CN107992268A - A kind of method and relevant apparatus of bad block mark - Google Patents
A kind of method and relevant apparatus of bad block mark Download PDFInfo
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- CN107992268A CN107992268A CN201711194987.5A CN201711194987A CN107992268A CN 107992268 A CN107992268 A CN 107992268A CN 201711194987 A CN201711194987 A CN 201711194987A CN 107992268 A CN107992268 A CN 107992268A
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- data block
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/06—Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
- G06F3/0601—Interfaces specially adapted for storage systems
- G06F3/0602—Interfaces specially adapted for storage systems specifically adapted to achieve a particular effect
- G06F3/0614—Improving the reliability of storage systems
- G06F3/0616—Improving the reliability of storage systems in relation to life time, e.g. increasing Mean Time Between Failures [MTBF]
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/06—Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
- G06F3/0601—Interfaces specially adapted for storage systems
- G06F3/0628—Interfaces specially adapted for storage systems making use of a particular technique
- G06F3/0638—Organizing or formatting or addressing of data
- G06F3/064—Management of blocks
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/06—Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
- G06F3/0601—Interfaces specially adapted for storage systems
- G06F3/0668—Interfaces specially adapted for storage systems adopting a particular infrastructure
- G06F3/0671—In-line storage system
- G06F3/0673—Single storage device
- G06F3/0679—Non-volatile semiconductor memory device, e.g. flash memory, one time programmable memory [OTP]
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- Techniques For Improving Reliability Of Storages (AREA)
Abstract
The invention discloses a kind of method of bad block mark, and wrong parameter, standard parameter and the weight parameter for corresponding to different operating are pre-set for different types of data block.When performing operation generation mistake to target data block, the current wrong parameter of the target data block can be determined according to the weight parameter of the correspondence operation and the wrong parameter of the target data block prestored, bad block is labeled as when wrong parameter is not less than pre-set standard parameter, then by the target data block.Since different types of data block may have different susceptibilitys for different operations, the data block to have failed can be accurately filtered out by the above method and the data block is labeled as bad block, so as to effectively reduce the depletion rate of data block, increase the service life of flash memory.The equipment of device, a kind of bad block mark present invention also offers a kind of bad block mark and a kind of computer-readable recording medium, equally with above-mentioned beneficial effect.
Description
Technical field
The present invention relates to storage device field, method, a kind of dress of bad block mark more particularly to a kind of bad block mark
Put, a kind of bad block mark equipment and a kind of computer-readable recording medium.
Background technology
As science and technology is constantly progressive in recent years, the application of solid state hard disc is more and more extensive.And at this stage, it is usually used
Flash memory is used as solid state hard disc.
For flash memory, it is generally the case that the base unit that read operation and write operation are carried out to flash memory is page (page),
The base unit for carrying out wiping operation to flash memory is data block (block).And a flash memory usually has multiple cores (die), and
Multiple data blocks have been generally included in each core, multiple pages have been generally included in each data block.Typically will at this stage
Multiple pages are organized together in the form of page group (super page) and are managed, while by multiple data blocks with data chunk
The form of (super block), which organizes together, to be managed.When some data block can not be operated specifically in flash memory
When, it is necessary to the data block is labeled as bad block, so as to avoid data storage failure, avoid loss of data.
In the prior art, it is when some data block either wipes behaviour in execution read operation, write operation under normal conditions
When making to occur mistake, the data block is just labeled as bad block.
If but using bad block labeling method of the prior art, can usually cause the depletion rate of data block compared with
Greatly, so that the service life of flash memory can be reduced.
The content of the invention
The object of the present invention is to provide a kind of method of bad block mark, can effectively reduce the depletion rate of data block；This
The another object of invention is to provide a kind of relevant apparatus of bad block mark, can increase the service life of flash memory.
In order to solve the above technical problems, the present invention provides a kind of method of bad block mark, the described method includes：
When performing operation generation mistake to target data block, according to the weight parameter of the correspondence operation with prestoring
The wrong parameter of the target data block determine the current wrong parameter of the target data block；
When the wrong parameter is not less than pre-set standard parameter, the target data block is labeled as bad block.
Optionally, the operation includes following any one or any combination：
Read operation, write operation, wipe operation.
Optionally, it is described when performing operation generation mistake to target data block, joined according to the weight of the correspondence operation
The wrong parameter of the target data block of the number with prestoring determines that the current wrong parameter of the target data block includes：
When performing read operation generation mistake to the target data block, reading behaviour is performed again to the target data block
Make；
When performing read operation generation mistake again to the target data block, joined according to the weight of the correspondence read operation
The wrong parameter of the target data block of the number with prestoring determines the current wrong parameter of the target data block.
