CN109618485A - The current test method of flexible circuit board and flexible circuit board - Google Patents

The current test method of flexible circuit board and flexible circuit board Download PDF

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Publication number
CN109618485A
CN109618485A CN201811430668.4A CN201811430668A CN109618485A CN 109618485 A CN109618485 A CN 109618485A CN 201811430668 A CN201811430668 A CN 201811430668A CN 109618485 A CN109618485 A CN 109618485A
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China
Prior art keywords
test point
flexible circuit
circuit board
test
section
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CN201811430668.4A
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CN109618485B (en
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谭力
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Wuhan China Star Optoelectronics Semiconductor Display Technology Co Ltd
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Wuhan China Star Optoelectronics Semiconductor Display Technology Co Ltd
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0266Marks, test patterns or identification means
    • H05K1/0268Marks, test patterns or identification means for electrical inspection or testing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Structure Of Printed Boards (AREA)

Abstract

The present invention provides the current test method of a kind of flexible circuit board and this flexible circuit board, flexible circuit board of the invention includes working region and test zone, working region includes multiple test blocks to be measured and multiple p-wires, it is separated between each test block to be measured by gap, p-wire extends to test zone and forms close access two-by-two, so that corresponding test block to be measured two-by-two is connected, the present invention solve the problems, such as in the prior art flexible circuit board in testing current due to using 0 Ohmic resistance and bring increases Material Cost, low efficiency and inconvenient prompt.

