CN109581068B - Effective dielectric constant evaluation test method and system - Google Patents
Effective dielectric constant evaluation test method and system Download PDFInfo
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- CN109581068B CN109581068B CN201811426983.XA CN201811426983A CN109581068B CN 109581068 B CN109581068 B CN 109581068B CN 201811426983 A CN201811426983 A CN 201811426983A CN 109581068 B CN109581068 B CN 109581068B
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- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
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Abstract
The invention relates to the technical field of dielectric constant detection, in particular to an effective dielectric constant evaluation test method and system. The invention measures the impedance value of each impedance in the impedance test board and combines the parameters of the line width, the line thickness, the thickness of the adjacent medium layer and the like of the impedance, utilizes the impedance simulation software to reversely calculate the effective dielectric constant corresponding to the impedance, and then carries out regression analysis on the effective dielectric constant, the line width, the glue content of the adjacent layer of the impedance and the like to obtain the polynomial equation for calculating the effective dielectric constant, thereby realizing that a dielectric constant detector is not needed, obtaining the effective dielectric constant of the plate through the calculation mode and providing convenience for production design. The polynomial equation constructed by the method can calculate the effective dielectric constant of the plate more accurately and can meet the production precision requirement.
Description
Technical Field
The invention relates to the technical field of dielectric constant detection, in particular to an effective dielectric constant evaluation test method and system.
Background
The dielectric constant (DK) is a physical quantity that measures the amount of electrostatic energy that can be stored per unit volume of an insulating material per unit potential gradient. The medium has the function of generating induced charges under an applied electric field to weaken the electric field, the impedance is the vector sum of conductor resistance, inductive reactance and capacitive reactance, and the dielectric constant has a remarkable influence on the impedance and is one of important parameters in the PCB impedance design process. The DK values of the core board and the prepreg (PP) involved in the PCB production process are provided by the supplier, the actual effective DK value cannot be confirmed, and for the combined material, the effective DK value of the combined material cannot be known without the DK measurement instrument. For example, in the production process of PCB, PP sheets with different specifications (such as PP with model 1080 and PP with model 2116) are often required to be combined for use, and in this case, the effective DK value of the combined material cannot be confirmed. That is, in the prior art, the DK measuring instrument is directly used for measuring the DK value of the material, but the effective DK values of different plates, plates with different specifications and different gel contents cannot be determined, so that the production design, the real-time monitoring and the design scheme adjustment are inconvenient.
Disclosure of Invention
The invention provides an effective dielectric constant evaluation test method and a system for evaluating the effective dielectric constant of a test plate, aiming at the problem that the effective dielectric constant of the test plate cannot be detected and evaluated in a calculation mode except for directly measuring the effective dielectric constant of the plate by using a DK measuring instrument in the prior art, so that the production and design are inconvenient.
In order to achieve the purpose, the invention adopts the following technical scheme.
An effective dielectric constant evaluation test method comprises the following steps:
s1, detecting the impedance values of the impedances on the plurality of identical impedance test boards; the parameters of the lamination structure of the impedance test board are known values, and the parameters of the lamination structure comprise the gel content of each semi-cured sheet layer in the lamination structure.
Preferably, the impedance test board is a multilayer board structure consisting of six core boards which are numbered from top to bottom and sequentially comprise C1-C6, seven prepreg layers which are numbered from top to bottom and sequentially comprise P1-P7, an upper copper foil layer and a lower copper foil layer; the upper copper foil layer and the lower copper foil layer are respectively provided with an outer layer impedance; one surface of each of the core plates C1, C2, C3, C5 and C6 is a signal surface, inner layer impedances are arranged on the signal surfaces, and the other surface of each of the core plates is a reference copper surface; one surface of the core plate C4 is a copper-free surface, and the other surface is a reference copper surface; the core boards C1-C6 comprise three types of core boards with the glue content of the dielectric layer being less than 50%, 50-70% and more than 70%; the prepreg layers P1-P7 comprise three types of prepreg layers with the gel content of less than 50%, 50-70% and more than 70%; the prepreg layer comprises a prepreg layer formed by a single prepreg and a prepreg layer formed by two prepregs.
S2, slicing each impedance test board, and respectively measuring the upper line width, the lower line width, the line thickness, the upper medium thickness and the lower medium thickness of the impedance on the impedance test board.
S3, calculating the effective dielectric constant corresponding to each impedance using the impedance simulation software based on the data measured in steps S1 and S2.
