viscosity is increased, workability is deteriorated, but also molecular weight becomes excessive, therefore unexposed portion is not It is dissolved in developer solution, is unable to get target pattern sometimes.
To the acid value (acid of solid component conversion of the first and second alkali soluble resins of the invention containing unsaturated group Value) be not particularly limited, preferably 100 or less, more preferably 90 or less, further preferably 80 or less, be most preferably 60 with Under.If acid value is more than 100, electrology characteristic is sometimes insufficient.
The weight average molecular weight of first and second alkali soluble resins of the invention containing unsaturated group is not particularly limited, Preferably 1,000~50,000,1,000~10,000 are more preferably.If weight average molecular weight is less than 1,000, it some times happens that in advance The problem of film after baking remains adherency, if more than 50,000, not only resin viscosity increases, workability is deteriorated, Er Qiewei Exposure portion does not dissolve in developer solution, is unable to get target pattern sometimes.
<<alkali soluble type radiation sensitive resin composition>>
Alkali soluble type radiation sensitive resin composition of the invention is characterized in that, it includes:
(A) first or second alkali soluble resins of the invention containing unsaturated group,
(B) photopolymerization monomer and/or oligomer,
(C) Photoepolymerizationinitiater initiater and
(D) solvent.
<alkali soluble resins of (A) containing unsaturated group>
Alkali soluble resins (being hereinafter also referred to as (A) ingredient) about (A) containing unsaturated group, with first or second sheet The alkali soluble resins containing unsaturated group of invention is identical.
<(B) photopolymerization monomer and/or oligomer>
It is not particularly limited as (B) photopolymerization monomer and/or oligomer (being hereinafter also referred to as (B) ingredient), it can With enumerate for example (methyl) acrylic acid -2- hydroxyl ethyl ester, (methyl) 2-hydroxypropyl acrylate, (methyl) acrylic acid -3- hydroxypropyl acrylate, Ethylene glycol two (methyl) acrylate, diethylene glycol two (methyl) acrylate, triethylene glycol two (methyl) acrylate, tetrem Glycol two (methyl) acrylate, butanediol two (methyl) acrylate, trimethylolpropane tris (methyl) acrylate, three hydroxyls Methylpropane two (methyl) acrylate, trimethylolpropane list (methyl) acrylate, trimethylolethane trimethacrylate (methyl) third Olefin(e) acid ester, trimethylolethane two (methyl) acrylate, trimethylolethane list (methyl) acrylate, pentaerythrite list (methyl) acrylate, pentaerythrite two (methyl) acrylate, pentaerythrite three (methyl) acrylate, pentaerythrite four (methyl) acrylate, dipentaerythritol list (methyl) acrylate, dipentaerythritol two (methyl) acrylate, two Ji Wusi Alcohol three (methyl) acrylate, dipentaerythritol four (methyl) acrylate, dipentaerythritol five (methyl) acrylate, two seasons Penta tetrol six (methyl) acrylate, glycerol (methyl) acrylate etc..They can be used alone, can also share two kinds with On.
In alkali soluble type radiation sensitive resin composition of the invention, the content of (B) ingredient is not particularly limited, phase For 100 parts by weight of (A) ingredient, below preferably 50 parts by weight, it is more preferably 40 parts by weight or less.If content is more than 50 weight Part, then the adhesiveness after prebake is led to the problem of sometimes.
<(C) Photoepolymerizationinitiater initiater>
It is not particularly limited as (C) Photoepolymerizationinitiater initiater (being hereinafter also referred to as (C) ingredient), it can be cited for example that benzene Ethyl ketone, 2,2- diethoxy acetophenone, to dimethyl acetophenone, to dimethylamino propiophenone, dichloroacetophenone, trichloro-benzenes second The acetophenones such as ketone, p-tert.-butyl acetophenone;Benzophenone, 2- chlorobenzophenone, p, bis- dimethylamino benzopheones of p '-etc. two Benzophenone class;The benzoin ethers such as benzil, benzoin, benzoin methylether, benzoin iso-propylether, benzoin isobutyl ether;It rests in peace The sulphur compounds such as fragrant double methyl ether, thioxanthene, 2- diuril ton, 2,4- diethyl thioxanthene, 2- methyl thioxanthene, 2- isopropylthioxanthones;2- second The Anthraquinones such as base anthraquinone, prestox anthraquinone, 1,2 benzae thracene quinone, 2,3- diphenyl anthraquinone;Azodiisobutyronitrile, benzoyl peroxide first The organic peroxides such as acyl, dicumyl peroxide;2-mercaptobenzimidazole, 2- mercaptobenzoxazole, 2-mercaptobenzothiazole etc. Mercaptan compound;1,2- acetyl caproyl, 1- [4- (thiophenyl) -, 2- (0- benzoyl oximes)], ethyl ketone, 1- [9- ethyl -6- (2- first Base benzoyl) -9H- carbazole -3- base] -, the oximes esters such as 1- (0- acetyl group oxime);Deng.They can be used alone, can also be with It shares two or more.
