CN109489941B - Testing system for low-light-level image intensifier - Google Patents
Testing system for low-light-level image intensifier Download PDFInfo
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- CN109489941B CN109489941B CN201811362079.7A CN201811362079A CN109489941B CN 109489941 B CN109489941 B CN 109489941B CN 201811362079 A CN201811362079 A CN 201811362079A CN 109489941 B CN109489941 B CN 109489941B
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Abstract
A testing system for a low-light-level image intensifier comprises a testing box for accommodating a tested low-light-level image intensifier, a testing power supply assembly for providing working power supply for the tested low-light-level image intensifier, an illumination assembly for providing testing optical signal input for the tested low-light-level image intensifier, and a recording assembly for receiving an output optical signal generated by the tested low-light-level image intensifier based on the testing optical signal input, converting the output optical signal into a testing electrical signal and recording voltage data of the testing electrical signal; the illumination subassembly is including being used for sending the illuminator of test light signal and the leaded light device that is used for transmitting test light signal, test power supply subassembly, illuminator and record subassembly all set up outside the test box, the leaded light device sets up inside the test box, be used for with the test light signal transmission that illuminator sent gives the glimmer image intensifier of being tested is as test light signal input.
Description
Technical Field
The invention relates to the field of photoelectric technology, in particular to a dim light image intensifier testing system for testing high and low temperature illumination of a dim light image intensifier.
Background
The low-light level image intensifier mainly comprises a high-voltage power supply and an image intensifier tube, belongs to a high-voltage vacuum device, and has important application in the fields of military, scientific research and the like. In real-world applications, the image intensifier is often required to work normally under extreme environments and cannot cause any problems, so that a test system with variable temperature and variable illumination is required to test the quality of the image intensifier.
In order to check the quality reliability of the image intensifier and the high-voltage power supply used by the image intensifier, in actual production, a power supply high-low temperature test system is generally used for carrying out high-low temperature test on the high-voltage power supply, if the high-voltage power supply is qualified in test, the high-voltage power supply and an image intensifier tube are connected to form the image intensifier, and then the image intensifier is subjected to high-low temperature test by the image intensifier high-low temperature test system. Two different test systems are used before and after the method, so that the test process is possibly too complicated, more resources are occupied, and the following problems can also exist:
1. when the high-voltage power supply is subjected to output test, the high-voltage power supply has high insulation treatment requirement due to the fact that the output of the high-voltage power supply is as high as 10kV, and is very sensitive to humidity, so that high-voltage discharge is very easy to occur in a high-humidity environment. In the existing high-low temperature test box, the protection measures for high-voltage discharge are mostly to sleeve an insulating sheath on a high-voltage output line of a high-voltage power supply, then lead the insulating sheath out through a hole on a box door, and then connect the high-voltage output line with an external test system, wherein the hole is sealed by a soft plug. However, when a low temperature test is performed, the temperature may be as low as-55 ℃, and at this time, the soft plug may not be able to completely seal the hole due to shrinkage when it is cooled, so that the phenomena of fog, condensation or frost formation and the like are likely to occur in the box body, and at this time, although the output line is covered with the insulation skin, high voltage discharge is also likely to occur, which may adversely affect the high voltage test. In addition, fogging in the chamber can also severely affect the light input and accurate measurement of the image intensifier screen output brightness.
2. The function of the image intensifier is to intensify weak light to adapt to human eye observation, so that a light source is needed to provide external light with different illumination intensities to the cathode of the image intensifier during testing, and meanwhile, the brightness of the light output by the image intensifier needs to be monitored and recorded in real time. The existing light source design generally places the light source module outside the high and low temperature chamber, and then transmits the light to the cathode of the intensifier through a cylindrical glass tube embedded in the hole of the wall of the high and low temperature chamber. By using the method, only one image intensifier can be tested each time, and the testing working efficiency is very low.
3. The existing input light rays with different illumination intensities are selected through optical filters and light shields with different attenuations, the range of the achievable illumination intensity is narrow, linear change of the illumination cannot be achieved, automatic change of the illumination along with program setting cannot be achieved, and the scientific research and thorough research test are not facilitated. In addition, the original output brightness test module is that the photoelectric conversion test module is arranged in a high-low temperature box, the brightness test module and the image intensifier are arranged together to carry out high-low temperature tests, and in the test process, the brightness test module is greatly influenced by high and low temperatures, and the test result error is relatively large.