Preferably, the impedance simulation software is Polar SI8000 or Polar SI 9000.
S4, performing regression analysis on the effective dielectric constant obtained in the step S3, the line width of the corresponding impedance and the gel content of the adjacent layer of the corresponding impedance to fit Y, X1、X2、X1 2、X2 2、X1X2Polynomial equation f (x); y is the effective dielectric constant, X2Is line width, X1Is the gel content, X2 2Then is the square of the line width, X1 2Is the square of the gel content, X1X2The product of the gel content and the line width.
Preferably, the regression analysis is performed on the correlation index R of the curve fit2≥0.85。
And S5, substituting the gel content of the board and the line width of the manufactured/planned circuit on the board into the polynomial equation F (X), and calculating to obtain the effective dielectric constant of the board.
Preferably, step S4 is followed by the step of simplifying the polynomial equation, i.e. the line width X2Respectively setting three constant values and respectively substituting the three constant values into the polynomial equation F (X) in the step S4 to respectively obtain three simplified polynomial equations F1(X)、F2(X) and F3(X); said F1(X) corresponding line width X2Less than 4mil, said F2(X) corresponding line width X2Greater than 4mil and less than 6mil, said F3(X) corresponding line width X2Greater than 6 mils.
Correspondingly, in the step S5, the line width of the circuit to be manufactured/manufactured on the board is changed from F1(X)、F2(X) and F3Selecting a polynomial equation in (X), substituting the gel content of the plate into the selected polynomial equation, and calculating to obtain the effective dielectric constant of the plateA constant.
For example, if the line width X of the fabricated/to-be-fabricated circuit on the board2Less than 4mil, a polynomial equation F is selected1(X) calculating the effective dielectric constant of the sheet; if the line width of the manufactured/planned line on the plate is 4mil < X2Less than 6mil, a polynomial equation F is selected2(X) calculating the effective dielectric constant of the sheet; line width X of circuit to be manufactured/manufactured on board2If it is more than 6mil, selecting polynomial equation F3(X) calculating the effective dielectric constant of the plate.
Preferably, said F1(X) corresponding line width X2Is 3mil, said F2(X) corresponding line width X2Is 5mil, said F3(X) corresponding line width X2Is 7 mil.
Preferably, the impedance test board is a characteristic impedance test board or a differential impedance test board, the characteristic impedance test board is provided with an inner layer characteristic impedance and an outer layer characteristic impedance, and the differential impedance test board is provided with an inner layer differential impedance and an outer layer differential impedance.
Correspondingly, if the impedance test board in step S1 is a differential impedance test board, the slicing analysis in step S2 further includes measuring the bottom line pitch of two lines in the inner layer differential impedance and the outer layer differential impedance, respectively.
Preferably, in step S4, a regression analysis is performed on the effective dielectric constant of the same type of impedance, the line width of the corresponding impedance, and the gel content of the adjacent layer of the corresponding impedance to fit a polynomial equation f (x).
Preferably, the inner layer differential/characteristic impedance on the impedance test board is composed of a left end inner layer differential/characteristic impedance and a right end inner layer differential/characteristic impedance which are symmetrical and connected together; the outer layer differential/characteristic impedance is composed of a left end outer layer differential/characteristic impedance and a right end outer layer differential/characteristic impedance which are symmetrical and connected together.
Preferably, in step S1, the impedance values of the left and right ends of each impedance on the impedance test board are measured, and if the absolute value of the difference between the impedance values of the left and right ends of the inner layer characteristic impedance or the outer layer characteristic impedance is greater than 1.5 Ω, the impedance value measurement data of the inner layer characteristic impedance or the outer layer characteristic impedance is rejected; and if the absolute value of the difference between the impedance values of the left end and the right end of the inner-layer differential impedance or the outer-layer differential impedance is larger than 3 omega, rejecting the impedance value measurement data of the inner-layer differential impedance or the outer-layer differential impedance.
Preferably, in step S2, each impedance test board is made into two slices for slice analysis, and slice analysis data of each impedance in the two slices are compared, and if there is data with a difference larger than ± 10 μm in the two slice analysis data of the same impedance, the slice analysis data of the impedance is rejected.
An effective dielectric constant evaluation test system comprises a polynomial equation F (X) established by the method described above.
