CN201497784U - Test cabinet for photosensitive device - Google Patents

Test cabinet for photosensitive device Download PDF

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Publication number
CN201497784U
CN201497784U CN2009202331427U CN200920233142U CN201497784U CN 201497784 U CN201497784 U CN 201497784U CN 2009202331427 U CN2009202331427 U CN 2009202331427U CN 200920233142 U CN200920233142 U CN 200920233142U CN 201497784 U CN201497784 U CN 201497784U
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CN
China
Prior art keywords
test cabinet
photosensitive
incandescent lamp
test
light source
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2009202331427U
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Chinese (zh)
Inventor
戚元平
Original Assignee
戚元平
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Priority to CN2009202331427U priority Critical patent/CN201497784U/en
Application granted granted Critical
Publication of CN201497784U publication Critical patent/CN201497784U/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

The utility model relates to a testing device for a photosensitive device, in particular to a test cabinet for a photosensitive device, which comprises a test circuit connected with a photosensor, a power manager, a test cabinet and a light source layer disposed inside the test cabinet. The inner top wall of the test cabinet is provided with a driving device capable of driving the light source layer to move up and down, the light source layer includes a support, an incandescent lamp and a convex lens arranged under the incandescent lamp, the support is connected with the driving device, the incandescent lamp is electrically connected with the power manager through leads, and a test circuit is mounted inside the test cabinet and positioned under the convex lens. The test cabinet can change brightness of light at each test point without changing color temperature, and narrow the gap of light brightness among the test points on a same plane.

Description

The test cabinet of photosensitive device
Technical field
The utility model relates to a kind of proving installation of photosensitive device, particularly a kind of test cabinet of photosensitive device.
Background technology
Photoresistance is a kind of common components and parts, and photoresistance need be carried out quality testing after manufacturing is finished.The checkout equipment of present photoresistance, the power of light is to realize by the bright dark degree of regulating incandescent lamp, because the colour temperature of the light that this method also changes when changing the bright dark degree of incandescent lamp, and the variation of colour temperature also is influential to the test of photoresistance, so method is worthless.In addition, the otherness that is in the light intensity of each test point on the same surface level is very big, and this just is unfavorable for the large scale test of photosensitive device.So in this case, design a practically, the photoresistance testing apparatus becomes current urgent problem.
Summary of the invention
At above-mentioned technical matters, the purpose of this utility model provides a kind of test cabinet of photosensitive device, and it can change the power of the light at each test point place under the prerequisite that does not change colour temperature; And can dwindle the light-intensity difference that is in each test point place on the same surface level.
The purpose of this utility model is achieved in that and comprises testing circuit and the power supervisor that connects photosensitive device, also comprise the test cabinet and be arranged at the interior light source layer of this test cabinet, test cabinet inner roof wall is provided with the drive unit that energy driving light source layer is done upper and lower displacement, the convex lens that light source layer comprises support, incandescent lamp and is positioned at this incandescent lamp below, support is connected with drive unit, incandescent lamp is electrically connected with power supervisor by lead, and testing circuit is assemblied in the test cabinet and is positioned at the below of convex lens.
Described drive unit comprises motor, around property connection cord and steady arm, be connected with motor around property connection cord one end, pass steady arm around the property connection cord other end and connect incandescent lamp.
Described steady arm is a fixed pulley.
The installation site of described incandescent lamp is the focal position of convex lens.
Described testing circuit comprises the spliced eye that power supply, switch, resistance, a plurality of light emitting diode and many groups are pegged graft for photosensitive device, switch one end is connected with power supply, the other end connects resistance, each light emitting diode is connected with one group of jack and is formed detection branch, is connected between resistance and the power supply after these detection branch parallel connections.
Described power supervisor is the power supervisor that has pressure regulator.
Adopted such scheme, test cabinet inner roof wall is provided with the drive unit that energy driving light source layer is done upper and lower displacement, control by drive unit, light source layer is in the process of moving up and down, distance between incandescent lamp and the convex lens does not change, can reach the purpose of regulating tested photosensitive device zone intensity of illumination like this, thereby avoid making the colour temperature of light to change, under same colour temperature, not have influence on tested photosensitive device like this with respect to photosensitive device.The convex lens that light source layer comprises support, incandescent lamp and is positioned at this incandescent lamp below, support is connected with drive unit, incandescent lamp is electrically connected with power supervisor by lead, the installation site of incandescent lamp is the focal position of convex lens, after the light that sends from incandescent lamp is mapped on the convex lens, can become parallel rays, because these light send by same point through behind the convex lens, therefore, can dwindle the light-intensity difference that is in each tested photosensitive device on the same surface level.The utility model is by changing the power of the light at each test point place under the prerequisite that does not change colour temperature; And dwindle the light-intensity difference that is in each test point place on the same surface level, make the performance of test greatly improve.
What connect photosensitive device in the testing circuit is spliced eye, need not during use photosensitive device and testing circuit welding have been improved the convenience of using, and also reusable.
The utility model is not only simple in structure, and can detect a plurality of photosensitive devices on a large scale simultaneously, has detection speed fast, the advantage that detection efficiency is high.
The utility model is described in further detail below in conjunction with the drawings and specific embodiments.
Description of drawings
Fig. 1 is a structural representation of the present utility model;
Fig. 2 is the assembly structure figure of drive unit and light source layer in the utility model;
Fig. 3 is the circuit structure diagram of testing circuit in the utility model;
Fig. 4 is the structural drawing of connector in the utility model;
In the accompanying drawing, 1 is the test cabinet, and 2 is incandescent lamp, 3 convex lens, and 4 is motor, and 5 is around the property connection cord, and 6 is steady arm, and 7 is power supervisor, 8 is connector.
Embodiment
Referring to figs. 1 through Fig. 4, the test cabinet of photosensitive device of the present utility model connects the testing circuit of photosensitive device, the power supervisor 7 that has pressure regulator, test cabinet 1 and is arranged at the interior light source layer of this test cabinet.Test cabinet inner roof wall is provided with and can drives the drive unit that incandescent lamp is done upper and lower displacement, drive unit comprises motor 4, around property connection cord 5 and steady arm 6, steady arm 6 is a fixed pulley, is connected with motor 4 around property connection cord 5 one ends, passes steady arm around the property connection cord other end and connects light source layer.The convex lens 3 that light source layer comprises support, incandescent lamp 2 and is positioned at this incandescent lamp below, incandescent lamp 2 is fixed in the support, and incandescent lamp 2 is electrically connected with power supervisor by lead, and the installation site of incandescent lamp 2 is the focal position of convex lens.Testing circuit is assemblied in the test cabinet and is positioned at the below of convex lens.Testing circuit comprises power supply, K switch, resistance R, a plurality of light emitting diode and a plurality of connector 8 for the photosensitive device grafting, K switch one end is connected with power supply, the other end connects resistance R, each light emitting diode is connected with a connector and is formed detection branch, is connected between resistance R and the power supply after these detection branch parallel connections.
As Fig. 3, be that example describes to test 4 photoresistance, actual conditions can increase the number of test point as required.The length of side is can arrange 64 test points in the square test zone of 40cm generally speaking.The photoresistance of required detection is plugged on the connector, closes the cabinet door of test cabinet then.And the K and open the power supervisor 7 of incandescent lamp of closing a switch.Photosensitive device and light source layer are apart from maximum at this moment, and the photoresistance zonal ray is darker, and the photoresistance resistance is bigger, and the electric current that flows through each light emitting diode is very faint, so light emitting diode can be not luminous.Press the point driving switch that the control motor is just changeing, light source layer is slowly moved down, after it slipped over critical point, the photoresistance zonal ray strengthened, and the photoresistance resistance reduces, and the electric current that flows through each light emitting diode increases, and light emitting diode should be able to be luminous.Do not have luminous light emitting diode if occur, illustrate that then coupled photoresistance is substandard or bad photosensitive device.

