CN109542794A - A kind of Software Automatic Testing Method applied to embedded system - Google Patents
A kind of Software Automatic Testing Method applied to embedded system Download PDFInfo
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- CN109542794A CN109542794A CN201811472055.7A CN201811472055A CN109542794A CN 109542794 A CN109542794 A CN 109542794A CN 201811472055 A CN201811472055 A CN 201811472055A CN 109542794 A CN109542794 A CN 109542794A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
- G06F11/3672—Test management
- G06F11/3684—Test management for test design, e.g. generating new test cases
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
- G06F11/3672—Test management
- G06F11/3688—Test management for test execution, e.g. scheduling of test suites
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
- G06F11/3672—Test management
- G06F11/3692—Test management for test results analysis
Abstract
The invention belongs to airborne avionics system fields, it is related to a kind of Software Automatic Testing Method of embedded system, test case template and relevant parameter including host end send mechanism, the automatic test machine system of embedded system target side, test case template has been write in host's generator terminal, determine the relevant parameter of test, then test case template and relevant parameter are sent to embedded system target side and automatically generate test case, use-case to be tested returns to test case implementing result after the completion of embedded system target side executes.Software automatic test mechanism through the invention can largely improve the Efficiency of Software Testing of embedded system, meet the requirement of the Embedded System Design complexity increasingly updated.The present invention is easy to use, has higher reliability, is a kind of simple, efficient embedded system function test method.
Description
Technical field
The invention belongs to airborne avionics system fields, are related to a kind of Software Automatic Testing Method of embedded system.
Background technique
With the fast development and continuous renewal of avionics, the integration degree of embedded system is higher and higher,
This requires embedded system test methods constantly to optimize and improve.With most simple, most efficient test method is embedding to ensure
The stability of embedded system function is the necessary condition that embedded system operates normally.It is most of at present for embedded system
Test carries out the test of different application mode using the target machine of host connection embedded system.Such test mode is in host
Generator terminal is write corresponding test case according to demand and is compiled by generating target application, using network interface, serial ports etc. that compiling is logical
The target application crossed, which is loaded onto the target machine of embedded system, is tested, and when needing replacing test item, then must be incited somebody to action
The target machine of embedded system carries out resetting setting and rewrites corresponding test case.Such test method is unfavorable for high collection
At the test verifying for changing embedded system, specifically have the disadvantage that
A. larger workload must then write more when the project for needing to test in the same embedded system is more
A test case is simultaneously repeatedly tested manually respectively, and efficiency is lower；And if including multiple and different points of operations in embedded system
System, and test case used in the same function is inconsistent under each operating system, is easy to cause error；
B. maintainability is poor, especially when using multiple and different test cases in different embedded systems, it is not easy to carry out
The maintenance of test case.
Summary of the invention
The purpose of the present invention is: for above-mentioned existing built-in system software test method there are the shortcomings that, the present invention
Propose a kind of Software Automatic Testing Method applied to embedded system, it is therefore an objective to improve the test effect of built-in system software
Rate.
Technical solution of the present invention: the present invention can make the automatic test of embedded system progress software, including host end
Test case template and relevant parameter send mechanism, the automatic test machine system of embedded system target side, i.e., in host's generator terminal
Test case template has been write, the relevant parameter of test has been determined, is then sent to test case template and relevant parameter
Embedded system target side automatically generates test case, and use-case to be tested will be surveyed after the completion of embedded system target side executes
Example implementing result on probation returns.Suitable for the airborne avionics system with embedded system.
The test case template and relevant parameter at host end send mechanism, and steps are as follows:
Step 1, the test case template for covering all subsystems and function is write at host end according to specification, and uses parameter
Selected system and function are tested in control；
Step 2, test case compiling host end write generates test application；
Step 3, test application and corresponding test parameter are sent to embedded system target side；
Step 4, the test application implementing result of embedded system target side is waited to return；
Step 5, the test result returned to embedded system target side is analyzed.
In the step 1, host end can be PC machine, can also make any terminal that can be write with compiler test use-case
Equipment.
In the step 1, subsystem will cover the system that should include in all embedded systems to be measured.