Description

The current test method of flexible circuit board and flexible circuit board
Technical field
The present invention relates to field of display technology more particularly to the current test methods of flexible circuit board and flexible circuit board.
Background technique
In LCD (Liquid Crystal Display, liquid crystal display) or AMOLED (Active-matrix Organic light-emitting diode, active matrix organic light-emitting diode) in module design, FPC (Flexible Printed Circuit, flexible circuit board) it is essential component, the one of effect of FPC is just to provide panel and display Drive the electrical testing position of IC.Test position on FPC can be divided into two class of voltage tester and testing current by structure, wherein Testing current since it is desired that series connection inlet wire road, so the testing current position on FPC, which is one, can cut off this route Device.Conventional method is by a 0 Ohmic resistance line disconnection, and when not using testing current function, resistance is welding shape State, and when needing to measure electric current, resistance is removed.
There are three this method drawbacks: first is that, increased 0 Europe resistance will increase the electronic component region of mould group, and increase Material Cost;It is disconnected second is that removing 0 Europe resistance when tested and will lead to the certain routes of product, Yao Huifu function must be again By hand by electric resistance welding, efficiency is extremely low;Third is that 0 Europe resistance must be placed into defined element area, the difficulty of cabling design is increased It may be because mechanism limitation when spending, while testing and be inconvenient to carry out.
FPC testing current there is a problem that increasing Material Cost, low efficiency and inconvenient victory in the prior art, because This, above-mentioned technology has improved space.
Summary of the invention
The present invention provides the current test methods of flexible circuit board and flexible circuit board, for solving in flexible circuit board Testing current in due to using 0 Ohmic resistance and bring increases Material Cost, low efficiency and the problem of inconvenient victory.
To solve the above problems, the present invention provides a kind of flexible circuit board, comprising:
At least one lug surface, the lug surface are formed in the flexible circuit board edge, and cropped area is defined on On the lug surface;
At least one signal lead, the first section and the second section including being formed in the flexible circuit plate surface, with And the third section between first section and second section, wherein the third section is formed in the sanction It cuts in region.
In the flexible circuit board of the application, the flexible circuit board further includes test zone, including the first test point and Second test point is spaced between first test point and second test point and is formed with to join domain;
First test point connects the first section of the signal lead, and second test point connects the signal and walks Second section of line.
In the flexible circuit board of the application, the lug surface is semicircle.
In the flexible circuit board of the application, the lug surface is triangle.
It is logical sky in the flexible circuit board of the application, among the lug surface.
In the flexible circuit board of the application, the signal lead is copper foil circuit.
Correspondingly, the present invention provides the current test method of the flexible circuit board, which is characterized in that including walking as follows It is rapid:
S101, the projection for cutting the flexible circuit board edge, to disconnect first test point and described second Test point;
S102, first test point and second test point are correspondingly connected to the input, output end of ammeter into Row testing current;
After S103, testing current, bonding pad will be needed between first test point and second test point Domain carries out a tin processing, to be connected to first test point and second test point.
In the current test method of the flexible circuit board of the application, cutting described in the prominent flexible circuit board edge Before lug surface, first test point is connected to second test point by the signal lead;Cut off the signal After cabling, first test point and second test point are disconnected.
In the current test method of the flexible circuit board of the application, the processing of described tin be to first test point with The join domain certain point that needs between second test point carries out a tin processing.
In the current test method of the flexible circuit board of the application, the processing of described tin be to first test point with The join domain that entirely needs between second test point carries out a tin processing.
The beneficial effects of the present invention are: the present invention provides the testing current sides of flexible circuit board and this flexible circuit board Method, the flexible circuit board include working region and test zone, and working region includes multiple test blocks to be measured and multiple tests Line is separated by gap between each test block to be measured, and p-wire extends to test zone and forms close access two-by-two.Normal Under state, test block to be measured is connected to by being connected to the p-wire of test zone two-by-two, to guarantee display driving IC and panel energy It works normally;When needing to carry out testing current, corresponding raised areas is cut, disconnects corresponding network line, by ammeter two End is respectively connected to breakpoint and carries out current measurement;It, only need to will be at the gap between above-mentioned corresponding test block to be measured when restoring circuit A tin processing is carried out, two test blocks to be measured is made to be connected.Therefore, present invention decreases Material Cost and save the time, Circuit risk is small, also simplifies the layout designs of circuit.
Detailed description of the invention
Below by attached drawing, invention is further explained.It should be noted that the accompanying drawings in the following description is only Explanation some embodiments of the present invention are only for not make the creative labor for those skilled in the art Under the premise of, it is also possible to obtain other drawings based on these drawings.
Fig. 1 is a kind of whole overlooking structure diagram of flexible circuit board provided in an embodiment of the present invention.
Fig. 2 is the whole overlooking structure diagram of another flexible circuit board provided in an embodiment of the present invention.
Fig. 3 is the whole overlooking structure diagram of another flexible circuit board provided in an embodiment of the present invention.
Fig. 4 is the cabling schematic diagram of the lug surface of flexible circuit board provided in an embodiment of the present invention.
Fig. 5 is the signal lead distribution schematic diagram of flexible circuit board provided in an embodiment of the present invention.
Fig. 6 is the flow chart of the current test method of flexible circuit board provided in an embodiment of the present invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete Whole description.Obviously, described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on Embodiment in the present invention, those skilled in the art's every other implementation obtained without creative efforts Example, shall fall within the protection scope of the present invention.
In the description of the present invention, it is to be understood that, the orientation or positional relationship of the instructions such as term " edge ", " surface " To be based on the orientation or positional relationship shown in the drawings, be merely for convenience of description of the present invention and simplification of the description, rather than indicate or It implies that signified device or element must have a particular orientation, be constructed and operated in a specific orientation, therefore should not be understood as Limitation of the present invention.In addition, term " height ", be neutral words, thick or thin, wide or narrow, long or short, only visitor is not indicated to be biased to The a certain attribute for indicating device is seen, and term " thickness " then implies that the distance between solid body two sides is larger.
In addition, it should also be noted that, attached drawing offer is only and Relationship Comparison of the present invention close structure and/or step Suddenly, some and little details of inventive relationship is omitted, it is therefore intended that simplify attached drawing, keeps inventive point very clear, rather than table Bright device in practice and/or method are exactly and attached drawing is the same, not as the limitation of device in practice and/or method.
Such as Fig. 1, a kind of whole overlooking structure diagram of flexible circuit board provided in an embodiment of the present invention is illustrated, such as scheme Shown, flexible circuit board 101 includes lug surface 102, and the lug surface 102 is formed in 101 side of flexible circuit board Edge, cropped area are defined on the lug surface 102, wherein the shape of the lug surface 102 (cropped area) is semicircle Shape.
