CN109389921A - Testing device of display panel and display device - Google Patents
Testing device of display panel and display device Download PDFInfo
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- CN109389921A CN109389921A CN201811521785.1A CN201811521785A CN109389921A CN 109389921 A CN109389921 A CN 109389921A CN 201811521785 A CN201811521785 A CN 201811521785A CN 109389921 A CN109389921 A CN 109389921A
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- Engineering & Computer Science (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
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- Computer Hardware Design (AREA)
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Abstract
The present invention discloses a kind of testing device of display panel and display device, testing device of display panel includes test signal input part, short-circuit gate, N number of one-way conduction component and N number of conducting wire, the display panel test signal of the test signal input part input successively exports after the short-circuit gate, one-way conduction component, N number of conducting wire to display panel, to test display panel.The present invention solves the problems, such as that the G concealed wire of display panel in the prior art interferes with each other.
Description
Technical field
The present invention relates to display device technology field, in particular to a kind of testing device of display panel and display device.
Background technique
In the production technology of existing display panel (TFT-LCD), one of stub test (Shorting Bar is had
Testing) program, test philosophy are that panel lighted in the measurement circuit injection test signal of display panel, pass through control
Test program generates some simple test pictures, if (such as stain, color spot, scribing line and gray scale are uneven for panel existing defects
Deng), defect will be shown in these pictures, then bad panel detection is gone out by artificial or defect automatic checkout system
Come, guarantees that underproof product does not enter lower road IC binding procedure, unnecessary driving chip (IC) and anisotropy is avoided to lead
The waste of the materials such as electric glue film (ACF) improves the qualification rate of display panel product, reduces material consumption cost.
But it before carrying out the connection (bonding) of driving chip and display panel, needs short-circuit gate (shorting
Bar) with bonding pad (Gate IC generate signal reach glass end bridge) in cabling it is radium-shine fall, if having two after radium-shine
Item just has the generation of G concealed wire, to influence the display result of display panel with upward wiring short circuit.
Summary of the invention
The main object of the present invention is to propose a kind of testing device of display panel, realizes the G concealed wire phase of display panel not
The purpose of interference.
To achieve the above object, the present invention proposes a kind of testing device of display panel, the testing device of display panel packet
It includes:
Signal input part is tested, tests signal for the corresponding display panel for receiving test equipment input；
Short-circuit gate, N number of output end that the short-circuit gate has public input terminal and connect with the public input terminal are described
The public input terminal of short-circuit gate is connect with the test signal input part；
N number of one-way conduction component, the one-way conduction component have input terminal and output end, and the one-way conduction component is certainly
Its input terminal is to its output end one-way conduction, the input terminal of N number of one-way conduction component and N number of output end of the short-circuit gate
One-to-one connection；
N number of conducting wire, the one-to-one company of output end of the input terminal of N number of conducting wire and N number of one-way conduction component
It connects；The output end of N number of conducting wire is for connecting display panel；N number of conducting wire is successively divided from its input terminal to its output end
For radium-shine area and bonding pad；
The display panel test signal of the test signal input part input is successively through the short-circuit gate, one-way conduction group
It exports after part, N number of conducting wire to display panel, to test display panel.
Optionally, the one-way conduction component is diode, and the anode of the diode is input terminal, the diode
Cathode is output end.
Optionally, the testing device of display panel further includes fanout area, and N number of conducting wire is from its input terminal to its output
End is divided into radium-shine area, bonding pad and fanout area.
Optionally, the test signal input part, short-circuit gate, N number of one-way conduction component, in N number of conducting wire at least
The two is arranged on same circuit board.
Optionally, the conducting wire is the conductive film being layed on the circuit board.
Optionally, the conducting wire is the copper sheet being layed on the circuit board.
Optionally, the conducting wire is the conductive layer that the circuit board is formed through overetch.