4. In the aspect of test data recording, the existing test system generally adopts a pinhole printer to record the brightness of the output light of the image intensifier. However, the pinhole printer has high failure rate, the whole system is complex and large, and the recording depth is limited, for example, a great amount of paper is consumed when the image intensifier is subjected to depth recording for several hours. Moreover, the sampling rate of the test system is low, and accidental transient faults are difficult to capture. Test data cannot be exported, and subsequent comparative analysis cannot be performed on the data.
Disclosure of Invention
In order to solve the problems in the prior art, the invention provides a testing system of a low-light-level image intensifier, which is used for testing the performance of the low-light-level image intensifier; the testing system for the micro-optical image intensifier comprises a testing box for accommodating a tested micro-optical image intensifier, a testing power supply assembly for providing working power supply for the tested micro-optical image intensifier, an illumination assembly for providing testing optical signal input for the tested micro-optical image intensifier, and a recording assembly for receiving an output optical signal generated by the tested micro-optical image intensifier based on the testing optical signal input, converting the output optical signal into a testing electrical signal, and recording voltage data of the testing electrical signal; the illumination subassembly is including being used for sending the illuminator of test light signal and the leaded light device that is used for transmitting test light signal, test power supply subassembly, illuminator and record subassembly all set up outside the test box, the leaded light device sets up inside the test box, be used for with the test light signal transmission that illuminator sent gives the glimmer image intensifier of being tested is as test light signal input.
Preferably, the test box comprises a box body for accommodating the tested low-light image intensifier and a box door which is arranged on the box body in an openable and closable manner and is used for opening and closing the box body.
Preferably, the box body is provided with a fan accommodating port for installing a fan and a vent for introducing protective gas into the box body.
Preferably, the box door is provided with a plurality of groups of light inlet and outlet parts for guiding the light-emitting device into the box body and a plurality of groups of electrical connection parts for electrically connecting the test power supply assembly with the tested micro-optical image intensifier accommodated in the box body.
Preferably, each set of the electrical connection parts includes an outer insertion part provided on an outer surface of the door, an inner insertion part provided on an inner surface of the door, and a connection assembly passing through the door to electrically connect the outer insertion part and the inner insertion part.
Preferably, the external insertion part comprises a first socket and a second socket, wherein the first socket is a plug-in type independent high-voltage socket, and the second socket is a plug-in type four-pin high-voltage-resistant socket; the inner inserting connection part comprises a plurality of high-pressure-resistant pressing type spring wiring terminals which correspond to the first socket and the second socket and are electrically connected with the first socket and the second socket through the connecting assembly.
Preferably, each set of the light input and output portions includes a light input port and a light output port formed on an outer surface of the box door, and a light input channel and a light output channel penetratingly disposed inside the box door, the light input channel and the light output channel are communicated with the light input port and open on an inner surface of the box door, and the light output channel is communicated with the light output port and open on the inner surface of the box door; the light guide device comprises a flexible optical fiber bundle, one end of the flexible optical fiber bundle is aligned with an opening of the light inlet channel on the inner surface of the box door and used for receiving a test light signal sent by the light emitting device, and the other end of the flexible optical fiber bundle is used for transmitting the test light signal sent by the light emitting device to the tested micro-optical image intensifier as the test light signal to be input.
Preferably, the light emitting device comprises a light source, a light emitting driver, a light emitting device power supply and a light emitting controller, wherein the light emitting device power supply is electrically connected with the light source through the light emitting driver, and supplies power to the light source under the driving of the light emitting driver, so that the light source emits light rays for forming a test light signal input; the light-emitting controller is electrically connected with the light-emitting driver and is used for adjusting the light-emitting intensity and the light-emitting time period of the light source; the light source is arranged to be aligned with the light inlet.