In alkali soluble type radiation sensitive resin composition of the invention, the content of (C) ingredient is not particularly limited, phase For 100 parts by weight of (A) ingredient, preferably 0.1~30 parts by weight, more preferably 1~20 parts by weight.If content is less than 0.1 weight Part is measured, photopolymerization slows, and sensitivity reduces sometimes, if content is more than 30 parts by weight, light is difficult to reach substrate, thus The adaptation of substrate and resin is deteriorated sometimes.
<(D) solvent>
It is not particularly limited as (D) solvent (being hereinafter also referred to as (D) ingredient), it can be cited for example that methoxybutyl Acetic acid esters;The alcohols such as methanol, ethyl alcohol;The ethers such as tetrahydrofuran;Glycol monoethyl ether, glycol dimethyl ether, Ethylene Glycol Methyl second The glycol ethers such as ether, ethylene glycol monoethyl ether;The ethylene glycol alkyl ethers acetic acid such as methylcellosolve acetate, ethyl cellosolve acetate Esters;Diethylene glycol monomethyl ether, diethylene glycol diethyl ether, diethylene glycol dimethyl ether, diethylene glycol ethyl methyl ether, diethylene glycol list The diethylene glycols class such as ether, diethylene glycol monobutyl ether;The propylene glycol such as methyl proxitol acetate, propylene glycol ethyl ether acetic acid esters Alkylether acetates class;Toluene, dimethylbenzene etc. are aromatic hydrocarbon;Methyl ethyl ketone, methyl amyl ketone, cyclohexanone, 4- hydroxyl -4- The ketones such as methyl -2 pentanone;And 2 hydroxy propanoic acid ethyl ester, 2- hydroxy-2-methyl methyl propionate, 2- hydroxy-2-methyl propionic acid Ethyl ester, ethoxy ethyl acetate, hydroxyl ethyl acetate, 2- hydroxy-2-methyl methyl butyrate, 3- methoxy methyl propionate, 3- first Oxygroup ethyl propionate, 3- ethoxypropanoate, 3- ethoxyl ethyl propionate, ethyl acetate, butyl acetate, methyl lactate, cream Esters such as acetoacetic ester etc..They can be used alone or in combination with two or more.
In alkali soluble type radiation sensitive resin composition of the invention, the content of (D) ingredient is not particularly limited, though So changed according to target viscosities, but the solid component concentration of preferably alkali soluble type radiation sensitive resin composition reaches 1 The amount of~50 weight % more preferably reaches the amount of 5~30 weight %.
For alkali soluble type radiation sensitive resin composition of the invention, in addition to above-mentioned (A)~(D) ingredient with Outside, other compositions can also optionally be contained.It is not particularly limited as other compositions, (E) pigment etc. can be enumerated.They can To be used alone, can also share two or more.
<(E) pigment>
It is not particularly limited as (E) pigment (being hereinafter also referred to as (E) ingredient), it can be cited for example that carbon black, oxidation Chromium, iron oxide, titanium be black, nigrosine, Cyanine Black, perylene are black, pigment yellow, paratonere, naphthol green, pigment blue, silica, Barium titanate, titanium oxide, zirconium oxide, barium sulfate, calcium carbonate etc..They can be used alone or in combination with two or more.
In the case that alkali soluble type radiation sensitive resin composition contains (E) ingredient, its content is not particularly limited, Relative to 100 parts by weight of (A) ingredient, preferably 50~150 parts by weight, more preferably 80~120 parts by weight.If content is less than 50 Parts by weight, light-proofness is sometimes insufficient, if content is more than 150 parts by weight, the content of original (A) ingredient as binder subtracts It is few, thus it some times happens that also damaging the undesirable problem of film Forming ability while damaging developing property.
<<cured film>>
Cured film of the invention is characterized in that, is to keep alkali soluble type radiation sensitive resin composition of the invention solid Made of change.
Cured film of the invention is obtained as alkali soluble type radiation sensitive resin composition of the invention is solidified Method is not particularly limited, and can enumerate following methods etc.: by infusion process, spray-on process, utilizing slit coater, rotary coating By in solution coating of alkali soluble type radiation sensitive resin composition to substrate etc., drying carries out any method of machine etc. After light (including ultraviolet light, radioactive ray etc.) irradiation, development treatment, rear baking are carried out.
The film thickness of cured film of the invention is not particularly limited, preferably 0.1~10 μm, more preferably 0.5~5 μm. If film thickness is less than 0.1 μm, electrology characteristic is sometimes insufficient, if film thickness is more than 10 μm, is unable to fully solidify when film is integrated with.
The purposes of cured film of the invention is not particularly limited, colour filter, thin film transistor (TFT), liquid crystal display can be enumerated Protective film or insulating film used in element, integrated circuit component, solid-state imaging element, organic EL etc. or bank material, colour The solder resist used etc. such as when photoresist, black matrix, printed circuit board manufacture.
<<colour filter>>
Colour filter of the invention is characterized in that it includes cured films of the invention.
