CN109493767A - Mura defects compensate device and method - Google Patents
Mura defects compensate device and method Download PDFInfo
- Publication number
- CN109493767A CN109493767A CN201811278936.5A CN201811278936A CN109493767A CN 109493767 A CN109493767 A CN 109493767A CN 201811278936 A CN201811278936 A CN 201811278936A CN 109493767 A CN109493767 A CN 109493767A
- Authority
- CN
- China
- Prior art keywords
- mura
- station
- test
- turntable
- display panel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
- G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
- G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
- G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
- G09G3/3225—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
The present invention provides a kind of Mura defects to compensate equipment, is related to AMOLED display panel production technical field.This Mura defects compensation equipment includes: board, which is provided with rotation drive device；Turntable is set on board, and connect with rotation drive device, and board is disposed with along the circumferential direction of turntable and picks and places station, IC eliminates station, Mura test station and burning station, and turntable is equipped with test loaded tool, signal connector and PG signal generator；Mura test suite is set to the top of turntable, and in Mura test station, is used to shoot the luminescent image for going to the AMOLED display panel to be measured placed on test loaded tool below；And controller, it is electrically connected respectively with every PG signal generator and every Mura test suite.Mura defects in the present invention compensate equipment, AMOLED to be measured are carried using turntable, and compensate required all kinds of devices around turntable to be arranged, whole equipment is made to occupy little space, space utilization rate is high.
Description
Technical field
The present invention relates to AMOLED display panel production technical field, in particular to a kind of Mura defects compensation equipment and side
Method.
Background technique
OLED (Organic Light-Emitting Diode, Organic Light Emitting Diode) is used as a kind of current mode photophore
Part has been applied to more and more during high-performance shows.Due to its self luminous characteristic, with LCD (Liquid Crystal
Display, liquid crystal display) it compares, AMOLED (Active Matrix Organic Light Emitting Diode, it is main
Dynamic matrix organic LED) display panel have high contrast, ultra-thin, it is flexible many advantages, such as.
Mura refers to the display non-uniform phenomenon of display panel, for characterizing when display is shown with constant luminance, shows
Show the uneven of region.Mura defects are still the problem that AMOLED display panel faces at present, to solve this problem, in addition to
The improvement of technique would have to mention compensation technique.
Currently, the compensation method of the Mura defects of AMOLED display panel can be divided into internal compensation and external compensation two is big
Class.Internal compensation refers to be carried out in the sub-circuit of pixel inner utilization TFT (Film Transistor, thin film transistor (TFT)) building
The method of compensation.External compensation refer to by the electrically or optically characteristic of external driving circuit or device-aware pixel then into
The method of row compensation.External compensation can be divided into optics extraction-type and electricity extraction-type again according to the different of data pick-up method,
Optics extraction-type refers to AMOLED display panel is lighted after by optical CCD take a picture method luminance signal is extracted,
The mode that optics extracts has structure simple, the flexible advantage of method, therefore is widely adopted at this stage.
In the prior art, currently used optics extraction-type Mura defects compensation equipment is typically disposed in straight line shape
On assembly line, cause Mura defects compensation equipment the space occupied larger, and an AMOLED display surface to be measured need to have been operated
It could prepare the operation of next display panel after plate, while each process requires operator monitoring, and is manually assisted,
Waste of manpower, low efficiency.
Summary of the invention
The present invention provides a kind of Mura defects to compensate device and method, it is intended to improve Mura defects in the prior art and mend
Repay the larger technical problem of equipment the space occupied.
The present invention is implemented as follows:
One of work as Mura defects compensation equipment according to embodiments of the present invention characterized by comprising
One board, which is provided with rotation drive device；
One turntable is set on the board, and connect with the rotation drive device, and the board is along the turntable
It is circumferentially disposed with and picks and places station, IC elimination station, Mura test station and burning station, the turntable is equipped at least one
Test loaded tool, at least a signal connector and at least a PG signal generator are placed on each test loaded tool to be measured
The flexible circuit board of AMOLED display panel is electrically connected by a signal connector with a PG signal generator
It connects；
An at least Mura test suite is set to the top of the turntable, and in the Mura test station, uses
The luminescent image for the AMOLED display panel to be measured placed on the test loaded tool below is gone in shooting；And
One controller is electrically connected with each PG signal generator and each Mura test suite respectively,
To calculate offset data according to the luminescent image, and the offset data is burnt using the corresponding PG signal generator
In record to the integrated circuit of the corresponding AMOLED to be measured.
In addition, the Mura defects compensation equipment can also have following technology special in preferred embodiments of the present invention
Sign:
Further, the Mura test suite includes CCD camera and camera light source, and the camera light source is located at described
Between CCD camera and the turntable.