Optionally, when performing read operation generation mistake to target data block, the method further includes：
The data stored in the target data block are recovered.
Present invention also offers a kind of device of bad block mark, described device includes：
Weight processing module：For when to target data block perform operation occur mistake when, according to the correspondence operation
The wrong parameter of weight parameter and the target data block prestored determines the current mistake ginseng of the target data block
Number；
Mark module：For when the wrong parameter is not less than pre-set standard parameter, by the target data
Block is labeled as bad block.
Optionally, the operation includes following any one or any combination：
Read operation, write operation, wipe operation.
Optionally, the weight processing module includes：
Unit is reprocessed in read operation：For when to the target data block perform read operation occur mistake when, to the mesh
Mark data block performs read operation again；
Read operation weight processing unit：When performing read operation generation mistake again to the target data block, according to right
The weight parameter of the read operation is answered to determine the target data with the wrong parameter of the target data block prestored
The current wrong parameter of block.
Optionally, described device further includes：
Read data recovery module：For when to the target data block perform read operation occur mistake when, by target data
Block is recovered.
Present invention also offers a kind of equipment of bad block mark, including：
Memory：For storing computer program；
Processor：The step for the method that bad block described in any of the above-described marks is realized during for performing the computer program
Suddenly.
Present invention also offers a kind of computer-readable recording medium, meter is stored with the computer-readable recording medium
The step of calculation machine program, the computer program realizes the method that bad block described in any of the above-described marks when being executed by processor.
A kind of method of bad block mark provided by the present invention, wrong ginseng is pre-set for different types of data block
The weight parameter of number, standard parameter and corresponding different operating., can be with when performing operation to target data block mistake occurring
The target is determined according to the wrong parameter of the weight parameter of the correspondence operation and the target data block prestored
The current wrong parameter of data block, when wrong parameter is not less than pre-set standard parameter, then by the target data block
Labeled as bad block.Since different types of data block there may be different susceptibilitys for different operations, pass through above-mentioned side
Method can accurately filter out the data block to have failed and the data block is labeled as bad block, so as to effectively reduce data block
Depletion rate, increases the service life of flash memory.
The equipment of device, a kind of bad block mark present invention also offers a kind of bad block mark and a kind of computer-readable deposit
Storage media, equally with above-mentioned beneficial effect, is no longer repeated herein.
Brief description of the drawings
, below will be to embodiment or existing for the clearer explanation embodiment of the present invention or the technical solution of the prior art
Attached drawing is briefly described needed in technology description, it should be apparent that, drawings in the following description are only this hair
Some bright embodiments, for those of ordinary skill in the art, without creative efforts, can be with root
Other attached drawings are obtained according to these attached drawings.
A kind of flow chart for bad block labeling method that Fig. 1 is provided by the embodiment of the present invention；
A kind of flow chart for specific bad block labeling method that Fig. 2 is provided by the embodiment of the present invention；
A kind of structure diagram for bad block labelling apparatus that Fig. 3 is provided by the embodiment of the present invention；
A kind of structure diagram for bad block marking arrangement that Fig. 4 is provided by the embodiment of the present invention.
Embodiment
The core of the present invention is to provide a kind of method of bad block mark.In the prior art, it is when a certain under normal conditions
The data block is just labeled as bad block by a data block when performing read operation, write operation either wiping operation generation mistake.But
For different types of data block, different types of data block may have different susceptibilitys for different operations,
Such as some data blocks, may be insensitive for read operation, it is possible to which multiple read operation mistake, which occurs, can just think
The data block is bad block.Accordingly for some data blocks, it is also possible to insensitive etc. for wiping operation and write operation.If
For different types of data block, just the data block can be made labeled as bad block when performing a certain operation and mistake occurring
It is larger to obtain the depletion rate of data block, so that the service life of flash memory can be reduced.
And a kind of method of bad block mark provided by the present invention, pre-set mistake for different types of data block
The weight parameter of parameter, standard parameter and corresponding different operating., can when performing operation generation mistake to target data block
The mesh is determined with the wrong parameter of the weight parameter according to the correspondence operation and the target data block prestored
The current wrong parameter of data block is marked, when wrong parameter is not less than pre-set standard parameter, then by the target data
Block is labeled as bad block.Since different types of data block may have different susceptibilitys for different operations, by above-mentioned
Method can accurately filter out the data block to have failed and the data block is labeled as bad block, so as to effectively reduce data block
Depletion rate, increase the service life of flash memory.
