CN105716720B - Infrared Image Non-uniformity Correction method and device - Google Patents
Infrared Image Non-uniformity Correction method and device Download PDFInfo
- Publication number
- CN105716720B CN105716720B CN201610076610.9A CN201610076610A CN105716720B CN 105716720 B CN105716720 B CN 105716720B CN 201610076610 A CN201610076610 A CN 201610076610A CN 105716720 B CN105716720 B CN 105716720B
- Authority
- CN
- China
- Prior art keywords
- relation curve
- imaging system
- heavy caliber
- processor
- heat source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012937 correction Methods 0.000 title claims abstract description 39
- 238000000034 method Methods 0.000 title claims abstract description 26
- 230000005855 radiation Effects 0.000 claims abstract description 79
- 230000004044 response Effects 0.000 claims abstract description 76
- 238000003331 infrared imaging Methods 0.000 claims abstract description 71
- 238000003384 imaging method Methods 0.000 claims abstract description 23
- 238000001228 spectrum Methods 0.000 claims description 43
- 230000003595 spectral effect Effects 0.000 claims description 20
- 238000013507 mapping Methods 0.000 claims description 18
- 238000005259 measurement Methods 0.000 claims description 9
- 230000001360 synchronised effect Effects 0.000 claims description 6
- 230000000149 penetrating effect Effects 0.000 claims description 3
- 238000012545 processing Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 6
- 230000008859 change Effects 0.000 description 4
- 230000005457 Black-body radiation Effects 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 238000011088 calibration curve Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000008439 repair process Effects 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 230000004043 responsiveness Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/80—Calibration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J2005/0077—Imaging
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
The present invention provides a kind of Infrared Image Non-uniformity Correction method and devices, improve the problem of nonuniformity correction mode in the prior art cannot adapt to instrument nonlinear response very well.The device is applied to heavy caliber infrared imaging system, and heavy caliber infrared imaging system includes lens barrel and detector, and device includes bracket, reflecting mirror, heat source, diaphragm and processor；The radiant light of heat source enters in lens barrel through diaphragm directive reflecting mirror and after reflecting mirror reflects, and detector is used to detect the radiant light entered in lens barrel；Processor is used to obtain the yi-S relation curve between diaphragm clear field S and each pixel response data yi of imaging, and the yi-H relation curve of radiation intensity H corresponding with yi-S relation curve and clear field S, and is corrected to yi-H relation curve.The correction to instrument nonlinear response may be implemented in the Infrared Image Non-uniformity Correction method and device, easy to implement, application easy to spread.
Description
Technical field
The present invention relates to alignment technique fields, in particular to a kind of Infrared Image Non-uniformity Correction method and dress
It sets.
Background technique
It is single that due to the operational characteristic and thermal characteristics of infrared camera and optical system, in infrared imaging system, there are each detections
The responsiveness of member is inconsistent, causes the irregular shading for occurring fixed in infrared image, i.e. heterogeneity, influences image quality.
Therefore infrared Nonuniformity Correction processing must be carried out.In outfield, Infrared Image Non-uniformity Correction is usually using based on linear
Respond a bit assumed, peg method.The principle of correction be the response straight slope and intercept of each pixel are adapted to it is same
A value keeps each pixel response consistent, reaches nonuniformity correction purpose.But the premise of correction is that the response of detector pixel is linear
's.Infrared imaging system is usually poor in the low side of response curve and the high-end linearity, when shooting using sky as the target of background,
Sky is very low with respect to infrared band brightness, the low side in response curve.Instrument nonlinear response cannot be adapted to very well.
Summary of the invention
In view of this, the embodiment of the present invention is designed to provide a kind of Infrared Image Non-uniformity Correction method and dress
It sets, to improve the problem of cannot adapting to very well instrument nonlinear response in a manner of nonuniformity correction in the prior art.
To achieve the goals above, technical solution used in the embodiment of the present invention is as follows:
The embodiment of the invention provides a kind of Infrared Image Non-uniformity Correction devices, are applied to heavy caliber infrared imaging system
System, the heavy caliber infrared imaging system includes lens barrel and detector, and described device includes bracket, reflecting mirror, heat source, light
Door screen and processor；
Described bracket one end is installed on the lens barrel, the other end is connected with the reflecting mirror, and the heat source is set to
With the detector adjacent position；
The diaphragm is set between the heat source and the reflecting mirror, and the radiant light of the heat source is through the diaphragm directive institute
It states reflecting mirror and enters in the lens barrel after reflecting mirror reflection, the detector is used for the entrance camera lens mirror
Radiant light in cylinder is detected；
The processor is used for according to the heat source temperature, diaphragm clear field, the heavy caliber infrared imaging system institute
Standard spectrum radiation data under the conditions of place obtains the imaging of the diaphragm clear field S Yu the heavy caliber infrared imaging system
Yi-S relation curve between each pixel response data yi, and radiation intensity H corresponding with the yi-S relation curve and logical
The yi-H relation curve of light area S, by the unified amendment y' of low side point response of all pixels in the yi-H relation curvej, will
The unified amendment y' of high endpoint response of all pixels in the yi-H relation curvek, obtain response data y'nWith the equivalent spoke
The linear straight line L of intensity H is penetrated, according to the y' on the straight line LnWith the y on the yi-S relation curvenBetween reflect
The relationship of penetrating obtains y'nTo ynMapping table, according to the mapping table by each ynIt is mapped as y'n。
Further, the reflecting mirror is flexibly connected with the bracket, and the reflecting mirror can be adjusted the angle along the bracket.