Further, when the test loaded tool is gone to below the CCD camera, the central axes of the CCD camera camera lens
It is vertical with the central point for the AMOLED display panel to be measured placed on the test loaded tool.
Further, circumference array arrangement is equipped with one on each carrier disk there are four carrier disk on the turntable
The test loaded tool is arranged, when any carrier disk is transferred on the designated position in any station, excess-three is described
Carrier disk is located on the designated position of other three stations.
Further, each test loaded tool is set to the top of a PG signal generator, and the PG signal occurs
Device is set on the corresponding carrier disk, and the side of each test loaded tool is respectively equipped with a signal connector, described
Signal connector is set to the top of the corresponding PG signal generator.
Further, the Mura defects compensation equipment includes Mura test suite described in a row, when any carrier
When disk is transferred to the designated position in the Mura test station, each test loaded tool on the carrier disk is just
Top is equipped with a Mura test suite.
Further, the board is provided with a light-blocking shell around the turntable, and the light-blocking shell is in the pick-and-place
It is provided with opening at station, an isolation barn door is provided between two neighboring station.
Further, the side of the Mura test station is equipped with side light source, and the side light source and the controller are electrical
Connection.
One of work as Mura defects compensation method according to embodiments of the present invention, is set applied to above-mentioned Mura defects compensation
In standby, the Mura defects compensation method includes:
Drive turntable rotation by rotation drive device, will be placed with the test loaded tool of AMOLED display panel to be measured from
It picks and places and is successively transferred in station on the designated position that IC is eliminated in station, Mura test station and burning station；
When the test loaded tool, which goes to the IC, eliminates the designated position in station, institute is removed by PG signal generator
State the original Mura data in the integrated circuit of AMOLED display panel to be measured；
When the test loaded tool goes to the designated position in the Mura test station, pass through the PG signal generator
The AMOLED display panel to be measured is lighted, and obtains the hair of the AMOLED display panel to be measured by Mura test suite
Light image, and offset data is calculated according to the luminescent image；
When the test loaded tool goes to the designated position in the burning station, by the PG signal generator by institute
Offset data is stated to be burned onto the integrated circuit of the AMOLED display panel to be measured.
In addition, the Mura defects compensation method can also have following technology special in preferred embodiments of the present invention
Sign:
Further, the side of the Mura test station is equipped with side light source, is obtained described by Mura test suite
After the step of luminescent image of the AMOLED display panel to be measured, further includes:
The PG signal generator is closed, and opens the side light source, and by described in Mura test suite acquisition
The dust granule image of AMOLED panel surface to be measured, and the luminescent image is carried out according to the dust granule image
Noise reduction.
The beneficial effects of the present invention are: the Mura defects compensation device and method that the present invention obtains by above-mentioned design, make
Used time can be used manually or mechanically hand and AMOLED display panel to be measured be put into the test loaded tool in turntable from picking and placing station
On, then controller control rotation drive device driving turntable rotation, test loaded tool is successively transferred to IC eliminate station,
On designated position in Mura test station and burning station, when test loaded tool, which goes to IC, to be eliminated in station, controller is logical
Cross PG signal generator and remove original Mura data in the integrated circuit of AMOLED display panel, when test loaded tool go to it is described
When in Mura test station, controller is lighted AMOLED display panel by PG signal generator, and passes through Mura test group
Part obtains the luminescent image of AMOLED display panel, and calculates offset data according to luminescent image；When test loaded tool goes to burning
When recording in station, offset data is burned onto the integrated circuit of AMOLED to be measured by controller by PG signal generator, complete
It is compensated at Mura defects.Therefore, this Mura defects compensates device and method, and entire compensation process can be completed voluntarily, without artificial
It assists, saves manpower, it is high-efficient, while AMOLED to be measured is carried using turntable, and compensate required all kinds of devices and surround and turn
Disk is arranged, and whole equipment is made to occupy little space, and space utilization rate is high, while settable multiple test loaded tools on each turntable,
And then it can realize that multiple AMOLED panels are synchronous and execute Mura defects compensation.
Detailed description of the invention
It, below will be to use required in embodiment in order to illustrate more clearly of the technical solution of embodiment of the present invention
Attached drawing be briefly described, it should be understood that the following drawings illustrates only certain embodiments of the present invention, therefore is not to be seen as
It is the restriction to range, it for those of ordinary skill in the art, without creative efforts, can be with root
Other relevant attached drawings are obtained according to these attached drawings.
