CN109581017B - Multifunctional digital transient response tester - Google Patents
Multifunctional digital transient response tester Download PDFInfo
- Publication number
- CN109581017B CN109581017B CN201811431344.2A CN201811431344A CN109581017B CN 109581017 B CN109581017 B CN 109581017B CN 201811431344 A CN201811431344 A CN 201811431344A CN 109581017 B CN109581017 B CN 109581017B
- Authority
- CN
- China
- Prior art keywords
- signal
- digital
- output
- power supply
- main processor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
- G01R13/0209—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form in numerical form
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
- G01R23/06—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into an amplitude of current or voltage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/16—Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line
Abstract
The invention discloses a multifunctional digital transient response tester capable of testing embedded electronic equipment, which comprises a main processor, a numerical control power supply module, a numerical control signal generation module and a data acquisition module, wherein the numerical control power supply module is used for providing a testing power supply and a testing signal for tested equipment and acquiring a response signal of the tested equipment; the main processor receives control data sent by the upper computer and generates power control parameters of the numerical control power module and signal control parameters of the numerical control signal generation module; the numerical control power supply module dynamically adjusts power supply output parameters according to power supply control parameters generated by the main processor; the numerical control signal generation module dynamically adjusts signal output parameters according to signal control parameters generated by the main processor; and the data acquisition module is used for sampling the response signal of the tested equipment and then transmitting the response signal to the main processor for processing or transmitting the response signal to the upper computer for displaying. By the means, the problem that the prior art cannot meet the flexible and diversified equipment test requirements can be effectively solved.
Description
Technical Field
The invention belongs to the technical field of embedded system testing, and particularly relates to a multifunctional digital transient response tester.
Background
In order to test the performance of software and hardware of the embedded electronic device, it is often necessary to simulate the application environment of the electronic device, including input signals, environmental noise, interference, different transient responses and ripple effects of the power supply of the embedded electronic device, and whether the output signals of the electronic device meet the index requirements under these conditions, etc., which requires various signal generators, data acquisition devices and power supplies. The signal generator is used for generating a required signal, the required signal is input into the tested equipment, meanwhile, the power supply is used for supplying power to the tested equipment, and whether the tested equipment is qualified or not is judged by observing and measuring an output signal of the tested equipment. The actual working environment of many devices is difficult to simulate and create with a common instrument.
Existing signal generators generally include: the frequency generation module, the modulation unit, the buffer amplification unit, the output attenuation unit, the display unit and the control unit are combined with a human-computer interaction operation panel, and various parameters can be input to obtain expected signals. However, the output parameters of the conventional signal generator generally need to be manually set, and the output parameters need to be set and then output every time the signal generator is used, so that the output parameters cannot be dynamically adjusted on line.
The existing adjustable power supply mainly comprises a rectifying circuit, a transformer, a switching voltage-stabilizing converter, an output power supply filter circuit and the like. The product is numerous, and various output voltage and current specifications are optional, but the characteristic parameters are relatively fixed, and the flexible and various equipment test requirements cannot be met.
Disclosure of Invention
In order to solve the problems, the invention discloses a multifunctional digital transient response tester capable of testing embedded electronic equipment, which can generate various test signals, and the parameters of the test signals, such as waveform, amplitude, frequency, output impedance and the like, are programmable and controllable; the output response waveform of the tested product can be collected, and a time sequence signal, a waveform recurrence and the like are displayed.