In order to make those skilled in the art more fully understand the present invention program, with reference to the accompanying drawings and detailed description
The present invention is described in further detail.Obviously, described embodiment is only part of the embodiment of the present invention, rather than
Whole embodiments.Based on the embodiments of the present invention, those of ordinary skill in the art are not making creative work premise
Lower all other embodiments obtained, belong to the scope of protection of the invention.
Please refer to Fig.1, a kind of flow chart for bad block labeling method that Fig. 1 is provided by the embodiment of the present invention, this method bag
Include：
S101：When performing operation generation mistake to target data block, according to the weight parameter of respective operations with depositing in advance
The wrong parameter of the target data block of storage determines the current wrong parameter of target data block.
In embodiments of the present invention, for different types of target data block, wrong parameter, standard ginseng can be pre-set
The weight parameter of number and corresponding different operating.The operation has generally included read operation, write operation and has wiped operation, that is, exists
In the embodiment of the present invention, the action type of aforesaid operations has generally included reading and writing, has wiped three kinds of action types.Come for data block
Say, can all carry out read operation, write operation under normal conditions and wipe operation, certain some data blocks can only may perform above-mentioned
Certain two kinds operations of three kinds of operations, or a certain operation.In embodiments of the present invention, may specifically be performed for data block
Action type is simultaneously not specifically limited.Certainly, except above-mentioned three kinds for the operation of data block, it is also possible to which data block is held
The other operations of row, are equally not specifically limited for the particular type of operation in embodiments of the present invention.
Since the data block in flash memory is typically to organize together to be managed in the form of data chunk, so in this hair
It is that information is stored in units of data chunk under normal conditions in bright embodiment.The information includes the bad of the corresponding data chunk
The wrong parameter of different pieces of information block, standard parameter, weight parameter etc. in block table and corresponding data block group.Certainly for whole
For flash memory, the standard parameter of each data block and the weight parameter of different operating may be identical in corresponding flash memory.
Above-mentioned target data block is the data block referred in flash memory, and the present invention is carried out primarily directed to a data block
Introduce, certain present invention can be generalized to multiple data blocks.It is above-mentioned operation is performed to target data block mistake occurs popular say
It is exactly the operation failure, is not performed.Such as read operation occurs mistake and typically refers to data not from target data block
Read out；Write operation occurs mistake and refers to not write data into target data block；Operation generation mistake is wiped to refer to incite somebody to action
The data erasing stored in target data block.
For target data block, the wrong parameter of the corresponding target data block has an initial value, when right every time
, can be according to the weight parameter and target data of the operation of the corresponding generation mistake when target data block performs operation generation mistake
The wrong parameter of block determines the current wrong parameter of target data block, and current wrong parameter can be by before under normal conditions
Wrong parameter covers, i.e., the wrong parameter that target data block is corresponded to during afterwards is this definite target component.
Under normal conditions, determine the method for current wrong parameter for will the corresponding operation that mistake occurs weight parameter with
The wrong parameter of the target data block prestored is added, to obtain the current wrong parameter of target data block.Certainly, in this hair
In bright embodiment, current wrong parameter can also be determined in other way, such as by by weight parameter and in advance
Wrong parameter multiplication of storage etc., the detailed process in relation to determining wrong parameter do not do specific limit in embodiments of the present invention
It is fixed.
In embodiments of the present invention, when mistake does not occur to target data block execution operation, it is only necessary to continue to execute this
Operation.
S102：When wrong parameter is not less than pre-set standard parameter, target data block is labeled as bad block.
In this step, when the wrong parameter is not less than pre-set standard parameter, i.e., when wrong parameter is more than
When being either equal to the standard parameter, target data block can be labeled as bad block.The mode for marking bad block is typically by mesh
The information that mark data block has been damaged is stored among above-mentioned bad block table.
In embodiments of the present invention, when wrong parameter is less than pre-set standard parameter, it is not necessary to perform other behaviour
Make.
