CN203304203U - Improved structure of LED (Light Emitting Diode) testing sorting machine - Google Patents
Improved structure of LED (Light Emitting Diode) testing sorting machine Download PDFInfo
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- CN203304203U CN203304203U CN2013202534339U CN201320253433U CN203304203U CN 203304203 U CN203304203 U CN 203304203U CN 2013202534339 U CN2013202534339 U CN 2013202534339U CN 201320253433 U CN201320253433 U CN 201320253433U CN 203304203 U CN203304203 U CN 203304203U
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- led
- feeding
- testing
- nozzle
- vavuum pump
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Abstract
The utility model discloses an improved structure of an LED (Light Emitting Diode) testing sorting machine. The improved structure comprises a material fetching nozzle, a rotary table, a testing head and a vacuum pump, wherein a plurality of testing positions are uniformly distributed on the periphery of the rotary table; each testing position is connected with the air suction end of the vacuum pump and is used for loading an LED; the material fetching nozzle is connected with the air exhausting end of the vacuum pump; an air path between the material fetching nozzle and the vacuum pump is further connected with a vacuum generator in parallel. The air suction end of the vacuum pump is only connected with the testing positions of the rotary table so as to guarantee negative pressures of the testing positions of the rotary table; the material fetching nozzle is arranged on the air exhausting end of the vacuum pump and the air path is connected with one vacuum generator in parallel; the air exhausting end of the vacuum pump is ingeniously used for driving the vacuum generator so as to provide a vacuum adsorption force for the material fetching nozzle; the vacuum generator greatly enhances the adsorption effect on the LEDs by the material fetching nozzle so that the charging and the discharging of the material fetching nozzle are guaranteed; the stability to the adsorption of the LEDs in the feeding process of the rotary table is guaranteed; the material falling rate of the LEDs is greatly reduced and the testing efficiency is improved; damages to the LEDs in the testing process are reduced.
Description
Technical field
The utility model relates to a kind of structure-improved of LED Test handler.
Background technology
LED all needs parameters is tested after completing production, and volume is little due to the LED enormous amount, during test, all adopts the testing equipment of automation to carry out, and the LED Test handler is exactly a kind of for the equipment of test LED automatically.In the LED Test handler, a part and parcel is exactly automatically LED to be put into to the pay-off under measuring head, the pay-off of tradition LED Test handler is to chew by feeding the test bit of LED being put into to rotating disk, by rotating disk, proceeded under measuring head to complete after test and send back again feeding and chew, feeding is chewed with rotating disk and is all adopted the mode of vacuum intake to transmit LED, and feeding is chewed the suction end that all is arranged at vavuum pump with rotating disk, yet, because the negative pressure of vavuum pump suction end is inadequate, while making the LED Test handler pick and place in the process of material, there is LED to drop, dressing drop ratio is about 3/1000ths, because dressing drop ratio is higher, not only affect test speed, and the LED that falls material causes easily badly, reduced yields.
The utility model content
The purpose of this utility model is to provide a kind of structure-improved of LED Test handler, and the structure-improved of this a kind of LED Test handler makes dressing drop ratio little, has improved test speed and yields.
For achieving the above object, the technical solution adopted in the utility model is as follows:
A kind of structure-improved of LED Test handler, comprise that feeding is chewed, rotating disk, measuring head, vavuum pump, and the rotating disk periphery is evenly equipped with some test bits, and each test bit all is connected with the suction end of vavuum pump, be used to loading LED; Feeding is chewed and with described vavuum pump, is obtained exhaust end and be connected, and feeding is chewed and vavuum pump between gas circuit also be parallel with a vacuum generator.
Between described vavuum pump and feeding are chewed, and vacuum generator and feeding are respectively equipped with the magnetic valve of controlling the source of the gas break-make between chewing.
Described feeding is chewed and vavuum pump, vacuum generator between also be provided with vacuum filter.
Described measuring head is provided with the driving cylinder, and this driving cylinder is connected with the exhaust end of described vavuum pump, and also is provided with magnetic valve between driving cylinder and vavuum pump.
The beneficial effects of the utility model are: the suction end of vavuum pump only is connected with the test bit of rotating disk, has guaranteed the negative pressure of rotating disk test bit, namely to the adsorption effect of LED; Feeding is chewed the exhaust end of being located at vavuum pump, an and also in parallel vacuum generator on gas circuit, utilize dexterously the exhaust end of vavuum pump to drive vacuum generator, thereby chew vacuum adsorption force is provided for feeding, not only avoided sucker and feeding in the prior art to chew the deficiency that shares negative pressure, and this independently vacuum generator greatly strengthened feeding and chewed the adsorption effect to LED; Thereby guaranteed that feeding chews material loading, blanking, and the stability of in the rotating disk feeding process, LED being adsorbed, greatly reduced the dressing drop ratio of LED, in actual the use, be about ten thousand/, therefore also improved the efficiency of test and reduced in the test process damage to LED.
The accompanying drawing explanation
Below in conjunction with accompanying drawing, the utility model is described further:
Fig. 1 is a kind of structure improved electrical schematics of LED Test handler.