Compared with the prior art, the invention has the beneficial effects that:
the invention measures the impedance value of each impedance in the impedance test board, combines parameters such as the line width, the line thickness and the thickness of the adjacent medium layer of the impedance, reversely calculates the effective dielectric constant corresponding to the impedance by using impedance simulation software, and performs regression analysis on the parameters such as the effective dielectric constant, the line width, the gel content of the adjacent layer of the impedance and the like to obtain a polynomial equation for calculating the effective dielectric constant, thereby realizing that a dielectric constant detector is not needed, obtaining the effective dielectric constant of the plate by a calculation mode and providing convenience for production and design. The polynomial equation constructed by the method can calculate the effective dielectric constant of the plate more accurately and can meet the production precision requirement.
Drawings
FIG. 1 is a front view of the differential impedance test board in the embodiment;
FIG. 2 is a schematic front view of the characteristic impedance test board in the embodiment;
FIG. 3 is a graph of the trend of effective DK value versus RC% for different line widths;
FIG. 4 shows the fitting values of Y and X1The scatter plot of (a);
FIG. 5 shows the fitting values of Y and X2The scatter plot of (a).
Detailed Description
In order to more fully understand the technical contents of the present invention, the technical solutions of the present invention will be further described and illustrated with reference to the following specific embodiments.
Examples
The embodiment provides an effective dielectric constant evaluation test method and a system for evaluating and testing the effective dielectric constant. Preparing an impedance test board for collecting relevant data, collecting impedance values and data such as line width, line thickness, upper and lower dielectric layer thickness and the like of corresponding impedance through measuring the impedance test board, reversely calculating corresponding effective dielectric constant of the data obtained through testing through impedance simulation software, and performing regression analysis by using the calculated effective dielectric constant and variables related to the line width and gel content to obtain a fitting curve. The effective dielectric constant of the plate with known gel content can be calculated by utilizing the fitting curve when a circuit with a certain line width is manufactured. The specific procedure is exemplified as follows.
Firstly, preparation of impedance test board
The impedance test board used in the effective dielectric constant evaluation test method of the invention is a multilayer board structure composed of six core boards which are numbered from top to bottom in sequence from C1-C6, seven prepreg layers which are numbered from top to bottom in sequence from P1-P7, an upper copper foil layer and a lower copper foil layer, and the lamination structure design of the impedance test board is shown in the following table 1 (the table comprises the lamination structure of three differential impedance test boards and three characteristic impedance test boards). The upper copper foil layer (L1) and the lower copper foil layer (L14) are respectively provided with outer layer characteristic impedance or outer layer differential impedance; one surface (L3, L5, L7, L10 and L12) of the core plates C1, C2, C3, C5 and C6 is a signal surface, inner layer characteristic impedance or inner layer differential impedance is arranged on each signal surface, and the other surfaces (L2, L4, L6, L11 and L13) are reference copper surfaces; one surface (L8) of the core sheet C4 was a copper-free surface as a spacer, and the other surface (L9) was a reference copper surface.
The residual copper rate of the reference copper surface was 70%, and the residual copper rate of the signal surface was 50%. (part of copper surface is reserved on the reference copper surface and the signal surface through exposure, development and etching processes in PCB production so that the coverage rate of the copper surface on the layer meets the design requirement, and the coverage rate of the copper surface is the residual copper rate.)
The glue content of the medium layers in the core plates C1 and C6 is 70%; the glue content of the medium layers in the core plates C2 and C5 is 55%; the glue content of the medium layers in the core plates C3 and C4 is 45 percent. (in Table 1, layers J1-J6 correspond to layers of media in cores C1-C6, respectively.)
The gel contents of the prepreg layers P1 and P7 are both 70%; the gel contents of the prepreg layers P2 and P6 are both 70%; the gel contents of the prepreg layers P3 and P5 are both 55%; the gel content of the prepreg layer P4 was 45%.
The prepreg layers P2 and P6 were each composed of two prepregs.
The line widths of the characteristic impedance of the outer layer and the characteristic impedance of the inner layer of the characteristic impedance test boards 1 to 3 are shown in table 1; the line widths of the outer layer differential impedance and the inner layer differential impedance of the differential impedance test boards 1-3 are shown in table 1 (the line width "3/4/3" of the differential test board in table 1 means that the line widths of two copper wires are 3 mils, and the line bottom spacing of two copper wires is 4 mils).