The invention provides a multifunctional digital transient response tester, which comprises a main processor, a numerical control power supply module, a numerical control signal generation module and a data acquisition module, wherein: the numerical control power supply module provides a test power supply for the tested equipment, the numerical control signal generation module provides a test signal for the tested equipment, and the data acquisition module acquires a response signal of the tested equipment; the numerical control signal generation module dynamically adjusts signal output parameters according to signal control parameters generated by the main processor; the signal output parameters comprise output signal frequency, output signal amplitude and output signal impedance, and the numerical control signal generation module comprises a low-pass filter, a second integrated operational amplifier circuit and a second radio frequency output circuit; the numerical control power supply module comprises a first digital-to-analog converter, a first integrated operational amplifier circuit, a ripple wave adjusting circuit, an addition arithmetic unit and a first radio-follower output circuit; the input end of the first digital-to-analog converter is connected with the main processor through a parallel bus, the first output end of the first digital-to-analog converter is connected with the voltage input end of the first integrated operational amplifier circuit, and the second output end of the first digital-to-analog converter is connected with the input end of the ripple regulating circuit; the first integrated operational amplifier circuit is provided with a first digital potentiometer which is controlled by a main processor in a program mode; the ripple wave adjusting circuit is provided with a second digital potentiometer which is controlled by a main processor in a program mode; the input end of the addition arithmetic unit is respectively connected with the voltage output end of the first integrated operational amplifier circuit and the ripple output end of the ripple regulating circuit; the output end of the addition arithmetic unit is connected with the input end of the first emitter follower output circuit; the output end of the first emitter follower output circuit is connected with a power supply end of the tested equipment; the numerical control power supply module dynamically adjusts power supply output parameters according to power supply control parameters generated by the main processor; the power supply output parameters comprise output voltage, output current, power-on time and power-off time of the power supply; the data acquisition module samples the response signal of the tested equipment and transmits the response signal to the main processor for processing or transmits the response signal to the upper computer for displaying; the main processor receives control data sent by the upper computer, generates power control parameters of the numerical control power module and signal control parameters of the numerical control signal generation module, is also used for processing and storing signals acquired by the data acquisition module, sends the stored signals to the signal input end of the tested equipment through the reserved output end of the second digital-to-analog converter, and performs reproduction when reproduction is needed, and performs digital signal processing based on the signals.
Preferably, the input end of the second digital-to-analog converter is connected with the main processor through a parallel bus, and the signal output end of the second digital-to-analog converter is connected with the signal input end of the second integrated operational amplifier circuit through a low-pass filter; the signal output end of the second integrated operational amplifier circuit is connected with the input end of a second radio-follower output circuit, and the output end of the second radio-follower output circuit is connected with the signal input end of the tested equipment; the second integrated operational amplifier circuit is provided with a third digital potentiometer which is controlled by a program through a main processor; the second emitter follower output circuit is provided with a fourth digital potentiometer which is controlled by a program through a main processor.
Preferably, the power setup time of the first digital-to-analog converter is 35 ns; the test signal settling time of the second digital-to-analog converter is 35 ns.
Preferably, the data acquisition module comprises an analog-to-digital converter; the input end of the analog-to-digital converter is connected with the signal output end of the tested equipment, and the output end of the analog-to-digital converter is connected with the main processor through a parallel bus.
Preferably, the signal sent by the main processor to the upper computer for displaying further comprises a test signal applied to the device under test.
Preferably, the main processor is an FPGA.
The invention also provides a method for testing the tested equipment by adopting the multifunctional digital transient response tester, which comprises the following steps: applying a power supply and a test signal to a device under test; adjusting power supply or test signal parameters applied to the tested device on line; and acquiring the output response signal of the tested equipment in real time, storing the acquired response signal and displaying the response signal on the upper computer.
The invention is different from the technical scheme of the existing product design, combines an arbitrary waveform signal generator, a transient process controllable power supply and a signal acquisition and measurement function, and realizes a multi-parameter controllable and transient process controllable multifunctional digital transient response tester. The method comprises the steps of applying a power supply and an input signal to a tested product, adjusting the parameters of the input power supply or the input signal on line, acquiring the output response waveform of the tested product in real time, storing the acquired waveform and carrying out graphical display on an upper computer.
On the other hand, the invention can collect the state output waveform of the tested equipment in real time, can collect the output signal waveform of the tested equipment while testing, and can carry out transient response observation and qualification judgment of signals, thereby effectively avoiding a plurality of defects (including uncontrollable transient response, large difficulty in cooperative adjustment of parameters, poor integration level, low reliability, portability and flexibility and the like) when different equipment is adopted to build a test platform in the prior art.
Drawings
FIG. 1 is a block diagram of the structure of the multifunctional digital transient response tester according to the present invention;
FIG. 2 is a flow chart of the testing of a device under test based on an embodiment of the multifunctional digital transient response tester of the present invention;
FIG. 3 is a schematic diagram illustrating the principle of amplitude control of a test signal according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of an exemplary embodiment of a radio-follower output circuit;
FIG. 5 is a schematic diagram of a voltage simulation circuit according to an embodiment of the present invention;
fig. 6 is a schematic diagram of a multi-channel signal acquisition circuit according to an embodiment of the present invention.