The specific embodiment
With reference to figure 1, a kind of structure-improved of LED Test handler, comprise with the feeding of feed mechanism and cutting agency interlock and chew 100, for the feeding of LED to be tested and tested the sorting blanking of LED; Rotating disk 200, its periphery is evenly equipped with some test bits, and each test bit is loaded LED by negative-pressure adsorption; Measuring head 300, be connected with testing equipment, and this measuring head 300 contacts with LED by driving cylinder 310 drivings when test; Vavuum pump 400, for pneumatic supply, its suction end is connected with the test bit of rotating disk 200, for the test bit of rotating disk 200 provides negative-pressure adsorption power, its exhaust end is connected with the driving cylinder 310 of measuring head 300, provides power for driving cylinder 310, simultaneously, the exhaust end of vavuum pump 400 is chewed 100 with feeding and is connected, and also is parallel with vacuum generator 500 on this gas circuit, and vacuum generator 500 utilizes the exhaust end air pressure of vavuum pump 400 to chew 100 for feeding negative pressure source is provided; Vavuum pump 400 and feeding are chewed 100, are driven between cylinder 310, and vacuum generator 500 chews between 100 with feeding the magnetic valve 600 that is respectively equipped with control source of the gas break-make; Feeding chew 100 and vavuum pump 400, vacuum generator 500 between also be provided with vacuum filter 700; In whole gas circuit, also be provided with air filter 800.
The suction end of vavuum pump only is connected with the test bit of rotating disk, has guaranteed the negative pressure of rotating disk test bit, namely to the adsorption effect of LED; Feeding is chewed the exhaust end of being located at vavuum pump, an and also in parallel vacuum generator on gas circuit, utilize dexterously the exhaust end of vavuum pump to drive vacuum generator, thereby chew vacuum adsorption force is provided for feeding, not only avoided sucker and feeding in the prior art to chew the deficiency that shares negative pressure, and this independently vacuum generator greatly strengthened feeding and chewed the adsorption effect to LED; Thereby guaranteed that feeding chews material loading, blanking, and the stability of in the rotating disk feeding process, LED being adsorbed, greatly reduced the dressing drop ratio of LED, in actual the use, be about ten thousand/, therefore also improved the efficiency of test and reduced in the test process damage to LED.
Above embodiment just is explanation rather than restriction the utility model, therefore all equivalences of doing according to the described method of the utility model patent claim change or modify, is included in the utility model patent claim.
Claims (4)
1. the structure-improved of a LED Test handler is characterized in that: comprise that feeding is chewed, rotating disk, measuring head, vavuum pump, the rotating disk periphery is evenly equipped with some test bits, and each test bit all is connected with the suction end of vavuum pump, be used to loading LED; Feeding is chewed and with described vavuum pump, is obtained exhaust end and be connected, and feeding is chewed and vavuum pump between gas circuit also be parallel with a vacuum generator.
2. the structure-improved of a kind of LED Test handler according to claim 1 is characterized in that: between described vavuum pump and feeding are chewed, and vacuum generator and feeding are respectively equipped with the magnetic valve of controlling the source of the gas break-make between chewing.
3. the structure-improved of a kind of LED Test handler according to claim 1 and 2 is characterized in that: described feeding is chewed and vavuum pump, vacuum generator between also be provided with vacuum filter.
4. the structure-improved of a kind of LED Test handler according to claim 1 and 2, it is characterized in that: described measuring head is provided with the driving cylinder, and this drives cylinder and is connected with the exhaust end of described vavuum pump, and also is provided with magnetic valve between driving cylinder and vavuum pump.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2013202534339U CN203304203U (en) | 2013-05-11 | 2013-05-11 | Improved structure of LED (Light Emitting Diode) testing sorting machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2013202534339U CN203304203U (en) | 2013-05-11 | 2013-05-11 | Improved structure of LED (Light Emitting Diode) testing sorting machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203304203U true CN203304203U (en) | 2013-11-27 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2013202534339U Expired - Fee Related CN203304203U (en) | 2013-05-11 | 2013-05-11 | Improved structure of LED (Light Emitting Diode) testing sorting machine |
Country Status (1)
| Country | Link |
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| CN (1) | CN203304203U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106216269A (en) * | 2015-12-31 | 2016-12-14 | 陕西理工学院 | A kind of big array resistors formula foil gauge automatic sorting method |
| CN106345709A (en) * | 2015-12-31 | 2017-01-25 | 陕西理工学院 | Automatic detection, profiling and sorting method for macroarray resistance strain gages |
| CN109493767A (en) * | 2018-10-30 | 2019-03-19 | 合肥市商巨智能装备有限公司 | Mura defects compensate device and method |
| CN116002371A (en) * | 2022-11-30 | 2023-04-25 | 北京东舟技术股份有限公司 | Electric vacuum adsorber |
-
2013
- 2013-05-11 CN CN2013202534339U patent/CN203304203U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106216269A (en) * | 2015-12-31 | 2016-12-14 | 陕西理工学院 | A kind of big array resistors formula foil gauge automatic sorting method |
| CN106345709A (en) * | 2015-12-31 | 2017-01-25 | 陕西理工学院 | Automatic detection, profiling and sorting method for macroarray resistance strain gages |
| CN109493767A (en) * | 2018-10-30 | 2019-03-19 | 合肥市商巨智能装备有限公司 | Mura defects compensate device and method |
| CN116002371A (en) * | 2022-11-30 | 2023-04-25 | 北京东舟技术股份有限公司 | Electric vacuum adsorber |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C56 | Change in the name or address of the patentee |
Owner name: DONGGUAN ZHONGZHI PHOTOVOLTAIC CO., LTD. Free format text: FORMER NAME: DONGGUAN SINO-WIN OPTOELECTRONIC TECHNOLOGY CO., LTD. |
|
| CP03 | Change of name, title or address |
Address after: 3 No. 523000 Guangdong province Dongguan Songshan Lake Park Avenue Patentee after: DONGGUAN SINOWIN OPTO-ELECTRONIC CO., LTD. Address before: 523808, 3, Xincheng Road, Songshan Lake, Guangdong, Dongguan Patentee before: Dongguan Sinowin Opto-Electronic Technology Co., Ltd. |
|
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20131127 Termination date: 20180511 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |