CN109387762A - A kind of adopting surface mounted LED row survey device - Google Patents
A kind of adopting surface mounted LED row survey device Download PDFInfo
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- CN109387762A CN109387762A CN201710686782.2A CN201710686782A CN109387762A CN 109387762 A CN109387762 A CN 109387762A CN 201710686782 A CN201710686782 A CN 201710686782A CN 109387762 A CN109387762 A CN 109387762A
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- bracket
- flakes
- integrating sphere
- testboard
- led
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
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- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
A kind of adopting surface mounted LED row survey device, it is related to LED technology field；Lower support plate is provided on testboard, bracket in flakes is placed on lower support plate, array is placed with more mutual disjunct lamp beads on bracket in flakes, more lamp bead structure distributions in a strip shape are on bracket in flakes, it is provided with groove between strip structure, the first rib corresponding with groove is provided on the lower support plate；Upper cover plate is provided with above the bracket in flakes, the surface of upper cover plate is provided with several second ribs, and the second rib is correspondingly arranged with groove；The side of the testboard is provided with integrating sphere, and test probe is provided with below integrating sphere；The testboard is connect by X/Y guide rail with pedestal.The present invention can solve the problems, such as that industry adopting surface mounted LED row surveys low efficiency, while as much as possible can grab certain photoelectric parameter data before LED lamp bead light splitting, be adjusted to the encapsulation material of volume production lamp bead, to reach qualified LED product.
Description
Technical field
The present invention relates to LED technology fields, and in particular to a kind of adopting surface mounted LED row survey device.
Background technique
LED production procedure mainly includes the links such as die bond, bonding wire, dispensing, blank, light splitting, packaging, first three process is referred to as
For the encapsulation of LED, being encapsulated in is a critically important link in entire LED production procedure, and main purpose is in order to ensure LED core
It is correctly electrically connected between piece and LED support circuit, chip is protected not allow it by mechanical, hot, moist and other various
External shock；Blank is then the every LED separated on platoon bracket；Whether light splitting is then to examine the LED product of production qualified, at
An essential procedure before product dispatch from the factory.There is biggish discreteness in LED, and practical application is to LED light in process of production
The coherence request of electrical parameter is very high, and to the process control that LED is produced, more stringent requirements are proposed for this, how to improve the good of product
How product rate can find substandard product at semi-finished product (before being divided), how to greatest extent substandard product in time
Become qualified products, this is LED manufacturing enterprise urgently problem to be solved.Yields is improved, it just need to be to the half of a certain amount of LED
Finished product (non-blank platoon lamp), finished product parameter measure, especially need to grab a certain amount of light wait semi-finished product before being divided
Electrical parameter data determines LED product quality；Wherein the quality of quality mainly with forward voltage, leakage current, colour temperature, chromaticity coordinates,
The parameter measures such as luminous flux, aobvious finger, if parameter is not achieved, it is necessary to be debugged, until meeting photoelectric parameter consistency need
It asks, then batch jobs again.So just to the performance of test equipment, compatibility more stringent requirements are proposed.Existing survey
Examination is that single product is placed on integrating sphere measurement instrument and is tested, for LED after the completion of LED product dispensing trial
PCT/PPA product involved by industry can directly remove single product after dispensing trial from platoon lamp support and be tested,
But for EMC product, after dispensing trial, then need to paste the progress monomer cutting of UV film on bracket in flakes, then again from flakes
Single product is removed on bracket to be tested.Such test method takes a long time, inefficiency, and one one from platoon branch
It takes off to be placed on integrating sphere on frame and test, be easier to place the influence of gimmick because testing gimmick and lead to test result deviation
It is larger.
Summary of the invention
In view of the defects and deficiencies of the prior art, the present invention intends to provide one kind by directly testing platoon bracket
On the photoelectric parameter of each lamp bead determine that the qualified or not adopting surface mounted LED row of product surveys device.
To achieve the above object, the technical solution adopted by the present invention is that: it include testboard, lower support plate, in flakes bracket, lamp
Pearl, groove, the first rib, upper cover plate, the second rib, integrating sphere, test probe, pedestal；It is provided with down on the testboard
Support plate is placed with bracket in flakes on lower support plate, and array is placed with more mutual disjunct lamp beads on bracket in flakes, and more lamp beads are in
Strip structure is distributed on bracket in flakes, and groove is provided between strip structure, is provided with and groove pair on the lower support plate
The first rib answered；Upper cover plate is provided with above the bracket in flakes, the surface of upper cover plate is provided with several second ribs,
Second rib is correspondingly arranged with groove；The side of the testboard is provided with integrating sphere, and test is provided with below integrating sphere
Probe；The testboard is connect by X/Y guide rail with pedestal.
