CN109444077A - A kind of refractive index field quantitative measurement system and method based on phase calibration - Google Patents
A kind of refractive index field quantitative measurement system and method based on phase calibration Download PDFInfo
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- CN109444077A CN109444077A CN201811458340.3A CN201811458340A CN109444077A CN 109444077 A CN109444077 A CN 109444077A CN 201811458340 A CN201811458340 A CN 201811458340A CN 109444077 A CN109444077 A CN 109444077A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/4133—Refractometers, e.g. differential
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
Abstract
The present invention relates to a kind of refractive index field quantitative measurement system and method based on phase calibration, the system includes light source and the condenser lens set gradually at light source rear, aperture, collimation lens, search coverage, imaging len, the edge of a knife and detector, in calibration, normalized phase controlling element is changed to field to be measured in measurement and is placed in search coverage by search coverage for placing normalized phase controlling element；It further include the control unit for controlling detector and normalized phase controlling element；The refractive index gradient of varying strength is generated in different location in mark timing control unit control normalized phase controlling element, and controls detector record, to obtain the response relation that the system generates different location, different size of deflection angle on the detector；In measurement, control detector detects field to be measured, and the index distribution of field to be measured is obtained according to the response relation.The present invention can reduce measurement error, realize accurate, the quantitative measurement in refractive index field.
Description
Technical field
The present invention relates to the schlieren optics technical field of imaging of detection fluid refractive index field distribution, more particularly, to one
Refractive index field quantitative measurement system and method for the kind based on phase calibration.
Background technique
Stration technique is proposed and is used by roentgen August Toepler earliest, by constantly improving and sending out
Exhibition has developed a variety of schlieren imaging technologies such as black and white schlieren, colour schlieren, interference schlieren.Stration technique can be used for observing
The index distribution of field to be measured, and by the pass between other properties such as fluid refractive index and density, pressure, temperature, chemical component
System, obtains the distribution field information of respective physical amount, has in acoustic investigation, wind tunnel experiment, combustion experiment and ballistics research
It is widely used.
In above-mentioned various stration techniques, all can due to system there are aberration, light source there are heterogeneity and optical path by
To reasons such as disturbances, making imaging, there is a certain error, and then causes to calculate resulting refractive index generation error.Occur
Error, which is mainly included two aspects that, responds difference caused by the identical variations in refractive index occurred in field different location to be measured；To
The variations in refractive index for surveying the varying strength that the fixed position in field occurs, due to system " overload ", optical element bore are limited etc.,
Linear relationship in the response deviation theory of generation.In short, since many factors influence, schlieren imaging system pair under actual conditions
It is not theoretic linear spatially invariant system in refractive index gradient, different location is different to the response of identical refractive index gradient,
And linear relationship can be deviateed the response of same position refractive index gradient.
It solves the problems, such as above-mentioned image error, needs to demarcate system using standard component, obtain different foldings
Penetrate rate variation and system respond in the picture between actual corresponding relationship, and then improve detect accuracy.
Interferometry is more stringent measurement method, is usually used in needing in the schlieren system of quantitative analysis, but interferometry needs
To use laser as light source, common incoherent light is not available.Colour schlieren shows refractive index gradient using different colours,
It needs using white light source, it is desirable that light source light spectrum is wider.Above two method all has strict requirements to light source, and for black and white
Schlieren is rarely used in quantitative point to the less-restrictive of light source, but since contrast is insufficient and path error is affected to result
In analysis.
Summary of the invention
It is quantitative that it is an object of the invention to overcome the deficiencies of the prior art and provide a kind of refractive index fields based on phase calibration
Measuring system can reduce measurement error, realize accurate, the quantitative measurement in refractive index field.
In order to achieve the above objectives, the technical solution adopted by the present invention is that:
A kind of refractive index field quantitative measurement system based on phase calibration is provided, including light source and is successively set at light source rear
Condenser lens, aperture, collimation lens, search coverage, imaging len, the edge of a knife and the detector set, the detecting area in calibration
Normalized phase controlling element is changed to field to be measured in measurement and is placed in detecting area by domain for placing normalized phase controlling element
Domain；The light line focus lens that light source issues converge at aperture, then collimated lens become directional light, most afterwards through detecting area
It is imaged on detector test surface after the edge of a knife is cut behind domain by the light that imaging len is emitted；Further include for control detector and
The control unit of normalized phase controlling element；It is generated in mark timing control unit control normalized phase controlling element in different location
The refractive index gradient of varying strength, and detector record is controlled, to obtain the system to different location, different size of deflection angle
The response relation generated on the detector；In measurement, control detector detects field to be measured, and according to the response relation to obtain
Take the index distribution of field to be measured.