As shown in fig. 1 (a copper surface for controlling a residual copper rate is not shown in fig. 1, commonly referred to as "dummy copper"), two rows of signal holes are respectively formed at the left end and the right end of the differential impedance test board, each signal hole is respectively connected with a copper wire of differential impedance on a signal surface (the length of the copper wire is greater than or equal to 6in), the differential impedance on each signal surface comprises two copper wires, the left end and the right end of each copper wire are respectively connected with a signal hole, and a left-end differential impedance and a right-end differential impedance which are symmetrical and connected together are formed; according to the difference that the differential impedance is positioned at the outer layer and the inner layer, the difference is called as: the impedance matching circuit comprises an outer layer differential impedance, a left end outer layer differential impedance, a right end outer layer differential impedance, an inner layer differential impedance, a left end inner layer differential impedance and a right end inner layer differential impedance. Because the copper wires of the inner layer differential impedance are located inside the stitching structure, the front view of the differential impedance test board shown in fig. 1 can only see the signal holes of the corresponding inner layer differential impedance, and the copper wires of the inner layer differential impedance cannot be seen.
As shown in fig. 2 (a copper surface for controlling the copper residue rate is not shown in fig. 2, which is commonly referred to as "dummy copper"), a row of signal holes and a row of GND holes are respectively formed at the left and right ends of the characteristic impedance test board. Each GND hole is connected to two reference copper surfaces adjacent to one signal surface (see GND holes "L2 & 4" in fig. 2, which are connected to reference copper surfaces L2 and L4, and the L3 layer located between L2 and L4 is the signal surface, and the signal hole denoted by "L3" and the GND hole denoted by "L2 & 4" are used for measurement of the impedance value of the internal layer characteristic impedance provided on the L3 layer). Each signal hole is respectively connected with a copper wire of the characteristic impedance on a signal surface (the length of the copper wire is more than or equal to 6in), the characteristic impedance on each signal surface comprises a copper wire, and the left end and the right end of the copper wire are respectively connected with a signal hole to form a left end characteristic impedance and a right end characteristic impedance which are symmetrical and connected together; according to the difference that the characteristic impedance is located in the outer layer and the inner layer, the difference is called as: outer layer characteristic impedance, left end outer layer characteristic impedance, right end outer layer characteristic impedance, inner layer characteristic impedance, left end inner layer characteristic impedance, right end inner layer characteristic impedance. Since the copper wires of the inner layer characteristic impedance are located inside the press-fit structure, only the signal holes and the corresponding GND holes of the corresponding inner layer characteristic impedance can be seen in the front view of the characteristic impedance test board shown in fig. 2, and the copper wires of the inner layer characteristic impedance cannot be seen.
TABLE 1 lamination structure information of impedance test board
In table 1, 106, 2166, and 7628 refer to the types of the dielectric layers of the prepreg or the core board, which are 106, 2166, and 7628, respectively; "106 x 2" means that the layer is made up of two prepregs or dielectric layers, respectively, of type 106.
Except for the resistance test board of the laminated structure shown in the above table 1, 6 other resistance test boards of laminated structures were fabricated by changing the layer structures of P1 and P7 from 106 × 2 to 2116, and the gel contents of the prepreg layers P1 and P7 were all 55%; then, the layer structures of P1 and P7 were changed from 106X 2 to 7628, and the gel contents of the prepreg layers P1 and P7 were both 45%, and then another 6-layered structure resistance test boards were fabricated.
The method comprises the steps that a pressing structure is arranged, the pressing structure comprises three types of core boards with the glue content of a medium layer being less than 50%, 50-70% and more than 70%, and three types of prepreg layers with the glue content being less than 50%, 50-70% and more than 70%, the prepreg layers comprise a single prepreg and two prepreg impedance test boards, the impedance values of impedances on the prepreg layers are measured and subjected to slicing analysis to collect slicing analysis data such as line width, line thickness, line spacing, medium layer thickness and the like, and the data are processed by a certain method, so that the relation between the line width, the glue content of a board and an effective dielectric constant can be accurately reflected, and material conditions for accurately collecting relevant data are provided for developing and constructing an accurate and feasible effective dielectric constant evaluation method and system for the board used for producing the PCB. The impedance test board has inner/outer layer impedance comprising symmetrical left end inner/outer layer impedance and right end inner/outer layer impedance connected together, and one impedance test board can obtain two sets of measurement data. (inner layer impedance includes inner layer characteristic impedance and inner layer differential impedance, outer layer impedance includes outer layer characteristic impedance and outer layer differential impedance, left end inner layer impedance includes left end inner layer characteristic impedance and left end inner layer differential impedance, right end inner layer impedance includes right end inner layer characteristic impedance and right end inner layer differential impedance, left end outer layer impedance includes left end outer layer characteristic impedance and left end outer layer differential impedance, right end outer layer impedance includes right end outer layer characteristic impedance and right end outer layer differential impedance.)
