CN109701905A - A kind of capacitance detecting line - Google Patents

A kind of capacitance detecting line Download PDF

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Publication number
CN109701905A
CN109701905A CN201811639354.5A CN201811639354A CN109701905A CN 109701905 A CN109701905 A CN 109701905A CN 201811639354 A CN201811639354 A CN 201811639354A CN 109701905 A CN109701905 A CN 109701905A
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China
Prior art keywords
capacitor
probe
test
leakage current
station
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CN201811639354.5A
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CN109701905B (en
Inventor
熊焰明
周凯咨
高�敬一
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JIANGSU EEEST ADVANCED TECHNOLOGY Co Ltd
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JIANGSU EEEST ADVANCED TECHNOLOGY Co Ltd
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Publication of CN109701905A publication Critical patent/CN109701905A/en
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Abstract

The present invention provides a kind of capacitance detecting line, each equipment is mutually merged, at low cost and high-efficient.It includes feeding device, blanking device, it is characterized by: the feeding device, blanking device are separately positioned on the head end of the detection line, tail end, position further includes marking mechanism, rib cutting mechanism, ageing oven, parameter testing station, sorting mechanism among the detection line, and capacitor is shifted between feeding device, marking mechanism, rib cutting mechanism, ageing oven, parameter testing station, sorting mechanism, blanking device by transfer device.