In the step 1, the function of test case will include what all subsystems of all embedded systems should have
Function.
In the step 1, test case will have according to corresponding input parameter the content and range for controlling test.
In the step 1, test case will have versatility, that is, the test for meeting all different subsystems and function is wanted
It asks.
In the step 2, the test case that host writes at end will have general applicability.
In the step 2, test application that host end generates can test scope to cover all embedded systems and had
Some functions.
In the step 3, each test parameter should all have corresponding specific survey in test application
Try routine.
In the step 3, each incoming test parameter will represent different test items.
In the step 3, test parameter represents the function of embedded system, or represents different types of subsystem.
In the step 3, the test application of generation is wanted to execute in embedded system target side.
In the step 3, target side will be tested according to test case and test parameter dynamic.
In the step 4, embedded system target side has all executed test case generated.
In the step 4, embedded system target side returns to whole implementing results of test case.
In the step 5, test case implementing result should include the test of the test item of all embedded systems.
In the step 5, test case implementing result should be authentic and valid, and different test return values represents different surveys
Test result.
The automatic test machine system of embedded system target side, steps are as follows:
Step 1 starts embedded system target side according to specification；
Step 2, the test application for waiting host end to be received to send and test relevant parameter；
Step 3 is tested according to the test application and test parameter dynamic generation test case that receive and automatically；
Step 4 executes the test case of generation；
Step 5 returns to the implementing result of test case.
In the step 1, embedded system target side should meet tested condition.
In the step 2, embedded system target side will have the ability for receiving test case.
In the step 3, embedded system target side is wanted to be carried out according to test case and test parameter dynamic automatic
Test, Test coverage embedded system target side institute range to be measured.
In the step 4, embedded system target side has all executed test case.
In the step 4, for the test of each single item function and subsystem, there will be corresponding test return value
Judge the success or not of test.
In the step 5, embedded system target side returns to all test results.
The beneficial effects of the present invention are: the invention enables embedded systems can carry out software automatic test, survey is improved
It tries efficiency and meets test request, the requirement of the Embedded System Design complexity increasingly updated is met, suitable for having
The airborne avionics system of embedded system.
Detailed description of the invention
Fig. 1 is that built-in system software of the present invention tests general flow chart automatically.
Specific embodiment
For a better understanding of the present invention, the present invention is further described in the following with reference to the drawings and specific embodiments.
For the target machine under certain embedded system, can be applied on the airborne avionics system of multiple models, it is different by calling
Interface carries out application control and uses to meet polytypic.Write test program, with test parameter come control interface call relation and
Test function selection.
It is described in detail below for host end test case and relevant parameter transmitter system:
Step 1, a kind of specification is established, the test for meeting the covering all subsystems and function of this specification is write at host end
Use-case template, and selected system and function are tested with state modulator；
Step 2, test case compiling host end write generates test application；
Step 3, test application and corresponding test parameter are sent to embedded system target side；
Step 4, the test application implementing result of embedded system target side is waited to return；
Step 5, the test result returned to embedded system target side is analyzed.
In the step 1, specification includes testing the meaning of range, test depth and test parameter.Wherein test is wide
Degree include all embedded OSs, all airborne avionics system models applied by embedded system end used in it with
And function to be tested；Test depth includes all big functional modules and each big functional module at embedded system end
The subfunction part of beneath subdivision；The meaning of test parameter include examining system test range and test depth definition, to
The definition of the functional block of survey and the definition of subblock to be measured and test scope etc..
In the step 1, the format that bibliographic structure can be used in specification carries out the definition setting of test parameter, such as first
Grade indicates airborne avionics system model definition used in current embedded system, and the second level indicates used operation system at present
System type, the third level indicate the type definition for the big function block tested at present, and the fourth stage then indicates that each big function block is corresponding
Subblock.Specific example is as shown in table 1:
1 test parameter example of table
In the step 1, such as embedded system use is in model 3, and the operating system used is the operation of day arteries and veins 2 system
System, if necessary to carry out memory headroom application and release test, then test parameter be just selected as " 3.4.5.1 " and
“3.4.5.2”。
In the step 2, test application should carry out different branch process, first order ginseng in parsing to test parameter
Used model should be confirmed in number, including performing corresponding processing according to the requirement of each model；Second level parameter is then
OS Type is judged according to test parameter, to confirm that some and operating system binds the calling of relevant internal interface,
For example creation, task creation interface of semaphore etc. is different for the definition of its function of each operating system；Third level ginseng
Several and fourth stage parameter is then under the premise of preceding two-stage parameter has been acknowledged, as needed and model requires to call corresponding letter
Number.
