CN209105118U - A kind of cell slice test mechanism - Google Patents

A kind of cell slice test mechanism Download PDF

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Publication number
CN209105118U
CN209105118U CN201822159876.7U CN201822159876U CN209105118U CN 209105118 U CN209105118 U CN 209105118U CN 201822159876 U CN201822159876 U CN 201822159876U CN 209105118 U CN209105118 U CN 209105118U
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CN
China
Prior art keywords
test
strips
cell
transmitting device
testboard
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201822159876.7U
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Chinese (zh)
Inventor
崔巍
周平
吴华德
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canadian Solar Inc
CSI Cells Co Ltd
Original Assignee
CSI Solar Technologies Inc
Atlas Sunshine Power Group Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CSI Solar Technologies Inc, Atlas Sunshine Power Group Co Ltd filed Critical CSI Solar Technologies Inc
Priority to CN201822159876.7U priority Critical patent/CN209105118U/en
Application granted granted Critical
Publication of CN209105118U publication Critical patent/CN209105118U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

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  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The utility model relates to solar battery sheet the field of test technology, disclose a kind of cell slice test mechanism, including the testboard, transmitting device and test probe set gradually from bottom to top, wherein the transmitting device is for conveying cell piece;The testboard can be with the rear-face contact of the mesuring battary piece conveyed on the transmitting device, the testboard includes braced frame, at least two test-strips, each test-strips are arranged in parallel and are detachably connected with the braced frame, and have gap between two adjacent test-strips;The test probe can be with the front face of the mesuring battary piece conveyed on the transmitting device.The way of contact of cell piece back side test is changed to conductive performance test bench by traditional probe contact and contacts, and can test positive rear electrode not in the cell piece of same position, moreover it is possible to avoid double-side cell built-in testing inaccuracy problem caused by reflecting because of metal large area.