Description

A kind of capacitance detecting line
Technical field
The present invention relates to capacitance measurement technique field, specially a kind of capacitance detecting line.
Background technique
After chip electrolytic capacitor such as tantalum capacitor in road production, the capacitor produced passes through lead frame for multiple capacitance connections At a band, and when detecting to it, need to carry out mark, rib cutting, aging, surge, 4 parameter testings these processes, Judge whether the capacitor produced is qualified, the equipment for realizing these processes at this stage is all mutually indepedent, product is in each equipment Between shift or installation is needed by manually nursing to complete or be also required to more people simultaneously to distinct device, efficiency It is low, operating cost is high, simultaneously because distinct device may structure with the same function, such as aging process needs loading and unloading to fill Set, 4 parameter testing processes are also required to handling equipment, which results in infrastructure cost height.
Summary of the invention
Lead to low efficiency, problem at high cost independently of each other for each equipment of traditional detection line, the present invention provides one kind Capacitance detecting line, each equipment mutually merge, at low cost and high-efficient.
Its technical solution is such that a kind of capacitance detecting line comprising feeding device, blanking device, it is characterised in that: The feeding device, blanking device are separately positioned on the head end of the detection line, tail end, and position further includes among the detection line Marking mechanism, rib cutting mechanism, ageing oven, parameter testing station, sorting mechanism, capacitor by transfer device in feeding device, beat Mark mechanism, ageing oven, parameter testing station, sorting mechanism, shifts between blanking device rib cutting mechanism.
It is further characterized by:
The transfer device include connect the feeding device, marking mechanism, rib cutting mechanism feed rail, pass through the ageing oven The conveyer belt of inside, the discharging rail for connecting the parameter testing station, sorting mechanism, blanking device;
Be equipped with the first feeding device for shifting capacitor between the feed rail and the conveyer belt, the conveyer belt with it is described The second feeding device for shifting capacitor is equipped between discharging rail;
Pressurization probe more than or equal to 1 group is installed, the probe is pressed in by group by reciprocating mechanism in the ageing oven Capacitor is powered on capacitor, capacitor temperature-pressure is made to carry out seasoned and aging;
Previous group pressurizes probe after pressurizeing to one group of capacitor, and the pressurization probe of later group can also detect previous group before pressurization and add Probe is pressed to the pressurized condition of capacitor and is delivered in controller, to judge the working condition of previous group pressurization probe;
Ageing oven the latter station is room temperature leakage current test station, for measuring capacitor room temperature leakage current and being delivered to control In device processed, the room temperature leakage current test station includes reciprocating mechanism and the test that is installed on the reciprocating mechanism Probe, the test probe are connect with test device;
The ageing oven inside end is equipped with high-temperature current leakage test station, for measuring the high-temperature current leakage parameter of capacitor and defeated It send into controller, the high-temperature current leakage test station includes reciprocating mechanism and is installed on the reciprocating mechanism Test probe, the test probe connect with test device;
The ageing oven interior forward end or outer front end are equipped with front end leakage current test station, for having just enter into ageing oven Capacitor carries out leakage current prediction to the capacitor into ageing oven and is delivered in controller, the front end electric leakage current test work Position includes reciprocating mechanism and the test probe being installed on the reciprocating mechanism, the test probe and test device Connection;
Middle-end is equipped with middle part leakage current test station inside the ageing oven, for carrying out leakage current survey to by seasoned capacitor Try and be delivered in controller, thus with the resulting parameter comparison of front end leakage current test station, assess seasoned effect, it is described in The test probe of portion's leakage current test station is between the pressurization probe and by being pressed in capacitor under reciprocating mechanism On, the pressurization probe is connect with test device;
It further includes surge test station, by the way that probe is pressed on capacitor, carry out surge test and data are delivered to control In device.
After such detection line, a detection line incorporates mark, rib cutting, aging, test and screens in one, Reduce and need the artificial operating cost shifted and install originally, while also eliminating some with identical function on different device The structure of energy, to eliminate infrastructure cost, and then saves cost;Simultaneously by using the mode of integrated detection line, certainly Dynamicization degree is high, thus more efficient.
Detailed description of the invention
Fig. 1 is schematic structural view of the invention;
Fig. 2 is the station layout drawing inside and outside ageing oven;
Fig. 3 is schematic diagram after ribbon capacitor rib cutting.
Specific embodiment
By taking tantalum capacitor as an example, a kind of capacitance detecting line as shown in Figure 1 and Figure 2 comprising the feeding device 1 that sets gradually, Marking mechanism 2, rib cutting mechanism 3, ageing oven 4, parameter testing station 5, sorting mechanism 6, blanking device 7, tantalum capacitor pass through transfer Mechanism is in feeding device 1, marking mechanism 2, rib cutting mechanism 3, ageing oven 4, parameter testing station 5, sorting mechanism 6, blanking device 7 Between shift, in addition, parameter testing station 5 include room temperature leakage current test station 5-1, be located at conveyer belt 8-1 end, and And cooling zone 5-2 is equipped between room temperature leakage current test station 5-1 and ageing oven 4, it can dry the tantalum capacitor after aging cold But, and capacitance, loss, these three parameter testing stations of ESR be located at discharging rail 8-3.
Specifically, transfer device include connect feeding device 1, marking mechanism 2, rib cutting mechanism 2 feed rail 8-2, pass through The discharging rail 8-3 of conveyer belt 8-1, Connecting quantity test station 5, sorting mechanism 6, feeding device 7 inside ageing oven 4, charging The first feeding device 8-4 for shifting tantalum capacitor, conveyer belt 8-1 and discharging rail 8-3 are equipped between rail 8-2 and conveyer belt 8-1 Between be equipped with the second feeding device 8-5 for shifting tantalum capacitor.Feed rail 8-2, discharging rail 8-3 cloth vertical with conveyer belt 8-1 It sets, it is possible to reduce detection line length, feeding device 1, feeding device 7 and application No. is a kind of 201810437937.3 tantalum capacitors Rear road production characterization processes and production line in the empty tray conveying mechanism, the full charging tray conveying mechanism that use it is similar, ribbon tantalum Capacitor is placed in charging tray, charging tray automatic lifting is driven by elevating mechanism, and be sent into feed rail 8-2, by marking mechanism 2 at every The symbolic information such as polarity are put on tantalum capacitor, marking mechanism 2 can may be laser mark printing device for ink jet numbering machine, then by cutting Muscle mechanism 2 carries out rib cutting processing to ribbon tantalum capacitor, side lead frame is removed, as shown in figure 3, then feed rail 8-2's Terminal waits, and the tantalum capacitor after the first feeding device 8-4 will be processed by suction nozzle is placed in the start position of conveyer belt 8-1 On charging plate, a charging plate can disposably put more tantalum capacitor items, for example, the first feeding device 8-4 can be at one 4, after occupying successively laterally are put on charging plate, controller controls conveyer belt 8-1 one lattice of advance, then the first feeding device 8- 4 continue to be placed on next charging plate, and charging plate is mutually fixed with conveyer belt, in cycles loopy moving, at the same charging plate with Outside does not have electrical connection, is easy to implement probe and pushes independent power-up, so as to realize the test of high-temperature current leakage, tantalum electricity Hold item and heat the seasoned, aging of making alive progress in ageing oven 4 on conveyer belt 8-1, and measure room temperature leakage current parameter, passes through Tantalum capacitor after degradation is placed on discharging rail 8-3 by the second feeding device 8-5, is surveyed by the parameter of three parameter testing stations Trial assembly is set measures rest parameter, then according to all tests and is delivered to the data of controller and screens to tantalum capacitor, leads to It crosses sorting mechanism 6 and cuts off underproof tantalum capacitor, sorting mechanism 6 can be the cutter of controller control, which can be more Group is respectively used to the unqualified tantalum capacitor of excision different parameters, and the tantalum capacitor of remaining qualification then passes through blanking device 7 and stores Come.