Preferably, the reflecting mirror and the bracket detachable connection or the bracket and the lens barrel are detachable
Formula connection.
Preferably, the heat source is high temperature blackbody.
Preferably, the reflecting mirror is small-bore plane total reflection mirror or small-bore curved face total reflection mirror.
On the basis of the above, the embodiment of the invention also provides a kind of Infrared Image Non-uniformity Correction method, it is applied to
Infrared Image Non-uniformity Correction device, described device are applied to heavy caliber infrared imaging system, the heavy caliber infrared imaging
System includes lens barrel and detector, and described device includes bracket, reflecting mirror, heat source, diaphragm and processor；The bracket one
End be installed on the lens barrel, the other end is connected with the reflecting mirror, the heat source set on the heavy caliber it is infrared at
As system adjacent position；The diaphragm is set between the heat source and the reflecting mirror, described in the radiant light warp of the heat source
Reflecting mirror described in diaphragm directive simultaneously enters in the lens barrel after reflecting mirror reflection, which comprises
The detector is recorded in the heat source temperature when being T1, the corresponding heavy caliber of different clear field S
Each pixel response data yi of the imaging of infrared imaging system (i=1,2...N, N are detector pixel number), obtains in the heat source
When temperature is T1 between the diaphragm clear field S and each pixel response data yi of imaging of the heavy caliber infrared imaging system
Synchronized relation；
The processor is rung according to each pixel of imaging of the diaphragm clear field S and the heavy caliber infrared imaging system
The synchronized relation between data yi is answered, the diaphragm clear field S is drawn and the imaging of the heavy caliber infrared imaging system is each
Yi-S relation curve between pixel response data yi；
The processor according to locating for the heavy caliber infrared imaging system under the conditions of standard spectrum radiation data obtain
The yi-H relation curve of radiation intensity H and clear field S corresponding with the yi-S relation curve；
The low side point response unification of all pixels in the yi-H relation curve is corrected y' by the processorj, will be described
The unified amendment y' of high endpoint response of all pixels in yi-H relation curvek, obtain response data y'nIt is strong with the equivalent radiated power
Spend the linear straight line L of H；
The processor is according to the y' on the straight line LnWith the y on the yi-S relation curvenBetween mapping relations obtain
To y'nTo ynMapping table；
The processor is according to the mapping table by each ynIt is mapped as y'n。
Further, the reflecting mirror and the bracket detachable connection or the bracket and the lens barrel are removable
Unload formula connection, the processor according to locating for the heavy caliber infrared imaging system under the conditions of standard spectrum radiation data obtain
The step of yi-H relation curve of radiation intensity H and clear field S corresponding with the yi-S relation curve includes:
When the processor records the heavy caliber infrared imaging system direction first area, the heavy caliber infrared imaging
The orientation angle a and measurement data y of system、；
The processor obtain spectral radiometer at orientation angle a with the heavy caliber infrared imaging system synchro measure
The spectral measurement ranges of the resulting standard spectrum radiation data h1 in first area, the spectral radiometer are greater than the big mouth
The spectral response range of diameter infrared imaging system；
The processor marks the standard spectrum radiation data h1 on the yi-S relation curve.
Further, the standard spectrum under the conditions of the processor is according to locating for the heavy caliber infrared imaging system
Radiation data obtains the step of yi-H relation curve of radiation intensity H corresponding with the yi-S relation curve and clear field S
Further include:
The processor obtain spectral radiometer at orientation angle a with the heavy caliber infrared imaging system synchro measure
The resulting standard spectrum radiation data h2 of second area；
The processor marks the standard spectrum radiation data h2 on the yi-S relation curve, wherein described second
Region is the day another region different from first area in the air.
Preferably, the processor is the step of marking the standard spectrum radiation data h1 on the yi-S relation curve
Include:
The processor is according to the standard spectrum radiation data h1 of acquisition and the heavy caliber infrared imaging system
Spectral response range obtains the equivalent radiated power intensity H1 of the standard spectrum radiation data h1；
The processor marks H1 numerical value on the horizontal axis that the yi-S relation curve corresponds to yi value；
The processor includes: the step of marking the standard spectrum radiation data h2 on the yi-S relation curve
The processor is according to the standard spectrum radiation data h2 of acquisition and the heavy caliber infrared imaging system
Spectral response range obtains the equivalent radiated power intensity H2 of the standard spectrum radiation data h2；
The processor marks H2 numerical value on the horizontal axis that the yi-S relation curve corresponds to yi value；
It is strong to obtain radiation according to the equivalent radiated power intensity H1 and the equivalent radiated power intensity H2 of mark for the processor
The corresponding relationship for spending H and clear field S, is rewritten into radiation intensity unit H for the abscissa of the yi-S relation curve, obtains
Yi-H relation curve.
Preferably, when it is T1 that the detector, which is recorded in the heat source temperature, the corresponding institute of different clear field S
Before each pixel response data yi of imaging for stating heavy caliber infrared imaging system, the method also includes the heavy caliber is red
Outer imaging system points into the sky, and adjusts the operating angle of the reflecting mirror and the heat source, in heavy caliber infrared imaging system
The fixed reflecting mirror and the heat source when system aims at the heat source.