Fig. 1 is the perspective view of the Mura defects compensation equipment in first embodiment of the invention；
Fig. 2 is the perspective view of the carrier disk in first embodiment of the invention；
Fig. 3 is the enlarged drawing in Fig. 2 at I
Fig. 4 is the main view of the Mura defects compensation equipment in first embodiment of the invention；
Fig. 5 is along Fig. 4 be middle line B-B vertical profile figure；
Fig. 6 is along Fig. 4 be middle line A-A transverse cross-sectional view；
Fig. 7 is the enlarged drawing in Fig. 5 at I
Fig. 8 is the flow chart of the Mura defects compensation method in first embodiment of the invention；
Fig. 9 is the transverse cross-sectional view of the Mura defects compensation equipment in second embodiment of the invention；
Figure 10 is the flow chart of the Mura defects compensation method in second embodiment of the invention.
The present invention that the following detailed description will be further explained with reference to the above drawings.
Specific embodiment
To keep the purposes, technical schemes and advantages of embodiment of the present invention clearer, implement below in conjunction with the present invention
The technical solution in embodiment of the present invention is clearly and completely described in attached drawing in mode, it is clear that described reality
The mode of applying is some embodiments of the invention, rather than whole embodiments.Based on the embodiment in the present invention, ability
Domain those of ordinary skill every other embodiment obtained without creative efforts, belongs to the present invention
The range of protection.Therefore, the detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit below and is wanted
The scope of the present invention of protection is sought, but is merely representative of selected embodiment of the invention.Based on the embodiment in the present invention,
Every other embodiment obtained by those of ordinary skill in the art without making creative efforts belongs to this
Invent the range of protection.
In the description of the present invention, it is to be understood that, term " on ", "lower", "front", "rear", "left", "right", " perpendicular
Directly ", the orientation or positional relationship of the instructions such as "horizontal", "top", "bottom", "inner", "outside" is orientation based on the figure or position
Relationship is set, is merely for convenience of description of the present invention and simplification of the description, rather than the equipment of indication or suggestion meaning or element are necessary
It with specific orientation, is constructed and operated in a specific orientation, therefore is not considered as limiting the invention.
In addition, term " first ", " second " are used for descriptive purposes only and cannot be understood as indicating or suggesting relative importance
Or implicitly indicate the quantity of indicated technical characteristic.Define " first " as a result, the feature of " second " can be expressed or
Implicitly include one or more of the features.In the description of the present invention, the meaning of " plurality " is two or more,
Unless otherwise specifically defined.
In the present invention unless specifically defined or limited otherwise, term " installation ", " connected ", " connection ", " fixation " etc.
Term shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or integral；It can be mechanical connect
It connects, is also possible to be electrically connected；It can be directly connected, can also can be in two elements indirectly connected through an intermediary
The interaction relationship of the connection in portion or two elements.It for the ordinary skill in the art, can be according to specific feelings
Condition understands the concrete meaning of above-mentioned term in the present invention.
In the present invention unless specifically defined or limited otherwise, fisrt feature second feature "upper" or "lower"
It may include that the first and second features directly contact, also may include that the first and second features are not direct contacts but pass through it
Between other characterisation contact.Moreover, fisrt feature includes the first spy above the second feature " above ", " above " and " above "
Sign is right above second feature and oblique upper, or is merely representative of first feature horizontal height higher than second feature.Fisrt feature exists
Second feature " under ", " lower section " and " following " include that fisrt feature is directly below and diagonally below the second feature, or is merely representative of
First feature horizontal height is less than second feature.
Embodiment 1
Fig. 1 to Fig. 7 is please referred to, the Mura defects compensation equipment showing in first embodiment of the invention, including a board
10,20, four Mura test suites 30 of a turntable and a controller (not shown).
The board 10 includes rack 11, the platform 12 set on 11 top of rack, the rotation in the rack 11
Rotary driving device 13 and the ring-shaped guide rail 14 at the top of the platform 12, the rotation drive device 13 are located at the platform 12
The lower section of center, output shaft pass through the platform 12, during the ring-shaped guide rail 14 with the rotation drive device 13 is
Thimble is around arrangement.
Wherein, the platform 12 uses marble platform, and marble platform stability is good, intensity is big, hardness is high, can be in weight
High-precision is kept under load.The rotation drive device 13 uses direct-drive motor (DD motor), greatly improves running accuracy, and adopt
With mode is directly connected to, reduce the position error generated due to mechanical structure, so that craft precision is guaranteed, also has quiet
The advantages of sound, energy conservation, steady, powerful.The bottom of the rack 11 is additionally provided with the auxiliary bodies such as support leg and castor.
The turntable 20 is set on the platform 12, and the output axis connection with the rotation drive device 13, and with institute
Ring-shaped guide rail 14 is stated to be slidably connected.When the rotation drive device 13 drives the turntable 20 to rotate, the turntable 20 will be with
The driving point of the rotation drive device 13 is rotation center rotation, and is slided along the ring-shaped guide rail 14, and running accuracy is improved.