Above-mentioned weight parameter, wrong parameter and standard parameter are typically the form of numeral.If for example, target data block pair
It is very sensitive in read operation, and for write operation and wipe operation it is less sensitive if, being typically for target data block will be initial
Wrong parameter be set to 0, and the weight parameter of corresponding read operation is set to 1, corresponding write operation is wiped into the weight operated with corresponding
Parameter is respectively set to 0.5, while standard parameter is arranged to 1.When performing wiping operation generation mistake to target data block, just
The wrong parameter of target data block is added with the corresponding weight parameter for wiping operation, at this time the current wrong parameter of target data block
For 0.5, but the wrong parameter of target data block is smaller than standard parameter at this time, at this time can't be labeled as target data block
Bad block.When performing read operation generation mistake again to target data block, just by the wrong parameter of target data block and corresponding reading
The weight parameter of operation is added, and the current wrong parameter of target data block is 1.5 at this time so that the wrong parameter of target data block
More than standard parameter, target data block can be labeled as bad block at this time.
The design parameter occurred in above-mentioned paragraph only plays the role of illustration, is not the tool to the embodiment of the present invention
Body limits.In embodiments of the present invention, the concrete numerical value for weight parameter, wrong parameter and standard parameter is not done specifically
Limit.
A kind of method for bad block mark that the embodiment of the present invention is provided, pre-sets for different types of data block
The weight parameter of wrong parameter, standard parameter and corresponding different operating.Mistake occurs when performing operation to target data block
When, institute can be determined according to the weight parameter of the correspondence operation and the wrong parameter of the target data block prestored
The current wrong parameter of target data block is stated, when wrong parameter is not less than pre-set standard parameter, then by the target
Data block is labeled as bad block.Since different types of data block there may be different susceptibilitys for different operations, pass through
The above method can accurately filter out the data block to have failed and the data block is labeled as bad block, so as to effectively reduce number
According to the depletion rate of block, increase the service life of flash memory.
There is particularity since read operation is operated compared to write operation with wiping, i.e., with the relevant data of write operation in upper strata master
There is backup in control, wiping operation only needs to delete related data, but is only stored in flash memory with the relevant data of read operation
In, read operation is compared to write operation and wipes for operation, occurs not backing up with the relevant data of read operation during mistake, this meeting
Cause the loss of data；There is mistake and does not have continuity in read operation at the same time, i.e., continuously carries out read operation just to target data block
Data may be read out from target data block.It is usually the case that when mistake occurs for read operation, others can be passed through
Whether mode test-target data block is damaged.Detailed content refer to following inventive embodiments.
Please refer to Fig.2, a kind of flow chart for specific bad block labeling method that Fig. 2 is provided by the embodiment of the present invention should
Method includes：
S201：When performing read operation generation mistake to target data block, read operation is performed again to target data block.
Due to the particularity of read operation, the possibility that mistake occurs in read operation does not have continuity.In this step, when reading is grasped
When making to occur mistake, read operation can be carried out to target data block again, determine whether target data block can be normal with this
Work.
S202：When performing read operation generation mistake again to target data block, according to the weight parameter of corresponding read operation
The wrong parameter of target data block with prestoring determines the current wrong parameter of target data block.
In embodiments of the present invention, when mistake does not occur for execution read operation herein, it is only necessary to continue to execute read operation i.e.
Can.
When performing read operation generation mistake again, it was demonstrated that can not be read during this read operation from target data block
Take out data.At this time can be according to the wrong parameter of the weight parameter renewal target data block of corresponding read operation, i.e., according to correspondence
The wrong parameter of the weight parameter of read operation and the target data block prestored determines the current mistake ginseng of target data block
Number.Specifically definite step is described in detail in foregoing invention embodiment, is no longer repeated herein.
S203：The data stored in target data block are recovered.
Under normal conditions, in a flash memory all can there are the storage means of data redundancy.Common data redundancy is included in number
According to parity data are added in block group, the parity data are the numbers that will be stored in multiple data blocks in a data chunk
According to progress XOR operation, a data being calculated.Parity data are added in corresponding data chunk under normal conditions,
Parity data have the function that data redundancy.When mistake occurs for the data that some data block stores in a data chunk
When, can be by the data and parity data that are stored in other data block in data chunk, to recover that mistake occurs
The data stored in data block.
Certainly, in addition to carrying out this mode of data redundancy above by addition parity data are this, can also lead to
Cross other modes and carry out data redundancy and recovery.Mode in relation to specific data redundancy and recovery is implemented in the present invention
It is not specifically limited in example.
S204：When wrong parameter is not less than pre-set standard parameter, target data block is labeled as bad block.
This step is roughly the same with foregoing invention embodiment S102, and detailed content refer to foregoing invention embodiment, herein
No longer repeated.
