CN109459680A - A kind of type self-destroyed laser label detection device - Google Patents
A kind of type self-destroyed laser label detection device Download PDFInfo
- Publication number
- CN109459680A CN109459680A CN201811417530.0A CN201811417530A CN109459680A CN 109459680 A CN109459680 A CN 109459680A CN 201811417530 A CN201811417530 A CN 201811417530A CN 109459680 A CN109459680 A CN 109459680A
- Authority
- CN
- China
- Prior art keywords
- type self
- detection device
- laser label
- destroyed
- destroyed laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 68
- 238000004064 recycling Methods 0.000 claims abstract description 45
- 239000000758 substrate Substances 0.000 claims abstract description 40
- 239000000523 sample Substances 0.000 claims abstract description 16
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims abstract description 14
- 238000004140 cleaning Methods 0.000 claims description 27
- 239000004020 conductor Substances 0.000 claims description 7
- 238000010438 heat treatment Methods 0.000 claims description 7
- 238000009434 installation Methods 0.000 claims description 3
- 238000011084 recovery Methods 0.000 abstract description 4
- 238000004891 communication Methods 0.000 abstract description 3
- 238000005457 optimization Methods 0.000 abstract description 3
- 238000010586 diagram Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000003032 molecular docking Methods 0.000 description 1
- 238000011895 specific detection Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
Abstract
The invention discloses a kind of type self-destroyed laser label detection devices, the type self-destroyed laser label includes recycling substrate and self-destruction label, the pedestal of detection device is equipped with recycling substrate and accommodates position, the recycling substrate accommodates position side and is equipped with two support levels for being respectively used to chip placement terminals, testing agency is rack-mount, it is set in testing agency there are two detection probe, each detection probe is located on a support level.Pass through the type self-destroyed laser label detection device of above-mentioned optimization design, chip circuit communication situation on the recycling substrate to type self-destroyed laser label and whether radio frequency is working properly detects, to guarantee that the recycling substrate of recycling can be re-used, recovery utilization rate is greatly improved, the cost of type self-destroyed laser label is reduced.
Description
Technical field
The present invention relates to laser label technical field more particularly to a kind of type self-destroyed laser label detection devices.
Background technique
Requirement with client to product quality is continuously improved, to high quality of products it is anti-fake require it is higher and higher.Usually
Anti-fake and personal settings are used for using common laser paper, the most commonly used is disposable self-destructing laser label in existing market, by
Chip and associated metal structure inside laser label, cause cost excessively high, and use scope reduces.Therefore, it is necessary to one kind can
The type self-destroyed laser label of recycling, this recyclable laser label is needed to recoverer to improve recovery utilization rate
Divide and is detected.
Summary of the invention
To solve technical problem present in background technique, the present invention proposes a kind of type self-destroyed laser label detection device.
A kind of type self-destroyed laser label detection device proposed by the present invention, the type self-destroyed laser label include recycling substrate
With self-destruction label, recycles substrate and be equipped with chip, set on chip there are two terminals, self-destruction is signed equipped with conductor portion, conductor portion two
End is connect with two terminals of chip respectively, and the detection device includes: pedestal, bracket, testing agency;
Pedestal is equipped with recycling substrate and accommodates position, and recycling substrate receiving position side, which is equipped with, to be respectively used to place terminals
Two support levels;
Bracket, which is located above pedestal and is located at the recycling substrate, accommodates position close to support level side, testing agency's installation
It is set on bracket, in testing agency there are two detection probe, each detection probe is located on a support level.
Preferably, the recycling substrate accommodates position and is equipped with holding tank, is equipped in the holding tank to far from holder orientation
The sliding rail of extension, sliding rail are equipped with the support being slidably mounted.
Preferably, sliding rail extends to the direction far from support level.
Preferably, two support levels are located at sliding rail two sides.
Preferably, support level is located at the receiving trench bottom.
Preferably, further include cleaning mechanism, cleaning mechanism is rack-mount, set on cleaning mechanism there are two clear up knife
Head, each cleaning cutter head are located above a support level.
It preferably, further include heating mechanism, heating mechanism is connect for heating to cleaning cutter head with cleaning cutter head.
Preferably, detection probe is located at cleaning cutter head far from recycling substrate receiving position side.
Preferably, the outer diameter for clearing up cutter head is gradually reduced from the top down on the direction perpendicular to sliding rail.
Preferably, testing agency includes radio frequency detection unit and circuit detection unit.
In the present invention, the type self-destroyed laser label detection device proposed, the type self-destroyed laser label includes recycling base
Material and self-destruction label, the pedestal of detection device are equipped with recycling substrate and accommodate position, and the recycling substrate accommodates position side and is equipped with difference
For two support levels of chip placement terminals, testing agency is rack-mount, set in testing agency there are two detection
Probe, each detection probe are located on a support level.By the type self-destroyed laser label detection device of above-mentioned optimization design,
Chip circuit communication situation on the recycling substrate to type self-destroyed laser label and whether radio frequency is working properly examines
It surveys, to guarantee that the recycling substrate of recycling can be re-used, greatly improves recovery utilization rate, reduce type self-destroyed laser label
Cost.