<<thin film transistor (TFT)>>
Thin film transistor (TFT) of the invention is characterized in that it includes cured films of the invention.
Embodiment
In the following, enumerating embodiment to illustrate the present invention, but the present invention is not limited to these embodiments.As long as hereinafter, not having There is special record, then " part " or " % " refers respectively to " parts by weight " or " weight % ".
1. using material
Materials described below has been used in embodiment below and comparative example.
1-1. (a) has epoxy (methyl) acrylate of fluorene skeleton
9,9- bis- (3- methyl -4- hydroxy phenyl) fluorenes type epoxy acrylate (manufacture of Nagase chemteX company)
Bisphenol fluorene type epoxy acrylate (manufacture of Nagase chemteX company)
1-2. (b) does not have epoxy (methyl) acrylate of fluorene skeleton
Bisphenol-a epoxy acrylate (manufacture of Nagase chemteX company)
Triphenol type epoxy acrylate (manufacture of Nagase chemteX company)
Hydrogenated bisphenol A type epoxy acrylate (manufacture of Nagase chemteX company)
1-3. (c) tetrabasic carboxylic acid or its acid dianhydride
3,3 ', 4,4 '-biphenyltetracarboxylic dianhydride pyromellitic dianhydrides
1-4. (d) dicarboxylic acids or tricarboxylic acids or its acid anhydrides
1,2,3,6- tetrabydrophthalic anhydride
1-5. (B) photopolymerization monomer and/or oligomer
Pentaerythrite (three/tetra-) acrylate (manufacture of Daicel-allnex company, PETIA)
1-6. (C) Photoepolymerizationinitiater initiater
Ethyl ketone, 1- [9- ethyl -6- (2- methyl benzoyl) -9H- carbazole -3- base] -, 1- (0- acetyl group oxime) (BASF AG's manufacture, Irgacure OXE-02)
1-7. (D) solvent
Methoxybutyl acetic acid esters (manufacture of Daicel company)
2. embodiment
(embodiment 1)
By the molar ratio of (a) ingredient and (b) ingredient be (a): in the way of (b)=50:50, in the removable flask of 300ml Middle mixing is calculated as the first of 9,9- bis- (3- methyl -4- hydroxy phenyl) fluorenes type epoxy acrylate of 51.0g with solid component conversion Oxygroup butylacetic acid ester solution and with solid component conversion be calculated as 34.7g bisphenol-a epoxy acrylate methoxybutyl Acetate solution mixes 3,3 ', 4,4 '-biphenyltetracarboxylic dianhydride 5.9g and methoxybutyl acetic acid esters 19.0g later, slowly rises Temperature is reacted 14 hours at 100~105 DEG C.Later, methoxybutyl acetic acid esters 6.4g is added to be diluted, mixing 1,2,3,6- Tetrabydrophthalic anhydride 18.4g reacts 4 hours at 90~95 DEG C, obtains alkali soluble resins 1.Obtained alkali soluble resins 1 Solid component be 56.2%, acid value be 48.2mgKOH/g (with solid component conversion be calculated as 85.9mgKOH/g), Weight-average molecular Amount is 2,100.In addition, l and n are 0, m 1 in general formula (1).
(embodiment 2)
By the molar ratio of (a) ingredient and (b) ingredient be (a): in the way of (b)=50:50, in the removable flask of 300ml Middle mixing is calculated as the first of 9,9- bis- (3- methyl -4- hydroxy phenyl) fluorenes type epoxy acrylate of 49.6g with solid component conversion Oxygroup butylacetic acid ester solution and with solid component conversion be calculated as 36.7g triphenol type epoxy acrylate methoxybutyl second Acid esters solution mixes 3,3 ', 4,4 '-biphenyltetracarboxylic dianhydride 5.8g and methoxybutyl acetic acid esters 15.4g later, slowly rises Temperature is reacted 14 hours at 100~105 DEG C.Later, methoxybutyl acetic acid esters 5.8g is added to be diluted, mixing 1,2,3,6- Tetrabydrophthalic anhydride 17.9g reacts 4 hours at 90~95 DEG C, obtains alkali soluble resins 2.Obtained alkali soluble resins 2 Solid component be 55.6%, acid value be 45.6mgKOH/g (with solid component conversion be calculated as 81.9mgKOH/g), Weight-average molecular Amount is 2,700.In addition, l, m and n are 1 in general formula (1).
(embodiment 3)
By the molar ratio of (a) ingredient and (b) ingredient be (a): in the way of (b)=50:50, in the removable flask of 300ml Middle mixing is calculated as the first of 9,9- bis- (3- methyl -4- hydroxy phenyl) fluorenes type epoxy acrylate of 49.3g with solid component conversion Oxygroup butylacetic acid ester solution and with solid component conversion be calculated as 37.1g hydrogenated bisphenol A type epoxy acrylate methoxyl group Butylacetic acid ester solution mixes 3,3 ', 4,4 '-biphenyltetracarboxylic dianhydride 5.7g and methoxybutyl acetic acid esters 13.3g later, delays Slow heating, reacts 14 hours at 100~105 DEG C.Later, methoxybutyl acetic acid esters 5.6g is added to be diluted, mixing 1,2, 3,6- tetrabydrophthalic anhydride 17.8g react 4 hours at 90~95 DEG C, obtain alkali soluble resins 3.Obtained alkali solubility The solid component of resin 3 is 54.8%, and acid value is 47.1mgKOH/g (being calculated as 86.0mgKOH/g with solid component conversion), and weight is equal Molecular weight is 2,200.In addition, l and n are 0, m 1 in general formula (1).
(embodiment 4)
By the molar ratio of (a) ingredient and (b) ingredient be (a): in the way of (b)=50:50, in the removable flask of 300ml Middle mixing is calculated as the first of 9,9- bis- (3- methyl -4- hydroxy phenyl) fluorenes type epoxy acrylate of 57.3g with solid component conversion Oxygroup butylacetic acid ester solution and with solid component conversion be calculated as 38.8g bisphenol-a epoxy acrylate methoxybutyl Acetate solution mixes 3,3 ', 4,4 '-biphenyltetracarboxylic dianhydride 6.7g and methoxybutyl acetic acid esters 16.7g later, slowly rises Temperature is reacted 14 hours at 100~105 DEG C.Later, methoxybutyl acetic acid esters 1.0g is added to be diluted, mixing 1,2,3,6- Tetrabydrophthalic anhydride 6.9g reacts 4 hours at 90~95 DEG C, obtains alkali soluble resins 4.Obtained alkali soluble resins 4 Solid component be 56.5%, acid value be 28.8mgKOH/g (with solid component conversion be calculated as 51.0mgKOH/g), Weight-average molecular Amount is 2,000.In addition, l and n are 0, m 1 in general formula (1).
(embodiment 5)
By the molar ratio of (a) ingredient and (b) ingredient be (a): in the way of (b)=25:75, in the removable flask of 300ml Middle mixing is calculated as the first of 9,9- bis- (3- methyl -4- hydroxy phenyl) fluorenes type epoxy acrylate of 32.0g with solid component conversion Oxygroup butylacetic acid ester solution and with solid component conversion be calculated as 65.4g bisphenol-a epoxy acrylate methoxybutyl Acetate solution mixes 3,3 ', 4,4 '-biphenyltetracarboxylic dianhydride 7.5g and methoxybutyl acetic acid esters 30.4g later, slowly rises Temperature is reacted 14 hours at 100~105 DEG C.Later, methoxybutyl acetic acid esters 0.1g is added to be diluted, mixing 1,2,3,6- Tetrabydrophthalic anhydride 5.1g reacts 4 hours at 90~95 DEG C, obtains alkali soluble resins 5.Obtained alkali soluble resins 5 Solid component be 56.8%, acid value be 25.9mgKOH/g (with solid component conversion be calculated as 45.6mgKOH/g), Weight-average molecular Amount is 2,000.In addition, l and n are 0, m 1 in general formula (1).
(embodiment 6)
By the molar ratio of (a) ingredient and (b) ingredient be (a): in the way of (b)=50:50, in the removable flask of 300ml It is middle mixing with solid component conversion be calculated as 59.3g bisphenol fluorene type epoxy acrylate methoxybutyl acetate solution and with Solid component conversion is calculated as the methoxybutyl acetate solution of the bisphenol-a epoxy acrylate of 38.7g, mixes equal benzene later Four acid anhydrides 4.9g and methoxybutyl acetic acid esters 18.7g slowly heat up, and react 14 hours at 100~105 DEG C.Later, first is added Oxygroup butylacetic acid ester 1.2g is diluted, and mixes 1,2,3,6- tetrabydrophthalic anhydride 6.9g, small in 90~95 DEG C of reactions 4 When, obtain alkali soluble resins 6.The solid component of obtained alkali soluble resins 6 be 55.9%, acid value be 29.7mgKOH/g (with Solid component conversion is calculated as 53.2mgKOH/g), weight average molecular weight 2,100.In addition, l and n are 0, m 1 in general formula (1).
(embodiment 7)
By the molar ratio of (a) ingredient and (b) ingredient be (a): in the way of (b)=50:50, in the removable flask of 300ml It is middle mixing with solid component conversion be calculated as 60.3g bisphenol fluorene type epoxy acrylate methoxybutyl acetate solution and with Solid component conversion is calculated as the methoxybutyl acetate solution of the bisphenol-a epoxy acrylate of 39.4g, mixes equal benzene later Four acid anhydrides 10.0g and methoxybutyl acetic acid esters 10.4g slowly heat up, and react 14 hours at 100~105 DEG C.Later, it is added Methoxybutyl acetic acid esters 8.2g is diluted, and obtains alkali soluble resins 7.The solid component of obtained alkali soluble resins 7 is 55.6%, acid value is 28.9mgKOH/g (being calculated as 52.0mgKOH/g with solid component conversion), weight average molecular weight 2,900.Separately Outside, in general formula (1), l and n are 0, m 1.
(comparative example 1)
(3- methyl -4- the hydroxyl of 9,9- bis- that 75.4g is calculated as with solid component conversion is mixed in the removable flask of 300ml Phenyl) fluorenes type epoxy acrylate methoxybutyl acetate solution and 3,3 ', 4,4 '-biphenyltetracarboxylic dianhydride 8.7g and first Oxygroup butylacetic acid ester 0.3g slowly heats up, and reacts 14 hours at 100~105 DEG C.Later, methoxybutyl acetic acid esters is added 16.4g is diluted, and mixes 1,2,3,6- tetrabydrophthalic anhydride 25.8g, is reacted 4 hours at 90~95 DEG C, is obtained alkali soluble Property resin 8.The solid component of obtained alkali soluble resins 8 is 56.0%, and acid value is that 73.7mgKOH/g (is changed with solid component Calculate for 131.6mgKOH/g), weight average molecular weight 2,300.
(comparative example 2)
The bisphenol fluorene type epoxy acrylate that 88.3g is calculated as with solid component conversion is mixed in the removable flask of 300ml Methoxybutyl acetate solution and 3,3 ', 4,4 '-biphenyltetracarboxylic dianhydride 12.9g and methoxybutyl acetic acid esters 2.9g, Slowly heating is reacted 14 hours at 100~105 DEG C.Later, methoxybutyl acetic acid esters 23.1g is added to be diluted, mixing 1, 2,3,6- tetrabydrophthalic anhydride 8.9g react 4 hours at 90~95 DEG C, obtain alkali soluble resins 9.Obtained alkali solubility The solid component of resin 9 is 55.2%, and acid value is 48.5mgKOH/g (being calculated as 87.9mgKOH/g with solid component conversion), and weight is equal Molecular weight is 2,300.