Detailed Description
Referring to fig. 1, a composition structure of an embodiment of the multifunctional digital transient response tester of the present invention is shown, including a main processor, a numerical control power module, a numerical control signal generation module, and a data acquisition module, wherein:
the numerical control power supply module provides a test power supply for the tested equipment, the numerical control signal generation module provides a test signal for the tested equipment, and the data acquisition module acquires a response signal of the tested equipment;
the main processor receives control data sent by the upper computer and generates power control parameters of the numerical control power module and signal control parameters of the numerical control signal generation module;
the numerical control power supply module dynamically adjusts power supply output parameters according to power supply control parameters generated by the main processor; the power supply output parameters comprise output voltage, output current, power-on time and power-off time of the power supply;
the numerical control signal generation module dynamically adjusts signal output parameters according to signal control parameters generated by the main processor; the signal output parameters comprise output signal frequency, output signal amplitude and output signal impedance;
and the data acquisition module is used for sampling the response signal of the tested equipment and then transmitting the response signal to the main processor for processing or transmitting the response signal to the upper computer for displaying.
The detailed technical scheme of each part in the embodiment of the multifunctional digital transient response tester is described as follows.
Amplitude control scheme
The control of the amplitude is realized by adopting a circuit structure of 'high-speed DA + emitter follower output stage'. First, a signal output from a high-speed Digital-to-Analog Converter (DA) is amplified in amplitude by an operational amplifier, and the amplification factor of the amplifier is adjusted by a Digital potentiometer, so that the signal gain can be controlled by a program. A schematic diagram of this section is shown in fig. 3.
In fig. 3, a Field-Programmable Gate Array (FPGA) is used as a main processor, and the high-speed DA is driven by a parallel bus, so that signals with any frequency and waveform can be generated within a certain range. The active low pass filter after the DA is used to filter out the sampling frequency and its image frequency components. According to the circuit topology of fig. 3, two segments of the digital potentiometer determine the gain of the op-amp.
Second, frequency control scheme
The frequency of the analog signal is realized by the signal output by DA, and the high-speed DA converter is adopted, and the setup time is 35ns, so that various signal frequencies can be realized by DA simulation within a certain range. The frequency of the signal is also adjustable in real time.
Third, output impedance control scheme
In the output stage of the baseband signal circuit, an emitter follower output circuit structure is adopted, on one hand, the emitter follower output circuit obeys the output voltage of the DA, on the other hand, the current is amplified, and the driving capability is increased. Furthermore, the emitter follower circuit can play a role in impedance transformation, so that the control of output impedance can be realized. The circuit configuration of the output stage is shown in fig. 4.
Control scheme for transient voltage process
The transient process control of the voltage is realized by adopting a circuit structure of 'high-speed DA + emitter follower output stage' and overlapping ripples, and a schematic diagram of the part is shown in FIG. 5.
In this part of the circuit, in order to produce a power supply with controllable voltage and ripple, a dual channel high speed DA converter is required, which is also driven by the FPGA via a parallel bus. The high-speed DA converter has a fast setup time, and therefore, this characteristic can be used to realize the power-up or power-down time of the output power source. And at the first output of the DA, amplitude adjustment is carried out through the integrated operational amplifier so as to adjust the voltage to a required value. This voltage amplification adjustment is also accomplished by a digital potentiometer programmed via FP 6A. The second output at the DA output produces a voltage of only a few tens of millivolts, which is used to superimpose on the power supply to simulate the ripple of the power supply output. Because different ripple sizes need to be simulated for different products to be tested, the amplitude of the ripple also needs to be adjusted, and the adjustment mode is realized by a digital potentiometer controlled by an FPGA. And adopting an adder at the later stage of the voltage and ripple output to add the voltage and the ripple so as to obtain a voltage output with the ripple. Here the voltage amplitude and ripple amplitude are independently programmable. Because the driving capability of the integrated operational amplifier is limited, the output stage also adopts a radio following output stage, on one hand, the radio following circuit obeys the input voltage, on the other hand, the current is amplified, the driving capability is increased, and the output current in the circuit can reach hundreds of milliamperes (such as 500mA) in a single path.
Five-way and multi-way waveform acquisition scheme
The multi-path waveform acquisition scheme is formed by adopting an FPGA + AD converter, and the system block diagram of the part is shown in figure 6.