Detailed description of the invention
Fig. 1 is a kind of structure of the type self-destroyed laser label of type self-destroyed laser label detection device detection proposed by the present invention
Schematic diagram.
Fig. 2 is a kind of side structure schematic view of type self-destroyed laser label detection device detection proposed by the present invention.
Fig. 3 is a kind of overlooking structure diagram of type self-destroyed laser label detection device detection proposed by the present invention.
Specific embodiment
As shown in Figures 1 to 3, Fig. 1 is a kind of the type self-destroyed of type self-destroyed laser label detection device detection proposed by the present invention
The structural schematic diagram of laser label, Fig. 2 are a kind of side view knot of type self-destroyed laser label detection device detection proposed by the present invention
Structure schematic diagram, Fig. 3 are a kind of overlooking structure diagram of type self-destroyed laser label detection device detection proposed by the present invention.
Referring to Fig.1, the invention proposes a kind of type self-destroyed laser label detection device, be used to detect is type self-destroyed radium-shine
Label includes recycling substrate 1 and self-destruction label 2, and recycling substrate 1 is equipped with chip 3, sets that there are two terminals, self-destruction label 2 on chip 3
It is equipped with conductor portion 4,4 both ends of conductor portion are connect with two terminals of chip 3 respectively.
Referring to Fig. 2 and 3, the type self-destroyed laser label detection device includes: pedestal 5, bracket 6, testing agency;
Pedestal 5 is equipped with recycling substrate and accommodates position, and recycling substrate receiving position side, which is equipped with, to be respectively used to place wiring
Two support levels 51 at end;
Bracket 6, which is located at 5 top of pedestal and is located at the recycling substrate, accommodates position close to 51 side of support level, testing agency
Installation is set on the frame 6, in testing agency there are two detection probe 7, and each detection probe 7 is located on a support level 51.
In the specific work process of the type self-destroyed laser label detection device of the present embodiment, the recycling substrate of recycling is placed on
The recycling substrate of pedestal accommodates on position, and two terminals of chip are located on two support levels, when detection, testing agency
Decline so that two detection probes respectively with two terminal contacts of chip, thus to chip inner looping whether access carry out
Detection.
In the present embodiment, the type self-destroyed laser label detection device proposed, the type self-destroyed laser label include back
Substrate and self-destruction label are received, the pedestal of testing agency is equipped with recycling substrate and accommodates position, and the recycling substrate accommodates position side and is equipped with
Be respectively used to two support levels of chip placement terminals, testing agency is rack-mount, set in testing agency there are two
Detection probe, each detection probe are located on a support level.It is detected by the type self-destroyed laser label of above-mentioned optimization design
Device, for type self-destroyed laser label recycling substrate on chip circuit communication situation and radio frequency it is whether working properly into
Row detection greatly improves recovery utilization rate to guarantee that the recycling substrate of recycling can be re-used, and reduces type self-destroyed radium-shine
The cost of label.
In a specific embodiment, the recycling substrate accommodates position and is equipped with holding tank, is equipped in the holding tank to remote
From the sliding rail 8 that 6 direction of bracket extends, sliding rail 8 is equipped with the support 9 being slidably mounted;When feeding, recycling substrate is placed on branch
On seat, two terminals are towards bracket side, and the substrate then recycled is as support slides to below testing agency, convenient for recycling base
The loading and unloading of material.
In the specific set-up mode of sliding rail, sliding rail 8 extends to the direction far from support level 51, with the sliding of support
Feeding, the terminals of chip are placed on above support level.
In further specific set-up mode, two support levels 51 are located at 8 two sides of sliding rail.
In the specific set-up mode of support level, support level 51 is located at the receiving trench bottom.
It further include cleaning mechanism, cleaning mechanism peace in other specific embodiments for the ease of recycling the recycling of substrate
Dress is set on the frame 6, on cleaning mechanism there are two cutter head 10 is cleared up, and each cleaning cutter head 10 is located on a support level 51
Side;While detection, the remaining conductor portion on chip terminals is removed by cleaning cutter head.
In other specific embodiments, detection probe 7 is located at cleaning cutter head 10 and accommodates position one far from the recycling substrate
Side;Before detection, cleaning cutter head docking line end is cleared up, and improves the accuracy of detection.
It further include heating mechanism to improve cleaning effect, heating mechanism is connect with cleaning cutter head 10 for cleaning knife
First 10 are heated.
In the specific set-up mode of cleaning cutter head, the outer diameter of cleaning cutter head 10 is on the direction perpendicular to sliding rail 8 from upper
It is gradually reduced downwards, guarantees cleaning effect.
In specific detection mode, testing agency includes radio frequency detection unit and circuit detection unit, realizes and returns to chip
While whether access is detected on road, realization detects the radio-frequency enabled of chip itself.
The foregoing is only a preferred embodiment of the present invention, but scope of protection of the present invention is not limited thereto,
Anyone skilled in the art in the technical scope disclosed by the present invention, according to the technique and scheme of the present invention and its
Inventive concept is subject to equivalent substitution or change, should be covered by the protection scope of the present invention.