Preferably, the lamp bead and groove replaces with LED lamp bead, region, LED support metal tablet；The company
Array is placed with several LED lamp beads on plate rack, and arrangement of several LED lamp beads on bracket in flakes is divided into no less than two
A region passes through the connection support of LED support metal tablet between region；First rib replaces with the first hollow out, the
Two ribs replace with the second hollow out, and the first hollow out corresponding with region is provided on lower support plate；The upper cover plate be provided with
Corresponding second hollow out of first hollow out.
Preferably, the back metal frame edge of the bracket in flakes is provided with cutting groove, bracket in flakes
The back side is provided with several sheet metals of array arrangement, and every sheet metal is connected with each other.
Preferably, the integrating sphere is connect by cable with test controller and computer, probe and power supply are tested
Connection.
Preferably, the integrating sphere takes optical port to flush with the horizontal direction of testboard, test probe is arranged in product
Bulb separation takes below optical port.
Preferably, the integrating sphere and test probe are fixed on the base.
The operation principle of the present invention is that: support plate under installing on testboard, the bracket in flakes for then completing encapsulation are placed
On lower support plate, and upper cover plate is covered, testboard is controlled by control system and is moved among integrating sphere and test probe, allows spy
Needle touches the pad of product bottom, while giving rated current by power supply and lighting, what the lamp bead being then lit was issued
Light is transmitted to the integrating sphere of surface, and integrating sphere passes through test controller again and obtains corresponding photoelectric parameter, and is transferred to meter
On calculation machine, testboard completes the test of full page lamp bead by control system in XY horizontal plane.
After adopting the above structure, the present invention is the beneficial effects are as follows: a kind of adopting surface mounted LED row of the present invention surveys dress
It sets, can solve the problems, such as that industry adopting surface mounted LED row surveys low efficiency, while can crawl one as much as possible before LED lamp bead light splitting
Fixed photoelectric parameter data are analyzed data, are adjusted to the encapsulation material of volume production lamp bead by correlation data, are closed with reaching
The LED product of lattice.
Detailed description of the invention
Fig. 1 is structure chart of the invention；
Fig. 2 is present invention supporting structure schematic diagram in flakes；
Fig. 3 is the lower carrying board structure schematic diagram of the present invention；
Fig. 4 is the structure chart of present embodiment embodiment 2；
Fig. 5 is the supporting structure schematic diagram in flakes of present embodiment embodiment 2；
Fig. 6 is the lower support plate schematic diagram of present embodiment embodiment 2；
Fig. 7 is the back view of Fig. 5.
Description of symbols:
Testboard 1, lower support plate 2, in flakes bracket 3, lamp bead 4, groove 5, the first rib 6, upper cover plate 7, the second rib 8, integrating sphere
9, test probe 10, pedestal 11, LED lamp bead 12, region 13, LED support metal tablet 14, the first hollow out 15, the second hollow out 16,
Cutting groove 17, sheet metal 18.
Specific embodiment
It, below will be to reality in order to illustrate more clearly of present embodiment embodiment or technical solution in the prior art
It applies example or attached drawing needed to be used in the description of the prior art is briefly described, it should be apparent that, the accompanying drawings in the following description
Only some embodiments of present embodiment are not paying creative labor for those of ordinary skill in the art
Under the premise of dynamic property, it is also possible to obtain other drawings based on these drawings.