Wherein, the platform 12 is disposed with along the circumferential direction of the turntable 20 and picks and places station 121, IC eliminates station 122,
Mura test station 123 and burning station 124.The board 10 is provided with a light-blocking shell 15 around the turntable 20, described
Light-blocking shell 15 is provided with opening at the pick-and-place station 121, to pick and place AMOLED display surface from pick-and-place station 121
Plate, while an isolation barn door 16 is provided between two neighboring station, the light-blocking shell 15 and the isolation barn door
16 are made by plastic-spraying black matte material.
Meanwhile there are four carrier disk 21, the tops of each carrier disk 21 for the top circumference array arrangement of the turntable 20
It is equipped with row's test loaded tool 22 in portion, and each row is all provided with that there are four the test loaded tool 22, each test loaded tools 22
Set on the top of a PG signal generator 23, the PG signal generator 23 is set in the corresponding carrier disk 21, each
The side of the test loaded tool 22 is respectively equipped with a signal connector 24, and the signal connector 24 is also set to the corresponding PG
The top of signal generator 23.The flexible circuit for the AMOLED display panel 200 to be measured placed on each test loaded tool 22
Plate 201 can be electrically connected by a signal connector 24 and a PG signal generator 24.In other embodiments
In the middle, also a vacuum adsorption mechanism can be set on each test loaded tool 22, to adsorb the AMOLED display panel to be measured being put into
200, keep panel relatively more stable.
Specifically, the signal connector 24 includes that a support base 241 and a crimping plate 242, the crimping plate 242 pass through
One shaft 243 is rotatably installed on the top of the support base 241, and a reduction torsion spring is sheathed in the shaft 243, and (figure is not
Show), the reduction torsion spring connects the support base 241 and the crimping plate 242, and the top of the support base 241, which is equipped with, to be connected
Contact angle (not shown), the connection feeler (not shown) are electrically connected by conducting wire and the PG signal generator of lower section 23
It connects.In the specific implementation, first can firmly press and crimp plate 242, and by the flexible circuit board of AMOLED display panel 200 to be measured
201 alignment connection feelers are simultaneously put to 242 lower section of crimping plate, are then unclamped crimping plate 242, under reduction torsion spring effect, are crimped plate
242 force flexible circuit board 201 to be pressed against on connection feeler, so that 23 electricity of AMOLED display panel 200 and PG signal generator
Property connection.
In addition to this, four carrier disks 21 meet when any carrier disk 21 is transferred to the finger in any station
When positioning is set, the excess-three carrier disk is located on the designated position of other three stations, this manner it is achieved that
It is gone in IC elimination station 122 when turntable 20 will pick and place the disk AMOLED display panel 200 to be measured being newly put into station 121
When, the AMOLED display panel 200 for having a disk to complete Mura defects supplement just is produced from burning station 124 to pick-and-place station
In 121, thus AMOLED display panel 200 to be measured constantly can be added into turntable 20, compensation efficiency greatly improves.
In the specific implementation, sensors in place can be set on the designated position in each station, so as to work as any load
When tool disk 21 is transferred on the designated position in any station, corresponding sensors in place will be sensed, the sensors in place
Including but not limited to optoelectronic switch, close switch, magnetic induction sensor, infrared sensor etc..
Four Mura test suites 30 are arranged in a row, and are respectively arranged at the top of turntable 20, and in described
In Mura test station 123, and when any carrier disk 21 is transferred on the designated position into the Mura test station 123
When, the surface of each test loaded tool 22 on the carrier disk 21 is equipped with the Mura test station 123, institute
Mura test station 123 is stated for shooting the AMOLED display panel to be measured for going on the test loaded tool 22 below and placing
200 luminescent image.
It should be understood that the test loaded tool 22, signal connector 23, PG signal generator 24 and Mura test suite
30 quantity is not limited to quantity described in the present embodiment, in other embodiments, can also can set according to actual needs
Set one or more.
Wherein, the Mura test suite 30 includes CCD camera 31 and camera light source 32, and the camera light source 32 is located at institute
It states between CCD camera 31 and the turntable 20, and when the test loaded tool 22 goes to 31 lower section of CCD camera, the CCD
The central point of AMOLED display panel 200 to be measured placed on the central axes of 31 camera lens of camera and the test loaded tool 22 is vertical,
Ensure that CCD camera 31 can capture entire display panel.
The controller 40 electrically connects with each PG signal generator 23 and each Mura test suite respectively
It connects, to calculate offset data according to the luminescent image, and utilizes the corresponding PG signal generator by the compensation number
According to being burned onto the integrated circuit of the corresponding AMOLED to be measured.