Preferably, the recording component comprises a shading and dimming device, a photoelectric conversion device, an amplifier unit, a voltage recording unit and a recording component power supply; the shading and dimming device is arranged to be aligned with the light outlet to receive an output light signal generated by the tested micro-optic image intensifier based on the test light signal input; the photoelectric conversion device, the amplifier unit and the voltage recording unit are electrically connected in sequence and are simultaneously electrically connected with the recording component power supply so as to obtain electric power from the recording component power supply; the photoelectric conversion device converts the test optical signal into a test electric signal; the amplifier unit amplifies the test electric signal and transmits the amplified test electric signal to the voltage recording unit; and the voltage recording unit automatically records the voltage data of the test electric signal.
Preferably, the box door further comprises a bearing plate disposed on the inner surface of the box door, and the bearing plate is disposed below the opening of the light inlet channel on the inner surface of the box door and below the opening of the light outlet channel on the inner surface of the box door.
According to the above embodiment, the testing system of the low-light-level image intensifier provided by the invention can obtain the following beneficial effects compared with the prior art: 1. the specially processed high-pressure resistant joint module (such as the above) is hermetically arranged in the test box door to be connected with a tested micro-optical image intensifier product, the existing high-pressure test method of threading from the box wall is replaced, and nitrogen is introduced into the box body to isolate air, so that the problems of high-pressure discharge and frost formation in the box are effectively solved. 2. The transmission path of light input and light output is sealed in the box door and the box body, a plurality of sealed channels are integrated, flexible optical fiber bundles are adopted to transmit light in the box body, a plurality of illumination assemblies and recording assemblies can be correspondingly arranged, a plurality of image intensifiers can be measured simultaneously, and the problem that the traditional test mode can only be tested one by one and the working efficiency is low is solved. By means of the unique light transmission design, the system can complete the high and low temperature illumination test of the image intensifier and the high and low temperature test of the power supply at the same time. 3. The illumination assembly with changeable illumination is designed, the luminance and the time interval of light emitting of the light source are controlled through the single chip microcomputer, good input optical signals are obtained, and automatic dimming can be further achieved. The recording component for recording the output of the image intensifier is arranged outside the test box, so that the measurement error caused by severe temperature change in the box body can be eliminated. 4. The automatic recording component solves the problem of recording depth of the test data, can keep a higher sampling rate to perform depth recording on the test data by adopting a paperless recording mode, can capture accidental faults and is convenient for data comparison statistical analysis.
Drawings
Fig. 1 is a block diagram of a testing system for a low-light-level image intensifier according to a preferred embodiment of the present application.
Fig. 2 is a schematic structural diagram of a test box of the low-light image intensifier test system shown in fig. 1.
Figure 3 is a schematic view of the outer surface of the door of the test chamber shown in figure 2.
FIG. 4 is a side schematic view of the door of the test chamber shown in FIG. 2.
FIG. 5 is a schematic diagram of the testing system of the low-light level image intensifier shown in FIG. 1.
FIG. 6 is a schematic circuit diagram of a light emitting device of the light emitting assembly of the micro-optical image intensifier testing system shown in FIG. 1.
FIG. 7 is a schematic circuit diagram of a recording assembly of the low-light image intensifier testing system shown in FIG. 1.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in further detail below with reference to the accompanying drawings in conjunction with embodiments.
Referring to fig. 1, a preferred embodiment of the present application provides a testing system 100 for a low-light image intensifier, which can be used to perform performance tests such as high and low temperature illumination tests on the existing low-light image intensifier. The low-light image intensifier test system 100 comprises a test box 1, a test power supply component 2, an illumination component 3 and a recording component 4.
Referring to fig. 2, 3 and 4, the testing box 1 includes a box body 11 and a box door 12, and the box body 11 and the box door 12 are preferably made of light-shielding and insulating materials. The box body 11 is substantially in the shape of a rectangular parallelepiped or a square with one open side, and is surrounded by a top plate 11a, a bottom plate 11b, a first side plate 11c, a second side plate 11d, and a third side plate 11e, the top plate 11a, bottom plate 11b, first side plate 11c, second side plate 11d and third side plate 11e are preferably all rectangular, wherein the top plate 11a and the bottom plate 11b are parallel, the first side plate 11c, the second side plate 11d and the third side plate 11e are connected between the top plate 11a and the bottom plate 11b perpendicularly to the top plate 11a and the bottom plate 11b, and the second side plate 11d is also connected between the first side plate 11c and the third side plate 11e perpendicularly to the first side plate 11c and the third side plate 11e, this makes the top plate 11a, the bottom plate 11b, the first side plate 11c, the second side plate 11d, and the third side plate 11e enclose a rectangular or square box 11 having an opening on one side. It will be appreciated that the housing 11 is preferably integrally formed. A fan receiving opening 112 may be formed on the second side plate 11d, and a compressor fan 113 may be installed in the fan receiving opening 112. The first side plate 11c or the third side plate 11e may be provided with an air vent 114.