(comparative example 3)
The bisphenol fluorene type epoxy acrylate that 96.1g is calculated as with solid component conversion is mixed in the removable flask of 300ml Methoxybutyl acetate solution and 3,3 ', 4,4 '-biphenyltetracarboxylic dianhydride 14.0g and methoxybutyl acetic acid esters 3.1g, Slowly heating is reacted 14 hours at 100~105 DEG C.Later, methoxybutyl acetic acid esters 17.3g is added to be diluted, obtains alkali Soluble resin 10.The solid component of obtained alkali soluble resins 10 be 55.9%, acid value be 30.1mgKOH/g (with solid at Conversion is divided to be calculated as 53.9mgKOH/g), weight average molecular weight 2,200.
(mixed example 1~7 and more mixed example 1~3)
Using alkali soluble resins 1~10 obtained in Examples 1 to 7 and comparative example 1~3, with weight shown in following table 1 Than mixing each ingredient, alkali soluble type radiation sensitive resin composition is obtained.For obtained alkali soluble type radiation-sensitive Resin combination evaluates alkali solubility, development adaptation, resolution ratio, electrology characteristic by following methods.Wherein, about mixed example 2,3,5~7 and more mixed example 3 obtained in alkali soluble type radiation sensitive resin composition, do not evaluate electrology characteristic.It will knot Fruit is shown in following table 1.
3. evaluation method
3-1. alkali solubility
By be not exposed processing, at 90 DEG C be impregnated into 0.1 with 2 μm of 2 minutes film thickness of heating plate prebake of film In the potassium hydroxide aqueous solution of weight %, the time required for measurement film dissolves, thus in accordance with following three Phase Evaluation alkali Dissolubility.
Zero: the good situation of alkali solubility (film dissolution time was less than 60 seconds)
△: the bad situation of alkali solubility (film dissolution time was 60 seconds more than and less than 300 seconds)
×: the bad situation of alkali solubility (film dissolution time is 300 or more)
3-2. development adaptation
For with 2 μm of 2 minutes film thickness of heating plate prebake of film, passing through ultra high pressure mercury using negative mask at 90 DEG C Lamp is with 100mJ/cm2After being exposed processing, dipping makes above-mentioned alkali-soluble comment in the potassium hydroxide aqueous solution of 0.1 weight % The time that film dissolution time obtained in valence is 1.2 times, develop, the glass substrate after development is amplified 50 times, visually Line pattern is confirmed, thus in accordance with following three Phase Evaluations development adaptation.
Zero: the good situation (not from strippable substrate, being formed with line pattern) of development adaptation
△: the bad situation (although foring line pattern, pattern defect has occurred) of development adaptation
×: the bad situation of development adaptation (from strippable substrate, not formed line pattern)
3-3. resolution ratio
For with 2 μm of 2 minutes film thickness of heating plate prebake of film, passing through ultra high pressure mercury using negative mask at 90 DEG C Lamp is with 100mJ/cm2After being exposed processing, dipping makes above-mentioned alkali-soluble comment in the potassium hydroxide aqueous solution of 0.1 weight % The time that film dissolution time obtained in valence is 1.2 times, develop, the glass substrate after development is amplified 500 times, visually Line pattern is confirmed, thus in accordance with following three Phase Evaluation resolution ratio.
Zero: the good situation of resolution ratio (resolution ratio is less than 30 μm)
△: the bad situation of resolution ratio (resolution ratio is 30 μm more than and less than 100 μm)
×: the bad situation of resolution ratio (resolution ratio is 100 μm or more)
3-4. electrology characteristic
For at 90 DEG C with 0.5 μm of 2 minutes film thickness of heating plate prebake of film, using ultrahigh pressure mercury lamp with 100mJ/ cm2It after being exposed processing, is baked after ten minutes at 200 DEG C with baking oven, uses 2400 type (Keithley of source table The manufacture of Instruments company) measurement current-voltage characteristic, the evaluation of the leakage current of obtained film is carried out, thus in accordance with Following three Phase Evaluation electrology characteristics.
Zero: the good situation of electrology characteristic (leakage current is small)
△: the bad situation of electrology characteristic (leakage current is slightly larger)
×: the bad situation of electrology characteristic (leakage current is big)
[table 1]
As shown in Table 1, the mixed example 1 for the alkali soluble resins for sharing (a) ingredient and (b) ingredient has been used In~7, mixed example 1~3 is compared compared with having used the alkali soluble resins merely with (a) ingredient, although acid value is low, alkali soluble Property, development adaptation, excellent in resolution, in addition, especially in mixed example 4, electrical characteristic is also excellent.