After such detection line, a detection line incorporates mark, rib cutting, aging, test and screens in one, Reduce and need the artificial operating cost shifted and install originally, while also eliminating some with identical function on different device The structure of energy, to eliminate infrastructure cost, and then saves cost;Simultaneously by using the mode of integrated detection line, certainly Dynamicization degree is high, thus more efficient.
In addition, as shown in Fig. 2, 4 outer front end of ageing oven is equipped with front end leakage current test station 5-3, for old to entering The capacitor for changing furnace 4 carries out leakage current prediction and is delivered in controller, and front end leakage current test station 5-3 includes and moves up and down The probe card 5-01 of mechanism connection and the test probe being installed on probe card 5-01, test probe are connect with test device;Always Preheating zone 5-4 can also be not provided with for first preheating to capacitor to save length by changing the preheating zone 5-4 that furnace 4 includes front end Degree, the preheating zone rear end 5-4 are equipped with pressor areas 5-5, and pressor areas 5-5 is equipped with the pressurization probe more than or equal to 2 groups, and specific pressurization is visited The group number of needle is adapted according to ageing time length, and probe controls probe card 5-01 by reciprocating mechanism and is pressed in tantalum electricity by group Hold upper to the power-up of tantalum capacitor, the quantity of one group of probe is corresponding with the position of one group of tantalum capacitor top electrode and quantity, adds capacitor Warm pressurization carries out seasoned and aging, while controller can also be made to judge whether pressurization probe is powered on by the data that prediction generates Pressure, if the leakage current of front end leakage current test station 5-3 prediction is unqualified, correlation pressurization probe is being pushed under pressure It is in close state, to prevent from exploding in ageing process;It is also possible to which the probe that makes to pressurize is with current-limiting protection function Can, it prevents capacitor in pressure process from exploding, can thus be not provided with front end leakage current test station 5-3;Previous group adds Press probe after pressurizeing to one group of tantalum capacitor, the pressurization probe of later group can also detect previous group pressurization probe to tantalum before pressurization The pressurized condition of capacitor is simultaneously delivered in controller, so that the working condition of previous group pressurization probe is judged, due in ageing oven 4 Middle probe is easy to oxidize to lead to poor contact, and can find the problem probe in time in this way, is polished or is replaced.
It is located at 4 inside middle-end of ageing oven between pressor areas and is equipped with middle part leakage current test station 5-6, for by seasoned Capacitor carry out electric leakage and current test and be delivered in controller, thus with the resulting parameter pair of front end leakage current test station 5-3 Than assessing seasoned effect, the test probe of middle part leakage current test station 5-6 is located between pressurization probe and by above moving down It is pressed under motivation structure on tantalum capacitor, pressurization probe is connect with test device.
4 inside end of ageing oven is equipped with high-temperature current leakage test station 5-7, and the high-temperature current leakage for measuring tantalum capacitor is joined It counts and is delivered in controller, high-temperature current leakage test station 5-7 includes reciprocating mechanism and is installed on reciprocating mechanism On test probe, test probe connect with test device.The high-temperature current leakage parameter that this step measures is as an important ginseng Number can judge whether tantalum capacitor is qualified by being compared generation difference with room temperature leakage current, and the detection of traditional monomer Equipment is independently picked out due to can not achieve capacitor, can only measure one parameter of room temperature leakage current, and also therefore this detection line passes through Three parameters of difference for measuring room temperature leakage current, high-temperature current leakage, room temperature leakage current and high-temperature current leakage substantially increase test It is horizontal.
And carry out surge test if necessary, then surge examination need to be only set between parameter testing station 5 and rib cutting mechanism 2 Station is tested, by the way that probe is pressed on tantalum capacitor, carry out surge test and data are delivered in controller.
In addition, for above-mentioned test station, the combination of surge test station, the probe for being powered on area and capacitor, it can be with It is pressed on one end lead frame of ribbon capacitor by a probe, then is pressed in by quantity probe corresponding with capacitor quantity One end of lead frame is cut off, and probe is then mounted on probe card, probe card is equipped with pcb board, and by connecting with pcb board Conducting wire is connect with external test machine or controller, and it is only that each capacitor may be implemented when to being pressed on capacitor under probe card Vertical interval realizes that capacitor independently picks out to electricity, so as to measure the relevant parameter of each capacitor, good test effect.Such as Shown in Fig. 2, conveyer belt 8-1 is mobile using step-by-step movement, i.e., once a mobile unit, a specific unit are a charging plate The setting at 9 length, each station length or interval is also corresponding with the length of charging plate, and controller passes through control conveying The mobile unit of band 8-1, the first feeding device 8-4 charge to charging plate 9, then mobile one or more units, charging Capacitor on plate 9 enters front end leakage current test station 5-3 and carries out pretest, then mobile one or more units enter ageing oven 4, it is heated, then mobile one or more units pressurize to it by the probe more than or equal to one group into pressor areas 5-5, The mobile corresponding unit of charging plate 9 enters middle part leakage current test station 5-6 simultaneously, then mobile one or more units enter After pressor areas 5-5 repressurization, into high-temperature current leakage test station 5-7, surveyed subsequently into cooling zone 5-2, room temperature leakage current Trial work position 5-1, the second feeding device 8-5 is reached, the material on charging plate 9 is delivered in discharging rail 8-3, and empty charging plate 9 is then Front end is returned to from the lower part conveyer belt 8-1 and carries out feeding, and each station orderly carries out high degree of automation.
More than, it is merely preferred embodiments of the present invention, but scope of protection of the present invention is not limited thereto, it is any It is familiar with the people of the technology within the technical scope disclosed by the invention, any changes or substitutions that can be easily thought of, should all cover at this Within the protection scope of invention.Therefore, protection scope of the present invention should be subject to the protection scope in claims.