The door 12 is preferably shaped as a rectangular plate, and is preferably made of a light-shielding and insulating material. The door 12 is openably and closably installed at one surface of the opening of the cabinet 11, so that the cabinet 11 can be opened or closed. The door 12 is provided with a plurality of sets of light entrance/exit portions 12A and a plurality of sets of electrical connection portions 12B, for example, four sets of light entrance/exit portions 12A and four sets of electrical connection portions 12B are shown in fig. 2. These light entrance and exit portions 12A and the electrical connection portions 12B are arranged on the door 12 at intervals from each other, as shown in fig. 2, for example. It is to be understood that the arrangement of the light entrance and exit portion 12A and the electrical connection portion 12B is not limited by the drawings as long as the functions of each other are not hindered.
Each set of light inlet/outlet 12A includes at least one light inlet 121 and at least one light outlet 122 formed on the outer surface of the door 12, and a light inlet channel 123 and a light outlet channel 124 penetratingly disposed inside the door 12, wherein the light inlet channel 123 and the light outlet channel 124 are preferably vacuum light guide channels, the light inlet channel 123 is communicated with the light inlet 121 and opens on the inner surface of the door 12, and the light outlet channel 124 is communicated with the light outlet 122 and opens on the inner surface of the door 12. Preferably, the openings of the light inlet 121 and the light outlet 122 on the outer surface of the door 12, and the openings of the light inlet passage 123 and the light outlet passage 124 on the inner surface of the door 12 are covered with a transparent protective cover (not shown) having high light transmittance, which is preferably made of glass.
Preferably, the door 12 may also include a carrier plate 12C preferably mounted below the openings in the interior surface of the door 12 adjacent the light entry channel 123 and the light exit channel 124 for carrying the image intensifier products being tested or other items of equipment that need to be placed adjacent the interior wall of the door 12, such as the two carrier plates 12C shown in FIGS. 1 and 3. Obviously, the number and arrangement of the carrier plates 12C are not limited by the drawings.
Each set of electrical connection portions 12B includes an outer insertion portion 125, a connection assembly 126, and an inner insertion portion 127, wherein the outer insertion portion 125 is disposed on an outer surface of the door 12, the inner insertion portion 127 is disposed on an inner surface of the door 12, and the connection assembly 126 passes through the door 12 to electrically connect the outer insertion portion 125 and the inner insertion portion 127.
Specifically, each of the outer plugs 125 preferably includes a first socket 128 and a second socket 129, wherein the first socket 128 is preferably a plug-in stand-alone high voltage socket dedicated to connecting the anode output of the high voltage power supply for testing to the image intensifier being tested (since the anode output typically has a very high voltage); the second socket 129 is preferably a plug-in four-pin high voltage resistant socket having four insertion holes for connecting a cathode output of a test high voltage power supply (e.g., the test power supply module 2) to the image intensifier under test, an output of a test high voltage power supply to an MCP (Micro Channel Plate) of the image intensifier under test, a power supply input of the test high voltage power supply, and a ground, respectively. In order to improve the mounting stability and safety of the first and second sockets 128, 129, it is preferred in this embodiment that one or more of the terminals of the first and/or second sockets 128, 129 are fixed to the motherboard made of insulating material by using existing fixing means, such as screws, and then the motherboard is fixed to the door 12 by using existing fixing means, such as screws. The gap between the motherboard and the box door 12 is preferably sealed by a sealant resistant to high and low temperatures and high pressure, and the airtightness of the box door 12 and the sockets 128 and 129 thereon can be ensured after the sealant is cured, so that the problem that the airtightness is affected after the traditional sealing rubber plug is aged and hardened is solved.