Claims (11)

1. a kind of alkali soluble resins containing unsaturated group, which is characterized in that it is
(a) with fluorene skeleton epoxy (methyl) acrylate,
(b) without fluorene skeleton epoxy (methyl) acrylate and
(c) reactant of tetrabasic carboxylic acid or its acid dianhydride.
2. being containing the alkali soluble resins of unsaturated group as described in claim 1
(a) with fluorene skeleton epoxy (methyl) acrylate,
(b) without fluorene skeleton epoxy (methyl) acrylate,
(c) tetrabasic carboxylic acid or its acid dianhydride and
(d) reactant of dicarboxylic acids or tricarboxylic acids or its acid anhydrides.
3. as claimed in claim 1 or 2 containing the alkali soluble resins of unsaturated group, wherein (b) ingredient has cyclic structure.
4. a kind of alkali soluble resins containing unsaturated group, which is characterized in that its by the following general formula (1) indicate,
[changing 1]
In general formula (1), A indicates structure shown in the following general formula (2) or (3) independently of each other, structure shown in general formula (2) and logical The molar ratio of structure shown in formula (3) is general formula (2): general formula (3)=90:10~20:80, and B indicates following logical independently of each other Structure shown in formula (4), C indicate structure shown in hydrogen atom or the following general formula (5) independently of each other, and l is being averaged for repeat number Value and independently of each other 0~20, m of expression are the average value of repeat number and indicate that 1~20, n indicates 0~20 independently of each other Integer,
[changing 2]
In general formula (2), D indicates to remove epoxy (methyl) acrylate position from epoxy (methyl) acrylate with fluorene skeleton Bivalent group afterwards, R1Hydrogen atom or methyl are indicated independently of each other,
[changing 3]
In general formula (3), E indicates to remove epoxy (methyl) acrylate portion from epoxy (methyl) acrylate for not having fluorene skeleton Multivalence group behind position, R1Indicate that hydrogen atom or methyl, n indicate 0~20 integer independently of each other,
-CO-X(COOH)2-CO- (4)
In general formula (4), X indicates tetrabasic carboxylic acid residue,
-CO-Y-(COOH)y (5)
In general formula (5), Y indicates that 2~4 yuan of polycarboxylic acid residues, y indicate 1~3 integer.
5. as claimed in claim 4 containing the alkali soluble resins of unsaturated group, wherein in general formula (2), D indicates following logical Structure shown in formula (6),
[changing 4]
In general formula (6), R2Hydrogen atom is indicated independently of each other, alkyl, phenyl or the halogen group that carbon atom number is 1~5, k is indicated 0~10 integer.
6. as described in claim 4 or 5 containing the alkali soluble resins of unsaturated group, wherein in general formula (1), C indicates general formula (5) structure shown in, and in general formula (5), Y indicates that 2 yuan or 3 yuan of polycarboxylic acid residues, y indicate an integer of 1 or 2.
7. acid value is 100 or less such as the alkali soluble resins according to any one of claims 1 to 6 containing unsaturated group.
8. a kind of alkali soluble type radiation sensitive resin composition, which is characterized in that it includes:
(A) alkali soluble resins according to any one of claims 1 to 7 containing unsaturated group,
(B) photopolymerization monomer and/or oligomer,
(C) Photoepolymerizationinitiater initiater and
(D) solvent.
9. a kind of cured film, which is characterized in that it is to make alkali soluble type radiation sensitive resin composition according to any one of claims 8 Made of solidification.
10. a kind of colour filter, which is characterized in that it includes cured films as claimed in claim 9.
11. a kind of thin film transistor (TFT), which is characterized in that it includes cured films as claimed in claim 9.
CN201780056482.4A 2016-10-27 2017-10-18 Alkali soluble resins and alkali soluble type radiation sensitive resin composition containing unsaturated group Pending CN109715698A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2016-210642 2016-10-27
JP2016210642A JP2018070724A (en) 2016-10-27 2016-10-27 Unsaturated group-containing alkali-soluble resin and alkali-soluble radiation-sensitive resin composition
PCT/JP2017/037668 WO2018079368A1 (en) 2016-10-27 2017-10-18 Unsaturated-group-containing alkali-soluble resin, and alkali-soluble radiation-sensitive resin composition

