CN109599145A - A kind of test method of solid state hard disk, device and computer storage medium - Google Patents
A kind of test method of solid state hard disk, device and computer storage medium Download PDFInfo
- Publication number
- CN109599145A CN109599145A CN201811475938.3A CN201811475938A CN109599145A CN 109599145 A CN109599145 A CN 109599145A CN 201811475938 A CN201811475938 A CN 201811475938A CN 109599145 A CN109599145 A CN 109599145A
- Authority
- CN
- China
- Prior art keywords
- hard disk
- solid state
- state hard
- test
- data block
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C2029/5604—Display of error information
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C29/56008—Error analysis, representation of errors
Landscapes
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
The invention discloses a kind of test method of solid state hard disk, device and computer storage mediums, wherein, this method is before solid state hard disk factory, the test of bad block is carried out for each data block in completely new solid state hard disk, test method is to judge whether the identifier of the first page and last page of current data block is identical as pre-set identifier, if identical, then think that current data block is not bad block, if it is different, then thinking that current data block is bad block, and marking current data block is bad block.It can be seen that, this method can determine there are how much bad blocks in solid state hard disk before solid state hard disk factory, decide whether the sale that can dispatch from the factory so as to the quantity according to bad block, the experience sense of user is improved to a certain extent, also guidance foundation is provided for subsequent production, the solid state hard disk that excessively there is bad block is avoided the occurrence of, production cost is saved.The test device and computer storage medium of solid state hard disk disclosed by the invention are corresponding with the above method, and effect is as above.
Description
Technical field
The present invention relates to solid state hard disk technical fields, more particularly to a kind of test method of solid state hard disk, device and meter
Calculation machine storage medium.
Background technique
With the development of the technologies such as internet, cloud computing, Internet of Things, solid state hard disk is stored as a new generation, extensively quilt
Using.As the lowermost end of data center, solid state hard disk carries the key task of storing data.
Each solid state hard disk saves information using Nand particle, and the quality of Nand particle directly affects solid-state hard disc product
The yield of production.Under normal conditions, solid state hard disk is all one data of multiple pages of compositions using page as minimum memory measurement unit
Therefore, in solid state hard disk block will include multiple data blocks.In storing data, data block can be counted as a whole
According to storage.Due to the capacity for the data that different data block stores, number and technique is made certainly there is difference, and therein each
The quality of page is also and therefore asynchronous variation for a solid state hard disk, guarantees that the availability of each data block is most base
This requirement.
It in the prior art, is all to work hard in processing technology, but process work in order to guarantee the reliability of solid state hard disk
Skill is fine again, and the data block that also not can guarantee in each solid state hard disk is available, that is to say, that solid state hard disk when leaving the factory may
Just having existed certain data blocks is bad block, but and uncertain specifically which bad block.Therefore, when user buys solid state hard disk
Afterwards, it inevitably will appear the not available problem of certain data blocks, cause the experience sense of user when in use poor, even result in data and lose
The serious problems such as mistake.
It can be seen that how to test before factory solid state hard disk, so that it is determined that the time of day of solid state hard disk is
Those skilled in the art's urgent problem to be solved.
Summary of the invention
The object of the present invention is to provide a kind of test method of solid state hard disk, device and computer storage mediums, are used for
Solid state hard disk is tested before factory, so that it is determined that the time of day of solid state hard disk.
In order to solve the above technical problems, the present invention provides a kind of test method of solid state hard disk, go out applied to solid state hard disk
Before factory, comprising:
Choose a data block of the solid state hard disk;
Whether the identifier of the first page and last page that judge current data block is identical as pre-set identifier;
If it is different, then label current data block is bad block, and judge whether there are also remaining datas in the solid state hard disk
Block;
If identical, judge whether there are also remaining data blocks in the solid state hard disk;
If so, the step of then returning to a data block for choosing the solid state hard disk, if it is not, terminating.
Preferably, further includes:
Establish the bad block label table of the solid state hard disk;
Table is marked according to bad block described in the information update labeled as the data block of bad block.
Preferably, further includes:
Institute is established, before end, further includes:
Order is wiped according to read-write, and read-write-wipe test is executed to mark the solid-state hard to the non-bad block in the solid state hard disk
Increase bad block in disk newly;
Wherein, the read-write wipes order and includes read command, write order and wipe order, and the read-write-wipe test includes reading to survey
It tries, write test and wipe test.
Preferably, further includes:
Institute is established, the read command, the write order and wiping order are to execute order parallel.
Preferably, further includes:
Establish institute, further includes:
When executed it is described read test, it is described write test and it is described wipe test after record the bad page of corresponding data block respectively
Address, and count bad block rate.
Preferably, further includes:
Establish institute, further includes:
When the bad block rate reaches threshold value, warning note.
Preferably, further includes:
Establish institute, further includes:
The more wheel read-writes of statistics, which are wiped, orders corresponding test result;
It is tested by heating, order is wiped in the read-write of one wheel of record can reach the test temperature of the test result with letter
Change burn-in test process.
In order to solve the above technical problems, the present invention provides a kind of test device of solid state hard disk, go out applied to solid state hard disk
Before factory, comprising:
Module is chosen, for choosing a data block of the solid state hard disk;
First judgment module, for judge current data block first page and last page identifier whether and in advance
The identifier of setting is identical, if it is different, then triggered mark module and the second judgment module, otherwise trigger described second and judge mould
Block.
The mark module is bad block for marking current data block;
Second judgment module, for judging whether there are also remaining data blocks in the solid state hard disk, if so, then touching
Send out selection module described, if it is not, terminating.
In order to solve the above technical problems, the present invention provides a kind of test device of solid state hard disk, including memory, for depositing
Store up computer program;
Processor, the step of test method of solid state hard disk as mentioned is realized when for executing the computer program.
It is described computer-readable to deposit in order to solve the above technical problems, the present invention provides a kind of computer readable storage medium
Computer program is stored on storage media, the computer program realizes the survey of solid state hard disk as mentioned when being executed by processor
The step of method for testing.
The test method of solid state hard disk provided by the present invention, this method are consolidated before solid state hard disk factory for completely new
Each data block in state hard disk carries out the test of bad block, and test method is the first page and last page for judging current data block
Identifier it is whether identical as pre-set identifier, if identical, then it is assumed that current data block is not bad block, if not
Together, then it is assumed that current data block is bad block, and marking current data block is bad block.It can be seen that this method can be hard in solid-state
It can determine there are how much bad blocks in solid state hard disk before disk factory, decide whether to dispatch from the factory so as to the quantity according to bad block
Sale, improves the experience sense of user to a certain extent, also provides guidance foundation for subsequent production, avoids the occurrence of and excessively deposit
In the solid state hard disk of bad block, production cost is saved.The test device and computer of solid state hard disk provided by the present invention, which store, to be situated between
Matter is corresponding with the above method, and effect is as above.
Detailed description of the invention
In order to illustrate the embodiments of the present invention more clearly, attached drawing needed in the embodiment will be done simply below
It introduces, it should be apparent that, drawings in the following description are only some embodiments of the invention, for ordinary skill people
For member, without creative efforts, it is also possible to obtain other drawings based on these drawings.
Fig. 1 is a kind of flow chart of the test method of solid state hard disk provided in an embodiment of the present invention;
Fig. 2 is the flow chart of the test method of another solid state hard disk provided in an embodiment of the present invention;
Fig. 3 is a kind of flow chart for wiping test method provided in an embodiment of the present invention;
Fig. 4 is a kind of flow chart for writing test method provided in an embodiment of the present invention;
Fig. 5 is a kind of flow chart for reading test method provided in an embodiment of the present invention;
Fig. 6 is a kind of structure chart of the test device of solid state hard disk provided in an embodiment of the present invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, rather than whole embodiments.Based on this
Embodiment in invention, those of ordinary skill in the art are without making creative work, obtained every other
Embodiment belongs to the scope of the present invention.
Core of the invention is to provide test method, device and the computer storage medium of a kind of solid state hard disk, is used for
Solid state hard disk is tested before factory, so that it is determined that the time of day of solid state hard disk.
In order to enable those skilled in the art to better understand the solution of the present invention, with reference to the accompanying drawings and detailed description
The present invention is described in further detail.
