CN109448620B - Display panel tests circuit, system and method - Google Patents

Display panel tests circuit, system and method Download PDF

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Publication number
CN109448620B
CN109448620B CN201910013511.XA CN201910013511A CN109448620B CN 109448620 B CN109448620 B CN 109448620B CN 201910013511 A CN201910013511 A CN 201910013511A CN 109448620 B CN109448620 B CN 109448620B
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grid
control device
drive control
cabling
test
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CN109448620A (en
Inventor
高鹏
李向峰
宋子科
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Chengdu BOE Display Technology Co Ltd
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Chengdu CEC Panda Display Technology Co Ltd
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    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Liquid Crystal Display Device Control (AREA)

Abstract

The embodiment of the present application provides a kind of display panel test circuit, system and method, which includes: the first connection unit for receiving Test driver signal;For receiving the second connection unit of test control signal;The first grid cabling and second grid cabling being connect with first connection unit, the first grid cabling and the second grid cabling are respectively used to be connected to one end of first grid driving line and second grid driving line, the control terminal for the drive control device that the first grid drives line and the second grid that the other end of line is driven to be connected to display panel;Wherein, it is in series with controlled member on the first grid cabling and/or the second grid cabling, the control terminal of the controlled member is connected to second connection unit.Circuit provided in this embodiment is able to solve the problem of grid signal Flaw detectability that can not promote display panel driving in the prior art.

Description

Display panel tests circuit, system and method
Technical field
The invention relates to display panel the field of test technology more particularly to a kind of display panel test circuit, it is System and method.
Background technique
TFT LCD (Thin Film Transistor-LCD) industry gradually towards large scale, develop by direction high-definition, is Meet panel driving ability, the mode that grid grade driving line is all made of two sides bilateral drivings is designed.
In actual panel manufacturing process, after Array (array) technique be to panel performance checking, need to be in panel Special configuration test circuit is tested when design, and since traditional large scale cabling designs, Gate (grid) cabling is using survey Examination driving method is that up/down two sides drive simultaneously, to avoid decaying because of signal caused by distortion, but use and double drive test circuits When being checked, traditional route can not complete analog drive signal, cause the grid signal line defect of bilateral driving can not be complete Full inspection goes out.
Summary of the invention
The embodiment of the present application provides a kind of display panel test circuit, system and method, in the prior art can not with overcoming The problem of promoting the grid signal Flaw detectability of display panel driving.
In a first aspect, the embodiment of the present application provides a kind of display panel test circuit, comprising:
For receiving the first connection unit of Test driver signal;The second connection for receiving test control signal is single Member;
The first grid cabling and second grid cabling being connect with first connection unit, the first grid cabling and The second grid cabling is respectively used to be connected to one end of first grid driving line and second grid driving line, the first grid The other end of pole driving line and second grid driving line is connected to the control terminal of the drive control device of display panel;
Wherein, controlled member, the controllable member are in series on the first grid cabling and/or the second grid cabling The control terminal of part is connected to second connection unit, the controlled member be used under the control of test control signal conducting or Shutdown, the drive control device are used for the on or off under the control of the Test driver signal.
In a kind of possible design, display panel includes the pixel column of multiple parallel arrangements, and each pixel column includes more A pixel.
In a kind of possible design, the quantity of the drive control device is multiple, multiple drive control devices It is corresponded with multiple pixel columns of the display panel;
Wherein, the both ends of each drive control device are respectively connected to source electrode cabling and the drive control device pair The pixel in pixel column answered;
The source electrode cabling is for providing charging signals, and when drive control device conducting, the source electrode cabling is mentioned The charging signals of confession charge to the pixel in the pixel column.
In a kind of possible design, the drive control device is the first field-effect tube, the drive control device Control terminal is the grid of first field-effect tube.
In a kind of possible design, the controlled member is the second field-effect tube, and the control terminal of the controlled member is The grid of second field-effect tube.
Second aspect, the embodiment of the present application provide a kind of test system for display panel, comprising: display panel and such as right It is required that panel test circuit described in any one of 1-5.