If the shape of Fig. 2, the cropped area 202 at 201 edge of flexible circuit board are the triangle hollowed out.
If the shape of Fig. 3, the cropped area 302 at 301 edge of flexible circuit board are the semicircle hollowed out.
To sum up, the shape of lug surface 102 (cropped area) as shown in Figure 1 can be, but not limited to be it is semicircle, Triangle, it should be noted that the present invention compared with the increased lug surface 102 (cropped area) of traditional scheme, seem increase it is soft Property circuit board 101 area, actually using flexible circuit board 101 be mostly this feature of polymorphic structure it is each to rationally design The shapes and sizes of a lug surface 102 (cropped area) avoid the hollow plate price for increasing flexible circuit board 101;Further, It cuts for convenience, intermediate to the lug surface 102 (cropped area) processing can be hollowed out.
Such as Fig. 4, the cabling schematic diagram of the lug surface of flexible circuit board provided in an embodiment of the present invention is illustrated, as schemed institute Show, for the lug surface 401 (cropped area) at least provided with a bars cabling 402, the signal lead 402 includes being formed In the first section 4021 and the second section 4022 of the flexible circuit plate surface, and it is located at first section and described the Third section 4023 between two sections, wherein the third section shape 4023 is in the lug surface 401 (cropped area) It is interior.
Wherein, the lug surface 401 (cropped area) is single layer region, and the later period is facilitated to cut the lug surface 401 (cropped area), it is to be understood that doubling plate is too thick, and shearing when may will affect the effective coverage of flexible circuit board.
Specifically, the signal lead 402 of the lug surface 401 (cropped area) can be, but not limited to be one, herein The number of signal lead 402 is carried out rationally according to the position for the route for needing to carry out testing current in flexible circuit board and number Design.
Further, the signal lead 402 is copper foil circuit, and height value is almost nil, therefore the signal lead 402 It can be according to needing to carry out the line condition of testing current in the side foot areas case and flexible circuit board of flexible circuit board for institute Any region that signal lead 402 is designed at flexible circuit board is stated, All other routes or element will not be impacted.Therefore, The design method of lug surface 401 (cropped area) and signal lead 402 of the invention compared with prior art, eliminates big 0 Ohmic resistance is measured, saves Material Cost, while also simplifying circuit design.
Such as Fig. 5, the signal lead distribution schematic diagram of flexible circuit board provided in an embodiment of the present invention is illustrated, as schemed institute Show, flexible circuit board 501 includes test zone 502, and test zone 502 includes the first test point 5021 and the second test point 5022, it is spaced and is formed with to join domain between first test point 5021 and second test point 5022;Described first Test point 5021 connects the first section of the signal lead 503, and second test point 5022 connects the signal lead 503 The second section (division of the first section of the signal lead, the second section, third section with reference to Fig. 4 and its can be said It is bright).
Wherein, the test zone 502 includes at least first test point 5021 and second test point 5022, institute State between the first test point 5021 and second test point 5022 that interval formed need join domain be not limited to straight line or Person is curve, as long as first test point 5021 can be made to disconnect between any two with second test point 5022.
Wherein, the signal lead 503 extends to cropped area 504 and forms close access, so that corresponding described first Test point 5021 is connected with second test point 5022.
In addition to this, the edge of first test point 5021 and second test point 5022 is additionally provided with electric current entrance (not shown) enables the flexible circuit board 501 to obtain power supply to guarantee the normal work of display driving IC and panel, figure Signal lead 503 can also be connected to driving in addition to being connected to first test point 5021 and second test point 5022 in 5 The circuits such as IC are to guarantee the normal work of panel.
Such as Fig. 6, the flow chart of the current test method of flexible circuit board provided in an embodiment of the present invention is illustrated, in the reality It applies in example, the current test method of the flexible circuit board includes the following steps:
S101, the projection for cutting the flexible circuit board edge, to disconnect first test point and described second Test point;
Wherein, before cutting the signal lead, first test point and second test point pass through corresponding The signal lead is connected;After cutting off the signal lead, first test point and second test point are disconnected.
S102, first test point and second test point are correspondingly connected to the input, output end of ammeter into Row testing current;
It should be noted that by noted earlier, it is known that the signal lead of the cropped area can be, but not limited to be one The signal lead, therefore will form at least a pair of of breakpoint after cutting the cropped area, therefore when carrying out testing current, can be with The both ends of ammeter every a pair of of corresponding first test point of breakpoint is connected to according to actual needs to test with the second test point. But under normal circumstances, can all have tested demand in the signal lead of cropped area design, so cutting a certain institute After stating cropped area, testing current successively can be all carried out between multipair first test point and the second test point with ammeter And data are recorded, are used convenient for the data in later period.
After S103, testing current, bonding pad will be needed between first test point and second test point Domain carries out a tin processing, so that first test point is connected to second test point.
Wherein, described tin processing is between first test point and second test point to join domain Certain point or multiple points carry out a tin processing either to entire between first test point and second test point A tin processing is carried out to join domain.It is understood that only being needed between first test point and second test point Certain point connection, then first test point is just connected with second test point, therefore no matter selects any tin side Formula, as long as finally guaranteeing that first test point is connected to second test point.
Therefore, reset mode of the invention is compared with prior art, it is only necessary to point Xi Chu is carried out between two test points Reason does not need and welds 0 Ohmic resistance in circuit again, and in batch production, the time is short, and also reduces damage electricity The risk on road.
In conclusion the present invention provides the current test method of flexible circuit board and this flexible circuit board, the flexibility Circuit board includes cropped area, signal lead and test zone, and test zone includes the first test point and the second test point, each It is separated between test point by needing join domain, signal lead extends to cropped area and forms close access.In normal shape Under state, the first test point is connected to the second test point by being connected to the signal lead of cropped area, to guarantee display driving IC and panel can work normally;When needing to carry out testing current, corresponding cropped area is cut, keeps corresponding network line disconnected It opens, ammeter both ends is respectively connected to breakpoint and carry out current measurement;It, only need to be by above-mentioned corresponding first test point when restoring circuit And the second join domain that needs between test point carries out a tin processing, and the first test point is made to be connected i.e. with the second test point It can.Therefore, present invention decreases Material Cost and save that the time, circuit risk is small, also simplifies the layout designs of circuit.
The current test method for being provided for the embodiments of the invention flexible circuit board and this flexible circuit board above carries out It is discussed in detail, used herein a specific example illustrates the principle and implementation of the invention, above embodiments Explanation be merely used to help understand technical solution of the present invention and its core concept;Those skilled in the art should manage Solution: it is still possible to modify the technical solutions described in the foregoing embodiments, or to part of technical characteristic into Row equivalent replacement;And these are modified or replaceed, the skill for various embodiments of the present invention that it does not separate the essence of the corresponding technical solution The range of art scheme.

Claims (10)

1. a kind of flexible circuit board characterized by comprising
At least one lug surface, the lug surface are formed in the flexible circuit board edge, and cropped area is defined on described On lug surface;
At least one signal lead, the first section and the second section including being formed in the flexible circuit plate surface, Yi Jiwei Third section between first section and second section, wherein the third section, which is formed in, described cuts area In domain.
2. flexible circuit board as described in claim 1, which is characterized in that further include test zone, including the first test point and Second test point is spaced between first test point and second test point and is formed with to join domain;
First test point connects the first section of the signal lead, and second test point connects the signal lead Second section.
3. flexible circuit board as described in claim 1, which is characterized in that the lug surface is semicircle.
4. flexible circuit board as described in claim 1, which is characterized in that the lug surface is triangle.
5. flexible circuit board as described in claim 1, which is characterized in that be logical sky among the lug surface.
6. flexible circuit board as described in claim 1, which is characterized in that the signal lead is copper foil circuit.
7. a kind of current test method of flexible circuit board as described in claim 1, which comprises the steps of:
S101, the lug surface for cutting the flexible circuit board edge, to disconnect first test point and described second Test point;
S102, the input, output end that first test point and second test point are correspondingly connected to ammeter carry out electricity Current test;
After S103, testing current, by between first test point and second test point need join domain into Row point tin processing, to be connected to first test point and second test point.
8. the method for claim 7, which is characterized in that in the projection table for cutting the prominent flexible circuit board edge Before face, first test point is connected to second test point by the signal lead;Cut off the signal lead it Afterwards, first test point and second test point disconnect.
9. the method for claim 7, which is characterized in that the processing of described tin is to first test point and described the The join domain certain point that needs between two test points carries out a tin processing.
10. the method for claim 7, which is characterized in that the processing of described tin be to first test point with it is described The join domain that entirely needs between second test point carries out a tin processing.
CN201811430668.4A 2018-11-28 2018-11-28 Flexible circuit board and current testing method of flexible circuit board Active CN109618485B (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110501567A (en) * 2019-08-01 2019-11-26 RealMe重庆移动通信有限公司 A kind of power consumption test device

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1652672A (en) * 2005-03-21 2005-08-10 友达光电股份有限公司 Patterned insulation layer and display paned using the same
CN106658947A (en) * 2016-12-30 2017-05-10 上海天马有机发光显示技术有限公司 Flexible circuit board and display panel
CN106793487A (en) * 2016-12-23 2017-05-31 武汉华星光电技术有限公司 Display device and its flexible PCB

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1652672A (en) * 2005-03-21 2005-08-10 友达光电股份有限公司 Patterned insulation layer and display paned using the same
CN106793487A (en) * 2016-12-23 2017-05-31 武汉华星光电技术有限公司 Display device and its flexible PCB
CN106658947A (en) * 2016-12-30 2017-05-10 上海天马有机发光显示技术有限公司 Flexible circuit board and display panel

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110501567A (en) * 2019-08-01 2019-11-26 RealMe重庆移动通信有限公司 A kind of power consumption test device
CN110501567B (en) * 2019-08-01 2022-07-19 RealMe重庆移动通信有限公司 Power consumption testing device

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