Embodiment one
Fig. 1 is a kind of flow chart of the test method of solid state hard disk provided in an embodiment of the present invention.As shown in Figure 1, the party
Before method is applied to solid state hard disk factory, the following steps are specifically included.
S10: a data block of solid state hard disk is chosen.
S11: judge current data block first page and last page identifier whether with pre-set identifier
It is identical, if it is different, then, if identical, entering S13 into S12.
S12: label current data block is bad block, and enters S13.
S13: judging whether there are also remaining data blocks in solid state hard disk, if so, S10 is then returned to, if it is not, knot
Beam.
It should be noted that the solid state hard disk in step S10 need to be it is completely new, without any read-write wipe operate.Step
The data block chosen every time in S10 is different data block, that is to say, that in the test for the bad block for carrying out the same solid state hard disk
In the process, the selection of each data block is unduplicated.In addition, in order to choose conveniently, it can in a certain order, then such as
Fruit is to execute S10 for the first time, then current data block is exactly first data block, is judged after the result of the data block it is necessary to the
Secondary execution S10, then current data block is exactly second data block, is carried out until by each data block in solid state hard disk
The test stated.
For step S11, each data block has its identifier, need to preset (specific method of setting and
Content is identified, the present invention is not construed as limiting, and nor affects on the implementation of this programme), such as FFh, under normal circumstances, in the data block
Each page of identifier should be it is identical, in this step, in order to quickly judge, have chosen first page and last page, because
For, it is generally the case that if first page is identical with the identifier of last page, then other pages of identifier between this page two
It will not be abnormal.Because first page and last page are the same identifiers when presetting identifier, so, for step
For S11, it can be and judge whether first page and last page are identical, if it is not the same, then entering S12, if identical, enter
S13.In specific implementation, the identifier of first page and second page can all be read, then again with pre-set identifier
It is compared;The identifier for either first reading first page, which is compared with pre-set identifier, if
It is not identical, then illustrate S11 judging result be it is no, be directly entered S12, also the unnecessary identifier to last page sentenced
It is disconnected.For the former, if the data block is bad block, the time used in the judgement of the latter is shorter.In conclusion if
The first page of the current data block perhaps identifier of second page or first page and second page and pre-set identifier not phase
Together, then illustrate current data block be exactly bad block, only first page and second page identifier with pre-set identifier phase
Together, just show that current data block is not bad block, i.e., non-bad block.
The effect of step S13 is to judge whether to have carried out the judgement of bad block to all data blocks in solid state hard disk, here
Remaining data block be exactly not by bad block judgement data block.For example, passing through if carrying out the judgement of bad block in sequence
A S10-S12 is executed, then the remaining data block in solid state hard disk is exactly other data blocks in addition to current data block, so
As long as then the judging result of S13 is no, then needing to return at this point, the quantity of the data block in solid state hard disk is not less than 2
S10, that is, the judgement of bad block is carried out to next data block.
By above-mentioned steps are performed a plurality of times, all data blocks of solid state hard disk can be judged, and obtain it includes
Bad block, be capable of determining that solid state hard disk has several bad blocks with this, complete the test of bad block.
The test method of solid state hard disk provided in an embodiment of the present invention, before solid state hard disk factory, for completely new solid-state
Each data block in hard disk carries out the test of bad block, specific test method be judge current data block first page and last
Whether the identifier of page is identical as pre-set identifier, if identical, then it is assumed that and current data block is not bad block, if
It is different, then it is assumed that current data block is bad block, and marking current data block is bad block.It can be seen that this method can be in solid-state
It can determine there are how much bad blocks in solid state hard disk before hard disk factory, decide whether to go out so as to the quantity according to bad block
Factory's sale, improves the experience sense of user to a certain extent, also provides guidance foundation for subsequent production, avoids the occurrence of excessive
There are the solid state hard disks of bad block, save production cost.
Embodiment two
Fig. 2 is the flow chart of the test method of another solid state hard disk provided in an embodiment of the present invention.As shown in Fig. 2,
On the basis of above-described embodiment, the test method of solid state hard disk in the present embodiment further include:
S20: the bad block label table of solid state hard disk is established.
S21: table is marked according to the information update bad block of the data block labeled as bad block.