The connecting assembly 126 preferably includes a plurality of high voltage resistant wires that pass through the door 12 to electrically connect the outer plug 125 to the inner plug 127. The plurality of high voltage resistant wires are electrically connected to the outer insertion portion 125 and the inner insertion portion 127, preferably by soldering, inside and outside the door 12, and are preferably insulated by a high voltage resistant heat shrink tube at the soldered portion. The inner insertion portion 127 preferably includes a plurality of high pressure resistant press-type spring terminals corresponding to the first socket 128 and the second socket 129 of the outer insertion portion 125, and the high pressure resistant press-type spring terminals are electrically connected to the terminals of the first socket 128 and the second socket 129 through the high pressure resistant wires respectively, via the door 12, for connecting the lead wires of the tested product during testing.
The test power supply assembly 2 may be the operating power supply required for the microimage intensifier product to be tested (e.g., the microimage intensifier 200), which may include an existing high voltage test power supply such as a high voltage tolerant cable set. The test power supply module 2 is disposed outside the test box 1, and a connection line thereof corresponds to a connection terminal structure of the at least one outer insertion portion 125, and can be inserted into the outer insertion portion 125 from outside the test box 1, thereby establishing electrical connection with the electrical connection portion 12B of the box door 12.
The illumination assembly 3 comprises a light emitting means 31 and a light guiding means 32. Referring to fig. 5 and 6, the light emitting device 31 includes a light source 311, a light emitting driver 312, a light emitting device power source 313 and a light emitting controller 314. The Light source 311 is preferably a Light Emitting Diode (LED) lamp bead with a color temperature of 2856K, and the number of the Light Emitting Diode lamp beads is preferably multiple; the lighting driver 312 is preferably a buck dimmable LED driver; the light emitting device power supply 313 is preferably a 12V dc power supply. The light-emitting device power source 313 is electrically connected to each light source 311 through the light-emitting driver 312, and can supply power to each light source 311 under the driving of the light-emitting driver 312, so that the light source 311 emits light for forming the test light signal input. The light emitting controller 314 is preferably a single chip, electrically connected to the light emitting driver 312, and can be programmed to control a Pulse Width Modulation (PWM) duty ratio of a driving signal generated by the light emitting driver 312, so as to adjust the light emitting intensity and the light emitting time period of each light source 311. At least one of the light sources 311 is disposed in alignment with one of the light inlets 121 on the outer surface of the door 12. The light guide 32 preferably comprises a flexible fiber optic bundle having one end disposed in alignment with the opening of the light entrance path 123 on the inner surface of the door 12 corresponding to the light entrance 121 aligned with the light source 311, preferably fixed to the opening of the light entrance path 123 on the inner surface of the door 12.
Referring to fig. 7, the recording element 4 includes a light shielding and dimming device 41, a photoelectric conversion device 42, an amplifier unit 43, a voltage recording unit 44, and a recording element power supply 45. The light blocking and dimming device 41, which may be an existing focusing device or the like, is preferably disposed in alignment with at least one light exit opening 122 on the outer surface of the door 12, the at least one light exit opening 122 preferably corresponding to a light exit channel 124 having an opening aligned with one end of the light guide 32. The photoelectric conversion device 42 is disposed on the outgoing light path of the light shielding and dimming device 41. The photoelectric conversion device 42, the amplifier unit 43, and the voltage recording unit 44 are electrically connected in sequence, and are electrically connected to the recording element power supply 45 to obtain power from the recording element power supply 45. The recording assembly power supply 45 is preferably a 12V dc power supply.
Referring again to fig. 5, when the testing system 100 of the low-light level image intensifier of the present embodiment is used, it preferably operates according to the following method:
firstly, the door 12 is opened, and a to-be-tested microimage intensifier product, such as the microimage intensifier 200 shown in fig. 4, is placed in the box body 11, such as can be placed on the bearing plate 12C, and can be further fixed in the existing manner; connecting the above-mentioned leading-out wires of the micro-light image intensifier 200 to the high-pressure resistant pressing type spring terminals of the inner plug-in part 127; the light signal output end of the microimage intensifier 200 is arranged to be aligned with an opening of the light-emitting channel 124 on the inner surface of the door 12, and one end of the light guide device 32, which is not aligned with the opening of the light-entering channel 123 on the inner surface of the door 12, is arranged to be aligned with the light signal input end of the microimage intensifier 200. Obviously, since the light guide 32 is preferably a flexible fiber bundle, the positions of both ends thereof are easily adjusted to precisely align the respective positions. It can be understood that, since the box door 12 is provided with a plurality of sets of the light input/output portion 12A and the electrical connection portion 12B, a plurality of micro-optical image intensifier products to be tested can be simultaneously loaded in the box 11 for testing according to the above method, as long as a plurality of light guide devices 32 are correspondingly arranged.