In fig. 6, the first to fourth input signals are from the device under test, and the input signals are sampled by an Analog-to-Digital Converter (AD) and transmitted to the FPGA, so that the output of the product under test is measured. The obtained data can be processed by operation or stored, and can also be sent to an upper computer for display. The signals can be subjected to time sequence comparison and transient response analysis through the measurement result.
Sixth, playback implementation of complex waveforms
The 'playback implementation of complex waveforms' scheme is implemented by means of a 'multi-path waveform acquisition scheme' in combination with reserved DA outputs. For some signals which are particularly difficult to be simulated, the signals can be sampled through a multi-channel signal acquisition function on site, the obtained data can be stored, when reproduction is needed, the signals are reproduced through DA output, and various post-processing such as digital signal processing can be carried out based on the signals.
During specific testing, the tested equipment is interconnected with the tester, the test system can be controlled to supply power to the tested product, load test signals, collect and observe the output response of the tested product through the graphical interface of the upper computer, and the adjustment of input signal parameters is adjustable on line in the whole testing process.
Referring to fig. 2, a flow of testing a device under test (or a product under test) by using the above-mentioned embodiment of the multifunctional digital transient response tester of the present invention is shown, which includes:
step 1: and starting the numerical control power supply module through a program to power up the tested product.
Step 2: judging whether the voltage, the current and the like of each test point are normal, if so, turning to the step 4; otherwise, go to step 3.
And step 3: and checking and repairing the tested product, and turning to the step 1 to power up the tested product again.
And 4, step 4: and (3) starting the numerical control signal generation module (1 to N can be started according to the test requirement) through a program, and applying a test signal to the corresponding tested product.
And 5: the parameters of the test signal (i.e., the input signal to the product under test) are dynamically adjusted, and the output waveform (or response signal) of the product under test is collected in real time.
Step 6: is the output signal of the product to be tested qualified? If yes, turning to step 7; otherwise, go to step 3.
And 7: and storing the test record and ending the test process.
In the existing device, for testing embedded electronic equipment (including software and hardware), a signal generator, an adjustable power supply and data acquisition equipment are required to establish a testing environment, and input signal parameters are manually adjusted one by one to complete a testing process. Three existing devices can select the waveform, amplitude, frequency, driving current and output impedance of an output signal through setting. The disadvantages are that manual adjustment is required, the transient process cannot be simulated, and the transient response of the tested device cannot be collected. In some electronic device testing applications, multi-parameter real-time tuning is difficult to achieve. Compared with the present invention, the main differences are shown in the following table:
from the above comparison, it can be seen that the present invention has significant advantages in generating test signals, especially when comprehensive automated tuning of multiple parameters is required. In particular, the invention enables the simulation of the power supply output, and the transients and ripple of the power supply are controllable.
Claims (7)
1. A multifunctional digital transient response tester is used for testing embedded electronic equipment and is characterized by comprising a main processor, a numerical control power supply module, a numerical control signal generation module and a data acquisition module, wherein:
the numerical control power supply module provides a test power supply for the tested equipment, the numerical control signal generation module provides a test signal for the tested equipment, and the data acquisition module acquires a response signal of the tested equipment;
the numerical control signal generation module dynamically adjusts signal output parameters according to signal control parameters generated by the main processor; the signal output parameters comprise output signal frequency, output signal amplitude and output signal impedance, and the numerical control signal generation module comprises a low-second digital-to-analog converter, a low-pass filter, a second integrated operational amplifier circuit and a second radio-follower output circuit;
the numerical control power supply module comprises a first digital-to-analog converter, a first integrated operational amplifier circuit, a ripple wave adjusting circuit, an addition arithmetic unit and a first radio-follower output circuit;
the input end of the first digital-to-analog converter is connected with the main processor through a parallel bus, the first output end of the first digital-to-analog converter is connected with the voltage input end of the first integrated operational amplifier circuit, and the second output end of the first digital-to-analog converter is connected with the input end of the ripple regulating circuit;
the first integrated operational amplifier circuit is provided with a first digital potentiometer which is controlled by a main processor in a program mode; the ripple wave adjusting circuit is provided with a second digital potentiometer which is controlled by a main processor in a program mode;
the input end of the addition arithmetic unit is respectively connected with the voltage output end of the first integrated operational amplifier circuit and the ripple output end of the ripple regulating circuit; the output end of the addition arithmetic unit is connected with the input end of the first emitter follower output circuit;
the output end of the first emitter follower output circuit is connected with a power supply end of the tested equipment;
the numerical control power supply module dynamically adjusts power supply output parameters according to power supply control parameters generated by the main processor; the power supply output parameters comprise output voltage, output current, power-on time and power-off time of the power supply;
the data acquisition module samples the response signal of the tested equipment and transmits the response signal to the main processor for processing or transmits the response signal to the upper computer for displaying;
the main processor receives control data sent by the upper computer, generates power control parameters of the numerical control power module and signal control parameters of the numerical control signal generation module, is also used for processing and storing signals acquired by the data acquisition module, sends the stored signals to the signal input end of the tested equipment through the reserved output end of the second digital-to-analog converter, and performs reproduction when reproduction is needed, and performs digital signal processing based on the signals.