It should be noted that the form of bad block label table is not construed as limiting, any type of table does not affect the technical program
Implementation.In addition, step S20 and S10-S13 do not have strict sequence, Fig. 2 is a kind of specific application scenarios.
In specific implementation, it can execute a S12 every and be carried out S21, can also all judge in all data blocks
A S21 is executed after complete, is exactly that S20 and S21 are performed after all having judged all data blocks in Fig. 2.
In addition, it is necessary to illustrate, the information of the data block in S21 can be the number of data block, address etc., the present invention
It is not construed as limiting.
The present embodiment can record solid state hard disk by establishing bad block label table and being updated to bad block label table in time
In bad block information, facilitate subsequent lookup.
Embodiment three
It is not carry out any read-write to wipe operation that above-described embodiment, which is to the test of solid state hard disk, that is to say, that is being tested
Cheng Hou, solid state hard disk are also that data were not written.In specific implementation, on the one hand solid state hard disk is the case where there are bad blocks
Before factory due to technique etc. caused by, be on the other hand in use caused by, i.e., solid state hard disk is with the increasing used
Mostly meeting aging can increase some bad blocks newly, so the present embodiment is also newly on the basis of original bad block after solid state hard disk aging
Burn-in test is carried out to solid state hard disk.
As shown in Fig. 2, before end, further includes:
S23: order is wiped according to read-write, read-write-wipe test is executed to mark in solid state hard disk to the non-bad block in solid state hard disk
Increase bad block newly;
Wherein, read-write wipes order and includes read command, write order and wipe order, and read-write-wipe test includes reading test, writing test
It is tested with wiping.
Fig. 3 is a kind of flow chart for wiping test method provided in an embodiment of the present invention.It should be noted that for not being written
The data block for crossing data does not execute wiping test.So not carrying out wiping test to data block when the first run carries out burn-in test.Such as figure
Shown in 3, wiping test method includes:
S30: it receives and wipes order;
S31: wiping test is carried out according to each data block of order control is wiped;
S32: bad page address is determined according to the wiping test result of return with obtain that epicycle wipes test and increases bad block newly, and is saved
Bad block label table is increased newly what is pre-established.
Fig. 4 is a kind of flow chart for writing test method provided in an embodiment of the present invention.As shown in figure 4, writing test method packet
It includes:
S40: write order is received;
S41: each data block is controlled according to write order and carries out writing test;
S42: bad page address is determined to obtain epicycle and write the bad block that increases newly of test according to the test result of writing of return, and is saved
Bad block label table is increased newly what is pre-established.
Fig. 5 is a kind of flow chart for reading test method provided in an embodiment of the present invention.As shown in figure 5, reading test method packet
It includes:
S50: read command is received;
S51: each data block is controlled according to read command and carries out reading test;
S52: bad page address is determined according to the reading test result of return with obtain that epicycle reads test and increases bad block newly, and is saved
Bad block label table is increased newly what is pre-established.
It should be noted that the foundation for judging whether it is bad block is when the bit of read error is more than threshold for reading for test
Value, if it is wrong, but be less than threshold value, then it is not considered as bad block.
In specific implementation in order to accelerate read-write-wipe test, the above read command, write order and wiping order are parallel execution
Order.For example, carrying out reading test to 4 data blocks simultaneously, or writes test or wipe test.
As shown in Fig. 2, preferably embodiment, further includes:
S24: recording the address of the bad page of corresponding data block respectively after having executed reading test, having write test and wiping test,
And count bad block rate.
S25: when bad block rate reaches threshold value, warning note.
It should be noted that being that the epicycle of statistics tests corresponding bad block rate in fact, specifically increasing bad block newly in S24
The ratio of the quantity of the non-bad block of quantity and solid state hard disk when epicycle is tested.In addition, the threshold value in S25 can be according to practical feelings
Condition determines that there are many modes of warning note, and most direct mode is shown on test interface, and the present invention is not construed as limiting.
In addition, since every wheel read-write-wipe test can all be increased newly the quantity of bad block accordingly, it is being embodied
In, the corresponding bad block that increases newly of adjacent two-wheeled same test project can also be compared, when ratio is more than threshold value, then be alarmed
Prompt.For example, the first round reads, test is corresponding to increase the bad block ratio for increasing bad block newly corresponding with the second wheel reading test newly, if should
Ratio is more than threshold value, then warning note.