To achieve the above object, the present invention also proposes a kind of testing device of display panel, the testing device of display panel
Include:
M test signal input part tests signal for the corresponding display panel for receiving test equipment input；
M short-circuit gate, each short-circuit gate have public input terminal and the N/M connecting with the public input terminal a defeated
Outlet, the public input terminal of the M short-circuit gates and the M one-to-one connections of the test signal input part；
N number of one-way conduction component, the one-way conduction component have input terminal and output end, and the one-way conduction component is certainly
Its input terminal to its output end one-way conduction, the input terminal of N number of one-way conduction component is exported with N/M of the short-circuit gate
Hold one-to-one connection；
N number of conducting wire, the one-to-one company of output end of the input terminal of N number of conducting wire and N number of one-way conduction component
It connects；The output end of N number of conducting wire is for connecting display panel；N number of conducting wire is divided into radium from its input terminal to its output end
Penetrate area and bonding pad；
The display panel test signal of the test signal input part input is successively through the short-circuit gate, one-way conduction group
It exports after part, N number of conducting wire to display panel, to test display panel.
Optionally, the quantity of the short-circuit gate is two, respectively the first short-circuit gate and the second short-circuit gate,
N/M output end of N/M output end of first short-circuit gate and second short-circuit gate is intertwined
Setting.
To achieve the above object, the present invention also proposes a kind of display device, including display panel as described above test dress
It sets.
Testing device of display panel proposed by the present invention, the testing device of display panel include test signal input part,
Short-circuit gate, N number of one-way conduction component and N number of conducting wire, the input terminal of the short-circuit gate and the test signal input part one
It is connected to one, N number of one-way conduction component, the one-way conduction component has input terminal and output end, the one-way conduction component
From its input terminal to its output end one-way conduction, N number of output of the input terminal and the short-circuit gate of N number of one-way conduction component
Hold one-to-one connection.The output end of N number of conducting wire, the input terminal of N number of conducting wire and N number of one-way conduction component is a pair of
One connection, the output end of N number of conducting wire for connecting display panel, N number of conducting wire from its input terminal to its output end according to
It is secondary to be divided into radium-shine area and bonding pad.The invention shows panel testers can receive test by the way that test signal input part is corresponding
The display panel of equipment input tests signal, and then the display panel test signal of the test signal input part input successively passes through
It exports after the short-circuit gate, one-way conduction component, N number of conducting wire to display panel, to test display panel.This
When, testing device of display panel lights display panel by testing signal, so that the defective products in display panel is rejected, it will be remaining
Testing device of display panel radium-shine area it is radium-shine fall, by the driving signal of bonding pad input display panel, at this point, can exist
Due to the conducting wire short-circuit conditions in radium-shine not exclusively caused radium-shine area, i.e., G concealed wire is generated in display panel, at this point, holding
It easily causes subsequent finished product display panel to go wrong, reduces the yields of production.In the technical solution of the application, by short
One-way conduction component is arranged in road grid and conducting wire, it can prevent it is radium-shine after there is G concealed wire driving signal caused to interfere with each other
The case where, to solve the problems, such as that the G concealed wire of display panel in the prior art interferes with each other.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of invention for those of ordinary skill in the art without creative efforts, can be with
The structure shown according to these attached drawings obtains other attached drawings.
Fig. 1 is that the invention shows the module diagrams of one embodiment of panel tester；
Fig. 2 is that the invention shows the module diagrams of the another embodiment of panel tester；
Fig. 3 is that the invention shows the structural schematic diagrams of panel tester；
Fig. 4 is that the invention shows the structural schematic diagrams of panel tester G concealed wire short circuit.
The embodiments will be further described with reference to the accompanying drawings for the realization, the function and the advantages of the object of the present invention.
Specific embodiment
It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, it is not intended to limit the present invention.
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiment is only two section Examples of the invention, instead of all the embodiments.Base
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts it is all its
His embodiment, shall fall within the protection scope of the present invention.
It is to be appreciated that the directional instruction (such as up, down, left, right, before and after ...) of institute is only used in the embodiment of the present invention
In explaining in relative positional relationship, the motion conditions etc. under certain two particular pose (as shown in the picture) between each component, if should
When particular pose changes, then directionality instruction also correspondingly changes correspondingly.