The third aspect, the embodiment of the present application provide a kind of display panel test method, based on any one of claim 1-5 institute The display panel test circuit stated, which comprises
The first test control signal is provided to the second connection unit, to control on first grid cabling or second grid cabling Controlled member disconnect;
If the pixel voltage of the corresponding pixel of drive control device is abnormal, the second grid driving line or institute are determined First grid driving line is stated to be broken.
In a kind of possible design, after first test control signal of offer to the second connection unit, further includes:
If the pixel voltage of the corresponding pixel of the drive control device is normal, the is provided to second connection unit Two test control signals, to control the controlled member conducting;
Test driver signal is provided to first connection unit, and according to the corresponding pixel of the drive control device Pixel voltage carries out driving test.
It is described to provide Test driver signal to first connection unit in a kind of possible design, and according to described The pixel voltage of the corresponding pixel of drive control device, carries out driving test, comprising:
Test driver signal is provided to first connection unit, the Test driver signal is for controlling the driving control Break-over of device processed;
If the pixel voltage of the corresponding pixel of the drive control device is normal, determine that driving is normal, otherwise, it is determined that driving It is dynamic abnormal.
In a kind of possible design, if the pixel voltage of the corresponding pixel of the drive control device is normal, Determine that driving is normal, otherwise, it is determined that driving is abnormal, comprising:
If the charging signals one that the pixel voltage and the source electrode cabling of the corresponding pixel of the drive control device provide It causes, then determines that driving is normal, otherwise, it is determined that driving is abnormal.
Display panel provided in this embodiment tests circuit, system and method, provided with for receiving Test driver signal The first connection unit and the second connection unit for receiving test control signal, be also provided with and first connection unit The first grid cabling and second grid cabling of connection, the first grid cabling and second grid cabling are respectively used to be connected to First grid drives one end of line and second grid driving line, and the first grid driving line and the second grid drive line The other end is connected to the control terminal of the drive control device of display panel, drives to control under the control of Test driver signal The on or off of movement controller part, wherein be additionally provided with controlled member, be connected on first grid cabling and/or described second On grid cabling, for the on or off under the control in the Test driver signal.Grid of this programme in test circuit Increase controlled member on the cabling of pole, the switching of display panel unilateral side driving and bilateral driving is realized, to promote big epoch display surface Gate plate signal defect Detection capability.
Detailed description of the invention
In order to illustrate the technical solutions in the embodiments of the present application or in the prior art more clearly, to embodiment or will show below There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is this Shen Some embodiments please for those of ordinary skill in the art without any creative labor, can be with It obtains other drawings based on these drawings.
Fig. 1 is the array test schematic diagram that display panel provided by the embodiments of the present application tests circuit;
Fig. 2 is the structural schematic diagram that display panel provided by the embodiments of the present application tests circuit;
Fig. 3 is the configuration diagram that display panel provided by the embodiments of the present application tests circuit;
Fig. 4 is the structural schematic diagram of test system for display panel provided by the embodiments of the present application;
Fig. 5 is the flow diagram of display panel test method provided by the embodiments of the present application.
Specific embodiment
To keep the purposes, technical schemes and advantages of the embodiment of the present application clearer, below in conjunction with the embodiment of the present application In attached drawing, the technical scheme in the embodiment of the application is clearly and completely described, it is clear that described embodiment is Some embodiments of the present application, instead of all the embodiments.Based on the embodiment in the application, those of ordinary skill in the art Every other embodiment obtained without creative efforts, shall fall in the protection scope of this application.
The description and claims of this application and term " first ", " second ", " third " " in above-mentioned attached drawing The (if present)s such as four " are to be used to distinguish similar objects, without being used to describe a particular order or precedence order.It should manage The data that solution uses in this way are interchangeable under appropriate circumstances, so that embodiments herein described herein for example can be to remove Sequence other than those of illustrating or describe herein is implemented.In addition, term " includes " and " having " and theirs is any Deformation, it is intended that cover it is non-exclusive include, for example, containing the process, method of a series of steps or units, system, production Product or equipment those of are not necessarily limited to be clearly listed step or unit, but may include be not clearly listed or for this A little process, methods, the other step or units of product or equipment inherently.