In above scheme, measuring system is demarcated using normalized phase controlling element, normalized phase controlling element will
Plane where it generates known phase distribution, makes light that known deviation occur, is recorded with detector, to obtain the system
It, then will in measurement to the response relation i.e. calibration result that different location, different size of deflection angle generate on the detector
Normalized phase controlling element is changed to field to be measured and is placed in search coverage and is recorded with detector, can cope with previous schlieren imaging system
Unite different to the response intensity of different location as caused by many reasons and deflection angle and nonlinearity the problem of, reduction
Measurement error realizes accurate, the quantitative measurement in refractive index field.
Preferably, control unit is computer, and in measurement, according to calibration result, control unit controls detector and carries out
Single measurement or continuous measurement.
Preferably, the light source is laser light source or incoherent light.
It is further preferred that the light source is single mode Frequency Stabilized Lasers, white light or quasi-monochromatic light.It is higher to sensitivity requirement
Situation preferentially selects laser, must use white light for colour schlieren system.
Preferably, the aperture includes the aperture member for adjusting diaphragm size.Aperture member can be manually or electric
It is dynamic to adjust, it is arranged in this way so that can according to the actual situation, change the light passing size of aperture, and easy to operate.
Preferably, normalized phase controlling element is changeless for the spatial light modulator or phase distribution of energy phase-modulation
Standard component.Spatial light modulator can improve calibration speed, simplify demarcation flow, the changeless standard component energy of phase distribution
Improve the accuracy of phase calibration.
Preferably, the edge of a knife can be placed according to different directions, can be horizontal, vertical or by certain angle slant setting；From
When the light of imaging len outgoing is colored, the edge of a knife is optical filter；Can also be used instead according to schlieren imaging method difference used aperture or
Slit diaphragm replaces.
Preferably, detector is the array optical electric explorer for detecting intensity of illumination.Detector can be used CCD or
CMOS camera.
It is a further object of the invention to provide a kind of the refractive index field method for quantitative measuring based on phase calibration, use
Above-mentioned quantitative measurement system, includes the following steps:
S1. light source is opened, optical path is adjusted, knife-edge positions is adjusted, the quantitative measurement system is made to meet schlieren imaging optical path
Requirement；
S2. the position of search coverage in optical path, the i.e. corresponding object plane in detector image-forming face are determined, normalized phase regulation is placed
Element；
S3. control unit control normalized phase controlling element generates the refractive index gradient of varying strength in different location, and
Detector detection record is controlled, to obtain the quantitative measurement system for calibration to different location, varying strength refractive index gradient
Response results；
S4. it according to the relationship between phase gradient and deflection of light angle, obtains and passes through normalized phase tune in calibration process
Control deviation angular distribution of the light in different location of element；Phase gradient is refractive index gradient；
S5. step S3 and S4 are combined, the quantitative measurement system is obtained and different location, different size of deflection angle is being visited
Survey the response results generated on device；Calibration process terminates；
S6. it keeps optical path constant, normalized phase controlling element is changed to field to be measured and is placed in search coverage, control unit control
Detector processed carries out detection record；
S7. it is recorded according to detector as a result, the quantitative measurement system obtained in conjunction with step S5 is to different location, different size
The response results that generate on the detector of deflection angle, obtain the emergent ray deflection angle size of field different location to be measured；
S8. according to the relationship of refractive index gradient and emergent ray deflection angle, the index distribution of field to be measured is obtained.
Preferably for the measuring system that knife-edge positions can quantitatively change, different knives can also be demarcated during the calibration process
Response of the corresponding measuring system in mouthful position to the refractive index gradient of different location, varying strength, schlieren imaging optical path other
Measurement process can be only using the data once demarcated without all being marked using preceding every time in the case that parameter does not change
It is fixed, identical knife-edge positions corresponding nominal data is also selected when need to only measure, only when optical path be can not ignore
Disturbance after re-scale again.