In addition, the description for being related to " second ", " multiple " etc. in the present invention is used for description purposes only, and should not be understood as referring to
Show or imply its relative importance or implicitly indicates the quantity of indicated technical characteristic.It defines as a result, " second ", " more
It is a " feature can explicitly or implicitly include at least two this feature.In addition, the technical solution between each embodiment can
It to be combined with each other, but must be based on can be realized by those of ordinary skill in the art, when the combination of technical solution occurs
Conflicting or cannot achieve when, will be understood that the combination of this technical solution is not present, also not the present invention claims protection model
Within enclosing.
The present invention proposes a kind of testing device of display panel, the G concealed wire phase to the display panel when detecting display device
Mutually the problem of interference, so that G concealed wire does not interfere with the normal display of subsequent display panel, the yields of finished product is improved.
In an embodiment of the present invention, together referring to Fig.1 and Fig. 4, a kind of testing device of display panel, the display panel
Test device includes test signal input part 110, short-circuit gate 111, N number of one-way conduction component 112 and N number of conducting wire 113, list
There is input terminal and output end to feed-through assembly.Test the corresponding display panel for receiving test equipment input of signal input part 110
Test signal, N number of output end that short-circuit gate 111 has public input terminal and connect with the public input terminal, short-circuit gate 111
Public input terminal is connect with test signal input part 110, and one-way conduction component is from its input terminal to its output end one-way conduction, N
The one-to-one connection of N number of output end of the input terminal and short-circuit gate of a one-way conduction component.The input terminal and N of N number of conducting wire 113
The one-to-one connection of output end of a one-way conduction component, the output end of N number of conducting wire 113 are N number of to lead for connecting display panel
Electric line 113 is divided into radium-shine area 1131 and bonding pad 1132 from its input terminal to its output end.
Wherein, the display panel test signal that test signal input part 110 inputs is successively through short-circuit gate, one-way conduction group
It exports after part, N number of conducting wire 113 to display panel, to test display panel.At this point, display panel test dress
Signal can be tested by display panel by, which setting, light display panel, detect the defect of display panel, such as stain, color spot, draw
The problems such as line and uneven gray scale, is allowed to be not involved in subsequent handling to reject the defective products in display panel, to save consumption
Material reduces cost and the yields of end product can be improved.By the testing device of display panel of the display panel normally shown
Radium-shine area 1131 it is radium-shine fall after, at this time testing device of display panel by bonding pad 1132 to display panel input driving letter
Number, if at this point, it is radium-shine not exclusively, the feelings of two or more conducting wire short circuits are had between the conducting wire in radium-shine area 1131
Condition, since conducting wire is the exclusive path that driving signal is transmitted to thin film transistor (TFT), therefore, because the short circuit of conducting wire,
So G concealed wire can be generated in the driver circuit of display panel, at this point, subsequent finished product display panel is be easy to cause to ask
Topic, reduces the yields of production.In the technical solution of the application, by the way that one-way conduction is arranged between short-circuit gate and conducting wire
Component prevents driving from believing when being allowed in testing device of display panel through bonding pad 1132 to display panel input drive signal
Number short-circuit gate is flowed into via the radium-shine area 1131 after radium-shine, avoids G concealed wire, avoid two G lines driving as shown in Figure 4
The case where signal interferes with each other between each other, thus after radium-shine area 1131 is radium-shine when solving detection display device in the prior art
The problem of driving signal interferes with each other.In this application, radium-shine to can be understood as laser, radium-shine area 1131 is laser zone, radium-shine
For laser irradiation.More optionally, in this application, if detect that display panel is qualified product, panel survey can be directly displayed
Trial assembly is set through bonding pad 1132 to display panel input drive signal, without needing as traditional detection device specially
Door be arranged radium-shine area 1131 by its it is radium-shine fall, at this point, even if having.At this point, driving signal is not yet since one-way conduction component exists
Short-circuit gate can be flowed by radium-shine area 1131, so that influencing each other between driving signal, so as to reduce production process, save
Productive power and reduction enterprise's production cost have preferable industrialization effect.Wherein, one-way conduction component can be various
Device in one-way on state.At this point, mentioned N is 1~n (n is infinity).