Fig. 1 is the array test schematic diagram that the application implements that the display panel provided tests circuit, as shown in Figure 1:
To drive control device, for example, in figure 1 thin film transistor (TFT) (TFT), the Test driver signal provided is sometimes referred to For grid (Gate) signal, it is designed to include the Test driver signal of odd number and the Test driver signal of even number, is surveyed with distinguishing Trial signal: specifically, Gate ODD and Gate Even as shown in Figure 1, that is, be respectively used to receive the Test driver signal of odd number With the Test driver signal of even number.In practical application, Gate ODD and Gate Even are the connection list that can receive electric signal Member, for example, can be signal transmission port, conductive contact blade etc..
Specifically, the test probe contacts Gate of tester table can be used when carrying out display panel driving test ODD or Gate Even, Gate ODD or Gate Even pass through the gate driving line in grid cabling and display panel (Panel) Connection.By grid cabling and gate driving line by Test driver signal be passed in display panel drive control device (for example, TFT in Fig. 1), carry out driving test.
Actual testing process, which can be such that, to be driven by Gate ODD or Gate Even to the grid input test of TFT Signal is so that TFT is connected;Meanwhile the source electrode of TFT is connected to source electrode (Source) cabling, which is used for transmission electric signal (for example, charging signals), once TFT is connected, then charging signals can be connect by TFT into display panel with the drain electrode of the TFT Pixel (Pixel) charging;Correspondingly, popping one's head in by using test detects pixel voltage, the drive of display panel can be tested out It is dynamic to whether there is defect.For example, when driving abnormal, TFT is not turned on, correspondingly, charging signals can not fill pixel Point electricity, then pixel voltage will not be detected by testing probe, form the continuous dim spot along grid direction of routing, tester table is by patrolling It volume calculates and can be determined that be defined as driving abnormal.
However, in practical applications, especially in the driving testing scheme of large scale display panel, due to grid cabling and Gate driving line is longer, therefore the Test driver signal decline transmitted thereon is more obvious, and the decline of Test driver signal excessively may Will lead to TFT can not normally, respective pixel charging decaying, cause test pop one's head in test result inaccuracy.
In this regard, be directed to large scale display panel, the Test driver mode that can be used for drive control device (for example, Thin film transistor (TFT) above-mentioned) control terminal two sides drive simultaneously, to avoid because Test driver signal decaying caused by test result Inaccuracy, physical circuit can be as shown in Figure 1.
However, in scheme shown in Fig. 1, when being checked using double drives test circuit, grid cabling and gate driving The line architecture that line is constituted is closed circuit, even if the gate driving line of drive control device side breaks in display panel, is surveyed Examination driving signal can still receive Test driver signal by other side gate driving line, and then control TFT conducting and realize to picture Element charging.That is, in above process, can not detect the abnormal scene of gate driving line broken string.
Fig. 2 is the structural schematic diagram that the display panel that the embodiment of the present application one provides tests circuit.As shown in Fig. 2, the electricity Road includes:
For receiving the first connection unit 101 of Test driver signal;For receiving the second connection of test control signal Unit 102;
The first grid cabling 103 and second grid cabling 104 being connect with first connection unit 101, described first Grid cabling 103 and second grid cabling 104 are respectively used to be connected to first grid driving line 105 and second grid driving line The other end of 106 one end, the first grid driving line 105 and second grid driving line 106 is connected to display surface The control terminal of the drive control device 107 of plate;
Wherein, it is in series with controlled member 108 on the first grid cabling 103 and/or the second grid cabling 104, The control terminal of the controlled member 108 is connected to second connection unit 102, and the controlled member 108 is used to control in test On or off under the control of signal processed, the drive control device 107 under the control of the Test driver signal for leading Logical or shutdown.
Wherein, first connection unit, can be similar to Gate ODD shown in Fig. 1 for receiving Test driver signal Or Gate Even;Second connection unit is for receiving test control signal.Optionally, the second connection unit can be for can be real Existing signal received device, such as signal port, conductive contact blade etc., for example, can be by grid virtual port (Gate Dummy) as the second connection unit in driving test circuit.In practical application, in order to improve the reliability of display panel, lead to Standby port can be often set, for example, the Gate Dummy.In the present solution, can be single as second connection using standby port Member simplifies the structure of test circuit, reduces testing cost without special connection unit is arranged.