Preferably, in step S3, control unit controls phase controlling element and generates regular phase distribution field, a highest wisdom
Using the edge of a knife, then phase gradient is generated on perpendicular to edge of a knife direction, and constantly change the spatial position of the gradient distribution, quite
It is scanned in space, changes gradient magnitude after one wheel of scanning, scan again, and so on until reaching pre-set threshold
Value, just obtains the measuring system in different location, the response to different phase gradients in this way.But be not only limited in this way,
The measuring system can be obtained by detector detection result and phase distribution to respond in different location, varying strength phase gradient
Method can reach calibration purpose.
Preferably, in step S4, the relationship between phase gradient and deflection of light angle uses formula (1)；
Wherein, λ0For the wavelength of light in a vacuum,For perpendicular to the phase gradient on the edge of a knife (7) direction, θ is light
Deflection angle.
Preferably, in step S8, the relationship of refractive index gradient and emergent ray deflection angle uses formula (2)；
Wherein, x is refractive index,It is refractive index along the gradient perpendicular to edge of a knife direction, z is the direction of light propagation.
Formula (2) can turn to integral relation (3):
Wherein, x is refractive index,It is refractive index along the gradient perpendicular to edge of a knife direction, z is the direction of light propagation, works as institute
When surveying the lesser value that region is fixed in the z-direction with a thickness of one and index distribution almost unchanged in the z-direction, integralization can be closed
It is that formula (3) is reduced to multiplication formula (4):
Wherein Δ z is the thickness of search coverage.
Compared with prior art, the beneficial effects of the present invention are:
A kind of refractive index field quantitative measurement system and method based on phase calibration of the present invention regulates and controls member using normalized phase
Part demarcates measuring system, and plane where it is generated known phase distribution by normalized phase controlling element, makes light
Known deviation occurs, is recorded with detector, to obtain the system to different location, different size of deflection angle on the detector
Normalized phase controlling element is then changed to field to be measured in measurement and is placed in detecting area by response relation, that is, calibration result of generation
Domain is simultaneously recorded with detector, and it is strong to the response of different location as caused by many reasons can to cope with previous schlieren imaging system
The problem of degree difference and deflection angle and nonlinearity, reduce measurement error, realizes accurate, the quantitative survey in refractive index field
Amount.
Detailed description of the invention
Fig. 1 is a kind of schematic diagram of the refractive index field quantitative measurement system based on phase calibration of the present embodiment；
Appended drawing reference: 1 light source；2 condenser lenses；3 apertures；4 collimation lenses；5 search coverages；6 imaging lens；7 knives
Mouthful；8 detectors；9 control units.
Specific embodiment
The present invention is further illustrated With reference to embodiment.Wherein, attached drawing only for illustration,
What is indicated is only schematic diagram, rather than pictorial diagram, should not be understood as the limitation to this patent；Reality in order to better illustrate the present invention
Example is applied, the certain components of attached drawing have omission, zoom in or out, and do not represent the size of actual product；To those skilled in the art
For, the omitting of some known structures and their instructions in the attached drawings are understandable.
The same or similar label correspond to the same or similar components in the attached drawing of the embodiment of the present invention；It is retouched in of the invention
In stating, it is to be understood that if the orientation or positional relationship for having the instructions such as term " on ", "lower", "left", "right" is based on attached drawing
Shown in orientation or positional relationship, be merely for convenience of description of the present invention and simplification of the description, rather than indication or suggestion is signified
Device or element must have a particular orientation, be constructed and operated in a specific orientation, therefore positional relationship is described in attached drawing
Term only for illustration, should not be understood as the limitation to this patent, for the ordinary skill in the art, can
To understand the concrete meaning of above-mentioned term as the case may be.
Embodiment
The present embodiment provides a kind of refractive index field quantitative measurement system based on phase calibration, as shown in Figure 1, including light source
1 and the condenser lens 2, aperture 3, collimation lens 4, search coverage 5, the imaging len 6, knife that are set gradually at 1 rear of light source
Mouth 7 and detector 8, in calibration, search coverage 5 regulates and controls normalized phase in measurement for placing normalized phase controlling element
Element is changed to field to be measured and is placed in search coverage 5；The light line focus lens 2 that light source 1 issues converge at aperture 3, then pass through
Collimation lens 4 becomes directional light, and the light being most emitted after search coverage 5 by imaging len 6 afterwards is after the cutting of the edge of a knife 7 in detector
It is imaged on 8 test surfaces；It further include the control unit 9 for controlling detector 8 and normalized phase controlling element；In mark timing controlled
Unit 9 controls normalized phase controlling element and generates the refractive index gradient of varying strength in different location, and controls the note of detector 8
Record, to obtain the response relation that the system generates different location, different size of deflection angle on the detector 8；In measurement
Control detector 8 detects field to be measured, and the index distribution of field to be measured is obtained according to the response relation.