After the disposition of the microimage intensifier product to be tested and the corresponding light guide 32, the door 12 is closed, the air in the cabinet 11 is evacuated by, for example, the above-mentioned compressor fan 113, and then a protective gas such as nitrogen is filled into the cabinet 11 through, for example, the above-mentioned vent 114. Outside the box 11, the testing power supply module 2 is connected to the outer insertion part 125 corresponding to the inner insertion part 127 connected to the leading line of the microimage intensifier 200, so that the microimage intensifier 200 is electrically connected to the testing power supply module 2 through the box door 12.
After the above-mentioned connecting operation is completed, the scotopic image intensifier product to be tested, such as the scotopic image intensifier 200, can be tested. During testing, the twilight image intensifier 200 is powered by a working power source, such as a power supply device, through the corresponding external plug-in connection 125, connection component 126 and internal plug-in connection 127, and the twilight image intensifier 200 is turned on to be in a working state. Then, the light emitting device 31 is turned on, and the light source 311 is controlled by the light emitting controller 314 via the light emitting driver 312 to emit a test light signal at a preset brightness and time period. When the light source 311 is controlled to emit light, the PWM duty ratio of the driving signal of the light emitting driver 312 is adjusted, so that the illumination intensity with a wide range can be generated, and the linear change of the illumination intensity between brightness and darkness in actual use can be simulated; in addition, when the light sources 311 are controlled to emit light, it is preferable to control the plurality of light sources 311 to emit light at the same time, so that instantaneous strong flash can be realized, and the actual use environment close to the image intensifier can be simulated as much as possible.
The test light signal emitted by the light source 311 enters from the light inlet 121 facing the light source 311, passes through the corresponding light inlet channel 123, is transmitted to the light guide device 32, and is transmitted to the light signal input end of the micro-light image intensifier 200 through the optical fiber bundle of the light guide device 32, so as to provide the test light signal input for the micro-light image intensifier 200. The micro-optical image intensifier 200 processes the input test optical signal according to its working mode, so as to form and output a corresponding output optical signal at its optical signal output end based on the test optical signal input. The output optical signal enters and passes through the light exit channel 124 aligned with the output end of the optical signal, exits the corresponding light exit port 122, and is received by the recording element 4. The light blocking and dimming device 41 adjusts the output optical signal to improve the quality thereof, and the adjusted output optical signal is received by the photoelectric conversion device 42 and converted into a test electrical signal according to the existing photoelectric conversion principle. After the amplifier unit 43 amplifies the test electrical signal, the amplified test electrical signal is transmitted to the voltage recording unit 44, and the voltage recording unit 44 automatically records the voltage data of the test electrical signal. The recorded voltage data can be transmitted to various existing data processing devices (such as a computer, a singlechip and the like) for analysis and processing, and whether the quality of the tested micro-optical image intensifier 200 is qualified or not is determined according to the analysis result; or the measured light can be transmitted to an existing oscilloscope or other similar devices for waveform display, so that the working state of the tested low-light image intensifier 200 can be monitored and detected in real time; and also transferred to existing data storage for recall when needed.
Compared with the prior art, the micro-optical image intensifier test system 100 provided by the above embodiment has the following advantages:
1. the specially processed high-pressure resistant joint module (such as the above) is hermetically arranged in the test box door to be connected with a tested micro-optical image intensifier product, the existing high-pressure test method of threading from the box wall is replaced, and nitrogen is introduced into the box body to isolate air, so that the problems of high-pressure discharge and frost formation in the box are effectively solved.