In the present embodiment, when the control terminal to controlled member applies test control signal, the controlled member is being tested It controls and is connected under the control of signal, electrical transmission can be carried out by controlled member, since the control terminal of the controlled member connects Extremely second connection unit, and controlled member is arranged in series on first grid cabling and/or second grid cabling, therefore, When controlled member conducting, Test driver signal can be passed by controlled member along first grid cabling and/or second grid cabling Transport to gate driving line.Further, if first grid cabling and/or second grid cabling are normal, driving can be transmitted to Control device, to control the conducting of drive control device.
The principle of this programme is, when control controlled member is in an off state, where grid cabling be in breaking shape State.Optionally, controlled member can be set on first grid cabling, correspondingly, being when needing to test second grid driving line When no fracture, controlled member can be controlled by the test control signal of the second connection unit and disconnected, and to the first connection unit Test driver signal is provided.Correspondingly, Test driver signal can not reach drive control if second grid drives thread breakage Device, drive control device disconnect, and pixel can not charge, and then by detection pixel voltage, can determine that second grid drives Thread breakage;, whereas if second grid driving line is normal, then Test driver signal can drive line to reach driving by second grid Control device, the conducting of drive control device, pixel charging, and then by detection pixel voltage, it can determine that second grid drives Line is normal.It is subsequent, it, can be with the other driving tests of further progress on the basis of detecting that gate driving line is normal.
Optional again, controlled member also can be set on second grid cabling, similar with the above process, accordingly can be with Detect whether first grid driving line is broken.Again optional, controlled member also can be set in first grid cabling and second On grid cabling, i.e., controlled member has multiple, as shown in Fig. 2, be separately positioned on first grid cabling and second grid cabling, It is still similar with the above process, it can detect whether first grid driving line and second grid driving line are broken respectively.Specifically, When whether detection first grid driving line is broken, need the controlled member conducting on first grid cabling, and control second Controlled member on grid cabling disconnects, and when whether detection second grid driving line is broken, needing will be on second grid cabling Controlled member conducting, and control the controlled member on first grid cabling disconnection.The embodiment of the present application realizes display panel The unilateral driving of test and the switching of bilateral driving, structure is simple, easy to operate.
In a kind of possible design, display panel includes multiple pixels of array arrangement.Optionally, display panel includes The pixel column of multiple parallel arrangements, each pixel column include multiple pixels (Pixel).
In the present embodiment, display panel can be liquid crystal display panel, and liquid crystal display panel is to determine LCD brightness, comparison Degree, color, visible angle material.Display panel includes the pixel column of multiple parallel arrangements, and each pixel column includes multiple pictures Element.It being all made of pixel due to point, line and the face on screen, the displayable pixel of display is more, and picture is finer, The information that can be shown in same screen area is also more.So resolution ratio is performance indicator important in a display panel quality One of, by the voltage of detection pixel, to judge display panel grid signal with the presence or absence of defect, convenient for test and test knot Fruit instant is checked.
In a kind of possible design, each drive control device is used to control the charging of corresponding pixel lines.It is corresponding, institute The quantity for stating drive control device is multiple, one a pair of multiple pixel columns of multiple drive control devices and the display panel It answers;
Wherein, the both ends of each drive control device are respectively connected to source electrode cabling and the drive control device is corresponding Pixel in pixel column;
The source electrode cabling is for providing charging signals, and when drive control device conducting, the source electrode cabling is mentioned The charging signals of confession charge to the pixel in the pixel column.
In the present embodiment, the quantity of the drive control device is multiple, multiple drive control devices and the display surface Multiple pixel columns of plate correspond, wherein the both ends of each drive control device are respectively connected to source electrode cabling and the drive Pixel in the corresponding pixel column of movement controller part passes through source electrode cabling input signal, driving by each drive control device Control device conducting, so as to be the pixel charging in each pixel column being correspondingly connected with drive control device.
Wherein, if the gate driving line connecting with drive control device breaks down, drive control device can not be driven Conducting.It can intuitively reflect exception bits from display panel when the driving exception of certain pixel column by present embodiment It sets, convenient for test and repairs.