Embodiment 1
Referring to such as Fig. 1 --- shown in Fig. 3, the present embodiment includes testboard 1, lower support plate 2, in flakes bracket 3, lamp bead 4, groove 5, the
One rib 6, upper cover plate 7, the second rib 8, integrating sphere 9, test probe 10, pedestal 11；Downloading is provided on the testboard 1
Plate 2 is placed with bracket 3 in flakes on lower support plate 2, and array is placed with more mutual disjunct lamp beads 4, more lamps on bracket 3 in flakes
The structure distribution in a strip shape of pearl 4 is provided with groove 5 on bracket 3 in flakes, between strip structure, is provided on the lower support plate 2
First rib 6 corresponding with groove 5；The top of the bracket in flakes 3 is provided with upper cover plate 7, and the surface of upper cover plate 7 is provided with
Several second ribs 8, the second rib 8 are correspondingly arranged with groove 5；The side of the testboard 1 is provided with integrating sphere 9, integral
The lower section of ball 9 is provided with test probe 10；The testboard 1 is connect by X/Y guide rail with pedestal 11；The integrating sphere 9
It is connect by cable with test controller and computer, test probe 10 connects to power supply；The integrating sphere 9 take optical port with
The horizontal direction of testboard 1 flushes, and the taking below optical port of integrating sphere 9 is arranged in test probe 10；The integrating sphere 9 and test
Probe 10 is fixed on the pedestal 11.
When the present embodiment operates, then the bracket in flakes 3 that encapsulation is completed is placed on by support plate under installing on testboard 1
On lower support plate, and upper cover plate is covered, testboard 1 is controlled by control system and is moved among integrating sphere 9 and test probe 10, is allowed
Probe touches the pad of product bottom, while giving rated current by power supply and lighting, and the lamp bead being then lit is issued
Light be transmitted to right above integrating sphere 9, integrating sphere 9 obtains corresponding photoelectric parameter by test controller again, and transmits
Onto computer, testboard completes the test of full page lamp bead by control system in XY horizontal plane.
The present embodiment is suitable for PCT/PPA product test.
Embodiment 2
Referring to such as Fig. 4 --- shown in Fig. 7, the present embodiment difference from example 1 is that: the lamp bead 4 and groove 5 is replaced
It is changed to LED lamp bead 12, region 13, LED support metal tablet 14；Array is placed with several LED lamp beads on the bracket in flakes 3
12, and arrangement of several LED lamp beads 12 on bracket 3 in flakes is divided into no less than two regions 13, leads between region 13
Cross the connection support of LED support metal tablet 14；First rib 6 replaces with the first hollow out 15, and the second rib 8 replaces with
Two hollow outs 16 are provided with first hollow out 15 corresponding with region 13 on lower support plate 2；The upper cover plate 7 is provided with to be engraved with first
Empty 15 corresponding second hollow outs 16；The integrating sphere 9 is connect by cable with test controller and computer, and probe 10 is tested
It connects to power supply；The integrating sphere 9 takes optical port and the horizontal direction of testboard 1 to flush, and the test setting of probe 10 is integrating
Ball 9 takes below optical port；The integrating sphere 9 and test probe 10 is fixed on the pedestal 11.
The present embodiment and embodiment 1 operate the difference is that: the back metal frame surrounding of the bracket in flakes 3
Edge is provided with cutting groove 17, and the back side of bracket 3 is provided with several sheet metals 18 of array arrangement, and every 18 phase of sheet metal in flakes
It connects, i.e., the LED on full wafer bracket forms short circuit, and because EMC product bracket belongs to the arrangement of MAP formula, every product is phase
Interconnection is connected together, and the electrode of every product be all it is interconnected by the sheet metal of internal stent, be equivalent to product with
It is all there is short circuit, therefore cannot directly be tested as the PCT/PPA product in embodiment 1 between product, if needing
Realize single test, Normal practice needs single single and is separated, and the separation of EMC bracket is realized using cutting technique,
After the completion of cutting, single product on bracket will hang down and can not be gathered on bracket in flakes, therefore can not carry out full page test.
In view of this, the present embodiment be by cutting EMC cradle back with before channel, i.e., cut from cradle back toward front
It cuts, depth of cut is the 2/3 of backing thickness, and the metal tablet inside the cut-off EMC bracket of the implementation of such technique is carried on the back from bracket
Face is seen, it can be achieved that single product is disconnected with single product electrode, and without connection, while bracket front is still protected by EMC resin
Leveling connection is held, the test of EMC single of bracket and single progress photoelectric parameter in flakes can be realized by this embodiment.
After adopting the above structure, present embodiment is the beneficial effects are as follows: one described in present embodiment
Kind adopting surface mounted LED row surveys device, can solve the problems, such as that industry adopting surface mounted LED row surveys low efficiency, while can before LED lamp bead is divided
The certain photoelectric parameter data of crawl as much as possible analyze data by correlation data, to the encapsulation material of volume production lamp bead into
Row adjustment, to reach qualified LED product.