Publications (1)

Publication Number Publication Date
CN109715698A true CN109715698A (en) 2019-05-03

Family

ID=62024902

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201780056482.4A Pending CN109715698A (en) 2016-10-27 2017-10-18 Alkali soluble resins and alkali soluble type radiation sensitive resin composition containing unsaturated group

Country Status (5)

Country Link
JP (1) JP2018070724A (en)
KR (1) KR20190075907A (en)
CN (1) CN109715698A (en)
TW (1) TW201821466A (en)
WO (1) WO2018079368A1 (en)

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09304929A (en) * 1996-05-10 1997-11-28 Nippon Steel Chem Co Ltd Alkali developable photosensitive resin composition
TW200530281A (en) * 2003-11-26 2005-09-16 Nippon Steel Chemical Co Photosensitive resin composition and color filter using the same
TW200902579A (en) * 2007-07-04 2009-01-16 Tokyo Ohka Kogyo Co Ltd Colored photosensitive composition
CN101845137A (en) * 2009-03-25 2010-09-29 新日铁化学株式会社 Alkaline water-soluble resin, its producing method and photosensitive resin composition using same
CN102414616A (en) * 2009-04-27 2012-04-11 日产化学工业株式会社 Photosensitive composition using photopolymerizable polymer having fluorene skeleton
CN103980472A (en) * 2014-05-27 2014-08-13 张家港康得新光电材料有限公司 Epoxy acrylate low polymer containing fluorene as well as preparation method and application thereof
JP2015127730A (en) * 2013-12-27 2015-07-09 新日鉄住金化学株式会社 Black photosensitive composition for touch panel, cured product thereof, and touch panel including the cured product
CN104849960A (en) * 2014-02-13 2015-08-19 奇美实业股份有限公司 Resin, photosensitive resin composition, optical filter and its manufacturing method, liquid crystal display device
CN105467761A (en) * 2014-09-30 2016-04-06 新日铁住金化学株式会社 Photosensitive resin composition used for touch screen, and hardening film thereof, and touch screen with hardening film
CN107531880A (en) * 2015-04-28 2018-01-02 长濑化成株式会社 Alkali soluble resins