Drive control device and controlled member in this programme can be controllable devices, can be according to control signal conduction Or shutdown.In a kind of possible design, the drive control device can be the first field-effect tube (OH crystal Pipe), correspondingly, the control terminal of the drive control device is the grid of first field-effect tube.
In a kind of embodiment, the drive control device is the first field-effect tube, the control of the drive control device part End processed is the grid of first field-effect tube, then the corresponding display panel tests circuit, may include: to survey for receiving Try the first connection unit of driving signal;For receiving the second connection unit of test control signal;
The first grid cabling and second grid cabling being connect with first connection unit, the first grid cabling and Second grid cabling is respectively used to be connected to one end of first grid driving line and second grid driving line, and the first grid drives The other end of moving-wire and second grid driving line is connected to the grid of the first field-effect tube of display panel;
Wherein, controlled member, the controllable member are in series on the first grid cabling and/or the second grid cabling The control terminal of part is connected to second connection unit, for the on or off under the control of test control signal, described One field-effect tube is used for the on or off under the control of the Test driver signal.
Optionally, the quantity of first field-effect tube is multiple, multiple first field-effect tube and the display panel Multiple pixel columns correspond;
Wherein, the both ends of each first field-effect tube are respectively connected to source electrode cabling and first field-effect tube is corresponding Pixel in pixel column;
The source electrode cabling is for providing charging signals, and when first field-effect tube conducting, the source electrode cabling is mentioned The charging signals of confession charge to the pixel in the pixel column.
In alternatively possible design, the controlled member can be the second field-effect tube, the control of the controlled member End processed is the grid of second field-effect tube.
In present embodiment, the controlled member is the second field-effect tube, and the control terminal of the controlled member is described the The grid of two field-effect tube, then the display panel tests circuit, may include:
For receiving the first connection unit of Test driver signal;The second connection for receiving test control signal is single Member;
The first grid cabling and second grid cabling being connect with first connection unit, the first grid cabling and Second grid cabling is respectively used to be connected to one end of first grid driving line and second grid driving line, and the first grid drives The other end of moving-wire and second grid driving line is connected to the control terminal of the drive control device of display panel;
Wherein, it is in series with the second field-effect tube on the first grid cabling and/or the second grid cabling, described The grid of two field-effect tube is connected to second connection unit, for the on or off under the control of test control signal, The drive control device is used for the on or off under the control of the Test driver signal.
Display panel provided in this embodiment tests circuit, single provided with the first connection for receiving Test driver signal Member and the second connection unit for receiving test control signal, are also provided with the first grid connecting with first connection unit Pole cabling and second grid cabling, the first grid cabling and second grid cabling are respectively used to be connected to first grid driving The other end of one end of line and second grid driving line, the first grid driving line and second grid driving line is all connected with To the control terminal of the drive control device of display panel, to control drive control device under the control of Test driver signal On or off, wherein be additionally provided with controlled member, be connected on first grid cabling and/or the second grid cabling, use In the on or off under the control in the Test driver signal.This programme increases on the grid cabling in test circuit can Element is controlled, the switching of display panel unilateral side driving and bilateral driving is realized, to promote big epoch display panel grid signal defect Detection capability.
Fig. 3 is the configuration diagram that the display panel that the embodiment of the present application two provides tests circuit.Right figure in Fig. 3 is a left side The partial structural diagram of figure.The structure chart on right side is the device of controlled member and Gate dummy in left side structure figure in Fig. 3 Structural schematic diagram.
In practical applications, Gate graphic making technique can be used in circuit structure as shown in connection with fig. 2, completes Gate Dummy cabling, for realizing the gate control lines of controlled member.In practical application, standby port can be arranged in display panel, such as The Gate dummy.It, can be using Gate dummy as the second connection unit 102, for inputting in a kind of embodiment Signal (test control signal) simplifies structure, reduces cost without connection unit is separately provided again.Further, it uses Semiconductor figure manufacture craft completes the semiconductor figure of controlled member, is used for electrical transmission;Use Source graphic making work Skill, the Source cabling for completing controlled member are connected to Gate Busline (grid cabling).The first grid cabling 103 And/or be in series on the second grid cabling 104 controlled member (in Fig. 3 semiconductor shown in right figure be controlled member, controllably The two sides of element are connected to grid cabling Gate Busline), the control terminal of the controlled member is connected to the Gate Dummy, when Gate dummy applies the test control signal for controlling controlled member conducting, controlled member conducting carries out electricity Lotus transmission, the grid cabling where controlled member are in access, signal normal transmission.It, can when Gate dummy does not apply signal Element is controlled to disconnect, where grid cabling be in open circuit, signal can only pass through the grid cabling and gate driving line of the other side It is transmitted unilateral side.