A kind of method for specific bad block mark that the embodiment of the present invention is provided, two are carried out for the particularity of read operation
Secondary read operation is to confirm whether this read operation can smoothly perform, while when mistake occurs for read operation, by will be with read operation
Associated data are recovered the integrality of the data to ensure to store in flash memory.
A kind of bad block labelling apparatus provided in an embodiment of the present invention is introduced below, bad block mark dress described below
Reference can be corresponded with above-described bad block labeling method by putting.
The structure diagram for a kind of bad block labelling apparatus that Fig. 3 is provided by the embodiment of the present invention, with reference to figure, bad block mark dress
Putting to include：
Weight processing module 100：For when to target data block perform operation occur mistake when, according to the correspondence operation
Weight parameter and the wrong parameter of the target data block that prestores determine the current mistake of the target data block
Parameter.
Mark module 200：For when the wrong parameter is not less than pre-set standard parameter, by the number of targets
Bad block is labeled as according to block.
In embodiments of the present invention, the operation can include following any one or any combination：
Read operation, write operation, wipe operation.
In embodiments of the present invention, weight processing module can include：
Unit 101 is reprocessed in read operation：For when to the target data block perform read operation occur mistake when, to described
Target data block performs read operation again.
Read operation weight processing unit 102：When performing read operation generation mistake again to the target data block, according to
The weight parameter of the corresponding read operation and the wrong parameter of the target data block prestored determine the number of targets
According to the current wrong parameter of block.
In embodiments of the present invention, described device can also include：
Read data recovery module 300：For when to the target data block perform read operation occur mistake when, by number of targets
Recovered according to block.
The bad block labelling apparatus of the present embodiment is used for realization foregoing bad block labeling method, therefore in bad block labelling apparatus
The embodiment part of the visible bad block labeling method hereinbefore of embodiment, for example, weight processing module 100, marks mould
Block 200 is respectively used to realize step S101 and S102 in above-mentioned bad block labeling method, so, its embodiment is referred to
The description of corresponding various pieces embodiment, details are not described herein.
A kind of equipment of bad block mark provided in an embodiment of the present invention is introduced below, bad block mark described below
Equipment can correspond reference with above-described bad block labeling method and bad block labelling apparatus.
The structure diagram for a kind of bad block marking arrangement that Fig. 4 is provided by the embodiment of the present invention, with reference to Fig. 4, the bad block mark
Note equipment can include processor 400 and memory 500.
The memory 500 is used to store computer program；When the processor 400 is used to perform the computer program
Realize the control method described in foregoing invention embodiment.
Processor 400 is used to install the control device described in above-mentioned inventive embodiments in the control device of the present embodiment,
Simultaneous processor 400 is combined the control method that can be realized described in foregoing invention embodiment with memory 500.Therefore control
The embodiment part of the visible control method hereinbefore of embodiment in equipment, its embodiment are referred to phase
The description for the various pieces embodiment answered, details are not described herein.
Present invention also offers a kind of computer-readable recording medium, meter is stored with the computer-readable recording medium
Calculation machine program, the computer program realize the side of the bad block mark described in foregoing invention embodiment when being executed by processor
Method.Remaining content is referred to the prior art, no longer carries out expansion description herein.
Each embodiment is described by the way of progressive in this specification, what each embodiment stressed be with it is other
The difference of embodiment, between each embodiment same or similar part mutually referring to.For dress disclosed in embodiment
For putting, since it is corresponded to the methods disclosed in the examples, so description is fairly simple, related part is referring to method part
Explanation.
Professional further appreciates that, with reference to each exemplary unit of the embodiments described herein description
And algorithm steps, can be realized with electronic hardware, computer software or the combination of the two, in order to clearly demonstrate hardware and
The interchangeability of software, generally describes each exemplary composition and step according to function in the above description.These
Function is performed with hardware or software mode actually, application-specific and design constraint depending on technical solution.Specialty
Technical staff can realize described function to each specific application using distinct methods, but this realization should not
Think beyond the scope of this invention.
Can directly it be held with reference to the step of method or algorithm that the embodiments described herein describes with hardware, processor
Capable software module, or the two combination are implemented.Software module can be placed in random access memory (RAM), memory, read-only deposit
Reservoir (ROM), electrically programmable ROM, electrically erasable ROM, register, hard disk, moveable magnetic disc, CD-ROM or technology
In any other form of storage medium well known in field.