Claims (10)
1. a kind of type self-destroyed laser label detection device, wherein the type self-destroyed laser label includes recycling substrate (1) and self-destruction
It signs (2), recycling substrate (1) is equipped with chip (3), is set on chip (3) there are two terminals, self-destruction label (2) are equipped with conductor portion
(4), conductor portion (4) both ends are connect with two terminals of chip (3) respectively, which is characterized in that the detection device includes: bottom
Seat (5), bracket (6), testing agency;
Pedestal (5) is equipped with recycling substrate and accommodates position, and recycling substrate receiving position side, which is equipped with, to be respectively used to place terminals
Two support levels (51);
Bracket (6), which is located above pedestal (5) and is located at the recycling substrate, accommodates position close to support level (51) side, detection machine
Structure is mounted on bracket (6), is set in testing agency there are two detection probe (7), each detection probe (7) is located at a supporting table
On rank (51).
2. type self-destroyed laser label detection device according to claim 1, which is characterized in that the recycling substrate accommodates position
It is equipped with holding tank, is equipped in the holding tank to the sliding rail (8) extended far from bracket (6) direction, sliding rail (8) is equipped with and can slide
The support (9) of dynamic installation.
3. type self-destroyed laser label detection device according to claim 2, which is characterized in that sliding rail (8) is to far from support
The direction of step (51) extends.
4. type self-destroyed laser label detection device according to claim 3, which is characterized in that two support levels (51) point
It Wei Yu not sliding rail (8) two sides.
5. type self-destroyed laser label detection device according to claim 2, which is characterized in that support level (51) is located at institute
State receiving trench bottom.
6. type self-destroyed laser label detection device according to claim 1 or 3, which is characterized in that it further include cleaning mechanism,
Cleaning mechanism is mounted on bracket (6), is set on cleaning mechanism there are two cutter head (10) are cleared up, each cleaning cutter head (10) is located at one
Above a support level (51).
7. type self-destroyed laser label detection device according to claim 6, which is characterized in that further include heating mechanism, add
Heat engine structure is connect for heating to cleaning cutter head (10) with cleaning cutter head (10).
8. type self-destroyed laser label detection device according to claim 6, which is characterized in that detection probe (7) is located at clear
It manages cutter head (10) and accommodates position side far from the recycling substrate.
9. type self-destroyed laser label detection device according to claim 6, which is characterized in that the outer diameter of cleaning cutter head (10)
It is gradually reduced from the top down on the direction perpendicular to sliding rail (8).
10. type self-destroyed laser label detection device according to claim 1, which is characterized in that testing agency includes radio frequency
Detection unit and circuit detection unit.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201811417530.0A CN109459680A (en) | 2018-11-26 | 2018-11-26 | A kind of type self-destroyed laser label detection device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN201811417530.0A CN109459680A (en) | 2018-11-26 | 2018-11-26 | A kind of type self-destroyed laser label detection device |
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Publication Number | Publication Date |
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CN109459680A true CN109459680A (en) | 2019-03-12 |
Family
ID=65611596
Family Applications (1)
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CN201811417530.0A Pending CN109459680A (en) | 2018-11-26 | 2018-11-26 | A kind of type self-destroyed laser label detection device |
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CN102401873A (en) * | 2010-09-15 | 2012-04-04 | 江苏凯路威电子有限公司 | RFID high-frequency chip four-channel test device and method |
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CN204439719U (en) * | 2015-01-28 | 2015-07-01 | 上海英内电子标签有限公司 | A kind of proving installation for testing RFID antenna resistance |
CN207718410U (en) * | 2017-12-29 | 2018-08-10 | 福州市楚天电子有限公司 | A kind of fabrication, business card or electronic tag class moulding material and card, business card or electronic tag |
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US20080000074A1 (en) * | 2006-05-05 | 2008-01-03 | Genaro Martinez | Computer automated tag test system |
CN200979773Y (en) * | 2006-11-16 | 2007-11-21 | 沈阳先达条码技术发展有限公司 | A disposable electronic tag with a fragile encapsulation structure |
CN101908298A (en) * | 2010-07-23 | 2010-12-08 | 天津长荣印刷设备股份有限公司 | Flexible printed paper battery anti-counterfeiting label |
CN102401873A (en) * | 2010-09-15 | 2012-04-04 | 江苏凯路威电子有限公司 | RFID high-frequency chip four-channel test device and method |
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TA01 | Transfer of patent application right |
Effective date of registration: 20210202 Address after: 6 / F, C2 building, innovation industrial park, 800 Wangjiang West Road, high tech Zone, Hefei, Anhui 230000 Applicant after: Anhui Zhongji National Medical Technology Co.,Ltd. Address before: 230000 Room 203, office of building B, Xiangfeng Creative Park, 211 Xiangzhang Avenue, high tech Zone, Hefei City, Anhui Province Applicant before: ANHUI BALIUSAN INFORMATION TECHNOLOGY Co.,Ltd. |
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