When driving test, test probe contacts Gate ODD or the Gate Even of tester table can be used, in conjunction with figure Shown in 2, wherein the connection unit of this programme includes that the first connection unit (such as Gate ODD and Gate Even) and second connect Order member (such as Gate dummy), the first connection unit is for receiving Test driver signal, and the second connection unit is for receiving Test control signal;Grid cabling is connected with first connection unit two sides, wherein (grid tests cabling to grid cabling Bus Gate Busline) it include first grid cabling 103 and second grid cabling 104, and (be equivalent to by gate driving line Dotted line position in Fig. 3) it is connect with the grid of thin film transistor (TFT) (TFT), the gate driving line includes first grid driving line 105 and second grid drive line 106.Controlled member is in series on the first grid cabling and/or the second grid cabling.
I.e. described first connection unit is connect with first grid cabling 103 and second grid cabling 104 respectively, and described first Grid cabling 103 and second grid cabling 104 are respectively used to be connected to first grid driving line 105 and second grid driving line The other end of 106 one end, the first grid driving line and second grid driving line is connected to the drive of display panel The control terminal of movement controller part (TFT), the control terminal of the controlled member 108 are connected to second connection unit 102, are used for The on or off under the control of test control signal, the drive control device (being equivalent to semiconductor) are used in the test On or off under the control of driving signal.
Fig. 4 is the structural schematic diagram that the application implements three test system for display panel provided.As shown in figure 4, a kind of Panel test system may include: display panel 201 and the panel test circuit 202 as described in above-described embodiment one.
Wherein, panel test circuit 202 is the structural schematic diagram that display panel shown in Fig. 3 tests circuit.
The embodiment that circuit is tested in the test system for display panel and panel test described in above-described embodiment one The embodiment of circuit is similar, and details are not described herein.
In the present embodiment, display panel and the panel test as described in above-described embodiment one in the panel test system Circuit tests the display panel by panel test circuit, by being provided with for receiving Test driver signal First connection unit and the second connection unit for receiving test control signal, are also provided with and first connection unit connects The first grid cabling and second grid cabling connect, the first grid cabling and second grid cabling are respectively used to be connected to One end of one gate driving line and second grid driving line, the first grid driving line and the second grid drive the another of line One end is connected to the control terminal of the drive control device of display panel, to control driving under the control of Test driver signal The on or off of control device, wherein be additionally provided with controlled member, be connected on first grid cabling and/or the second gate On the cabling of pole, for the on or off under the control in the Test driver signal.Grid of this programme in test circuit Increase controlled member on cabling, the switching of display panel unilateral side driving and bilateral driving is realized, to promote big epoch display panel Grid signal defect detection ability.
Referring to Fig. 5, Fig. 5 is the flow diagram one of display panel test method provided by the embodiments of the present application.Such as Fig. 5 institute Show, based on the above embodiment one into embodiment two display panel described in any embodiment test circuit, this method comprises:
S101, the first test control signal is provided to the second connection unit, to control first grid cabling or second grid Controlled member on cabling disconnects;
If the pixel voltage of S102, the corresponding pixel of the drive control device are abnormal, the second grid is determined Driving line or first grid driving line are broken.
In the present embodiment, the structural schematic diagram of display panel test circuit as shown in connection with fig. 3 tests display panel When, the first test control signal is provided to the second connection unit 102 first, wherein the first grid cabling and/or described the Controlled member is in series on two grid cablings, the control terminal of the controlled member is connected to second connection unit, is used for On or off under the control of test control signal, i.e., with control on first grid cabling 103 or second grid cabling 104 can It controls element 108 to disconnect, when the controlled member on first grid cabling 103 or second grid cabling 104 disconnects, then signal can only Signal transmission is carried out from unilateral side.