In this embodiment, 24 pieces of impedance testing boards are respectively manufactured for each laminated structure.
The impedance test board is manufactured by adopting the conventional PCB production process, firstly, impedance and false copper are manufactured on each core board by using a negative film process, then corresponding prepregs and core board laminates are laminated and pressed into a multilayer production board according to a designed laminated structure, then, the processing procedures of outer layer drilling, copper deposition, full board electroplating and positive film process upper/lower copper foil manufacturing impedance are sequentially carried out on the multilayer production board, and then, the forming procedure is carried out, so that the preparation of the impedance test board is completed. After the upper/lower copper foils are used for manufacturing the impedance, a solder mask layer can be continuously manufactured on the surface, and the forming procedure is carried out after the solder mask layer is manufactured.
Second, measure the impedance value of the impedance on the impedance test board
And (2) measuring the impedance value of each impedance in each impedance test board prepared in the step one by using an Agilent impedance analyzer, wherein the impedance test needs to measure the two ends of the impedance, namely, the left end differential impedance and the right end differential impedance of the differential impedance test board are respectively measured, the left end characteristic impedance and the right end characteristic impedance of the characteristic impedance test board are respectively measured, data are recorded, and two digits after a decimal point are reserved. An average impedance value (an average value of impedance values of the left-end characteristic impedance and the right-end characteristic impedance, and an average value of impedance values of the left-end differential impedance and the right-end differential impedance) of each impedance is calculated.
Before measuring the impedance, the air rod/standard part calibration needs to be carried out on the Agilent impedance analyzer.
If the absolute value of the difference between the impedance values of the left end and the right end of the inner layer characteristic impedance or the outer layer characteristic impedance is larger than 1.5 omega, eliminating the impedance value measurement data of the inner layer characteristic impedance or the outer layer characteristic impedance; and if the absolute value of the difference between the impedance values of the left end and the right end of the inner-layer differential impedance or the outer-layer differential impedance is larger than 3 omega, rejecting the impedance value measurement data of the inner-layer differential impedance or the outer-layer differential impedance. For example, the impedance values of the impedances in the characteristic impedance test board 1 and the differential impedance test board 2 are measured as shown in tables 2 and 3, where table 2 shows the impedance values (measured values) of the impedances in the characteristic impedance test board 1, and table 3 shows the impedance values (measured values) of the impedances in the differential impedance test board 2.
TABLE 2
TABLE 3
Third, slice analysis
Each impedance test board is respectively sliced and sampled at 1/3 and 2/3 with the length (from the left), two slices are subjected to slice analysis, the slice analysis data of each impedance in the two slices are compared, and if the two slice analysis data of the same impedance have data with the difference value larger than +/-10 mu m, the slice analysis data of the impedance are rejected.
The characteristic impedance test board is used for measuring 5 data of the upper line width/line top W2, the lower line width/line bottom W1, the line thickness/copper thickness T, the lower layer medium thickness/lower medium thickness H1 and the upper layer medium thickness/upper medium thickness H2 of a copper wire with outer layer characteristic impedance and inner layer characteristic impedance; the differential impedance test board needs to measure 11 data including upper line width/top (W2, W4), lower line width/bottom (W1, W3), line thickness/copper thickness (T1, T2)), lower medium thickness/lower medium thickness (H1, H3), upper medium thickness/upper medium thickness (H2, H4) of two copper wires of the outer layer differential impedance and the inner layer differential impedance. The obtained slice analysis data corresponds to the impedance values one by one, and confusion is avoided. Each impedance test board has two slices, and the data corresponding to the two slices are averaged.
For example, the measurement data for two differential impedance test boards 2 (outer layer differential impedance on layer L1 of board A-2 and inner layer differential impedance on layer L3 of board B-2) is shown in Table 4 below.
TABLE 4
Fourthly, data arrangement
And calculating and summarizing the average impedance value of each impedance in the impedance test board of each lamination structure and the average value of the slice analysis data. The average impedance values of the differential impedance of the inner layer on the third layer (L3) in the 11 differential impedance test boards 1 and the average values of the slice analysis data are shown in table 5, for example.
TABLE 5
Fifthly, calculating the effective dielectric constant DK value reversely
And (4) using impedance simulation software (Polar SI8000 or Polar SI9000), substituting the average data collected in the step four into a calculation model of the software, and reversely calculating the corresponding effective dielectric constant DK value.