Optionally, one-way conduction component is diode, and the anode of diode is input terminal, and the cathode of diode is output
End.
Wherein, diode is set by one-way conduction component, diode is only made of a PN junction at this time, and structure is simpler
It is single, it is advantageously integrated in testing device of display panel, moreover, diode behavior is relatively stable, has good unilateral conduction,
Relatively good technical effect can be played in this application.Also, since the PN junction structure of composition diode is simple, easily
Industrial mass production, so as to reduce the cost of production.
Further, as shown in figure 3, testing device of display panel further includes fanout area 1133, N number of conducting wire is defeated from its
Enter end to its output end and is divided into radium-shine area 1131, bonding pad 1132 and fanout area 1133.
Wherein, one fanout area 1133 of setting is in order to by the radium-shine area 1131 in fanout area 1133 and even more than the conductor wire section
The function distinguishing for meeting area 1132 comes, and three is conducting wire, is only respectively at different location, and radium-shine area 1131 is arranged can
With facilitate mark off it is subsequent need it is radium-shine fall region, avoid it is radium-shine during because radium-shine position do not know caused by such as radium
Penetrate positional fault and cause the routes of other parts also by it is radium-shine fall the problem of.In addition, setting bonding pad 1132 is for convenience
The driving chip of input drive signal is connect with display panel, while fanout area 1133 is arranged and can be convenient change fanout area 1133
Conductive trace portion shape, be allowed to and corresponding display panel connect.At this point, radium-shine area 1131, bonding pad 1132 and fan
Area 1,133 one can be set as different shape and material according to the difference of object respectively connected out, facilitate connection.Function is set
Property subregion can make subsequent production process apparent, facilitate the binding of driving chip and display panel, improve finished product
Stability.
Optionally, signal input part 110, short-circuit gate 111, N number of one-way conduction component 112, N number of conducting wire 113 are tested
In both be at least arranged on same circuit board.
At this point, signal input part 110, short-circuit gate 111, N number of one-way conduction component 112, N number of conducting wire 113 will be tested
In both at least setting be integrated on same circuit board on same circuit board, testing device of display panel can be made integrated
Change and simplifies.And convenient for producing in enormous quantities, to reduce the testing cost of production.
Optionally, conducting wire is the conductive film being layed on circuit board.
Wherein, the residual of the radium-shine radium-shine area 1131 of conducting wire later can be reduced by setting conductive film for conducting wire
It stays, to thoroughly disconnect the access between area 1132 and short-circuit gate 111, improves the stability of system.
Optionally, conducting wire is the copper sheet being layed on circuit board.
Wherein, by conducting wire be set as conductive film can guarantee in test process and radium-shine conducting wire later it is only
Vertical property, is not in situation short-circuit between conducting wire.
Optionally, conducting wire is the conductive layer that circuit board is formed through overetch.
Wherein, the conductive layer that circuit board is formed through overetch is set by conducting wire, electricity can be simplified to the full extent
Line structure, and 111 multilayer of short-circuit gate can be arranged, reduce the volume of circuit board, convenient for storage.
To achieve the above object, as shown in Figure 2,3, the present invention proposes that a kind of testing device of display panel, display panel are surveyed
Trial assembly is set including M test signal input part 114, M short-circuit gate 115, N number of one-way conduction component 112 and N number of conducting wire
113.The corresponding display panel test signal for receiving test equipment input of M test signal input part 114, M short-circuit gate 115,
Each short-circuit gate has public input terminal and a N/M output end connecting with public input terminal, M short-circuit gate 115 it is public defeated
Enter end and the M one-to-one connection of test signal input part 114.N number of one-way conduction component 112, one-way conduction component have input
End and output end, one-way conduction component is from its input terminal to its output end one-way conduction, the input of N number of one-way conduction component 112
The one-to-one connection of N/M output end at end and short-circuit gate.The input terminal of N number of conducting wire 113 and N number of one-way conduction component 112
The one-to-one connection of output end；The output end of N number of conducting wire 113 is for connecting display panel；N number of conducting wire 113 from its
Input terminal to its output end is divided into radium-shine area 1131 and bonding pad 1132.