Wherein, first grid cabling 103 and second grid cabling 104 are connect with first connection unit 101 respectively, institute It states first grid cabling 103 and second grid cabling 104 is respectively used to be connected to first grid driving line 105 and second grid drives The other end of one end of moving-wire 105, the first grid driving line and second grid driving line is connected to display panel Drive control device control terminal, for example, when being provided with controlled member on first grid cabling, and controlled member disconnects When, signal can only be transmitted by second grid cabling.Therefore, if the pixel voltage of the corresponding pixel of the drive control device not Normally, i.e. the corresponding pixel of drive control device does not charge, then determines that the second grid driving line is broken.
In the present embodiment, by providing the first test control signal to the second connection unit, to control first grid cabling Or the controlled member on second grid cabling disconnects, if the pixel voltage of the corresponding pixel of the drive control device is abnormal, Then determine that the second grid driving line or first grid driving line are broken, can be realized the driving of display panel unilateral side With the switching of bilateral driving, to promote big epoch display panel grid signal defect detection ability.
In a kind of possible design, after first test control signal of offer to the second connection unit, further includes:
If the pixel voltage of the corresponding pixel of the drive control device is normal, the is provided to second connection unit Two test control signals, to control the controlled member conducting;
Test driver signal is provided to first connection unit, and according to the corresponding pixel of the drive control device Pixel voltage carries out driving test.
In the present embodiment, the structural schematic diagram of display panel test circuit as shown in connection with fig. 3 is mentioned to the second connection unit After the first test control signal, the controlled member on first grid cabling or second grid cabling is disconnected, if the driving The pixel voltage of the corresponding pixel of control device is normal, illustrates that grid is normal, i.e., on second grid cabling or first grid cabling It is not broken.The drive control device is used for the on or off under the control of the Test driver signal, then to described the Two connection units provide the second test control signal, are connected with controlling the controlled member 108, carry out gate driving test, then Test driver signal is provided to first connection unit 101, and according to the pixel of the corresponding pixel of the drive control device Voltage carries out driving test.By the detection to pixel voltage to judge that driving is tested as a result, being convenient for test, and test As a result it conveniently checks.
It is described to provide Test driver signal to first connection unit in a kind of possible design, and according to described The pixel voltage of the corresponding pixel of drive control device, carries out driving test, comprising:
Test driver signal is provided to first connection unit, the Test driver signal is for controlling the driving control Break-over of device processed;
If the output signal (signal with pixel connecting pin) of the drive control device (TFT) is normally, determine to drive Normally, otherwise, it is determined that driving is abnormal.
In the present embodiment, the first connection unit of Xiang Suoshu provide Test driver signal so that drive control device be connected, by It is normal in grid, therefore, if the pixel voltage of the corresponding pixel of the drive control device is normal, determine that driving is normal;It is no Then, determine that driving is abnormal.
In a kind of possible design, if the pixel voltage of the corresponding pixel of the drive control device is normal, Determine that driving is normal, otherwise, it is determined that driving is abnormal, comprising:
If pixel voltage (the letter of drive control device and pixel connecting pin of the corresponding pixel of the drive control device Number) consistent with the charging signals that the source electrode cabling provides, then determine that driving is normal, otherwise, it is determined that driving is abnormal.
In the present embodiment, if what the pixel voltage of the corresponding pixel of the drive control device and the source electrode cabling provided Charging signals are consistent, i.e., drive control device both ends do not have obvious voltage drop, illustrate that driving is normal, otherwise determine that driving is abnormal.
The dotted line frame position in Fig. 3 (Fig. 1) increases TFT device newly and (partly leads on the basis of traditional Gate cabling (Bus line) Body);TFT is controlled by applying test control signal by reserved test pad, completes the transmitting and cut-off of electric signal.This programme Increase controlled member on the grid cabling in test circuit, realizes the switching of display panel unilateral side driving and bilateral driving, with Promote big epoch display panel grid signal defect detection ability.