Description

A kind of cell slice test mechanism
Technical field
The utility model relates to solar battery sheet the field of test technology more particularly to a kind of cell slice test mechanisms.
Background technique
Currently, the test of conventional silica-based solar cell piece electrical property, method under the conditions of volume production is predominantly up and down Probe is clamped cell piece and is tested.This test method is suitable for testing positive rear electrode with respect to the mirror-symmetrical electricity of silicon base Pond piece, i.e., upper and lower probe clamp cell piece in corresponding position jointly, and the electrode for contacting cell piece front and back respectively is surveyed Examination.
However for the cell piece (such as battery used in imbrication component) of positive rear electrode dislocation, the method is but caught the flap and is seen Elbow.This is because the positive rear electrode of battery cannot be contacted simultaneously if probe is arranged in same position up and down, tie test Fruit is inaccurate and test result fluctuation is big;And if probe is arranged at positive rear electrode up and down, and the wind of fragment can be improved Danger.
Common Curve guide impeller method is cell backside using all-metal platform test, and this method is testing positive backplane mistake It is contacted while can both having guaranteed upper probe with front electrode and lower platform with rear electrode when the battery of position, greatly improves test knot The accuracy of fruit, and reduce fragment risk.However, the method still remains two defects: first is that due to cell backside with it is whole The contact of a metal platform, causes electric current directly to be collected by external circuit by back surface field, this and cell backside electric current in solar components It is far from each other that the process that backplane is collected by external circuit again is flowed by back surface field, so that test result is distorted;Second is that testing two-sided electricity Chi Shi causes test electric current bigger than normal since the back side is reflective.
In view of the above shortcomings, the designer, is actively subject to research and innovation, it can meet volume electricity production to found one kind The high-speed transfer of pond piece, and can guarantee the novel test device of battery testing precision, make it with more the utility value in industry.
Utility model content
The purpose of this utility model is that proposing a kind of cell slice test mechanism, the electricity of positive rear electrode dislocation can be tested Pond piece, and can be reduced the outflow of cell piece back side electric current, and reduce test electric current.
For this purpose, the utility model uses following technical scheme:
A kind of cell slice test mechanism, including set gradually from bottom to top testboard, transmitting device and test probe, In,
The transmitting device is for conveying cell piece;
The testboard can be with the rear-face contact of the mesuring battary piece conveyed on the transmitting device, the testboard packet Braced frame, at least two test-strips are included, each test-strips are arranged in parallel and are detachably connected with the braced frame, and phase There is gap between two adjacent test-strips;
The test probe can be with the front face of the mesuring battary piece conveyed on the transmitting device.
Further, the both ends of the test-strips are equipped with connector, and the connector passes through screw and the braced frame Connection.
Further, the test-strips and transmission cable are electrically connected.
Further, the transmitting device includes two conveyer belts parallel with each test-strips, and the conveyer belt It is staggered with the test-strips.
Further, fixing piece is equipped with below the testboard, the fixing piece, which is equipped with, adjusts the testboard height Height adjust component.
Further, the height adjustment component includes straight line slide unit, the guidance that output end is connect with the braced frame The guide rail that the relatively described fixing piece of the braced frame moves back and forth.
Further, the quantity of the test probe is multiple, and the position of the electrode on corresponding cell piece front is in a row Setting.
Further, the test probe is set as multiple rows of.
Further, the test probe is fixed on fixed bracket.
Further, the cell slice test mechanism further includes driving the relatively described transmitting device of the fixed bracket reciprocal Mobile lifting device.
The utility model has the following beneficial effects:
1, the way of contact of cell piece back side test is changed to conductive performance test bench contact by traditional probe contact, can survey Positive rear electrode is tried not in the cell piece of same position, fragment and crack problem caused by reducing because of test;
2, testboard uses multiple independent test-strips, can change test according to different pattern and the cell piece of size The quantity of item and position, without remaking testboard;
3, the metallic area of multiple independent test-strips is far below bulk metal platform, not only saves material cost, moreover it is possible to Avoid double-side cell built-in testing inaccuracy problem caused by reflecting because of metal large area.
Detailed description of the invention
Fig. 1 is the structural front view for the cell slice test mechanism that specific embodiment of the present invention provides;
Fig. 2 is the structure top view for the cell slice test mechanism that specific embodiment of the present invention provides;
Fig. 3 is the structural side view for the cell slice test mechanism that specific embodiment of the present invention provides;
Fig. 4 is the structural representation of the testboard in the cell slice test mechanism that specific embodiment of the present invention provides Figure.
In figure: 10- testboard, 11- braced frame, 12- test-strips, 13- connector, 14- screw, 15- fixing piece, 21- Conveyer belt, 31- test probe, the fixed bracket of 32-, 40- cell piece.
Specific embodiment
Further illustrate the technical solution of the utility model below with reference to the accompanying drawings and specific embodiments.
As shown in Figures 1 to 4, the cell slice test mechanism of the utility model includes the testboard set gradually from bottom to top 10, transmitting device and test probe 31.Wherein, testboard 10 can be with the back side of the mesuring battary piece 40 conveyed on transmitting device Contact, testboard 10 include braced frame 11, the test-strips 12 of at least two metal materials, each test-strips 12 be arranged in parallel and with Braced frame 11 is detachably connected, and has gap between two adjacent test-strips 12, and test-strips 12 and transmission cable are electrical Connection is the energization of testboard 10 by transmission cable, so that testboard 10 and test probe 31 cooperate to carry out the survey of electrical property Examination;Transmitting device includes two conveyer belts 21 parallel with each test-strips 12, and conveyer belt 21 is staggered with test-strips 12, is used for Convey cell piece 40;Testing probe 31 can be with the front face of the mesuring battary piece 40 conveyed on transmitting device.
Testboard 10 rises, and makes the rear-face contact of corresponding test-strips 12 and cell piece 40 and jacks up cell piece, test is visited Needle 31 pushes, the front face with cell piece 40, and cell piece 40 is clamped between testboard 10 and test probe 31, can be surveyed Positive rear electrode is tried not in the cell piece of same position;It is replaced in the way of conductive performance test bench 10 contact 40 back side of cell piece Traditional probe way of contact, fragment and crack problem caused by greatly reducing because of test.
In addition, when testboard 10 rises, corresponding test-strips 12 may pass through biography because conveyer belt 21 and test-strips 12 are staggered Defeated device jacks up cell piece 40, and does not influence the conveying of conveyer belt 21, convenient test;After being completed, under testboard 10 General who has surrendered's cell piece 40 puts back to conveyer belt 21, so that cell piece 40 can continue to be conveyed, the test and transmission for cell piece 40 It does not interfere with each other, is respectively normally carried out.
Furthermore testboard 10 uses multiple independent test-strips 12, multiple only for testing cell piece 40 of the same area The metallic area of vertical test-strips 12 is far below bulk metal platform, not only saves material cost, moreover it is possible to reduce the back of cell piece 40 Double-side cell built-in testing inaccuracy problem caused by face metal large area reflects.
Specifically, in order to be detachably connected each test-strips 12 and braced frame 11, the utility model is in test-strips 12 Both ends are equipped with connector 13, and connector 13 is connect by screw 14 with braced frame 11.In this way, can be according to the figure of cell piece 40 Case and size set quantity and the position of test-strips 12, greatly improve the versatility of the testboard 10, in test different size When cell piece 40, without remaking testboard 10, so as to reduce testing cost.
In order to enable testboard 10 to go up and down, the utility model is equipped with fixing piece 15, fixing piece 15 below testboard 10 The height for being equipped with adjustment 10 height of testboard adjusts component (not shown).Height adjustment component is common technological means, than Such as, height adjustment component can be connect with braced frame 11 for output end straight line slide unit (or cylinder) guides 11 phase of braced frame The guide rail that fixing piece 15 is moved back and forth.
For testing the setting of probe 31, the quantity of the test probe 31 of the utility model is multiple, and corresponds to cell piece The position of electrode on 40 fronts is set in a row.The multiple test probes 31 set in a row survey the electrode on cell piece 40 Examination, test are accurate;Certainly, it can also set multiple rows of for test probe 31, it is more on multiple rows of corresponding cell piece 40 of test probe 31 A electrode can comprehensively test cell piece 40.
In order to make each test probe 31 is synchronous to push or lift, each test probe 31 is fixed on fixed branch by the utility model On frame 32, lifting device (not shown) is connected on fixed bracket 32, lifting device drives fixed 32 relative transport device of bracket It moves back and forth.Lifting device is common technological means, for example, cylinder, oil cylinder etc..
To sum up, the cell slice test mechanism of the utility model can test the cell piece of positive rear electrode dislocation, and can drop The low double-side cell as caused by backside reflection tests inaccurate problem, in addition to this can also reduce testing cost.
Technical principle of the utility model has been described above with reference to specific embodiments.These descriptions are intended merely to explain this reality With novel principle, and it cannot be construed to the limitation to scope of protection of the utility model in any way.Based on the explanation herein, Those skilled in the art, which does not need to pay for creative labor, can associate with other specific implementation modes of this utility model, These modes are fallen within the protection scope of the utility model.

