CN109632809A - 产品质量检测方法及装置 - Google Patents
产品质量检测方法及装置 Download PDFInfo
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- CN109632809A CN109632809A CN201811557276.4A CN201811557276A CN109632809A CN 109632809 A CN109632809 A CN 109632809A CN 201811557276 A CN201811557276 A CN 201811557276A CN 109632809 A CN109632809 A CN 109632809A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8861—Determining coordinates of flaws
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8867—Grading and classifying of flaws using sequentially two or more inspection runs, e.g. coarse and fine, or detecting then analysing
- G01N2021/887—Grading and classifying of flaws using sequentially two or more inspection runs, e.g. coarse and fine, or detecting then analysing the measurements made in two or more directions, angles, positions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Image Processing (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201811557276.4A CN109632809B (zh) | 2018-12-19 | 2018-12-19 | 产品质量检测方法及装置 |
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CN201811557276.4A CN109632809B (zh) | 2018-12-19 | 2018-12-19 | 产品质量检测方法及装置 |
Publications (2)
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CN109632809A true CN109632809A (zh) | 2019-04-16 |
CN109632809B CN109632809B (zh) | 2021-11-02 |
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CN201811557276.4A Active CN109632809B (zh) | 2018-12-19 | 2018-12-19 | 产品质量检测方法及装置 |
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Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110057755A (zh) * | 2019-05-24 | 2019-07-26 | 广东工业大学 | 一种复合光学检测仪 |
CN111060520A (zh) * | 2019-12-30 | 2020-04-24 | 歌尔股份有限公司 | 一种产品缺陷检测方法、装置与系统 |
CN111179261A (zh) * | 2019-12-31 | 2020-05-19 | 深圳市太赫兹科技创新研究院 | 缺陷检测方法、系统、终端设备及存储介质 |
CN113640303A (zh) * | 2021-08-09 | 2021-11-12 | 联宝(合肥)电子科技有限公司 | 一种用于笔记本电脑的表面瑕疵检验设备及其检测方法 |
CN114240927A (zh) * | 2021-12-28 | 2022-03-25 | 湖南云箭智能科技有限公司 | 一种板卡质量检测方法、装置、设备及可读存储介质 |
CN114697556A (zh) * | 2022-04-12 | 2022-07-01 | 山东瑞邦自动化设备有限公司 | 一种流水作业生产线旋转拍照方法 |
CN115619767A (zh) * | 2022-11-09 | 2023-01-17 | 南京云创大数据科技股份有限公司 | 基于多光照条件的类镜面工件表面缺陷检测方法及装置 |
WO2023138641A1 (zh) * | 2022-01-19 | 2023-07-27 | 阿里云计算有限公司 | 杂质检测方法、系统、装置、设备、存储介质及软件产品 |
Citations (7)
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CN1508535A (zh) * | 2002-12-20 | 2004-06-30 | 宝山钢铁股份有限公司 | 扫描式带钢表面检测方法和装置 |
JP2005223006A (ja) * | 2004-02-03 | 2005-08-18 | Sony Corp | クリーム半田印刷検査方法 |
CN1991343A (zh) * | 2001-12-31 | 2007-07-04 | 奥博泰克有限公司 | 检查图形的方法 |
CN102539437A (zh) * | 2010-11-18 | 2012-07-04 | 松下电器产业株式会社 | 焊接检查方法及焊接检查装置 |
CN105043298B (zh) * | 2015-08-21 | 2017-08-04 | 东北大学 | 基于傅里叶变换无需相位展开的快速三维形貌测量方法 |
CN108240990A (zh) * | 2018-03-22 | 2018-07-03 | 深圳市永光神目科技有限公司 | 一种焊锡缺陷检测系统 |
CN108665453A (zh) * | 2018-05-09 | 2018-10-16 | 华霆(合肥)动力技术有限公司 | 焊点检测方法及装置 |
-
2018
- 2018-12-19 CN CN201811557276.4A patent/CN109632809B/zh active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
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CN1991343A (zh) * | 2001-12-31 | 2007-07-04 | 奥博泰克有限公司 | 检查图形的方法 |
CN1508535A (zh) * | 2002-12-20 | 2004-06-30 | 宝山钢铁股份有限公司 | 扫描式带钢表面检测方法和装置 |
JP2005223006A (ja) * | 2004-02-03 | 2005-08-18 | Sony Corp | クリーム半田印刷検査方法 |