Infrared Image Non-uniformity Correction method and device provided in the embodiment of the present invention, dexterously in heat source and instead
It penetrates and diaphragm is set between mirror, obtain different clear field S and heavy caliber infrared imaging system by adjusting diaphragm clear field S
The yi-S relation curve between each pixel response data yi is imaged, it is verified, according to system photographs frequency and diaphragm pace of change,
Can reach the sampling densities of the thousands of points of response curve within one minute, response curve precision is very high, Nonuniformity Correction effect compared with
It is good, high temperature blackbody radiation is particularly introduced using small-bore optical total-reflection mirror, sky background is superimposed on, is changed using light-dimming method
Blackening body is incident on the energy in heavy caliber infrared imaging system, to draw out the response song close to sky background radiation intensity
Line, low side Photo-Response Non-Uniformity calibration result are good.
Further, Infrared Image Non-uniformity Correction method and device provided in the embodiment of the present invention can incite somebody to action
The sky background radiation source minimum as infrared intensity when fine, using the low background radiation of zenith, by instrumental optics camera lens
It is directed toward zenith, high temperature blackbody radiation is introduced using small-bore optical total-reflection mirror, sky background is superimposed on, is demarcated using light adjusting type
Method (application number 201410528350.5) changes black matrix and is incident on the amount of radiation in heavy caliber infrared imaging system, to draw out
Easy to implement close to the response curve of sky background radiation intensity, low side calibration and calibration result are good, and suitable large-scale promotion is answered
With.
To enable the above objects, features and advantages of the present invention to be clearer and more comprehensible, preferred embodiment is cited below particularly, and cooperate
Appended attached drawing, is described in detail below.
Detailed description of the invention
In order to illustrate the technical solution of the embodiments of the present invention more clearly, below will be to needed in the embodiment attached
Figure is briefly described, it should be understood that the following drawings illustrates only certain embodiments of the present invention, therefore is not construed as pair
The restriction of range for those of ordinary skill in the art without creative efforts, can also be according to this
A little attached drawings obtain other relevant attached drawings.
Fig. 1 shows a kind of structural schematic diagram of means for correcting provided by the embodiment of the present invention.
Fig. 2 shows a kind of flow diagrams of bearing calibration provided by the embodiment of the present invention.
Fig. 3 shows a kind of product process schematic diagram of yi-H relation curve provided by the embodiment of the present invention.
Fig. 4 shows a kind of yi-S curve synoptic diagram provided by the embodiment of the present invention.
Fig. 5 shows a kind of yi-H curve synoptic diagram provided by the embodiment of the present invention.
Fig. 6 shows a kind of calibration curve schematic diagram provided by the embodiment of the present invention.
The corresponding title of appended drawing reference are as follows:
Detector 100, lens barrel 101；
Bracket 200, reflecting mirror 201, diaphragm 202, heat source 203, processor 204.
Specific embodiment
Below in conjunction with attached drawing in the embodiment of the present invention, technical solution in the embodiment of the present invention carries out clear, complete
Ground description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.Usually exist
The component of the embodiment of the present invention described and illustrated in attached drawing can be arranged and be designed with a variety of different configurations herein.Cause
This, is not intended to limit claimed invention to the detailed description of the embodiment of the present invention provided in the accompanying drawings below
Range, but it is merely representative of selected embodiment of the invention.Based on the embodiment of the present invention, those skilled in the art are not doing
Every other embodiment obtained under the premise of creative work out, shall fall within the protection scope of the present invention.
As shown in Figure 1, being applied to heavy caliber the embodiment of the invention provides a kind of Infrared Image Non-uniformity Correction device
Infrared imaging system, the heavy caliber infrared imaging system include lens barrel 101 and detector 100, and described device includes branch
Frame 200, reflecting mirror 201, heat source 203, diaphragm 202 and processor 204.
Wherein, described 200 one end of bracket be installed on the lens barrel 101, the other end and 201 phase of reflecting mirror
Even, the heat source 203 is set to and 100 adjacent position of detector.
The diaphragm 202 is set between the heat source 203 and the reflecting mirror 201, and the radiant light of the heat source 203 is through institute
It states reflecting mirror 201 described in 202 directive of diaphragm and enters in the lens barrel 101 after the reflecting mirror 201 reflection, the spy
Device 100 is surveyed to be used to detect the radiant light entered in the lens barrel 101.
The processor 204 be used for according to 203 temperature of heat source, 202 clear field of diaphragm, the heavy caliber it is infrared at
Standard spectrum radiation data under the conditions of as locating for system obtain the 202 clear field S of diaphragm and the heavy caliber it is infrared at
As the yi-S relation curve of system being imaged between each pixel response data yi, and spoke corresponding with the yi-S relation curve
The yi-H relation curve for penetrating intensity H Yu clear field S responds the low side point of all pixels in the yi-H relation curve unified
Correct y'j, by the unified amendment y' of high endpoint response of all pixels in the yi-H relation curvek, obtain response data y'nWith
The equivalent radiated power intensity H linear straight line L, according to the y' on the straight line LnOn the yi-S relation curve
ynBetween mapping relations obtain y'nTo ynMapping table, according to the mapping table by each ynIt is mapped as y'n。
In order to ensure the flexibility of angle adjustment, the preferably described reflecting mirror 201 is flexibly connected with the bracket 200, described
Reflecting mirror 201 can be adjusted the angle along the bracket 200.The reflecting mirror 201 and 200 detachable connection of bracket are described
Bracket 200 and 101 detachable connection of lens barrel.When so that adjustment angle being reinstalled, it is able to maintain higher heavy
Multiple precision.