For example, the effective dielectric constant DK value of each inner layer characteristic impedance and the data of line thickness, line width and gel content of the adjacent dielectric layer corresponding to the impedance obtained by inverse calculation of the characteristic impedance test board 1, the characteristic impedance test board 2 and the characteristic impedance test board 3 are shown in table 6.
TABLE 6
Sixth, Linear regression analysis
Performing regression analysis on the effective dielectric constant obtained by the reverse calculation in the step five, the line width of the corresponding impedance and the gel content of the adjacent layer of the corresponding impedance to fit Y, X1、X2、X1 2、X2 2、X1X2Polynomial equation f (x); y is the effective dielectric constant, X2Is line width, X1Is the gel content, X2 2Then is the square of the line width, X1 2Is the square of the gel content, X1X2The product of the gel content and the line width. And the correlation index R2And more than or equal to 0.85 is taken as a credible judgment standard of the fitting result.
Taking the characteristic impedance test board 1, the characteristic impedance test board 2 and the characteristic impedance test board 3 as an example, the effective dielectric constant DK value Y and the corresponding X of each inner layer characteristic impedance obtained by reverse calculation1、X2、X1 2、X2 2、X1X2The data of (a) are shown in table 7 below.
TABLE 7
Linear regression analysis of the data in table 7 gave the polynomial equation f (x) for the effective DK value of the panel (three decimal places retained):
Y＝12.571-24.162X1-0.108X2+17.972X1 2+0.010X2 2-0.133X1*X2
r obtained by regression statistics2When the value is 0.989 and is more than 0.85, the polynomial equation is judged to be credible.
Evaluation test of effective dielectric constant of plate
Collecting the gel content of the board to be tested and the line width of the circuit manufactured/to be manufactured on the board, substituting the gel content and the line width into the polynomial equation F (X), and calculating to obtain a Y value, namely the effective dielectric constant.
In other embodiments, the polynomial equation of step six above may be simplified. The simplified processing method comprises the following steps:
different gel contents (RC%) X1And line width X2Substituting into the polynomial equation, drawing a trend graph, and respectively drawing a Y fitting value and X1、X2The scatter plot of (1). For example, the line widths of 3mil, 4mil, 5mil, 6mil, 7mil and 8mil are substituted into the polynomial equation according to the line widths of 3mil, 4mil, 5mil, 6mil, 7mil and 8mil, respectively, to obtain a trend graph of the effective DK value and RC% under different line widths, as shown in fig. 3, the Y-fit value and X-fit value1The scatter plot of (A) is shown in FIG. 4, the fitting value of Y to X2The scatter plot of (a) is shown in fig. 5.
From the trend graph of the effective DK value and RC%, as the line width increases, the influence of the line width on the effective DK value decreases gradually, and the change trends of the six curves are consistent. Because the DK value changes by 0.1 and the corresponding impedance value changes by about 0.3-0.5 omega, the influence on the impedance value is small, the factors which have the maximum influence on the DK value in the formula and do not exceed 0.1 can be considered to be classified and combined, and a curve can be drawn according to the line width range of less than 4mil, 4-6mil and more than 6mil for the convenience of simplifying the execution. Classifying according to the line width range of less than 4mil, 4-6mil and more than 6mil, respectively2Substituting 7mil, 5mil and 3mil into the aboveAnd (3) a polynomial equation, and then combining the same terms to obtain a simplified equation:
F1(X): line width < 4mil, X2＝3mil，DK＝12.337-24.561X1+17.972X1 2
F2(X): line width 4-6mil, X2＝5mil，DK＝12.281-24.827X1+17.972X1 2
F3(X): line width > 6mil, X2＝7mil，DK＝12.305-25.093X1+17.972X1 2
Substituting different values of the glue content RC% into the formula to calculate the corresponding effective dielectric constant, and initially establishing an effective DK value database of the plate.
For example, if the line width X of the fabricated/to-be-fabricated circuit on the board2Less than 4mil, a polynomial equation F is selected1(X) calculating the effective dielectric constant of the sheet; if the line width of the manufactured/planned line on the plate is 4mil < X2Less than 6mil, a polynomial equation F is selected2(X) calculating the effective dielectric constant of the sheet; line width X of circuit to be manufactured/manufactured on board2If it is more than 6mil, selecting polynomial equation F3(X) calculating the effective dielectric constant of the plate.