CN102539437A (zh) * | 2010-11-18 | 2012-07-04 | 松下电器产业株式会社 | 焊接检查方法及焊接检查装置 |
CN105043298B (zh) * | 2015-08-21 | 2017-08-04 | 东北大学 | 基于傅里叶变换无需相位展开的快速三维形貌测量方法 |
CN108240990A (zh) * | 2018-03-22 | 2018-07-03 | 深圳市永光神目科技有限公司 | 一种焊锡缺陷检测系统 |
CN108665453A (zh) * | 2018-05-09 | 2018-10-16 | 华霆(合肥)动力技术有限公司 | 焊点检测方法及装置 |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110057755A (zh) * | 2019-05-24 | 2019-07-26 | 广东工业大学 | 一种复合光学检测仪 |
CN111060520A (zh) * | 2019-12-30 | 2020-04-24 | 歌尔股份有限公司 | 一种产品缺陷检测方法、装置与系统 |
CN111060520B (zh) * | 2019-12-30 | 2021-10-29 | 歌尔股份有限公司 | 一种产品缺陷检测方法、装置与系统 |
US11836907B2 (en) | 2019-12-30 | 2023-12-05 | Goertek, Inc. | Product defect detection method, device and system |
CN111179261A (zh) * | 2019-12-31 | 2020-05-19 | 深圳市太赫兹科技创新研究院 | 缺陷检测方法、系统、终端设备及存储介质 |
CN113640303A (zh) * | 2021-08-09 | 2021-11-12 | 联宝(合肥)电子科技有限公司 | 一种用于笔记本电脑的表面瑕疵检验设备及其检测方法 |
CN114240927A (zh) * | 2021-12-28 | 2022-03-25 | 湖南云箭智能科技有限公司 | 一种板卡质量检测方法、装置、设备及可读存储介质 |
WO2023138641A1 (zh) * | 2022-01-19 | 2023-07-27 | 阿里云计算有限公司 | 杂质检测方法、系统、装置、设备、存储介质及软件产品 |
CN114697556A (zh) * | 2022-04-12 | 2022-07-01 | 山东瑞邦自动化设备有限公司 | 一种流水作业生产线旋转拍照方法 |
CN114697556B (zh) * | 2022-04-12 | 2023-06-06 | 山东瑞邦智能装备股份有限公司 | 一种流水作业生产线旋转拍照方法 |
CN115619767A (zh) * | 2022-11-09 | 2023-01-17 | 南京云创大数据科技股份有限公司 | 基于多光照条件的类镜面工件表面缺陷检测方法及装置 |
CN115619767B (zh) * | 2022-11-09 | 2023-04-18 | 南京云创大数据科技股份有限公司 | 基于多光照条件的类镜面工件表面缺陷检测方法及装置 |
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Publication number | Publication date |
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CN109632809B (zh) | 2021-11-02 |
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Date | Code | Title | Description |
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PB01 | Publication | ||
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Effective date of registration: 20201027 Address after: 261061 north of Yuqing East Street, east of Dongming Road, Weifang High tech Zone, Weifang City, Shandong Province (Room 502, Geer electronic office building) Applicant after: GoerTek Optical Technology Co.,Ltd. Address before: 261031 No. 268 Dongfang Road, Weifang hi tech Industrial Development Zone, Shandong, Weifang Applicant before: GOERTEK Inc. |
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CB02 | Change of applicant information | ||
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Address after: 261061 east of Dongming Road, north of Yuqing East Street, high tech Zone, Weifang City, Shandong Province (Room 502, Geer electronics office building) Applicant after: GoerTek Optical Technology Co.,Ltd. Address before: 261061 East of Dongming Road, Weifang High-tech Zone, Weifang City, Shandong Province, North of Yuqing East Street (Room 502, Goertek Office Building) Applicant before: GoerTek Optical Technology Co.,Ltd. |
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Effective date of registration: 20221223 Address after: 266104 No. 500, Songling Road, Laoshan District, Qingdao, Shandong Patentee after: GOERTEK TECHNOLOGY Co.,Ltd. Address before: 261061 east of Dongming Road, north of Yuqing East Street, high tech Zone, Weifang City, Shandong Province (Room 502, Geer electronics office building) Patentee before: GoerTek Optical Technology Co.,Ltd. |