If the present embodiment carries out the read-write-wipe tests taken turns more, so that it may realize the burn-in test to solid state hard disk, be solid
The state hard disk subsequent use service life provides reference frame.
Example IV
It is understood that being necessarily required to carry out the test mentioned in embodiment three if to carry out burn-in test
More wheel repetitive operations, for example, 10 wheels are carried out, and each round operation will take considerable time, so for entire solid state hard disk
For complete a burn-in test and need to consume the plenty of time.In the present embodiment, in order to shorten the time of burn-in test, by right
Solid state hard disk carries out warming temperature to reach identical test effect.Concrete operation method includes:
The more wheel read-writes of statistics, which are wiped, orders corresponding test result;
It is tested by heating, order is wiped in one wheel read-write of record can reach the test temperature of test result to simplify aging survey
Examination process.
It should be noted that embodiment three just needs to carry out at normal temperature, and the basis of heating is for heating test
It carries out at normal temperature.When having obtained corresponding test temperature, burn-in test directly can be carried out to other hard disks with the temperature,
To which other hard disks no longer need take turns to test more, the testing time has been saved.
The present embodiment improves test environment temperature according to Nand characteristic, shortens number of rounds of tests to reach identical test effect
Fruit, so as to shorten the testing time.
In the above-described embodiments, the test method of solid state hard disk is described in detail, the present invention also provides solid-states
The corresponding embodiment of the test device of hard disk.It should be noted that the present invention from two angles to the embodiment of device part into
Row description, one is the angle based on functional module, another kind is hardware based angle.
Embodiment five
Fig. 6 is a kind of structure chart of the test device of solid state hard disk provided in an embodiment of the present invention.As shown in Figure 6, comprising:
Module 10 is chosen, for choosing a data block of solid state hard disk.
First judgment module 11, for judge current data block first page and last page identifier whether and in advance
The identifier being first arranged is identical, if it is different, then triggered mark module 12 and the second judgment module 13, otherwise trigger the second judgement
Module 13.
Mark module 12 is bad block for marking current data block.
Second judgment module 13, for judging whether there are also remaining data blocks in solid state hard disk, if so, then triggering selection
Module, if it is not, terminating.
Preferably embodiment, the test device of solid state hard disk further include:
Module is established, for establishing the bad block label table of solid state hard disk;
Update module, for marking table according to the information update bad block of the data block labeled as bad block.
Preferably embodiment, further includes:
It increases bad block mark module newly, read-write-wipe test is executed to the non-bad block in solid state hard disk for wiping order according to read-write
Bad block is increased in solid state hard disk newly to mark;
Wherein, read-write wipes order and includes read command, write order and wipe order, and read-write-wipe test includes reading test, writing test
It is tested with wiping.
Preferably embodiment, further includes:
First statistical module, for recording corresponding data block respectively after having executed and having read test, write test and wipe test
Bad page address, and count bad block rate.
Preferably embodiment, further includes:
Alarm module, for when bad block rate reaches threshold value, warning note.
Preferably embodiment, further includes:
Second statistical module wipes the corresponding test result of order for counting more wheel read-writes;
Logging modle, for by heating test, order is wiped in the one wheel read-write of record can to reach the test result
Test temperature to simplify burn-in test process.
Since the embodiment of device part is corresponded to each other with the embodiment of method part, the embodiment of device part is asked
Referring to the description of the embodiment of method part, wouldn't repeat here.
The test device of solid state hard disk provided in an embodiment of the present invention, before solid state hard disk factory, for completely new solid-state
Each data block in hard disk carries out the test of bad block, specific test process be judge current data block first page and last
Whether the identifier of page is identical as pre-set identifier, if identical, then it is assumed that and current data block is not bad block, if
It is different, then it is assumed that current data block is bad block, and marking current data block is bad block.It can be seen that the present apparatus can be in solid-state
It can determine there are how much bad blocks in solid state hard disk before hard disk factory, decide whether to go out so as to the quantity according to bad block
Factory's sale, improves the experience sense of user to a certain extent, also provides guidance foundation for subsequent production, avoids the occurrence of excessive
There are the solid state hard disks of bad block, save production cost.