Basic principles and main features and advantages of the present invention of the invention have been shown and described above.The skill of the industry
Art personnel it should be appreciated that the present invention is not limited to the above embodiments, the above embodiments and description only describe
The principle of the present invention, without departing from the spirit and scope of the present invention, various changes and improvements may be made to the invention, these
Changes and improvements all fall within the protetion scope of the claimed invention.The claimed scope of the invention by appended claims and
Its equivalent thereof.
Claims (6)
1. a kind of adopting surface mounted LED row surveys device, it is characterised in that: it includes testboard, lower support plate, in flakes bracket, lamp bead, ditch
Slot, the first rib, upper cover plate, the second rib, integrating sphere, test probe, pedestal；Lower support plate is provided on the testboard,
It is placed with bracket in flakes on lower support plate, array is placed with more mutual disjunct lamp beads on bracket in flakes, and more lamp beads are in a strip shape
Structure distribution is provided with groove, is provided on the lower support plate corresponding with groove on bracket in flakes between strip structure
First rib；It is provided with upper cover plate above the bracket in flakes, the surface of upper cover plate is provided with several second ribs, and second
Rib is correspondingly arranged with groove；The side of the testboard is provided with integrating sphere, and test probe is provided with below integrating sphere；
The testboard is connect by X/Y guide rail with pedestal.
2. a kind of adopting surface mounted LED row according to claim 1 surveys device, it is characterised in that: the lamp bead and groove is replaced
It is changed to LED lamp bead, region, LED support metal tablet；Array is placed with several LED lamp beads on the bracket in flakes, and several
Arrangement of the LED lamp bead on bracket in flakes is divided into no less than two regions, passes through LED support metal tablet between region
Connection support；First rib replaces with the first hollow out, and the second rib replaces with the second hollow out, be provided on lower support plate with
Corresponding first hollow out in region；The upper cover plate is provided with the second hollow out corresponding with the first hollow out.
3. a kind of adopting surface mounted LED row according to claim 2 surveys device, it is characterised in that: the back of the bracket in flakes
Face metal edge frame edge is provided with cutting groove, and the back side of bracket is provided with several sheet metals of array arrangement in flakes, and every
Piece sheet metal is connected with each other.
4. a kind of adopting surface mounted LED row according to claim 1 surveys device, it is characterised in that: the integrating sphere passes through electricity
Cable is connect with test controller and computer, and test probe connects to power supply.
5. a kind of adopting surface mounted LED row according to claim 1 surveys device, it is characterised in that: the integrating sphere takes light
It mouthful is flushed with the horizontal direction of testboard, tests probe and the taking below optical port of integrating sphere is set.
6. a kind of adopting surface mounted LED row according to claim 1 surveys device, it is characterised in that: the integrating sphere and test
Probe is fixed on the base.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710686782.2A CN109387762A (en) | 2017-08-11 | 2017-08-11 | A kind of adopting surface mounted LED row survey device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710686782.2A CN109387762A (en) | 2017-08-11 | 2017-08-11 | A kind of adopting surface mounted LED row survey device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109387762A true CN109387762A (en) | 2019-02-26 |
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ID=65413881
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710686782.2A Pending CN109387762A (en) | 2017-08-11 | 2017-08-11 | A kind of adopting surface mounted LED row survey device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109387762A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110379726A (en) * | 2019-07-31 | 2019-10-25 | 厦门华联电子股份有限公司 | A kind of method that townhouse COB-LED row surveys |
| CN114441148A (en) * | 2022-04-02 | 2022-05-06 | 常州市润达照明电器有限公司 | Courtyard lamp illumination detection feedback marking device and method |
-
2017
- 2017-08-11 CN CN201710686782.2A patent/CN109387762A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110379726A (en) * | 2019-07-31 | 2019-10-25 | 厦门华联电子股份有限公司 | A kind of method that townhouse COB-LED row surveys |
| CN110379726B (en) * | 2019-07-31 | 2022-07-22 | 厦门华联电子股份有限公司 | Method for row-by-row COB-LED row test |
| CN114441148A (en) * | 2022-04-02 | 2022-05-06 | 常州市润达照明电器有限公司 | Courtyard lamp illumination detection feedback marking device and method |
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