Finally, it should be noted that the above various embodiments is only to illustrate the technical solution of the application, rather than its limitations;To the greatest extent Pipe is described in detail the application referring to foregoing embodiments, those skilled in the art should understand that: its according to So be possible to modify the technical solutions described in the foregoing embodiments, or to some or all of the technical features into Row equivalent replacement;And these are modified or replaceed, each embodiment technology of the application that it does not separate the essence of the corresponding technical solution The range of scheme.

Claims (10)

1. a kind of display panel tests circuit characterized by comprising
For receiving the first connection unit of Test driver signal;For receiving the second connection unit of test control signal;
The first grid cabling and second grid cabling being connect with first connection unit, the first grid cabling and described Second grid cabling is respectively used to be connected to one end of first grid driving line and second grid driving line, and the first grid drives The other end of moving-wire and second grid driving line is connected to the control terminal of the drive control device of display panel;
Wherein, it is in series with controlled member on the first grid cabling and/or the second grid cabling, the controlled member Control terminal is connected to second connection unit, and the controlled member is used to be connected or close under the control of test control signal Disconnected, the drive control device is used for the on or off under the control of the Test driver signal.
2. circuit according to claim 1, which is characterized in that display panel includes the pixel column of multiple parallel arrangements, often A pixel column includes multiple pixels.
3. circuit according to claim 2, which is characterized in that the quantity of the drive control device is multiple, Duo Gesuo The multiple pixel columns for stating drive control device and the display panel correspond;
Wherein, the both ends of each drive control device are respectively connected to source electrode cabling and the drive control device is corresponding Pixel in pixel column;
The source electrode cabling is for providing charging signals, when drive control device conducting, what the source electrode cabling provided Charging signals charge to the pixel in the pixel column.
4. circuit according to any one of claim 1-3, which is characterized in that the drive control device is first effect Ying Guan, the control terminal of the drive control device are the grid of first field-effect tube.
5. circuit according to any one of claim 1-3, which is characterized in that the controlled member is the second field-effect Pipe, the control terminal of the controlled member are the grid of second field-effect tube.
6. a kind of test system for display panel characterized by comprising display panel and any one of such as claim 1-5 The panel test circuit.
7. a kind of display panel test method, which is characterized in that based on the described in any item display panel tests of claim 1-5 Circuit, which comprises
There is provided the first test control signal to the second connection unit, with control on first grid cabling or second grid cabling can Element is controlled to disconnect;
If the pixel voltage of the corresponding pixel of drive control device is abnormal, second grid driving line or described the are determined One gate driving line is broken.
8. the method according to the description of claim 7 is characterized in that described provide the first testing and control letter to the second connection unit After number, further includes:
If the pixel voltage of the corresponding pixel of the drive control device is normal, second is provided to second connection unit and is surveyed Examination control signal, to control the controlled member conducting;
Test driver signal is provided to first connection unit, and according to the pixel of the corresponding pixel of the drive control device Voltage carries out driving test.
9. according to the method described in claim 8, it is characterized in that, described provide Test driver letter to first connection unit Number, and according to the pixel voltage of the corresponding pixel of the drive control device, carry out driving test, comprising:
Test driver signal is provided to first connection unit, the Test driver signal is for controlling the drive control device Part conducting;
If the pixel voltage of the corresponding pixel of the drive control device is normal, determine that driving is normal, otherwise, it is determined that driving is different Often.
10. according to the method described in claim 9, it is characterized in that, the quantity of the drive control device is multiple, Duo Gesuo The multiple pixel columns for stating drive control device and the display panel correspond, and the both ends of the drive control device connect respectively The pixel being connected in source electrode cabling and the corresponding pixel column of the drive control device;
If the pixel voltage of the corresponding pixel of the drive control device is normal, determine that driving is normal, otherwise, it is determined that driving It is dynamic abnormal, comprising:
If the pixel voltage of the corresponding pixel of the drive control device is consistent with the charging signals that the source electrode cabling provides, Determine that driving is normal, otherwise, it is determined that driving is abnormal.
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CN100456114C (en) * 2006-01-16 2009-01-28 友达光电股份有限公司 Display device and its pixel test method
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CN102654973B (en) * 2011-08-15 2014-11-19 京东方科技集团股份有限公司 Pixel circuit and drive method thereof as well as display panel
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