Claims (10)

1. a kind of capacitance detecting line comprising feeding device, blanking device, it is characterised in that: the feeding device, blanking device Be separately positioned on head end, the tail end of the detection line, among the detection line position further include marking mechanism, it is rib cutting mechanism, old Change furnace, parameter testing station, sorting mechanism, capacitor is by transfer device in feeding device, marking mechanism, rib cutting mechanism, aging Furnace, sorting mechanism, shifts between blanking device parameter testing station.
2. a kind of capacitance detecting line according to claim 1, it is characterised in that: the transfer device includes connecting on described Expect device, marking mechanism, the feed rail of rib cutting mechanism, the conveyer belt inside the ageing oven, the connection parameter testing Station, sorting mechanism, blanking device discharging rail.
3. a kind of capacitance detecting line according to claim 2, it is characterised in that: between the feed rail and the conveyer belt Equipped with the first feeding device for shifting tantalum capacitor, it is equipped between the conveyer belt and the discharging rail for shifting tantalum capacitor The second feeding device.
4. a kind of capacitance detecting line according to claim 1, it is characterised in that: be equipped with and be more than or equal in the ageing oven 1 group of pressurization probe, the probe are pressed on capacitor by group by reciprocating mechanism and are powered on to capacitor, and capacitor temperature-pressure is made Carry out seasoned and aging.
5. a kind of capacitance detecting line according to claim 4, it is characterised in that: previous group pressurizes probe to one group of capacitor After pressurization, the pressurization probe of later group can also detect previous group pressurization probe to the pressurized condition of capacitor and is delivered to before pressurization In controller, to judge the working condition of previous group pressurization probe.
6. a kind of capacitance detecting line according to claim 1, it is characterised in that: ageing oven the latter station is room temperature Leakage current test station, for measuring capacitor room temperature leakage current and being delivered in controller, the room temperature leakage current test station Including reciprocating mechanism and the test probe being installed on the reciprocating mechanism, the test probe and test device connect It connects.
7. a kind of capacitance detecting line according to claim 1, it is characterised in that: the ageing oven inside end is equipped with high temperature Leakage current test station, for measuring the high-temperature current leakage parameter of capacitor and being delivered in controller, the high-temperature current leakage is surveyed Trial work position includes reciprocating mechanism and the test probe that is installed on the reciprocating mechanism, the test probe with test Device connection.
8. a kind of capacitance detecting line according to claim 1, it is characterised in that: the ageing oven interior forward end or outside Front end is equipped with front end leakage current test station, carries out for the capacitor to the capacitor for having just enter into ageing oven or wait enter ageing oven Leakage current predicts and is delivered in controller that the front end leakage current test station includes reciprocating mechanism and is installed on described Test probe on reciprocating mechanism, the test probe are connect with test device.
9. a kind of capacitance detecting line according to claim 8, it is characterised in that: middle-end is equipped with middle part inside the ageing oven Leakage current test station, for carrying out electric leakage current test to the seasoned capacitor of process and being delivered in controller, thus and front end The resulting parameter comparison of leakage current test station assesses seasoned effect, the test probe position of the middle part leakage current test station Between the pressurization probe and by being pressed on capacitor under reciprocating mechanism, the pressurization probe and test device connect It connects.
10. a kind of capacitance detecting line according to claim 1, it is characterised in that: it further includes surge test station, is passed through Probe is pressed on capacitor, surge test is carried out and data are delivered in controller.
CN201811639354.5A 2018-12-29 2018-12-29 Capacitance detection line Active CN109701905B (en)

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CN110523644A (en) * 2019-08-13 2019-12-03 江苏伊施德创新科技有限公司 Detection device for electronic component
CN110947648A (en) * 2019-12-18 2020-04-03 广东恩慈智能科技有限公司 Full-automatic ox horn capacitor aging data monitoring and testing method
CN112162180A (en) * 2020-09-18 2021-01-01 安徽龙和电力集团有限公司 Electric power test box and test method thereof

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