In the embodiment of the present invention, the preferably described heat source 203 is high temperature blackbody.The reflecting mirror 201 is that small-bore plane is complete
Reflecting mirror or small-bore curved face total reflection mirror.
Wherein, the standard item that black matrix (black body) is studied frequently as heat radiation.It can absorb external whole
Electromagnetic radiation, and any reflection and transmission are not had.
The edge of optical element, frame or the barrier with holes being especially arranged are known as diaphragm 202 in optical system part.It can enter mirror
The light beam of head imaging, size are to be determined by lens frame and other metal frames, but in practical application, often limit light beam in this way
Not enough, some sheet metals with holes are also set in camera lens to limit light beam, referred to as diaphragm 202.The light passing of diaphragm 202
Hole is generally rounded, and on the central axis of lens, the metal frame of camera lens is also a kind of diaphragm 202 at center.
Based on above-mentioned Infrared Image Non-uniformity Correction device, it is non-that the embodiment of the invention also provides a kind of infrared images
Even property bearing calibration is applied to above-mentioned Infrared Image Non-uniformity Correction device, as shown in Fig. 2, the method includes following steps
Suddenly.
The heavy caliber infrared imaging system is pointed into the sky, the work of the reflecting mirror 201 and the heat source 203 is adjusted
Angle, the fixed reflecting mirror 201 and the heat source 203 when the heavy caliber infrared imaging system aims at the heat source 203.
By adjusting 201 operating angle of heat source 203 and reflecting mirror, keep 203 radiant light of heat source anti-by reflecting mirror 201
It injects into lens barrel 101, so that detector 100 is radiated H response maximum to heat source 203, fix heat source 203 in the case
With 201 angle of reflecting mirror, and radiation survey meter orientation angle is kept in mind.
When implementation, heat source 203 can be aimed at by auxiliary gun sight.
Step S301: the detector 100 be recorded in 203 temperature of heat source be T1 when, different clear field S are right respectively
(i=1,2...N, N are 100 pixel of detector to each pixel response data yi of the imaging for the heavy caliber infrared imaging system answered
Number), obtain the 202 clear field S of diaphragm and the heavy caliber infrared imaging system when 203 temperature of heat source is T1
The synchronized relation between each pixel response data yi is imaged.
In the step, by adjusting 202 clear field S of diaphragm, detector 100 is measured, and keeps the effective light pass surface of diaphragm 202 in mind
It is effective to record heat source 203 response of detector 100 and diaphragm 202 at a temperature of T1 for the long-pending synchronized relation with pixel response data yi
The relationship of clear field, the radiation flux H into instrument should be linear with 202 clear field S of diaphragm.
Szi+Shi=S0
y1i→B+ZbSzi+HT1Shi=A+k1Shi
Wherein: A=B+ZbS0, k1=HT1-Zb
SziFor shading-area, ShiFor clear field, S0For 202 area of effective diaphragm, B is containing sky background radiation, equipment
The constant of zero input response etc., HT1Radiosity when for 203 temperature of heat source being T1, ZbRefer to that the radiation of diaphragm 202 is logical
Metric density.
Step S302: the processor 204 is according to the 202 clear field S of diaphragm and heavy caliber infrared imaging system
Synchronized relation between each pixel response data yi of imaging of system, draws the 202 clear field S of diaphragm and the heavy caliber is red
Yi-S relation curve between each pixel response data yi of imaging of outer imaging system, yi-S relation curve are as shown in Figure 4.
Yi-S relation curve illustrates the relationship of response gray scale and clear field, by H=K × Ht × S, obtain gray scale with
The relationship of H.
Step S303: the processor 204 according to locating for the heavy caliber infrared imaging system under the conditions of standard spectrum
Radiation data obtains the yi-H relation curve of radiation intensity H and clear field S corresponding with the yi-S relation curve.
Wherein, the specific generating mode of yi-H relation curve can be specifically described in subsequent content, thus in this step
It is not illustrated more in rapid.
Step S304: the processor 204 uniformly repairs the low side point response of all pixels in the yi-H relation curve
Positive y'j, by the unified amendment y' of high endpoint response of all pixels in the yi-H relation curvek, obtain response data y'nWith institute
State the linear straight line L of equivalent radiated power intensity H.
Step S305: the processor 204 is according to the y' on the straight line LnWith the y on the yi-S relation curvenBetween
Mapping relations obtain y'nTo ynMapping table.
Step S306: the processor 204 is according to the mapping table by each ynIt is mapped as y'n.To complete to correct.