2. The multi-function digital transient response tester of claim 1,
the input end of the second digital-to-analog converter is connected with the main processor through a parallel bus, and the signal output end of the second digital-to-analog converter is connected with the signal input end of the second integrated operational amplifier circuit through a low-pass filter;
the signal output end of the second integrated operational amplifier circuit is connected with the input end of a second radio-follower output circuit, and the output end of the second radio-follower output circuit is connected with the signal input end of the tested equipment;
the second integrated operational amplifier circuit is provided with a third digital potentiometer which is controlled by a program through a main processor; the second emitter follower output circuit is provided with a fourth digital potentiometer which is controlled by a program through a main processor.
3. The multifunctional digital transient response tester as claimed in any one of claims 1 to 2, wherein the power setup time of said first digital-to-analog converter is 35 ns; the test signal settling time of the second digital-to-analog converter is 35 ns.
4. The multifunctional digital transient response tester of claim 1 wherein the data acquisition module comprises an analog-to-digital converter;
the input end of the analog-to-digital converter is connected with the signal output end of the tested equipment, and the output end of the analog-to-digital converter is connected with the main processor through a parallel bus.
5. The multi-function digital transient response tester of claim 1 wherein the signals sent by the main processor to the host computer for display further comprise test signals applied to the device under test.
6. The multifunctional digital transient response tester of claim 1 wherein said main processor is an FPGA.
7. A method for testing a device under test using the multifunctional digital transient response tester of any one of claims 1 to 6, comprising:
applying a power supply and a test signal to a device under test;
adjusting power supply or test signal parameters applied to the tested device on line;
and acquiring the output response signal of the tested equipment in real time, storing the acquired response signal and displaying the response signal on the upper computer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811431344.2A CN109581017B (en) | 2018-11-28 | 2018-11-28 | Multifunctional digital transient response tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811431344.2A CN109581017B (en) | 2018-11-28 | 2018-11-28 | Multifunctional digital transient response tester |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109581017A CN109581017A (en) | 2019-04-05 |
| CN109581017B true CN109581017B (en) | 2021-06-29 |
Family
ID=65925103
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811431344.2A Active CN109581017B (en) | 2018-11-28 | 2018-11-28 | Multifunctional digital transient response tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109581017B (en) |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101029918A (en) * | 2007-01-23 | 2007-09-05 | 北京芯技佳易微电子科技有限公司 | System and method for testing controllable integrated circuit based on programmable device |
| CN101788579A (en) * | 2010-02-09 | 2010-07-28 | 中兴通讯股份有限公司 | Oscilloscope, signal wave shape collection and display method and system thereof |
| CN101865946A (en) * | 2010-06-26 | 2010-10-20 | 天水天光半导体有限责任公司 | Alternating current parameter testing system and method of programmable digital integrated circuit |
| CN203299599U (en) * | 2013-05-09 | 2013-11-20 | 威凯检测技术有限公司 | Multifunctional programmable test power supply |
| KR20140126003A (en) * | 2013-04-22 | 2014-10-30 | 김영준 | Digital Power Meter of Calculating the Used Poweraccording to Ratio Which Allocated to Real Time |
| CN105814620A (en) * | 2014-10-09 | 2016-07-27 | 约翰·皮埃尔·科克 | A portable electronic test device and a method of using same |
| CN206193578U (en) * | 2016-09-29 | 2017-05-24 | 国网安徽省电力公司阜阳供电公司 | Numerical control D.C. regulated power supply |
| CN206725628U (en) * | 2017-05-18 | 2017-12-08 | 南京师范大学 | Multifunctional portable electronic tests virtual instrument |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101806869B (en) * | 2010-03-22 | 2013-08-28 | 株洲南车时代电气股份有限公司 | General-purpose automatic test system for locomotive switching power supply and method thereof |