Wherein, the controller is a host computer, uses GPU to handle image, while the controller 40 is using existing
Some Mura defects backoff algorithms calculate offset data, and detailed process is first to carry out distortion processing to luminescent image, detection
Then the region Mura of AMOLED display panel out counts the region Mura detected using Mura defects backoff algorithm
It calculates, to form Mura offset data table.In the present embodiment, the controller passes through wireless network connection, the nothing respectively
Gauze network can be WIFI, radio frequency, bluetooth etc..
Another aspect of the present invention also proposes a kind of matching used Mura defects compensation method, referring to Fig. 8, showing this
Mura defects compensation method in invention first embodiment is applied to Mura defects in first embodiment of the invention and compensates equipment
In the middle, the Mura defects compensation method includes step S01 to step S04.
Step S01 drives turntable rotation by rotation drive device, will be placed with the survey of AMOLED display panel to be measured
Examination carrier is successively transferred to the designated position in IC elimination station, Mura test station and burning station in pick-and-place station
On.
It in the specific implementation, can be first with manually or mechanically hand toward each hollow testing carrier being currently in pick-and-place station
On be respectively put into an AMOLED display panel to be measured, and by the flexible circuit board of each AMOLED display panel to be measured with it is corresponding
Signal connector connection, to make each AMOLED display panel to be measured that can establish with the PG signal generator of respective lower section
Connection.
In addition to this, when test loaded tool is transferred on the designated position in each station, it can instruct rotation drive device and exist
Stop driving turntable rotation in setting time, so that the inter-related task in the station can be completed by time enough, has served as
After setting time, rotation drive device drives turntable to rotate again, and test loaded tool is gone in next station.In other implementations
In example, rotation drive device can also be made with setting speed driving turntable rotation, to complete defect under reasonable rotation situation
Compensation.
Step S02 is occurred when the test loaded tool, which goes to the IC, eliminates the designated position in station by PG signal
Device removes the original Mura data in the integrated circuit of the AMOLED display panel to be measured.
Step S03 is believed when the test loaded tool goes to the designated position in the Mura test station by the PG
Number generator lights the AMOLED display panel to be measured, and obtains the AMOLED display panel to be measured by CCD camera
Luminescent image, and offset data is calculated according to the luminescent image.
Step S04 is sent out when the test loaded tool goes to the designated position in the burning station by the PG signal
The offset data is burned onto the integrated circuit of the AMOLED to be measured by raw device.
To sum up, the Mura defects in the above embodiment of the present invention compensate device and method, and entire compensation process can be voluntarily
It completes, without manually assisting, saving manpower is high-efficient, while AMOLED to be measured is carried using turntable, and each needed for compensation
Class device is arranged around turntable, and whole equipment is made to occupy little space, and space utilization rate is high, while settable more on each turntable
A test loaded tool, and then can realize that multiple AMOLED panels are synchronous and execute Mura defects compensation.
Embodiment 2
Fig. 9 is please referred to, show the Mura defects compensation equipment that second embodiment of the invention works as, in the present embodiment
Mura defects compensate the Mura defects compensation equipment in equipment and first embodiment the difference is that, the Mura defects
Compensation equipment still further comprises a side light source 40.
The side light source 40 is set to the side of the Mura test station 123, the side light source 40 and the controller electricity
Property connection.The position of the side light source 40 should meet, can be irradiated to go to it is each to be measured in Mura test station 123
The surface of AMOLED display panel 200.
It should be pointed out that the compensation equipment of Mura defects provided by the embodiment of the present invention 2, realization principle and generation
Technical effect and embodiment 1 are identical, and to briefly describe, the present embodiment does not refer to place, can refer to corresponding contents in embodiment 1.
Figure 10 is please referred to, Mura defects compensation method in second embodiment of the invention is shown, is applied to the present invention the
In two embodiments in Mura defects compensation equipment, the Mura defects compensation method includes step S11 to step S16.
Step S11 drives turntable rotation by rotation drive device, will be placed with the survey of AMOLED display panel to be measured
Examination carrier is successively transferred to the designated position in IC elimination station, Mura test station and burning station in pick-and-place station
On；
Step S12 is occurred when the test loaded tool, which goes to the IC, eliminates the designated position in station by PG signal
Device removes the original Mura data in the integrated circuit of the AMOLED display panel to be measured；
Step S13, when the test loaded tool goes to the designated position in the Mura test station, under RGB mode,
Multiple grayscale values are inputted to the AMOLED display panel to be measured by the PG signal generator, and under each grayscale, point
It is not taken pictures by CCD camera to the AMOLED display panel to be measured, to obtain multiple luminescent images.