The present invention demarcates measuring system using normalized phase controlling element, and normalized phase controlling element will be in its institute
Known phase distribution is generated in plane, makes light that known deviation occur, is recorded with detector 8, to obtain the system to not
The response relation i.e. calibration result that same position, different size of deflection angle generate on the detector 8, then in measurement by standard
Phase controlling element is changed to field to be measured and is placed in search coverage 5 and is recorded with detector 8, can cope with previous schlieren imaging system
The problem of and deflection angle different to the response intensity of different location as caused by many reasons and nonlinearity, reduces and survey
Error is measured, realizes accurate, the quantitative measurement in refractive index field.
Wherein, aperture 3 and the edge of a knife 7 conjugate planes each other, normalized phase controlling element 5 and 8 test surface of detector are each other
Conjugate planes.
In addition, LED light source can be used in the light source 1, it is quasi-monochromatic light；Control unit 9 is computer 9, in measurement, root
According to calibration result, control unit 9 controls detector 8 and carries out single measurement or continuous measurement.
Certainly, to the higher situation of sensitivity requirement, laser light source is can be used in light source 1；For colour schlieren system, light source
1 must use white light.
Wherein, the light that light source 1 issues is focused by the condenser lens 2, and the aperture 3 is placed on focal point, is enabled
The aperture of aperture 3 is sufficiently small, its approximation can be considered as point light source；The focus of the collimation lens 4 is similarly positioned in aperture light
At the aperture of door screen 3, the light that approximate point light source issues is become into directional light, directional light will pass through normalized phase controlling element 5 later.
In addition, the aperture 3 includes the aperture member for adjusting diaphragm size.Aperture member can be manually or electrically
It adjusts, setting is so that can change the light passing size of aperture 3, and easy to operate according to the actual situation in this way.
Wherein, the normalized phase controlling element 5 uses the LCD space light modulator with phase-only modulation function,
Pixel size and number of pixels need to guarantee that the light pass surface of spatial light modulator can be taken in detector shooting area, and clap
Taking the photograph the corresponding actual area in region should be suitable with liquid crystal cell total size, is slightly less than the liquid crystal cell gross area but can not be too small.Shoot area
Domain center should approach as far as possible with liquid crystal cell center.Spatial light modulator 5 is connected with computer 9, and computer 9 can control spatial light tune
Modulate intensity of each pixel of device 5 processed to phase.Spatial light modulator 5 can improve calibration speed, simplify demarcation flow.
Certainly, the changeless standard component of phase distribution can also be used in normalized phase controlling element 5, this can improve phase
The accuracy of calibration.
In addition, the edge of a knife 7 is horizontal positioned metal blade, it is placed on the focal point of imaging len 6, while being also small
The conjugate planes for the point light source that hole diaphragm 3 generates.Directional light is after spatial light modulator 5 through the meeting at the edge of a knife 7 of imaging len 6
It is poly-, and by the picture of spatial light modulator 5 at detector 8.
When the light being emitted from imaging len 6 is colored, the edge of a knife 7 is optical filter；It can also be according to schlieren imaging method used
Difference uses aperture instead or slit diaphragm replaces.
Wherein, the detector 8 is CCD camera, and positioned at the conjugate planes of spatial light modulator 5, the magnifying power of imaging should expire
The requirement of foot above-mentioned " CCD photo visual field is slightly less than 5 liquid crystal cell region of spatial light modulator and the two center is close ".CCD camera
It is connected with computer 9.
Process control spatial light modulator 5 and CCD camera 8 can be used in the computer 9, makes the two linkage work, every time
It enables CCD camera 8 take pictures after changing the phase modulation distribution of spatial light modulator 5, saves simultaneously analysis picture.