Wherein, the display panel test signal of test signal input part input is successively through M short-circuit gate 115, N one-way conduction
It exports after component 112, N number of conducting wire 113 to display panel, to test display panel.At this point, display panel is surveyed
Trial assembly, which is set, can light display panel by display panel test signal, detect the defect of display panel, such as stain, coloured silk
Point, the problems such as scribing line and gray scale are uneven, to reject the defective products in display panel, are allowed to be not involved in subsequent handling, to save
About consumptive material, reduce cost and the yields of end product can be improved.The display panel of the display panel normally shown is tested
The radium-shine area 1131 of device it is radium-shine fall after, at this time testing device of display panel by bonding pad 1132 to display panel input drive
Signal, if at this point, it is radium-shine not exclusively, had between the conducting wire in radium-shine area 1,131 two or more conducting wire short circuit
Situation, since conducting wire is the exclusive path that driving signal is transmitted to thin film transistor (TFT), therefore, because conducting wire is short
Road, so G concealed wire can be generated in the driver circuit of display panel, at this point, subsequent finished product display panel is be easy to cause to occur
Problem reduces the yields of production.In the technical solution of the application, unidirectionally led by being arranged between short-circuit gate and conducting wire
Logical component prevents from driving when being allowed in testing device of display panel through bonding pad 1132 to display panel input drive signal
Signal flows into short-circuit gate via the radium-shine area 1131 after radium-shine, avoids G concealed wire, avoids two G lines as shown in Figure 3 and drives
The case where dynamic signal interferes with each other between each other, so that it is radium-shine to solve radium-shine area 1131 when detecting display device in the prior art
The problem of driving signal interferes with each other afterwards.In this application, radium-shine to can be understood as laser, radium-shine area 1131 is laser zone, radium
It penetrates as laser irradiation.Optionally, in this application, if detect that display panel is qualified product, panel survey can be directly displayed
Trial assembly is set through bonding pad 1132 to display panel input drive signal, without needing as traditional detection device specially
Door be arranged radium-shine area 1131 by its it is radium-shine fall, at this point, even if thering is driving signal to flow through.Since one-way conduction component exists, driving
Signal will not flow into short-circuit gate by radium-shine area 1131, so that influencing each other between driving signal, so as to reduce production
Process saves productive power and reduces enterprise's production cost, has preferable industrialization effect.Wherein, one-way conduction component
It can be various device in one-way on state.At this point, mentioned N is 1~n (n is infinity).
It is worth noting that, the quantity of short-circuit gate is set as M at this time, it can be convenient and detect to lead with each short-circuit gate
The short-circuit conditions of electric line part, and upon completion of the assays, stop input detection signal, and can prevent contingency from short-circuit feelings occur
Condition reduces short circuit and impacts to the display area of display panel, and then promotes the display effect of display panel.
Optionally, the quantity of short-circuit gate is two, and respectively the first short-circuit gate 1151 and the second short-circuit gate 1152, first is short
N/M output end of N/M output end of road grid 1151 and the second short-circuit gate 1152 is intertwined setting.
At this point it is possible to conveniently detect the conductive trace portion being connect with the first short-circuit gate 1151 and with the second short-circuit gate
Abnormal conditions between the conductive trace portion of 1152 connections.And upon completion of the assays, stop input detection signal, and can be to prevent
Only just in case there are short-circuit conditions, reduce short circuit and the display area of display panel is impacted, promotes the display effect of display panel
Fruit.Also, by the interlaced row of N/M output end of N/M output end of the first short-circuit gate 1151 and the second short-circuit gate 1152
Column setting, can largely utilize space, prevent the short-circuit conditions occurred as soon as without short-circuit gate, improve the accurate of detection
Property.And the short circuit between adjacent two line upon completion of the assays, can be preferably avoided, is allowed to work independently, improves display surface
The display effect of plate.