Step S14 closes the PG signal generator, and opens the side light source, and passes through the Mura test suite
The dust granule image of the AMOLED panel surface to be measured is obtained, and is shone according to the dust granule image to described
Image carries out noise reduction.
Step S15 calculates offset data according to the luminescent image after noise reduction.
Step S16 is sent out when the test loaded tool goes to the designated position in the burning station by the PG signal
The offset data is burned onto the integrated circuit of the AMOLED display panel to be measured by raw device.
It should be pointed out that it is multiple one can also to be added between burning station and pick-and-place station in other embodiments
Station is looked into, which equally has matched CCD camera, to check compensated AMOLED panel.
The foregoing is merely the preferred embodiment of the present invention, are not intended to restrict the invention, for this field
For technical staff, the invention may be variously modified and varied.All within the spirits and principles of the present invention, made any
Modification, equivalent replacement, improvement etc., should all be included in the protection scope of the present invention.
Claims (10)
1. a kind of Mura defects compensate equipment characterized by comprising
One board, which is provided with rotation drive device；
One turntable is set on the board, and connect with the rotation drive device, circumferential direction of the board along the turntable
It is disposed with and picks and places station, IC elimination station, Mura test station and burning station, the turntable is equipped at least one test
Carrier, at least a signal connector and at least a PG signal generator, the AMOLED to be measured placed on each test loaded tool
The flexible circuit board of display panel is electrically connected by a signal connector and a PG signal generator；
An at least Mura test suite is set to the top of the turntable, and in the Mura test station, is used to clap
Take the photograph the luminescent image that the AMOLED display panel to be measured placed is gone on the test loaded tool below；And
One controller is electrically connected, with root respectively with each PG signal generator and each Mura test suite
Offset data is calculated according to the luminescent image, and is burned onto the offset data using the corresponding PG signal generator
In the integrated circuit of the corresponding AMOLED to be measured.
2. Mura defects according to claim 1 compensate equipment, which is characterized in that the Mura test suite includes CCD
Camera and camera light source, the camera light source is between the CCD camera and the turntable.
3. Mura defects according to claim 2 compensate equipment, which is characterized in that described in being gone to when the test loaded tool
When below CCD camera, the AMOLED display panel to be measured placed on the central axes of the CCD camera camera lens and the test loaded tool
Central point it is vertical.
4. Mura defects according to claim 1 compensate equipment, which is characterized in that circumference array is placed on the turntable
Four carrier disks are equipped with test loaded tool described in a row on each carrier disk, when any carrier disk be transferred to it is any
When on the designated position in station, the excess-three carrier disk is located on the designated position of other three stations.
5. Mura defects according to claim 4 compensate equipment, which is characterized in that each test loaded tool is set to an institute
The top of PG signal generator is stated, the PG signal generator is set on the corresponding carrier disk, each test loaded tool
Side be respectively equipped with a signal connector, the signal connector is set to the top of the corresponding PG signal generator
Portion.
6. Mura defects according to claim 4 compensate equipment, which is characterized in that the Mura defects compensate equipment and include
Mura test suite described in one row, when any carrier disk is transferred to the designated position in the Mura test station
When, the surface of each test loaded tool on the carrier disk is equipped with a Mura test suite.
7. Mura defects according to claim 1 compensate equipment, which is characterized in that the board is arranged around the turntable
There is a light-blocking shell, the light-blocking shell is provided with opening at the pick-and-place station, is provided between two neighboring station
One isolation barn door.
8. Mura defects according to claim 1 compensate equipment, which is characterized in that the side of the Mura test station is set
There is side light source, the side light source and the controller are electrically connected.
9. a kind of Mura defects compensation method, which is characterized in that be applied to the described in any item Mura defects of claim 1 to 8
It compensates in equipment, the Mura defects compensation method includes:
Turntable rotation is driven by rotation drive device, the test loaded tool of AMOLED display panel to be measured will be placed with from pick-and-place
It is successively transferred in station on the designated position that IC is eliminated in station, Mura test station and burning station；
When the test loaded tool, which goes to the IC, eliminates the designated position in station, by PG signal generator remove it is described to
Survey the original Mura data in the integrated circuit of AMOLED display panel；
When the test loaded tool goes to the designated position in the Mura test station, by the PG signal generator by institute
It states AMOLED display panel to be measured to light, and obtains the illuminated diagram of the AMOLED display panel to be measured by Mura test suite
Picture, and offset data is calculated according to the luminescent image；
When the test loaded tool goes to the designated position in the burning station, by the PG signal generator by the benefit
It repays in data recording to the integrated circuit of the AMOLED display panel to be measured.