Embodiment six
The test device of solid state hard disk provided in this embodiment, including memory, for storing computer program;
Processor realizes the survey of the solid state hard disk as described in one-embodiment of embodiment three when for executing computer program
The step of method for testing.
Since the embodiment of device part is corresponded to each other with the embodiment of method part, the embodiment of device part is asked
Referring to the description of the embodiment of method part, wouldn't repeat here.In some embodiments of the invention, processor and memory
It can be connected by bus or other means.
The test device of solid state hard disk provided in an embodiment of the present invention, including processor and memory, processor are executing
It, can be before solid state hard disk factory, for each data in completely new solid state hard disk when the computer program of memory storage
Block carries out the test of bad block, and specific test process is to judge whether the identifier of the first page and last page of current data block is equal
It is identical as pre-set identifier, if identical, then it is assumed that current data block is not bad block, if it is different, then thinking current
Data block is bad block, and marking current data block is bad block.It can be seen that the present apparatus can solid state hard disk factory before can be true
Determine the presence of how much bad blocks in solid state hard disk, decides whether the sale that can dispatch from the factory so as to the quantity according to bad block, in certain journey
The experience sense of user is improved on degree, is also provided guidance foundation for subsequent production, is avoided the occurrence of the solid-state that excessively there is bad block
Hard disk saves production cost.
Embodiment seven
Finally, being stored with meter on computer readable storage medium the present invention also provides a kind of computer readable storage medium
Calculation machine program realizes the test method of the solid state hard disk such as one-embodiment of embodiment three when computer program is executed by processor
The step of.
It is understood that if the method in above-described embodiment is realized in the form of SFU software functional unit and as independence
Product when selling or using, can store in a computer readable storage medium.Based on this understanding, of the invention
Technical solution substantially all or part of the part that contributes to existing technology or the technical solution can be in other words
It is expressed in the form of software products, which is stored in a storage medium, and it is each to execute the present invention
The all or part of the steps of embodiment the method.And storage medium above-mentioned includes: USB flash disk, mobile hard disk, read-only memory
(Read-Only Memory, ROM), random access memory (Random Access Memory, RAM), magnetic or disk
Etc. the various media that can store program code.
Computer readable storage medium provided in an embodiment of the present invention, is stored with computer program, which is performed
The test of bad block can be carried out for each data block in completely new solid state hard disk before solid state hard disk factory, it is specific to test
Process is to judge whether the identifier of the first page and last page of current data block is identical as pre-set identifier, such as
Fruit is identical, then it is assumed that current data block is not bad block, if it is different, then thinking that current data block is bad block, and marks current number
It is bad block according to block.It can be seen that this method can determine there are how much bad blocks in solid state hard disk before solid state hard disk factory,
Decide whether the sale that can dispatch from the factory so as to the quantity according to bad block, improve the experience sense of user to a certain extent,
Guidance foundation is provided for subsequent production, the solid state hard disk that excessively there is bad block is avoided the occurrence of, saves production cost.
The test method of solid state hard disk provided by the present invention, device and computer storage medium have been carried out in detail above
It introduces.Each embodiment is described in a progressive manner in specification, and the highlights of each of the examples are implement with other
The difference of example, the same or similar parts in each embodiment may refer to each other.For the device disclosed in the embodiment,
Since it is corresponded to the methods disclosed in the examples, so being described relatively simple, related place is referring to method part illustration
It can.It should be pointed out that for those skilled in the art, without departing from the principle of the present invention, may be used also
With several improvements and modifications are made to the present invention, these improvements and modifications also fall within the scope of protection of the claims of the present invention.
It should also be noted that, in the present specification, relational terms such as first and second and the like be used merely to by
One entity or operation are distinguished with another entity or operation, without necessarily requiring or implying these entities or operation
Between there are any actual relationship or orders.Moreover, the terms "include", "comprise" or its any other variant meaning
Covering non-exclusive inclusion, so that the process, method, article or equipment for including a series of elements not only includes that
A little elements, but also including other elements that are not explicitly listed, or further include for this process, method, article or
The intrinsic element of equipment.In the absence of more restrictions, the element limited by sentence "including a ...", is not arranged
Except there is also other identical elements in the process, method, article or apparatus that includes the element.