Optionally, the input terminal of the first short-circuit gate 1151 is connect with the first test signal input part 1141, the second short-circuit gate
1152 input terminal is connect with the second test signal input part 1142.
Wherein, the first short-circuit gate 1151 and the second short-circuit gate 1152 are respectively from the first test signal input part 1141 and second
It tests signal input part 1142 and obtains test signal, because test signal is the same, contrast so as to can be convenient by with the
The working condition of multiple conducting wires of one short-circuit gate 1151 connection, conveniently picks out bad display panel, further, can be with
Save test signal input port.
To achieve the above object, the present invention proposes a kind of display device, including testing device of display panel as above.
It is understood that due to having used above-mentioned testing device of display panel in the display device of that present invention, this
The embodiment of invention display device includes whole technical solutions of above-mentioned testing device of display panel whole embodiments, achieved
Technical effect is also identical, and details are not described herein.
The above is only a preferred embodiment of the present invention, is not intended to limit the scope of the invention, all in the present invention
Inventive concept under, using equivalent structure transformation made by description of the invention and accompanying drawing content, or directly/be used in it indirectly
He is included in scope of patent protection of the invention relevant technical field.
Claims (10)
1. a kind of testing device of display panel, which is characterized in that the testing device of display panel includes:
Signal input part is tested, tests signal for the corresponding display panel for receiving test equipment input；
Short-circuit gate, N number of output end that the short-circuit gate has public input terminal and connect with the public input terminal, the short circuit
The public input terminal of grid is connect with the test signal input part；
N number of one-way conduction component, the one-way conduction component have input terminal and output end, and the one-way conduction component is defeated from its
Enter end to its output end one-way conduction, the input terminal of N number of one-way conduction component and N number of output end of the short-circuit gate are a pair of
One connection；
N number of conducting wire, the one-to-one connection of output end of the input terminal of N number of conducting wire and N number of one-way conduction component；N
The output end of a conducting wire is for connecting display panel；N number of conducting wire is divided into radium-shine area from its input terminal to its output end
The bonding pad and；
The display panel test signal of the test signal input part input is successively through the short-circuit gate, one-way conduction component, N number of
It exports after conducting wire to display panel, to test display panel.
2. testing device of display panel as described in claim 1, which is characterized in that the one-way conduction component is diode,
The anode of the diode is input terminal, and the cathode of the diode is output end.
3. testing device of display panel as described in claim 1, which is characterized in that the testing device of display panel further includes
Fanout area, N number of conducting wire are divided into radium-shine area, bonding pad and fanout area from its input terminal to its output end.
4. testing device of display panel as described in claim 1, which is characterized in that the test signal input part, short-circuit gate,
At least the two in N number of one-way conduction component, N number of conducting wire is arranged on same circuit board.
5. testing device of display panel as claimed in claim 4, which is characterized in that the conducting wire is to be layed in the electricity
Conductive film on the plate of road.
6. testing device of display panel as claimed in claim 4, which is characterized in that the conducting wire is to be layed in the electricity
Copper sheet on the plate of road.
7. testing device of display panel as claimed in claim 4, which is characterized in that the conducting wire is circuit board warp
The conductive layer that overetch is formed.