For some pixel, as shown in fig. 6, the response of all pixel low side points and high endpoint are responded when two point correction
Unified amendment y'jAnd y'k, obtain straight line L.The output of pixel gray scale is linear with intensity of illumination H.For the pixel, C
For the real response curve of the pixel, real response yjAnd ykAlthough corresponding HjAnd HkIt is unknown, but HjAnd HkReally
It is fixed, for any point N, H on curve CnWith HjAnd HkDifference is determining, i.e. gray scale y' after the amendment of arbitrary point on straight line LnWith reality
Respond ynRelationship determines that the corresponding relationship on curve C determines, that is, passes through real response gray scale ynAsh after correcting can directly be mapped
Spend y'n, pixel response gray scale and correction grey scale mapping table are made, other pixels are equally handled, it is non-homogeneous to complete image planes
Property checking list production.By image procossing, actual imaging is corrected using checking list, achievees the purpose that nonuniformity correction.
The reflecting mirror 201 and 200 detachable connection of bracket or the bracket 200 and the lens barrel 101
Detachable connection can effectively ensure the flexibility of angle adjustment.As shown in figure 3, the processor 204 is according to the big mouth
Standard spectrum radiation data under the conditions of diameter infrared imaging system is locating show that radiation corresponding with the yi-S relation curve is strong
Spend H and clear field S yi-H relation curve the step of include.
Step S401: described big when the processor 204 records the heavy caliber infrared imaging system direction first area
The orientation angle a and measurement data y of bore infrared imaging system、。
Wherein, 200 position of the reflecting mirror 201 or the bracket is preferably adjusted, the heavy caliber infrared imaging system is made
It is directed toward the uniform sky of background (first area), when record is directed toward the sky, the direction of the heavy caliber infrared imaging system
Angle a and measurement data y、。
Step S402: the processor 204 obtain spectral radiometer at orientation angle a with the heavy caliber infrared imaging
The resulting standard spectrum radiation data h1 in first area described in system synchro measure, the spectral measurement ranges of the spectral radiometer
Greater than the spectral response range of the heavy caliber infrared imaging system.
In the step, using spectral radiometer at orientation angle a with the heavy caliber infrared imaging system synchro measure
Same sky obtains standard spectrum radiation data h1, and standard spectrum radiation data h1 is sent to processor 204.
Step S403: the processor 204 marks the standard spectrum radiation data h1 on the yi-S relation curve.
Preferably the step includes: the processor 204 according to the standard spectrum radiation data h1 of acquisition and described
The spectral response range of heavy caliber infrared imaging system obtains the equivalent radiated power intensity H1 of the standard spectrum radiation data h1.
The processor 204 marks H1 numerical value on the horizontal axis that the yi-S relation curve corresponds to yi value；
Step S404: the processor 204 obtain spectral radiometer at orientation angle a with the heavy caliber infrared imaging
The resulting standard spectrum radiation data h2 of system synchro measure second area.
Second area in the step is the day region different from first area in the air.
Step S405: the processor 204 marks the standard spectrum radiation data h2 on the yi-S relation curve.
Preferably, which includes: the processor 204 according to the standard spectrum radiation data h2 of acquisition and described
The spectral response range of heavy caliber infrared imaging system obtains the equivalent radiated power intensity H2 of the standard spectrum radiation data h2.
The processor 204 marks H2 numerical value on the horizontal axis that the yi-S relation curve corresponds to yi value.
Step S406: the equivalent radiated power intensity H1 and the equivalent radiated power intensity of the processor 204 according to mark
H2 obtains the corresponding relationship of radiation intensity H Yu clear field S, and it is strong that the abscissa of the yi-S relation curve is rewritten into radiation
Unit H is spent, yi-H relation curve is obtained.To complete radiation intensity calibration.
It should be noted that pixel response data is only a greyscale concept, and there are no build with radiation flux in the present embodiment
Stringent corresponding relationship is found, the process of opening relationships is exactly to demarcate.
When implementing, also 203 alternating temperature of heat source to T2 can be executed above-mentioned demarcating steps, at this time:
Szi+Shi=S0
y2i→B+ZbSzi+HT1Shi=A+k2Shi
Wherein: A=B+ZbS0, k2=HT2-Zb
SziFor shading-area, ShiFor clear field, S0For 202 area of effective diaphragm, B is containing sky background radiation, equipment
The constant of zero input response etc., HT2Radiosity when for 203 temperature of heat source being T2, ZbRefer to that the radiation of diaphragm 202 is logical
Metric density.
For the same yi value, the same radiation intensity should be corresponded to, if two curves are answered using radiation intensity as abscissa
It is overlapped, the coincidence of two curves, available zoom factor K can be realized by scaling abscissa；
It is possible thereby to determine Zb, i.e. response curve abscissa unit is converted into (H+B) by S, since B not can determine that, curve
Abscissa absolute value is indefinite.
Calibration curve can be used as relative measurement use, such as the background subtraction that distant object actinometry can use,
Target emanation amount directly can be obtained using Fig. 5 as a result, obtaining measured target infrared radiation measurement result.It can also be in the base of Fig. 5
On plinth, absolute response calibration is carried out in conjunction with radiometer.
It can be concluded that, to enable response curve to demarcate near sky background as far as possible, needed by the embodiment of the present invention
ZbS0It is as small as possible, S0It is as small as possible to be realized using reflecting mirror 201 as small as possible, ZbIt is as small as possible to pass through diaphragm
202 total reflection designs, adjust the angle and realize with reflection zenith background radiation.