Finally, it is to be noted that, herein, relational terms such as first and second and the like be used merely to by
One entity or operation are distinguished with another entity or operation, without necessarily requiring or implying these entities or operation
Between there are any actual relationship or order.Moreover, term " comprising ", "comprising" or its any other variant meaning
Covering non-exclusive inclusion, so that process, method, article or equipment including a series of elements not only include that
A little key elements, but also including other elements that are not explicitly listed, or further include for this process, method, article or
The intrinsic key element of equipment.In the absence of more restrictions, the key element limited by sentence "including a ...", is not arranged
Except also there are other identical element in the process, method, article or apparatus that includes the element.
The method and relevant apparatus of a kind of bad block mark provided by the present invention are described in detail above.Herein
Apply specific case to be set forth the principle of the present invention and embodiment, the explanation of above example is only intended to help
Understand the method and its core concept of the present invention.It should be pointed out that for those skilled in the art, do not taking off
On the premise of from the principle of the invention, some improvement and modification can also be carried out to the present invention, these are improved and modification also falls into this
In invention scope of the claims.
Claims (10)
- A kind of 1. method of bad block mark, it is characterised in that the described method includes：When performing operation generation mistake to target data block, according to the weight parameter of the correspondence operation and the institute prestored The wrong parameter for stating target data block determines the current wrong parameter of the target data block；When the wrong parameter is not less than pre-set standard parameter, the target data block is labeled as bad block.
- 2. according to the method described in claim 1, it is characterized in that, the operation includes following any one or any combination：Read operation, write operation, wipe operation.
- It is 3. according to the method described in claim 2, it is characterized in that, described when to target data block execution operation generation mistake When, the mesh is determined according to the wrong parameter of the weight parameter of the correspondence operation and the target data block prestored The current wrong parameter of mark data block includes：When performing read operation generation mistake to the target data block, read operation is performed again to the target data block；When the target data block is performed again read operation occur mistake when, according to the weight parameter of the correspondence read operation with The wrong parameter of the target data block prestored determines the current wrong parameter of the target data block.
- 4. according to the method described in claim 2, it is characterized in that, when to target data block perform read operation occur mistake when, The method further includes：The data stored in the target data block are recovered.
- 5. a kind of device of bad block mark, it is characterised in that described device includes：Weight processing module：For when to target data block perform operation occur mistake when, according to the weight of the correspondence operation The wrong parameter of parameter and the target data block prestored determines the current wrong parameter of the target data block；Mark module：For when the wrong parameter is not less than pre-set standard parameter, by the target data block mark It is denoted as bad block.
- 6. according to the method described in claim 5, it is characterized in that, the operation includes following any one or any combination：Read operation, write operation, wipe operation.
- 7. according to the method described in claim 6, it is characterized in that, the weight processing module includes：Unit is reprocessed in read operation：For when to the target data block perform read operation occur mistake when, to the number of targets Read operation is performed again according to block；Read operation weight processing unit：When performing read operation generation mistake again to the target data block, according to corresponding institute State the weight parameter of read operation and determine that the target data block is worked as with the wrong parameter of the target data block prestored Preceding wrong parameter.
- 8. according to the method described in claim 6, it is characterized in that, described device further includes：Read data recovery module：For when to the target data block perform read operation occur mistake when, by target data block into Row recovers.
- A kind of 9. equipment of bad block mark, it is characterised in that including：Memory：For storing computer program；Processor：The method that the bad block as described in any one of Claims 1-4 marks is realized during for performing the computer program The step of.
- 10. a kind of computer-readable recording medium, it is characterised in that be stored with computer on the computer-readable recording medium Program, the method that the bad block as described in any one of Claims 1-4 marks is realized when the computer program is executed by processor Step.
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| CN201711194987.5A CN107992268B (en) | 2017-11-24 | 2017-11-24 | Bad block marking method and related device |
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| CN201711194987.5A CN107992268B (en) | 2017-11-24 | 2017-11-24 | Bad block marking method and related device |
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| CN107992268A true CN107992268A (en) | 2018-05-04 |
| CN107992268B CN107992268B (en) | 2021-08-10 |
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Cited By (4)
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| CN111324286A (en) * | 2018-12-14 | 2020-06-23 | 北京兆易创新科技股份有限公司 | Memory and control method and device thereof |
| CN113127238A (en) * | 2019-12-30 | 2021-07-16 | 北京懿医云科技有限公司 | Method, apparatus, medium, and device for exporting data from database |
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