8. a kind of testing device of display panel, which is characterized in that the testing device of display panel includes:
M test signal input part tests signal for the corresponding display panel for receiving test equipment input；
M short-circuit gate, the N/M output that each short-circuit gate has public input terminal and connect with the public input terminal
End, the public input terminal of the M short-circuit gates and the M one-to-one connections of the test signal input part；
N number of one-way conduction component, the one-way conduction component have input terminal and output end, and the one-way conduction component is defeated from its
Enter end to its output end one-way conduction, the input terminal of N number of one-way conduction component and the N/M output end one of the short-circuit gate
It is connected to one；
N number of conducting wire, the one-to-one connection of output end of the input terminal of N number of conducting wire and N number of one-way conduction component；N
The output end of a conducting wire is for connecting display panel；N number of conducting wire is divided into radium-shine area from its input terminal to its output end
The bonding pad and；
The display panel test signal of the test signal input part input is successively through the short-circuit gate, one-way conduction component, N number of
It exports after conducting wire to display panel, to test display panel.
9. testing device of display panel as claimed in claim 8, which is characterized in that the quantity of the short-circuit gate is two, point
Not Wei the first short-circuit gate and the second short-circuit gate,
N/M output end of N/M output end of first short-circuit gate and second short-circuit gate is intertwined setting.
10. a kind of display device, which is characterized in that including such as described in any item testing device of display panel of claim 1-7
Or such as the described in any item testing device of display panel of claim 8-9.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811521785.1A CN109389921A (en) | 2018-12-12 | 2018-12-12 | Testing device of display panel and display device |
| PCT/CN2019/123967 WO2020119623A1 (en) | 2018-12-12 | 2019-12-09 | Display panel testing device and display device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811521785.1A CN109389921A (en) | 2018-12-12 | 2018-12-12 | Testing device of display panel and display device |
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| Publication Number | Publication Date |
|---|---|
| CN109389921A true CN109389921A (en) | 2019-02-26 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811521785.1A Pending CN109389921A (en) | 2018-12-12 | 2018-12-12 | Testing device of display panel and display device |
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| CN (1) | CN109389921A (en) |
| WO (1) | WO2020119623A1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2020119623A1 (en) * | 2018-12-12 | 2020-06-18 | 惠科股份有限公司 | Display panel testing device and display device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN101630072A (en) * | 2008-07-18 | 2010-01-20 | 群康科技(深圳)有限公司 | Liquid crystal display panel |
| US20140203281A1 (en) * | 2010-07-29 | 2014-07-24 | Chunghwa Picture Tubes, Ltd. | Display device having repair and detect structure |
| CN104062784A (en) * | 2014-06-25 | 2014-09-24 | 深圳市华星光电技术有限公司 | Panel detection circuit and display panel |
| CN104111550A (en) * | 2014-08-08 | 2014-10-22 | 深圳市华星光电技术有限公司 | Liquid crystal panel detection circuit |
| CN204964956U (en) * | 2015-09-16 | 2016-01-13 | 厦门天马微电子有限公司 | Array substrate and display panel |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109389921A (en) * | 2018-12-12 | 2019-02-26 | 惠科股份有限公司 | Testing device of display panel and display device |
-
2018
- 2018-12-12 CN CN201811521785.1A patent/CN109389921A/en active Pending
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2019
- 2019-12-09 WO PCT/CN2019/123967 patent/WO2020119623A1/en active Application Filing
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| CN101630072A (en) * | 2008-07-18 | 2010-01-20 | 群康科技(深圳)有限公司 | Liquid crystal display panel |
| US20140203281A1 (en) * | 2010-07-29 | 2014-07-24 | Chunghwa Picture Tubes, Ltd. | Display device having repair and detect structure |
| CN104062784A (en) * | 2014-06-25 | 2014-09-24 | 深圳市华星光电技术有限公司 | Panel detection circuit and display panel |
| CN104111550A (en) * | 2014-08-08 | 2014-10-22 | 深圳市华星光电技术有限公司 | Liquid crystal panel detection circuit |
| CN204964956U (en) * | 2015-09-16 | 2016-01-13 | 厦门天马微电子有限公司 | Array substrate and display panel |
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| WO2020119623A1 (en) * | 2018-12-12 | 2020-06-18 | 惠科股份有限公司 | Display panel testing device and display device |
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| WO2020119623A1 (en) | 2020-06-18 |
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