Infrared Image Non-uniformity Correction method and device provided in the embodiment of the present invention, dexterously in heat source 203
Diaphragm 202 is set between reflecting mirror 201, obtains different clear field S and heavy caliber by adjusting 202 clear field S of diaphragm
Yi-S relation curve between each pixel response data yi of imaging of infrared imaging system, it is verified, according to system photographs frequency
With 202 pace of change of diaphragm, the sampling density of the thousands of points of response curve can reach within one minute, response curve precision is very high,
Nonuniformity Correction effect is preferable, particularly introduces high temperature blackbody radiation using small-bore optical total-reflection mirror 201, is superimposed on day
Empty background changes black matrix using light-dimming method and is incident on the energy in heavy caliber infrared imaging system, to draw out close to day
The response curve of empty background radiation intensity, low side Photo-Response Non-Uniformity calibration result are good.
The foregoing is only a preferred embodiment of the present invention, is not intended to restrict the invention, for the skill of this field
For art personnel, the invention may be variously modified and varied.All within the spirits and principles of the present invention, made any to repair
Change, equivalent replacement, improvement etc., should all be included in the protection scope of the present invention.It should also be noted that similar label and letter exist
Similar terms are indicated in following attached drawing, therefore, once being defined in a certain Xiang Yi attached drawing, are then not required in subsequent attached drawing
It is further defined and explained.
The above description is merely a specific embodiment, but scope of protection of the present invention is not limited thereto, any
Those familiar with the art in the technical scope disclosed by the present invention, can easily think of the change or the replacement, and should all contain
Lid is within protection scope of the present invention.Therefore, protection scope of the present invention should be based on the protection scope of the described claims.
Claims (10)
1. a kind of Infrared Image Non-uniformity Correction device, be applied to heavy caliber infrared imaging system, the heavy caliber it is infrared at
As system includes lens barrel and detector, which is characterized in that described device includes bracket, reflecting mirror, heat source, diaphragm and processing
Device；
Described bracket one end is installed on the lens barrel, the other end is connected with the reflecting mirror, and the heat source is set to and institute
State detector adjacent position；
The diaphragm is set between the heat source and the reflecting mirror, and the radiant light of the heat source is through anti-described in the diaphragm directive
It penetrates mirror and enters in the lens barrel after reflecting mirror reflection, the detector is used for in the entrance lens barrel
Radiant light detected；
The processor is used for the item according to locating for the heat source temperature, diaphragm clear field, the heavy caliber infrared imaging system
Standard spectrum radiation data under part obtains each picture of imaging of the diaphragm clear field S Yu the heavy caliber infrared imaging system
Yi-S relation curve between first response data yi, and radiation intensity H corresponding with the yi-S relation curve and light pass surface
The yi-H relation curve of product S, by the unified amendment y' of low side point response of all pixels in the yi-H relation curvej, will be described
The unified amendment y' of high endpoint response of all pixels in yi-H relation curvek, obtain response data y'nWith the radiation intensity H at
The straight line L of linear relationship, according to the y' on the straight line LnWith the y on the yi-S relation curvenBetween mapping relations obtain
y'nTo ynMapping table, according to the mapping table by each ynIt is mapped as y'n。
2. Infrared Image Non-uniformity Correction device according to claim 1, which is characterized in that the reflecting mirror with it is described
Bracket is flexibly connected, and the reflecting mirror can be adjusted the angle along the bracket.
3. Infrared Image Non-uniformity Correction device according to claim 1 or 2, which is characterized in that the reflecting mirror with
The bracket detachable connection or the bracket and the lens barrel detachable connection.
4. Infrared Image Non-uniformity Correction device according to claim 3, which is characterized in that the heat source is that high temperature is black
Body.
5. Infrared Image Non-uniformity Correction device according to claim 4, which is characterized in that the reflecting mirror is osculum
Diameter plane total reflection mirror or small-bore curved face total reflection mirror.
6. a kind of Infrared Image Non-uniformity Correction method, which is characterized in that it is applied to Infrared Image Non-uniformity Correction device,
Described device is applied to heavy caliber infrared imaging system, and the heavy caliber infrared imaging system includes lens barrel and detector,
Described device includes bracket, reflecting mirror, heat source, diaphragm and processor；Described bracket one end is installed on the lens barrel, is another
One end is connected with the reflecting mirror, and the heat source is set to and the heavy caliber infrared imaging system adjacent position；The diaphragm
Between the heat source and the reflecting mirror, the radiant light of the heat source is through described in reflecting mirror described in the diaphragm directive and warp
Enter in the lens barrel after reflecting mirror reflection, which comprises
The detector is recorded in the heat source temperature when being T1, and the corresponding heavy caliber of different clear field S is infrared
Each pixel response data yi of the imaging of imaging system (i=1,2...N, N are detector pixel number), obtains in the heat source temperature
It is same between each pixel response data yi of the imaging of the diaphragm clear field S and the heavy caliber infrared imaging system when for T1
Step relationship；
The processor is according to each pixel number of responses of imaging of the diaphragm clear field S and the heavy caliber infrared imaging system
According to the synchronized relation between yi, each pixel of imaging of the diaphragm clear field S Yu the heavy caliber infrared imaging system are drawn
Yi-S relation curve between response data yi；
The processor according to locating for the heavy caliber infrared imaging system under the conditions of standard spectrum radiation data obtain and institute
State the yi-H relation curve of yi-S relation curve corresponding radiation intensity H and clear field S；
The low side point response unification of all pixels in the yi-H relation curve is corrected y' by the processorj, the yi-H is closed
It is the unified amendment y' of high endpoint response of all pixels in curvek, obtain response data y'nWith the linear pass radiation intensity H
The straight line L of system；
The processor is according to the y' on the straight line LnWith the y on the yi-S relation curvenBetween mapping relations obtain
y'nTo ynMapping table；
The processor is according to the mapping table by each ynIt is mapped as y'n。
7. Infrared Image Non-uniformity Correction method according to claim 6, which is characterized in that the reflecting mirror with it is described
Bracket detachable connection or the bracket and the lens barrel detachable connection, the processor is according to the heavy caliber
Standard spectrum radiation data under the conditions of infrared imaging system is locating obtains radiation intensity H corresponding with the yi-S relation curve
Include: with the step of yi-H relation curve of clear field S
When the processor records the heavy caliber infrared imaging system direction first area, the heavy caliber infrared imaging system
Orientation angle a and measurement data y,；
The processor obtains spectral radiometer at orientation angle a and described in the heavy caliber infrared imaging system synchro measure
The resulting standard spectrum radiation data h1 in first area, it is red that the spectral measurement ranges of the spectral radiometer are greater than the heavy caliber
The spectral response range of outer imaging system；
The processor marks the standard spectrum radiation data h1 on the yi-S relation curve.