As shown in table 8, the effective dielectric constant DK (characteristic impedance of the inner layer) was calculated from the above equation for the sheets with different gel contents.
TABLE 8
The polynomial equations of the effective dielectric constants of the inner layer differential impedance, the outer layer characteristic impedance and the outer layer differential impedance are respectively constructed according to the method, and the obtained polynomial equations of the effective DK value of the plate (simplified polynomial equation in the same way as the simplified polynomial equation of the inner layer characteristic impedance) are as follows:
polynomial equation (X) of inner layer differential impedance1＝RC)：
Line width>6mil，DK＝6.316-6.678X1+3.930*X1 2
The line width is 4-6mil, and DK is 5.986-6.242X1+3.930*X1 2
Line width<4mil，DK＝5.655-5.805X1+3.930*X1 2
Polynomial equation (X) of the characteristic impedance of the outer layer1＝RC)：
Line width>6mil，DK＝13.068-25.540*X1+18.520*X1 2
The line width is 4-6mil, DK 13.242-25.540X1+18.520*X1 2
Polynomial equation (X) of outer differential impedance1＝RC)：
Line width>6mil，DK＝4.76044-1.2942X1
The line width is 4-6mil, and DK is 4.21-0.551X1
Line width<4mil，DK＝3.56404+0.1922X1
Using the polynomial equations obtained above for the effective DK values of the sheet materials, taking IT180ABS sheet material as an example, an effective DK value database for IT180ABS sheet material was constructed, as shown in table 9 below. Table 9 also lists the DK values provided by the supplier of the sheet material, and the effective DK values calculated by the polynomial equation about the effective DK values of the sheet material constructed by the method of the present invention are compared with the DK values provided by the supplier, so that it can be seen that the accuracy and validity of the data can be ensured by collecting the relevant data using the impedance test board developed by the present invention, and then the effective DK values of the sheet material can be accurately and effectively calculated by the polynomial equation about the effective DK values of the sheet material constructed by the data processing method of the present invention, and the accuracy can meet the accuracy requirements of the production design.
TABLE 9
The polynomial equation which is constructed by the method and is related to the effective DK value of the plate is constructed into a system for measuring the effective dielectric constant of the plate, different gel contents can be substituted into each polynomial equation, the effective dielectric constant corresponding to the gel content of the plate, such as data shown in a table 9, can be prepared in advance and used as a part of the system, and the corresponding effective dielectric constant can be conveniently and directly inquired through the gel content of the plate in the production and design process.
The technical contents of the present invention are further illustrated by the examples, so as to facilitate the understanding of the reader, but the embodiments of the present invention are not limited thereto, and any technical extension or re-creation based on the present invention is protected by the present invention.
Claims (10)
1. An effective dielectric constant evaluation test method is characterized by comprising the following steps:
s1, detecting the impedance values of the impedances on the plurality of identical impedance test boards; the parameters of the lamination structure of the impedance test board are known values, and the parameters of the lamination structure comprise the gel content of each semi-cured sheet layer in the lamination structure;
s2, performing slicing analysis on each impedance test board, and respectively measuring the upper line width, the lower line width, the line thickness, the upper medium thickness and the lower medium thickness of the impedance on the impedance test board;
s3, calculating effective dielectric constants corresponding to the impedances by using impedance simulation software according to the data obtained by the measurement in the steps S1 and S2;
s4, performing regression analysis on the effective dielectric constant obtained in the step S3, the line width of the corresponding impedance and the gel content of the adjacent layer of the corresponding impedance to fit Y, X1、X2、X1 2、X2 2、X1X2Polynomial equation f (x); y is the effective dielectric constant, X2Is line width, X1Is the gel content, X2 2Then is the square of the line width, X1 2Is the square of the gel content, X1X2The product of the gel content and the line width;
and S5, substituting the gel content of the board and the line width of the manufactured/planned circuit on the board into the polynomial equation F (X), and calculating to obtain the effective dielectric constant of the board.
2. The method of claim 1, further comprising the step of simplifying the polynomial equation after step S4, i.e. the line width X2Respectively setting three constant values and respectively substituting the three constant values into the polynomial equation F (X) in the step S4 to respectively obtain three simplified polynomial equations F1（X）、F2(X) and F3(X); said F1(X) corresponding line width X2Less than 4mil, said F2(X) corresponding line width X2Greater than or equal to 4mil and less than or equal to 6mil, F3(X) corresponding line width X1Greater than 6 mil;
in the step S5, the line width of the circuit to be manufactured/manufactured on the board is changed from F1（X）、F2(X) and F3And (X) selecting a polynomial equation, substituting the gel content of the plate into the selected polynomial equation, and calculating to obtain the effective dielectric constant of the plate.