The present embodiment also provides a kind of refractive index field method for quantitative measuring based on phase calibration, uses above-mentioned quantitative measurment
System includes the following steps:
S1. light source 1 is opened, optical path is adjusted, 7 position of the edge of a knife is adjusted, the quantitative measurement system is made to meet schlieren imaging light
The requirement on road；
S2. the position of search coverage 5 in optical path, the i.e. corresponding object plane of 8 imaging surface of detector are determined, normalized phase tune is placed
Control element；
S3. control unit 9 controls the refractive index gradient that normalized phase controlling element generates varying strength in different location, and
The detection record of detector 8 is controlled, to obtain the quantitative measurement system for calibration to different location, varying strength refractive index gradient
Response results；
S4. it according to the relationship between phase gradient and deflection of light angle, obtains and passes through normalized phase tune in calibration process
Control deviation angular distribution of the light in different location of element；Phase gradient is refractive index gradient；
S5. step S3 and S4 are combined, the quantitative measurement system is obtained and different location, different size of deflection angle is being visited
Survey the response results generated on device 8；Calibration process terminates；
S6. it keeps optical path constant, normalized phase controlling element is changed to field to be measured and is placed in search coverage 5, control unit 9
Control detector 8 carries out detection record；
S7. it is recorded according to detector 8 as a result, the quantitative measurement system obtained in conjunction with step S5 is to different location, different big
The response results that small deflection angle generates on the detector 8 obtain the emergent ray deflection angle size of field different location to be measured；
S8. according to the relationship of refractive index gradient and emergent ray deflection angle, the index distribution of field to be measured is obtained.
Wherein, the measuring system that can quantitatively change for knife-edge positions, can also demarcate the different edges of a knife during the calibration process
Response of the corresponding measuring system in position to the refractive index gradient of different location, varying strength, in other ginsengs of schlieren imaging optical path
Number do not change in the case where measurement process can only using the data once demarcated without all being demarcated using preceding every time,
Identical knife-edge positions corresponding nominal data is only also selected when need to measure, only when what optical path be can not ignore disturbs
It is re-scaled again after dynamic.
In addition, control unit 9 controls phase controlling element 5 and generates regular phase distribution field, a highest wisdom in step S3
Using the edge of a knife 7, then phase gradient is generated on perpendicular to 7 direction of the edge of a knife, and constantly change the spatial position of the gradient distribution, phase
It is scanned when in space, changes gradient magnitude after one wheel of scanning, scan again, and so on until reaching pre-set
Threshold value just obtains the measuring system in different location, the response to different phase gradients in this way.But be not only limited in as
This, the measuring system can be obtained by 8 detection result of detector and phase distribution and is rung in different location, varying strength phase gradient
The method answered can reach calibration purpose.
Wherein, in step S4, the relationship between phase gradient and deflection of light angle uses formula (1)；
Wherein, λ0For the wavelength of light in a vacuum,For perpendicular to the phase gradient on the edge of a knife (7) direction, θ is light
Deflection angle.
In addition, the relationship of refractive index gradient and emergent ray deflection angle uses formula (2) in step S8；
Wherein, x is refractive index,It is refractive index along the gradient perpendicular to edge of a knife direction, z is the direction of light propagation.
Formula (2) can turn to integral relation (3):
Wherein, x is refractive index,It is refractive index along the gradient perpendicular to edge of a knife direction, z is the direction of light propagation, works as institute
When surveying the lesser value that region is fixed in the z-direction with a thickness of one and index distribution almost unchanged in the z-direction, integralization can be closed
It is that formula (3) is reduced to multiplication formula (4):
Wherein Δ z is the thickness of search coverage.
Obviously, the above embodiment of the present invention be only to clearly illustrate example of the present invention, and not be pair
The restriction of embodiments of the present invention.For those of ordinary skill in the art, may be used also on the basis of the above description
To make other variations or changes in different ways.There is no necessity and possibility to exhaust all the enbodiments.It is all this
Made any modifications, equivalent replacements, and improvements etc., should be included in the claims in the present invention within the spirit and principle of invention
Protection scope within.
Claims (10)
1. a kind of refractive index field quantitative measurement system based on phase calibration, which is characterized in that including light source (1) and in light source
(1) rear is set gradually condenser lens (2), aperture (3), collimation lens (4), search coverage (5), imaging len (6),
The edge of a knife (7) and detector (8), in calibration, search coverage (5) is for placing normalized phase controlling element, in measurement by standard
Phase controlling element is changed to field to be measured and is placed in search coverage (5)；The light line focus lens (2) that light source (1) issues converge at small
At hole diaphragm (3), then collimated lens (4) become directional light, most afterwards after search coverage (5) by imaging len (6) outgoing
Light is imaged on detector (8) test surface after the edge of a knife (7) are cut；It further include for controlling detector (8) and normalized phase tune
Control the control unit (9) of element；Difference is generated in different location in mark timing control unit (9) control normalized phase controlling element
The refractive index gradient of intensity, and detector (8) record is controlled, to obtain the system to different location, different size of deflection angle
The response relation generated on detector (8)；In measurement, control detector (8) detects field to be measured, and is closed according to the response
It is the index distribution to obtain field to be measured.