8. Infrared Image Non-uniformity Correction method according to claim 7, which is characterized in that the processor root
It is obtained and the yi-S relation curve pair according to the standard spectrum radiation data under the conditions of locating for the heavy caliber infrared imaging system
The step of yi-H relation curve of the radiation intensity H and clear field S that answer further include:
The processor obtain spectral radiometer at orientation angle a with the heavy caliber infrared imaging system synchro measure second
The resulting standard spectrum radiation data h2 in region；
The processor marks the standard spectrum radiation data h2 on the yi-S relation curve, wherein the second area
For the day another region different from first area in the air.
9. Infrared Image Non-uniformity Correction method according to claim 8, which is characterized in that the processor is described
The step of standard spectrum radiation data h1 is marked on yi-S relation curve include:
The processor is according to the standard spectrum radiation data h1 of acquisition and the spectrum of the heavy caliber infrared imaging system
Response range obtains the equivalent radiated power intensity H1 of the standard spectrum radiation data h1；
The processor marks H1 numerical value on the horizontal axis that the yi-S relation curve corresponds to yi value；
The processor includes: the step of marking the standard spectrum radiation data h2 on the yi-S relation curve
The processor is according to the standard spectrum radiation data h2 of acquisition and the spectrum of the heavy caliber infrared imaging system
Response range obtains the equivalent radiated power intensity H2 of the standard spectrum radiation data h2；
The processor marks H2 numerical value on the horizontal axis that the yi-S relation curve corresponds to yi value；
The processor obtains radiation intensity H according to the equivalent radiated power intensity H1 and the equivalent radiated power intensity H2 of mark
With the corresponding relationship of clear field S, the abscissa of the yi-S relation curve is rewritten into radiation intensity unit H, obtains yi-H
Relation curve.
10. Infrared Image Non-uniformity Correction method according to claim 9, which is characterized in that remember in the detector
When the heat source temperature is T1, the imaging of the corresponding heavy caliber infrared imaging system of different clear field S is each for record
Before pixel response data yi, the method also includes pointing into the sky the heavy caliber infrared imaging system, adjust described anti-
The operating angle for penetrating mirror and the heat source, the fixed reflecting mirror when the heavy caliber infrared imaging system aims at the heat source
With the heat source.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610076610.9A CN105716720B (en) | 2016-02-03 | 2016-02-03 | Infrared Image Non-uniformity Correction method and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610076610.9A CN105716720B (en) | 2016-02-03 | 2016-02-03 | Infrared Image Non-uniformity Correction method and device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105716720A CN105716720A (en) | 2016-06-29 |
| CN105716720B true CN105716720B (en) | 2019-05-31 |
Family
ID=56155642
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610076610.9A Active CN105716720B (en) | 2016-02-03 | 2016-02-03 | Infrared Image Non-uniformity Correction method and device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105716720B (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107860478B (en) * | 2017-11-17 | 2019-11-22 | 北京长峰科威光电技术有限公司 | A kind of restorative procedure of infrared imaging system cold emission blackspot |
| CN108762700B (en) * | 2018-06-07 | 2020-12-08 | 华南理工大学 | Spectral characteristic correction method and device for output equipment |
| CN108871832B (en) * | 2018-08-01 | 2019-10-18 | 北京交通大学 | A kind of infrared seeker on-line proving system free of demolition |
| CN113916383B (en) * | 2021-09-29 | 2023-11-21 | 杭州微影软件有限公司 | Thermal imaging temperature measurement method and device and electronic equipment |
| CN114184567A (en) * | 2021-12-03 | 2022-03-15 | 渤海大学 | Infrared radiation shielding device and infrared detector calibration method based on same |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0601534A1 (en) * | 1992-12-07 | 1994-06-15 | Hughes Aircraft Company | Wide dynamic range non-uniformity compensation for infrared focal plane arrays |
| US6184529B1 (en) * | 1998-01-28 | 2001-02-06 | Lockheed Martin Corporation | Methods and apparatus for performing scene based uniformity correction in imaging systems |
| CN102230823A (en) * | 2011-06-20 | 2011-11-02 | 北京理工大学 | Infrared two-point non-uniform calibrating method based on frame black body field diaphragm |
| CN103065280A (en) * | 2012-12-13 | 2013-04-24 | 中国航空工业集团公司洛阳电光设备研究所 | Method and device of non-uniformed correction for short wave infrared detector |