10. Mura defects compensation method according to claim 9, which is characterized in that the side of the Mura test station
Equipped with side light source, the luminescent image for obtaining the AMOLED display panel to be measured by Mura test suite the step of it
Afterwards, further includes:
The PG signal generator is closed, and opens the side light source, and is described to be measured by Mura test suite acquisition
The dust granule image of AMOLED panel surface, and the luminescent image is dropped according to the dust granule image
It makes an uproar.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811278936.5A CN109493767A (en) | 2018-10-30 | 2018-10-30 | Mura defects compensate device and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811278936.5A CN109493767A (en) | 2018-10-30 | 2018-10-30 | Mura defects compensate device and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109493767A true CN109493767A (en) | 2019-03-19 |
Family
ID=65693301
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811278936.5A Pending CN109493767A (en) | 2018-10-30 | 2018-10-30 | Mura defects compensate device and method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109493767A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109903717A (en) * | 2019-04-26 | 2019-06-18 | 京东方科技集团股份有限公司 | Recognition methods, compensation method and the device in the speck region of display panel |
| CN110534045A (en) * | 2019-08-20 | 2019-12-03 | 武汉精立电子技术有限公司 | A kind of efficient Demura process flow operation method and system |
| CN110723478A (en) * | 2019-09-27 | 2020-01-24 | 苏州精濑光电有限公司 | Display panel overhauls device |
| CN111752020A (en) * | 2020-06-24 | 2020-10-09 | 苏州精濑光电有限公司 | Detection device |
| CN113347834A (en) * | 2021-06-17 | 2021-09-03 | 广州国显科技有限公司 | Brightness compensation device and brightness compensation equipment |
| CN114006967A (en) * | 2021-10-21 | 2022-02-01 | 上海晨兴希姆通电子科技有限公司 | Mobile phone test equipment and test method thereof |
Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN203304203U (en) * | 2013-05-11 | 2013-11-27 | 东莞市中之光电科技有限公司 | Improved structure of LED (Light Emitting Diode) testing sorting machine |
| CN103940832A (en) * | 2013-01-17 | 2014-07-23 | 北京兆维电子(集团)有限责任公司 | Lighting device for automatic optical detection on flat display screen |
| CN204490004U (en) * | 2014-12-31 | 2015-07-22 | 浙江鼎炬电子科技股份有限公司 | A kind of carrier and the Novel conveying device based on this carrier |
| CN106782264A (en) * | 2016-12-27 | 2017-05-31 | 武汉精测电子技术股份有限公司 | Module color spot prosthetic device and method based on PCGPU |
| CN106770362A (en) * | 2016-12-27 | 2017-05-31 | 武汉精测电子技术股份有限公司 | Gross imperfection detection means and method based on AOI |
| CN206716519U (en) * | 2017-04-27 | 2017-12-08 | 东莞市诺尔佳电子有限公司 | A kind of charger ATE |
| CN207365991U (en) * | 2017-09-18 | 2018-05-15 | 广东天机工业智能系统有限公司 | Detection device |
| CN207533577U (en) * | 2017-11-01 | 2018-06-26 | 江苏凯尔生物识别科技有限公司 | Biochip non-defective unit automatic sieving mechanism |
| CN108507759A (en) * | 2018-04-16 | 2018-09-07 | 昆山精讯电子技术有限公司 | A kind of display panel testing and detection method |
| CN108594484A (en) * | 2018-04-19 | 2018-09-28 | 武汉精测电子集团股份有限公司 | Panel detection and reparation integral system |
| CN108648673A (en) * | 2018-07-06 | 2018-10-12 | 武汉精测电子集团股份有限公司 | A kind of OTP+Demura for OLED display screen compensates equipment |
| CN108682365A (en) * | 2018-04-18 | 2018-10-19 | 武汉精测电子集团股份有限公司 | A kind of detection of OLED color spots with repair integral system, method |
-
2018
- 2018-10-30 CN CN201811278936.5A patent/CN109493767A/en active Pending
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103940832A (en) * | 2013-01-17 | 2014-07-23 | 北京兆维电子(集团)有限责任公司 | Lighting device for automatic optical detection on flat display screen |
| CN203304203U (en) * | 2013-05-11 | 2013-11-27 | 东莞市中之光电科技有限公司 | Improved structure of LED (Light Emitting Diode) testing sorting machine |
| CN204490004U (en) * | 2014-12-31 | 2015-07-22 | 浙江鼎炬电子科技股份有限公司 | A kind of carrier and the Novel conveying device based on this carrier |
| CN106782264A (en) * | 2016-12-27 | 2017-05-31 | 武汉精测电子技术股份有限公司 | Module color spot prosthetic device and method based on PCGPU |