2. The transmission path of light input and light output is sealed in the box door and the box body, a plurality of sealed channels are integrated, flexible optical fiber bundles are adopted to transmit light in the box body, a plurality of illumination assemblies and recording assemblies can be correspondingly arranged, a plurality of image intensifiers can be measured simultaneously, and the problem that the traditional test mode can only be tested one by one and the working efficiency is low is solved. By means of the unique light transmission design, the system can complete the high and low temperature illumination test of the image intensifier and the high and low temperature test of the power supply at the same time.
3. The illumination assembly with changeable illumination is designed, the luminance and the time interval of light emitting of the light source are controlled through the single chip microcomputer, good input optical signals are obtained, and automatic dimming can be further achieved. The recording component for recording the output of the image intensifier is arranged outside the test box, so that the measurement error caused by severe temperature change in the box body can be eliminated.
4. The automatic recording component solves the problem of recording depth of the test data, can keep a higher sampling rate to perform depth recording on the test data by adopting a paperless recording mode, can capture accidental faults and is convenient for data comparison statistical analysis.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (10)
1. A glimmer image intensifier test system for testing the performance of glimmer image intensifier is characterized in that: the testing system for the micro-optical image intensifier comprises a testing box for accommodating a tested micro-optical image intensifier, a testing power supply assembly for providing working power supply for the tested micro-optical image intensifier, an illumination assembly for providing testing optical signal input for the tested micro-optical image intensifier, and a recording assembly for receiving an output optical signal generated by the tested micro-optical image intensifier based on the testing optical signal input, converting the output optical signal into a testing electrical signal, and recording voltage data of the testing electrical signal; the illumination subassembly is including being used for sending the illuminator of test light signal and the leaded light device that is used for transmitting test light signal, test power supply subassembly, illuminator and record subassembly all set up outside the test box, the leaded light device sets up inside the test box, be used for with the test light signal transmission that illuminator sent gives the glimmer image intensifier of being tested is as test light signal input.
2. The system according to claim 1, wherein the test box comprises a box for receiving the tested micro-optical image intensifier and a box door openably and closably mounted on the box for opening and closing the box.
3. The system as claimed in claim 2, wherein the housing has a fan receiving opening for receiving a fan and a vent opening for introducing shielding gas into the housing.
4. The system as claimed in claim 2, wherein the door has a plurality of light input/output portions for guiding the light emitting device into the interior of the case and a plurality of electrical connections for electrically connecting the testing power module to the tested microimage intensifier contained in the case.
5. The micro image intensifier testing system according to claim 4, wherein each set of the electrical connections comprises an outer insertion connection portion disposed on an outer surface of the door, an inner insertion connection portion disposed on an inner surface of the door, and a connecting assembly passing through the door to electrically connect the outer insertion connection portion and the inner insertion connection portion.
6. The system for testing a micro-optical image intensifier as claimed in claim 5, wherein the external plug-in unit comprises a first socket and a second socket, wherein the first socket is a plug-in type independent high-voltage socket, and the second socket is a plug-in type four-pin high-voltage resistant socket; the inner inserting connection part comprises a plurality of high-pressure-resistant pressing type spring wiring terminals which correspond to the first socket and the second socket and are electrically connected with the first socket and the second socket through the connecting assembly.
7. The system for testing a micro optical image intensifier as claimed in claim 4, wherein each set of the light input and output portions comprises a light input port and a light output port formed on the outer surface of the box door, and a light input channel and a light output channel penetratingly disposed inside the box door, the light input channel and the light output channel are communicated with the light input port and open on the inner surface of the box door, and the light output channel is communicated with the light output port and open on the inner surface of the box door; the light guide device comprises a flexible optical fiber bundle, one end of the flexible optical fiber bundle is aligned with an opening of the light inlet channel on the inner surface of the box door and used for receiving a test light signal sent by the light emitting device, and the other end of the flexible optical fiber bundle is used for transmitting the test light signal sent by the light emitting device to the tested micro-optical image intensifier as the test light signal to be input.
8. The system according to claim 7, wherein the light emitting device comprises a light source, a light emitting driver, a light emitting device power source and a light emitting controller, the light emitting device power source is electrically connected to the light source through the light emitting driver, and the light emitting driver is driven to supply power to the light source, so that the light source emits light for forming the test light signal input; the light-emitting controller is electrically connected with the light-emitting driver and is used for adjusting the light-emitting intensity and the light-emitting time period of the light source; the light source is arranged to be aligned with the light inlet.