| CN104316194A (en) * | 2014-09-24 | 2015-01-28 | 中国人民解放军63620部队 | Light adjusting-type infrared radiation calibration method |
-
2016
- 2016-02-03 CN CN201610076610.9A patent/CN105716720B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0601534A1 (en) * | 1992-12-07 | 1994-06-15 | Hughes Aircraft Company | Wide dynamic range non-uniformity compensation for infrared focal plane arrays |
| US6184529B1 (en) * | 1998-01-28 | 2001-02-06 | Lockheed Martin Corporation | Methods and apparatus for performing scene based uniformity correction in imaging systems |
| CN102230823A (en) * | 2011-06-20 | 2011-11-02 | 北京理工大学 | Infrared two-point non-uniform calibrating method based on frame black body field diaphragm |
| CN103065280A (en) * | 2012-12-13 | 2013-04-24 | 中国航空工业集团公司洛阳电光设备研究所 | Method and device of non-uniformed correction for short wave infrared detector |
| CN104316194A (en) * | 2014-09-24 | 2015-01-28 | 中国人民解放军63620部队 | Light adjusting-type infrared radiation calibration method |
Non-Patent Citations (1)
| Title |
|---|
| 红外焦平面探测器响应非线性的测定;胡贵红等;《光电子.激光》;20030531;第14卷(第5期);第489~492页 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105716720A (en) | 2016-06-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105716720B (en) | Infrared Image Non-uniformity Correction method and device | |
| CN109655162A (en) | Thermal infrared imager temperature measurement correction system and method | |
| CN109632104A (en) | A kind of infrared array radiation source calibrating installation and calibration method | |
| CN105509900B (en) | Infrared radiometer response curve caliberating device and method | |
| CN109444077B (en) | Quantitative measurement system and method for refractive index field based on phase calibration | |
| CN104977155A (en) | Rapid measurement method of LED light distribution curve | |
| CN105913414B (en) | A kind of caliberating device and scaling method of infrared camera vision system | |
| CN109932061A (en) | A kind of face battle array thermal infrared imager real-time correction method based on cold emission | |
| Chang et al. | Single-reference-based solution for two-point nonuniformity correction of infrared focal plane arrays | |
| Tang et al. | Overcoming high luminance gradient using serial exposure time method for synchronous full-field measurement of temperature and deformation | |
| CN108986170A (en) | A kind of line-scan digital camera method for correcting flat field suitable for field working conditions | |
| CN108871587A (en) | The Intelligent target device and its application method of thermal infrared imager NETD test | |
| Mier et al. | Color gradient background-oriented schlieren imaging | |
| Bao et al. | CMOS imager non-uniformity response correction-based high-accuracy spot target localization | |
| Chang et al. | Calibration algorithm for cooled mid-infrared systems considering the influences of ambient temperature and integration time | |
| Pang et al. | Research on the measurement method for a large laser beam profile based on CCD diffuse transmission imaging | |
| Hertel | Viewing direction measurements on flat and curved flexible E‐paper displays | |
| Jablonski et al. | Perfectly understood non-uniformity: methods of measurement and uncertainty of uniform sources | |
| CN205620030U (en) | Infrared measuring apparatu response curve calibration device and system | |
| CN114034405A (en) | Non-contact temperature measurement method and system | |
| Chang et al. | Application of neutral-density filters to nonuniformity correction | |
| Ren et al. | Design of a high frame rate driver circuit for a 22 M-pixel high-resolution large-area array CCD camera and its nonuniformity correction | |
| CN109579988A (en) | A kind of measuring device and measuring method of faint parallel illuminance | |
| Grange et al. | Comparison of Simulated and Measured Flux Distributions at the Aperture of the Next-CSP Solar Receiver | |
| CN108801982A (en) | A method of measuring translucent medium anisotropic scattering characteristic |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20201126 Address after: Room 228, 2nd floor, Fudu building, No. 11-13, Jiejin Middle Road, Shiqiao street, Panyu District, Guangzhou City, Guangdong Province Patentee after: GUANGZHOU CHONGKE INTELLECTUAL PROPERTY OPERATION Co.,Ltd. Address before: 732750 room 3, unit 321, Dongfeng 0948, Dongfeng District, Gansu, Jiuquan Patentee before: Jiang Zhifu |
|
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20230728 Address after: 229, Block B, Huafeng Headquarters Economic Building, No. 288 Xixiang Avenue, Labor Community, Xixiang Street, Bao'an District, Shenzhen City, Guangdong Province, 518000 Patentee after: Shenzhou technology test (Shenzhen) Technology Co.,Ltd. Address before: 228, 2nd Floor Shopping Mall, Fudu Building, No. 11-13 Jiejin Middle Road, Shiqiao Street, Panyu District, Guangzhou City, Guangdong Province, 511405 Patentee before: GUANGZHOU CHONGKE INTELLECTUAL PROPERTY OPERATION CO.,LTD. |
|
| TR01 | Transfer of patent right |