2. a kind of refractive index field quantitative measurement system based on phase calibration according to claim 1, which is characterized in that institute
Stating light source (1) is laser light source or incoherent light.
3. a kind of refractive index field quantitative measurement system based on phase calibration according to claim 2, which is characterized in that institute
Stating light source (1) is single mode Frequency Stabilized Lasers, white light or quasi-monochromatic light.
4. a kind of refractive index field quantitative measurement system based on phase calibration according to claim 1, which is characterized in that institute
Stating aperture (3) includes the aperture member for adjusting diaphragm size.
5. a kind of refractive index field quantitative measurement system based on phase calibration according to claim 1, which is characterized in that mark
Quasi- phase controlling element is the spatial light modulator or the changeless standard component of phase distribution of energy phase-modulation.
6. a kind of refractive index field quantitative measurement system based on phase calibration according to claim 1, which is characterized in that from
When the light of imaging len (6) outgoing is colored, the edge of a knife (7) is optical filter.
7. a kind of refractive index field quantitative measurement system based on phase calibration according to claim 1, which is characterized in that visit
Surveying device (8) is the array optical electric explorer for detecting intensity of illumination.
8. a kind of refractive index field method for quantitative measuring based on phase calibration, which is characterized in that use any one of claim 1-6
The quantitative measurement system, includes the following steps:
S1. light source (1) is opened, adjusts optical path, adjusted the edge of a knife (7) position, the quantitative measurement system is made to meet schlieren imaging light
The requirement on road；
S2. the position of search coverage (5) in optical path, the i.e. corresponding object plane of detector (8) imaging surface are determined, normalized phase tune is placed
Control element；
S3. control unit (9) control normalized phase controlling element generates the refractive index gradient of varying strength in different location, and controls
Detector (8) detection record processed, to obtain the quantitative measurement system for calibration to different location, varying strength refractive index gradient
Response results；
S4. it according to the relationship between phase gradient and deflection of light angle, obtains in calibration process by normalized phase regulation member
Deviation angular distribution of the light of part in different location；Phase gradient is refractive index gradient；
S5. step S3 and S4 are combined, obtains the quantitative measurement system to different location, different size of deflection angle in detector
(8) response results generated on；Calibration process terminates；
S6. it keeps optical path constant, normalized phase controlling element is changed to field to be measured and is placed in search coverage (5), control unit (9)
Control detector (8) carries out detection record；
S7. it is recorded according to detector (8) as a result, the quantitative measurement system obtained in conjunction with step S5 is to different location, different size
The response results that are generated on detector (8) of deflection angle, obtain the emergent ray deflection angle size of field different location to be measured；
S8. according to the relationship of refractive index gradient and emergent ray deflection angle, the index distribution of field to be measured is obtained.
9. a kind of refractive index field method for quantitative measuring based on phase calibration according to claim 8, which is characterized in that step
In rapid S4, the relationship between phase gradient and deflection of light angle uses formula (1)；
Wherein, λ0For the wavelength of light in a vacuum,For perpendicular to the phase gradient on the edge of a knife (7) direction, θ is deflection of light
Angle.
10. a kind of refractive index field method for quantitative measuring based on phase calibration according to claim 8, which is characterized in that
In step S8, the relationship of refractive index gradient and emergent ray deflection angle uses formula (2)；
Wherein, x is refractive index,It is refractive index along the gradient perpendicular to edge of a knife direction, z is the direction of light propagation.
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| CN111693250A (en) * | 2020-06-11 | 2020-09-22 | 四川欧瑞特光电科技有限公司 | System and method for measuring striae of extremely-low-density flow field based on programmable spatial light modulator |
| CN113203705A (en) * | 2021-04-06 | 2021-08-03 | 西安工业大学 | Double refraction type schlieren system and method capable of realizing quick adjustment and test of light path |
| CN113252295A (en) * | 2021-06-17 | 2021-08-13 | 西南科技大学 | Flow field measuring instrument and flow field measuring method based on rectangular pyramid sensor |
| CN114199721A (en) * | 2022-02-17 | 2022-03-18 | 北京航空航天大学 | Schlieren optical system and two-dimensional density distribution measuring method of flow field to be measured |
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