Claims (10)

1. a kind of cell slice test mechanism, which is characterized in that including testboard (10), the transmitting device set gradually from bottom to top And test probe (31), wherein
The transmitting device is for conveying cell piece (40);
The testboard (10) can be with the rear-face contact of the mesuring battary piece (40) conveyed on the transmitting device, the test Platform (10) includes braced frame (11), at least two test-strips (12), each test-strips (12) be arranged in parallel and with the branch Support frame frame (11) is detachably connected, and has gap between two adjacent test-strips (12);
Test probe (31) can be with the front face of the mesuring battary piece (40) conveyed on the transmitting device.
2. cell slice test mechanism according to claim 1, which is characterized in that the both ends of the test-strips (12), which are equipped with, to be connected Fitting (13), the connector (13) are connect by screw (14) with the braced frame (11).
3. cell slice test mechanism according to claim 1, which is characterized in that the test-strips (12) and transmission cable electricity Property connection.
4. cell slice test mechanism according to claim 1, which is characterized in that the transmitting device includes two and each institute The parallel conveyer belt (21) of test-strips (12) is stated, and the conveyer belt (21) is staggered with the test-strips (12).
5. cell slice test mechanism according to claim 1, which is characterized in that be equipped with and fix below the testboard (10) Part (15), the fixing piece (15) are equipped with the height adjustment component for adjusting testboard (10) height.
6. cell slice test mechanism according to claim 5, which is characterized in that the height adjustment component includes output end The straight line slide unit that connect with the braced frame (11), the guidance relatively described fixing piece (15) of braced frame (11) are back and forth moved Dynamic guide rail.
7. cell slice test mechanism according to claim 1, which is characterized in that the quantity of test probe (31) is more It is a, and the position of the electrode on corresponding cell piece (40) front is set in a row.
8. cell slice test mechanism according to claim 7, which is characterized in that the test probe (31) is set as more Row.
9. cell slice test mechanism according to claim 7 or 8, which is characterized in that the test probe (31) is fixed on On fixed bracket (32).
10. cell slice test mechanism according to claim 9, which is characterized in that the cell slice test mechanism further includes The lifting device for driving the relatively described transmitting device of the fixed bracket (32) to move back and forth.
CN201822159876.7U 2018-12-21 2018-12-21 A kind of cell slice test mechanism Expired - Fee Related CN209105118U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201822159876.7U CN209105118U (en) 2018-12-21 2018-12-21 A kind of cell slice test mechanism

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201822159876.7U CN209105118U (en) 2018-12-21 2018-12-21 A kind of cell slice test mechanism

Publications (1)

Publication Number Publication Date
CN209105118U true CN209105118U (en) 2019-07-12

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Application Number Title Priority Date Filing Date
CN201822159876.7U Expired - Fee Related CN209105118U (en) 2018-12-21 2018-12-21 A kind of cell slice test mechanism

Country Status (1)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111505471A (en) * 2020-05-22 2020-08-07 江西电力职业技术学院 Insulation strength detection device and insulation strength tester

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111505471A (en) * 2020-05-22 2020-08-07 江西电力职业技术学院 Insulation strength detection device and insulation strength tester

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Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant
CP01 Change in the name or title of a patent holder

Address after: No. 199, deer mountain road, Suzhou high tech Zone, Jiangsu Province

Patentee after: CSI Cells Co.,Ltd.

Patentee after: Atlas sunshine Power Group Co.,Ltd.

Address before: No. 199, deer mountain road, Suzhou high tech Zone, Jiangsu Province

Patentee before: CSI Cells Co.,Ltd.

Patentee before: CSI SOLAR POWER GROUP Co.,Ltd.

CP01 Change in the name or title of a patent holder
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20190712

Termination date: 20211221

CF01 Termination of patent right due to non-payment of annual fee