Claims (10)
1. a kind of test method of solid state hard disk, which is characterized in that before being applied to solid state hard disk factory, comprising:
Choose a data block of the solid state hard disk;
Whether the identifier of the first page and last page that judge current data block is identical as pre-set identifier;
If it is different, then label current data block is bad block, and judge whether there are also remaining data blocks in the solid state hard disk;
If identical, judge whether there are also remaining data blocks in the solid state hard disk;
If so, the step of then returning to a data block for choosing the solid state hard disk, if it is not, terminating.
2. the test method of solid state hard disk according to claim 1, which is characterized in that further include:
Establish the bad block label table of the solid state hard disk;
Table is marked according to bad block described in the information update labeled as the data block of bad block.
3. the test method of solid state hard disk according to claim 1 or 2, which is characterized in that before end, further includes:
Order is wiped according to read-write, and read-write-wipe test is executed to mark in the solid state hard disk to the non-bad block in the solid state hard disk
Increase bad block newly;
Wherein, the read-write wipes order and includes read command, write order and wipe order, and the read-write-wipe test includes reading test, writing
Test and wiping test.
4. the test method of solid state hard disk according to claim 3, which is characterized in that the read command, the write order
It is to execute order parallel with wiping order.
5. the test method of solid state hard disk according to claim 3, which is characterized in that further include:
When executed it is described read test, it is described write test and it is described wipe test after record respectively corresponding data block bad page ground
Location, and count bad block rate.
6. the test method of solid state hard disk according to claim 5, which is characterized in that further include:
When the bad block rate reaches threshold value, warning note.
7. the test method of solid state hard disk according to claim 3, which is characterized in that further include:
The more wheel read-writes of statistics, which are wiped, orders corresponding test result;
By heating test, the read-write of one wheel of record, which is wiped, orders the test temperature that can reach the test result old to simplify
Change test process.
8. a kind of test device of solid state hard disk, which is characterized in that before being applied to solid state hard disk factory, comprising:
Module is chosen, for choosing a data block of the solid state hard disk;
First judgment module, for judge current data block first page and last page identifier whether with preset
Identifier it is identical, if it is different, then triggered mark module and the second judgment module, otherwise trigger second judgment module.
The mark module is bad block for marking current data block;
Second judgment module, for judging whether there are also remaining data blocks in the solid state hard disk, if so, then triggering institute
Selection module is stated, if it is not, terminating.
9. a kind of test device of solid state hard disk, which is characterized in that including memory, for storing computer program;
Processor realizes the survey of solid state hard disk as described in any one of claim 1 to 7 when for executing the computer program
The step of method for testing.
10. a kind of computer readable storage medium, which is characterized in that be stored with computer on the computer readable storage medium
Program, the computer program realize the test of solid state hard disk as described in any one of claim 1 to 7 when being executed by processor
The step of method.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201811475938.3A CN109599145A (en) | 2018-12-04 | 2018-12-04 | A kind of test method of solid state hard disk, device and computer storage medium |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201811475938.3A CN109599145A (en) | 2018-12-04 | 2018-12-04 | A kind of test method of solid state hard disk, device and computer storage medium |
Publications (1)
Publication Number | Publication Date |
---|---|
CN109599145A true CN109599145A (en) | 2019-04-09 |
Family
ID=65961106
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201811475938.3A Pending CN109599145A (en) | 2018-12-04 | 2018-12-04 | A kind of test method of solid state hard disk, device and computer storage medium |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN109599145A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111985010A (en) * | 2020-08-20 | 2020-11-24 | 深圳忆联信息系统有限公司 | Interception verification method and device for notebook hard disk, computer equipment and storage medium |