In the step 2, when needing to test multiple functions, then needs to be passed to multiple test parameters and tested.Test
Application end is carried out according to incoming test parameter, the function interface and dynamic generation test case of dynamic call corresponding function block
The test of corresponding function block.
In the step 3, embedded system end is when parsing test application and test parameter, dynamically according to test application
The code branch walked when test application operation is determined with test parameter, and dynamic generation corresponds to test case.
In the step 4, the function return value in the test case of all functional blocks is protected at embedded system end
It deposits, an one-dimension array can be used and stored, the corresponding test return value of each test parameter, array element number
It is defined as the number of test parameter.It is returned after all return values are saved to return value array.
In the step 5, host end is after the return value array for receiving the return of embedded system end, to each return value
It is parsed and is judged, to analyze the test result of each test parameter.
The automatic test machine step of embedded system target side is described in detail below:
Step 1 establishes the specification as host end, starts embedded system target side according to specification；
Step 2, the test application for waiting host end to be received to send and test relevant parameter；
Step 3, according to the test application and test parameter dynamic generation test case received；
Step 4 is tested automatically at embedded system end；
Step 5 returns to the implementing result of test case.
In the step 1, description in the step 1 of specification content chummage main side includes test range, test depth
And the meaning of test parameter.
In the step 1, embedded system target side will have corresponding test condition, including there is plate grade to drive,
The image file of operating system to be measured will have enough memory spaces to store and run test application etc..
In the step 2 and step 3, embedded system target side will have reception and be joined according to test routine and test
Number automatically generates the ability of test program, and can run the test program generated.
In the step 4 and step 5, embedded system target side to have save each test parameter test return
The ability returned value and test return value is saved and returned.Each single item test parameter is judged according to each test return value
Test result.
Claims (3)
1. a kind of Software Automatic Testing Method applied to embedded system, it is characterised in that: the test case including host end
Template and relevant parameter send mechanism, the automatic test machine system of embedded system target side, i.e., have write test in host's generator terminal
Use-case template determines the relevant parameter of test, test case template and relevant parameter is then sent to embedded system
Target side automatically generates test case, and use-case to be tested executes test case after the completion of embedded system target side executes
As a result it returns.
2. a kind of Software Automatic Testing Method applied to embedded system as described in claim 1, it is characterised in that: described
The test case template and relevant parameter at host end send mechanism, and steps are as follows:
Step 1, the test case template for covering all subsystems and function is write at host end according to specification, and uses state modulator
Test selected system and function；
Step 2, test case compiling host end write generates test application；
Step 3, test application and corresponding test parameter are sent to embedded system target side；
Step 4, the test application implementing result of embedded system target side is waited to return；
Step 5, the test result returned to embedded system target side is analyzed.
3. a kind of Software Automatic Testing Method applied to embedded system as described in claim 1, it is characterised in that: insertion
The automatic test machine system at formula aims of systems end, steps are as follows:
Step 1 starts embedded system target side according to specification；
Step 2, the test application for waiting host end to be received to send and test relevant parameter；
Step 3 is tested according to the test application and test parameter dynamic generation test case that receive and automatically；
Step 4 executes the test case of generation；
Step 5 returns to the implementing result of test case.
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| CN111071481A (en) * | 2020-01-02 | 2020-04-28 | 北京航天测控技术有限公司 | Universal test platform integration method and system |
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| WO2021052325A1 (en) * | 2019-09-16 | 2021-03-25 | 上海御渡半导体科技有限公司 | Offline debugging method |
| CN112699033A (en) * | 2020-12-29 | 2021-04-23 | 中国航空工业集团公司西安飞机设计研究所 | Multi-partition airborne software test case multistage synchronous loading method |
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