| CN103063937A (en) * | 2011-10-19 | 2013-04-24 | 北京强度环境研究所 | Analog quantity converter test bench |
| CN108318754A (en) * | 2017-01-17 | 2018-07-24 | 中国电力科学研究院 | A kind of the automatic detection platform and detection method of distribution power automation terminal |
-
2018
- 2018-11-28 CN CN201811431344.2A patent/CN109581017B/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101029918A (en) * | 2007-01-23 | 2007-09-05 | 北京芯技佳易微电子科技有限公司 | System and method for testing controllable integrated circuit based on programmable device |
| CN101788579A (en) * | 2010-02-09 | 2010-07-28 | 中兴通讯股份有限公司 | Oscilloscope, signal wave shape collection and display method and system thereof |
| CN101865946A (en) * | 2010-06-26 | 2010-10-20 | 天水天光半导体有限责任公司 | Alternating current parameter testing system and method of programmable digital integrated circuit |
| KR20140126003A (en) * | 2013-04-22 | 2014-10-30 | 김영준 | Digital Power Meter of Calculating the Used Poweraccording to Ratio Which Allocated to Real Time |
| CN203299599U (en) * | 2013-05-09 | 2013-11-20 | 威凯检测技术有限公司 | Multifunctional programmable test power supply |
| CN105814620A (en) * | 2014-10-09 | 2016-07-27 | 约翰·皮埃尔·科克 | A portable electronic test device and a method of using same |
| CN206193578U (en) * | 2016-09-29 | 2017-05-24 | 国网安徽省电力公司阜阳供电公司 | Numerical control D.C. regulated power supply |
| CN206725628U (en) * | 2017-05-18 | 2017-12-08 | 南京师范大学 | Multifunctional portable electronic tests virtual instrument |
Also Published As
| Publication number | Publication date |
|---|---|
| CN109581017A (en) | 2019-04-05 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104504975A (en) | Portable comprehensive electronic experimental platform on basis of field programmable gate arrays | |
| CN104345262A (en) | Universal circuit board test system | |
| CN101504428A (en) | Electronic measurement method and multifunctional electronic measuring instrument | |
| CN111142008B (en) | Circuit board power parameter testing system and method | |
| US7027940B2 (en) | Stepped sine wave frequency response measurement system | |
| CN109581017B (en) | Multifunctional digital transient response tester | |
| CN104598347A (en) | Waveform data acquisition module suitable for high density server test | |
| CN107884703B (en) | Input signal simulation source for noise test of infrared detector video processing circuit | |
| CN214504211U (en) | Flying parameter recorder test system | |
| CN112810837A (en) | Flight parameter recorder testing system and testing method | |
| CN102353823B (en) | A kind of electronic load of semi-passive programmable simulation LED characteristic | |
| CN107145142B (en) | Testing device and multi-online testing system | |
| CN216900787U (en) | Generator rotor winding insulation fault detection device and system | |
| CN113086241B (en) | Airborne flight parameter simulation device and system | |
| CN108023548B (en) | Composite modulation signal generator and composite modulation signal generation method | |
| CN112213553B (en) | Device for measuring current | |
| CN105652050A (en) | Multiplex waveform output system and method | |
| CN209895333U (en) | Power supply testing device for hard disk backboard of server | |
| KR101884180B1 (en) | Automatic test equipment pin driver circuit | |
| CN205049531U (en) | Ultrasonic probe testing arrangement | |
| CN216485436U (en) | Testing device and system | |
| Murovec et al. | A USB-based data acquisition system designed for educational purposes | |
| CN210720514U (en) | Voltage and current source debugging device for automatic test equipment | |
| Si et al. | Four-channel virtual oscilloscope based on Labview | |
| CN112968742B (en) | Broadband channel simulation device and method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address | ||
| CP03 | Change of name, title or address |
Address after: 100041 4th floor, building 2, 9 Shuangyuan Road, Shijingshan District, Beijing Patentee after: Beijing Hongdong Technology Co.,Ltd. Address before: 100041 north side of 4th floor, building 2, Jingbao company, No.9 Shuangyuan Road, Shijingshan District, Beijing Patentee before: BEIJING HONGDONG TECHNOLOGY Co.,Ltd. |