9. The micro-optical image intensifier test system as claimed in claim 8, wherein the recording element comprises a shading and dimming device, a photoelectric conversion device, an amplifier unit, a voltage recording unit and a recording element power supply; the shading and dimming device is arranged to be aligned with the light outlet to receive an output light signal generated by the tested micro-optic image intensifier based on the test light signal input; the photoelectric conversion device, the amplifier unit and the voltage recording unit are electrically connected in sequence and are simultaneously electrically connected with the recording component power supply so as to obtain electric power from the recording component power supply; the photoelectric conversion device converts the output optical signal into a test electrical signal; the amplifier unit amplifies the test electric signal and transmits the amplified test electric signal to the voltage recording unit; and the voltage recording unit automatically records the voltage data of the test electric signal.
10. The system for testing a micro optical image intensifier as claimed in claim 7, wherein the door further comprises a loading plate disposed on the inner surface of the door, the loading plate being disposed under the opening of the light inlet channel on the inner surface of the door and under the opening of the light outlet channel on the inner surface of the door.
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| CN110346120B (en) * | 2019-08-05 | 2021-03-09 | 北方夜视技术股份有限公司 | System and method for testing strong light resolution and dynamic range of automatic gate control image intensifier |
| CN110779621A (en) * | 2019-10-17 | 2020-02-11 | 中国航空工业集团公司洛阳电光设备研究所 | Automatic testing device and method for brightness sensor for head-up display |
| CN111751976A (en) * | 2020-07-07 | 2020-10-09 | 北方夜视技术股份有限公司 | Portable low-light level night vision device with general type connection structure |
| CN112880594B (en) * | 2021-01-14 | 2022-06-03 | 北方夜视技术股份有限公司 | Image alignment calibration and inspection method applied to low-light-level image intensifier |
| CN112911275B (en) * | 2021-01-14 | 2023-03-07 | 北方夜视技术股份有限公司 | Device for testing image intensifier under low-pressure variable-temperature environment |
| CN113375908B (en) * | 2021-05-26 | 2022-09-23 | 北方夜视技术股份有限公司 | Dark box system for automatic test of low-light-level image intensifier |
| CN113432833B (en) * | 2021-06-15 | 2022-09-16 | 北方夜视技术股份有限公司 | Device and method for testing stability of photo-cathode of image intensifier tube after illumination |
| CN114814633B (en) * | 2022-06-29 | 2022-09-16 | 江苏夜视光电科技有限公司 | High-voltage power supply detection system of low-light-level image intensifier |
| CN115373321A (en) * | 2022-09-14 | 2022-11-22 | 中国人民解放军96963部队 | Multi-path star simulator calibrating device |
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| US4145142A (en) * | 1977-11-28 | 1979-03-20 | The United States Of America As Represented By The Secretary Of The Army | Apparatus for and method of testing direct-view image intensifiers |
| JP2012063327A (en) * | 2010-09-17 | 2012-03-29 | Toshiba Corp | Defect inspection device and method thereof, and defect inspection program |
| CN105319052A (en) * | 2015-11-30 | 2016-02-10 | 武汉光驰科技有限公司 | Low-light-level image intensifier characteristic test system |
| CN205157169U (en) * | 2015-11-30 | 2016-04-13 | 武汉光驰科技有限公司 | Shimmer image intensifier characteristic test system |
| CN205384133U (en) * | 2016-01-22 | 2016-07-13 | 北方夜视技术股份有限公司 | Shimmer image intensifier specifications integrated test device |
| CN106226037A (en) * | 2016-08-20 | 2016-12-14 | 南京理工大学 | A kind of large aperture gleam image intensifier imagewise uniform system safety testing device |
| CN106370400A (en) * | 2016-11-25 | 2017-02-01 | 南京理工大学 | Integrated tester for low-light image intensifier and test method of tester |
| CN107560830B (en) * | 2017-08-25 | 2018-11-02 | 北方夜视技术股份有限公司 | Large area microchannel template photomultiplier test device |
| CN207798683U (en) * | 2017-12-26 | 2018-08-31 | 深圳德夏科技发展有限公司 | Fluorescence detection device for enzyme mark detector |
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