CN112331252A (en) * | 2020-12-14 | 2021-02-05 | 深圳市芯天下技术有限公司 | Method and device for automatically marking bad blocks of Nand flash memory, storage medium and terminal |
WO2023087624A1 (en) * | 2021-11-17 | 2023-05-25 | 苏州浪潮智能科技有限公司 | Data inspection method and apparatus for solid-state drive, computer device, and storage medium |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105702300A (en) * | 2016-01-11 | 2016-06-22 | 浙江大学 | NAND Flash fault tolerant system based on FPGA (Field Programmable Gate Array) |
CN106681936A (en) * | 2016-12-29 | 2017-05-17 | 记忆科技(深圳)有限公司 | Bad block management method for NANDFLASH |
CN106920576A (en) * | 2017-03-22 | 2017-07-04 | 惠州佰维存储科技有限公司 | A kind of method and system of inspection Nand Flash mass |
CN106981315A (en) * | 2017-03-10 | 2017-07-25 | 记忆科技(深圳)有限公司 | A kind of solid state hard disc bad block knows method for distinguishing |
CN107992268A (en) * | 2017-11-24 | 2018-05-04 | 郑州云海信息技术有限公司 | A kind of method and relevant apparatus of bad block mark |
-
2018
- 2018-12-04 CN CN201811475938.3A patent/CN109599145A/en active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105702300A (en) * | 2016-01-11 | 2016-06-22 | 浙江大学 | NAND Flash fault tolerant system based on FPGA (Field Programmable Gate Array) |
CN106681936A (en) * | 2016-12-29 | 2017-05-17 | 记忆科技(深圳)有限公司 | Bad block management method for NANDFLASH |
CN106981315A (en) * | 2017-03-10 | 2017-07-25 | 记忆科技(深圳)有限公司 | A kind of solid state hard disc bad block knows method for distinguishing |
CN106920576A (en) * | 2017-03-22 | 2017-07-04 | 惠州佰维存储科技有限公司 | A kind of method and system of inspection Nand Flash mass |
CN107992268A (en) * | 2017-11-24 | 2018-05-04 | 郑州云海信息技术有限公司 | A kind of method and relevant apparatus of bad block mark |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111985010A (en) * | 2020-08-20 | 2020-11-24 | 深圳忆联信息系统有限公司 | Interception verification method and device for notebook hard disk, computer equipment and storage medium |
CN112331252A (en) * | 2020-12-14 | 2021-02-05 | 深圳市芯天下技术有限公司 | Method and device for automatically marking bad blocks of Nand flash memory, storage medium and terminal |
WO2023087624A1 (en) * | 2021-11-17 | 2023-05-25 | 苏州浪潮智能科技有限公司 | Data inspection method and apparatus for solid-state drive, computer device, and storage medium |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN112331253B (en) | Chip testing method, terminal and storage medium | |
CN109599145A (en) | A kind of test method of solid state hard disk, device and computer storage medium | |
CN103392208A (en) | Semiconductor storage apparatus and method for controlling semiconductor storage apparatus | |
CN110008129B (en) | Reliability test method, device and equipment for storage timing snapshot | |
CN102568522A (en) | Hardware performance test method and device | |
CN102004693A (en) | System performance test method and device | |
CN105469834A (en) | Testing method for embedded flash memory | |
CN105068936A (en) | Method and device for testing stability of software | |
CN111209148A (en) | Method and system for testing storage stability of server | |
CN112416670B (en) | Hard disk testing method, device, server and storage medium | |
CN105573676A (en) | Method for verifying data consistency in storage system | |
CN107256723A (en) | A kind of method of testing and device for storing product | |
CN106844166B (en) | Data processing method and device | |
CN113849388B (en) | Test method and device, electronic equipment and storage medium | |
CN112000536A (en) | Memory detection method, system and related equipment | |
CN105183583A (en) | Method for data reconstruction of disk array, and disk array system | |
CN106708445B (en) | Link selecting method and device | |
CN116884469B (en) | Flash memory performance detection method, device, equipment and medium | |
CN109491866A (en) | Monitor method, apparatus, terminal and the computer readable storage medium of storage hardware | |
CN103824600A (en) | Memory test method and device | |
CN109582527A (en) | Storage server and its solid-state disk service life monitoring method | |
CN110444244A (en) | Store the test device of equipment read error error correcting capability | |
CN110532139A (en) | Method for early warning and device | |
CN113625957B (en) | Method, device and equipment for detecting hard disk faults | |
CN114764596A (en) | Method and device for prolonging hard disk service life, computer equipment and storage medium |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
RJ01 | Rejection of invention patent application after publication | ||
RJ01 | Rejection of invention patent application after publication |
Application publication date: 20190409 |