| CN106770362A (en) * | 2016-12-27 | 2017-05-31 | 武汉精测电子技术股份有限公司 | Gross imperfection detection means and method based on AOI |
| CN206716519U (en) * | 2017-04-27 | 2017-12-08 | 东莞市诺尔佳电子有限公司 | A kind of charger ATE |
| CN207365991U (en) * | 2017-09-18 | 2018-05-15 | 广东天机工业智能系统有限公司 | Detection device |
| CN207533577U (en) * | 2017-11-01 | 2018-06-26 | 江苏凯尔生物识别科技有限公司 | Biochip non-defective unit automatic sieving mechanism |
| CN108507759A (en) * | 2018-04-16 | 2018-09-07 | 昆山精讯电子技术有限公司 | A kind of display panel testing and detection method |
| CN108682365A (en) * | 2018-04-18 | 2018-10-19 | 武汉精测电子集团股份有限公司 | A kind of detection of OLED color spots with repair integral system, method |
| CN108594484A (en) * | 2018-04-19 | 2018-09-28 | 武汉精测电子集团股份有限公司 | Panel detection and reparation integral system |
| CN108648673A (en) * | 2018-07-06 | 2018-10-12 | 武汉精测电子集团股份有限公司 | A kind of OTP+Demura for OLED display screen compensates equipment |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109903717A (en) * | 2019-04-26 | 2019-06-18 | 京东方科技集团股份有限公司 | Recognition methods, compensation method and the device in the speck region of display panel |
| CN109903717B (en) * | 2019-04-26 | 2022-06-21 | 京东方科技集团股份有限公司 | Identification method, compensation method and device for bright spot area of display panel |
| CN110534045A (en) * | 2019-08-20 | 2019-12-03 | 武汉精立电子技术有限公司 | A kind of efficient Demura process flow operation method and system |
| CN110534045B (en) * | 2019-08-20 | 2022-11-29 | 武汉精立电子技术有限公司 | Efficient Demura process operation method and system |
| CN110723478A (en) * | 2019-09-27 | 2020-01-24 | 苏州精濑光电有限公司 | Display panel overhauls device |
| CN111752020A (en) * | 2020-06-24 | 2020-10-09 | 苏州精濑光电有限公司 | Detection device |
| CN113347834A (en) * | 2021-06-17 | 2021-09-03 | 广州国显科技有限公司 | Brightness compensation device and brightness compensation equipment |
| CN114006967A (en) * | 2021-10-21 | 2022-02-01 | 上海晨兴希姆通电子科技有限公司 | Mobile phone test equipment and test method thereof |
| CN114006967B (en) * | 2021-10-21 | 2023-11-28 | 上海晨兴希姆通电子科技有限公司 | Mobile phone testing equipment and testing method thereof |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN109493767A (en) | Mura defects compensate device and method | |
| US7860296B2 (en) | Method and system for testing a display panel assembly | |
| US6879180B2 (en) | Display panel inspection apparatus and inspection method | |
| CN206321579U (en) | Flexible display screen multistation single vision AOI detection platforms | |
| TW200914920A (en) | Apparatus for manufacturing bonded substrate | |
| CN110657946B (en) | Screen defect detection system, screen detection line and screen defect detection method | |
| WO2014101304A1 (en) | Defect detection method and device for display panel | |
| CN209745840U (en) | Appearance detection system for capacitive module screen | |
| CN105424717A (en) | Optical detection device for detecting multiple defects | |
| CN105182209A (en) | Micro display chip production detection system and method | |
| CN109657606B (en) | Correction method of optical fingerprint sensor module | |
| CN108672312A (en) | Optical detector, optical detecting method and computer readable storage medium | |
| CN110044926A (en) | A kind of lens defect detection device | |
| CN102768017A (en) | Line width measuring device and method | |
| CN107065248B (en) | Optical compensation method and system of display panel | |
| CN108414197B (en) | Panel lighting test device | |
| CN114646646A (en) | AVI (amplitude versus voltage) inspection system for circuit defects of flexible circuit board | |
| CN106802500A (en) | Indexing type liquid crystal cell check device | |
| CN206990465U (en) | The defects of liquid crystal panel detection means | |
| CN101408520A (en) | Detection method and system for discriminating flaws of inner and outer layers | |
| JP6259806B2 (en) | 3D measuring device | |
| CN208661788U (en) | Optical detector | |
| CN114694525B (en) | Micro display laminating system and method | |
| CN102740113A (en) | Sensitization measurement device of miniature camera | |
| CN206377424U (en) | A kind of camera load bearing arm for electronic equipment screen quality shot detection |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20190319 |
|
| RJ01 | Rejection of invention patent application after publication |