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3268771B2 (en) 2000-06-12 2002-03-25 ナガセケムテックス株式会社 Photopolymerizable unsaturated compound, method for producing the same, and alkali-soluble radiation-sensitive resin composition using the same
JP4489564B2 (en) * 2003-11-26 2010-06-23 新日鐵化学株式会社 Photosensitive resin composition and color filter using the same

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09304929A (en) * 1996-05-10 1997-11-28 Nippon Steel Chem Co Ltd Alkali developable photosensitive resin composition
TW200530281A (en) * 2003-11-26 2005-09-16 Nippon Steel Chemical Co Photosensitive resin composition and color filter using the same
TW200902579A (en) * 2007-07-04 2009-01-16 Tokyo Ohka Kogyo Co Ltd Colored photosensitive composition
CN101845137A (en) * 2009-03-25 2010-09-29 新日铁化学株式会社 Alkaline water-soluble resin, its producing method and photosensitive resin composition using same
CN102414616A (en) * 2009-04-27 2012-04-11 日产化学工业株式会社 Photosensitive composition using photopolymerizable polymer having fluorene skeleton
JP2015127730A (en) * 2013-12-27 2015-07-09 新日鉄住金化学株式会社 Black photosensitive composition for touch panel, cured product thereof, and touch panel including the cured product
CN104849960A (en) * 2014-02-13 2015-08-19 奇美实业股份有限公司 Resin, photosensitive resin composition, optical filter and its manufacturing method, liquid crystal display device
CN103980472A (en) * 2014-05-27 2014-08-13 张家港康得新光电材料有限公司 Epoxy acrylate low polymer containing fluorene as well as preparation method and application thereof
CN105467761A (en) * 2014-09-30 2016-04-06 新日铁住金化学株式会社 Photosensitive resin composition used for touch screen, and hardening film thereof, and touch screen with hardening film
CN107531880A (en) * 2015-04-28 2018-01-02 长濑化成株式会社 Alkali soluble resins

Also Published As

Publication number Publication date
TW201821466A (en) 2018-06-16
KR20190075907A (en) 2019-07-01
JP2018070724A (en) 2018-05-10
WO2018079368A1 (en) 2018-05-03

Similar Documents

Publication Publication Date Title
TWI461843B (en) Photosensitive resin composition being curable at low temperature
JP4733231B2 (en) Photosensitive resin and photosensitive resin composition using the same
TWI485167B (en) Alkali-solutable resin, photosensitive resin composition, color filter and method for manufacturing the same, liquid crystal display apparatus
JP3813244B2 (en) Alkali developable unsaturated resin composition and highly sensitive negative pattern forming material using the same
CN101105629B (en) Light solidifying/heat solidifying one-part welding resistant agent composition and printing circuit plate
CN105778618A (en) Preparation method of liquid light-cured solder resist ink and photosensitive resin thereof
JP3268771B2 (en) Photopolymerizable unsaturated compound, method for producing the same, and alkali-soluble radiation-sensitive resin composition using the same
JPH08278629A (en) Light-shielding thin film forming composition and light-shielding film formed using the same
TW200417572A (en) A phtocurable resin commposition
CN104516199B (en) Manufacturing method and color filter of photosensitive resin
US9392688B2 (en) Biomass photosensitive material and method for manufacturing the same, and printed circuit board
TW201900710A (en) Alkali soluble resin
TWI690543B (en) Alkali soluble resin
JP2016029442A (en) Photosensitive resin composition for etching resist, wiring pattern of metal film or metal oxide film formed using the same, and touch panel having this wiring pattern
CN109715698A (en) Alkali soluble resins and alkali soluble type radiation sensitive resin composition containing unsaturated group
JP2900137B2 (en) Photocurable resin
JP6755007B2 (en) Unsaturated group-containing alkali-soluble resin
JP2009169049A (en) Photosensitive resist composition for color filter and color filter
JP2020060617A (en) Photosensitive resin composition for light-shielding film, cured product thereof, and method for manufacturing color filter and touch panel using the cured product
JP2014197143A (en) Conductive pattern forming method, resin composition, conductive pattern, and electronic circuit
JP2003176344A (en) Photopolymerizable unsaturated resin, method for producing the same and alkali-soluble radiation- sensitive resin composition produced by using the resin
JP3985554B2 (en) Photosensitive resin composition and printed wiring board using the same
JP6912695B2 (en) Composite resin composition and cured composite resin
CN119081444A (en) Colorant dispersion, photosensitive resin composition and cured product
JP4651914B2 (en) Photosensitive resin, composition and method for producing the same

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
WD01 Invention patent application deemed withdrawn after publication
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20190503