3. The effective dielectric constant evaluation test method of claim 2, wherein F is1(X) corresponding line width X2Is 3mil, said F2(X) corresponding line width X2Is 5mil, said F3(X) corresponding line width X1Is 7 mil.
4. The effective dielectric constant evaluation test method of claim 1, wherein in step S4, regression analysis is performed to analyze the correlation index R of curve fitting2≥0.85。
5. The effective dielectric constant evaluation test method of claim 1, wherein said impedance simulation software is Polar SI8000 or Polar SI 9000.
6. The effective dielectric constant evaluation test method as claimed in any one of claims 1 to 5, wherein the impedance test board is a characteristic impedance test board or a differential impedance test board, the characteristic impedance test board is provided with an inner layer characteristic impedance and an outer layer characteristic impedance, and the differential impedance test board is provided with an inner layer differential impedance and an outer layer differential impedance.
7. The method for evaluating and testing the effective dielectric constant of claim 6, wherein in step S1, the impedance test board is a differential impedance test board; in the slice analysis in step S2, the method further includes measuring the line-bottom distances of two lines in the inner layer differential impedance and the outer layer differential impedance, respectively.
8. The method for evaluating and testing the effective dielectric constant of claim 7, wherein in step S4, the effective dielectric constant of the same type of impedance and the line width of the corresponding impedance and the gel content of the adjacent layer of the corresponding impedance are subjected to regression analysis to fit a polynomial equation f (x).
9. The effective dielectric constant evaluation test method as claimed in claim 6, wherein the inner layer differential/characteristic impedance is composed of a left end inner layer differential/characteristic impedance and a right end inner layer differential/characteristic impedance which are symmetrical and connected together; the outer layer differential/characteristic impedance is composed of a left end outer layer differential/characteristic impedance and a right end outer layer differential/characteristic impedance which are symmetrical and connected together;
in step S1, the impedance values of the left and right ends of each impedance on the impedance test board are measured, and if the absolute value of the difference between the impedance values of the left and right ends of the inner layer characteristic impedance or the outer layer characteristic impedance is greater than 1.5 Ω, the impedance value measurement data of the inner layer characteristic impedance or the outer layer characteristic impedance are rejected; if the absolute value of the difference between the impedance values of the left end and the right end of the inner layer differential impedance or the outer layer differential impedance is larger than 3 omega, eliminating the impedance value measurement data of the inner layer differential impedance or the outer layer differential impedance;
in step S2, each impedance test board is made into two slices for slice analysis, and slice analysis data of each impedance in the two slices are compared, and if there is data with an absolute value of a difference greater than 10 μm in the two slice analysis data of the same impedance, the slice analysis data of the impedance are rejected.
10. An effective dielectric constant evaluation test system comprising a polynomial equation f (x) established by the method of any one of claims 1-9.
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Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
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Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
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| CN101634672B (en) * | 2009-07-10 | 2011-07-27 | 中国电子科技集团公司第五十五研究所 | Micro-wave on-wafer testing method based on unknown material substrate |
| CN102034724B (en) * | 2009-09-29 | 2012-05-30 | 中芯国际集成电路制造(上海)有限公司 | Method for determining dielectric constant value of fluoride silicon glass in actual process |
| CN105163483B (en) * | 2015-09-10 | 2018-04-20 | 珠海城市职业技术学院 | A kind of wiring board Dk resolution charts and wiring board Dk test methods |
| CN107328999A (en) * | 2017-07-31 | 2017-11-07 | 深圳崇达多层线路板有限公司 | A kind of method of parameter value needed for acquisition calculates sheet material dielectric constant |
-
2018
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Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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Non-Patent Citations (4)
| Title |
|---|
| Comparison of O2 plasma treatment on porous low dielectric constant material at sidewall and bottom of trench structure;Yi-Lung Cheng;《Thin Solid Films》;20180319;第808-813页 * |
| PCB板材介电常数的测量方法及其应用;范红;《2014秋季国际PCB技术》;20141231;第301-307页 * |
| 含胶量对介质厚度均匀性及阻抗控制的影响;王红飞;《2012秋季国际PCB技术》;20121231;第179-174页 * |
| 磁化铁氧体电磁参数的测试;刘春乐;《电子测量技术》;20120131;第68-70页 * |
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