Claims (6)

1. the test cabinet of a photosensitive device, comprise the testing circuit and the power supervisor that connect photosensitive device, it is characterized in that: also comprise the test cabinet and be arranged at the interior light source layer of this test cabinet, test cabinet inner roof wall is provided with the drive unit that energy driving light source layer is done upper and lower displacement, the convex lens that light source layer comprises support, incandescent lamp and is positioned at this incandescent lamp below, support is connected with drive unit, incandescent lamp is electrically connected with power supervisor by lead, and testing circuit is assemblied in the test cabinet and is positioned at the below of convex lens.
2. the test cabinet of photosensitive device according to claim 1, it is characterized in that: described drive unit comprises motor, around property connection cord and steady arm, be connected with motor around property connection cord one end, pass steady arm around the property connection cord other end and connect incandescent lamp.
3. the test cabinet of photosensitive device according to claim 2, it is characterized in that: described steady arm is a fixed pulley.
4. the test cabinet of photosensitive device according to claim 1, it is characterized in that: the installation site of described incandescent lamp is the focal position of convex lens.
5. the test cabinet of photosensitive device according to claim 1, it is characterized in that: described testing circuit comprises power supply, switch, resistance, a plurality of light emitting diode and a plurality of connector for the photosensitive device grafting, switch one end is connected with power supply, the other end connects resistance, each light emitting diode is connected with a connector and is formed detection branch, is connected between resistance and the power supply after these detection branch parallel connections.
6. the test cabinet of photosensitive device according to claim 1, it is characterized in that: described power supervisor is the power supervisor that has pressure regulator.
CN2009202331427U 2009-07-15 2009-07-15 Test cabinet for photosensitive device Expired - Fee Related CN201497784U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2009202331427U CN201497784U (en) 2009-07-15 2009-07-15 Test cabinet for photosensitive device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2009202331427U CN201497784U (en) 2009-07-15 2009-07-15 Test cabinet for photosensitive device

Publications (1)

Publication Number Publication Date
CN201497784U true CN201497784U (en) 2010-06-02

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN2009202331427U Expired - Fee Related CN201497784U (en) 2009-07-15 2009-07-15 Test cabinet for photosensitive device

Country Status (1)

Country Link
CN (1) CN201497784U (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106370957A (en) * 2016-10-12 2017-02-01 中国计量大学 Two-needle photosensitive resistance detection mechanism
CN106645165A (en) * 2016-10-12 2017-05-10 中国计量大学 Automatic detection apparatus of photoresistor
CN110501992A (en) * 2019-08-07 2019-11-26 格力电器(武汉)有限公司 WiFi detects board test device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106370957A (en) * 2016-10-12 2017-02-01 中国计量大学 Two-needle photosensitive resistance detection mechanism
CN106645165A (en) * 2016-10-12 2017-05-10 中国计量大学 Automatic detection apparatus of photoresistor
CN106645165B (en) * 2016-10-12 2019-10-01 中国计量大学 A kind of photo resistance automatic detection device
CN110501992A (en) * 2019-08-07 2019-11-26 格力电器(武汉)有限公司 WiFi detects board test device
CN110501992B (en) * 2019-08-07 2021-07-20 格力电器(武汉)有限公司 WiFi detection board testing device

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Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20100602

Termination date: 20100715